CN112713494A - Device for screening 808nm laser device bars through light spots and working method - Google Patents
Device for screening 808nm laser device bars through light spots and working method Download PDFInfo
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- CN112713494A CN112713494A CN201911018870.0A CN201911018870A CN112713494A CN 112713494 A CN112713494 A CN 112713494A CN 201911018870 A CN201911018870 A CN 201911018870A CN 112713494 A CN112713494 A CN 112713494A
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- camera
- laser
- white paper
- laser bars
- light
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/0014—Measuring characteristics or properties thereof
Abstract
A device for screening 808nm laser bars through light spots and a working method thereof are disclosed, wherein the device comprises a laser bar, a test platform, a test probe, a camera and white paper; the upper side of the test platform is provided with a bar, the upper end of the bar is provided with a test probe, the bar is provided with white paper along a light emission path, and the other end of the white paper is provided with a camera; the camera is connected with a computer, and batches with high poor light spot proportion are selected for elimination; the yield of 808 laser packaging is improved, and the production cost is reduced.
Description
Technical Field
The invention relates to a device for screening 808nm laser bars through light spots and a working method, and belongs to the field of semiconductor lasers.
Background
Semiconductor lasers and arrays thereof have been widely used in various fields such as industry, medical treatment, communication, military and the like due to their advantages of small size, light weight, high efficiency, low cost and the like. With the increasingly wide application of semiconductor lasers and arrays thereof, how to accurately and conveniently detect the performance of devices and evaluate the reliability of the devices is a very important work and has important practical significance.
The laser bars are basic constituent units of the laser array, can be independently applied, and can further form linear arrays and stacked arrays, so that a plurality of tests about array characteristics are based on the bars; the prior patent (publication number: CN105784330A) proposes a semiconductor laser bar unit consistency detector and a detection method thereof, the main technical scheme is' the semiconductor laser bar unit consistency detector and the detection method thereof, which belong to the technical field of semiconductor laser detection, and in order to detect the uniformity of the photoelectric characteristics of each unit of a laser bar, a probe station, an optical lens and a linear array CCD are all arranged on a one-dimensional guide rail; the linear array CCD and the program-controlled current source are both connected with the microcontroller system; the tested bar is arranged on the probe station, the output end of the program-controlled current source is connected with the electrode of the probe station, and the electrode is connected with the tested bar; the microcontroller system controls the program-controlled current source to drive the detected bar, each light-emitting point of the detected bar is imaged on the linear array CCD through the optical lens, the microcontroller system collects the brightness peak value of each light-emitting point of the detected bar through the linear array CCD, and the microcontroller system reads the linear array CCD once when the scanning current is increased by one step until the brightness peak value of the light-emitting point reaches the saturation value of the linear array CCD; and the microcontroller system calculates the variance of the tested bar by taking the brightness of each luminous point as a sample. The power is only tested, and the laser with poor facula is generally normal in power due to poor reciprocity between the facula and the power, so that the laser with poor facula cannot be screened out only by detecting the power.
However, the method has the defects that only the power brightness peak value is tested, no attention is paid to the imaging of the light spot, the light spot cannot be judged, and particularly, the 808 light spot cannot be seen by naked eyes and poor bars of the light spot cannot be removed.
Disclosure of Invention
In order to solve the problems, the invention provides a device for screening 808nm laser bars through light spots;
the invention also provides a working method of the device.
The technical scheme of the invention is as follows:
a device for screening 808nm laser bars through light spots comprises a laser bar, a test platform, a test probe and an imaging component; the testing platform upside is provided with the stick, and the stick upper end is provided with the test probe, and the stick is provided with the formation of image subassembly along light emission route, and the formation of image subassembly is used for forming images the facula.
Preferably, the imaging assembly comprises white paper and a camera; the white paper and the camera are sequentially arranged along the light emitting direction; the camera is connected with a computer; the white paper and the camera are both arranged on the bracket.
The 808nm laser has higher power and more concentrated energy density, and the direct camera is easy to damage. The laser is also applied to the white paper, because the energy density of the laser is concentrated, and light spots can be directly displayed on the white paper.
Preferably, the batten, the white paper and the camera are positioned on the same horizontal plane.
Preferably, the N-side of the bar is in contact with the test platform and the P-side is in contact with the test probe.
Preferably, the test platform is connected with a power supply.
Preferably, the test platform is a copper block.
Optionally, the bars are 808 laser bars.
A device for screening 808nm laser bars through light spots and a working method thereof comprise the following steps:
(1) connecting a camera with a computer, and capturing light spots by using the camera;
(2) connecting the strap binding platform with a power supply, wherein the working current is 250 mA;
(3) placing the N surface of the 808 laser bar on a bar binding platform, and contacting the probe with the P surface;
(4) and (3) binding and measuring 808 laser bars on a bar binding and measuring platform, wherein a light outlet is aligned with a piece of white paper:
(5) the camera is parallel to the white paper;
(6) the light spot of the 808 laser is emitted to the white paper, and the camera is aligned to the light spot pattern;
(7) the staff judges the condition of facula through the facula figure on the computer, rejects the barre of bad facula.
The invention has the beneficial effects that:
1. the device can be used for judging the light spot imaging of the laser bar, is particularly suitable for 808nm laser bars, screens poor light spot bars through light spot judgment, eliminates batches with high poor light spot proportion, improves the output rate of 808nm laser packaging, and reduces the production cost.
2. The imaging assembly provided by the invention consists of white paper and the camera, and can be safely applicable to laser light with higher power, and light spots are displayed on the white paper without damaging the camera.
Drawings
FIG. 1 is a schematic structural view of the present invention;
FIG. 2 is an observation of qualified rowbar spots;
FIG. 3 is an observation of qualified rowbar spots;
FIG. 4 is an observation of a failed swath spot;
FIG. 5 is an observation of a failed swath spot;
in the figure, 1, a laser bar, 2, a test platform, 3, a test probe, 4, a camera, 5, white paper, 6 and a support.
Detailed Description
The present invention will be further described by way of examples, but not limited thereto, with reference to the accompanying drawings.
Example 1:
a device for screening 808nm laser bars through light spots comprises a laser bar, a test platform, a test probe and an imaging component; the test platform is connected with a power supply; the test platform is a copper block; the upper side of the test platform is provided with a bar, the bar is a 808 laser bar, the N surface of the bar is in contact with the test platform, and the P surface of the bar is in contact with the test probe; the upper end of the bar is provided with a test probe, the bar is provided with an imaging component along a light emission path, and the imaging component is used for imaging the light spots; the imaging assembly comprises white paper and a camera; the white paper and the camera are both arranged on the bracket and are sequentially arranged along the light emission direction; the camera is connected with a computer; the batten, the white paper and the camera are positioned on the same horizontal plane; the staff judges the condition of the light spot through the light spot graph on the computer and rejects the bars of bad light spots; as shown in fig. 2 and fig. 3, the light spots of the qualified barnacles can be seen clearly and brightly; fig. 4 and 5 show light spots of unqualified bars, and it can be seen that the light spots have obvious bar shadows, so that a worker can select a bar batch with a poor light spot, the subsequent yield of 808 laser package is improved, and the production cost is reduced.
Example 2:
the structure of the device for screening the 808nm laser bars through the light spots and the working method are shown in embodiment 1, and the device comprises the following specific steps:
(1) connecting a camera with a computer, and capturing light spots by using the camera;
(2) connecting the test platform with a power supply, wherein the working current is 250 mA;
(3) placing the laser bars on a test platform;
(4) contacting the 808 laser bars on the test platform through probes, wherein the 808 laser bars emit light, and a light outlet is aligned to a piece of white paper;
(5) the camera is parallel to the white paper;
(6) the light spot of the 808 laser is emitted to the white paper, and the camera is aligned to the light spot pattern;
(7) the staff judges the condition of facula through the facula figure on the computer, rejects the barre of bad facula.
The above description is only a preferred embodiment of the present invention, but the scope of the present invention is not limited thereto, and all equivalent structures or equivalent flow transformations made by using the contents of the present specification and the drawings, or directly or indirectly applied to other related technical fields, are included in the scope of the present invention.
Claims (9)
1. The utility model provides a device of 808nm laser instrument barre is screened through facula which characterized in that: the device comprises a laser bar, a test platform, a test probe and an imaging component; the testing platform upside is provided with the stick, and the stick upper end is provided with the test probe, and the stick is provided with the formation of image subassembly along light emission route, and the formation of image subassembly is used for forming images the facula.
2. The apparatus of claim 1, wherein the apparatus for spot screening 808nm laser bars comprises: the imaging assembly comprises white paper and a camera; the white paper and the camera are sequentially arranged along the light emitting direction; the camera is connected with a computer.
3. The apparatus of claim 2, wherein the apparatus for spot screening 808nm laser bars comprises: the white paper and the camera are both arranged on the bracket.
4. The apparatus of claim 2, wherein the apparatus for spot screening 808nm laser bars comprises: the batten, the white paper and the camera are positioned on the same horizontal plane.
5. The apparatus of claim 1, wherein the apparatus for spot screening 808nm laser bars comprises: the N surface of the bar is contacted with the test platform, and the P surface of the bar is contacted with the test probe.
6. The apparatus of claim 1, wherein the apparatus for spot screening 808nm laser bars comprises: the test platform is connected with a power supply.
7. The apparatus of claim 1, wherein the apparatus for spot screening 808nm laser bars comprises: the test platform is a copper block.
8. The apparatus of claim 1, wherein the apparatus for spot screening 808nm laser bars comprises: the bars are 808 laser bars.
9. A method of operating an apparatus for spot screening 808nm laser bars according to claim 2, comprising the steps of:
(1) connecting a camera with a computer, and capturing light spots by using the camera;
(2) connecting the test platform with a power supply, wherein the working current is 250 mA;
(3) placing the laser bars on a test platform;
(4) contacting the 808 laser bars on the test platform through the probes, wherein the 808 laser bars emit light, and the light outlet is aligned to a piece of white paper:
(5) the camera is parallel to the white paper;
(6) the light spot of the 808 laser is emitted to the white paper, and the camera is aligned to the light spot pattern;
(7) the staff judges the condition of facula through the facula figure on the computer, rejects the barre of bad facula.
Priority Applications (1)
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CN201911018870.0A CN112713494A (en) | 2019-10-24 | 2019-10-24 | Device for screening 808nm laser device bars through light spots and working method |
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Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH05203843A (en) * | 1992-01-29 | 1993-08-13 | Fujitsu Ltd | Optical array module |
CN1821798A (en) * | 2006-02-13 | 2006-08-23 | 长春理工大学 | Semiconductor laser near and far field distribution observation device |
CN101515701A (en) * | 2009-04-07 | 2009-08-26 | 中国科学院长春光学精密机械与物理研究所 | Wavelength filtering device of semiconductor laser |
CN207691193U (en) * | 2017-12-05 | 2018-08-03 | 山东华光光电子股份有限公司 | A kind of laser diode hot spot device for sorting |
CN208420674U (en) * | 2018-08-10 | 2019-01-22 | 拓闻(天津)电子科技有限公司 | Low-power semiconductor laser testing equipment |
-
2019
- 2019-10-24 CN CN201911018870.0A patent/CN112713494A/en active Pending
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH05203843A (en) * | 1992-01-29 | 1993-08-13 | Fujitsu Ltd | Optical array module |
CN1821798A (en) * | 2006-02-13 | 2006-08-23 | 长春理工大学 | Semiconductor laser near and far field distribution observation device |
CN101515701A (en) * | 2009-04-07 | 2009-08-26 | 中国科学院长春光学精密机械与物理研究所 | Wavelength filtering device of semiconductor laser |
CN207691193U (en) * | 2017-12-05 | 2018-08-03 | 山东华光光电子股份有限公司 | A kind of laser diode hot spot device for sorting |
CN208420674U (en) * | 2018-08-10 | 2019-01-22 | 拓闻(天津)电子科技有限公司 | Low-power semiconductor laser testing equipment |
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