CN214895653U

CN214895653U - Auxiliary clamp for flying probe test

Info

Publication number: CN214895653U
Application number: CN202120469910.XU
Authority: CN
Inventors: 周天飞; 郑朝晖; 倪卫华; 顾昊晖
Original assignee: Giga Force Electronics Co ltd
Current assignee: Giga Force Electronics Co ltd
Priority date: 2021-03-04
Filing date: 2021-03-04
Publication date: 2021-11-26
Anticipated expiration: 2031-03-04

Abstract

The utility model discloses a flying probe test auxiliary fixture belongs to PCB test technical field. The method comprises the following steps: the supporting frame is provided with at least two first rails which are arranged in parallel, a second rail is arranged on one side of each first rail along the length direction of the first rail, the length direction of the second rail is perpendicular to the length direction of the first rail, and a PCB is installed in the supporting frame. The slide bar can slide to and fro along the length direction of the first track. The fixed pressing block is arranged on the sliding rod and movably connected with the sliding rod, and the fixed pressing block can be pressed or separated from a partial area of the PCB. The first sliding blocks can slide back and forth along the length direction of the second track and are pressed or separated from partial areas of the PCB. The flying probe test auxiliary clamp can enable a PCB with a smaller size to meet the test requirement of a flying probe test machine.

Description

Auxiliary clamp for flying probe test

Technical Field

The utility model relates to a PCB tests technical field, specifically relates to a flying probe test auxiliary clamp.

Background

The flying needle tester is PCBA test equipment with flexibility and high timeliness which is produced by the problem of huge cost of needle bed test. Various flying probe testing machines are currently on the market, such as 4-probe or 6-probe devices, IFree, EMMA, SPEA, Koya, etc., capable of testing PCBs of 620mm by 580mm or even larger area. However, it is difficult to support PCBs having smaller areas, such as 90mm by 90mm, because the smaller the PCB, the closer the track distance for holding the board to be tested. This results in the following problems at the time of testing: the running space of the test needle arms below the track is limited, the test needle processor is difficult to precisely move in the narrow range without interfering the track to adjust the track to the minimum size, all the test needle arms are in the range of the double tracks, and the test needle processor cannot cross the range of the tracks to avoid a no-fly area above the PCBA and the space occupied by the test needle processors and the PCBA. Therefore, the tester sets the minimum width of the track, and forbids a user to test the PCB smaller than the limited size.

SUMMERY OF THE UTILITY MODEL

Aiming at the problems in the prior art, the auxiliary clamp for the flying probe test is provided, so that a PCB with a smaller size can meet the test requirement of a flying probe tester.

The specific technical scheme is as follows:

flying probe test auxiliary jig includes: the support frame, slide bar, a plurality of fixed briquetting and a plurality of first slider.

The supporting frame is provided with at least two first rails which are arranged in parallel, a second rail is arranged on one side of each first rail along the length direction of the first rail, the length direction of the second rail is perpendicular to the length direction of the first rail, and a PCB is installed in the supporting frame.

The slide bar can slide to and fro along the length direction of the first track.

The fixed pressing block is arranged on the sliding rod and movably connected with the sliding rod, and the fixed pressing block can be pressed or separated from a partial area of the PCB.

The first sliding blocks can slide back and forth along the length direction of the second track and are pressed or separated from partial areas of the PCB.

The auxiliary clamp for the flying probe test is further characterized by comprising a plurality of second sliding blocks, wherein the second sliding blocks are respectively arranged at two ends of the sliding rod in the length direction.

The flying probe test auxiliary clamp also has the characteristic that the second sliding blocks are respectively matched with the corresponding first tracks.

The flying probe test auxiliary clamp is characterized in that the support frame and the edge of the sliding rod, which is in contact with the PCB, are provided with placing steps.

The flying probe test auxiliary clamp is characterized in that the support frame is detachably arranged on the flying probe test machine, a baffle step used for being clamped with the flying probe test machine is arranged at the edge of the support frame, and the baffle step and the bottom plane of the PCB are positioned on the same horizontal plane.

The flying probe test auxiliary clamp is characterized in that the first sliding block is provided with a knob, and after the knob is rotated, the first sliding block can be pressed or separated from a partial area of the PCB.

The flying probe test auxiliary clamp is characterized in that the fixing pressing block is internally provided with an elastic structure, the fixing pressing block can move along the axial direction under the action of external force and the elastic structure, and the fixing pressing block can rotate along the axial direction.

The positive effects of the technical scheme are as follows:

in the flying probe test auxiliary clamp provided by the utility model, the limit of different small-size PCB boards can be met by the movement of the slide bar, and the PCB board is fixed by the fixed pressing block and the first sliding block, so that the normal test of the flying probe test machine can be carried out on the PCB board with smaller size; meanwhile, the stroke of the test needle does not need to be calibrated and compensated again after the PCB is arranged on the clamp by matching the baffle step with the placing step; the first sliding block is movably arranged, so that edge devices of the PCB can be avoided flexibly.

Drawings

Fig. 1 is a schematic structural diagram of an embodiment of an auxiliary clamp for flying probe testing according to the present invention;

fig. 2 is a first schematic structural diagram of a support frame in an embodiment of the flying probe testing auxiliary fixture of the present invention;

fig. 3 is a second schematic structural view of a supporting frame in an embodiment of the flying probe testing auxiliary fixture of the present invention;

fig. 4 is a longitudinal sectional view of an embodiment of the flying probe testing auxiliary clamp of the present invention.

1. A support frame; 101. a first track; 102. a second track; 2. a slide bar; 3. fixing a pressing block;

4. a first slider; 41. a knob; 5. a second slider; 6. a PCB board; 7. placing a step; 8. baffle step.

Detailed Description

In order to make the technical means, creation characteristics, achievement purpose and efficiency of the utility model be easily understood and understood, the following embodiment is combined with the accompanying drawings 1 to 4 and is right the utility model provides a flying probe test auxiliary clamp makes concrete exposition.

The numbering of the components themselves, such as "first", "second", etc., is used herein only to distinguish between the objects depicted and not to have any sequential or technical meaning. The term "connected" and "coupled" when used in this application, unless otherwise indicated, includes both direct and indirect connections (couplings). In the description of the present invention, it is to be understood that the terms "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, and are only for convenience of description and simplicity of description, and do not indicate or imply that the device or element referred to must have a particular orientation, be constructed and operated in a particular orientation, and therefore, should not be construed as limiting the present invention.

In the present application, unless expressly stated or limited otherwise, the first feature may be directly on or directly under the second feature or indirectly via intermediate members. Also, a first feature "on," "over," and "above" a second feature may be directly or diagonally above the second feature, or may simply indicate that the first feature is at a higher level than the second feature. A first feature being "under," "below," and "beneath" a second feature may be directly under or obliquely under the first feature, or may simply mean that the first feature is at a lesser elevation than the second feature.

In the flying probe test auxiliary clamp, a virtual PCB 6 test area is formed through a support frame 1, and further the problems that the size of a PCB 6 to be tested is too small and a test machine cannot work normally are solved, generally, the support frame 1 is consistent with the PCB 6 in shape and is generally arranged in a rectangular shape, the support frame 1 is provided with at least two first rails 101 which are arranged in parallel, generally, two first rails 101 are arranged and are respectively arranged at two opposite sides of the support frame 1, a second rail 102 is arranged on one side of the first rail 101 in the length direction, the length direction of the second rail 102 is perpendicular to the length direction of the first rail 101, the PCB 6 is installed in the support frame 1, and two adjacent sides of the PCB 6 are respectively abutted against one side of the support frame 1 provided with the first rail 101 and one side of the support frame 1 provided with the second rail 102.

The slide bar 2 can slide to and fro along the length direction of the first track 101, namely the slide bar 2 can be close to or far away from the second track 102, one side of the slide bar 2 close to the second track 102 can be contacted with the edge of the PCB 6 to be tested and is abutted against the edge, the position of the PCB to be tested is limited by at least two sides of the slide bar 2 and the inner side of the supporting frame 1, and the subsequent needle bed test of the PCB 6 to be tested is facilitated.

Fixed briquetting 3 sets up in slide bar 2 to with slide bar 2 swing joint, fixed briquetting 3 can compress tightly or separate with partial region of PCB board 6, and fixed briquetting 3 one end can move about, and fixed briquetting 3 perpendicular to 1 ascending projection of braced frame can with slide bar 2 in the ascending projection coincidence of this side or part break away from for fix, place and take off PCB board 6.

A plurality of first sliders 4 can slide along the length direction of the second track 102 in a reciprocating mode, the first sliders 4 can be moved and arranged to enable plug-in components on the PCB 6 to be avoided conveniently in the process of clamping and fixing the PCB 6, the first sliders 4 are mainly used for compressing partial areas of the PCB 6, and subsequent testing of the PCB 6 is facilitated.

In a preferred embodiment, as shown in fig. 1, the PCB testing device further includes a plurality of second sliding blocks 5, the second sliding blocks 5 are respectively disposed at two ends of the sliding rod 2 in the length direction, two general second sliding blocks 5 are disposed for bearing the sliding rod 2 and assisting the sliding rod 2 to slide, the specific second sliding blocks 5 are detachably connected with the sliding rod 2 or integrally disposed with the sliding rod 2, and the second sliding blocks 5 move to drive the sliding rod 2 to move, so as to limit the width of the PCB 6 to be tested and fix the PCB 6. The clamp can be matched with the PCB 6 to be tested with any width smaller than 13cm by moving the second slide block 5.

In a preferred embodiment, as shown in fig. 1, the second sliders 5 are respectively matched with the corresponding first tracks 101, the specific first tracks 101 are grooves for the second sliders 5 to slide, the portions of the second sliders 5 embedded in the first tracks 101 are consistent with the shapes of the corresponding grooves, and sliding friction or rolling friction may be formed between the second sliders 5 and the grooves, which can be adaptively adjusted according to actual conditions, and generally considering that sliding friction is selected, the friction resistance is large, and the slide bar 2 does not easily slide after the position is determined.

In a preferred embodiment, as shown in fig. 1 to 4, the support frame 1 and the edge of the sliding rod 2 contacting the PCB 6 are provided with a placing step 7, the support frame 1 receives the PCB 6 to lift the edge of the PCB 6, and the support frame 1 is a rectangular frame with a hollow center.

In a preferred embodiment, as shown in fig. 1 to 4, the support frame 1 is detachably disposed on the flying probe testing machine, and the edge of the support frame 1 is provided with a baffle step 8 for being clamped with the flying probe testing machine, and the baffle step 8 is at the same horizontal plane with the bottom plane of the PCB 6 to be tested. The slide bar 2 and the placing step 7 arranged in the supporting frame 1 are matched with the baffle step 8 on the periphery of the supporting frame 1, so that the vertical distance between the bottom layer of the PCB 6 and the bottom needle point is the same regardless of whether a frame structure is used, the calibration compensation of the test needle is not needed again during testing, and the use is simple and convenient.

In a preferred embodiment, as shown in fig. 1, the first slider 4 is provided with a knob 41, after the knob 41 is rotated, the first slider 4 can be pressed or separated from a partial region of the PCB 6, specifically, the knob 41 can be rotated forward or backward, the first slider 4 further comprises a pressing component, further, after the knob 41 is rotated forward, the pressing component moves downward to press the PCB 6 to limit the movement of the PCB, after the knob 41 is rotated backward, the pressing component moves upward to be separated from the PCB 6, and then the PCB 6 can be removed for subsequent operation.

In a preferred embodiment, as shown in fig. 1, an elastic structure is disposed inside the fixed pressing block 3, the fixed pressing block 3 can move along the axial direction thereof under the action of an external force and the elastic structure, and the fixed pressing block 3 can rotate along the axial direction thereof, and a pressing part is also disposed on one side of the fixed pressing block 3, and after the fixed pressing block 3 rotates, the pressing part can contact with or be away from the PCB 6 placed on the supporting frame 1, so as to facilitate the placement or removal of the PCB 6.

The technical features of the above embodiments can be arbitrarily combined, and for the sake of brevity, all possible combinations of the technical features in the above embodiments are not described, but should be considered as the scope of the present specification as long as there is no contradiction between the combinations of the technical features.

The above is only a preferred embodiment of the present invention, and not intended to limit the scope of the invention, and it should be appreciated by those skilled in the art that various equivalent substitutions and obvious changes made in the specification and drawings should be included within the scope of the present invention.

Claims

1. Flying probe test auxiliary fixture which characterized in that includes:

the support frame is provided with at least two first rails which are arranged in parallel, a second rail is arranged on one side of each first rail along the length direction of the first rail, the length direction of each second rail is perpendicular to the length direction of each first rail, and a PCB is arranged in the support frame;

the sliding rod can slide in a reciprocating mode along the length direction of the first rail;

the fixed pressing blocks are arranged on the sliding rods and movably connected with the sliding rods, and the fixed pressing blocks can be pressed or separated from partial areas of the PCB;

and the first sliding blocks can slide back and forth along the length direction of the second track and are pressed or separated from partial areas of the PCB.

2. The flying probe testing auxiliary clamp of claim 1, further comprising a plurality of second sliding blocks, wherein the second sliding blocks are respectively arranged at two ends of the sliding rod in the length direction.

3. The flying probe testing aid jig of claim 2, wherein the second sliders are respectively matched with the corresponding first rails.

4. The flying probe testing auxiliary jig of claim 1, wherein the support frame and the edge of the slide bar contacting the PCB board are provided with a placing step.

5. The flying probe test auxiliary clamp of claim 1, wherein the supporting frame is detachably disposed on the flying probe tester, and a baffle step for being clamped with the flying probe tester is disposed at an edge of the supporting frame, and the baffle step and a bottom plane of the PCB are at the same horizontal plane.

6. The flying probe test auxiliary clamp of claim 1, wherein the first slider is provided with a knob, and the first slider can be pressed or separated from a partial area of the PCB board after the knob is rotated.

7. The flying probe test auxiliary clamp of claim 1, wherein the fixed pressing block is internally provided with an elastic structure, the fixed pressing block can move along the axial direction thereof under the action of external force and the elastic structure, and the fixed pressing block can rotate along the axial direction thereof.