CN2747578Y - Built-in controllable moveable anode electronic emitting tester - Google Patents

Built-in controllable moveable anode electronic emitting tester Download PDF

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Publication number
CN2747578Y
CN2747578Y CN 200420084205 CN200420084205U CN2747578Y CN 2747578 Y CN2747578 Y CN 2747578Y CN 200420084205 CN200420084205 CN 200420084205 CN 200420084205 U CN200420084205 U CN 200420084205U CN 2747578 Y CN2747578 Y CN 2747578Y
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CN
China
Prior art keywords
anode
movable bar
dielectric film
insulating film
sample
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Expired - Fee Related
Application number
CN 200420084205
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Chinese (zh)
Inventor
王波
严辉
朱满康
汪浩
侯育冬
宋雪梅
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Beijing University of Technology
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Beijing University of Technology
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Publication date
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Priority to CN 200420084205 priority Critical patent/CN2747578Y/en
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Publication of CN2747578Y publication Critical patent/CN2747578Y/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Abstract

The utility model relates to a built-in controllable moveable anode electronic emitting tester which belongs to the industry of an electronic material testing apparatus. The existing apparatus has the disadvantages that the anode has to be arranged outside the vacuum chamber so that the sample can not directly carry out the test after fabrication, and because the sample has to be exposed to the atmosphere, the sample changes compared with that the sample is not exposed to the atmosphere. The insulating film separated from the anode is easy to deform, and the different deformations during mounting cause the relatively great distance error between the cathode and the anode. The operational process of mounting is also relatively complicated. The utility model which comprises a vacuum chamber, a vacuum pump system, an anode part, a cathode part, an electrical measuring apparatus and a movable bar control assembly composed of a movable bar controller and a movable bar is characterized in that the anode part is formed by the integration of the anode (1) and the insulating film (4). Seeing the picture, the surface of the anode (1) is coated with a layer of insulating film (4) by the conventional method, and the center of the insulating film (4) has an area that is not coated with the insulating film as the testing area of field emission.

Description

Built-in controlled moving anode field-causing electron transmission test set
Technical field:
Belong to electronic material testing apparatus industry, be applied to the test aspect of field emmision material research.
Background technology:
Field electron emission materials is having a wide range of applications aspect radio tube and the field emission plane demonstration.In the research and production of field emmision material, the measuring technology of field-causing electron emission seems quite important.
In existing the transmission test set, generally be to need in the vacuum chamber outside sample to be installed on two electrodes (as Fig. 1) earlier, send into vacuum chamber then, two electrodes are communicated with test circuit.A dielectric film is wherein arranged between sample and anode, and dielectric film separates with anode usually.Its shortcoming is:
1) anode need be installed outside vacuum chamber, makes can not directly measure after the specimen preparation, must expose atmosphere, will test and send into a transmission test chamber again after fastener installs, and this moment sample surfaces with do not expose atmosphere before change than, so be unfavorable for studying;
2) dielectric film separates with anode, and dielectric film is yielding, and the deformation when being installed each time has difference, causes that yin, yang anode-cathode distance error is bigger, makes that the stochastic error in the test result increases;
3) the also more loaded down with trivial details complexity of the operating process that is installed.
Summary of the invention:
Built-in controlled moving anode field-causing electron transmission test set provided by the invention, the cathode and anode spacing error that causes at the anode in the field-causing electron transmission test field and dielectric film split is big, need sample is exposed the problem that atmosphere is installed.
Solve the method for anode cathode separation error in the technical solution of the present invention, exactly anode and dielectric film are fixed on the vacuum may command carriage release lever after integrated, when being placed on after specimen preparation is come out on the negative electrode, be put into integrated anode bottom, moving anode is placed into it on sample then, has just formed the test structure of field-causing electron emission.
Built-in controlled moving anode field-causing electron transmission test set (see figure 2) provided by the invention, the movable bar Control Component, the electrical measurement instrument 12 that comprise vacuum chamber 10, vacuum pump system 14, anode part 7, cathode portion 6, form by movable bar controller 9 and movable bar 8; Vacuum chamber 10 bottoms are linked to each other so that obtain high vacuum by vacuum pipe 13 with vacuum pump system 14, and movable bar controller 9 is equipped with in the top, move up and down in order to control movable bar 8; What link to each other with movable bar 8 is that anode part 7,7 bottoms are cathode portion 6; Anode part 7 is all linked to each other with electrical measurement instrument 12 by lead 11 with cathode portion 6, it is characterized in that: described anode part 7 is with anode 1 and the dielectric film 4 integrated (see figure 3)s that form, promptly plate one deck dielectric film 4 with conventional method on anode 1 surface, the center is reserved a zone and is not plated dielectric film on dielectric film 4, and this zone is as field transmission test area.
Wherein, the thickness of dielectric film 4 is in 1 micron to 50 microns scope.
The material of dielectric film 4 can be any conventional insulating material such as monox, aluminium oxide
Explain: the effect of (1) dielectric film 4 is that anode 1 and testing sample 3 are separated.The thickness of the size of the not coating film area that the center is reserved on the dielectric film 4 and shape and dielectric film 4 is decided according to the concrete needs of test.
(2) the movable bar Control Component formed of movable bar controller 9 and movable bar 8 is conventional vacuum standard accessory.
(3) anode part 7 is fixedly mounted on when vacuum chamber is assembled in the vacuum chamber on " movable bar " 8.
During test, testing sample 3 is placed on the anode below of putting into vacuum chamber on the negative electrode 2 again, is positioned over sample surfaces by movable bar controller control anode part 7 then, begin to test.
Adopt the obtained actual effect of built-in controlled moving anode field-causing electron transmission test set of the present invention to be:
1) dielectric film and anode are integrated, and dielectric film is not yielding, do not have the deformation difference when being installed each time, make that anode cathode separation control is more accurate, and the test stochastic error is little;
2) owing to saved the process that is installed of dielectric film and anode, it is more simple and convenient that test operating procedure becomes.
Description of drawings:
Existing transmission test anode and cathode structural drawing of Fig. 1
1. anodes among the figure; 2. negative electrode; 3. sample; 4. dielectric film; 5. nut
The built-in controlled moving anode field-causing electron transmission test set of Fig. 2
6. cathode portion among the figure; 7. anode part; 8. movable bar; 9. movable bar controller; 10. vacuum chamber; 11. lead; 12 electrical measurement instrument; 13. vacuum pipe; 14. vacuum pump system;
Built-in removable anode of Fig. 3 and cathode junction composition
1. anodes among the figure; 2. negative electrode; 3. sample; 4. dielectric film; 8. movable bar
Embodiment
Device (see figure 2) of the present invention, the movable bar Control Component, the electrical measurement instrument 12 that comprise vacuum chamber 10, vacuum pump system 14, anode part 7, cathode portion 6, form by movable bar controller 9 and movable bar 8.
Vacuum chamber 10 bottoms are linked to each other so that obtain high vacuum by vacuum pipe 13 with vacuum pump system 14, and movable bar controller 9 is equipped with in the top, move up and down in order to control " movable bar " 8.What link to each other with movable bar 8 is anode part 7, and anode part 7 is fixedly mounted on when vacuum chamber is assembled in the vacuum chamber on " movable bar " 8, and fixed form can adopt screw thread to fix or conventional fixing means such as trip bolt is fixing.7 bottoms are cathode portion 6; Anode part 7 is all linked to each other with electrical measurement instrument 12 by lead 11 with cathode portion 6.Described anode part 7 is with anode 1 and the dielectric film 4 integrated (see figure 3)s that form, and promptly plates one deck dielectric film 4 on anode 1 surface with conventional method, and the thickness of dielectric film 4 for example can select 10 microns in 1 micron to 50 microns scope.The center is reserved a zone and is not plated dielectric film on dielectric film 4, and this zone is as field transmission test area, and the size in zone and shape are decided according to the concrete needs of test, for example the border circular areas of diameter 10mm.The material of dielectric film 4 can be any conventional insulating material, for example selects monox for use.
When testing, at first sample 3 is put into vacuum chamber, be placed on the negative electrode 2, sample 3 and negative electrode 2 have been formed cathode portion 6.Start vacuum pump system 14 then, the gas in the vacuum chamber 10 is taken out, make to reach ultra-high vacuum state in the vacuum chamber.At this moment move down by " movable bar controller " 9 control " anode parts " 7, it is pressed on the cathode portion 6.This moment, test loop formed, and therefore can finish the field-causing electron transmission test by field-causing electron transmitter current and institute's making alive of electrical measurement instrument 12 measuring samples.

Claims (2)

1, built-in controlled moving anode field-causing electron transmission test set, the movable bar Control Component, the electrical measurement instrument (12) that comprise vacuum chamber (10), vacuum pump system (14), anode part (7), cathode portion (6), form by movable bar controller (9) and movable bar (8); Vacuum chamber (10) is following to be linked to each other so that obtain high vacuum by vacuum pipe (13) with vacuum pump system (14), and movable bar controller (9) is equipped with in the top, moves up and down in order to control movable bar (8); What link to each other with movable bar (8) is anode part (7), and anode part (7) bottom is cathode portion (6); Anode part (7) is all linked to each other with electrical measurement instrument (12) by lead (11) with cathode portion (6), it is characterized in that: described anode part (7) is with anode (1) and integrated the forming of dielectric film (4), promptly plate one deck dielectric film (4) with conventional method on anode (1) surface, reserve a zone in the last center of dielectric film (4) and do not plate dielectric film, this zone is as field transmission test area.
2, built-in controlled moving anode field-causing electron transmission test set according to claim 1, the thickness of dielectric film wherein (4) is at 1 micron to 50 microns.
CN 200420084205 2004-07-22 2004-07-22 Built-in controllable moveable anode electronic emitting tester Expired - Fee Related CN2747578Y (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN 200420084205 CN2747578Y (en) 2004-07-22 2004-07-22 Built-in controllable moveable anode electronic emitting tester

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN 200420084205 CN2747578Y (en) 2004-07-22 2004-07-22 Built-in controllable moveable anode electronic emitting tester

Publications (1)

Publication Number Publication Date
CN2747578Y true CN2747578Y (en) 2005-12-21

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Country Status (1)

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CN (1) CN2747578Y (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103675632A (en) * 2012-09-21 2014-03-26 中国科学院电子学研究所 Cathode emission testing apparatus and system for microwave vacuum electronic devices
CN106841369A (en) * 2017-03-03 2017-06-13 河南理工大学 A kind of Field Electron Emission test device
CN109613064A (en) * 2018-11-16 2019-04-12 兰州空间技术物理研究所 The adjustable field emission test device of electrode spacing and method in a kind of vacuum system

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103675632A (en) * 2012-09-21 2014-03-26 中国科学院电子学研究所 Cathode emission testing apparatus and system for microwave vacuum electronic devices
CN106841369A (en) * 2017-03-03 2017-06-13 河南理工大学 A kind of Field Electron Emission test device
CN106841369B (en) * 2017-03-03 2023-03-24 河南理工大学 Field electron emission testing device
CN109613064A (en) * 2018-11-16 2019-04-12 兰州空间技术物理研究所 The adjustable field emission test device of electrode spacing and method in a kind of vacuum system

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GR01 Patent grant
C19 Lapse of patent right due to non-payment of the annual fee
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