CN220509969U - PD chip responsivity test system - Google Patents
PD chip responsivity test system Download PDFInfo
- Publication number
- CN220509969U CN220509969U CN202320468099.2U CN202320468099U CN220509969U CN 220509969 U CN220509969 U CN 220509969U CN 202320468099 U CN202320468099 U CN 202320468099U CN 220509969 U CN220509969 U CN 220509969U
- Authority
- CN
- China
- Prior art keywords
- fixedly connected
- support base
- chip
- test system
- probe
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 57
- 239000000523 sample Substances 0.000 claims abstract description 34
- 230000004043 responsiveness Effects 0.000 claims abstract description 12
- 238000004891 communication Methods 0.000 claims abstract description 9
- 230000002950 deficient Effects 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 230000004044 response Effects 0.000 description 2
- 238000013461 design Methods 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 239000000428 dust Substances 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000007774 longterm Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 239000002994 raw material Substances 0.000 description 1
- 239000002699 waste material Substances 0.000 description 1
Abstract
The utility model relates to the technical field of communication test and provides a PD chip responsiveness test system which comprises a support base, wherein a first probe on one side of a first telescopic rod and a second probe on one side of a second telescopic rod are driven to move inwards, so that the first probe and the second probe tightly prop against PD chips to be tested.
Description
Technical Field
The utility model relates to the technical field of communication test, in particular to a PD chip responsivity test system.
Background
With the rapid development of the science and technology in the communication field, the yield of the PD chip is increased, and before the PD chip completes the assembly work, the performance of the PD chip needs to be detected, and particularly the responsiveness of the PD chip needs to be tested to ensure whether the PD chip meets the normal use after the subsequent assembly is completed.
The system comprises a probe station part, a light source part and a responsivity display part, is a simple, easy-to-operate and low-cost PD chip responsivity test system, can screen out defective products before the chip is formally put into production, greatly improves the production yield and the production efficiency, and avoids the man-hour waste and other raw material loss caused by the inflow of the defective products.
However, the following problems still exist in the current PD chip responsivity test system, and when the PD chip responsivity device performs the responsivity test on the PD chip, the detection probe may not be completely attached to the PD chip due to the different sizes of the PD chip, so as to affect the accuracy of the responsivity test.
Disclosure of Invention
The utility model provides a PD chip responsivity test system, which solves the problem of PD chip test accuracy in the related technology.
The technical scheme of the utility model is as follows: the utility model provides a PD chip responsivity test system, includes the support base, the rectangle fluting has been seted up at the top of support base, relative circular fluting has been seted up to the top rectangle fluting both sides of support base, the first flexible pipe of fixedly connected with in the circular fluting of top rectangle grooved one side of support base, the inner chamber swing joint of first flexible pipe has first telescopic link, fixedly connected with second flexible pipe in the circular fluting of top rectangle fluting opposite side of support base, the inner chamber swing joint of second flexible pipe has the second telescopic link.
Preferably, the top fixedly connected with test host computer of support base, the inside communication end fixedly connected with first probe of test host computer, first probe runs through the circular trompil in first flexible pipe one side and the circular trompil in middle part of first telescopic link and fixed connection in one side of first telescopic link.
Preferably, the internal communication end of the test host is fixedly connected with a second probe, and the second probe penetrates through the circular opening on one side of the second telescopic pipe and the circular opening in the middle of the second telescopic rod and is fixedly connected to one side of the second telescopic rod.
Preferably, the positive electrode source is fixedly connected in the rectangular slot at the top of the supporting base, the positive electrode block is fixedly connected to the front surface of the positive electrode source, and the back input end of the positive electrode source is electrically connected with the output end inside the test host.
Preferably, a negative-stage source is fixedly connected to one side, opposite to the positive-stage source, of the rectangular slot at the top of the supporting base, and the back input end of the negative-stage source is electrically connected with the output end of the inside of the test host.
Preferably, the bottom of the support base is fixedly connected with foot pads around.
Preferably, a power interface is fixedly connected to one side of the test host.
Preferably, the front surface of the test host is fixedly connected with a display screen, and the front surface of the test host is movably connected with a control button below the display screen.
Preferably, the support base is fixedly connected with an opening and closing auxiliary plate at one side close to the rectangular slot at the top.
Preferably, the support base is close to the top rectangle fluting and opens and shuts the opposite one side fixedly connected with mainboard that opens and shuts of subplate, the top of mainboard that opens and shuts runs through and has seted up horizontal fluting, the inside swing joint of mainboard that opens and shuts has the apron, the size of the board of apron is unanimous with the top rectangle fluting size of support base, the top fixedly connected with of apron pushes away the handle.
The utility model has the technical effects and advantages that:
1. according to the utility model, the first telescopic rod and the second telescopic rod in the support base are controlled to be respectively telescopic in the inner cavity of the first telescopic rod and the inner cavity of the second telescopic rod through the test host, and the first probe on one side of the first telescopic rod and the second probe on one side of the second telescopic rod are driven to move inwards in sequence, so that the first probe and the second probe tightly support the PD chip to be detected.
2. According to the utility model, the movable opening and closing device is arranged above the top groove of the support base, when the whole device is not in use, the cover plate can be driven to move to one side of the opening and closing auxiliary plate through the pushing handle until the cover plate completely covers the top groove of the support base, and the design can effectively prevent dust from entering the groove and polluting the first probe and the second probe under the condition that the device is not in use for a long time, so that the test stability of the whole device in use in the later period is affected.
Drawings
FIG. 1 is a schematic side view of the overall device structure of the present utility model.
FIG. 2 is a schematic top view of the overall device structure of the present utility model.
Fig. 3 is an enlarged view of area a of fig. 2.
Fig. 4 is an enlarged view of region B of fig. 2.
Fig. 5 is a cross-sectional view of a PD chip placement groove.
The reference numerals are: 1. a support base; 101. foot pads; 102. opening and closing the main board; 1021. a cover plate; 1022. a pushing handle; 103. an opening and closing auxiliary plate; 2. testing a host; 201. a power interface; 202. a control button; 203. a display screen; 3. a positive electrode block; 4. a negative electrode source; 5. a positive electrode source; 6. a first telescopic rod; 601. a first probe; 602. a first telescopic tube; 7. a second telescopic rod; 701. a second probe; 702. a second telescopic tube.
Detailed Description
The technical solutions of the embodiments of the present utility model will be clearly and completely described below in conjunction with the embodiments of the present utility model, and it is apparent that the described embodiments are only some embodiments of the present utility model, not all embodiments. All other embodiments, which can be made by one of ordinary skill in the art based on the embodiments of the utility model without making any inventive effort, are intended to be within the scope of the utility model.
Referring to fig. 5, the utility model provides a PD chip responsiveness test system, which comprises a support base 1, wherein a rectangular slot is formed in the top of the support base 1, opposite circular slots are formed in two sides of the rectangular slot in the top of the support base 1, a first telescopic tube 602 is fixedly connected in the circular slot on one side of the rectangular slot in the top of the support base 1, a first telescopic rod 6 is movably connected in an inner cavity of the first telescopic tube 602, a second telescopic tube 702 is fixedly connected in the circular slot on the other side of the rectangular slot in the top of the support base 1, and a second telescopic rod 7 is movably connected in an inner cavity of the second telescopic tube 702.
Referring to fig. 5, the top of the support base 1 is fixedly connected with the test host 2, the internal communication end of the test host 2 is fixedly connected with the first probe 601, and the first probe 601 penetrates through the circular opening on one side of the first telescopic tube 602 and the circular opening in the middle of the first telescopic rod 6 and is fixedly connected to one side of the first telescopic rod 6.
Referring to fig. 5, the internal communication end of the test host 2 is fixedly connected with a second probe 701, the second probe 701 penetrates through a circular opening on one side of the second telescopic tube 702 and a circular opening in the middle of the second telescopic rod 7 and is fixedly connected to one side of the second telescopic rod 7, the first telescopic rod 6 and the second telescopic rod 7 in the support base 1 are controlled to be respectively telescopic in the inner cavity of the first telescopic tube 602 and the inner cavity of the second telescopic tube 702 through the test host 2, and the first probe 601 on one side of the first telescopic rod 6 and the second probe 701 on one side of the second telescopic rod 7 are driven to move inwards in sequence, so that the first probe 601 and the second probe 701 tightly prop against a PD chip to be detected.
Referring to fig. 2 and 4, an anode source 5 is fixedly connected in a rectangular slot at the top of the support base 1, the front surface of the anode source 5 is fixedly connected with an anode block 3, and the back input end of the anode source 5 is electrically connected with the output end inside the test host 2.
Referring to fig. 2 and 4, a negative-stage source 4 is fixedly connected to a side opposite to the positive-stage source 5 in a rectangular slot at the top of the supporting base 1, and the back input end of the negative-stage source 4 is electrically connected to the output end inside the test host 2.
Referring to fig. 1, a foot pad 101 is fixedly connected around the bottom of a support base 1, and friction of a table top to the bottom of the support base 1 during long-term use is prevented by fixedly connecting the foot pad 101 to the bottom of the support base 1.
Referring to fig. 1, a power interface 201 is fixedly connected to one side of the test host 2.
Referring to fig. 1, a display screen 203 is fixedly connected to the front surface of a test host 2, and a control button 202 is movably connected to the front surface of the test host 2 below the display screen 203.
Referring to fig. 1, the support base 1 is fixedly connected with an opening and closing sub-plate 103 at one side close to the top rectangular slot.
Referring to fig. 2 and 3, the support base 1 is fixedly connected with an opening and closing main board 102 on a side close to the top rectangular slot opposite to the opening and closing auxiliary board 103, a transverse slot is formed through the top of the opening and closing main board 102, a cover plate 1021 is movably connected to the inside of the opening and closing main board 102, the size of the cover plate 1021 is consistent with that of the top rectangular slot of the support base 1, a pushing handle 1022 is fixedly connected to the top of the cover plate 1021, and a movable opening and closing device is arranged above the top slot of the support base 1.
The working principle of the utility model is as follows: firstly, a worker stably places the whole device on a desktop, then accesses a power supply through a power interface 201 on one side of a testing host 2, at this time, the whole device is in a to-be-operated state, then the worker places a PD chip which needs to be subjected to response test in a rectangular slot on the top of a supporting base 1, the specific placement position is that the power connection interfaces of the PD chip are required to be aligned with a negative electrode source 4 and a positive electrode source 5 respectively, the light source interfaces of the PD chip are aligned with a first probe 601 and a second probe 701 respectively, then according to the size of the PD chip, a control button 202 on the front side of the testing host 2 is used for starting a first telescopic rod 6 and a second telescopic rod 7, a driving element in the testing host 2 is used for controlling the first telescopic rod 6 and the second telescopic rod 7 to move in the inner cavities of the first telescopic rod 602 and the second telescopic rod 702 respectively, until the first probe 601 and the second probe 701 are completely propped against the light source interfaces of the PD chip, then the worker can observe the response of the tested PD chip through a display screen 203 on the front side of the testing host 2, and particularly, when the whole device is not in use, the whole device can be driven by a push handle 1022 to move to one side of a sub-plate 1021 until the top of the sub-plate 103 is completely covered by the top of the supporting base 1.
The foregoing description of the preferred embodiments of the utility model is not intended to be limiting, but rather is intended to cover all modifications, equivalents, alternatives, and improvements that fall within the spirit and scope of the utility model.
Claims (10)
1. The utility model provides a PD chip responsivity test system, includes support base (1), its characterized in that, rectangular open slot has been seted up at the top of support base (1), relative circular open slot has been seted up to the top rectangular open slot both sides of support base (1), the circular open slot of the grooved one side of top rectangular open slot of support base (1) internal fixation has first flexible pipe (602), the inner chamber swing joint of first flexible pipe (602) has first telescopic link (6), the circular open slot internal fixation of the grooved opposite side of top rectangular open slot of support base (1) has second flexible pipe (702), the inner chamber swing joint of second flexible pipe (702) has second telescopic link (7).
2. The PD chip responsiveness test system according to claim 1, wherein the top of the support base (1) is fixedly connected with a test host (2), an internal communication end of the test host (2) is fixedly connected with a first probe (601), and the first probe (601) penetrates through a circular opening on one side of the first telescopic tube (602) and a circular opening in the middle of the first telescopic rod (6) and is fixedly connected to one side of the first telescopic rod (6).
3. The PD chip responsiveness test system according to claim 2, wherein the internal communication end of the test host (2) is fixedly connected with a second probe (701), and the second probe (701) penetrates through a circular opening on one side of the second telescopic tube (702) and a circular opening on the middle of the second telescopic rod (7) and is fixedly connected to one side of the second telescopic rod (7).
4. The PD chip responsiveness test system according to claim 1, wherein an anode source (5) is fixedly connected in the rectangular slot at the top of the support base (1), the front surface of the anode source (5) is fixedly connected with an anode block (3), and the back input end of the anode source (5) is electrically connected with the output end inside the test host (2).
5. The PD chip responsiveness test system according to claim 1, wherein a negative-stage source (4) is fixedly connected to a side opposite to the positive-stage source (5) in the rectangular slot at the top of the support base (1), and a back input end of the negative-stage source (4) is electrically connected to an output end inside the test host (2).
6. The PD chip responsiveness test system according to claim 1, wherein a foot pad (101) is fixedly connected around the bottom of the support base (1).
7. The PD chip responsiveness test system according to claim 2, wherein a power interface (201) is fixedly connected to one side of the test host (2).
8. The PD chip responsiveness test system according to claim 2, wherein the front surface of the test host (2) is fixedly connected with a display screen (203), and the front surface of the test host (2) is movably connected with a control button (202) below the display screen (203).
9. The PD chip responsiveness test system according to claim 1, wherein the support base (1) is fixedly connected with an opening and closing sub-plate (103) at a side close to the top rectangular slot.
10. The PD chip responsiveness test system according to claim 9, wherein the support base (1) is fixedly connected with an opening and closing main board (102) on one side, which is close to the top rectangular slot and is opposite to the opening and closing auxiliary board (103), a transverse slot is formed through the top of the opening and closing main board (102), a cover plate (1021) is movably connected inside the opening and closing main board (102), the size of the cover plate (1021) is consistent with the size of the top rectangular slot of the support base (1), and a pushing handle (1022) is fixedly connected to the top of the cover plate (1021).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202320468099.2U CN220509969U (en) | 2023-03-13 | 2023-03-13 | PD chip responsivity test system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202320468099.2U CN220509969U (en) | 2023-03-13 | 2023-03-13 | PD chip responsivity test system |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN220509969U true CN220509969U (en) | 2024-02-20 |
Family
ID=89876848
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202320468099.2U Active CN220509969U (en) | 2023-03-13 | 2023-03-13 | PD chip responsivity test system |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN220509969U (en) |
-
2023
- 2023-03-13 CN CN202320468099.2U patent/CN220509969U/en active Active
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN206649122U (en) | A kind of test device based on PLCC and QFP encapsulation chips | |
| CN218037175U (en) | Independent temperature control aging test seat | |
| CN220509969U (en) | PD chip responsivity test system | |
| CN204495929U (en) | A kind of communication terminal screen testing device | |
| CN205450198U (en) | Thick film hybrid integrated circuit tester | |
| CN109116145B (en) | A kind of portable oscillograph with power-off protection function | |
| CN215449558U (en) | Contact condition detection device for injection molding plug | |
| CN208140914U (en) | A kind of electric energy meter aging apparatus for impact testing | |
| CN108922575A (en) | A kind of thimble test fixture of PCIE solid state hard disk | |
| CN208385354U (en) | A kind of packaging semiconductor plastic-sealed body insulation detection device | |
| CN205280833U (en) | A test platform for LCM development | |
| CN209640421U (en) | A kind of fixture and mobile terminal screen detection device for mobile terminal screen detection | |
| CN208314154U (en) | A kind of lithium battery inner walkway auxiliary mould | |
| CN205404750U (en) | Thick film hybrid integrated circuit test system | |
| CN112881898A (en) | High-temperature aging test device for integrated circuit | |
| CN107664706B (en) | LED measuring clamp | |
| CN205388612U (en) | Modified chip test fixture | |
| CN204903576U (en) | Integrated circuit test fixture | |
| CN111522325A (en) | Jig for checking availability of temperature control panel | |
| CN213240423U (en) | Module power management chip test equipment | |
| CN213750065U (en) | Computer mainboard voltage detection device | |
| CN215865693U (en) | Multifunctional test bench for testing integrated valve | |
| CN218003643U (en) | Integrated circuit fault detection device | |
| CN213600831U (en) | Wafer production is with multi-functional inspection desk | |
| CN220603420U (en) | Gas sensor testing arrangement |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant |