CN212364394U - Circuit for realizing measurement of multipoint current and voltage by single program-controlled multimeter - Google Patents
Circuit for realizing measurement of multipoint current and voltage by single program-controlled multimeter Download PDFInfo
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- CN212364394U CN212364394U CN202020888224.1U CN202020888224U CN212364394U CN 212364394 U CN212364394 U CN 212364394U CN 202020888224 U CN202020888224 U CN 202020888224U CN 212364394 U CN212364394 U CN 212364394U
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Abstract
The utility model discloses a circuit for realizing that a single program-controlled multimeter measures multipoint current and voltage, which comprises a control unit, a program-controlled multimeter and a test board, wherein the test board is provided with a voltage test end V, a current test end MI + and a current test end MI-which are respectively connected with a voltage end, a current end and a grounding end of the program-controlled multimeter, the test board is also provided with N voltage input ends and M pairs of current input/output ends, N and M are integers which are more than 1, each voltage input end is respectively connected with the voltage test end V through a first switch circuit, the current input end and the current output end in each pair of current input/output ends are respectively connected with the current test end MI + and the current test end MI-through a second switch circuit and a third switch circuit, the current test end MI-is grounded through a fourth switch circuit, the program-controlled multimeter, the first switch circuit, the second switch circuit, the third switch circuit and the fourth switch circuit are respectively connected with the control unit.
Description
Technical Field
The utility model belongs to the test circuit field specifically relates to a realize circuit that single programme-controlled universal meter measured multiple spot electric current and voltage.
Background
An IC (integrated circuit) refers to a monolithic module designed to perform certain electrical characteristic functions, such as a power supply IC, a control IC, and the like. The IC may be defective due to the presence of physical defects during the manufacturing process, and therefore, the IC needs to be tested after being manufactured, for example, for its current and voltage characteristics.
With the increasing complexity of IC functions, more and more pins are needed for testing current and voltage characteristics, and the existing test methods mainly have two types, wherein the first test method is to connect a plurality of multimeters to a plurality of pins to be tested simultaneously for testing, and the number of the multimeters needed is large, so that the cost is high; the other testing method is to use a universal meter to manually connect each pin to be tested for testing, and the universal meter does not need to continuously disconnect and connect wires, so that the operation is complicated, the speed is low, the efficiency is low, and errors are easy to occur.
Disclosure of Invention
An object of the utility model is to provide a realize that single programme-controlled universal meter measures the technical problem that the circuit of multiple spot electric current and voltage is used for solving above-mentioned existence.
In order to achieve the above object, the utility model adopts the following technical scheme: a circuit for realizing multi-point current and voltage measurement of a single program-controlled multimeter comprises a control unit, a program-controlled multimeter and a test board, wherein the test board is provided with a voltage test end V, a current test end MI + and a current test end MI-, the voltage test end V, the current test end MI + and the current test end MI-are respectively connected with a voltage end, a current end and a grounding end of the program-controlled multimeter, the test board is also provided with N voltage input ends and M pairs of current input/output ends, wherein N and M are integers larger than 1, each voltage input end is respectively connected with the voltage test end V through a first switch circuit, the current input end in each pair of current input/output ends is respectively connected with the current test end MI + through a second switch circuit, the current output end in each pair of current input/output ends is respectively connected with the current test end MI-through a third switch circuit, the current testing end MI-is also grounded through a fourth switch circuit, and the program-controlled multimeter, the first switch circuit, the second switch circuit, the third switch circuit and the fourth switch circuit are respectively connected with the control unit.
Furthermore, the test board further comprises M normally closed channels, the M normally closed channels respectively connect the current input end and the current output end of the M pairs of current input/output ends, M is larger than or equal to 1 and smaller than or equal to M, the normally closed channels are controlled to be disconnected by a fifth switch circuit, and the fifth switch circuit is connected with the control unit.
Further, the first switch circuit is implemented by a relay.
Furthermore, the first switch circuit is realized by an optocoupler relay.
Further, the second switch circuit and the third switch circuit are both realized by using relays.
Furthermore, the second switch circuit and the third switch circuit are both realized by electromagnetic relays.
Furthermore, the second switch circuit and the third switch circuit corresponding to each pair of current input/output terminals are implemented by a double-pole double-throw electromagnetic relay.
Further, the fourth switching circuit is realized by a relay.
Furthermore, the control unit comprises a PC and an MCU unit, the PC is in communication connection with the program-controlled multimeter, and the MCU unit is respectively connected with the PC, the first switch circuit, the second switch circuit, the third switch circuit and the fourth switch circuit.
Furthermore, the MCU unit is arranged on the test board and is in communication connection with the PC through a serial interface.
The utility model has the advantages of:
the utility model discloses can realize that single programme-controlled universal meter carries out the automatic measure of multiple spot electric current and voltage, improve measuring equipment's utilization ratio, reduce test cost, and easy operation, measuring speed is fast, and is efficient, is difficult for makeing mistakes.
Drawings
In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the drawings needed to be used in the description of the embodiments will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to these drawings without creative efforts.
Fig. 1 is a circuit diagram of an embodiment of the present invention.
Detailed Description
To further illustrate the embodiments, the present invention provides the accompanying drawings. The accompanying drawings, which are incorporated in and constitute a part of this disclosure, illustrate embodiments of the invention and, together with the description, serve to explain the principles of the embodiments. With these references, one of ordinary skill in the art will appreciate other possible embodiments and advantages of the present invention. Elements in the figures are not drawn to scale and like reference numerals are generally used to indicate like elements.
The present invention will now be further described with reference to the accompanying drawings and detailed description.
As shown in FIG. 1, a circuit for realizing multi-point current and voltage measurement of a single program-controlled multimeter comprises a control unit, a program-controlled multimeter 2 and a test board 1, wherein the test board 1 is provided with a voltage test end V, a current test end MI + and a current test end MI-, the voltage test end V, the current test end MI + and the current test end MI-are respectively connected with the voltage end V, the current end I and a grounding end G of the program-controlled multimeter 2, the test board 1 is further provided with N voltage input ends and M pairs of current input/output ends, the N voltage input ends are specifically voltage input ends Vin _1-Vin _ N, the M pairs of current input/output ends are provided with M current input ends Iin _1-Iin _ M and M current output ends Iout _1-Iout _ M, and both N and M are integers greater than 1.
Each voltage input end is connected with the voltage test end V through a first switch circuit, that is, the voltage input ends Vin _1-Vin _ N are connected with the voltage test end V through a first switch circuit, and the specific size of N can be set according to actual needs.
In this embodiment, the first switch circuit is preferably implemented by using the relay KV, that is, the voltage input terminals Vin _1 to Vin _ N are respectively connected to the voltage testing terminal V through the relays KV _1 to KV _ N, and the first switch circuit is implemented by using a relay, which has a large over-current and a high withstand voltage, but is not limited thereto.
More preferably, the relays KV _1 to KV _ N are all preferably optocoupler relays, and have a small size, so as to reduce the size of the test board 1.
The current input end of each pair of current input/output ends is respectively connected with the current test end MI + through a second switch circuit, the current output end of each pair of current input/output ends is respectively connected with the current test end MI-through a third switch circuit, and the current test end MI-is grounded through a fourth switch circuit.
In this embodiment, the second switch circuit and the third switch circuit are both implemented by using relays, and have high overcurrent and high withstand voltage, but the present invention is not limited thereto.
Preferably, the second switch circuit and the third switch circuit are both realized by electromagnetic relays, and the endured current is larger and more reliable.
More preferably, the second switch circuit and the third switch circuit corresponding to each pair of current input/output ends are realized by a double-pole double-throw electromagnetic relay KI, the integration level is high, the circuit volume and the number of parts are reduced, and the realization is easy. Specifically, the current input terminals Iin _1-Iin _ M are respectively connected to the current testing terminal MI + through the double-pole double-throw electromagnetic relays KI _1-KI _ M, and the current output terminals Iout _1-Iout _ M are also respectively connected to the current testing terminal MI-through the double-pole double-throw electromagnetic relays KI _1-KI _ M, for a specific connection relationship, refer to fig. 1.
In this embodiment, the test board 1 further includes M normally closed channels 11, where the M normally closed channels 11 respectively connect the current input terminals Iin _1-Iin _ M and the current output terminals Iout _1-Iout _ M of the M pairs of current input/output terminals, M is greater than or equal to 1 and less than or equal to M, the normally closed channels 11 are controlled to be disconnected by a fifth switch circuit, the fifth switch circuit is connected with the control unit, and the normally closed channels 11 are provided to satisfy a condition that some pins to be tested need to be always closed in the test process.
Preferably, in this embodiment, the fifth switch circuit is implemented by a double-pole double-throw electromagnetic relay KI, so as to save the number of components and reduce the circuit cost, specifically, two ends of the normally closed channel 11 are respectively connected to two normally closed contacts of the double-pole double-throw electromagnetic relay KI, as shown in fig. 1, but not limited thereto, and in other embodiments, the fifth switch circuit may also be implemented by a single switch.
In this embodiment, the fourth switching circuit is implemented by using a relay KG, and has a large overcurrent and a high withstand voltage, but the invention is not limited thereto.
In the specific embodiment, the control unit comprises a PC 4 and an MCU unit 3, the PC 4 is in communication connection with the program-controlled multimeter 2, and the MCU unit 3 is respectively connected with the PC 4, the relay KV _1-KV _ N, the double-pole double-throw electromagnetic relay KI _1-KI _ M and the relay KG.
Furthermore, the MCU unit 3 is arranged on the test board 1, the integration level is high, the use is convenient, and the MCU unit 3 is in communication connection with the PC 4 through a serial interface.
During measurement, a voltage end V, a current end I and a grounding end G of the program-controlled multimeter 2 are respectively connected with a voltage testing end V, a current testing end MI + and a current testing end MI-of the testing board 1, the program-controlled multimeter 2 is in communication connection with the PC 4, the MCU unit 3 of the testing board 1 is in communication connection with the PC 4 through a serial interface, then a plurality of voltage testing pins on the IC to be tested are correspondingly connected to the voltage input ends Vin _1-Vin _ N, and a plurality of pairs of current testing pins on the IC to be tested are correspondingly connected to the current input ends Iin _1-Iin _ M and the current output ends Iout _1-Iout _ M.
When measuring current, the PC 4 controls the program-controlled universal meter 2 to be configured in a current mode, simultaneously controls the double-pole double-throw electromagnetic relay KI _1-KI _ M through the MCU unit 3 to respectively access the current input end Iin _1-Iin _ M and the current output end Iout _1-Iout _ M to the current test end MI + and the current test end MI-, namely, current tests can be sequentially carried out on a plurality of pairs of current test pins, and the program-controlled universal meter 2 uploads a test result to the PC to be checked and stored.
When measuring voltage, PC 4 control program-controlled universal meter 2 configuration is the voltage mode, and through MCU unit 3 control relay KG closure, simultaneously control relay KV _1-KV _ N respectively with voltage input terminal Vin _1-Vin _ N access voltage test end V respectively, can carry out the voltage test to a plurality of voltage test feet in proper order, program-controlled universal meter 2 will test the result and upload and look over and save in the PC, realized promptly that single program-controlled universal meter carries out the automatic measure of multiple spot electric current and voltage, improve measuring equipment's utilization ratio, reduce test cost, and easy operation, measuring speed is fast, high efficiency, be difficult for makeing mistakes.
While the invention has been particularly shown and described with reference to a preferred embodiment, it will be understood by those skilled in the art that various changes in form and detail may be made therein without departing from the spirit and scope of the invention as defined by the appended claims.
Claims (10)
1. The utility model provides a realize that single programme-controlled universal meter measures circuit of multiple spot electric current and voltage which characterized in that: the test board is provided with a voltage test end V, a current test end MI + and a current test end MI-, the voltage test end V, the current test end MI + and the current test end MI-are respectively connected with a voltage end, a current end and a grounding end of the program-controlled multimeter, the test board is also provided with N voltage input ends and M pairs of current input/output ends, wherein N and M are integers which are larger than 1, each voltage input end is respectively connected with the voltage test end V through a first switch circuit, the current input ends in each pair of current input/output ends are respectively connected with the current test end MI + through a second switch circuit, the current output ends in each pair of current input/output ends are respectively connected with the current test end MI-through a third switch circuit, and the current test end MI-is also grounded through a fourth switch circuit, the program-controlled multimeter, the first switch circuit, the second switch circuit, the third switch circuit and the fourth switch circuit are respectively connected with the control unit.
2. The circuit for realizing the measurement of the multipoint current and voltage of the single program-controlled multimeter according to claim 1, wherein: the test board further comprises M normally closed channels, the M normally closed channels respectively connect the current input end and the current output end of the M pairs of current input/output ends, M is larger than or equal to 1 and smaller than or equal to M, the normally closed channels are controlled to be disconnected by a fifth switch circuit, and the fifth switch circuit is connected with the control unit.
3. The circuit for realizing the measurement of the multipoint current and voltage of the single program-controlled multimeter according to claim 1, wherein: the first switching circuit is implemented using a relay.
4. The circuit for realizing the measurement of the multi-point current and voltage of the single program-controlled multimeter according to claim 3, wherein: the first switching circuit is realized by an optocoupler relay.
5. The circuit for realizing the measurement of the multipoint current and voltage of the single program-controlled multimeter according to claim 1, wherein: the second switch circuit and the third switch circuit are both realized by adopting relays.
6. The circuit for realizing the measurement of the multi-point current and voltage of the single program-controlled multimeter according to claim 5, wherein: the second switch circuit and the third switch circuit are both realized by electromagnetic relays.
7. The circuit for realizing the measurement of the multi-point current and voltage of the single program-controlled multimeter according to claim 6, wherein: the second switch circuit and the third switch circuit corresponding to each pair of current input/output ends are realized by a double-pole double-throw electromagnetic relay.
8. The circuit for realizing the measurement of the multipoint current and voltage of the single program-controlled multimeter according to claim 1, wherein: the fourth switching circuit is realized by adopting a relay.
9. The circuit for realizing the measurement of the multipoint current and voltage of the single program-controlled multimeter according to claim 1, wherein: the control unit comprises a PC and an MCU unit, the PC is in communication connection with the program-controlled multimeter, and the MCU unit is respectively connected with the PC, the first switch circuit, the second switch circuit, the third switch circuit and the fourth switch circuit.
10. The circuit for realizing the measurement of the multi-point current and voltage of the single program-controlled multimeter according to claim 9, wherein: the MCU unit is arranged on the test board and is in communication connection with the PC through a serial interface.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202020888224.1U CN212364394U (en) | 2020-05-25 | 2020-05-25 | Circuit for realizing measurement of multipoint current and voltage by single program-controlled multimeter |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202020888224.1U CN212364394U (en) | 2020-05-25 | 2020-05-25 | Circuit for realizing measurement of multipoint current and voltage by single program-controlled multimeter |
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| Publication Number | Publication Date |
|---|---|
| CN212364394U true CN212364394U (en) | 2021-01-15 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN202020888224.1U Active CN212364394U (en) | 2020-05-25 | 2020-05-25 | Circuit for realizing measurement of multipoint current and voltage by single program-controlled multimeter |
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|---|---|
| CN (1) | CN212364394U (en) |
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- 2020-05-25 CN CN202020888224.1U patent/CN212364394U/en active Active
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| TR01 | Transfer of patent right |
Effective date of registration: 20220407 Address after: B201, zero one square, Xi'an Software Park, 72 Keji 2nd Road, high tech Zone, Xi'an City, Shaanxi Province, 710000 Patentee after: Tuoer Microelectronics Co.,Ltd. Address before: Unit 410, No. 1702, Gangzhong Road, Xiamen area, China (Fujian) pilot Free Trade Zone, Xiamen City, Fujian Province 361000 Patentee before: INMICRO (XIAMEN) MICROELECTRONIC TECHNOLOGY CO.,LTD. |
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