CN219799563U - Probe and contact module provided with same - Google Patents

Abstract

The utility model relates to a probe and a contact module provided with the probe, which comprises a sleeve, a thimble and a buffer spring, wherein one end of the thimble can movably extend into a sleeve hole of the sleeve, and the buffer spring is arranged between the sleeve and the thimble and is used for buffering the telescopic action between the thimble and the sleeve. The probe comprises a sleeve, the ejector pin and the buffer spring, wherein the ejector pin is movably arranged in a sleeve hole of the sleeve, and the buffer spring is arranged between the sleeve and the ejector pin and is used for buffering the telescopic action between the ejector pin and the sleeve, so that the elastic buffer effect can be achieved under the condition that the probe is not completely aligned, meanwhile, the contact friction between the probe and the inner wall of a probe hole is greatly reduced, the original hard friction is changed into the existing flexible friction, electric spark is avoided, and the performance of the device is improved.

Description

Probe and contact module provided with same

Technical Field

The utility model relates to the technical field of contact modules, in particular to a probe and a contact module provided with the probe.

Background

The test is a key link in the design and manufacturing processes of the electronic product, and is a necessary means for detecting the performance, quality and safety of the electronic product. As electronic products are widely used in various fields, testing of electronic products is also becoming more important. In the testing process, the interface of the product to be tested needs to lead out signals to the testing instrument in a real-time inserting mode, and a mode of manually inserting and pulling out the probe is time-consuming and labor-consuming, so that the operation efficiency is improved, and the butt joint of the probe and the interface is finished by adopting a mechanical structure.

Probes of the previous generation contact modules basically have an integrated structure, such as a rotary probe contact module disclosed in the application number 2022100902537 of this patent application. The probe of the contact module of above structure is integral type structure, and when the probe of integral type was inserting the probe hole, if the size deviation appears or when the inaccurate condition appears in the butt joint of probe module and contact module, the friction between probe just can and the probe hole inner wall belongs to hard friction, appears the spark because of the friction easily to influence product performance.

Disclosure of Invention

In order to overcome the defects in the background art, the utility model provides a probe and a contact module provided with the probe.

The technical scheme adopted by the utility model is as follows: the probe comprises a sleeve, a thimble and a buffer spring, wherein one end of the thimble can movably extend into a sleeve hole of the sleeve, and the buffer spring is arranged between the sleeve and the thimble and used for buffering telescopic action between the thimble and the sleeve.

Further, the thimble includes top, spring section and flexible section, flexible section activity stretches into in the sheathed tube trepanning, buffer spring suit is on the spring section, and buffer spring one end is connected with the top, and the other end is connected with the sleeve pipe.

Further, the top of the plug is of a plane structure.

Further, a groove is formed in one end, far away from the thimble, of the sleeve.

The utility model also provides a contact module provided with the probe, which comprises a probe module and a contact element module, wherein the probe is arranged on the probe module.

Further, a probe contact is mounted on the contact fixing plate of the contact module, an external thread is arranged on the probe contact, and the external thread is in threaded connection with an internal thread in a probe hole on the contact fixing plate.

Further, positioning holes are formed in two sides of the contact fixing plate, an introduction inclined plane is arranged at the opening of each positioning hole, positioning columns matched with the positioning holes are arranged on two sides of the probe plate of the probe module, and the tops of the positioning columns are of semicircular structures.

The beneficial effects of the utility model are as follows: the probe comprises a sleeve, the ejector pin and the buffer spring, wherein the ejector pin is movably arranged in a sleeve hole of the sleeve, and the buffer spring is arranged between the sleeve and the ejector pin and is used for buffering the telescopic action between the ejector pin and the sleeve, so that the elastic buffer effect can be achieved under the condition that the probe is not completely aligned, meanwhile, the contact friction between the probe and the inner wall of a probe hole is greatly reduced, the original hard friction is changed into the existing flexible friction, electric spark is avoided, and the performance of the device is improved.

In addition to the objects, features and advantages described above, the present utility model has other objects, features and advantages.

The utility model will be described in further detail with reference to the accompanying drawings.

Drawings

FIG. 1 is a schematic diagram of the structure of a probe.

FIG. 2 is a schematic illustration of the separation of the cannula and the spike.

Fig. 3 is a schematic structural diagram of the contact module.

Fig. 4 is a schematic front view of a contact module.

Fig. 5 is a schematic structural diagram of a probe module.

Fig. 6 is a schematic structural view of a probe contact.

In fig. 1-6: 1. a sleeve; 2. a thimble; 3. a buffer spring; 4. trepanning; 5. a plug; 6. a spring section; 7. a telescoping section; 8. a groove; 9. a probe module; 10. a contact module; 11. a probe; 12. a contact fixing plate; 13. a probe contact; 14. an external thread; 15. positioning holes; 16. an introduction slope; 17. positioning columns; 18. a probe hole.

Detailed Description

The following description of the embodiments of the present utility model will be made clearly and fully with reference to the accompanying drawings, in which it is evident that the embodiments described are only some, but not all embodiments of the utility model. All other embodiments, which can be made by those skilled in the art based on the embodiments of the utility model without making any inventive effort, are intended to be within the scope of the utility model.

It should be noted that, if directional indications (such as up, down, left, right, front, and rear … …) are included in the embodiments of the present utility model, the directional indications are merely used to explain the relative positional relationship, movement conditions, etc. between the components in a specific posture (as shown in the drawings), and if the specific posture is changed, the directional indications are correspondingly changed.

The utility model provides a probe and a contact module provided with the same.

In this embodiment, referring to fig. 1-6, the probe and the contact module provided with the probe comprise a sleeve 1, a thimble 2 and a buffer spring 3, wherein one end of the thimble can movably extend into a sleeve hole 4 of the sleeve, and the buffer spring is arranged between the sleeve and the thimble and used for buffering the telescopic action between the thimble and the sleeve.

Among the above-mentioned technical scheme, the probe includes sleeve pipe, thimble and buffer spring, thimble movable mounting in sheathed tube trepanning, buffer spring sets up and is used for buffering the flexible action between thimble and the sleeve pipe between sleeve pipe and the thimble to, can play elastic buffer's effect under the not condition of perfect alignment of probe, simultaneously, very big reduction probe and the contact friction between the probe hole inner wall changes the hard friction originally into current flexible friction, avoids appearing the electric spark, improves device performance.

After the technical scheme of the utility model is adopted, the utility model has the following advantages besides the advantages:

when the probe is not aligned with the probe hole, if an integrated probe is adopted, the problem of bending and even breaking of the probe easily occurs, and after a telescopic structure is adopted, the probe can be compressed, so that the extreme problems of bending, breaking and the like do not occur.

Specifically, the thimble comprises a top 5, a spring section 6 and a telescopic section 7, wherein the telescopic section movably stretches into a sleeve hole of the sleeve, the buffer spring is sleeved on the spring section, one end of the buffer spring is connected with the top, and the other end of the buffer spring is connected with the sleeve; the top of the ejector head is of a plane structure, and a groove 8 is formed in one end, far away from the ejector pin, of the sleeve.

In the technical scheme, the top adopts a plane structure instead of a tip structure in the prior art, so that the contact area between the top and the probe contact piece can be increased.

The utility model also provides a contact module provided with the probe, which comprises a probe module 9 and a contact element module 10, wherein the probe 11 is arranged on the probe module.

Specifically, the contact fixing plate 12 of the contact module is provided with a probe contact 13, the probe contact is provided with an external thread 14, and the external thread is in threaded connection with an internal thread in a probe hole on the contact fixing plate.

The probe contact piece is in threaded connection with the contact piece fixing plate, so that the probe contact piece is convenient to install and stable in connection.

Specifically, the both sides of contact spare fixed plate are equipped with locating hole 15, the opening part of locating hole is equipped with leading-in inclined plane 16, the probe board both sides of probe module are equipped with the reference column 17 with the locating hole adaptation, the reference column top is semicircle structure.

Through setting up reference column and locating hole, guarantee the butt joint between probe and the probe hole 18, simultaneously, the reference column top adopts semicircle structure, and the locating hole opening part sets up simultaneously and pours into the inclined plane, the locating action of assurance locating hole and reference column that can be fine.

The skilled person will know: while the utility model has been described in terms of the foregoing embodiments, the inventive concepts are not limited to the utility model, and any modifications that use the inventive concepts are intended to be within the scope of the appended claims.

Claims (6)

1. A probe, characterized in that: the telescopic thimble comprises a sleeve, a thimble and a buffer spring, wherein one end of the thimble can movably extend into a sleeve hole of the sleeve, and the buffer spring is arranged between the sleeve and the thimble and used for buffering telescopic action between the thimble and the sleeve;

the thimble comprises a top head, a spring section and a telescopic section, wherein the telescopic section movably stretches into a sleeve hole of the sleeve, the spring section is sleeved with a buffer spring, one end of the buffer spring is connected with the top head, and the other end of the buffer spring is connected with the sleeve.

2. The probe of claim 1, wherein: the top of the plug is of a plane structure.

3. The probe of claim 2, wherein: and a groove is formed in one end, far away from the thimble, of the sleeve.

4. A contact module provided with a probe according to any one of the preceding claims 1-3, characterized in that: the probe comprises a probe module and a contact piece module, wherein the probe is installed on the probe module.

5. The contact module on which the probe is mounted of claim 4, wherein: the probe contact is arranged on the contact fixing plate of the contact module, an external thread is arranged on the probe contact, and the external thread is in threaded connection with an internal thread in a probe hole on the contact fixing plate.

6. The contact module on which the probe is mounted of claim 5, wherein: the probe comprises a probe module and is characterized in that positioning holes are formed in two sides of the contact fixing plate, an introduction inclined plane is arranged at the opening of each positioning hole, positioning columns matched with the positioning holes are arranged on two sides of the probe plate of the probe module, and the tops of the positioning columns are semicircular structures.