CN218036982U - Test jig for ET test - Google Patents

Test jig for ET test Download PDF

Info

Publication number
CN218036982U
CN218036982U CN202222167783.5U CN202222167783U CN218036982U CN 218036982 U CN218036982 U CN 218036982U CN 202222167783 U CN202222167783 U CN 202222167783U CN 218036982 U CN218036982 U CN 218036982U
Authority
CN
China
Prior art keywords
pressing
jig
test
fixedly connected
base
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN202222167783.5U
Other languages
Chinese (zh)
Inventor
阙小刚
钱逸春
陈雅琼
张立群
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Suzhou Yiyuan Technology Co ltd
Original Assignee
Suzhou Yiyuan Technology Co ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Suzhou Yiyuan Technology Co ltd filed Critical Suzhou Yiyuan Technology Co ltd
Priority to CN202222167783.5U priority Critical patent/CN218036982U/en
Application granted granted Critical
Publication of CN218036982U publication Critical patent/CN218036982U/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Landscapes

  • Tests Of Electronic Circuits (AREA)

Abstract

The utility model discloses a test jig is used in ET test relates to PCB check out test set technical field, include: a base; the side bracket is fixedly arranged at the rear part of the upper end of the base; the downward pressing driving component is fixedly arranged at the upper end of the side bracket and comprises a downward pressing handle, the downward pressing handle is L-shaped, the tail end of the downward pressing handle is hinged with the upper hinged bracket, the bent part of the downward pressing handle is connected with a downward pressing guide pillar through a transmission part, and the lower end of the downward pressing guide pillar is connected with a downward mounting head in a sliding manner; the upper pressing component is fixedly arranged at the lower end of the lower mounting head; and the positioning jig is fixedly arranged above the jig mounting table. The utility model has the advantages that: the lower end of the lower pressing guide post is provided with the sliding lower mounting head to mount the upper pressing assembly, a certain buffer stroke can be provided, ET testing can be performed on flexible boards to be tested with different thicknesses through the buffer stroke, and meanwhile, the situation that the flexible boards to be tested are crushed due to the fact that the pressing force of the upper pressing assembly on the flexible boards to be tested is too large is reduced.

Description

Test jig for ET test
Technical Field
The utility model relates to a PCB check out test set technical field specifically is a test jig is used in ET test.
Background
In PCB electrical test, the test jig is the used test fixture of ET test in the PCB industry, however current test jig that carries out the ET test drives through rotating the handle and pushes down the guide pillar and move down, and then drives to connect and move down and compress tightly the back to the flexible board of awaiting measuring in last pressure subassembly of pushing down the guide pillar lower extreme, carries out electrical test to it, this kind of structure easy operation, and it is fast to push down, can realize compressing tightly fast to the flexible board of awaiting measuring, does benefit to and improves detection efficiency.
Then current be used for the test jig of ET test, its stroke of pushing down is relevant with the structure that rotates the handle, is fixed stroke usually, and this just leads to the test jig to be not convenient for compress tightly fixedly to the examination gentle board that awaits measuring of different thickness, and in addition when the operation, if the staff does not with the examination gentle board that awaits measuring accurate place in the constant head tank, the test jig of current structure pushes down and can lead to the subassembly of pushing up to crush examination gentle board.
SUMMERY OF THE UTILITY MODEL
For solving above-mentioned technical problem, provide a test jig for ET test, this technical scheme has solved foretell current test jig for ET test, its stroke of pushing down is relevant with the structure that rotates the handle, usually is fixed stroke, and this just leads to the test jig to be not convenient for compress tightly fixedly to the examination of awaiting measuring flexible board of different thickness, and in addition when the operation, if the staff will not wait to examine the accurate when placing in the constant head tank of flexible board, the test jig of current structure pushes down and can lead to the problem that the examination of awaiting measuring flexible board is crushed to the top pressure subassembly.
In order to achieve the above purpose, the utility model adopts the technical scheme that:
a test jig for ET testing, comprising:
the middle part of the upper end of the base is fixedly connected with a jig mounting table;
the side support is fixedly arranged at the rear part of the upper end of the base, the side support vertically extends upwards, and the front side of the upper end of the side support is fixedly provided with an upper mounting plate;
the lower pressing driving assembly is fixedly arranged on the front side of the upper mounting plate and comprises a mounting seat, the upper end of the front side of the mounting seat is fixedly connected with an upper hinged frame, the tail end of the upper hinged frame is hinged with a lower pressing handle, the lower pressing handle is L-shaped, the tail end of the lower pressing handle is hinged with the upper hinged frame, two sides of the bent part of the lower pressing handle are hinged with transmission parts, the lower end of each transmission part is hinged with a lower pressing guide pillar, the lower end of the front side of the mounting seat is fixedly connected with a lower guide sleeve, the lower pressing guide pillars are slidably connected inside the lower guide sleeves, and the lower ends of the lower pressing guide pillars are slidably connected with lower mounting heads;
the upper pressing component is fixedly arranged at the lower end of the lower mounting head;
and the positioning jig is fixedly arranged above the jig mounting table and is used for positioning and bearing the flexible plate to be tested.
Preferably, a buffering sliding groove is formed in the lower end of the lower pressing guide pillar, a buffering sliding column is fixedly connected to the upper end of the lower mounting head, the buffering sliding column is connected to the inside of the buffering sliding groove in a sliding mode, a buffering spring is arranged inside the buffering sliding groove, and the upper end and the lower end of the buffering spring are connected with the buffering sliding groove and the buffering sliding column respectively.
Preferably, the upper pressing component comprises a pressing mounting base plate, an upper connecting seat is fixedly connected to the upper end of the pressing mounting base plate, the pressing mounting base plate is fixedly connected with the lower mounting head through the upper connecting seat, side pressing rubbers are fixedly mounted on two sides of the lower end of the pressing mounting base plate, and a flexible disc pressing strip is fixedly connected to the middle of the lower end of the pressing mounting base plate.
Preferably, a plurality of guide holes are formed in the rear end of the downward pressing mounting substrate in a penetrating mode, a plurality of guide columns which vertically extend upwards are fixedly connected to the positions, corresponding to the guide holes, of the rear side of the upper end of the base, and the guide columns penetrate through the guide holes and are connected to the inner portions of the guide holes in a sliding mode.
Preferably, the positioning jig comprises a jig base, the jig base is fixedly mounted at the upper end of the jig mounting table, a positioning groove is formed in the middle of the jig base and matched with the flexible plate to be tested, and a detection golden finger is arranged inside the positioning groove.
Compared with the prior art, the beneficial effects of the utility model reside in that:
the utility model discloses a be provided with gliding installation head down and carry out the installation of top load subassembly under pushing down guide pillar lower extreme, when carrying out the ET test, gliding installation head structure down can provide certain buffering stroke, when the examination gentle board that awaits measuring to different thickness carries out the ET test, slip through installation head down can realize pressing from both sides the tight of the examination gentle board that awaits measuring to different thickness, very big improvement the application scope of test jig, the setting of buffering stroke simultaneously, when the staff will not await measuring the exact of gentle board of examining place in the constant head tank, when the handle is pushed down in the pulling, through with the top load subassembly with await measuring to change into the flexonics between the gentle board of examination, prevent that the packing force of top load subassembly to the examination gentle board that awaits measuring is too big and lead to the examination gentle board that awaits measuring to be crushed, the effectual condition that has reduced because of the improper operation and causes the loss takes place.
Drawings
Fig. 1 is a schematic perspective view of the present invention;
fig. 2 is a schematic perspective view of the push-down driving assembly in a lifted state according to the present invention;
fig. 3 is a schematic perspective view of the downward pressing driving assembly of the present invention in a downward pressing state;
fig. 4 is a cross-sectional view of a push down drive assembly in accordance with the present invention;
fig. 5 is a schematic perspective view of the upper pressing assembly of the present invention;
fig. 6 is a schematic perspective view of a positioning fixture according to the present invention.
The reference numbers in the figures are:
1. a base; 101. a jig mounting table; 102. a guide post; 2. a side bracket; 201. an upper mounting plate; 3. a push down drive assembly; 301. a mounting seat; 302. an upper hinge bracket; 303. pressing down the handle; 304. a transmission member; 305. pressing down the guide pillar; 3051. a buffer chute; 306. a lower guide sleeve; 307. a lower mounting head; 3071. a buffer slide post; 308. a buffer spring; 4. an upper pressing assembly; 401. pressing down the mounting substrate; 4011. a guide hole; 402. an upper connecting seat; 403. laterally pressing rubber; 404. pressing strips for the flexible disk; 5. positioning a jig; 501. a jig base; 502. positioning a groove; 503. detecting a golden finger; 6. a flexible plate to be tested.
Detailed Description
The following description is presented to disclose the invention so as to enable any person skilled in the art to practice the invention. The preferred embodiments in the following description are given by way of example only, and other obvious variations will occur to those skilled in the art.
Referring to fig. 1 to 6, a test rack for ET testing includes:
the jig mounting device comprises a base 1, wherein a jig mounting table 101 is fixedly connected to the middle of the upper end of the base 1;
the side support 2 is fixedly arranged at the rear part of the upper end of the base 1, the side support 2 vertically extends upwards, and the upper mounting plate 201 is fixedly arranged on the front side of the upper end of the side support 2;
the downward pressing driving component 3 is fixedly arranged on the front side of the upper mounting plate 201, the downward pressing driving component 3 comprises a mounting seat 301, the upper end of the front side of the mounting seat 301 is fixedly connected with an upper hinged frame 302, the tail end of the upper hinged frame 302 is hinged with a downward pressing handle 303, the downward pressing handle 303 is L-shaped, the tail end of the downward pressing handle 303 is hinged with the upper hinged frame 302, two sides of the bent part of the downward pressing handle 303 are hinged with transmission pieces 304, the lower end of the transmission pieces 304 is hinged with a downward pressing guide pillar 305, the lower end of the front side of the mounting seat 301 is fixedly connected with a lower guide sleeve 306, the downward pressing guide pillar 305 is slidably connected inside the lower guide sleeve 306, the lower end of the downward pressing guide pillar 305 is slidably connected with a lower mounting head 307, and when the to-be-tested flexible plate 6 is pressed and fastened, the downward pressing driving component 3 is switched from the state shown in fig. 2 to the state shown in fig. 3 by pulling the downward pressing handle 303, so that the upward pressing component 4 compresses and fixes the to-tested flexible plate 6;
an upper pressing component 4, wherein the upper pressing component 4 is fixedly arranged at the lower end of the lower mounting head 307;
and the positioning jig 5 is fixedly arranged above the jig mounting table 101, and the positioning jig 5 is used for positioning and bearing the flexible plate 6 to be tested.
The lower end of the downward pressing guide pillar 305 is internally provided with a buffer sliding chute 3051, the upper end of the lower mounting head 307 is fixedly connected with a buffer sliding pillar 3071, the buffer sliding pillar 3071 is slidably connected inside the buffer sliding chute 3051, a buffer spring 308 is arranged inside the buffer sliding chute 3051, the upper end and the lower end of the buffer spring 308 are respectively connected with the buffer sliding chute 3051 and the buffer sliding pillar 3071, the buffer spring 308 is in a pressed state in a conventional state, the upward pressing component 4 provides downward pressing elastic force, the downward pressing component 4 is guaranteed to have enough pressing force, meanwhile, the buffer stroke provided by the buffer sliding chute 3051 is realized, and clamping of the to-be-tested flexible plates with different thicknesses can be effectively realized.
The upper pressing component 4 comprises a lower pressing installation substrate 401, an upper connecting seat 402 is fixedly connected to the upper end of the lower pressing installation substrate 401, the lower pressing installation substrate 401 is fixedly connected with a lower installation head 307 through the upper connecting seat 402, side pressing rubbers 403 are fixedly installed on two sides of the lower end of the lower pressing installation substrate 401, a flexible plate pressing strip 404 is fixedly connected to the middle of the lower end of the lower pressing installation substrate 401, when the flexible plate 6 to be tested is pressed and fixed, the upper pressing component 4 moves downwards, the side pressing rubbers 403 on two sides are firstly extruded, the flexible plate pressing strip 404 is abutted to the upper end face of the flexible plate 6 to be tested, and then a compression buffer spring 308 is continuously pressed downwards, so that the flexible plate pressing strip 404 compresses and fixes the flexible plate 6 to be tested.
Push down mounting substrate 401 rear end and run through and seted up a plurality of guiding hole 4011, base 1 upper end rear side corresponds the vertical guide post 102 that upwards extends of a plurality of fixedly connected with of position department with guiding hole 4011, guide post 102 passes guiding hole 4011 to sliding connection is inside guiding hole 4011, guide post 102 cooperation guiding hole 4011's structural design, can effectual assurance push down the stability of movement of fixed in-process upper pressure subassembly 4 under going on
Positioning jig 5 includes tool base 501, and tool base 501 fixed mounting has been seted up at tool mount table 101 upper end, and constant head tank 502 has been seted up at tool base 501 middle part, constant head tank 502 and the 6 looks adaptations of the flexible board that awaits measuring, and constant head tank 502 is inside to be provided with the detection golden finger 503, when the flexible board 6 location that awaits measuring, through will await measuring the flexible board 6 and set up inside constant head tank 502, makes the pin head of the flexible board 6 that awaits measuring and detect golden finger 503 realization electric connection.
The utility model discloses a use does: when the ET test of the flexible board 6 to be tested is performed, firstly, the flexible board 6 to be tested, which is bonded by using the anti-static tweezers, is taken out from the tray, and is positioned inside the positioning groove 502 according to the shape, the position of the flexible board 6 to be tested is slightly adjusted by using the tweezers, so that the pin head of the flexible board 6 to be tested is electrically connected with the detection golden finger 503, then the handle 303 is pressed down, the pressing guide pillar 305 is driven by the transmission member 304 to move down, and then the pressing component 4 fixedly installed at the lower end of the pressing driving component 3 is driven to move down, so that the flexible board pressing strip 404 is used for pressing and fixing the flexible board 6 to be tested, in the pressing and fixing process, the pressing buffer spring 308 is moved up by the lower mounting head 307, and further the pressing component 4 is prevented from rigidly colliding with the flexible board 6 to be tested to crush the flexible board 6 to be tested.
To sum up, the utility model has the advantages that: the lower end of the lower pressing guide post is provided with the sliding lower mounting head to mount the upper pressing assembly, a certain buffer stroke can be provided, ET testing can be performed on flexible boards to be tested with different thicknesses through the buffer stroke, and meanwhile, the situation that the flexible boards to be tested are crushed due to the fact that the pressing force of the upper pressing assembly on the flexible boards to be tested is too large is reduced.
The foregoing shows and describes the general principles, essential features, and advantages of the invention. It will be understood by those skilled in the art that the present invention is not limited to the above embodiments, and that the principles of the present invention may be applied to any other embodiment without departing from the spirit and scope of the present invention. The scope of the invention is defined by the appended claims and equivalents thereof.

Claims (5)

1. The utility model provides a test jig is used in ET test which characterized in that includes:
the fixture mounting device comprises a base (1), wherein a fixture mounting table (101) is fixedly connected to the middle of the upper end of the base (1);
the side support (2) is fixedly arranged at the rear part of the upper end of the base (1), the side support (2) vertically extends upwards, and the front side of the upper end of the side support (2) is fixedly provided with an upper mounting plate (201);
the pressing driving assembly (3) is fixedly installed on the front side of the upper installation plate (201), the pressing driving assembly (3) comprises an installation seat (301), the upper end of the front side of the installation seat (301) is fixedly connected with an upper hinge frame (302), the tail end of the upper hinge frame (302) is hinged with a pressing handle (303), the pressing handle (303) is L-shaped, the tail end of the pressing handle (303) is hinged with the upper hinge frame (302), transmission parts (304) are hinged to two sides of a bent part of the pressing handle (303), the lower end of each transmission part (304) is hinged with a pressing guide pillar (305), the lower end of the front side of the installation seat (301) is fixedly connected with a lower guide sleeve (306), the pressing guide pillar (305) is connected inside the lower guide sleeve (306) in a sliding mode, and the lower end of each pressing guide pillar (305) is connected with a lower installation head (307) in a sliding mode;
the upper pressing component (4), the upper pressing component (4) is fixedly arranged at the lower end of the lower mounting head (307);
the flexible board testing fixture comprises a positioning fixture (5), wherein the positioning fixture (5) is fixedly arranged above a fixture mounting table (101), and the positioning fixture (5) is used for positioning and bearing a flexible board (6) to be tested.
2. The test jig for the ET test according to claim 1, wherein a buffering sliding groove (3051) is formed in the lower end of the lower pressing guide pillar (305), a buffering sliding pillar (3071) is fixedly connected to the upper end of the lower mounting head (307), the buffering sliding pillar (3071) is slidably connected to the inside of the buffering sliding groove (3051), a buffering spring (308) is arranged in the buffering sliding groove (3051), and the upper end and the lower end of the buffering spring (308) are respectively connected with the buffering sliding groove (3051) and the buffering sliding pillar (3071).
3. The test jig for the ET test according to claim 1, wherein the upper pressing assembly (4) comprises a lower pressing mounting substrate (401), an upper connecting seat (402) is fixedly connected to the upper end of the lower pressing mounting substrate (401), the lower pressing mounting substrate (401) is fixedly connected with a lower mounting head (307) through the upper connecting seat (402), side pressing rubbers (403) are fixedly mounted on two sides of the lower end of the lower pressing mounting substrate (401), and a flexible disk pressing strip (404) is fixedly connected to the middle of the lower end of the lower pressing mounting substrate (401).
4. The test jig for the ET test according to claim 3, wherein a plurality of guide holes (4011) are formed in the rear end of the downward pressing mounting substrate (401) in a penetrating manner, a plurality of guide posts (102) extending vertically and upwardly are fixedly connected to positions of the rear side of the upper end of the base (1) corresponding to the guide holes (4011), and the guide posts (102) penetrate through the guide holes (4011) and are connected to the inside of the guide holes (4011) in a sliding manner.
5. The test jig for the ET test according to claim 1, wherein the positioning jig (5) comprises a jig base (501), the jig base (501) is fixedly installed at the upper end of the jig mounting table (101), a positioning groove (502) is formed in the middle of the jig base (501), the positioning groove (502) is matched with the flexible board (6) to be tested, and a detection golden finger (503) is arranged inside the positioning groove (502).
CN202222167783.5U 2022-08-17 2022-08-17 Test jig for ET test Active CN218036982U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202222167783.5U CN218036982U (en) 2022-08-17 2022-08-17 Test jig for ET test

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202222167783.5U CN218036982U (en) 2022-08-17 2022-08-17 Test jig for ET test

Publications (1)

Publication Number Publication Date
CN218036982U true CN218036982U (en) 2022-12-13

Family

ID=84348009

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202222167783.5U Active CN218036982U (en) 2022-08-17 2022-08-17 Test jig for ET test

Country Status (1)

Country Link
CN (1) CN218036982U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN117310430A (en) * 2023-10-18 2023-12-29 南通华隆微电子股份有限公司 Semiconductor test fixture

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN117310430A (en) * 2023-10-18 2023-12-29 南通华隆微电子股份有限公司 Semiconductor test fixture

Similar Documents

Publication Publication Date Title
CN218036982U (en) Test jig for ET test
CN214622739U (en) Circuit board withstand voltage test fixture
CN214585844U (en) Test fixture with positioning function for integrated circuit test sorting machine
CN211180088U (en) FPC test jig convenient to go up unloading
CN115980401B (en) Automatic testing device based on down-pressure SOP test seat
CN112845168A (en) Automatic elasticity testing machine for movable contact spring piece of starting protector of motor of refrigeration compressor
CN217304671U (en) Quality detection device for building engineering management
CN211669319U (en) Mainboard testing device
CN215447802U (en) Positioning device for simultaneously positioning multiple products
CN211123148U (en) Circuit board testing jig
CN211086511U (en) Tool for quickly detecting circuit board
CN212275779U (en) Allergen test analysis equipment
CN211453709U (en) Workbench suitable for sound meter filter test
CN215415522U (en) IC testing device
CN220854431U (en) Aluminum alloy toughness testing device
CN212275596U (en) Allergen testing device
CN212514699U (en) Prevent PCB board testing arrangement that weighs wounded
CN219799529U (en) Double-deck floating test fixture
CN217011191U (en) Simple Bluetooth audio test box
CN214471680U (en) Plastic retainer wave-shaped tongue fatigue detection equipment
CN219122263U (en) Tool convenient for testing plate
CN218512169U (en) Stores pylon solder joint intensity testing arrangement
CN219417653U (en) PCBA test fixture
CN214417026U (en) Spring piece elasticity testing machine for movable contact spring of motor starting protector of refrigeration compressor
CN216386815U (en) Copper strips surface wound point detection device

Legal Events

Date Code Title Description
GR01 Patent grant
GR01 Patent grant