CN220154591U

CN220154591U - Signal transmission test fixture

Info

Publication number: CN220154591U
Application number: CN202321608040.5U
Authority: CN
Inventors: 夏世朋; 舒江林
Original assignee: Zhuhai Chuangxin Electronics Co ltd
Current assignee: Zhuhai Chuangxin Electronics Co ltd
Priority date: 2023-06-25
Filing date: 2023-06-25
Publication date: 2023-12-08
Anticipated expiration: 2033-06-25

Abstract

The utility model relates to the technical field of test jigs, in particular to a signal transmission test jig which comprises a base, wherein a control button is arranged on the surface of the base, a cover plate is rotatably connected to the surface of the base, a test mechanism is arranged on the surface of the cover plate, the test mechanism comprises a positioning seat, a probe, a pressing plate, a driving pressing part, a fixing frame, a pressing rod and a guide post, the base is detachably connected with the cover plate through an overhaul mechanism, the overhaul mechanism consists of a connecting assembly, a fixing plate and a pin groove, a buffer mechanism is arranged above the cover plate, and the buffer mechanism comprises a supporting frame and a buffer member. The utility model not only prolongs the service life of the test jig, but also improves the convenience degree of the test jig during maintenance.

Description

Signal transmission test fixture

Technical Field

The utility model relates to the technical field of test jigs, in particular to a signal transmission test jig.

Background

The circuit board is welded with a large number of electronic components, such as capacitors, resistors, chips, diodes and the like, and after the electronic components are welded with the circuit board, signal transmission test is required to be carried out on the circuit board in order to ensure the welding stability of the electronic components and the circuit board.

The test fixture generally performs signal transmission test on the circuit board through the probe, the circuit board and the probe are contacted with each other under the action of the pressing plate during test, and the pressing plate is easy to damage the probe or the circuit board due to overlarge impact during downward movement of the pressing plate, so that the service life of the test fixture is influenced; if need examine and repair the inside time of testing jig, dismantle base and apron through need, general dismouting mode is screw dismouting, comparatively loaded down with trivial details to the degree of convenience when having reduced testing jig and overhauld.

Disclosure of Invention

The utility model aims to provide a signal transmission test fixture so as to solve the problems that the service life of the test fixture is easy to influence when the test fixture is used and the convenience degree is low when overhauling.

In order to achieve the above purpose, the present utility model provides the following technical solutions: the utility model provides a signal transmission test fixture, includes the base, the surface mounting of base has control button, the surface rotation of base is connected with the apron, the surface of apron is provided with testing mechanism, testing mechanism's inside is including positioning seat, probe, clamp plate, drive pressing part, mount, depression bar and guide post, dismantle through maintenance mechanism between base and the apron and be connected, maintenance mechanism comprises coupling assembling, fixed plate and keyway, the top of apron is provided with buffer gear, buffer gear's inside includes support frame and buffer member.

Preferably, a positioning seat is fixed on the surface of the cover plate through a screw, the positioning seat is matched with the circuit board to be tested, a probe is mounted on the surface of the positioning seat, and the input end of the probe is electrically connected with the output end of the control button.

Preferably, a fixing frame is fixed on one side of the surface of the cover plate, a driving pressing component is arranged on the surface of the fixing frame, a pressing plate is fixed at one end of the driving pressing component, a pressing rod is fixed at the bottom of the pressing plate, a guide column is fixed on the surface of the fixing frame, one end of the guide column is fixedly connected with the surface of the base, and the guide column and the pressing plate are in sliding fit with each other.

Preferably, a fixing plate is fixed on one side of the inner wall of the cover plate, pin grooves are formed in the surfaces of the fixing plate, a connecting assembly is mounted on the surface of the base, and the connecting assembly is matched with the pin grooves.

Preferably, the inside of coupling assembling includes arm-tie, extension spring and pin, one side of base is provided with the arm-tie, one side of arm-tie all is fixed with the pin, the one end of pin runs through the base and with the mutual grafting cooperation of pin groove.

Preferably, the surface of the pin rod is sleeved with an extension spring, and two ends of the extension spring are fixedly connected with the surfaces of the base and the pulling plate respectively.

Preferably, the support frame is arranged below the pressing plate, one end of the support frame is fixedly connected with the guide post through the support plate, and a buffer component is arranged on the surface of the support frame.

Preferably, the inside of buffering component includes buffer board, buffer spring and telescopic link, the top of support frame is provided with the buffer board, the surface of support frame all is fixed with the telescopic link, the one end of telescopic link and the surface looks fixed connection of buffer board, the surface cover of telescopic link is equipped with buffer spring, buffer spring's both ends are fixed connection with the surface of support frame and buffer board respectively.

Compared with the prior art, the utility model has the beneficial effects that: the signal transmission test fixture not only prolongs the service life of the test fixture, but also improves the convenience degree of the test fixture during maintenance;

1. through being provided with buffer gear, when the clamp plate drives the press bar to press the circuit board and admittedly, the clamp plate extrudes the buffer board, makes buffer spring shrink to guide the buffer board under the effect of telescopic link, at this moment, can cushion the partial pressure that the clamp plate produced and unload the power under buffer spring's effect, avoid the clamp plate to cause the damage to circuit board or probe because of the impact is too big, influence the use of test fixture to realize the buffer function of test fixture, thereby prolonged test fixture's life;

2. through being provided with testing mechanism, the pin rod blocks to the inside of pin groove under the effect of extension spring, makes coupling assembling fix apron and base, if need to overhaul the inside device of base be, can stimulate the arm-tie, makes the arm-tie drive the pin rod and keep away from the pin groove, rotates the apron afterwards, opens the base, conveniently overhauls the base inside to realize the function of test jig convenient to overhaul, thereby improved the degree of convenience when test jig overhauls.

Drawings

FIG. 1 is a schematic view of a three-dimensional appearance structure of the present utility model;

FIG. 2 is a schematic diagram of a front view structure of the present utility model;

FIG. 3 is an enlarged schematic view of a partial side cross-section of the present utility model;

fig. 4 is an enlarged schematic view of the buffer mechanism of the present utility model.

In the figure: 1. a base; 101. a control button; 102. a cover plate; 2. a testing mechanism; 201. a positioning seat; 202. a probe; 203. a pressing plate; 204. driving the pressing member; 205. a fixing frame; 206. a compression bar; 207. a guide post; 3. an overhaul mechanism; 301. a connection assembly; 3011. pulling a plate; 3012. an extension spring; 3013. a pin rod; 302. a fixing plate; 303. a pin slot; 4. a buffer mechanism; 401. a support frame; 402. a buffer member; 4021. a buffer plate; 4022. a buffer spring; 4023. a telescopic rod.

Detailed Description

The technical solutions in the embodiments of the present utility model will be clearly and completely described below with reference to the drawings in the embodiments of the present utility model, and it is apparent that the described embodiments are only some embodiments of the present utility model, not all embodiments, and furthermore, the terms "first", "second", "third", "up, down, left, right", etc. are used for descriptive purposes only and are not to be construed as indicating or implying relative importance. Meanwhile, in the description of the present utility model, unless explicitly stated and defined otherwise, the terms "connected", "connected" and "connected" should be interpreted broadly, and for example, may be fixedly connected, detachably connected, or integrally connected; the mechanical connection and the electrical connection can be adopted; all other embodiments, which may be directly or indirectly through intermediaries, which may be obtained by a person of ordinary skill in the art without inventive effort based on the embodiments of the present utility model are within the scope of the present utility model.

The structure of the signal transmission test fixture provided by the utility model is shown in fig. 1 and 2, the signal transmission test fixture comprises a base 1, a control button 101 is arranged on the surface of the base 1, the model of the control button 101 can be LA series, a cover plate 102 is rotatably connected to the surface of the base 1, a test mechanism 2 is arranged on the surface of the cover plate 102, a positioning seat 201, a probe 202, a pressing plate 203, a driving pressing part 204, a fixing frame 205, a pressing rod 206 and a guide column 207 are arranged in the test mechanism 2, the positioning seat 201 is fixed on the surface of the cover plate 102 through screws, the positioning seat 201 is matched with a circuit board to be tested, a probe 202 is arranged on the surface of the positioning seat 201, the input end of the probe 202 is electrically connected with the output end of the control button 101, a fixing frame 205 is fixed on one side of the surface of the cover plate 102, a driving pressing part 204 is arranged on the surface of the fixing frame 205, a pressing plate 203 is fixed on one end of the driving pressing part 204, a pressing rod 206 is fixed on the bottom of the pressing plate 203, a guide column 207 is fixed on the surface of the fixing frame 205, one end of the guide column 207 is fixedly connected with the surface of the base 1, and the guide column 207 is in sliding fit with the pressing plate 203.

When the test fixture is used, a circuit board to be tested is placed on the surface of the positioning seat 201, the positioning seat 201 is matched with the circuit board to be tested, the circuit board can be positioned and placed under the action of the positioning seat 201, then the positioning seat 201 is operated, the positioning seat 201 drives the pressing plate 203 to move downwards, the pressing plate 203 is guided under the action of the guide column 207, the pressing plate 203 drives the pressing rod 206 to press and limit the circuit board, the circuit board is in contact with the probe 202, then the control button 101 is started, the circuit board is connected with the PC end through the connecting wire, the signal transmission test is carried out on the circuit board under the action of the probe 202, and the test result is transmitted to the PC end, so that the signal transmission test function of the test fixture is realized.

Further, as shown in fig. 3, the base 1 and the cover plate 102 are connected by disassembling the overhauling mechanism 3, the overhauling mechanism 3 is composed of a connecting component 301, a fixing plate 302 and a pin groove 303, the fixing plate 302 is fixed on one side of the inner wall of the cover plate 102, the pin groove 303 is formed in the surface of the fixing plate 302, the connecting component 301 is mounted on the surface of the base 1, the connecting component 301 is matched with the pin groove 303, the pull plate 3011, an extension spring 3012 and a pin 3013 are arranged in the connecting component 301, the pull plate 3011 is arranged on one side of the base 1, the pin 3013 is fixed on one side of the pull plate 3011, one end of the pin 3013 penetrates through the base 1 and is matched with the pin groove 303 in an inserting mode, the extension spring 3012 is sleeved on the surface of the pin 3013, and two ends of the extension spring 3012 are fixedly connected with the surfaces of the base 1 and the pull plate 3011 respectively.

During the use, the pin 3013 is blocked to the inside of pin groove 303 under the effect of extension spring 3012, makes coupling assembling 301 fix apron 102 and base 1, if need overhaul the inside device of base 1 be, can pull arm-tie 3011, makes arm-tie 3011 drive pin 3013 keep away from pin groove 303, rotates apron 102 afterwards, opens base 1, conveniently overhauls the inside function of examining and repairing of base 1 to realize test fixture easy access.

Further, as shown in fig. 4, a buffer mechanism 4 is disposed above the cover plate 102, the buffer mechanism 4 includes a support 401 and a buffer member 402, the support 401 is disposed below the pressing plate 203, one end of the support 401 is fixedly connected with the guide post 207 through a support plate, the buffer member 402 is mounted on the surface of the support 401, the buffer plate 4021, a buffer spring 4022 and a telescopic rod 4023 are disposed inside the buffer member 402, the buffer plate 4021 is disposed above the support 401, the telescopic rod 4023 is fixed on the surface of the support 401, one end of the telescopic rod 4023 is fixedly connected with the surface of the buffer plate 4021, the buffer spring 4022 is sleeved on the surface of the telescopic rod 4023, and two ends of the buffer spring 4022 are fixedly connected with the surface of the support 401 and the buffer plate 4021 respectively.

When in use, when the pressing plate 203 drives the pressing rod 206 to press and fix the circuit board, the pressing plate 203 extrudes the buffer plate 4021, so that the buffer spring 4022 contracts and guides the buffer plate 4021 under the action of the telescopic rod 4023, at this time, partial pressure generated by the pressing plate 203 can be buffered and unloaded under the action of the buffer spring 4022, and damage to the circuit board or the probe 202 caused by overlarge impact of the pressing plate 203 is avoided, so that the use of the test fixture is affected, and the buffer function of the test fixture is realized.

Working principle: when the test fixture is used, firstly, a circuit board to be tested is placed on the surface of the positioning seat 201, the positioning seat 201 is matched with the circuit board to be tested, the circuit board can be positioned and placed under the action of the positioning seat 201, then the positioning seat 201 is operated, the positioning seat 201 drives the pressing plate 203 to move downwards, the pressing plate 203 is guided under the action of the guide post 207, the pressing plate 203 drives the pressing rod 206 to press and limit the circuit board, the circuit board is in contact with the probe 202, then the control button 101 is started, the circuit board is connected with the PC end through the connecting wire, the signal transmission test is carried out on the circuit board under the action of the probe 202, and the test result is transmitted to the PC end, so that the signal transmission test function of the test fixture is realized.

When the pressing plate 203 drives the pressing rod 206 to press and fix the circuit board, the pressing plate 203 extrudes the buffer plate 4021, so that the buffer spring 4022 contracts and guides the buffer plate 4021 under the action of the telescopic rod 4023, at this time, partial pressure generated by the pressing plate 203 can be buffered and unloaded under the action of the buffer spring 4022, so that the damage to the circuit board or the probe 202 caused by overlarge impact of the pressing plate 203 is avoided, the use of the test fixture is affected, the buffer function of the test fixture is realized, and the service life of the test fixture is prolonged.

At this time, the pin 3013 is clamped to the inside of the pin slot 303 under the action of the extension spring 3012, so that the connecting component 301 fixes the cover plate 102 and the base 1, if the device inside the base 1 needs to be overhauled, the pull plate 3011 can be pulled, so that the pull plate 3011 drives the pin 3013 to be far away from the pin slot 303, and then the cover plate 102 is rotated to open the base 1, so that the inside of the base 1 is conveniently overhauled, the function of conveniently overhauling the test fixture is realized, the convenience degree of overhauling the test fixture is improved, and finally the use work of the test fixture is completed.

It will be evident to those skilled in the art that the utility model is not limited to the details of the foregoing illustrative embodiments, and that the present utility model may be embodied in other specific forms without departing from the spirit or essential characteristics thereof. The present embodiments are, therefore, to be considered in all respects as illustrative and not restrictive, the scope of the utility model being indicated by the appended claims rather than by the foregoing description, and all changes which come within the meaning and range of equivalency of the claims are therefore intended to be embraced therein. Any reference sign in a claim should not be construed as limiting the claim concerned.

Claims

1. Signal transmission test fixture, including base (1), its characterized in that: the surface mounting of base (1) has control button (101), the surface rotation of base (1) is connected with apron (102), the surface of apron (102) is provided with testing mechanism (2), the inside of testing mechanism (2) is including positioning seat (201), probe (202), clamp plate (203), drive pressing part (204), mount (205), depression bar (206) and guide post (207), dismantle through maintenance mechanism (3) between base (1) and apron (102) and be connected, maintenance mechanism (3) are by coupling assembling (301), fixed plate (302) and keyway (303) are constituteed, the top of apron (102) is provided with buffer gear (4), the inside of buffer gear (4) is contained support frame (401) and buffer member (402).

2. The signaling test fixture of claim 1, wherein: the surface of apron (102) is fixed with positioning seat (201) through the screw, positioning seat (201) matches with the test circuit board that awaits measuring, surface mounting of positioning seat (201) has probe (202), the input of probe (202) and the output electric connection of control button (101).

3. The signaling test fixture of claim 2, wherein: one side of apron (102) surface is fixed with mount (205), the surface mounting of mount (205) has drive to press part (204), the one end that drives to press part (204) is fixed with clamp plate (203), the bottom of clamp plate (203) all is fixed with depression bar (206), the surface mounting of mount (205) has guide post (207), the one end of guide post (207) is fixed connection with the surface of base (1), guide post (207) and clamp plate (203) sliding fit each other.

4. The signaling test fixture of claim 1, wherein: a fixing plate (302) is fixed on one side of the inner wall of the cover plate (102), pin grooves (303) are formed in the surface of the fixing plate (302), a connecting component (301) is mounted on the surface of the base (1), and the connecting component (301) and the pin grooves (303) are matched with each other.

5. The signaling test fixture of claim 4, wherein: the inside of coupling assembling (301) includes arm-tie (3011), extension spring (3012) and round pin pole (3013), one side of base (1) is provided with arm-tie (3011), one side of arm-tie (3011) all is fixed with round pin pole (3013), one end of round pin pole (3013) runs through base (1) and with pin groove (303) grafting cooperation each other.

6. The signaling test fixture of claim 5, wherein: the surface of the pin rod (3013) is sleeved with an extension spring (3012), and two ends of the extension spring (3012) are fixedly connected with the surfaces of the base (1) and the pull plate (3011) respectively.

7. The signaling test fixture of claim 1, wherein: the support frame (401) is arranged below the pressing plate (203), one end of the support frame (401) is fixedly connected with the guide column (207) through the support plate, and a buffer member (402) is arranged on the surface of the support frame (401).

8. The signaling test fixture of claim 7, wherein: the inside of cushioning component (402) includes buffer board (4021), buffer spring (4022) and telescopic link (4023), the top of support frame (401) is provided with buffer board (4021), the surface of support frame (401) all is fixed with telescopic link (4023), the one end of telescopic link (4023) is fixedly connected with the surface of buffer board (4021), the surface cover of telescopic link (4023) is equipped with buffer spring (4022), the both ends of buffer spring (4022) are fixedly connected with the surface of support frame (401) and buffer board (4021) respectively.