CN219552621U - High-efficiency testing tool for single-chip power supply module - Google Patents
High-efficiency testing tool for single-chip power supply module Download PDFInfo
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- CN219552621U CN219552621U CN202320237675.2U CN202320237675U CN219552621U CN 219552621 U CN219552621 U CN 219552621U CN 202320237675 U CN202320237675 U CN 202320237675U CN 219552621 U CN219552621 U CN 219552621U
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Abstract
The utility model discloses a high-efficiency test fixture for a single-chip power supply module, which comprises a test fixture A and a test fixture B, wherein the test fixture A and the test fixture B are connected through a test connection cable; the testing tool A comprises a first printed circuit board, an input connector and a first cavity, wherein a plurality of groups of elastic crown spring jacks are arranged on the first printed circuit board, and the plurality of groups of elastic crown spring jacks can be spliced with pins of a plurality of to-be-tested single-chip power supply modules; the input connector is arranged on the first printed circuit board and can be electrically connected with the power input ends of the plurality of to-be-tested single-chip power supply modules; the elastic crown spring jack, the input connector and the to-be-tested single-chip power module are integrated in the first cavity. The fixture can ensure that pins of the single-chip power supply module are free from welding and are effectively connected; the plugging error is prevented, and the time for checking the wiring is reduced; the method is favorable for developing batch environmental test, avoids the characteristics of messy and numerous traditional test cables, improves the test efficiency of the environmental test, and realizes quick voltage regulation test and enabling control.
Description
Technical Field
The utility model relates to the technical field of electronic element testing, in particular to a high-efficiency testing tool for a single-chip power supply module.
Background
Common monolithic power modules have input pins, output pins, enable pins, output voltage regulation pins, positioning pins, etc., as shown in fig. 1. The traditional test fixture is to directly weld a test cable on a pin of a single-chip power supply module or weld the test cable on a jack corresponding to a pin, and the jack is spliced on each pin of the module for testing. And the voltage regulating pin is connected with resistors with different resistance values to realize output voltage regulating test. The enable test is performed by externally inputting a high/low level. But currently there are the following problems:
(1) If the test cable is directly welded on the pin of the single-chip power supply module, the appearance of the product is damaged due to tin plating of the pin; if the test cable is welded on the jack corresponding to the pin, each pin needs to be plugged and unplugged independently, products are damaged easily due to plugging errors and poor contact between pinholes and the pin, and a great deal of time is required to check the correctness of the plug cable, so that the test efficiency of the batch single-chip power supply module is seriously affected.
(2) When testing voltage regulation function, different output voltages need to be connected into different output resistors, and the testing efficiency is seriously affected.
(3) When a large number of single-chip power supply modules are tested in the environment, the messy cables of the traditional testing tool can lead to complicated testing work, further reduce testing efficiency and increase the burning probability of products.
Disclosure of Invention
In order to solve the problems, the utility model provides a high-efficiency testing tool for a single-chip power module, which can ensure that pins of the single-chip power module are free from welding and are effectively connected; the plugging error can be prevented, and the time for checking the wiring is reduced; the method is favorable for developing batch environmental test, avoids the characteristics of messy and numerous traditional test cables, and improves the environmental test efficiency; fast voltage regulation test and enabling control can be realized.
The technical scheme adopted by the utility model is as follows:
the utility model provides a high efficiency test fixture of monolithic power module, includes test fixture A and test fixture B, test fixture A and test fixture B pass through the test connection cable and connect; the test fixture A comprises a first printed circuit board, an input connector and a first cavity, wherein a plurality of groups of elastic crown spring jacks are arranged on the first printed circuit board and can be spliced with pins of a plurality of single-chip power modules to be tested; the input connector is arranged on the first printed circuit board and can be electrically connected with power input ends of a plurality of to-be-tested single-chip power modules; the plurality of groups of elastic crown spring jacks, the input connector and the plurality of to-be-tested single-chip power supply modules are integrated in the first cavity.
The test fixture B comprises a second printed circuit board, a multi-gear band switch, an enabling button and a second cavity, wherein the second printed circuit board is electrically connected with the first printed circuit board through a test connection cable, the multi-gear band switch and the enabling button are arranged on the second printed circuit board, and the second printed circuit board and the first printed circuit board are electrically connected with a single-chip power module to be tested; the multi-gear band switch and the enabling button are integrated in the second cavity.
Further, the test connection cable comprises a cable, a first connector and a second connector, wherein the cable is electrically connected with the first printed circuit board through the first connector and the wiring terminal, and is electrically connected with the second printed circuit board through the second connector and the wiring terminal.
Further, the cables include an output cable, a detection cable, a voltage regulation signal cable, and an enable cable.
Further, the output cable and the detection cable are separated from the output pin of the single-chip power module to be tested and parallel.
Further, the multi-gear band switch comprises a voltage regulating resistor for regulating the output voltage of the to-be-tested single-chip power supply module, and the voltage regulating resistor is electrically connected with the to-be-tested single-chip power supply module through the second printed circuit board and the first printed circuit board.
Further, an indicator lamp is arranged on the enabling button, and the indicator lamp can display the enabling signal state of the single-chip power supply module to be tested when the enabling signal is switched on or off.
Further, the input connector is used for inputting a plurality of to-be-tested single-chip power modules in parallel.
Further, a voltage ripple test point is arranged on the second printed circuit board, and the voltage ripple test point is electrically connected with the to-be-tested single-chip power supply module through the second printed circuit board and the first printed circuit board.
Further, when the single-chip power module to be tested is subjected to high-temperature test, the test tool A is arranged in a high-temperature test box, and the test tool B is arranged outside the high-temperature test box.
Further, when the single-chip power supply module to be tested is subjected to a low-temperature test, the test tool A is arranged in a low-temperature test box, and the test tool B is arranged outside the low-temperature test box.
The utility model has the beneficial effects that:
(1) The direct welding test cable to the pin of the single-chip power module is avoided.
(2) The jack at the test cable end is effectively connected with the pin of the single-chip power supply module.
(3) The probability of burning out products due to misplug cables is reduced, the inspection time after wiring is shortened, and the test efficiency is improved.
(4) And the voltage regulation function test is optimized, output voltage regulation is realized by rapidly switching different voltage regulation resistors, and the test efficiency is improved.
(5) The testing efficiency of the environment test (high-low temperature test) of the batch single-chip power supply modules is improved.
Drawings
Fig. 1 is a schematic diagram of a common monolithic power module package.
Fig. 2 is a schematic diagram of a high-efficiency testing tool for a monolithic power module according to an embodiment of the utility model.
Fig. 3 is a schematic structural diagram of a high-efficiency testing tool for a monolithic power module according to an embodiment of the utility model.
Detailed Description
Specific embodiments of the present utility model will now be described in order to provide a clearer understanding of the technical features, objects and effects of the present utility model. It should be understood that the particular embodiments described herein are illustrative only and are not intended to limit the utility model, i.e., the embodiments described are merely some, but not all, of the embodiments of the utility model. All other embodiments, which can be made by a person skilled in the art without making any inventive effort, are intended to be within the scope of the present utility model.
As shown in fig. 2 and 3, this embodiment provides a high efficiency testing tool for a monolithic power module, including a testing tool a, a testing tool B and a testing connection cable, where the testing tool a is mainly used for plugging the monolithic power module to be tested, the testing tool B is mainly used for performing performance testing, enabling control, output voltage regulation and other operations on the module performance, and the testing connection cable is mainly used for electrically connecting the testing tool a, the testing tool B, the output load and the like.
As shown in fig. 3, the test fixture a includes a first printed circuit board 1, an input connector 8 and a first cavity 9, where multiple groups of elastic crown spring jacks are provided on the first printed circuit board 1, and the multiple groups of elastic crown spring jacks can be plugged with pins of multiple to-be-tested monolithic power modules 11. The input connector 8 is arranged on the first printed circuit board 1 and can be electrically connected with the power input ends of a plurality of to-be-tested single-chip power modules 11; the plurality of groups of elastic crown spring jacks, the input connector 8 and the plurality of single-chip power modules to be tested 11 are integrated in the first cavity 9.
In the embodiment, the pin of the single-chip power module is plugged by the elastic crown spring jack, and the elastic crown spring ensures that the jack is in good contact with the pin, and meanwhile, the product appearance is prevented from being damaged due to the fact that the pin is welded with the wire. The elastic crown spring jack is packaged and fixed on the first printed circuit board 1 according to the single-chip power module, the probability of burning out a product caused by human wiring errors can be reduced to 0, the wiring checking time is saved, and the testing efficiency is greatly improved. The plurality of single-chip power supply modules are packaged and integrated on the first printed circuit board 1 (10 single-chip power supply modules are integrated in the embodiment), so that the environment test (high-low temperature test) of the plurality of single-chip power supply modules can be carried out simultaneously, the test cost is saved, and the test efficiency is improved.
As shown in fig. 3, the test fixture B includes a second printed circuit board 2, a multi-gear band switch 4, an enabling button 7 and a second cavity 10, where the second printed circuit board 2 is electrically connected to the first printed circuit board 1 through a test connection cable, the multi-gear band switch 4 and the enabling button 7 are disposed on the second printed circuit board 2, and are electrically connected to the to-be-tested monolithic power module 11 through the second printed circuit board 2 and the first printed circuit board 1; the multi-range band switch 4 and the enable button 7 are integrated within the second cavity 10. Preferably, the second printed circuit board 2 is provided with a voltage ripple test point, and the voltage ripple test point is electrically connected with the monolithic power supply module 11 to be tested through the second printed circuit board 2 and the first printed circuit board 1.
In the embodiment, the multi-gear band switch 4, the enabling button 7, the voltage ripple test point and the like are integrated on the second printed circuit board 2, so that the time of scattered test is reduced, and the working states of a plurality of single-chip power modules can be monitored and adjusted in a centralized manner.
The test connection cable includes a cable 3, a first connector 5 and a second connector 6, the cable 3 is electrically connected to the first printed circuit board 1 through the first connector 5 and the connection terminal, and is electrically connected to the second printed circuit board 2 through the second connector 6 and the connection terminal. Preferably, the cable 3 includes an output cable, a detection cable, a voltage regulation signal cable, and an enable cable. More preferably, the output cable and the detection cable are separated from the output pin of the single-chip power module to be tested in parallel, so that measurement errors caused by line loss can be reduced, and the test precision is improved.
According to the embodiment, the test tool A, the test tool B and the output load are effectively connected through the test connecting cable, the test tool A, the test tool B and the output load can be freely connected and detached, the construction of an environment test bench is facilitated, and the defect that the traditional test cable is messy and various is avoided.
The embodiment can realize the rapid switching of different voltage regulating resistors by utilizing the multi-gear band switch 4, rapidly regulate the output voltage, further improve the test efficiency, flexibly expand the voltage regulating range and more comprehensively detect the voltage regulating performance of the single-chip power supply module.
The enabling button 7 with the indicating function is used for switching on or switching off the enabling signal, so that the enabling control of the single-chip power supply module is more convenient, and the state of the enabling signal of the single-chip power supply module can be visually displayed.
Preferably, the input connector 8 performs parallel input on a plurality of to-be-tested single-chip power supply modules, so that the number of external primary power supply devices can be reduced to 1, and the resource utilization rate of the devices can be improved.
Preferably, when the single-chip power module to be tested is subjected to high-temperature test, the test tool A is arranged in a high-temperature test box, and the test tool B is arranged outside the high-temperature test box; when the single-chip power module to be tested is subjected to a low-temperature test, the test tool A is arranged in a low-temperature test box, and the test tool B is arranged outside the low-temperature test box.
The assembly with the corresponding functions is integrated in the cavity, so that the effects of being convenient to use, store, carry and prolong the service life can be achieved.
In summary, the high-efficiency testing tool for the monolithic power module of the embodiment can ensure that the pins of the monolithic power module are free from welding and are effectively connected; the plugging error can be prevented, and the time for checking the wiring is reduced; the method is favorable for developing batch environmental test, avoids the characteristics of messy and numerous traditional test cables, and improves the environmental test efficiency; fast voltage regulation test and enabling control can be realized.
In the description of the present utility model, it should be noted that the terms "first," "second," "third," and the like are used merely to distinguish between descriptions and are not to be construed as indicating or implying relative importance. Unless specifically stated or limited otherwise, the terms "disposed," "mounted," "connected," and "connected" are to be construed broadly, and may be, for example, fixedly connected, detachably connected, or integrally connected; can be mechanically or electrically connected; either a wired connection or a wireless connection.
Claims (10)
1. The high-efficiency test fixture for the single-chip power supply module is characterized by comprising a test fixture A and a test fixture B, wherein the test fixture A and the test fixture B are connected through a test connecting cable; the test fixture A comprises a first printed circuit board (1), an input connector (8) and a first cavity (9), wherein a plurality of groups of elastic crown spring jacks are arranged on the first printed circuit board (1) and can be spliced with pins of a plurality of single-chip power modules (11) to be tested; the input connector (8) is arranged on the first printed circuit board (1) and can be electrically connected with power input ends of a plurality of single-chip power modules (11) to be tested; the plurality of groups of elastic crown spring jacks, the input connector (8) and the plurality of single-chip power modules (11) to be tested are integrated in the first cavity (9);
the test fixture B comprises a second printed circuit board (2), a multi-gear band switch (4), an enabling button (7) and a second cavity (10), wherein the second printed circuit board (2) is electrically connected with the first printed circuit board (1) through a test connection cable, the multi-gear band switch (4) and the enabling button (7) are arranged on the second printed circuit board (2), and the second printed circuit board (2) and the first printed circuit board (1) are electrically connected with a single-chip power module (11) to be tested; the multi-gear band switch (4) and the enabling button (7) are integrated in the second cavity (10).
2. The high-efficiency test fixture for the single-chip power supply module according to claim 1, wherein the test connection cable comprises a cable (3), a first connector (5) and a second connector (6), wherein the cable (3) is electrically connected with the first printed circuit board (1) through the first connector (5) and a wiring terminal, and is electrically connected with the second printed circuit board (2) through the second connector (6) and the wiring terminal.
3. The single-chip power module high-efficiency test fixture according to claim 2, wherein the cable (3) comprises an output cable, a detection cable, a voltage regulation signal cable and an enabling cable.
4. A monolithic power module high efficiency test fixture as defined in claim 3, wherein said output cable is in separate parallel with said detection cable from an output pin of the monolithic power module under test.
5. The high-efficiency test fixture for the single-chip power supply module according to claim 1, wherein the multi-gear band switch (4) comprises a voltage regulating resistor for regulating the output voltage of the single-chip power supply module to be tested, and the voltage regulating resistor is electrically connected with the single-chip power supply module to be tested (11) through the second printed circuit board (2) and the first printed circuit board (1).
6. The high-efficiency test fixture for the single-chip power supply module according to claim 1, wherein the enabling button (7) is provided with an indicator lamp, and the indicator lamp can display the enabling signal state of the single-chip power supply module to be tested when the enabling signal is turned on or off.
7. The high-efficiency test fixture for the single-chip power supply module according to claim 1, wherein the input connector (8) is used for inputting a plurality of single-chip power supply modules to be tested in parallel.
8. The high-efficiency test fixture for the single-chip power supply module according to claim 1, wherein a voltage ripple test point is arranged on the second printed circuit board (2), and the voltage ripple test point is electrically connected with the single-chip power supply module (11) to be tested through the second printed circuit board (2) and the first printed circuit board (1).
9. The high-efficiency test fixture for a single-chip power module according to any one of claims 1 to 8, wherein the test fixture a is placed in a high-temperature test chamber and the test fixture B is placed outside the high-temperature test chamber when the single-chip power module to be tested is subjected to high-temperature test.
10. The tool for testing the high efficiency of the monolithic power supply module according to any one of claims 1 to 8, wherein the tool for testing a is placed in a low temperature test chamber and the tool for testing B is placed outside the low temperature test chamber when the monolithic power supply module to be tested is subjected to a low temperature test.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202320237675.2U CN219552621U (en) | 2023-02-16 | 2023-02-16 | High-efficiency testing tool for single-chip power supply module |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202320237675.2U CN219552621U (en) | 2023-02-16 | 2023-02-16 | High-efficiency testing tool for single-chip power supply module |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN219552621U true CN219552621U (en) | 2023-08-18 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202320237675.2U Active CN219552621U (en) | 2023-02-16 | 2023-02-16 | High-efficiency testing tool for single-chip power supply module |
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| Country | Link |
|---|---|
| CN (1) | CN219552621U (en) |
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- 2023-02-16 CN CN202320237675.2U patent/CN219552621U/en active Active
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