CN220074520U - Semiconductor power device IV test fixture convenient to clamp - Google Patents
Semiconductor power device IV test fixture convenient to clamp Download PDFInfo
- Publication number
- CN220074520U CN220074520U CN202321720181.6U CN202321720181U CN220074520U CN 220074520 U CN220074520 U CN 220074520U CN 202321720181 U CN202321720181 U CN 202321720181U CN 220074520 U CN220074520 U CN 220074520U
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- semiconductor power
- power device
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- stop block
- bending arms
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- 239000004065 semiconductor Substances 0.000 title claims abstract description 86
- 238000012360 testing method Methods 0.000 title claims abstract description 24
- 238000005452 bending Methods 0.000 claims abstract description 49
- 238000001514 detection method Methods 0.000 claims abstract description 16
- 238000001125 extrusion Methods 0.000 claims description 14
- 230000000903 blocking effect Effects 0.000 claims description 10
- 238000007906 compression Methods 0.000 claims description 8
- 230000006835 compression Effects 0.000 claims description 7
- 230000002159 abnormal effect Effects 0.000 claims description 4
- 238000004891 communication Methods 0.000 claims description 3
- 230000000694 effects Effects 0.000 abstract description 3
- 230000008901 benefit Effects 0.000 description 2
- 238000012544 monitoring process Methods 0.000 description 2
- 238000006243 chemical reaction Methods 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 239000012212 insulator Substances 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000010248 power generation Methods 0.000 description 1
Classifications
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The utility model relates to the field of semiconductor testing, in particular to a semiconductor power device IV testing clamp convenient to clamp. The utility model provides a semiconductor power device IV test fixture which can conduct classification and export on semiconductor power devices with excellent differences in detection during detection of the semiconductor power devices, improves detection efficiency and is convenient to clamp. The utility model provides a semiconductor power device IV test fixture convenient to press from both sides tight, includes base, motor and cam etc. and both sides all open down the silo around the base middle part, and base left part downside is connected with the motor, is connected with the cam on the motor output shaft. According to the utility model, the bending arms are pushed to be extruded by the telescopic ends of the hydraulic cylinders, so that the whole bending arms move backwards, the bending arms change positions, and the effects of classifying and guiding out the semiconductor power devices with excellent differences in detection and improving the detection efficiency can be achieved when the semiconductor power devices are detected.
Description
Technical Field
The utility model relates to the field of semiconductor testing, in particular to a semiconductor power device IV testing clamp convenient to clamp.
Background
Semiconductors refer to materials with conductivity properties between conductors and insulators at ordinary temperatures, and are used in integrated circuits, consumer electronics, communication systems, photovoltaic power generation, lighting, high power conversion, and other fields, such as diodes, which are devices fabricated using semiconductors.
The conventional device for IV test of semiconductor power devices is characterized in that the semiconductor power devices are firstly placed on a test bench when the test is performed, the semiconductor power devices are clamped through a limiting mechanism and then detected by IV test equipment, but the conventional device is inconvenient to classify the semiconductor power devices with qualified or unqualified quality when the test is performed, the monitoring operation is required manually, the labor cost is high, and the detection efficiency is affected.
Therefore, a semiconductor power device IV test fixture which can classify and lead out semiconductor power devices with excellent differences in detection when the semiconductor power devices are detected, and which is convenient to clamp and improves the detection efficiency has been developed.
Disclosure of Invention
In order to overcome the defects that the existing device is inconvenient in classifying the semiconductor power devices with qualified or unqualified quality, manual monitoring operation is needed, the labor cost is high, and the detection efficiency is affected in detecting the semiconductor power devices, the utility model provides the semiconductor power device IV test fixture which can classify and lead out the semiconductor power devices with excellent difference in detection, and improve the detection efficiency and is convenient to clamp.
The technical proposal is as follows: the utility model provides a semiconductor power device IV test fixture convenient to press from both sides tightly, including base, a motor, the cam, advance the pole, the frame press from both sides the body, press from both sides to indicate, limit high xarm, tester and classification mechanism, both sides all open around the base middle part have down the silo, base left part downside is connected with the motor, be connected with the cam on the motor output shaft, base left side upper portion slidingtype is connected with advance pole, advance pole left portion and cam slidingtype connection, advance the pole right side to be connected with the frame press from both sides the body, the frame press from both sides the middle part rotation type and be connected with press from both sides to indicate, both sides upper right side all slidingtype connection limit high xarm around the base, base middle part upside is connected with a plurality of testers, be equipped with the classification mechanism that is used for classifying semiconductor power device on the base.
As a further preferred scheme, the sorting mechanism comprises a compression spring, a bending arm and a hydraulic cylinder, wherein the front part and the rear part of a base are both connected with the bending arm in a sliding mode, the left side of the bending arm is in extrusion fit with a clamping finger, the right side of the bending arm is in extrusion fit with a clamped semiconductor power device, the compression spring is connected between the bending arm at the rear part of the base and the base, the hydraulic cylinder is connected with the front part of the base, the telescopic end of the hydraulic cylinder is connected with the adjacent bending arm, the hydraulic cylinder is electrically connected with a tester, when the tester detects that the semiconductor power device is abnormal, the hydraulic cylinder is started, the telescopic end of the hydraulic cylinder pushes the bending arms to extrude each other, so that the bending arms integrally move backwards, the position of the bending arms is changed, and the clamped semiconductor power device is changed from the original backward falling into forward falling when being extruded and falling by the bending arms, so that the sorting purpose is realized.
As a further preferable scheme, the semiconductor power device comprises a front stopping mechanism, the front stopping mechanism comprises an inclined stop block, a spring seat and a lifting stopping plate, wherein the front side and the rear side of the left part of the height limiting cross arm are both connected with the inclined stop block in a sliding mode, the front side and the rear side of the left part of the height limiting cross arm are both connected with the spring seat, the lifting stopping plate is connected with the lifting stopping plate in a sliding mode, the lifting stopping plate is contacted with the adjacent inclined stop block, the bottom of the inclined stop block is contacted with the base, the right side of the lower part of the inclined stop block is in extrusion fit with a clamped semiconductor power device, the right side of the upper part of the inclined stop block is in extrusion fit with a clamping finger, when the clamping finger is clamped to the semiconductor power device, the lifting stopping plate is extruded and separated from the inclined stop block, the lifting stopping plate slides upwards, the semiconductor power device is taken out, and when the semiconductor power device is taken out, the lifting stopping plate is gradually reset under the action of the spring seat to limit the top of the inclined stop block, the semiconductor power device which is not clamped yet is in extrusion fit with the clamping finger, and the clamping finger is used for preventing the semiconductor power device from being accidentally falling.
As a further preferable scheme, a clamping pad is arranged at the right lower part of the frame clamp body.
As a further preferable scheme, the right side of the clamping finger is provided with an elastic pushing piece.
As a further preferable mode, the bending arms are combined into a triangular structure.
The utility model has the following advantages: 1. according to the utility model, the bending arms are pushed to be extruded by the telescopic ends of the hydraulic cylinders, so that the whole bending arms move backwards, the bending arms change positions, and the effects of classifying and guiding out the semiconductor power devices with excellent differences in detection and improving the detection efficiency can be achieved when the semiconductor power devices are detected.
2. According to the utility model, the limit control of the inclined stop block by the lifting-resistant plate can achieve the effect of limiting the semiconductor power device to be clamped and preventing the semiconductor power device from being too much extruded and dropped to influence detection.
Drawings
Fig. 1 is a schematic perspective view of the present utility model.
Fig. 2 is a schematic structural view of the present utility model.
Fig. 3 is a schematic view of a partial perspective structure of the present utility model.
Fig. 4 is a schematic view of a partial perspective structure of the present utility model.
Fig. 5 is a schematic perspective view of the sorting mechanism according to the present utility model.
Fig. 6 is a schematic perspective view of the front stop mechanism of the present utility model.
Wherein: the device comprises a base, a 2-blanking groove, a 3-motor, a 4-cam, a 5-forward rod, a 6-frame clamp body, 7-clamp fingers, an 8-height limiting cross arm, a 9-tester, a 10-sorting mechanism, a 101-compression spring, a 102-bending arm, a 103-hydraulic cylinder, a 11-front stopping mechanism, a 111-inclined stop block, 112-spring seats and 113-lifting-resisting plates.
Detailed Description
The utility model will be further illustrated by the following description of specific examples, which are given by the terms such as: setting, mounting, connecting are to be construed broadly, and may be, for example, fixed, removable, or integrally connected; can be mechanically or electrically connected; can be directly connected or indirectly connected through an intermediate medium, and can be communication between two elements. The specific meaning of the above terms in the present utility model will be understood in specific cases by those of ordinary skill in the art.
The utility model provides a semiconductor power device IV test fixture convenient to press from both sides tight, as shown in fig. 1-4, including base 1, motor 3, cam 4, advance pole 5, frame clamp body 6, press from both sides and indicate 7, limit high xarm 8, tester 9 and classification mechanism 10, lower silo 2 has all been opened to base 1 middle part front and back both sides, base 1 left side downside is connected with motor 3, be connected with cam 4 on the motor 3 output shaft, base 1 upper left portion slidingtype is connected with advance pole 5, advance pole 5 left portion and cam 4 slidingtype are connected, advance pole 5 right side is connected with frame clamp body 6, frame clamp body 6 right side lower part is equipped with the grip pad, can increase the centre gripping frictional force, frame clamp body 6 middle part rotation is connected with and presss from both sides to indicate 7 right side and is equipped with elasticity impeller, base 1 front and back two upper right sides all slidingtype is connected with limit high xarm 8, base 1 middle part upside is connected with two testers 9, be equipped with classification mechanism 10 on base 1.
As shown in fig. 1, fig. 2 and fig. 5, the sorting mechanism 10 comprises a compression spring 101, a bending arm 102 and a hydraulic cylinder 103, wherein the bending arm 102 is slidably connected to the front and rear parts of the base 1, the bending arm 102 is combined into a triangular structure, the clamping finger 7 is conveniently pressed and opened, the semiconductor power device is conveniently pressed and matched with the clamping finger 7, the right side of the bending arm 102 is pressed and matched with the clamped semiconductor power device, the compression spring 101 is connected between the bending arm 102 at the rear part and the base 1, the hydraulic cylinder 103 is connected to the front part of the base 1, the telescopic end of the hydraulic cylinder 103 is connected with the adjacent bending arm 102, and the hydraulic cylinder 103 is electrically connected with the tester 9.
When the utility model is used, the base 1 is firstly placed in a semiconductor power device IV test area, then the semiconductor power device is led into the space between the height limiting cross arm 8 and the base 1, the semiconductor power device is led to the left, the front side and the rear side of the semiconductor power device are positioned between the height limiting cross arm 8 after the semiconductor power device is led in, the middle part is suspended to facilitate the clamping of the clamping finger 7, the motor 3 is started during clamping, the output shaft of the motor 3 rotates to drive the cam 4 to rotate, the cam 4 rotates to drive the forward rod 5 to reciprocate left and right, the forward rod 5 actively drives the frame clamping body 6 and the clamping finger 7 to move, the clamping finger 7 moves rightwards to squeeze with the bending arm 102, rotates upwards to open, the clamping closure is lost when the semiconductor power device passes through the bending arm 102 to clamp, then the semiconductor power device is reset leftwards under the action of the cam 4, the semiconductor power device after clamping is carried out, the bending arm 102 is squeezed when the semiconductor power device is carried out, the right side of the bending arm 102 is extruded, the rear bending arm 102 slides away from the front bending arm 102, the bending arms 102 are mutually separated and opened, the semiconductor power device is carried out, the clamping finger 7 and the frame clamp 6 cooperate to carry the semiconductor power device to the position of the tester 9, the tester 9 detects that the detected semiconductor power device is driven rightwards by the clamping finger 7 and the frame clamp 6 again, the semiconductor power device is extruded and guided by the bending arm 102 and then falls into the rear blanking groove 2 to be led out, the clamping finger 7 and the frame clamp 6 clamp and detect the next semiconductor power device again, when the tester 9 detects that the semiconductor power device is abnormal, the hydraulic cylinder 103 is started, the telescopic end of the hydraulic cylinder 103 pushes the bending arm 102 to mutually extrude, the bending arm 102 integrally moves backwards, the bending arm 102 changes the position, the semiconductor power device clamped on the clamping finger 7 changes when being extruded and dropped by the bending arm 102, the original backward dropping is converted into forward dropping to the front blanking groove 2, the abnormal semiconductor power device is led out, the excellent classification purpose is achieved, the hydraulic cylinder 103 controls the front bending arm 102 to reset after the classification is finished, and the rear bending arm 102 resets under the rebound action of the compression spring 101 to return to the initial position.
As shown in fig. 1, 2 and 6, the device further comprises a front stopping mechanism 11, the front stopping mechanism 11 comprises an inclined stop block 111, a spring seat 112 and a lifting blocking plate 113, the front side and the rear side of the left part of the height limiting cross arm 8 are both connected with the inclined stop block 111 in a sliding mode, the front side and the rear side of the left part of the height limiting cross arm 8 are both connected with the spring seat 112, the lifting blocking plate 113 is connected to the spring seat 112 in a sliding mode, the lifting blocking plate 113 is contacted with the adjacent inclined stop block 111, the bottom of the inclined stop block 111 is contacted with the base 1, the right side of the lower part of the inclined stop block 111 is in extrusion fit with the clamped semiconductor power device, the right side of the upper part of the inclined stop block 111 is in extrusion fit with the clamp finger 7, and the left side of the lifting blocking plate 113 is in extrusion fit with the clamp finger 7.
The front stopping mechanism 11 can limit the semiconductor power device to be clamped, prevent the semiconductor power device from being too much extruded and dropped, extrude the lifting-resisting plate 113 when the clamping finger 7 moves rightwards to clamp and fix the semiconductor power device, enable the lifting-resisting plate 113 to move rightwards to be separated from the inclined stop block 111, enable the semiconductor power device to extrude the lifting-resisting plate 113 when the clamping finger 7 clamps the semiconductor power device to be taken leftwards, enable the lifting-resisting plate 113 to slide upwards, enable the semiconductor power device to be taken out, enable the lifting-resisting plate 113 to reset gradually under the action of the spring seat 112 while being taken out, limit the top of the inclined stop block 111 again, and prevent the semiconductor power device which is not clamped from being dropped accidentally from affecting detection through the inclined stop block 111.
While the disclosure has been described with respect to only a limited number of embodiments, those skilled in the art, having benefit of this disclosure, will appreciate that various other embodiments can be devised which do not depart from the scope of the utility model as disclosed herein. Accordingly, the scope of the utility model should be limited only by the attached claims.
Claims (6)
1. The utility model provides a semiconductor power device IV test fixture convenient to press from both sides tightly, a serial communication port, including base (1), motor (3), cam (4), advance pole (5), frame clamp body (6), press from both sides and indicate (7), limit high xarm (8), tester (9) and classification mechanism (10), both sides all open down silo (2) around base (1) middle part, base (1) left side downside is connected with motor (3), be connected with cam (4) on the motor (3) output shaft, base (1) upper left portion sliding type is connected with advance pole (5), advance pole (5) left portion and cam (4) sliding type and be connected with in order that pole (5) right side is connected with frame clamp body (6), frame clamp body (6) middle part rotation type is connected with and is pressed from both sides indicate (7), base (1) upper right side all sliding type is connected with high xarm (8), base (1) middle part upside is connected with a plurality of testers (9), be equipped with on base (1) and be used for classifying mechanism (10) that classifies semiconductor power device.
2. A semiconductor power device IV test fixture for facilitating clamping as recited in claim 1, wherein,
the classifying mechanism (10) comprises a compression spring (101), bending arms (102) and a hydraulic cylinder (103), wherein the bending arms (102) are connected to the front portion and the rear portion of the base (1) in a sliding mode, the left side of the bending arms (102) is in extrusion fit with the clamping fingers (7), the right side of the bending arms (102) is in extrusion fit with the clamped semiconductor power devices, the compression spring (101) is connected between the bending arms (102) at the rear portion and the base (1), the hydraulic cylinder (103) is connected to the front portion of the base (1), the telescopic ends of the hydraulic cylinder (103) are connected with the adjacent bending arms (102), the hydraulic cylinder (103) is electrically connected with the tester (9), when the tester (9) detects that the semiconductor power devices are abnormal, the hydraulic cylinder (103) is started, the telescopic ends of the hydraulic cylinder (103) push the bending arms (102) to extrude each other, the bending arms (102) integrally move backwards, the positions of the semiconductor power devices clamped on the clamping fingers (7) are changed when the bending arms (102) are subjected to extrusion falling, the positions of the bending arms (102) are changed, and the positions of the semiconductor power devices are converted into falling forward and the original classifying purposes are achieved.
3. The semiconductor power device IV test fixture convenient to clamp according to claim 2, further comprising a front stopping mechanism (11), wherein the front stopping mechanism (11) comprises a bevel stop block (111), a spring seat (112) and a lifting blocking plate (113), the bevel stop block (111) is connected to the front side and the rear side of the left part of the height limiting cross arm (8), the spring seat (112) is connected to the front side and the rear side of the left side of the height limiting cross arm (8), the lifting blocking plate (113) is connected to the spring seat (112), the lifting blocking plate (113) is contacted with the adjacent bevel stop block (111), the bottom of the bevel stop block (111) is contacted with the base (1), the right side of the lower part of the bevel stop block (111) is in extrusion fit with the clamped semiconductor power device, the right side of the upper part of the bevel stop block (111) is in extrusion fit with the clamping finger (7), when the left side of the lifting blocking plate (113) is in extrusion fit with the clamping finger (7), the semiconductor power device is clamped and fixed, the lifting blocking plate (113) is extruded to the right side, the lifting blocking plate (113) is separated from the bevel stop block (111) by the bevel stop block (1) and the semiconductor power device is taken out when the bevel stop block (111) is extruded to the left side of the semiconductor power device, gradually reset to limit the top of the inclined stop block (111) again, and intercept the semiconductor power device which is not clamped through the inclined stop block (111) so as to prevent the semiconductor power device from accidentally falling to influence detection.
4. A semiconductor power device IV test fixture for facilitating clamping as defined in claim 1, wherein the lower right portion of the frame clamp body (6) is provided with a clamping pad.
5. A semiconductor power device IV test fixture with easy clamping as claimed in claim 1, characterized in that the right side of the clamping finger (7) is provided with an elastic pushing member.
6. A semiconductor power device IV test fixture that facilitates clamping as recited in claim 2, wherein the bending arms (102) are combined in a triangular configuration.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202321720181.6U CN220074520U (en) | 2023-07-03 | 2023-07-03 | Semiconductor power device IV test fixture convenient to clamp |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202321720181.6U CN220074520U (en) | 2023-07-03 | 2023-07-03 | Semiconductor power device IV test fixture convenient to clamp |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN220074520U true CN220074520U (en) | 2023-11-24 |
Family
ID=88816766
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202321720181.6U Active CN220074520U (en) | 2023-07-03 | 2023-07-03 | Semiconductor power device IV test fixture convenient to clamp |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN220074520U (en) |
-
2023
- 2023-07-03 CN CN202321720181.6U patent/CN220074520U/en active Active
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