CN220626476U

CN220626476U - Test module using high-current probe

Info

Publication number: CN220626476U
Application number: CN202321583492.2U
Authority: CN
Inventors: 徐灏; 黄绍伟; 张月良
Original assignee: Shanghai Jianyang Electronic Technology Co ltd
Current assignee: Shanghai Jianyang Electronic Technology Co ltd
Priority date: 2023-06-21
Filing date: 2023-06-21
Publication date: 2024-03-19
Anticipated expiration: 2033-06-21

Abstract

The utility model relates to the technical field of current probe testing, in particular to a testing module using a heavy current probe, which adopts a heavy current testing probe and a conductive copper column to be matched with a second threaded hole for convenient disassembly and replacement, and a positioning hole is arranged to enable the heavy current testing probe to be accurately aligned with an end face to be tested, so that the purpose of good contact is achieved; in order to facilitate the fixing of the test module to the jig, the rear end of the conductive copper column is provided with an inner first inner threaded hole so as to achieve the fastening function and facilitate the disassembly and maintenance; meanwhile, a plurality of high-current test probes have an elastic stroke, so that the function of protecting the test end face is achieved, the load current of one probe is 100 amperes, and a safe and stable current value guarantee is provided for the test end face to the greatest extent.

Description

Test module using high-current probe

Technical Field

The utility model relates to the technical field of current probe testing, in particular to a testing module using a high-current probe.

Background

The large-current test scheme in the current market is complex in operation, manual installation and alignment are performed, and automatic test cannot be performed; the efficiency is low, and multiple ports and end faces cannot be tested at the same time; and the test yield is low, the test performance is not stable enough, and the test result repeatability is poor, because the current carrying value of various test modes does not reach the standard, and if a single copper column is used for testing, the required sectional area is large, and the space is wasted.

Disclosure of Invention

The present utility model is directed to a high-current probe test module, which solves the above-mentioned problems.

In order to achieve the above purpose, the present utility model provides the following technical solutions: the utility model provides an use heavy current probe test module, includes conductive copper post and heavy current test probe, first internal thread hole has been seted up in the middle of conductive copper post top, conductive copper post bottom surface evenly has seted up a plurality of installation locating hole, a plurality of installation locating hole inner chamber top is provided with the second internal thread hole, install heavy current test probe in the installation locating hole;

the high-current probe comprises a plugging column, a probe head and a connecting threaded column, wherein the probe head is arranged at the top end of the plugging column, and the connecting threaded column is connected with the bottom end of the plugging column.

Preferably, the conductive copper column is cuboid, and the conductive copper column is fixedly connected with the fixing surface through a first internal threaded hole in a threaded manner.

Preferably, the inserting column is connected with the mounting positioning hole in an inserting way, and the connecting threaded column is fixedly connected with the second internal threaded hole in a threaded way.

Preferably, the probe head is connected with the probe head through a fixed connecting sleeve, and the probe head is provided with an elastic stroke.

Preferably, the probe head protrudes out of the bottom surface of the conductive copper column, the probe head is flat-headed, and one end of the probe head is attached to the testing end face.

Preferably, the maximum load current of the high-current test probe is 100 amperes, the surface of the high-current test probe is gold-plated, and the thickness of the gold-plated layer is greater than 1.3 microns.

Compared with the prior art, the utility model has the beneficial effects that: according to the utility model, the high-current test probe and the conductive copper column are matched with the second threaded hole, so that the disassembly and the replacement are convenient, and the positioning holes are arranged, so that the high-current test probe can be accurately aligned to the end face to be tested, and the purpose of good contact is achieved; in order to facilitate the fixing of the test module to the jig, the rear end of the conductive copper column is provided with an inner first inner threaded hole so as to achieve the fastening function and facilitate the disassembly and maintenance; meanwhile, a plurality of high-current test probes have an elastic stroke, so that the function of protecting a test end surface is achieved, and the load current of one probe is 100 amperes, so that a safe and stable current value guarantee is provided for the test end surface to the greatest extent; the needle head of the heavy current test probe is flat-headed, and compared with other structures, the structure can ensure that the heavy current test probe can be fully contacted with an object to be tested when contacting the object to be tested, the end face is not damaged, unnecessary abrasion is caused, and the conductive effect and the current carrying capacity of the heavy current test probe are far greater than those of the conductive copper column because the gold plating layer of the heavy current test probe is greater than 1.3 micrometers.

Drawings

FIG. 1 is a schematic diagram of the overall structure of the present utility model;

FIG. 2 is a schematic side sectional view of a conductive copper pillar according to the present utility model;

FIG. 3 is a schematic diagram of a high current test probe according to the present utility model;

FIG. 4 is a schematic view of the internal structure of the conductive copper pillar according to the present utility model;

FIG. 5 is a schematic diagram showing the internal structure of the connection between the conductive copper pillar and the high-current test probe according to the present utility model;

fig. 6 is a schematic bottom view of the conductive copper pillar according to the present utility model.

In the figure: 1. conductive copper pillars; 2. a high current test probe; 3. a first internally threaded bore; 4. installing a positioning hole; 5. inserting a column; 6. a probe head; 7. fixing the connecting sleeve; 8. connecting a threaded column; 9. a second internally threaded bore.

Detailed Description

The following description of the embodiments of the present utility model will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present utility model, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the utility model without making any inventive effort, are intended to be within the scope of the utility model.

In the description of the present utility model, it should be noted that the azimuth or positional relationship indicated by the terms "vertical", "upper", "lower", "horizontal", etc. are based on the azimuth or positional relationship shown in the drawings, and are merely for convenience of describing the present utility model and simplifying the description, and do not indicate or imply that the apparatus or element referred to must have a specific azimuth, be constructed and operated in a specific azimuth, and thus should not be construed as limiting the present utility model.

In the description of the present utility model, it should also be noted that, unless explicitly specified and limited otherwise, the terms "disposed," "mounted," "connected," and "connected" are to be construed broadly, and may be, for example, fixedly connected, detachably connected, or integrally connected; can be mechanically or electrically connected; can be directly connected or indirectly connected through an intermediate medium, and can be communication between two elements. The specific meaning of the above terms in the present utility model can be understood by those of ordinary skill in the art according to the specific circumstances.

Referring to fig. 1-6, the present utility model provides a technical solution: the utility model provides an use heavy current probe test module, includes conductive copper post 1 and heavy current test probe 2, has seted up first internal thread hole 3 in the middle of conductive copper post 1 top, and conductive copper post 1 bottom surface evenly has seted up a plurality of installation locating hole 4, and a plurality of installation locating hole 4 inner chamber top is provided with second internal thread hole 9, installs heavy current test probe 2 in the installation locating hole 4;

the high-current test probe 2 comprises an inserting column 5, a probe head 6 and a connecting threaded column 8, wherein the probe head 6 is arranged at the top end of the inserting column 5, and the connecting threaded column 8 is connected with the bottom end of the inserting column 5.

Further, the conductive copper column 1 is a cuboid, and the conductive copper column 1 is fixedly connected with the fixed surface through the first internal threaded hole 3.

Further, the inserting column 5 is connected with the mounting positioning hole 4 in an inserting manner, and the connecting threaded column 8 is fixedly connected with the second internal threaded hole 9 in a threaded manner.

Further, the probe head 6 is connected with the probe head 6 through a fixed connecting sleeve 7, and the probe head 6 is provided with an elastic stroke.

Further, the probe head 6 protrudes out of the bottom surface of the conductive copper column 1, and the probe head 6 is flat-headed, and one end of the probe head 6 is attached to the testing end surface.

Further, the maximum load current of the high-current test probe 2 is 100 amperes, the surface of the high-current test probe 2 is plated with gold, and the thickness of the gold plating layer is larger than 1.3 micrometers.

According to the utility model, the high-current test probe 2 and the conductive copper column 1 are matched with the second threaded hole 9, so that the disassembly and the replacement are convenient, and the positioning hole 4 is arranged, so that the high-current test probe 2 can be accurately aligned with the end face to be tested, and the purpose of good contact is achieved; in order to facilitate the fixing of the test module to the jig, the rear end of the conductive copper column 1 is provided with an inner first inner threaded hole 3 so as to achieve the fastening function and facilitate the disassembly and maintenance; meanwhile, a plurality of high-current test probes 2 have elastic strokes, so that the function of protecting a test end face is achieved, and the load current of one probe is 100 amperes, so that a safe and stable current value guarantee is provided for the test end face to the greatest extent; the needle head of the heavy current test probe 2 is flat-headed, and compared with other structures, the structure can ensure that the heavy current test probe can be fully contacted with an object to be tested when contacting the object to be tested, the end face is not damaged, unnecessary abrasion is caused, and the conducting effect and the current carrying capacity of the heavy current test probe 2 are far greater than those of the conducting copper column 1 because the gold plating layer of the heavy current test probe 2 is greater than 1.3 micrometers.

Although embodiments of the present utility model have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and alterations can be made therein without departing from the spirit and scope of the utility model as defined by the appended claims and their equivalents.

Claims

1. The utility model provides an use heavy current probe test module, includes electrically conductive copper post (1) and heavy current test probe (2), its characterized in that: a first internal thread hole (3) is formed in the middle of the top of the conductive copper column (1), a plurality of installation positioning holes (4) are uniformly formed in the surface of the bottom of the conductive copper column (1), a second internal thread hole (9) is formed in the top of the inner cavity of each installation positioning hole (4), and a high-current test probe (2) is installed in each installation positioning hole (4);

the high-current test probe (2) comprises an inserting column (5), a probe head (6) and a connecting threaded column (8), wherein the probe head (6) is arranged at the top end of the inserting column (5), and the connecting threaded column (8) is connected with the bottom end of the inserting column (5).

2. The test module of claim 1, wherein the high current probe is configured to: the conductive copper column (1) is cuboid, and the conductive copper column (1) is fixedly connected with the fixed surface through a first internal threaded hole (3) in a threaded manner.

3. The test module of claim 1, wherein the high current probe is configured to: the inserting column (5) is connected with the mounting positioning hole (4) in an inserting mode, and the connecting threaded column (8) is fixedly connected with the second internal threaded hole (9) in a threaded mode.

4. The test module of claim 1, wherein the high current probe is configured to: the probe head (6) is connected with the probe head (6) through a fixed connecting sleeve (7), and the probe head (6) is provided with an elastic stroke.

5. The test module of claim 1, wherein the high current probe is configured to: the probe head (6) protrudes out of the bottom surface of the conductive copper column (1), the probe head (6) is flat-headed, and one end of the probe head (6) is connected with the test end face in a fitting mode.

6. The test module of claim 1, wherein the high current probe is configured to: the maximum load current of the high-current test probe (2) is 100 amperes, the surface of the high-current test probe (2) is plated with gold, and the thickness of the gold-plated layer is larger than 1.3 microns.