CN219496207U

CN219496207U - Device for detecting crystal defects

Info

Publication number: CN219496207U
Application number: CN202320868080.7U
Authority: CN
Inventors: 蔡棋梅; 严晨; 危志杰; 檀烽
Original assignee: Cas Laser Co ltd
Current assignee: Cas Laser Co ltd
Priority date: 2023-04-18
Filing date: 2023-04-18
Publication date: 2023-08-08
Anticipated expiration: 2033-04-18

Abstract

The utility model discloses a device for detecting crystal defects, which comprises a crystal placing part for placing a crystal to be detected, wherein a plurality of parallel light sources and detectors are arranged on the outer side of the crystal placing part, the parallel light sources are respectively arranged on different sides of the crystal to be detected, the detectors are correspondingly arranged on the opposite sides of the parallel light sources, an optical filter is arranged between the detectors and the crystal to be detected, and a crystal position regulator is arranged to facilitate rapid adjustment of the placing position of the crystal to be detected; the detector is electrically connected with the signal receiving and sending device, the signal receiving and sending device is electrically connected with the data analyzer and used for transmitting an electric signal sent by the detector to the data analyzer for analysis of internal defects of crystals, and the plurality of axial detectors simultaneously receive light spot information, so that accurate analysis of specific distribution conditions of crystal envelopes is facilitated, a detection result of crystal defects can be obtained rapidly by the data analyzer, and detection analysis efficiency is improved.

Description

Device for detecting crystal defects

Technical Field

The utility model relates to the technical field of crystal defect detection, in particular to a device for detecting crystal defects.

Background

There are various defects in crystals, and these defects are broadly classified into the following categories: point defects, line defects including edge dislocations and screw dislocations; the surface defects include stacking faults, twin grain boundaries, polycrystalline grain boundaries and the like; bulk defects include macroscopic or sub-microscopic voids, heterogenies, and the like. The various defects in the crystal affect the mechanical, thermal, electrical, optical and other properties of the crystal, so that the internal quality of the crystal needs to be strictly controlled in the production and manufacturing process to detect the crystal defects.

The existing crystal defect detection device, for example, patent CN201820740456.5 discloses a device for detecting the internal envelope of a TGG crystal, which irradiates the crystal through three-sided light sources and images the crystal on an image acquisition system on one side to collect detection images, but the crystal is of a three-dimensional structure, and only images collected through the image acquisition system on one side are difficult to accurately show the internal defect condition of the three-dimensional crystal, which is not beneficial to further accurately judging the crystal defect, and the collected images adopt a manual observation mode, which is not beneficial to improving the detection efficiency.

Disclosure of Invention

The present utility model has been made to overcome the above-mentioned drawbacks or problems occurring in the prior art, and an object of the present utility model is to provide an apparatus for detecting crystal defects.

In order to achieve the above purpose, the present utility model adopts the following technical scheme:

the utility model provides a device for detecting crystal defect, is including being used for placing the crystal portion of placing of awaiting measuring, and the crystal portion outside of placing is provided with a plurality of parallel light source and detector, parallel light source sets up respectively in the different sides of awaiting measuring crystal, and detector and parallel light source different sides and corresponding setting are just opposite at parallel light source, are provided with the filter between detector and the awaiting measuring crystal.

The detector is electrically connected with the signal receiver, and the signal receiver is electrically connected with the data analyzer and is used for transmitting the electric signal sent by the detector to the data analyzer for analysis of internal defects of the crystal.

Further, the parallel light source is a flat light source emitting plate.

Further, the detector is a detection plate, and the filter is a filter plate.

Further, the crystal placement part is arranged in the box body, the parallel light source and the detector are respectively arranged on the inner side wall of the box body, a cabinet door is arranged on one side of the box body, and the front side in the box body is arranged on the side where the cabinet door is arranged.

Further, a crystal position regulator for regulating the placement position of the crystal to be detected is arranged in the box body.

Further, the crystal position regulator comprises an L-shaped push block, and the L-shaped push block is arranged at the output end of the electric telescopic rod; the electric telescopic rod is arranged at the included angle between the rear side wall and the right side wall in the box body, and the electric telescopic rod and the crystal to be detected are located at the same horizontal height, so that the L-shaped push block can push the crystal to be detected conveniently.

Further, a shock absorber or a shock isolator is arranged at the bottom of the box body.

Further, the space in the box body is cube, the number of the parallel light sources is 3, the parallel light sources are respectively arranged on the front side in the box body, the left side wall in the box body and the lower side wall in the box body, and the detector is correspondingly arranged on the rear side wall, the right side wall and the upper side wall in the box body.

From the above description of the present utility model, compared with the prior art, the present utility model has the following advantages:

1. the three detection plates in the axial direction simultaneously receive the light spot information content, so that the specific distribution condition of the internal envelope of the crystal can be accurately analyzed, and accurate crystal defect information can be obtained; setting a filter plate to regulate scattered light caused by internal defects of the crystal, and avoiding that the difference of the scattered light received by the detection plate influences the detection precision; the signal receiving and sending device repairs and amplifies the electric signal transmitted by the detection plate, and a detection result of the internal defect of the crystal is obtained rapidly and accurately through the data analyzer, so that the detection and analysis efficiency is improved;

2. the crystal to be detected is pushed to the position to be detected through the electric telescopic rod, so that the crystal to be detected is positioned at a proper detection angle and position, and the accuracy of detection is guaranteed;

3. the damping device is arranged at the bottom of the box body, so that the influence of external vibration in the detection process is effectively avoided, and the detection precision is ensured.

Drawings

In order to more clearly illustrate the technical solutions of the embodiments of the present utility model, the drawings required to be used in the description of the embodiments below are briefly introduced, and it is obvious that the drawings in the following description are some embodiments of the present utility model, and other drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.

FIG. 1 is a schematic view of the structure of a case of the present utility model;

FIG. 2 is a schematic diagram of the structure of the present utility model;

FIG. 3 is a schematic diagram of the detection of a crystal under test according to the present utility model;

the main reference numerals illustrate:

1. the device comprises a crystal placing part, 2 parts of a parallel light source, 3 parts of a detector, 4 parts of an optical filter, 5 parts of a box body, 6 parts of a crystal position regulator, 60 parts of an L-shaped push block, 61 parts of an electric telescopic rod, 100 parts of a crystal to be detected.

Detailed Description

The technical solutions in the embodiments of the present utility model will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present utility model. It is to be understood that the described embodiments are preferred embodiments of the utility model and should not be taken as excluding other embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the present utility model without creative efforts, are within the protection scope of the present utility model.

In the claims, specification and drawings hereof, unless explicitly defined otherwise, the terms "first," "second," or "third," etc. are used for distinguishing between different objects and not for describing a particular sequential order.

In the claims, specification and drawings of the present utility model, unless explicitly defined otherwise, references to orientation or positional relationship such as the terms "center", "lateral", "longitudinal", "horizontal", "vertical", "top", "bottom", "inner", "outer", "upper", "lower", "front", "rear", "left", "right", "clockwise", "counterclockwise", etc. are based on the orientation and positional relationship shown in the drawings and are merely for convenience of description and to simplify the description, and do not indicate or imply that the apparatus or element referred to must have a particular orientation or be constructed and operated in a particular orientation, nor should it be construed as limiting the particular scope of the utility model.

In the claims, specification and drawings of the present utility model, unless explicitly defined otherwise, the term "fixedly connected" or "fixedly connected" should be construed broadly, i.e. any connection between them without a displacement relationship or a relative rotation relationship, that is to say includes non-detachably fixedly connected, integrally connected and fixedly connected by other means or elements.

In the claims, specification and drawings of the present utility model, the terms "comprising," having, "and variations thereof as used herein, are intended to be" including but not limited to.

Example 1, see fig. 1-3:

the device for detecting the crystal defects comprises a crystal placing part 1 for placing a crystal to be detected, a parallel light source 2, a detector 3 and a filter 4, wherein the parallel light source 2 is a flat light source emitting plate, the detector 3 is a detection plate, and the filter 4 is a filter plate.

The crystal placing part 1 is provided with a plurality of flat light source emitting plates on the outer side, light emitted by the flat light source emitting plates is parallel light, the number of the detecting plates and the filter plates is the same as that of the flat light source emitting plates, the flat light source emitting plates are respectively arranged on different sides of the crystal to be detected 100, the detecting plates and the flat light source emitting plates are respectively arranged on different sides and are correspondingly arranged on the right opposite sides of the flat light source emitting plates, and the filter plates are arranged between the detecting plates and the crystal to be detected 100, so that the parallel light emitted by the flat light source emitting plates irradiates the detecting plates after passing through the crystal to be detected 100 and the filter plates, and the filter plates are used for adjusting the scattered light intensity projected onto the detecting plates, thereby improving the detection precision;

the crystal placement part 1 is arranged in the box body 5, the flat light source emitting plate and the detection plate are respectively arranged on the inner side wall of the box body 5, a cabinet door is arranged on one side of the box body 5, the front side in the box body 5 is arranged on the side where the cabinet door is located, and the inner side of the box body 5 is the inner side wall of the cabinet door.

In this embodiment, the inner space of the case 5 is a cube, the number of flat light source emitting plates is 3, the flat light source emitting plates are distributed on the front side wall in the case 5, the left side wall in the case 5, the lower side wall in the case 5, the detecting plates are correspondingly arranged on the rear side wall, the right side wall and the upper side wall in the case 5, the crystal 100 to be detected is placed under the detecting plate located on the upper side wall in the case 5, and the position is the position to be detected.

The detecting board forms an electric signal according to the brightness degree of the received parallel light and the light spot density degree; the three detection plates arranged on the different sides receive the optical signals to form optical information in three dimensions, so that three-dimensional analysis of internal defects of the crystal is facilitated.

The detection plate is electrically connected with the signal receiver, and the signal receiver repairs and amplifies the electric signal, so that a signal blind area is effectively avoided; the signal receiver is electrically connected with the data analyzer and is used for transmitting the electric signals sent by the electronic light spot information captured by the detection plate to the data analyzer for data analysis of the distribution of the defect positions in the crystal.

A crystal position regulator 6 for regulating the placement position of the crystal 100 to be measured is arranged in the box body 5; the crystal position regulator 6 comprises an L-shaped push block 60, and the L-shaped push block 60 is arranged at the output end of an electric telescopic rod 61; the electric telescopic rod 61 is installed at the included angle between the rear side wall and the right side wall in the box body 5, and the electric telescopic rod 61 and the crystal to be detected 100 are located at the same horizontal height, so that the L-shaped push block 60 can push the crystal to be detected 100 to the position to be detected, and then the electric telescopic rod 61 is retracted and reset, and shielding of the detection plate by the electric telescopic rod 61 is avoided.

In the embodiment, the shock isolator is arranged at the bottom of the box body 5, so that the influence of external shock in the detection process is effectively avoided, and the detection precision is ensured; while in other embodiments the bottom of the tank 5 is provided as a shock absorber.

The working principle of the embodiment is as follows:

the crystal 100 to be detected is placed in the box body 5, the crystal 100 to be detected is pushed to a position to be detected through the electric telescopic rod 61, meanwhile, the L-shaped push block 60 enables the side face of the crystal 100 to be detected to be in contact with the L-shaped push block 60, the placement angle of the crystal 100 to be detected is adjusted in the pushing process, the detection accuracy is improved, then the electric telescopic rod 61 is contracted and reset, a cabinet door is closed, a flat light source emitting plate is started, parallel light beams emitted by the flat light source emitting plate penetrate the crystal 100 to be detected, scattered light intensity is regulated through the optical filter plate and then are projected onto the detection plate, when the parallel light beams pass through the crystal 100 to be detected, the light beams are blocked to advance because of the inner envelope of the crystal, part of the light beams are absorbed, part of the light beams continue to penetrate, electronic light spot information of brightness and light spot density degree can be left on the corresponding detection plate, the light signals are converted into electric signals through the detector, the electric signals are restored and amplified through the signal receiver, the captured electronic light spot information of the three surface detection plates in the box body is read by the data analyzer, data analysis of the position distribution of the internal defects of the crystal is carried out, the internal defect detection results of the crystal are obtained rapidly, and the detection results of the detection analysis efficiency of the internal defects are improved.

The three detection plates in the axial direction receive the information content of the light spot at the same time, so that the method is favorable for accurately analyzing the specific distribution condition of the inner envelope of the crystal.

The foregoing description of the embodiments and description is presented to illustrate the scope of the utility model, but is not to be construed as limiting the scope of the utility model. Modifications, equivalents, and other improvements to the embodiments of the utility model or portions of the features disclosed herein, as may occur to persons skilled in the art upon use of the utility model or the teachings of the embodiments, are intended to be included within the scope of the utility model, as may be desired by persons skilled in the art from a logical analysis, reasoning, or limited testing, in combination with the common general knowledge and/or knowledge of the prior art.

Claims

1. An apparatus for detecting crystal defects, characterized by: including being used for placing crystal (100) that awaits measuring crystal place portion (1), crystal place portion (1) outside is provided with a plurality of parallel light source (2) and detector (3), parallel light source (2) set up respectively in the different sides of crystal (100) that await measuring, detector (3) and parallel light source (2) different sides and detector (3) corresponding set up in parallel light source (2) are just opposite, are provided with optical filter (4) between detector (3) and the crystal (100) that await measuring, and detector (3) are connected with signal pickup ware electricity, and signal pickup ware is connected with data analyzer electricity and is used for carrying out the crystal internal defect analysis with the signal transmission of sending of detector (3) to data analyzer.

2. An apparatus for detecting crystal defects according to claim 1, wherein: the parallel light source (2) is a flat light source emitting plate.

3. An apparatus for detecting crystal defects according to claim 1, wherein: the detector (3) is a detection plate, and the optical filter (4) is an optical filter plate.

4. A device for detecting crystal defects according to any one of claims 1-3, characterized in that: the crystal placement part (1) is arranged in the box body (5), the parallel light source (2) and the detector (3) are respectively arranged on the inner side wall of the box body (5), a cabinet door is arranged on one side of the box body (5), and the front side in the box body (5) is arranged on the side where the cabinet door is arranged.

5. An apparatus for detecting crystal defects according to claim 4, wherein: a crystal position regulator (6) for regulating the placement position of the crystal (100) to be measured is arranged in the box body (5).

6. An apparatus for detecting crystal defects according to claim 5, wherein: the crystal position regulator (6) comprises an L-shaped push block (60), and the L-shaped push block (60) is arranged at the output end of the electric telescopic rod (61); the electric telescopic rod (61) is arranged at the included angle between the rear side wall and the right side wall in the box body (5), and the electric telescopic rod (61) and the crystal (100) to be detected are positioned at the same horizontal height, so that the L-shaped pushing block (60) can push the crystal (100) to be detected conveniently.

7. An apparatus for detecting crystal defects according to claim 4, wherein: the bottom of the box body (5) is provided with a shock absorber or a shock isolator.

8. An apparatus for detecting crystal defects according to claim 4, wherein: the box (5) inner space is the square, and the quantity of parallel light source (2) is 3, and parallel light source (2) set up respectively in front side wall, left side wall, the lower lateral wall in box (5), and detector (3) are corresponding to be set up in rear side wall, right side wall and the last lateral wall in box (5).