CY2004010I1 - Phenyl carbamate - Google Patents

Phenyl carbamate

Info

Publication number
CY2004010I1
CY2004010I1 CY200400010C CY2004010C CY2004010I1 CY 2004010 I1 CY2004010 I1 CY 2004010I1 CY 200400010 C CY200400010 C CY 200400010C CY 2004010 C CY2004010 C CY 2004010C CY 2004010 I1 CY2004010 I1 CY 2004010I1
Authority
CY
Cyprus
Prior art keywords
phenyl carbamate
carbamate
phenyl
Prior art date
Application number
CY200400010C
Other languages
English (en)
Other versions
CY2004010I2 (el
Original Assignee
Novartis Ag
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Novartis Ag filed Critical Novartis Ag
Publication of CY2004010I1 publication Critical patent/CY2004010I1/el
Publication of CY2004010I2 publication Critical patent/CY2004010I2/el

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10NELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N50/00Galvanomagnetic devices
    • H10N50/01Manufacture or treatment
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10NELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N50/00Galvanomagnetic devices
    • H10N50/10Magnetoresistive devices
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10BELECTRONIC MEMORY DEVICES
    • H10B61/00Magnetic memory devices, e.g. magnetoresistive RAM [MRAM] devices
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10NELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N35/00Magnetostrictive devices
    • H10N35/01Manufacture or treatment
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10NELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N50/00Galvanomagnetic devices
    • H10N50/80Constructional details
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10NELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N70/00Solid-state devices having no potential barriers, and specially adapted for rectifying, amplifying, oscillating or switching
    • H10N70/20Multistable switching devices, e.g. memristors
    • H10N70/24Multistable switching devices, e.g. memristors based on migration or redistribution of ionic species, e.g. anions, vacancies
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C2211/00Indexing scheme relating to digital stores characterized by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C2211/56Indexing scheme relating to G11C11/56 and sub-groups for features not covered by these groups
    • G11C2211/561Multilevel memory cell aspects
    • G11C2211/5615Multilevel magnetic memory cell using non-magnetic non-conducting interlayer, e.g. MTJ

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Mram Or Spin Memory Techniques (AREA)
  • Semiconductor Memories (AREA)
  • Hall/Mr Elements (AREA)
CY200400010C 2019-08-29 2004-11-05 Phenyl carbamate CY2004010I2 (el)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US16/555,527 US11152563B2 (en) 2019-08-29 2019-08-29 Reinforced single element bottom electrode for MTJ-containing devices
GB2203040.7A GB2601964B (en) 2019-08-29 2020-08-20 Reinforced single element bottom electrode for MTJ-containing devices

Publications (2)

Publication Number Publication Date
CY2004010I1 true CY2004010I1 (el) 2009-11-04
CY2004010I2 CY2004010I2 (el) 2009-11-04

Family

ID=74681361

Family Applications (1)

Application Number Title Priority Date Filing Date
CY200400010C CY2004010I2 (el) 2019-08-29 2004-11-05 Phenyl carbamate

Country Status (7)

Country Link
US (1) US11152563B2 (el)
JP (1) JP2022545901A (el)
CN (1) CN114287068B (el)
CY (1) CY2004010I2 (el)
DE (1) DE112020004072T5 (el)
GB (1) GB2601964B (el)
WO (1) WO2021038397A1 (el)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20210141024A (ko) * 2020-05-15 2021-11-23 삼성전자주식회사 자기 기억 소자
CN117425391A (zh) * 2022-07-06 2024-01-19 浙江驰拓科技有限公司 Sot-mram器件及其制造方法

Family Cites Families (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8802451B2 (en) 2008-02-29 2014-08-12 Avalanche Technology Inc. Method for manufacturing high density non-volatile magnetic memory
US8158445B2 (en) * 2009-11-11 2012-04-17 Samsung Electronics Co., Ltd. Methods of forming pattern structures and methods of manufacturing semiconductor devices using the same
JP2013021108A (ja) 2011-07-11 2013-01-31 Toshiba Corp 半導体記憶装置およびその製造方法
US9166154B2 (en) 2012-12-07 2015-10-20 Avalance Technology, Inc. MTJ stack and bottom electrode patterning process with ion beam etching using a single mask
US8835889B1 (en) 2013-03-13 2014-09-16 International Business Machines Corporation Parallel shunt paths in thermally assisted magnetic memory cells
US9257638B2 (en) 2014-03-27 2016-02-09 Lam Research Corporation Method to etch non-volatile metal materials
US9299745B2 (en) * 2014-05-08 2016-03-29 GlobalFoundries, Inc. Integrated circuits having magnetic tunnel junctions (MTJ) and methods for fabricating the same
US10008662B2 (en) * 2015-03-12 2018-06-26 Taiwan Semiconductor Manufacturing Co., Ltd. Perpendicular magnetic tunneling junction (MTJ) for improved magnetoresistive random-access memory (MRAM) process
US9583535B2 (en) 2015-05-01 2017-02-28 Kabushiki Kaisha Toshiba Magnetoresistive memory device and manufacturing method of the same
US9614143B2 (en) 2015-06-09 2017-04-04 Qualcomm Incorporated De-integrated trench formation for advanced MRAM integration
WO2016204774A1 (en) 2015-06-19 2016-12-22 Intel Corporation Capped magnetic memory
US10121964B2 (en) * 2015-09-23 2018-11-06 Globalfoundries Singapore Pte. Ltd. Integrated magnetic random access memory with logic device
US9704919B1 (en) 2016-06-24 2017-07-11 Qualcomm Incorporated High aspect ratio vertical interconnect access (via) interconnections in magnetic random access memory (MRAM) bit cells
KR102454877B1 (ko) * 2016-08-08 2022-10-17 에스케이하이닉스 주식회사 전자 장치 및 그 제조 방법
US10164169B2 (en) * 2016-09-30 2018-12-25 Taiwan Semiconductor Manufacturing Co., Ltd. Memory device having a single bottom electrode layer
KR102449605B1 (ko) * 2017-06-05 2022-10-04 삼성전자주식회사 반도체 장치 및 그 제조 방법
US10043851B1 (en) 2017-08-03 2018-08-07 Headway Technologies, Inc. Etch selectivity by introducing oxidants to noble gas during physical magnetic tunnel junction (MTJ) etching
KR102372829B1 (ko) * 2017-09-27 2022-03-10 삼성전자주식회사 자기 저항 메모리 장치
US11189658B2 (en) 2017-11-22 2021-11-30 Taiwan Semiconductor Manufacturing Co., Ltd. Magnetic random access memory and manufacturing method thereof
US11342378B2 (en) * 2019-04-25 2022-05-24 Taiwan Semiconductor Manufacturing Company Ltd. Magnetic tunnel junction device with residue-protection sidewall spacer and the method for forming a magnetic tunnel junction device with residue-protection sidewall spacer
US11227892B2 (en) * 2019-06-18 2022-01-18 International Business Machines Corporation MRAM integration with BEOL interconnect including top via

Also Published As

Publication number Publication date
DE112020004072T5 (de) 2022-05-19
JP2022545901A (ja) 2022-11-01
US20210066581A1 (en) 2021-03-04
GB2601964A (en) 2022-06-15
CN114287068B (zh) 2023-04-18
GB2601964B (en) 2023-09-06
GB202203040D0 (en) 2022-04-20
CN114287068A (zh) 2022-04-05
CY2004010I2 (el) 2009-11-04
WO2021038397A1 (en) 2021-03-04
US11152563B2 (en) 2021-10-19

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