CN208420674U - Low-power semiconductor laser testing equipment - Google Patents
Low-power semiconductor laser testing equipment Download PDFInfo
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- CN208420674U CN208420674U CN201821291148.5U CN201821291148U CN208420674U CN 208420674 U CN208420674 U CN 208420674U CN 201821291148 U CN201821291148 U CN 201821291148U CN 208420674 U CN208420674 U CN 208420674U
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- sliding block
- square groove
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Abstract
The utility model discloses a low-power semiconductor laser testing device, which comprises a bottom frame, a U-shaped plate, a laser to be tested, a slide rail, an attenuation sheet, an optical filter, an imaging screen, a support plate, a CCD camera, a computer, a slide block, a U-shaped rod, a latch and a rack, wherein the top of the bottom frame is fixedly connected with the U-shaped plate, the laser to be tested is embedded and installed in the U-shaped plate, a square groove is arranged at one side of the laser to be tested at the top of the bottom frame, the slide rail is arranged in the square groove, two ends of the slide rail are respectively and fixedly connected with the inner wall at one side of the corresponding square groove, the attenuation sheet and the optical filter are sequentially arranged at the top of the square groove, the bottoms of the attenuation sheet and the optical filter are respectively and fixedly connected with a slide block, the slide block is, the device has good collimation effect, is convenient to detect, and can accurately detect the stability of the laser.
Description
Technical field
The utility model relates to laser detection device technical field, specially a kind of low power semiconductor laser test
Equipment.
Background technique
Low power semiconductor laser optical beam collimation method can be summarized as simple lens method, compound lens method, gradual change folding
It penetrates, rate lens method, liquid lens method, bounce technique and diffraction approach etc., first method collimating effect is poor, the second to six kinds of method knots
Structure is excessively complicated, when designing optical alignment system, should consider the performance of system comprehensively, not only to meet collimation performance,
And the otherwise requirement such as to meet power and volume, this is just related to the parameters such as the focal length of lens, hole, diameter, for this purpose,
It is proposed that a kind of low power semiconductor laser test equipment.
Utility model content
The purpose of this utility model is to provide a kind of low power semiconductor laser test equipments, to solve above-mentioned background
The problem of being proposed in technology.
To achieve the above object, the utility model provides the following technical solutions: a kind of low power semiconductor laser test
Equipment, including chassis, U-shaped board, testing laser device, sliding rail, attenuator, optical filter, imaging screen, support plate, CCD camera, meter
Calculation machine, sliding block, U-shaped bar, latch and rack gear, the chassis top are fixedly connected with U-shaped board, and the U-shaped board, which is embedded in, to be equipped with
Testing laser device, the chassis top are located at testing laser device side and offer square groove, are equipped with sliding rail, institute in the square groove
It states sliding rail both ends to be fixedly connected with corresponding square groove side inner wall respectively, is located above square groove at the top of the chassis and successively sets
There are attenuator and optical filter, the attenuator and optical filter bottom are fixedly connected to sliding block, and the sliding block covers outside sliding block
Side, and sliding block is slidably connected with sliding rail, the sliding block side vertical with chassis offers U-type groove, is all provided in the U-type groove
There is U-shaped bar, and U-shaped bar is slidably connected with U-type groove, it is exposed in air that described U-shaped bar one end both passes through U-type groove, the U-shaped bar
The other end both passes through U-type groove and is symmetrically fixedly connected with latch, and the square groove side inner wall vertical with chassis is fixedly connected with
Rack gear, the latch are engaged with rack connection, are located at square groove at the top of the chassis and fix far from the side of testing laser device
It is connected with support plate, imaging screen is fixedly connected at the top of the support plate, imaging screen is located at the top of the chassis far from square groove
Side be fixedly connected with CCD camera, the CCD camera input terminal face imaging screen setting is located at the top of the chassis
CCD camera is fixedly connected with computer far from the side of imaging screen, and image pick-up card is equipped in the computer, described
CCD camera output end and image pick-up card input terminal are electrically connected, described image capture card output end and computer input terminal
It is electrically connected.
Preferably, the U-shaped board two sides vertical with chassis symmetrically offer threaded hole, engage in the threaded hole
It is connected with bolt, and bolt one end both passes through threaded hole and is in contact with testing laser device side wall.
Preferably, the sliding block offers limiting slot far from the side of U-type groove, is equipped with pulley in the limiting slot,
The pulley two sides pass through the bearing side inner wall rotation connection adjacent with limiting slot respectively.
Preferably, be equipped with spring in the U-type groove, the both ends of the spring respectively with corresponding U-type groove side inner wall
It is fixedly connected with U-shaped bar.
Preferably, the attenuator, optical filter and the equal face testing laser device output end setting of imaging screen.
Compared with prior art, the utility model has the beneficial effects that
1, the utility model photoemissive laser beam of testing laser device first passes through optical filter after attenuator is decayed
It is radiated on imaging screen, the hot spot on imaging screen is imaged in CCD camera, converts digital letter for image by image pick-up card
Number, Digital Image Processing is finally carried out in a computer, for CCD camera acquired image data, is calculated using second moment
Method, which chooses integral domain appropriate, can calculate relevant light beam parameters, by the way that coke can be obtained to the multimetering on optical axis
Point position and focal point spot size, the angle of divergence, depth of focus and beam quality factor, according to the available hot spot of power density distribution
Shape can further analyze mode structure, by the determination and repeatedly measurement of light-beam position, can detect the stability of laser
, by pushing U-shaped bar that latch is being engaged with rack not, so that it may push sliding block to slide on the slide rail, so as to adjust decaying
The position of piece and optical filter, adjustment angle when facilitating detection, it is ensured that detection data is correct.
2, the utility model is by pushing U-shaped bar that latch is being engaged with rack not, so that it may push sliding block on the slide rail
Sliding, so as to adjust the position of attenuator and optical filter, adjustment angle when facilitating detection, it is ensured that detection data is correct.
Detailed description of the invention
Fig. 1 is the utility model overall structure main view；
Fig. 2 is the utility model overall structure top view；
Fig. 3 is the utility model A plot structure enlarged drawing；
Fig. 4 is the utility model U-shaped board structural front view；
Fig. 5 is the utility model slide block structure left view cross-sectional view；
Fig. 6 is the utility model detection schematic diagram.
In figure: 1, chassis；2, U-shaped board；3, testing laser device；4, bolt；5, square groove；6, sliding rail；7, attenuator；8, it filters
Mating plate；9, imaging screen；10, support plate；11, CCD camera；12, computer；13, sliding block；14, U-type groove；15, U-shaped bar；16,
Latch；17, rack gear；18, threaded hole；19, spring；20, pulley；21, limiting slot；22, image pick-up card.
Specific embodiment
The following will be combined with the drawings in the embodiments of the present invention, carries out the technical scheme in the embodiment of the utility model
Clearly and completely describe, it is clear that the described embodiments are only a part of the embodiments of the utility model, rather than whole
Embodiment.Based on the embodiments of the present invention, those of ordinary skill in the art are without making creative work
Every other embodiment obtained, fall within the protection scope of the utility model.
Please refer to Fig. 1-6, the utility model provides a kind of technical solution: a kind of test of low power semiconductor laser is set
It is standby, including chassis 1, U-shaped board 2, testing laser device 3, sliding rail 6, attenuator 7, optical filter 8, imaging screen 9, support plate 10, CCD take the photograph
Camera 11, computer 12, sliding block 13, U-shaped bar 15, latch 16 and rack gear 17 are fixedly connected with U-shaped board 2 at the top of the chassis 1,
The U-shaped board 2, which is embedded in, is equipped with testing laser device 3, at the top of the chassis 1 be located at 3 side of testing laser device offer it is rectangular
Slot 5, the square groove 5 is interior to be equipped with sliding rail 6, and 6 both ends of sliding rail are fixedly connected with corresponding 5 side inner wall of square groove respectively,
It is located above square groove 5 at the top of the chassis 1 and is successively arranged attenuator 7 and optical filter 8,8 bottom of the attenuator 7 and optical filter
It is fixedly connected to sliding block 13, the sliding block 13 covers in 13 outside of sliding block, and sliding block 13 is slidably connected with sliding rail 6, the cunning
The side vertical with chassis 1 of block 13 offers U-type groove 14, and U-shaped bar 15, and U-shaped bar 15 and U are equipped in the U-type groove 14
Type groove 14 is slidably connected, and described U-shaped 15 one end of bar both passes through that U-type groove 14 is exposed in air, and U-shaped 15 other end of bar is worn
It crosses U-type groove 14 and is symmetrically fixedly connected with latch 16, the square groove 5 side inner wall vertical with chassis 1 is fixedly connected with rack gear
17, the latch 16 engages connection with rack gear 17, is located at side of the square groove 5 far from testing laser device 3 at the top of the chassis 1
It is fixedly connected with support plate 10, imaging screen 9 is fixedly connected at the top of the support plate 10, is located at imaging screen 9 at the top of the chassis 1
Side far from square groove 5 is fixedly connected with CCD camera 11, and the 11 input terminal face imaging screen 9 of CCD camera is arranged,
It is located at CCD camera 11 at the top of the chassis 1 and is fixedly connected with computer 12, the computer 12 far from the side of imaging screen 9
Image pick-up card 22 is inside installed, 11 output end of CCD camera and 22 input terminal of image pick-up card are electrically connected, the figure
As 22 output end of capture card and 12 input terminal of computer are electrically connected.
The U-shaped board 2 two sides vertical with chassis 1 symmetrically offer threaded hole 18, engage in the threaded hole 18
It is connected with bolt 4, and 4 one end of bolt both passes through threaded hole 18 and is in contact with 3 side wall of testing laser device, facilitates fixed testing laser
Device 3 adjusts 3 position of testing laser device.
The side of the sliding block 13 far from U-type groove 14 offers limiting slot 21, is equipped with pulley in the limiting slot 21
20,20 two sides of pulley pass through the bearing side inner wall rotation connection adjacent with limiting slot 21 respectively, when making to pull sliding block 13
It is more labor-saving.
Be equipped with spring 19 in the U-type groove 14,19 both ends of spring respectively with corresponding 14 side inner wall of U-type groove
It is fixedly connected with U-shaped bar 15, makes to may return to original position when not pushing U-shaped bar 15.
The attenuator 7, optical filter 8 and the setting of equal 3 output end of face testing laser device of imaging screen 9, facilitate testing laser
3 light of device passes through attenuator 7 and optical filter 8 is imaged on imaging screen 9.
Working principle are as follows: the photoemissive laser beam of testing laser device 3 passes through optical filtering after the decaying of attenuator 7 first
Piece 8 is radiated on imaging screen 9, and the hot spot on imaging screen 9 is imaged in CCD camera 11, is turned image by image pick-up card 22
Digital signal is turned to, Digital Image Processing is finally carried out in computer 12, for 11 acquired image number of CCD camera
According to relevant light beam parameters can be calculated using second moment algorithm picks integral domain appropriate, by more on optical axis
Point measurement, can be obtained focal position and focal point spot size, the angle of divergence, depth of focus and beam quality factor, according to power density
It is distributed available light spot shape, can further analyze mode structure, by the determination and repeatedly measurement of light-beam position, can be examined
The stability for surveying laser, by pushing U-shaped bar 15 to engage latch 16 with rack gear 17, so that it may sliding block 13 be pushed to exist
It is slided on sliding rail 6, so as to adjust the position of attenuator 7 and optical filter 8, adjustment angle when facilitating detection, it is ensured that detection data is just
Really, the 11 model SHL-019# of CCD camera, 22 model OK-VG14AB-4E of described image capture card, the calculating
12 model 5460-2208S of machine.
It should be noted that, in this document, relational terms such as first and second and the like are used merely to a reality
Body or operation are distinguished with another entity or operation, are deposited without necessarily requiring or implying between these entities or operation
In any actual relationship or order or sequence.Moreover, the terms "include", "comprise" or its any other variant are intended to
Non-exclusive inclusion, so that the process, method, article or equipment including a series of elements is not only wanted including those
Element, but also including other elements that are not explicitly listed, or further include for this process, method, article or equipment
Intrinsic element.
While there has been shown and described that the embodiments of the present invention, for the ordinary skill in the art,
It is understood that these embodiments can be carried out with a variety of variations in the case where not departing from the principles of the present invention and spirit, repaired
Change, replacement and variant, the scope of the utility model is defined by the appended claims and the equivalents thereof.
Claims (5)
1. a kind of low power semiconductor laser test equipment, including chassis (1), U-shaped board (2), testing laser device (3), sliding rail
(6), attenuator (7), optical filter (8), imaging screen (9), support plate (10), CCD camera (11), computer (12), sliding block
(13), U-shaped bar (15), latch (16) and rack gear (17), it is characterised in that: be fixedly connected with U-shaped board at the top of the chassis (1)
(2), the U-shaped board (2), which is embedded in, is equipped with testing laser device (3), and testing laser device (3) one is located at the top of the chassis (1)
Side offers square groove (5), is equipped with sliding rail (6) in the square groove (5), sliding rail (6) both ends respectively with it is corresponding rectangular
Slot (5) side inner wall is fixedly connected, and is located above square groove (5) at the top of the chassis (1) and is successively arranged attenuator (7) and filters
Piece (8), the attenuator (7) and optical filter (8) bottom are fixedly connected to sliding block (13), and the sliding block (13) covers in sliding block
(13) outside, and sliding block (13) is slidably connected with sliding rail (6), the sliding block (13) side vertical with chassis (1) offers U
Type groove (14), the U-type groove (14) is interior to be equipped with U-shaped bar (15), and U-shaped bar (15) is slidably connected with U-type groove (14), the U
Type bar (15) one end both passes through that U-type groove (14) is exposed in air, and it is right that U-shaped bar (15) other end both passes through U-type groove (14)
Title is fixedly connected with latch (16), and the square groove (5) the side inner wall vertical with chassis (1) is fixedly connected with rack gear (17),
The latch (16) engages connection with rack gear (17), and square groove (5) are located at the top of the chassis (1) far from testing laser device
(3) side is fixedly connected with support plate (10), is fixedly connected with imaging screen (9), the chassis at the top of the support plate (10)
(1) side that top is located at imaging screen (9) separate square groove (5) is fixedly connected with CCD camera (11), the CCD camera
(11) input terminal face imaging screen (9) is arranged, and one of CCD camera (11) far from imaging screen (9) is located at the top of the chassis (1)
Side is fixedly connected with computer (12), is equipped with image pick-up card (22) in the computer (12), the CCD camera (11)
Output end and image pick-up card (22) input terminal are electrically connected, and described image capture card (22) output end and computer (12) input
End is electrically connected.
2. a kind of low power semiconductor laser test equipment according to claim 1, it is characterised in that: the U-shaped board
(2) two sides vertical with chassis (1) symmetrically offer threaded hole (18), and engagement is connected with bolt in the threaded hole (18)
(4), and bolt (4) one end both passes through threaded hole (18) and is in contact with testing laser device (3) side wall.
3. a kind of low power semiconductor laser test equipment according to claim 1, it is characterised in that: the sliding block
(13) side far from U-type groove (14) offers limiting slot (21), is equipped with pulley (20) in the limiting slot (21), described
Pulley (20) two sides pass through the bearing side inner wall adjacent with limiting slot (21) respectively and are rotatablely connected.
4. a kind of low power semiconductor laser test equipment according to claim 1, it is characterised in that: the U-type groove
(14) in be equipped with spring (19), spring (19) both ends respectively with corresponding U-type groove (14) side inner wall and U-shaped bar
(15) it is fixedly connected.
5. a kind of low power semiconductor laser test equipment according to claim 1, it is characterised in that: the attenuator
(7), optical filter (8) and imaging screen (9) face testing laser device (3) output end setting.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201821291148.5U CN208420674U (en) | 2018-08-10 | 2018-08-10 | Low-power semiconductor laser testing equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201821291148.5U CN208420674U (en) | 2018-08-10 | 2018-08-10 | Low-power semiconductor laser testing equipment |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN208420674U true CN208420674U (en) | 2019-01-22 |
Family
ID=65122780
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201821291148.5U Active CN208420674U (en) | 2018-08-10 | 2018-08-10 | Low-power semiconductor laser testing equipment |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN208420674U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112713494A (en) * | 2019-10-24 | 2021-04-27 | 山东华光光电子股份有限公司 | Device for screening 808nm laser device bars through light spots and working method |
-
2018
- 2018-08-10 CN CN201821291148.5U patent/CN208420674U/en active Active
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112713494A (en) * | 2019-10-24 | 2021-04-27 | 山东华光光电子股份有限公司 | Device for screening 808nm laser device bars through light spots and working method |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| TR01 | Transfer of patent right | ||
| TR01 | Transfer of patent right |
Effective date of registration: 20210526 Address after: 4033, 2nd floor, South, No.18 Haitai West Road, Huayuan Industrial Zone, Binhai New Area, Tianjin Patentee after: Tianjin Xincheng measurement and Control Technology Co.,Ltd. Address before: 101-10, 1st floor, south 2nd floor, No.18 Haitai West Road, Huayuan Industrial Zone, Binhai New Area, Tianjin Patentee before: TUOWEN (TIANJIN) ELECTRONIC TECHNOLOGY Co.,Ltd. |