CN219978433U - Multichannel current voltage testing arrangement is used in OLED screen test - Google Patents
Multichannel current voltage testing arrangement is used in OLED screen test Download PDFInfo
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- CN219978433U CN219978433U CN202320923635.3U CN202320923635U CN219978433U CN 219978433 U CN219978433 U CN 219978433U CN 202320923635 U CN202320923635 U CN 202320923635U CN 219978433 U CN219978433 U CN 219978433U
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Abstract
The utility model discloses a multichannel current and voltage testing device for OLED screen testing, which comprises: the power supply module comprises a MCU, a communication module, an equipment display screen, a FLASH memory and an ADC circuit which are respectively connected with the MCU, and 6 voltage and current acquisition circuits which are respectively connected with the ADC circuit; the 6 voltage acquisition circuits respectively acquire IOVCC, VCI, AVDD, ELVSS, ELVDD, DVDD of the OLED screen; the power module is respectively connected with the MCU, the communication module, the equipment display screen, the FLASH memory, the ADC circuit and the voltage and current acquisition circuit. The utility model can monitor multiple paths of power supplies simultaneously, and can meet the monitoring of multiple paths of high-precision voltage and current required by an OLED screen. The system has a communication module, can be matched with a computer and a PLC for use, forms a complete test system, and is convenient for application.
Description
Technical Field
The utility model relates to the technical field of OLED screen testing, in particular to a multichannel current and voltage testing device for OLED screen testing.
Background
The demand for intelligent mobile devices has exploded, with cell phones, tablets, smart watches, VR glasses, car systems, etc. being particularly prominent. The assembly screen is taken as one of core components of the intelligent mobile equipment, is the most important docking window for man-machine interaction, and has a display function and a touch input function. With the iterative update of screen processes in recent years, the assembly screens of the INCELL process and the ONCELL process gradually appear on the market. The main TFT material screen is mainly made of INCELL process, and the OLED material screen is mainly made of ONCELL process. The touch Sensor device is fused into the display screen CELL and is called INCELL process, and the touch Sensor device is positioned above the display screen CELL and is called ONCELL process, and the INCELL process or the ONCELL process is a technology for integrating the touch function into the display screen, so that the screen is lighter and thinner, and the overall power consumption is lower.
The screen is a main power consumption component of the intelligent mobile device, and how to optimize the power consumption of the screen is always a main project which engineers cannot bypass. While driving a TFT screen normally requires 3 input voltages, IOVCC (+1.8v), VSP (+5.5v), VSN (-5.5V), and driving an OLED screen requires up to 6 input voltages, IOVCC (+1.8v), VCI (+3.0V), AVDD (+7.5v), ELVSS (-5.5V), ELVDD (+5.5v), VDDIO (+1.2v), the voltage requirements for the different process screens are different, but the power requirements for the OLED screen as a whole are more than for the TFT screen. In addition, the IOVCC is only a few milliamperes when the screen is normally displayed, and is only less than 100 microamps when the screen is normally dormant, and is lower than 10 microamps when the screen is deeply dormant.
In the face of such multiple voltage and current measurement and such high-precision current measurement of an OLED screen, a common voltage and current meter on the market cannot meet the measurement requirement.
Accordingly, the prior art has drawbacks and needs improvement.
Disclosure of Invention
The utility model aims to solve the technical problems that: the multi-channel current and voltage testing device for testing the OLED screen is convenient for testing the OLED screen simultaneously in multi-channel current and voltage, and improves testing efficiency.
The technical scheme of the utility model is as follows: provided is a multi-channel current-voltage testing device for OLED screen testing, comprising: the power supply module comprises a MCU, a communication module, an equipment display screen, a FLASH memory and an ADC circuit which are respectively connected with the MCU, and 6 voltage and current acquisition circuits which are respectively connected with the ADC circuit; the 6 voltage and current acquisition circuits respectively acquire IOVCC, VCI, AVDD, ELVSS, ELVDD, DVDD of the OLED screen; the power module is respectively connected with the MCU, the communication module, the equipment display screen, the FLASH memory, the ADC circuit and the voltage and current acquisition circuit. The power supply module is used for supplying power to each functional module; the MCU is used for controlling each functional module; the communication module is used for being connected with an upper computer (such as a computer) and used in a matched manner to form a complete test system; the device display screen is used for displaying interaction information (such as touch control buttons, collected voltage and current data and the like); the FLASH memory is used for storing collected voltage and current data; the ADC circuit is used for providing test voltage, and the voltage and current acquisition circuit is used for acquiring current and voltage data of the OLED screen.
Further, the chip model adopted by the MCU is as follows: STM32H750VBT6.
Further, the power module includes: and the power switch is connected with the first voltage reducing circuit and the second voltage reducing circuit which is connected with the first voltage reducing circuit. The first voltage reducing circuit is used for reducing the voltage of 12V outside to 5V, the second voltage reducing circuit is used for reducing the voltage of 5V to 3.3V, and the power switch is used for controlling the access of an external power supply.
Further, the communication module is an RS485 communication module.
Further, the ADC circuit includes: and the AD4114 chip is connected with the ADC sampling circuit.
Further, the voltage and current acquisition circuit adopts a TM7707 chip.
Further, the multi-channel current-voltage testing device for testing the OLED screen further comprises: UART-to-USB interface circuit, TTL UART interface circuit, DEBUG UART interface circuit, voice playing circuit connected with MCU respectively.
By adopting the scheme, the multichannel current and voltage testing device for testing the OLED screen can monitor multiple paths of power supplies simultaneously, and can meet the monitoring of multiple paths of high-precision voltage and current required by the OLED screen. The system has a communication module, can be matched with a computer and a PLC for use, forms a complete test system, and is convenient for application.
Drawings
FIG. 1 is a functional block diagram of an embodiment of the present utility model;
FIG. 2 is a schematic circuit diagram of the MCU;
FIG. 3 is a circuit diagram of a power switch;
FIG. 4 is a schematic circuit diagram of a first buck circuit;
FIG. 5 is a schematic circuit diagram of a second buck circuit;
FIG. 6 is a schematic circuit diagram of a communication module;
FIG. 7 is a schematic circuit diagram of a display screen of the device;
FIG. 8 is a schematic circuit diagram of a FLASH memory;
FIG. 9 is a circuit schematic of an ADC sampling circuit;
FIG. 10 is a circuit diagram of an AD4114 chip;
FIG. 11 is a schematic circuit diagram of a first portion of a voltage and current acquisition circuit;
FIG. 12 is a schematic circuit diagram of a second portion of the voltage and current acquisition circuit;
FIG. 13 is a schematic circuit diagram of a third portion of the voltage and current acquisition circuit;
FIG. 14 is a schematic diagram of a UART-to-USB interface circuit connected by an MCU;
FIG. 15 is a schematic circuit diagram of a TTL UART interface circuit;
FIG. 16 is a schematic circuit diagram of a DEBUG UART interface circuit;
fig. 17 is a schematic circuit diagram of a voice playing circuit.
Detailed Description
The utility model will be described in detail below with reference to the drawings and the specific embodiments.
Referring to fig. 1-17, the present embodiment provides a multi-channel current-voltage testing device for testing an OLED screen, including: the power module 10, the MCU11, the communication module 12, the equipment display screen 13, the FLASH memory 14 and the ADC circuit 15 which are respectively connected with the MCU11, and the 6 voltage and current acquisition circuits 17 which are respectively connected with the ADC circuit 15; the 6 voltage and current acquisition circuits respectively acquire IOVCC, VCI, AVDD, ELVSS, ELVDD, DVDD of the OLED screen; the power module 10 is respectively connected with the MCU11, the communication module 12, the equipment display screen 13, the FLASH memory 14, the ADC circuit 15 and the voltage and current acquisition circuit 17. The power supply module 10 is used for supplying power to each functional module; the MCU11 is used for controlling each functional module; the communication module 12 is used for being connected with an upper computer (such as a computer) and used in a matched manner to form a complete test system; the device display 13 is used for displaying interaction information (such as touch control buttons, collected voltage and current data, etc.); the FLASH memory 14 is used for storing collected voltage and current data; the ADC circuit 15 is configured to provide a test voltage, and the voltage-current collection circuit 17 is configured to collect current-voltage data of the OLED screen 16.
In this embodiment, the chip model adopted by the MCU11 is: STM32H750VBT6.
In this embodiment, the power module 10 includes: and the power switch is connected with the first voltage reducing circuit and the second voltage reducing circuit which is connected with the first voltage reducing circuit. The first voltage reducing circuit is used for reducing the voltage of 12V outside to 5V, the second voltage reducing circuit is used for reducing the voltage of 5V to 3.3V, and the power switch is used for controlling the access of an external power supply.
In this embodiment, the communication module 12 is an RS485 communication module.
In this embodiment, the ADC circuit 15 includes: and the AD4114 chip is connected with the ADC sampling circuit.
In this embodiment, the voltage and current acquisition circuit uses a TM7707 chip.
In this embodiment, the device for testing multi-channel current and voltage for testing an OLED screen further includes: UART-to-USB interface circuit, TTL UART interface circuit, DEBUG UART interface circuit, voice playing circuit connected with MCU respectively.
In summary, the utility model provides a multi-channel current and voltage testing device for testing an OLED screen, which can monitor multiple power supplies simultaneously and can meet the monitoring of multiple high-precision voltage and current required by the OLED screen. The system has a communication module, can be matched with a computer and a PLC for use, forms a complete test system, and is convenient for application.
The foregoing description of the preferred embodiment of the utility model is not intended to be limiting, but rather is intended to cover all modifications, equivalents, and alternatives falling within the spirit and principles of the utility model.
Claims (7)
1. A multi-channel current-voltage testing device for testing an OLED screen, comprising: the power supply module comprises a MCU, a communication module, an equipment display screen, a FLASH memory and an ADC circuit which are respectively connected with the MCU, and 6 voltage and current acquisition circuits which are respectively connected with the ADC circuit; the 6 voltage and current acquisition circuits respectively acquire IOVCC, VCI, AVDD, ELVSS, ELVDD, DVDD of the OLED screen; the power module is respectively connected with the MCU, the communication module, the equipment display screen, the FLASH memory, the ADC circuit and the voltage and current acquisition circuit.
2. The multi-channel current and voltage testing device for testing an OLED screen according to claim 1, wherein the MCU uses a chip model of: STM32H750VBT6.
3. The multi-channel current-voltage testing apparatus for testing an OLED screen according to claim 1, wherein the power module comprises: and the power switch is connected with the first voltage reducing circuit and the second voltage reducing circuit which is connected with the first voltage reducing circuit.
4. The multi-channel current and voltage testing device for testing an OLED screen according to claim 1, wherein the communication module is an RS485 communication module.
5. The multi-channel current-voltage testing apparatus for testing an OLED screen according to claim 1, wherein the ADC circuit comprises: and the AD4114 chip is connected with the ADC sampling circuit.
6. The multi-channel current and voltage testing device for testing an OLED screen according to claim 1, wherein the voltage and current acquisition circuit adopts a TM7707 chip.
7. The multi-channel current-voltage testing apparatus for testing an OLED screen according to claim 1, further comprising: UART-to-USB interface circuit, TTL UART interface circuit, DEBUG UART interface circuit, voice playing circuit connected with MCU respectively.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202320923635.3U CN219978433U (en) | 2023-04-20 | 2023-04-20 | Multichannel current voltage testing arrangement is used in OLED screen test |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202320923635.3U CN219978433U (en) | 2023-04-20 | 2023-04-20 | Multichannel current voltage testing arrangement is used in OLED screen test |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN219978433U true CN219978433U (en) | 2023-11-07 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202320923635.3U Active CN219978433U (en) | 2023-04-20 | 2023-04-20 | Multichannel current voltage testing arrangement is used in OLED screen test |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN219978433U (en) |
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2023
- 2023-04-20 CN CN202320923635.3U patent/CN219978433U/en active Active
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