CN117310430A - Semiconductor test fixture - Google Patents

Abstract

The invention discloses a semiconductor test fixture, which relates to the technical field of semiconductor test equipment. It includes a base. The four corners of the bottom surface of the base are fixed with bottom pillars. The rear end surface of the base is vertically fixed with a support plate. The top surface of the base is A workbench is fixedly connected to the middle part of the workbench, a clamping assembly is provided on the workbench, and a fixing assembly is provided on the front end of the support plate; the invention facilitates the relative movement of the two splints through a two-way screw rod, and facilitates the stable movement of the splints through a guide rod, thereby reducing Errors caused by different positions during detection; the guide pillars on both sides of the pressure plate can prevent the pressure plate from rotating when it is lowered; the multiple notches on the top surface of the pressure plate facilitate the adjustment of the position of the detection component to facilitate the detection of semiconductors at different positions; through When the detection component is pressed down, it cannot be energized when it first contacts the semiconductor. When it continues to drop, the detection component will be energized, which reduces the loss of the detection component, facilitates multiple detection of semiconductors, and improves the safety protection effect when testing semiconductors.

Description

A semiconductor test fixture

Technical field

The present invention relates to the technical field of semiconductor testing tools, and in particular, to a semiconductor testing fixture.

Background technique

Early semiconductor test fixtures were mainly simple physical interfaces used to connect the device under test and test equipment. These fixtures usually consist of metal fixtures, needle probes, etc., which are manually wired and require manual operation by testers to perform testing.

Existing semiconductor test fixtures usually consist of fixtures and probes, and testers manually operate the probes to test semiconductors; when conducting electrical tests, testers have better manual operation flexibility. When conducting a small amount of semiconductor tests, the test Manual operation by personnel is the best, but when a large number of semiconductor tests need to be carried out, the human factor of manual operation by testers is relatively large, which not only causes errors and affects the test structure, but also lacks safety during power-on testing; Therefore, the above problems need to be improved.

Contents of the invention

The purpose of the present invention is to propose a semiconductor testing fixture in order to solve the shortcomings existing in the prior art.

In order to achieve the above object, the present invention adopts the following technical solution: a semiconductor test fixture, including a base, the four corners of the bottom surface of the base are fixed with bottom pillars, and the rear end surface of the base is vertically fixed with a support plate , and a workbench is fixedly connected to the middle part of the top surface of the base, the workbench is provided with a clamping component, and the front end surface of the support plate is provided with a fixed component; the clamping component includes a transverse opening on the workbench. The chute on the top surface, and there are two equidistant guide grooves transversely provided in the workbench. A two-way screw rod is transversely provided in the guide groove at the front end of the top surface of the workbench. The guide groove at the rear end of the top surface of the workbench A guide rod is fixed transversely inside, and a hand wheel is fixedly connected to one end of the two-way screw rod. The two-way screw rod is rotatably connected to the workbench through bearings fixedly connected to both ends. The guide rod is fixedly connected to a handwheel at both ends. The baffle is fixedly connected in the workbench, and the two ends of the top surface of the workbench are provided with splints. The lower ends of the splints are threadedly connected to the two-way screw rod and sleeved on the guide rod respectively.

Preferably, the fixing assembly includes fixing rings transversely fixed on both sides of the upper end of the front end surface of the support plate, a guide post is provided between the fixing ring and the base, and the bottom surface of the guide post is fixed on the top surface of the base. The upper and upper ends are fixed on the inside of the fixed ring.

Preferably, the fixing assembly further includes a fixing plate vertically fixed on the middle upper end of the front end surface of the support plate, a C-shaped frame is vertically fixed on the front end surface of the fixed plate, and a C-shaped frame is vertically fixed on the lower end of the C-shaped frame. sleeve, and the upper end of the C-shaped frame is hinged with an L-shaped pressure rod, the inner side of the sleeve is vertically movable with a guide post, and U-shaped frames are provided on both sides of the guide post, and the U-shaped frame The upper and lower ends are respectively connected to the upper end of the guide column and the middle part of the L-shaped pressure plate through bolts.

Preferably, a pressure plate is provided at the upper end of the workbench, and sliding sleeves are fixedly connected to both sides of the rear end of the pressure plate. The sliding sleeves are movably connected to the guide column, and the rear end of the middle part of the top surface of the pressure plate is fixedly connected to a sliding sleeve. A connecting seat, a guide post is fixedly connected to the top surface of the connecting seat, a plurality of equidistant notches are provided on the top surface of the pressure plate, and a detection component is provided in the notches.

Preferably, the detection component includes a connecting block vertically fixed in the notch, a shell is fixed on the bottom surface of the connecting block, a small rubber sleeve is vertically provided in the shell cavity, and the inner upper end of the small rubber sleeve is Fixed with copper ring.

Preferably, the inner upper end of the copper ring is fixedly connected with the energizing device, and the top surface of the small rubber sleeve, the copper ring and the energizing device are all fixed on the connecting block, and the lower end of the shell is connected with a large rubber sleeve. A detection needle is engaged with the inside of the large rubber sleeve. The upper end of the detection needle is located at the lower end of the small rubber sleeve, and a spring is vertically provided between the small rubber sleeve and the outer casing.

Compared with the existing technology, the beneficial effects of the present invention are: the present invention facilitates the movement of the splint through the chute and the guide groove, and then fixes the semiconductor through the splint to facilitate semiconductor testing; the two-way screw rod facilitates the relative movement of the two splints, and The guide rod facilitates the stable movement of the clamping plate and fixes the semiconductor in the middle of the workbench, thereby reducing errors caused by different positions during detection; the guide column facilitates the stable descent of the pressure plate, and the guide columns on both sides of the pressure plate allow the pressure plate to descend smoothly. Rotation will occur to reduce errors; the sleeve is used to prevent the guide post from deflecting, thereby allowing the pressure plate to descend steadily; the height of the pressure plate is indirectly controlled through the L-shaped pressure rod. There are multiple equidistant notches on the top surface of the pressure plate. The notch is convenient for adjusting the position of the detection component and detecting semiconductors at different positions; at the same time, it can improve the protection effect of the semiconductor being tested; and when the detection component is pressed down, it cannot be powered when it first contacts the semiconductor, and when it continues to drop, the detection The components will be energized, which reduces the loss of the detection components, facilitates multiple detection of semiconductors, and improves the safety protection effect when testing semiconductors.

Description of drawings

The drawings described here are used to provide a further understanding of the present invention and constitute a part of this application. The illustrative embodiments of the present invention and their descriptions are used to explain the present invention and do not constitute an improper limitation of the present invention. In the attached picture:

Figure 1 is a schematic diagram of the overall three-dimensional structure of the present invention;

Figure 2 is a schematic front view of the structure of the present invention;

Figure 3 is a schematic side view of the cross-sectional structure of the present invention;

Figure 4 is a schematic top view of the cross-sectional structure of the present invention;

Figure 5 is a schematic cross-sectional view of the first layer of the present invention;

Figure 6 is a schematic diagram of the second layer cross-sectional structure of the present invention;

Figure 7 is an enlarged schematic diagram of the structure of part A in Figure 6 of the present invention;

Figure 8 is a schematic diagram of the overall three-dimensional structure of the detection component of the present invention.

Serial numbers in the picture: 1. Base; 2. Bottom column; 3. Support plate; 4. Workbench; 5. Two-way screw; 6. Guide rod; 7. Handwheel; 8. Block; 9. Bearing; 10 , plywood; 11. Guide column; 12. Fixed ring; 13. Pressure plate; 14. Sliding sleeve; 15. Fixed plate; 16. C-shaped frame; 17. Sleeve; 18. Guide column; 19. U-shaped frame; 20 , L-shaped pressure rod; 21. Connecting seat; 22. Connecting block; 23. Shell; 24. Small rubber sleeve; 25. Copper ring; 26. Power supply device; 27. Large rubber sleeve; 28. Detection needle; 29. Glue Ring; 30. Spring.

Detailed ways

The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some of the embodiments of the present invention, rather than all the embodiments.

Embodiment: Referring to Figures 1 to 8, a semiconductor test fixture includes a base 1, through which the height of the workbench 4 can be easily increased; bottom columns 2 are fixed on the four corners of the bottom surface of the base 1, and through the bottom columns 2 It is convenient to support the workbench 4; a support plate 3 is fixed vertically on the rear end surface of the base 1, and other components are easily connected through the support plate 3; a workbench 4 is fixed in the middle of the top surface of the base 1, and testing is facilitated by the workbench 4; The workbench 4 is provided with a clamping assembly, and the front end surface of the support plate 3 is provided with a fixed assembly; the clamping assembly includes a chute transversely opened on the top surface of the workbench 4, and two equidistant slots are transversely opened in the workbench 4 The guide groove facilitates the movement of the splint 10 through the chute and the guide groove; the guide groove at the front end of the top of the workbench 4 is transversely provided with a two-way screw rod 5, and the two-way screw rod 5 facilitates the relative movement of the two splints 10. A guide rod 6 is fixed transversely in the guide groove at the end, and the guide rod 6 prevents the splint 10 from rotating; a handwheel 7 is fixed at one end of the two-way screw rod 5, and the handwheel 7 facilitates the rotation of the two-way screw rod 5; and the two-way screw rod 5 5 is rotatably connected to the workbench 4 through bearings 9 fixedly connected to both ends. The bearings 9 facilitate better rotation of the two-way screw rod 5; the guide rod 6 is fixedly connected to the workbench 4 through baffles 8 fixedly connected to both ends. The guide rod 6 is prevented from sliding out by the baffle 8; clamping plates 10 are provided at both ends of the top surface of the workbench 4 to facilitate the fixation of semiconductors; the lower ends of the clamping plates 10 are threadedly connected to the two-way screw rod 5 and sleeved on the guide rod 6 respectively.

In the present invention, the fixing assembly includes fixing rings 12 transversely fixed on both sides of the upper end of the front end surface of the support plate 3. The fixing rings 12 facilitate fixing the guide column 11 to the base 1; the connection between the fixing ring 12 and the base 1 Guide posts 11 are provided in between, and the guide posts 11 prevent the pressure plate 13 from deflecting; the bottom surface of the guide posts 11 is fixed on the top surface of the base 1, and the upper end is fixed on the inside of the fixed ring 12.

In the present invention, the fixing assembly also includes a fixing plate 15 vertically fixed on the middle upper end of the front end surface of the support plate 3. The C-shaped frame 16 is easily fixed through the fixing plate 15; The C-shaped frame 16 is used to facilitate the connection between the guide post 18 and the L-shaped pressure plate 13; the lower end of the C-shaped frame 16 is vertically fixed with a sleeve 17, and the upper end is hinged with an L-shaped pressure rod 20. The sleeve 17 prevents the guide post from being guided. When the column 18 is offset, the height of the pressure plate 13 can be easily controlled through the L-shaped pressure rod 20; a vertically movable guide column 18 is provided on the inside of the sleeve 17, and the guide column 18 facilitates the connection between the pressure plate 13 and the L-shaped pressure rod 20; the guide column 18 U-shaped frames 19 are provided on both sides, and the U-shaped frame 19 facilitates the descent of the guide column 18; the upper and lower ends of the U-shaped frame 19 are connected to the upper end of the guide column 18 and the middle part of the L-shaped pressure plate 13 through bolts respectively.

In the present invention, a pressure plate 13 is provided at the upper end of the workbench 4, and sliding sleeves 14 are fixed on both sides of the rear end of the pressure plate 13. The sliding sleeves 14 facilitate the sliding of the pressure plate 13; the sliding sleeve 14 is movably connected to the guide column 11, and the pressure plate The rear end of the middle part of the top surface of 13 is fixedly connected with a connecting seat 21, through which the guide post 18 and the pressure plate 13 are easily connected; The slots are used to facilitate the adjustment of the position of the detection component through multiple slots; the detection components are arranged in the slots.

In the present invention, the detection component includes a connection block 22 vertically fixed in the slot, through which the detection component can be easily fixed; a shell 23 is fixed on the bottom surface of the connection block 22, through which the internal components can be easily protected; the cavity of the shell 23 A small rubber sleeve 24 is arranged vertically inside, and the small rubber sleeve 24 prevents the spring 30 from being energized. A copper ring 25 is fixedly connected to the inner upper end of the small rubber sleeve 24, and the copper ring 25 facilitates conduction; the inner upper end of the copper ring 25 is fixedly connected to a The energizing device 26 facilitates the detection of whether the semiconductor is conductive; and the small rubber sleeve 24, the copper ring 25 and the top surface of the energizing device 26 are all fixed on the connecting block 22, and a large rubber sleeve is connected to the lower end of the shell 23 27. The large rubber sleeve 27 prevents accidental contact and conduction; the inside of the large rubber sleeve 27 is connected with a detection needle 28, which facilitates detection; the upper end of the detection needle 28 is located at the lower end of the small rubber sleeve 24, and the small rubber sleeve 24 is connected to the shell A spring 30 is provided vertically between 23, through which the semiconductor can be easily detected.

Working principle: In this embodiment, the invention also proposes a method of using a semiconductor test fixture, which includes the following steps:

Step 1: First connect the wires to the connecting block 22 and energize it, then rotate the handwheel 7 counterclockwise, open the splint 10 outward, then place the semiconductor on the workbench 4, and then rotate the handwheel 7 clockwise to make The clamping plate 10 moves inward to clamp the semiconductor;

Step 2: Then lift the L-shaped pressure rod 20 upward, and move the guide post 18 downward through the hinge seat at the upper end of the U-shaped frame 19 and the C-shaped frame 16. Use the sleeve 17 to prevent the guide post 18 from deflecting when it descends. ; When the guide post 18 moves down, the pressure plate 13 is lowered through the connecting seat 21, and then the guide post 11 and the sliding sleeve 14 prevent the pressure plate 13 from falling and deflecting. When the pressure plate 13 drops, the detection component fixed below the pressure plate 13 also will decline;

Step 3: When the large rubber sleeve 27 touches the semiconductor, there is no power because the inner device is not connected yet. When the pressure plate 13 continues to drop, the large rubber sleeve 27 will rise on the inside of the housing 23. At this time, the spring 30 is in a compressed state. When the upper end of the detection needle 28 inside the large rubber sleeve 27 touches the copper ring 25, the device is powered on to detect whether the semiconductor is powered on, which can improve the convenience and work efficiency of semiconductor detection. Avoid mis-measurements and missed measurements;

Step 4: When the detection is completed, press down the L-shaped pressure rod 20. In the same way, the pressure plate 13 rises. During the rising process, the spring 30 will push the large rubber sleeve 27 downward so that the detection needle 28 does not touch the copper ring. 25. At this time, the device is powered off;

Step 5: After the device is powered off, turn the hand wheel 7 counterclockwise to move the splint 10 outward to loosen the semiconductor, then take out the semiconductor and reciprocate in order to test multiple semiconductors.

The above are only preferred specific embodiments of the present invention, but the protection scope of the present invention is not limited thereto. Any person familiar with the technical field can, within the technical scope disclosed in the present invention, implement the technical solutions of the present invention. Equivalent substitutions or changes of the inventive concept thereof shall be included in the protection scope of the present invention.

Claims (6)

1. The utility model provides a semiconductor test fixture, includes base (1), its characterized in that: the four corners of the bottom surface of the base (1) are fixedly connected with bottom posts (2), the rear end surface of the base (1) is vertically fixedly connected with a supporting plate (3), the middle part of the top surface of the base (1) is fixedly connected with a workbench (4), the workbench (4) is provided with a clamping assembly, and the front end surface of the supporting plate (3) is provided with a fixing assembly; the clamping assembly comprises a sliding groove transversely formed in the top surface of a workbench (4), two equidistant guide grooves are transversely formed in the workbench (4), a two-way screw rod (5) is transversely arranged in the guide groove at the front end of the top surface of the workbench (4), a guide rod (6) is transversely fixedly connected in the guide groove at the rear end of the top surface of the workbench (4), a hand wheel (7) is fixedly connected at one end of the two-way screw rod (5), bearings (9) are fixedly connected at two ends of the two-way screw rod (5) in a rotating mode, the guide rod (6) is fixedly connected with baffle plates (8) at two ends of the top surface of the workbench (4) in a fixedly connected mode, clamping plates (10) are arranged at two ends of the top surface of the workbench, and the lower ends of the clamping plates (10) are respectively connected with the two-way screw rod (5) in a threaded mode and are sleeved on the guide rod (6).

2. The semiconductor test fixture of claim 1, wherein: the fixing assembly comprises fixing rings (12) transversely fixedly connected to the upper ends of the two sides of the front end face of the supporting plate (3), guide posts (11) are arranged between the fixing rings (12) and the base (1), the bottom faces of the guide posts (11) are fixedly connected to the top face of the base (1), and the upper ends of the guide posts are fixedly connected to the inner sides of the fixing rings (12).

3. The semiconductor test fixture of claim 1, wherein: the fixing assembly further comprises a fixing plate (15) vertically fixedly connected to the upper end of the middle of the front end face of the supporting plate (3), a C-shaped frame (16) is longitudinally fixedly connected to the front end face of the fixing plate (15), a sleeve (17) is vertically fixedly connected to the lower end of the C-shaped frame (16), an L-shaped compression rod (20) is hinged to the upper end of the C-shaped frame (16), a guide pillar (18) is vertically movably arranged on the inner side of the sleeve (17), U-shaped frames (19) are arranged on two sides of the guide pillar (18), and the upper end and the lower end of each U-shaped frame (19) are respectively connected to the upper end of the guide pillar (18) and the middle of the L-shaped compression plate (13) through bolts.

4. A semiconductor test fixture according to claim 3, wherein: the automatic detection device is characterized in that a pressing plate (13) is arranged at the upper end of the workbench (4), sliding sleeves (14) are fixedly connected to two sides of the rear end of the pressing plate (13), the sliding sleeves (14) are movably sleeved on the guide posts (11), a connecting seat (21) is fixedly connected to the rear end of the middle of the top surface of the pressing plate (13), guide posts (18) are fixedly connected to the top surface of the connecting seat (21), a plurality of equidistant notches are formed in the top surface of the pressing plate (13), and detection components are arranged in the notches.

5. The semiconductor test fixture of claim 4, wherein: the detection assembly comprises a connecting block (22) vertically fixedly connected in the notch, a shell (23) is fixedly connected to the bottom surface of the connecting block (22), a small rubber sleeve (24) is vertically arranged in a cavity of the shell (23), and a copper ring (25) is fixedly connected to the upper end of the inner side of the small rubber sleeve (24).

6. The semiconductor test fixture of claim 5, wherein: the inner side upper end of copper ring (25) is fixedly connected with power-on device (26), just little gum cover (24), copper ring (25) and the top surface of power-on device (26) all are fixedly connected on connecting block (22), shell (23) lower extreme joint has big gum cover (27), the inboard joint of big gum cover (27) has detection needle (28), detection needle (28) upper end is located little gum cover (24) lower extreme, just vertical spring (30) that are equipped with between little gum cover (24) and shell (23).