CN217639220U

CN217639220U - High-precision testing probe for FPC (flexible printed circuit) board

Info

Publication number: CN217639220U
Application number: CN202220888803.5U
Authority: CN
Inventors: 龚坚; 李军
Original assignee: Shenzhen Meirui Precision Electronic Co ltd
Current assignee: Shenzhen Meirui Precision Electronic Co ltd
Priority date: 2022-04-15
Filing date: 2022-04-15
Publication date: 2022-10-21
Anticipated expiration: 2032-04-15

Abstract

The utility model relates to a FPC board high accuracy test probe, this probe includes the stylophore, the upper end of stylophore is equipped with the contact site, the upper end of contact site is the toper and is used for laminating with transmission line board's contact site, the lower extreme of contact site is equipped with the connecting portion of connecting its with the stylophore, the lower surface of connecting portion is the hemisphere face, the external diameter of the lower surface of connecting portion is greater than the diameter of stylophore, the lower extreme shaping of stylophore has the test section and its detection site that is used for with the circuit board that receives to be tested laminates, the test section is the toper, during the detection, the upper end of test section and the contact site contact of transmission line board, be used for signal transmission, and the test section is used for detecting the product circuit board, can effectively improve detection precision and rate of accuracy, avoid contact failure's condition to take place, furthermore, probe overall structure is simple, the wholeness is good, can directly improve the shaping in the basis of original probe, can reduce manufacturing cost to a great extent, the suitable function of transplanting between the product has also been increased simultaneously.

Description

High-precision testing probe for FPC (Flexible printed Circuit) board

Technical Field

The utility model relates to a test probe technical field, in particular to FPC board high accuracy test probe.

Background

At present, no matter whether the electric appliance is an automobile, a computer, a household appliance or a mobile phone, a circuit board is an indispensable element as long as the electric appliance is the electric appliance. The circuit board needs many processes from the beginning to the end of the product. The testing links are not negligible in order to obtain a circuit board with reliable performance from the selection of components, the circuit design, the debugging test, the performance test, the temperature rise test and the like. If a certain testing link is omitted before the circuit board leaves a factory, defective products flow out, the problem of returning goods is caused, and corresponding loss can be caused naturally. Therefore, the testing link of the circuit board becomes extremely important.

In the existing circuit board testing method, a needle bed testing method is adopted, in the method, a probe with a spring is connected to each detection point on a circuit board, and the spring is used for enabling the probe to generate pressure so as to test whether each detection point is in good contact. The test probe is mainly composed of three parts: the first is a needle tube: mainly takes copper alloy as material and gold is plated on the outside; secondly, a spring: mainly gold plating is carried out on the outsides of the piano steel wire and the spring steel; thirdly, a needle head: mainly plating nickel or gold on the tool steel. The probe is assembled by the three parts.

The disadvantages are that in the actual testing process, the following are found: the existing test probe consists of a needle tube, a spring and a needle head, so that a large amount of manpower and material resources are consumed during assembly and manufacturing, and the waste of time and money cost is caused; in addition, because the current conducting capacity of the spring used by the existing probe is limited to only pass small current, the applicable product range is very small, and the contact yield of the existing probe and a circuit board, especially a contact test process with an FPC board, is difficult to guarantee, the probe adopts a spring connection structure, the elasticity is very small, the pressure of a contact surface is very small, the contact area of the probe and the circuit board is required to be guaranteed to be large enough to avoid poor contact, but due to the structural characteristic of the FPC board, the exposed area is mostly below a millimeter level, the contact point is very small, the condition causes that the existing traditional probe cannot meet the test and transmission requirements, and the normal operation of production cannot be guaranteed.

SUMMERY OF THE UTILITY MODEL

An object of the utility model is to prior art not enough, provide a FPC board high accuracy test probe, this FPC board high accuracy test probe can solve above-mentioned problem well.

In order to meet the above requirements the utility model provides a technical scheme that its technical problem adopted is:

the utility model provides a FPC board high accuracy test probe, includes the stylophore, the upper end of stylophore is equipped with the contact site, the upper end of contact site is the toper and is used for laminating with transmission line board's contact position, the lower extreme of contact site be equipped with connect its with the connecting portion of stylophore, the lower surface of connecting portion is the hemisphere face, the external diameter of the lower surface of connecting portion is greater than the diameter of stylophore, the lower extreme shaping of stylophore has detection portion and its detection position laminating that is used for with receiving the circuit board, detection portion is the toper.

FPC board high accuracy test probe, wherein, the contact site is the cone.

FPC board high accuracy test probe, wherein, connecting portion are the hemisphere, connecting portion with the plane end looks laminating of contact site.

FPC board high accuracy test probe, wherein, the bottom surface diameter of contact site with the diameter of connecting portion is the same.

FPC board high accuracy test probe, wherein, the contact site with connecting portion and stylar integrated into one piece.

FPC board high accuracy test probe, wherein, the top of contact site to the straight-line distance of bottom surface with the radius of connecting portion is the same.

FPC board high accuracy test probe, wherein, the cone angle of detection portion is 30 degrees, the pointed end of detection portion is equipped with the circular arc chamfer.

FPC board high accuracy test probe, wherein, still be equipped with insulating coating on the stylophore.

The beneficial effects of the utility model reside in that: this probe is when examining, during the detection, the upper end of detection portion and the contact position contact of transmission line board for signal transmission, and detection portion is used for detecting the product circuit board, can effectively improve and detect precision and rate of accuracy, avoids contact failure's condition to take place, and in addition, probe overall structure is simple, and the wholeness is good, can directly improve the shaping on the basis of original probe, can reduce manufacturing cost at to a great extent, has also increased the transplantation application function between the product simultaneously.

Drawings

In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the present invention will be further described below with reference to the accompanying drawings and embodiments, wherein the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained without inventive work according to the drawings:

fig. 1 is the overall structure schematic diagram of the high-precision testing probe for the FPC board of the present invention.

Fig. 2 is a cross-sectional view of the testing state of the high-precision testing probe for the FPC board.

Detailed Description

The terms "first," "second," "third," and "fourth," etc. in the description and claims of the invention and in the accompanying drawings are used for distinguishing between different objects and not for describing a particular order. Furthermore, the terms "include" and "have," as well as any variations thereof, are intended to cover a non-exclusive inclusion. For example, a process, method, system, article, or apparatus that comprises a list of steps or elements is not limited to only those steps or elements listed, but may alternatively include other steps or elements not listed, or inherent to such process, method, article, or apparatus.

Reference herein to "an embodiment" means that a particular feature, structure, or characteristic described in connection with the embodiment can be included in at least one embodiment of the invention. The appearances of the phrase in various places in the specification are not necessarily all referring to the same embodiment, nor are separate or alternative embodiments mutually exclusive of other embodiments. It is explicitly and implicitly understood by one skilled in the art that the embodiments described herein can be combined with other embodiments.

"plurality" means two or more. "and/or" describes the association relationship of the associated objects, meaning that there may be three relationships, e.g., a and/or B, which may mean: a exists alone, A and B exist simultaneously, and B exists alone. The character "/" generally indicates that the former and latter associated objects are in an "or" relationship.

Also, the terms "upper, lower, left, right, upper, lower, longitudinal" and the like, which indicate orientation, are all referenced to the attitude and position of the device or apparatus described in this disclosure during normal use.

In order to make the objects, technical solutions and advantages of the embodiments of the present invention clearer, a clear and complete description will be given below with reference to the technical solutions of the embodiments of the present invention, and it is obvious that the described embodiments are some, but not all embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by a person skilled in the art without creative efforts belong to the protection scope of the present invention.

The high-precision testing probe for the FPC board of the preferred embodiment of the utility model, as shown in fig. 1-2, comprises a pin column 1, the upper end of the pin column 1 is provided with a contact part 2, the upper end of the contact part 2 is conical and used for being attached to a contact position 31 of a transmission circuit board 3, which can effectively ensure the stability of contact, compared with the traditional method of adopting plane and spherical contact, which can avoid unstable contact caused by insufficient contact pressure and further abnormal transmission of signal transmission to a great extent, the lower end of the contact part 2 is provided with a connecting part 4 for connecting the connecting part with the pin column 1, the lower surface of the connecting part 4 is a hemisphere surface, the outer diameter of the lower surface of the connecting part 4 is larger than the diameter of the pin column 1, the lower end of the pin column 1 is formed with a detecting part 7 for being attached to a detecting position of a tested circuit board (FPCB) 10, the detecting part is conical, in practical test, the probe is installed in pinhole 6 on fixed arm 5, and form barrier structure through connecting portion 4, prevent that the probe from dropping from pinhole 6's lower extreme, wherein, the lower surface of connecting portion 4 is the hemisphere face structure can be convenient for make the probe wholly rotatory on fixed arm 5 in the test procedure, this probe is when examining, the upper end and the circuit board 3 contact of detection portion, can realize the contact of point and face, the stability of multiplicable contact, and locate the detection portion of needle post lower extreme, can be used to detect multiple product circuit board, the cooperation of contact portion and detection portion can effectively improve detection precision and rate of accuracy, avoid contact failure's condition to take place, furthermore, probe overall structure is simple, the wholeness is good, can directly improve the shaping in the basis of original probe, can reduce manufacturing cost to a great extent, the suitable function of transplantation between the product has also been increased simultaneously.

Further, the contact part 2 is a cone so as to facilitate processing, the connecting part 4 is hemispherical, and the connecting part 4 is attached to the plane end of the contact part 2 so as to reduce the length of the probe, wherein the diameter of the bottom surface of the contact part 2 is the same as that of the connecting part 4, so that the contact part 2 and the connecting part 4 are convenient to mold and process.

Preferably, the contact portion 2 is integrally formed with the connecting portion 4 and the needle cylinder 1, specifically, integrally formed by a lathe or integrally cast.

Preferably, the straight line distance from the top end to the bottom surface of the contact part 2 is the same as the radius of the connecting part 4, so that the contact part 2 and the connecting part 4 can be conveniently and directly processed and molded on a sphere, the process is simplified, the manufacturing difficulty is reduced, and the taper of the contact part 2 and the size of the arc chamfer at the tip end are conveniently molded.

In addition, because the probe can freely move from top to bottom, the dead weight of usable probe itself forms the detection position constant pressure to circuit board 3 of its below, wherein can realize the size regulation of this pressure through the size of design connecting portion 4, adopts the spring to realize the probe of pressure in the comparison, and the probe of this scheme all can obtain bigger promotion on test stability and current carrying capacity.

Preferably, the taper angle of the detection part 7 is 30 degrees, and the tip of the detection part 7 is provided with a circular arc chamfer 8 to meet the test of a specific product.

Preferably, the needle cylinder 1 is further provided with an insulating coating 9 to avoid electric series connection with other peripheral parts.

It will be understood that modifications and variations can be made by persons skilled in the art in light of the above teachings and all such modifications and variations are considered to be within the scope of the invention as defined by the following claims.

Claims

1. The utility model provides a FPC board high accuracy test probe, its characterized in that, this probe includes the stylophore, the upper end of stylophore is equipped with the contact site, the upper end of contact site is the toper and is used for laminating with transmission line board's contact position, the lower extreme of contact site be equipped with connect its with the connecting portion of stylophore, the lower surface of connecting portion is the hemisphere face, the external diameter of the lower surface of connecting portion is greater than the diameter of stylophore, the lower extreme shaping of stylophore has detection portion and its detection position laminating that is used for with the circuit board that receives to examine, detection portion is the toper.

2. The FPC board high accuracy test probe of claim 1, wherein the contact portion is a cone.

3. The FPC board high accuracy test probe of claim 2, wherein the connecting portion is a hemisphere, and the connecting portion is attached to a planar end of the contact portion.

4. The FPC board high accuracy test probe of claim 3, wherein a bottom surface diameter of the contact portion is the same as a diameter of the connection portion.

5. The FPC board high accuracy test probe of claim 1 or 3, wherein the contact portion is integrally formed with the connection portion and the pin.

6. The FPC board high accuracy test probe of claim 4, wherein a straight line distance from a top end to a bottom surface of the contact portion is the same as a radius of the connection portion.

7. The FPC board high accuracy test probe of claim 1, wherein the taper angle of the detection portion is 30 degrees, and the tip of the detection portion is provided with a rounded chamfer.

8. The FPC board high-precision test probe of claim 1, wherein an insulating coating is further disposed on the needle post.