CN216622584U - Pressure intelligence integrated circuit board testing arrangement - Google Patents
Pressure intelligence integrated circuit board testing arrangement Download PDFInfo
- Publication number
- CN216622584U CN216622584U CN202122389406.1U CN202122389406U CN216622584U CN 216622584 U CN216622584 U CN 216622584U CN 202122389406 U CN202122389406 U CN 202122389406U CN 216622584 U CN216622584 U CN 216622584U
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- CN
- China
- Prior art keywords
- board card
- clamping table
- integrated circuit
- pressing plates
- circuit board
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- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- 239000000523 sample Substances 0.000 claims abstract description 31
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000001125 extrusion Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
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Abstract
The utility model discloses a pressure intelligent board card testing device, which relates to the technical field of pressure intelligent board card testing and comprises a board card testing frame and a board card tester, wherein the board card tester is positioned outside the board card testing frame, guide rods are welded at the left end and the right end between the upper surface and the lower surface of the inner side of the board card testing frame, a clamping table is welded in the middle between the two guide rods, pressing plates capable of moving up and down are arranged at the upper end and the lower end of the inner side of the board card testing frame, the two pressing plates are respectively positioned at the upper side and the lower side of the clamping table, a plurality of blind holes are uniformly formed in one surface, facing the clamping table, of the two pressing plates, a sliding block capable of sliding up and down is arranged in each blind hole, and a probe is inserted into one surface, facing the clamping table, of the sliding block. The pressing plates capable of moving up and down are arranged on the upper side and the lower side of the clamping table respectively, so that probes of the two pressing plates can test the upper surface and the lower surface of the board card respectively, the trouble of turning over the board card for testing is eliminated, and the testing efficiency is high.
Description
Technical Field
The utility model relates to the technical field of pressure intelligent board card testing, in particular to a pressure intelligent board card testing device.
Background
The board card is a printed circuit board, called PCB for short, and is provided with a plug core during manufacturing, and can be inserted into a slot of a main circuit board to control the operation of hardware.
After the board is manufactured, the board is usually tested. The existing board card testing device can only test the single face of a board card mostly, and when the other face of the board card is required to be tested, the board card needs to be turned over and clamped again, so that the board card testing efficiency is influenced, and when the board card is tested, if the contact force between a probe and the board card is too large, the probe and the board card are easily damaged, so that the pressure intelligent board card testing device is provided, and the technical problem is solved.
SUMMERY OF THE UTILITY MODEL
The utility model provides a pressure intelligent board card testing device to solve the problems that most of testing devices provided by the background technology can only test the single surface of a board card, and the contact force between a probe and the board card is too large, so that the probe and the board card are easily damaged.
In order to achieve the purpose, the utility model adopts the following technical scheme:
a pressure intelligent board test device comprises a board test rack and a board tester, wherein the board tester is positioned on the outer side of the board test rack;
the utility model discloses a clamping device, including clamping platform, integrated circuit board test jig, guide arm, clamping platform, probe, slide block, fixed connection spring, clamping platform, probe, clamping platform, the inboard clamp plate that can reciprocate is located respectively to the inboard upper and lower both ends of integrated circuit board test jig, two the clamp plate is located the upper and lower both sides of clamping platform, two a plurality of blind hole has all evenly been seted up towards a surface of clamping platform to the clamp plate, the inside of blind hole is equipped with gliding slider from top to bottom, the slider has been pegged graft towards a surface of clamping platform, fixedly connected with spring between the surface of blind hole bottom and the hole bottom of slider orientation blind hole.
Furthermore, the two guide rods respectively penetrate through the left end and the right end of the rear side of the two pressing plates, and the pressing plates are connected with the guide rods in a sliding mode.
Furthermore, two electric push rods are arranged between one surface of the pressing plate back to the clamping table and the upper surface and the lower surface of the inner side of the board card testing frame respectively, and the electric push rods are located in front of the guide rod.
Furthermore, a step through groove is formed between the upper surface and the lower surface of the clamping table, and a clamping frame for fixing the board card is embedded into the upper end of the step through groove.
Furthermore, the probes on the two pressing plates are respectively positioned on the upper side and the lower side of the stepped through groove.
Furthermore, one end of the probe, which is far away from the clamping table, penetrates through the sliding block and is connected with a lead, and the lead penetrates through the pressing plate and is connected with the board card tester.
Compared with the prior art, the utility model has the following beneficial effects:
the pressing plates capable of moving up and down are arranged on the upper side and the lower side of the clamping table, so that after a board card to be tested is clamped in the stepped through groove of the clamping table, the pressing plates on the upper side and the lower side can move towards the clamping table, when the pressing plates are close to the clamping table, probes on the pressing plates can be inserted into the stepped through groove and contact with the board card, the board card is tested, and the probes on the two pressing plates can respectively test the upper surface and the lower surface of the board card due to the fact that the pressing plates are arranged on the upper side and the lower side of the clamping table, the trouble of turning over the board card is avoided, and the testing efficiency is high;
through on installing the slider on the clamp plate with the probe, the slider can slide from top to bottom in the blind hole on the clamp plate, so when probe and integrated circuit board contact, if the contact dynamics between probe and the integrated circuit board is too big, then the slider just can be promoted and slide towards the direction of keeping away from the integrated circuit board to this cushions impact force, avoids probe or integrated circuit board to be crushed.
Drawings
Fig. 1 is a schematic perspective view of the present invention.
Fig. 2 is a schematic view of the internal structure of the front surface of the present invention.
FIG. 3 is an enlarged view of a portion of FIG. 2 according to the present invention.
Fig. 4 is a partially enlarged view of the position B in fig. 2 according to the present invention.
In FIGS. 1-4: 1-board card testing frame, 2-board card tester, 3-guide rod, 4-clamping table, 401-ladder through groove, 5-pressing plate, 501-blind hole, 6-electric push rod, 7-sliding block, 8-probe, 9-spring, 10-lead and 11-clamping frame.
Detailed Description
Please refer to fig. 1 to 4:
the utility model provides a pressure intelligent board card testing device, which comprises a board card testing frame 1 and a board card tester 2, wherein the board card tester 2 is positioned outside the board card testing frame 1, guide rods 3 are welded at the left end and the right end between the upper surface and the lower surface of the inner side of the board card testing frame 1, a clamping table 4 is welded in the middle between the two guide rods 3, pressing plates 5 capable of moving up and down are arranged at the upper end and the lower end of the inner side of the board card testing frame 1, the two pressing plates 5 are respectively positioned at the upper side and the lower side of the clamping table 4, a plurality of blind holes 501 are uniformly formed in one surface, facing the clamping table 4, of the two pressing plates 5, a sliding block 7 capable of sliding up and down is arranged in the blind hole 501, a probe 8 is inserted into one surface, facing the blind hole 501, of the sliding block 7, and a spring 9 is fixedly connected between the surface, facing the blind hole bottom, of the blind hole 501, of the sliding block 7;
specifically, two guide rods 3 respectively penetrate through the left end and the right end of the rear side of two pressing plates 5, the pressing plates 5 are connected with the guide rods 3 in a sliding mode, electric push rods 6 are respectively arranged between the upper surface and the lower surface of the inner side of the board card testing frame 1, and the surfaces, back to the clamping table 4, of the two pressing plates 5, and the electric push rods 6 are located in front of the guide rods 3;
the electric push rods 6 on the two press plates 5 can respectively push the press plates 5 on the same side to slide up and down along the guide rod 3, the slide block 7 can slide up and down in the blind hole 501, and when the slide block 7 slides towards the bottom of the blind hole 501, the spring 9 can be compressed and generates elasticity;
according to the above, a stepped through groove 401 is formed between the upper surface and the lower surface of the clamping table 4, a clamping frame 11 for fixing the board card is embedded in the upper end of the stepped through groove 401, the probes 8 on the two pressing plates 5 are respectively positioned on the upper side and the lower side of the stepped through groove 401, one end of each probe 8, which is far away from the clamping table 4, penetrates through the sliding block 7 and is connected with the lead 10, and the lead 10 penetrates out of the pressing plate 5 and is connected with the board card tester 2;
specifically, the integrated circuit board that needs the test can be put into in the logical groove 401 of ladder, and after the integrated circuit board placed and finishes, the upper end that leads to groove 401 of clamping frame 11 embedding ladder to this is spacing to the top of integrated circuit board, makes the integrated circuit board fix the inside that leads to groove 401 in the ladder.
In summary, the pressing plates 5 at the upper and lower ends can both move towards the clamping table 4, and when the pressing plate 5 at the lower end moves towards the clamping table 4, the probes 8 on the pressing plate 5 at the lower end extend into the stepped through groove 401 from the bottom of the stepped through groove 401 and contact with the lower surface of the board card, so that the board card tester 2 can test the lower surface of the board card through the probes 8 on the pressing plate 5 at the lower end;
similarly, when the pressing plate 5 at the upper end moves towards the clamping table 4, the probe 8 at the upper end of the pressing plate 5 at the upper end penetrates through the inner side of the clamping frame 11 and is in contact with the upper surface of the board card, so that the upper surface of the board card is tested, and therefore, the board card can be tested on the upper surface and the lower surface only by clamping the board card once, the trouble of turning over and re-clamping the board card is eliminated, and the board card testing efficiency is improved;
through installing probe 8 on the slider 7 on clamp plate 5, slider 7 can slide from top to bottom in the blind hole 501 on clamp plate 5, so when probe 8 contacts with the integrated circuit board, if the contact dynamics between probe 8 and the integrated circuit board is too big, then slider 7 just can be promoted by reaction force and slides towards the direction of keeping away from the integrated circuit board, cushion with this impact force, avoid probe 8 or integrated circuit board to be crushed, and after slider 7 slides, spring 9 can receive the extrusion and produce an elasticity opposite with slider 7 slip direction, and this elasticity can be exerted on slider 7, thereby after slider 7 takes place to remove, make probe 8 on the slider 7 can also be inseparable contact with the integrated circuit board.
Claims (6)
1. The utility model provides a pressure intelligence integrated circuit board testing arrangement, includes integrated circuit board test jig (1) and integrated circuit board tester (2), integrated circuit board tester (2) are located the outside of integrated circuit board test jig (1), its characterized in that:
guide rods (3) are welded at the left end and the right end between the upper surface and the lower surface of the inner side of the board card testing frame (1), two guide rods (3) are welded at the middle part between the guide rods (3), a clamping table (4) is welded at the middle part between the upper surface and the lower surface of the inner side of the board card testing frame (1), pressing plates (5) capable of moving up and down are arranged at the upper end and the lower end of the clamping table (4), two pressing plates (5) are evenly provided with a plurality of blind holes (501) towards the surface of the clamping table (4), a sliding block (7) capable of sliding up and down is arranged inside the blind holes (501), a probe (8) is inserted into the sliding block (7) towards the surface of the clamping table (4), and a spring (9) is fixedly connected between the surface of the sliding block (7) towards the hole bottom of the blind holes (501) and the hole bottom of the blind holes (501).
2. The intelligent pressure board card testing device of claim 1, wherein: the two guide rods (3) respectively penetrate through the left end and the right end of the rear side of the two pressing plates (5), and the pressing plates (5) are connected with the guide rods (3) in a sliding mode.
3. The intelligent pressure board card testing device of claim 2, wherein: two electric putter (6) are installed respectively to a surface of clamp plate (5) back to clamping platform (4) and between the inboard upper and lower two sides of integrated circuit board test jig (1), electric putter (6) are located the place ahead of guide arm (3).
4. The intelligent pressure board card testing device of claim 1, wherein: a step through groove (401) is formed between the upper surface and the lower surface of the clamping table (4), and a clamping frame (11) used for fixing the board card is embedded into the upper end of the inside of the step through groove (401).
5. The intelligent pressure board card testing device of claim 4, wherein: the probes (8) on the two pressing plates (5) are respectively positioned at the upper side and the lower side of the stepped through groove (401).
6. The intelligent pressure board card testing device of claim 1, wherein: one end, far away from the clamping table (4), of the probe (8) penetrates through the sliding block (7) and is connected with a lead (10), and the lead (10) penetrates through the pressing plate (5) and is connected with the board card tester (2).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202122389406.1U CN216622584U (en) | 2021-09-29 | 2021-09-29 | Pressure intelligence integrated circuit board testing arrangement |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202122389406.1U CN216622584U (en) | 2021-09-29 | 2021-09-29 | Pressure intelligence integrated circuit board testing arrangement |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN216622584U true CN216622584U (en) | 2022-05-27 |
Family
ID=81690614
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202122389406.1U Expired - Fee Related CN216622584U (en) | 2021-09-29 | 2021-09-29 | Pressure intelligence integrated circuit board testing arrangement |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN216622584U (en) |
-
2021
- 2021-09-29 CN CN202122389406.1U patent/CN216622584U/en not_active Expired - Fee Related
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20220527 |
|
| CF01 | Termination of patent right due to non-payment of annual fee |