CN219799529U - Double-deck floating test fixture - Google Patents
Double-deck floating test fixture Download PDFInfo
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- CN219799529U CN219799529U CN202320883071.5U CN202320883071U CN219799529U CN 219799529 U CN219799529 U CN 219799529U CN 202320883071 U CN202320883071 U CN 202320883071U CN 219799529 U CN219799529 U CN 219799529U
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- upper probe
- groove
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- 238000012360 testing method Methods 0.000 title claims abstract description 45
- 239000000523 sample Substances 0.000 claims abstract description 211
- 230000007246 mechanism Effects 0.000 claims abstract description 35
- 238000001514 detection method Methods 0.000 claims description 20
- 239000010410 layer Substances 0.000 claims description 9
- 239000002355 dual-layer Substances 0.000 claims description 7
- 238000003780 insertion Methods 0.000 abstract description 8
- 230000037431 insertion Effects 0.000 abstract description 8
- 239000000463 material Substances 0.000 abstract description 7
- 230000009286 beneficial effect Effects 0.000 abstract description 2
- 238000010586 diagram Methods 0.000 description 3
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000013459 approach Methods 0.000 description 1
- 230000003139 buffering effect Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000002349 favourable effect Effects 0.000 description 1
- 238000012840 feeding operation Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
Abstract
The utility model relates to the technical field of test equipment, and particularly discloses a double-layer floating type test fixture, which comprises: the upper support plate assembly is provided with an upper probe groove; an upper probe assembly mounted in the upper probe slot; the downloading plate assembly is positioned below the upper plate assembly and is provided with a lower probe groove; a lower probe assembly mounted in the lower probe groove; and the driving end of the probe driving mechanism is connected with the upper carrier plate assembly and is used for driving the upper carrier plate assembly to be close to or far away from the lower carrier plate assembly. The double-layer floating type test fixture provided by the utility model can complete the test operation of double-sided needle insertion by using one probe driving mechanism, and is beneficial to reducing the material cost.
Description
Technical Field
The utility model relates to the technical field of test equipment, in particular to a double-layer floating type test fixture.
Background
Generally, a test fixture includes:
the jig comprises a jig body, wherein the jig body is provided with a piece placing groove for placing a device to be tested;
the detection probe is arranged opposite to the device to be detected in the piece placing groove;
the driving end of the needle inserting cylinder is connected with the detection probe to drive the detection probe to compress or release the device to be detected.
In general, when the test contact of the device under test is located at the top surface position, the test probe is disposed above the placement groove, and correspondingly, when the test contact of the device under test is located at the bottom surface position, the test probe is disposed below the placement groove.
When the top surface and the bottom surface of the device to be tested are both provided with the test contact pieces, a group of detection probes are arranged above and below the device to be tested, and accordingly, each group of detection probes is connected with a needle inlet cylinder.
It should be noted that the test operation of double-sided needle insertion can be completed by using two needle insertion cylinders and other probe driving mechanisms, and the material cost is high.
Therefore, the utility model aims to improve the existing test fixture, and the double-sided needle insertion test operation can be completed by using one probe driving mechanism, so that the effect of reducing the material cost is achieved.
The above information disclosed in this background section is only included to enhance understanding of the background of the disclosure and therefore may contain information that does not form the prior art that is presently known to those of ordinary skill in the art.
Disclosure of Invention
One object of the present utility model is to provide a double-layer floating test fixture, which can complete the test operation of double-side needle insertion by using one probe driving mechanism, and is favorable for reducing the material cost.
To achieve the above object, the present utility model provides a dual-layer floating test fixture, comprising:
the upper support plate assembly is provided with an upper probe groove;
an upper probe assembly mounted in the upper probe slot;
the downloading plate assembly is positioned below the upper plate assembly and is provided with a lower probe groove;
a lower probe assembly mounted in the lower probe groove;
and the driving end of the probe driving mechanism is connected with the upper carrier plate assembly and is used for driving the upper carrier plate assembly to be close to or far away from the lower carrier plate assembly.
Optionally, the upper probe assembly includes:
the upper probe fixing bottom plate is positioned in the upper probe groove and is attached to the bottom of the upper probe groove; wherein, the upper probe fixing bottom plate is provided with a plurality of upper probe through holes;
the upper probe fixing top plate is positioned above the upper probe fixing bottom plate and is fixedly connected with the upper probe fixing bottom plate;
the upper probe floating circuit board is positioned between the upper probe fixing bottom plate and the upper probe fixing top plate and is arranged in the upper probe groove in a vertical sliding way;
the upper ends of the upper detection probes are arranged on the upper probe floating circuit board, and the lower ends of the upper detection probes penetrate through one upper probe through hole and extend to the lower part of the upper probe fixing bottom plate.
Optionally, a first upper probe spring is arranged between the upper probe fixing bottom plate and the upper probe floating circuit board,
and a second upper probe spring is arranged between the upper probe fixing top plate and the upper probe floating circuit board.
Optionally, a limit slot is arranged on the top surface of the upper probe fixing bottom plate;
a bolt mounting groove is formed in the position, corresponding to the limiting slot, of the groove wall of the upper probe groove;
the plug pin mounting groove is internally provided with a limit plug pin and a plug pin spring for driving the limit plug pin to be inserted into the limit slot in a sliding manner.
Optionally, the lower probe assembly includes:
the lower probe floating plate is connected with the downloading plate component in an up-down sliding way;
the lower probe spring is positioned between the bottom of the lower probe groove and the lower probe floating plate;
and the lower detection probes are arranged on the top surface of the lower probe floating plate.
Optionally, the method further comprises:
the sliding sleeve protrudes above the downloading plate assembly and is connected with the downloading plate assembly in an up-down sliding manner;
and the sleeve spring is positioned below the sliding sleeve and drives the sliding sleeve to slide upwards.
Optionally, the device further comprises a download board driving mechanism, wherein the driving end of the download board driving mechanism is connected with the download board assembly to drive the download board assembly to reciprocate along the horizontal direction.
Optionally, the probe card further comprises a platform bottom plate, wherein the platform bottom plate is located below the downloading plate assembly, and the probe driving mechanism and the downloading plate driving mechanism are both installed on the platform bottom plate.
The utility model has the beneficial effects that: the utility model provides a double-deck floating test fixture, when needs test the device that awaits measuring, put the device that awaits measuring on probe subassembly down, then probe actuating mechanism drives the upper carrier plate subassembly and drives probe subassembly down motion, when going up probe subassembly and compressing tightly the device that awaits measuring downwards, also can make the device that awaits measuring compress tightly down probe subassembly down, can realize the two-sided needle operation of inserting of device that awaits measuring from this.
Therefore, the double-layer floating type test fixture provided by the embodiment can realize the test operation of double-sided needle insertion only by using one probe driving mechanism, and greatly reduces the material cost.
Drawings
In order to more clearly illustrate the embodiments of the utility model or the technical solutions of the prior art, the drawings which are used in the description of the embodiments or the prior art will be briefly described, it being obvious that the drawings in the description below are only some embodiments of the utility model, and that other drawings can be obtained from these drawings without inventive faculty for a person skilled in the art.
FIG. 1 is a schematic diagram of a dual-layer floating test fixture according to an embodiment;
FIG. 2 is a schematic diagram of a dual-layer floating test fixture according to an embodiment during loading and unloading;
fig. 3 is a schematic structural diagram of a limiting latch according to an embodiment.
In the figure:
1. an upper carrier plate assembly; 101. an upper probe groove; 102. a bolt mounting groove; 103. a limit bolt; 104. a latch spring;
2. downloading a board assembly; 201. a lower probe groove;
3. a platform floor;
4. a probe driving mechanism;
5. a download board driving mechanism;
6. an upper probe assembly; 601. an upper probe fixing base plate; 6011. a limit slot; 6012. a probe via is formed; 602. the upper probe is fixed on the top plate; 603. a probe floating circuit board is arranged on the upper surface of the probe; 604. a detection probe is arranged on the probe; 605. a first upper probe spring; 606. a second upper probe spring;
7. a lower probe assembly; 701. a lower probe floating plate; 702. a lower probe spring; 703. a lower detection probe;
8. a buffer mechanism; 801. a sliding sleeve; 802. a sleeve spring.
Detailed Description
In order to make the objects, features and advantages of the present utility model more obvious and understandable, the technical solutions of the embodiments of the present utility model will be clearly and completely described below with reference to the drawings in the embodiments of the present utility model, and it is apparent that the embodiments described below are only some embodiments of the present utility model, not all embodiments of the present utility model. All other embodiments, which can be made by those skilled in the art based on the embodiments of the utility model without making any inventive effort, are intended to be within the scope of the utility model.
In the description of the present utility model, it will be understood that when one component is referred to as being "connected" to another component, it can be directly connected to the other component or intervening components may also be present. When an element is referred to as being "disposed on" another element, it can be directly on the other element or intervening elements may also be present.
Furthermore, the terms "long," "short," "inner," "outer," and the like, as used herein, refer to an orientation or positional relationship based on that shown in the drawings, for convenience of description of the present utility model, and are not intended to indicate or imply that the apparatus or elements referred to must have this particular orientation, operate in a particular orientation configuration, and thus should not be construed as limiting the utility model.
The present utility model will be described in detail below with reference to specific embodiments shown in the drawings. These embodiments are not intended to limit the utility model and structural, methodological, or functional modifications of these embodiments that may be made by one of ordinary skill in the art are included within the scope of the utility model.
The utility model provides a double-layer floating type test fixture which is suitable for an application scene of testing a device to be tested, wherein the top surface and the bottom surface of the device need to be subjected to needle insertion.
Referring to fig. 1 and 2, in this embodiment, the dual-layer floating test fixture includes an upper plate assembly 1, a lower plate assembly 2 and a platform bottom plate 3 sequentially from top to bottom.
Wherein, the platform bottom plate 3 mountain fixed mounting has probe actuating mechanism 4 that sets up along vertical direction and download board actuating mechanism 5 that sets up along the horizontal direction. The driving end of the probe driving mechanism 4 is connected with the upper carrier assembly 1, and is used for driving the upper carrier assembly 1 to approach or depart from the lower carrier assembly 2. The driving end of the download board driving mechanism 5 is connected with the download board assembly 2, so as to drive the download board assembly 2 to reciprocate along the horizontal direction, so that the download board assembly 2 moves to the position right below the upper board assembly 1 or moves to the position in front of the upper board assembly 1, so that the device to be tested can be taken and placed.
The upper carrier plate assembly 1 is provided with an upper probe groove 101, and an upper probe assembly 6 is arranged in the upper probe groove 101; the lower probe groove 201 is arranged on the download plate assembly 2, and the lower probe assembly 7 is arranged in the lower probe groove 201.
When the device to be tested needs to be tested, the download board driving mechanism 5 pushes out the download board assembly 2 firstly, and then the device to be tested can be placed on the lower probe assembly 7; then, the download board driving mechanism 5 returns the download board assembly 2 to the position right below the upper board assembly 1; finally, the probe driving mechanism 4 drives the upper carrier plate assembly 1 to drive the upper probe assembly 6 to move downwards, and the upper probe assembly 6 can downwards compress the device to be tested and simultaneously downwards compress the lower probe assembly 7, so that the double-sided needle inserting operation of the device to be tested can be realized.
Therefore, the double-layer floating type test fixture provided by the embodiment can realize the test operation of double-sided needle insertion only by using one probe driving mechanism 4, and greatly reduces the material cost.
Alternatively, the probe driving mechanism 4 and the downloading board driving mechanism 5 may be telescopic cylinders, electric cylinders, hydraulic cylinders or motor screw linear modules, which is not limited in the present utility model.
In this embodiment, the upper probe assembly 6 includes an upper probe fixing base plate 601, an upper probe fixing top plate 602, an upper probe floating circuit board 603, and a plurality of upper detection probes 604.
The upper probe fixing base plate 601 is located in the upper probe groove 101 and is attached to the bottom of the upper probe groove 101; wherein, the upper probe fixing base plate 601 is provided with a plurality of upper probe through holes 6012. The upper probe fixing top plate 602 is located above the upper probe fixing bottom plate 601, and is fastened to the upper probe fixing bottom plate 601 by vertical guide posts or the like.
The upper probe floating circuit board 603 is located between the upper probe fixing base board 601 and the upper probe fixing top board 602, and is slidably disposed up and down in the upper probe groove 101. The upper ends of the upper detection probes 604 are mounted on the upper probe floating circuit board 603, and the lower end of each upper detection probe 604 extends to the lower side of the upper probe fixing base plate 601 through one upper probe via 6012.
Further, a first upper probe spring 605 is disposed between the upper probe fixing base plate 601 and the upper probe floating circuit board 603, and a second upper probe spring 606 is disposed between the upper probe fixing top plate 602 and the upper probe floating circuit board 603. It can be appreciated that the first upper probe spring 605 and the second upper probe spring 606 are arranged, so that the upper probe floating circuit board 603 can be buffered whether sliding upwards or downwards, and damage caused by overlarge impact force when the upper detection probe 604 presses down on the device to be tested is avoided.
Optionally, referring to fig. 3, a limit slot 6011 is provided on the top surface of the upper probe fixing base plate 601; the slot wall of the upper probe slot 101 is provided with a bolt mounting slot 102 corresponding to the limit slot 6011; a limit bolt 103 and a bolt spring 104 for driving the limit bolt 103 to slide and insert into the limit slot 6011 are arranged in the bolt mounting groove 102.
It can be appreciated that after the upper probe assembly 6 is placed in the upper probe groove 101, the upper probe assembly 6 is pressed downwards, so that the limit plug 103 can be aligned with the limit slot 6011, and under the driving action of the plug spring 104, the limit plug 103 is automatically inserted into the limit slot 6011, thereby realizing the relative positioning of the upper probe assembly 6 in the upper probe groove 101. When the upper probe assembly 6 needs to be taken out, the limit bolt 103 is pushed backwards against the elastic action of the bolt spring 104, so that the limit bolt 103 can be withdrawn from the limit slot 6011.
In this embodiment, the lower probe assembly 7 includes a lower probe floating plate 701, a lower probe spring 702, and a plurality of lower detection probes 703. The lower probe floating plate 701 is connected with the lower plate assembly 2 in a sliding manner up and down; the lower probe springs 702 are located between the bottom of the lower probe groove 201 and the lower probe floating plate 701; each of the lower detection probes 703 is mounted to the top surface of the lower probe floating plate 701. When the upper probe assembly 6 drives the device under test to press down against the lower probe assembly 7, the lower probe floating plate 701 moves downward against the spring force of the lower probe springs 702 to provide a buffer to prevent damage to the lower test probes 703 or the device under test.
Optionally, several groups of buffer mechanisms 8 are provided on top of the download board assembly 2, and the buffer mechanisms 8 include a sliding sleeve 801 and a sleeve spring 802. The sliding sleeve 801 protrudes above the downloading plate assembly 2 and is connected with the downloading plate assembly 2 in an up-down sliding manner; the sleeve spring 802 is located below the sliding sleeve 801, and drives the sliding sleeve 801 to slide upward.
When the probe driving mechanism 4 drives the upper carrier assembly 1 to move downwards, the upper carrier assembly 1 will first touch the top of the sliding sleeve 801, at this time, the sleeve spring 802 can provide initial buffering, and as the upper carrier assembly 1 continues to move downwards, the upper probe assembly 6 will touch the device to be tested, so as to press the device to be tested downwards.
The double-deck floating test fixture that this embodiment provided possesses following advantage:
(1) the probe driving mechanism 4 drives the upper probe assembly 6 to move downwards, and the upper probe assembly 6 downwards presses the device to be tested and simultaneously downwards presses the probe assembly 7, so that the double-sided needle feeding operation of the device to be tested can be realized by using only one probe driving mechanism 4, and the material cost is greatly reduced;
(2) the upper probe assembly 6 is detachably connected with the upper carrier plate assembly 1 through a limiting bolt 103 and a bolt spring 104, and the assembly and the disassembly are convenient.
It should be understood that although the present disclosure describes embodiments, not every embodiment is provided with a separate embodiment, and that this description is for clarity only, and that the skilled artisan should recognize that the embodiments may be combined as appropriate to form other embodiments that will be understood by those skilled in the art.
The above list of detailed descriptions is only specific to practical embodiments of the present utility model, and they are not intended to limit the scope of the present utility model, and all equivalent embodiments or modifications that do not depart from the spirit of the present utility model should be included in the scope of the present utility model.
Claims (8)
1. Double-deck floating test fixture, its characterized in that includes:
the probe comprises an upper carrier plate assembly (1), wherein the upper carrier plate assembly (1) is provided with an upper probe groove (101);
an upper probe assembly (6), the upper probe assembly (6) being mounted in the upper probe groove (101);
the device comprises a downloading plate assembly (2), wherein the downloading plate assembly (2) is positioned below the upper plate assembly (1) and is provided with a lower probe groove (201);
-a lower probe assembly (7), the lower probe assembly (7) being mounted in the lower probe groove (201);
and the driving end of the probe driving mechanism (4) is connected with the upper carrier plate assembly (1) and is used for driving the upper carrier plate assembly (1) to be close to or far away from the lower carrier plate assembly (2).
2. The double-layer floating test fixture according to claim 1, wherein the upper probe assembly (6) comprises:
an upper probe fixing base plate (601), wherein the upper probe fixing base plate (601) is positioned in the upper probe groove (101) and is attached to the groove bottom of the upper probe groove (101); wherein the upper probe fixing bottom plate (601) is provided with a plurality of upper probe through holes (6012);
an upper probe fixing top plate (602), wherein the upper probe fixing top plate (602) is positioned above the upper probe fixing bottom plate (601) and is fixedly connected with the upper probe fixing bottom plate (601);
an upper probe floating circuit board (603), wherein the upper probe floating circuit board (603) is positioned between the upper probe fixing bottom plate (601) and the upper probe fixing top plate (602) and is arranged in the upper probe groove (101) in a vertical sliding way;
the upper detection probes (604) are arranged on the upper probe floating circuit board (603), and the lower end of each upper detection probe (604) penetrates through one upper probe through hole (6012) to extend to the lower part of the upper probe fixing bottom plate (601).
3. The dual-layer floating test fixture according to claim 2, wherein a first upper probe spring (605) is provided between the upper probe fixing base plate (601) and the upper probe floating circuit board (603),
a second upper probe spring (606) is arranged between the upper probe fixing top plate (602) and the upper probe floating circuit board (603).
4. The double-layer floating test fixture according to claim 2, wherein a limit slot (6011) is arranged on the top surface of the upper probe fixing bottom plate (601);
a bolt mounting groove (102) is formed in the position, corresponding to the limit slot (6011), of the groove wall of the upper probe groove (101);
a limiting bolt (103) and a bolt spring (104) for driving the limiting bolt (103) to slide and insert into the limiting slot (6011) are arranged in the bolt mounting groove (102).
5. The double-layer floating test fixture according to claim 1, wherein the lower probe assembly (7) comprises:
a lower probe floating plate (701), said lower probe floating plate (701) being slidably connected up and down to said download plate assembly (2);
a lower probe spring (702), the lower probe spring (702) being located between a bottom of the lower probe groove (201) and the lower probe floating plate (701);
and a plurality of lower detection probes (703), wherein each lower detection probe (703) is mounted on the top surface of the lower probe floating plate (701).
6. The dual layer floating test fixture of claim 1, further comprising:
the sliding sleeve (801) protrudes above the downloading plate assembly (2) and is connected with the downloading plate assembly (2) in an up-down sliding manner;
and the sleeve spring (802) is positioned below the sliding sleeve (801) and drives the sliding sleeve (801) to slide upwards.
7. The double-layer floating type test fixture according to claim 1, further comprising a download plate driving mechanism (5), wherein a driving end of the download plate driving mechanism (5) is connected with the download plate assembly (2) to drive the download plate assembly (2) to reciprocate along a horizontal direction.
8. The dual layer floating test fixture of claim 7, further comprising a platform floor (3), wherein the platform floor (3) is located below the download plate assembly (2), and the probe drive mechanism (4) and the download plate drive mechanism (5) are both mounted on the platform floor (3).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202320883071.5U CN219799529U (en) | 2023-04-19 | 2023-04-19 | Double-deck floating test fixture |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202320883071.5U CN219799529U (en) | 2023-04-19 | 2023-04-19 | Double-deck floating test fixture |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN219799529U true CN219799529U (en) | 2023-10-03 |
Family
ID=88178809
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202320883071.5U Active CN219799529U (en) | 2023-04-19 | 2023-04-19 | Double-deck floating test fixture |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN219799529U (en) |
-
2023
- 2023-04-19 CN CN202320883071.5U patent/CN219799529U/en active Active
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