CN220509089U

CN220509089U - LCD logic board testing device

Info

Publication number: CN220509089U
Application number: CN202322061259.4U
Authority: CN
Inventors: 黄彩飞; 黄冠奎
Original assignee: Shenzhen Weidexun Photoelectric Ltd
Current assignee: Shenzhen Weidexun Photoelectric Ltd
Priority date: 2023-08-01
Filing date: 2023-08-01
Publication date: 2024-02-20
Anticipated expiration: 2033-08-01

Abstract

The utility model relates to the technical field of LCD logic boards, in particular to an LCD logic board testing device, which comprises a base, wherein the surface of the base is provided with a jig seat, the surface of the base is fixedly provided with a support frame, the surface of the support frame is provided with a pressing plate, the surface of the support frame is provided with an electric push rod, the surface of a mounting plate is provided with a testing probe, the base and the jig seat are detachably connected through a dismounting mechanism, the dismounting mechanism consists of a jack and a dismounting member, the bottom of the support frame is sleeved with a buffer mechanism, and the surface of the mounting plate is provided with a wiring mechanism. The utility model not only improves the convenience of the testing device for disassembling and assembling the jig seat for placing the LCD logic board, so that the LCD logic board and the testing probe are not easy to be damaged due to overlarge pressure, but also avoids the phenomenon that the connecting wires of the testing probe are placed in disorder when the testing device is used.

Description

LCD logic board testing device

Technical Field

The utility model relates to the technical field of LCD logic boards, in particular to an LCD logic board testing device.

Background

The LCD logic board is a central control board of a display screen, and is TCON, and the LCD logic board is required to continuously test semi-finished products and finished products in the manufacturing process, reject defective products, send genuine products into the next working procedure for processing, and also is required to carry out inspection and recheck on outgoing products again.

The LCD logic board is tested by fixing the LCD logic board jig on the surface of the testing device, placing the LCD logic board in the jig, and then driving the probe to perform electrical performance test by the pressing plate, wherein the jig is generally fixed by a screw, and a tool is needed to be used for fixing, so that the convenience of the testing device in assembling and disassembling the LCD logic board jig is influenced; when the pressure plate drives the probe to move downwards, the pressure is easy to be overlarge, the probe is generally thinner, and the probe or an LCD logic board is easy to be damaged when the pressure of the pressure plate is overlarge; because the probes for testing the LCD logic board are generally connected with the test instrument through connecting wires, the testing device is generally not easy to wire the connecting wires of the probes, and the phenomenon that the connecting wires are placed in disorder easily occurs when the testing device is used is easy to cause.

Disclosure of Invention

The utility model aims to provide an LCD logic board testing device, which solves the problems that the testing device has low convenience degree when the LCD logic board fixture is disassembled and assembled, the probe or the LCD logic board is easy to damage, and the connecting wires are easy to be placed in disorder in the prior art.

In order to achieve the above purpose, the present utility model provides the following technical solutions: the LCD logic board testing device comprises a base, the surface mounting of base has the control to arrange the key, the surface of base is provided with the tool seat, the fixed surface of base has the support frame, the surface of support frame is provided with the clamp plate, clamp plate and the mutual sliding fit of support frame, the surface mounting of support frame has electric putter, electric putter's one end and the surface looks fixed connection of clamp plate, the mounting panel is all installed through the screw to the bottom of clamp plate, test probe is all installed to the surface of mounting panel, the base is dismantled through dismouting mechanism with the tool seat and is connected, dismouting mechanism comprises jack and dismouting component, the bottom of support frame all overlaps and is equipped with buffer gear, buffer gear comprises pressure section of thick bamboo and buffer subassembly, the surface of mounting panel is provided with wiring mechanism, wiring mechanism comprises wiring subassembly and couple.

Preferably, the corner positions of the jig seat are provided with jacks, and the surfaces of the base are provided with dismounting members.

Preferably, the inside of dismouting component is provided with changeing handle, spiral shell section of thick bamboo and double-screw bolt, the surface of base is all fixed with the double-screw bolt, double-screw bolt and jack grafting cooperation each other.

Preferably, one end of the stud is sleeved with a screw cylinder, the screw cylinder is in threaded fit with the stud, the surface of the screw cylinder is tightly attached to the surface of the jig seat, and a rotating handle is fixed at one end of the screw cylinder.

Preferably, the bottom of support frame all overlaps and is equipped with the pressure section of thick bamboo, the surface of pressure section of thick bamboo is fixedly connected with the surface of clamp plate, the below of pressure section of thick bamboo is provided with buffer unit.

Preferably, the inside of buffering subassembly is including fixed section of thick bamboo, buffer spring and buffer piece, the bottom position department of clamp plate is fixed with fixed section of thick bamboo, the inside of fixed section of thick bamboo is provided with the buffer piece, the buffer piece is mutually sliding fit with fixed section of thick bamboo, the diameter of buffer piece is greater than the diameter of pressure section of thick bamboo.

Preferably, one end of the buffer spring is fixed with the buffer spring, and one end of the buffer spring is fixedly connected with the bottom of the pressing cylinder.

Preferably, one end of the mounting plate is rotatably connected with a hook, one end of the mounting plate is provided with a wiring assembly, and the wiring assembly is matched with the hook.

Preferably, the wiring assembly comprises a wire frame, a pressing sheet, a compression spring and a hanging bolt, wherein the wire frame is fixed at one end of the mounting plate, and the pressing sheet is arranged in the wire frame.

Preferably, the surface of the pressing sheet is fixed with a pressing spring, one end of the pressing spring is fixedly connected with the inner wall of the wire frame, a hanging bolt is fixed at the center of the surface of the pressing sheet, and the hanging bolt is mutually connected with the hanging hook in a hanging mode.

Compared with the prior art, the utility model has the beneficial effects that: the LCD logic board testing device not only improves the convenience of the testing device when the testing device is disassembled and assembled to be used for placing the jig base of the LCD logic board, so that the LCD logic board and the testing probe are not easy to damage due to overlarge pressure, but also avoids the phenomenon that the connecting wires of the testing probe are placed in disorder when the testing device is used;

1. through being provided with the dismouting mechanism, will be equipped with the tool seat and put to the top of base, will jack cover to the surface of double-screw bolt again, to the tool seat location place, will follow the spiral shell section of thick bamboo and overlap to one end of double-screw bolt again, rotatory commentaries on classics handle makes the rotatory handle drive spiral shell section of thick bamboo rotatory, extrudees the tool seat fixedly under the screw thread cooperation of spiral shell section of thick bamboo and double-screw bolt to realize the function that testing arrangement was convenient for dismouting tool seat, thereby improved the convenience when testing arrangement dismouting is used for placing the tool seat of LCD logic board;

2. the buffer mechanism is arranged, the buffer assembly is driven to synchronously move when the pressing plate moves downwards, so that the buffer assembly is contacted with the buffer sheet, when the pressing plate continues to move downwards, the buffer assembly extrudes the buffer sheet, so that the buffer sheet drives the buffer spring to shrink, and the buffer assembly is buffered under the action of the buffer spring, so that the pressing plate is buffered, the buffer function of the testing device is realized, and the LCD logic board and the testing probe are not easy to damage due to overlarge pressure;

3. through being provided with wiring mechanism, pass between wire frame and the preforming with test probe's the connecting wire, be connected connecting wire and test instrument again, rotate the couple afterwards, make couple one end keep away from the peg, at this moment, the preforming is pressed down the effect of spring and is moved down, and is fixed with the connecting wire to realize testing arrangement to test probe connecting wire's wiring function, thereby avoided taking place test probe connecting wire in disorder when testing arrangement uses the phenomenon.

Drawings

FIG. 1 is a schematic view of a three-dimensional appearance structure of the present utility model;

FIG. 2 is a schematic view of a front cross-sectional structure of the present utility model;

FIG. 3 is a schematic view of a partially enlarged structure of the present utility model;

fig. 4 is an enlarged schematic view of the wiring mechanism of the present utility model.

In the figure: 1. a base; 101. controlling the row keys; 102. a jig base; 103. a support frame; 104. an electric push rod; 105. a pressing plate; 106. a test probe; 107. a mounting plate; 2. a disassembly and assembly mechanism; 201. a jack; 202. disassembling and assembling the component; 2021. a rotating handle; 2022. a screw cylinder; 2023. a stud; 3. a buffer mechanism; 301. pressing a cylinder; 302. a buffer assembly; 3021. a fixed cylinder; 3022. a buffer spring; 3023. a buffer sheet; 4. a wiring mechanism; 401. a wiring assembly; 4011. a wire frame; 4012. tabletting; 4013. compressing the spring; 4014. hanging bolts; 402. a hook.

Detailed Description

The technical solutions in the embodiments of the present utility model will be clearly and completely described below with reference to the drawings in the embodiments of the present utility model, and it is apparent that the described embodiments are only some embodiments of the present utility model, not all embodiments, and furthermore, the terms "first", "second", "third", "up, down, left, right", etc. are used for descriptive purposes only and are not to be construed as indicating or implying relative importance. Meanwhile, in the description of the present utility model, unless explicitly stated and defined otherwise, the terms "connected", "connected" and "connected" should be interpreted broadly, and for example, may be fixedly connected, detachably connected, or integrally connected; the mechanical connection and the electrical connection can be adopted; all other embodiments, which may be directly or indirectly through intermediaries, which may be obtained by a person of ordinary skill in the art without inventive effort based on the embodiments of the present utility model are within the scope of the present utility model.

The structure of the LCD logic board testing device provided by the utility model is as shown in fig. 1 and 2, the LCD logic board testing device comprises a base 1, a control row key 101 is arranged on the surface of the base 1, the model of the control row key 101 can be LA series, a jig seat 102 is arranged on the surface of the base 1, a support frame 103 is fixed on the surface of the base 1, a pressing plate 105 is arranged on the surface of the support frame 103, the pressing plate 105 is in sliding fit with the support frame 103, an electric push rod 104 is arranged on the surface of the support frame 103, the model of the electric push rod 104 can be TA series, one end of the electric push rod 104 is fixedly connected with the surface of the pressing plate 105, a mounting plate 107 is arranged at the bottom of the pressing plate 105 through screws, and a testing probe 106 is arranged on the surface of the mounting plate 107.

When the device is used, an LCD logic board to be tested is placed in the jig seat 102, then the control row key 101 is operated, the control row key 101 controls the electric push rod 104 to work, the pressing plate 105 is driven to slide downwards along the supporting frame 103 under the action of the electric push rod 104, the test probe 106 is driven to synchronously downwards, the test probe 106 is contacted with the LCD logic board, and the test instrument performs electrical performance test on the LCD logic board under the action of the test probe 106.

Further, as shown in fig. 3, the base 1 is detachably connected with the jig base 102 through the dismounting mechanism 2, the dismounting mechanism 2 is composed of an insertion hole 201 and a dismounting member 202, the insertion hole 201 is formed in the corner position of the jig base 102, the dismounting member 202 is arranged on the surface of the base 1, the rotating handle 2021, the screw cylinder 2022 and the screw bolt 2023 are arranged in the dismounting member 202, the screw bolt 2023 is fixed on the surface of the base 1, the screw bolt 2023 is mutually inserted and matched with the insertion hole 201, the screw cylinder 2022 is sleeved at one end of the screw bolt 2023, the screw cylinder 2022 is mutually in threaded fit with the screw bolt 2023, the surface of the screw cylinder 2022 is tightly attached to the surface of the jig base 102, and the rotating handle 2021 is fixed at one end of the screw cylinder 2022.

When the testing device is used, the jig base 102 is placed above the base 1, the insertion holes 201 are sleeved on the surface of the stud 2023, the jig base 102 is positioned and placed, the screw cylinder 2022 is sleeved on one end of the stud 2023, the rotating handle 2021 is rotated, the rotating handle 2021 drives the screw cylinder 2022 to rotate, and the jig base 102 is extruded and fixed under the threaded fit of the screw cylinder 2022 and the stud 2023, so that the testing device is convenient to disassemble and assemble.

Further, as shown in fig. 2 and 3, the bottom of the support frame 103 is sleeved with a buffer mechanism 3, the buffer mechanism 3 is composed of a pressing cylinder 301 and a buffer assembly 302, the bottom of the support frame 103 is sleeved with the pressing cylinder 301, the surface of the pressing cylinder 301 is fixedly connected with the surface of the pressing plate 105, the buffer assembly 302 is arranged below the pressing cylinder 301, the buffer assembly 302 comprises a fixing cylinder 3021, a buffer spring 3022 and a buffer sheet 3023, the fixing cylinder 3021 is fixed at the bottom of the pressing plate 105, the buffer sheet 3023 is arranged inside the fixing cylinder 3021, the buffer sheet 3023 is in sliding fit with the fixing cylinder 3021, the diameter of the buffer sheet 3023 is larger than that of the pressing cylinder 301, one end of the buffer spring 3022 is fixedly connected with the bottom of the pressing cylinder 301, and the other end of the buffer spring 3022 is fixedly connected with the bottom of the pressing cylinder 301.

When the testing device is used, the pressing plate 105 moves downwards to drive the buffer assemblies 302 to synchronously move, so that the buffer assemblies 302 are in contact with the buffer sheets 3023, when the pressing plate 105 continues to move downwards, the buffer assemblies 302 squeeze the buffer sheets 3023, so that the buffer sheets 3023 drive the buffer springs 3022 to shrink, the buffer assemblies 302 are buffered under the action of the buffer springs 3022, and therefore the pressing plate 105 is buffered, and the buffering function of the testing device is achieved.

Further, as shown in fig. 4, a wiring mechanism 4 is disposed on the surface of the mounting plate 107, the wiring mechanism 4 is composed of a wiring component 401 and a hook 402, one end of the mounting plate 107 is rotatably connected with the hook 402, one end of the mounting plate 107 is provided with the wiring component 401, the wiring component 401 is mutually matched with the hook 402, the interior of the wiring component 401 comprises a wire frame 4011, a pressing sheet 4012, a pressing spring 4013 and a hanging bolt 4014, one end of the mounting plate 107 is fixedly provided with the wire frame 4011, the pressing sheet 4012 is internally provided with the pressing sheet 4012, the pressing spring 4013 is fixedly connected with the inner wall of the wire frame 4011 on the surface of the pressing sheet 4012, the hanging bolt 4014 is fixedly arranged at the central position of the surface of the pressing sheet 4012, and the hanging bolt 4014 is mutually hung and matched with the hook 402.

When the testing device is used, a connecting wire of the testing probe 106 passes through the space between the wire frame 4011 and the pressing piece 4012, then the connecting wire is connected with a testing instrument, then the hook 402 is rotated to enable one end of the hook 402 to be far away from the hanging bolt 4014, at the moment, the pressing piece 4012 moves downwards under the action of the pressing spring 4013 to clamp the connecting wire, and therefore the wiring function of the testing device on the connecting wire of the testing probe 106 is achieved.

Working principle: when the testing device is used, firstly, the jig base 102 is placed above the base 1, then the insertion holes 201 are sleeved on the surface of the stud 2023, the jig base 102 is positioned and placed, then the screw cylinder 2022 is sleeved on one end of the stud 2023, and then the rotating handle 2021 is rotated, so that the rotating handle 2021 drives the screw cylinder 2022 to rotate, the jig base 102 is extruded and fixed under the threaded fit of the screw cylinder 2022 and the stud 2023, the function of the testing device that the jig base 102 is convenient to disassemble and assemble is achieved, and the convenience degree of the testing device in disassembling and assembling the jig base 102 for placing LCD logic boards is improved.

Then the connecting wire of the test probe 106 passes through the space between the wire frame 4011 and the pressing piece 4012, then the connecting wire is connected with the test instrument, then the hook 402 is rotated to enable one end of the hook 402 to be far away from the hanging bolt 4014, at the moment, the pressing piece 4012 moves downwards under the action of the pressing spring 4013 to clamp the connecting wire, so that the wiring function of the test device on the connecting wire of the test probe 106 is realized, and the phenomenon that the connecting wire of the test probe 106 is placed in disorder when the test device is used is avoided.

Then the LCD logic board to be tested is placed in the jig seat 102, then the control row key 101 is operated, so that the control row key 101 controls the electric push rod 104 to work, the pressing plate 105 is driven to slide downwards along the supporting frame 103 under the action of the electric push rod 104, the test probe 106 is driven to synchronously slide downwards, the test probe 106 is contacted with the LCD logic board, and the test instrument performs electrical performance test on the LCD logic board under the action of the test probe 106.

Meanwhile, the pressing plate 105 moves downwards to drive the buffer assembly 302 to synchronously move, so that the buffer assembly 302 is in contact with the buffer sheet 3023, when the pressing plate 105 continues to move downwards, the buffer assembly 302 extrudes the buffer sheet 3023, so that the buffer sheet 3023 drives the buffer spring 3022 to shrink, the buffer assembly 302 is buffered under the action of the buffer spring 3022, and therefore the pressing plate 105 is buffered, the buffer function of the testing device is achieved, the LCD logic board and the testing probe 106 are not easy to damage due to overlarge pressure, and finally the use of the testing device is completed.

It will be evident to those skilled in the art that the utility model is not limited to the details of the foregoing illustrative embodiments, and that the present utility model may be embodied in other specific forms without departing from the spirit or essential characteristics thereof. The present embodiments are, therefore, to be considered in all respects as illustrative and not restrictive, the scope of the utility model being indicated by the appended claims rather than by the foregoing description, and all changes which come within the meaning and range of equivalency of the claims are therefore intended to be embraced therein. Any reference sign in a claim should not be construed as limiting the claim concerned.

Claims

LCD logical board testing arrangement, including base (1), its characterized in that: the surface mounting of base (1) has control row key (101), the surface of base (1) is provided with tool seat (102), the fixed surface of base (1) has support frame (103), the surface of support frame (103) is provided with clamp plate (105), the mutual sliding fit of clamp plate (105) and support frame (103), the surface mounting of support frame (103) has electric putter (104), the one end of electric putter (104) is fixedly connected with the surface of clamp plate (105), mounting panel (107) are all installed through the screw to the bottom of clamp plate (105), test probe (106) are all installed on the surface of mounting panel (107), the base (1) is connected through dismouting mechanism (2) dismantlement with tool seat (102), dismouting mechanism (2) are constituteed by jack (201) and dismouting component (202), the bottom of support frame (103) is all overlapped and is equipped with buffer gear (3), buffer gear (3) comprise pressure section of thick bamboo (301) and buffer assembly (302), the surface mounting panel (107) is provided with wiring mechanism (4) and wiring assembly (401) are constituteed by wiring assembly (401).
2. The LCD logic board test device according to claim 1, wherein: the jig is characterized in that insertion holes (201) are formed in corner positions of the jig base (102), and dismounting members (202) are arranged on the surface of the base (1).
3. The LCD logic board test apparatus according to claim 2, wherein: the inside of dismouting component (202) is provided with changeing handle (2021), spiral shell section of thick bamboo (2022) and double-screw bolt (2023), the surface of base (1) is all fixed with double-screw bolt (2023), double-screw bolt (2023) and jack (201) are pegged graft mutually and are cooperated.
4. The LCD logic board test apparatus of claim 3, wherein: one end of the stud (2023) is sleeved with a screw cylinder (2022), the screw cylinder (2022) is in threaded fit with the stud (2023), the surface of the screw cylinder (2022) is tightly attached to the surface of the jig base (102), and a rotating handle (2021) is fixed at one end of the screw cylinder (2022).
5. The LCD logic board test device according to claim 1, wherein: the bottom of support frame (103) all overlaps and is equipped with pressure section of thick bamboo (301), the surface of pressure section of thick bamboo (301) is connected with the surface of clamp plate (105) fixed, the below of pressure section of thick bamboo (301) is provided with buffer unit (302).
6. The LCD logic board test apparatus according to claim 5, wherein: the inside of buffering subassembly (302) is including fixed section of thick bamboo (3021), buffer spring (3022) and buffer piece (3023), the bottom position department of clamp plate (105) is fixed with fixed section of thick bamboo (3021), the inside of fixed section of thick bamboo (3021) is provided with buffer piece (3023), the mutual sliding fit of buffer piece (3023) and fixed section of thick bamboo (3021), the diameter of buffer piece (3023) is greater than the diameter of clamp cylinder (301).
7. The LCD logic board test apparatus according to claim 6, wherein: one end of the buffer spring (3022) is fixed with the buffer spring (3022), and one end of the buffer spring (3022) is fixedly connected with the bottom of the pressure cylinder (301).
8. The LCD logic board test device according to claim 1, wherein: one end of mounting panel (107) rotates and is connected with couple (402), one end of mounting panel (107) is provided with wiring subassembly (401), wiring subassembly (401) and couple (402) mutually support.
9. The LCD logic board test device according to claim 8, wherein: the inside of wiring subassembly (401) contains wire frame (4011), preforming (4012), sticiss spring (4013) and peg (4014), wire frame (4011) is fixed to one end of mounting panel (107), the inside of wire frame (4011) is provided with preforming (4012).
10. The LCD logic board test apparatus according to claim 9, wherein: the surface of preforming (4012) is all fixed with sticiss spring (4013), sticiss spring (4013) one end and the inner wall of wire frame (4011) are fixed connection, the central point department on preforming (4012) surface is fixed with and hangs bolt (4014), hang bolt (4014) and couple (402) and hang the cooperation each other.