CN114018960B - Defect analysis device based on X-ray flaw detection image - Google Patents
Defect analysis device based on X-ray flaw detection image Download PDFInfo
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- CN114018960B CN114018960B CN202210003482.0A CN202210003482A CN114018960B CN 114018960 B CN114018960 B CN 114018960B CN 202210003482 A CN202210003482 A CN 202210003482A CN 114018960 B CN114018960 B CN 114018960B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
Abstract
The invention relates to the technical field of nondestructive testing, in particular to a defect analysis device based on an X-ray flaw detection image. The detection platform comprises a focusing mirror and a transmission light receiver which are arranged in the detection platform, the detection platform is horizontally fixed on a rotating shaft of a first rotating motor, the first rotating motor is vertically fixed on a lifting platform below the first rotating motor, and the lifting platform is fixed on a lifting mechanism. An X-ray gun is fixed above the detection platform, and the X-ray gun is obliquely towards the upper surface of the detection platform. First rotating electrical machines, elevating system, X ray rifle all are connected with the switch board. The reflected light receiver is arranged above the detection table and is positioned on the opposite side of the X-ray gun. The transmission light receiver and the reflection light receiver are both connected with an imaging and analyzing system. The analysis device can perform transmission and reflection light imaging on the same measurement position, effectively improves the resolution ratio of the defect image, can automatically finish the classification of the defect type, and effectively improves the detection efficiency.
Description
Technical Field
The invention relates to the technical field of nondestructive testing, in particular to a defect analysis device based on an X-ray flaw detection image.
Background
The following in the background art merely refers to information that is understood by the inventor to be relevant to the present invention and is intended to augment understanding of the present invention through a description of some basic technical knowledge related to the present invention, which information does not necessarily have to constitute knowledge that is well known by those of ordinary skill in the art.
X-ray inspection is a nondestructive inspection method for finding defects by utilizing the property that X-rays can penetrate and have attenuation in a substance. X-ray flaw detection has the advantages of high sensitivity, suitability for detecting internal defects of various materials, and the like, and has been widely applied to quality detection of various instruments and devices. Although the X-ray is transmitted in a straight line at the speed of light and is not influenced by an electric field and a magnetic field, the X-ray is attenuated in the process of penetrating substances, and if defects such as cracks, holes, slag inclusion and the like are encountered, dark shadow areas are displayed on the negative film. Based on this, the essence of X-ray flaw detection is that the intensity difference of the radiation after penetrating the workpiece is caused according to the different attenuation degrees of the radiation energy between the workpiece to be detected and the internal defect medium of the workpiece, so that a latent image generated by the defect projection is obtained on the photosensitive material, the latent image is further processed in a darkroom to obtain a defect image, and then the property of the internal defect of the workpiece and the grade of a negative film are evaluated according to the standard.
Based on the above principle and technical guidance, the current X-ray inspection apparatus generally only adopts and collects transmitted X-ray information for imaging. However, the imaging resolution is not ideal in the method, and the problem of large error is caused in the subsequent defect grading process, so that the accuracy of part quality evaluation is affected.
Disclosure of Invention
In view of the above problems, the present invention provides a defect analysis device based on X-ray flaw detection images, which can perform both transmission light imaging and reflection light imaging on the same measurement position, thereby effectively improving the resolution of the defect images, and can automatically classify the types of defects, thereby effectively improving the detection efficiency. In order to achieve the purpose, the invention adopts the following technical scheme.
A defect analysis apparatus based on X-ray inspection images, comprising: the device comprises a detection table, a focusing mirror, a transmission light receiver, a first rotating motor, a lifting platform, a lifting mechanism, an X-ray gun, a control cabinet, a reflection light receiver and an imaging and analyzing system. Wherein: an inner cavity is formed in the detection table, the focusing mirror and the transmission light receiver are fixed in the inner cavity, and the transmission light receiver is located under the focusing mirror. The detection platform is horizontally fixed on a motor shaft of the first rotating motor, the first rotating motor is vertically fixed on a lifting platform below the first rotating motor, and the lifting platform is fixed on the lifting mechanism. The X-ray gun is fixed above the detection platform, and the X-ray gun faces the upper surface of the detection platform in an inclined mode. The first rotating motor, the lifting mechanism and the X-ray gun are all connected with the control cabinet. The reflected light receiver is arranged above the detection table and is positioned on the opposite side of the X-ray gun so as to receive reflected light. And the transmission light receiver and the reflection light receiver are both connected with the imaging and analyzing system so as to convert the received light into a visual image and analyze the defect type.
In a further technical scheme, the imaging and analyzing system comprises an imaging module, an image collecting module, an analyzing module and a storage module. Wherein: the imaging module is used for imaging light signals collected by the transmission light receiver and the reflection light receiver, and the image collecting module is used for collecting images from the imaging module and transmitting the images to the analyzing module for defect identification and classification. The storage module is connected with the analysis module and is used for storing the analysis result given by the analysis module.
In a further technical solution, the imaging and analyzing system further includes a display, and the display is used for displaying a visual analysis image, such as a detection image of a detected workpiece, a defect type, and the like, for a detection person to observe.
In a further technical scheme, the analysis module is provided with a convolutional neural network model for classifying the defects of the image, and the convolutional neural network model can identify and classify the X-ray information input by the image collection module, match the X-ray information with the corresponding defect type and grade, transmit the X-ray information to the storage module for storage, and transmit the X-ray information to the display for display.
In a further technical scheme, the lifting mechanism comprises any one of an air cylinder, a hydraulic cylinder, a screw rod mechanism and the like, so that the lifting platform is driven to lift, the distance between the detection platform and the X-ray gun can be changed by lifting the lifting platform, and the irradiation position of the X-ray on the detected workpiece on the detection platform is further changed.
In a further technical scheme, the screw mechanism comprises a second rotating motor, a fixing plate, a supporting rod, a screw hole plate, a screw rod and a guide rod. Wherein: the utility model discloses a motor, including first rotating electrical machines, bracing piece, screw hole board, second rotating electrical machines, fixed plate level, the vertical setting of second rotating electrical machines, the fixed plate level is fixed on the up end of the motor shaft of second rotating electrical machines, the bracing piece is vertical to be fixed on the fixed plate, the top at the bracing piece is fixed to the screw hole board level, screw rod threaded connection is in the screw of screw hole board, and the screw rod sets up with the motor shaft is coaxial of second rotating electrical machines. The two guide rods are vertically fixed on two sides of the second rotating motor respectively, and the upper ends of the guide rods penetrate through the lifting platform and are in sliding connection with the lifting platform.
In a further technical scheme, the X-ray inspection device further comprises a collimator which is connected to the light ray exit of the X-ray gun, and the collimator slantly faces the upper surface of the inspection table. The collimator can enhance X-rays emitted by the X-ray gun, can correct and collect the X-rays, generates high-density X-ray beams and improves imaging resolution.
In a further technical scheme, a wireless transmission module connected with the transmission light receiver is arranged in an inner cavity of the detection table, so that transmission light signals received by the transmission light receiver are wirelessly transmitted to an imaging and analyzing system.
In a further technical scheme, the reflected light receiver is connected with a wireless transmission module, and the wireless transmission module is used for wirelessly transmitting the reflected light signal received by the reflected light receiver to the imaging and analyzing system.
In a further technical scheme, still include the protective housing, examine test table, focusing mirror, transmission light receiver, first rotating electrical machines, lift platform, elevating system, X ray rifle, reflection light receiver and all be located in the protective housing to reduce revealing of X ray, reduce the influence to the staff.
Based on the technical scheme, the defect analysis device disclosed by the invention can at least produce the following beneficial effects:
(1) The defect analysis device based on the X-ray flaw detection image simultaneously adopts the transmission light receiver and the reflection light receiver to respectively receive the transmission light and the reflection light which pass through the detected workpiece, so that the two lights can be utilized to respectively image, and further, the condition inside the workpiece is comprehensively reflected through the two images, so that the imaging resolution ratio is higher, the detection result is more accurate, the defect condition in the workpiece can be more accurately judged, and the problems of unsatisfactory imaging resolution ratio and larger detection result error caused by the fact that the conventional X-ray flaw detection device only adopts and collects the transmitted X-ray information to image generally are solved.
(2) The defect analysis device based on the X-ray flaw detection image adopts an imaging and analysis system comprising an imaging module, an image collection module, an analysis module and a storage module, wherein the analysis module is internally provided with a convolutional neural network model for classifying the defects of the image, and the convolutional neural network model can automatically match the received image with the data of the defect image by utilizing the neural network model with high accuracy, so as to classify the data according to the data, automatically finish the classification of the defect type and effectively improve the detection efficiency.
(3) The defect analysis device based on the X-ray flaw detection image, disclosed by the invention, has the advantages that the focusing lens and the transmission light receiver are arranged in the inner cavity of the detection platform, and then the first rotating motor and the lifting platform are utilized to realize the rotation and lifting of the detection platform, and the defect analysis device based on the X-ray flaw detection image has the advantages that: in order to ensure the accurate measurement of the X-ray gun, the X-ray gun is fixed above the detection table, which leads to the problem of how to realize the overall detection of the workpiece to be detected on the detection table. Therefore, the invention ensures that the position relation between the workpiece to be detected and the focusing mirror does not move due to the movement of the detection platform by arranging the focusing mirror and the transmission light receiver in the device, and ensures the smooth proceeding and the accuracy of the detection. Meanwhile, the first rotating motor is used for ensuring that the detection table carries the workpiece to be detected to rotate, so that the detection of the workpiece on the detection table within the same radius range is realized, but the whole detection of the whole workpiece to be detected cannot be finished yet.
Drawings
The accompanying drawings, which are incorporated in and constitute a part of this specification, are included to provide a further understanding of the invention, and are included to illustrate an exemplary embodiment of the invention and not to limit the invention.
Fig. 1 is a schematic structural diagram of a defect analysis apparatus based on an X-ray inspection image according to an embodiment of the present invention.
Fig. 2 is a schematic structural diagram of an imaging and analysis system in an embodiment of the invention.
FIG. 3 is a schematic diagram of the structure of the inspection station and its accessories in the embodiment of the present invention.
Fig. 4 is a schematic structural diagram of the lifting mechanism in the embodiment of the present invention.
The labels in the figures represent: 1-detection table, 2-focusing mirror, 3-transmission light receiver, 4-first rotating motor, 5-lifting platform, 6-lifting mechanism, 6.1-second rotating motor, 6.2-fixing plate, 6.3-supporting rod, 6.4-screw hole plate, 6.5-screw rod, 6.6-guide rod, 7-X ray gun, 8-control cabinet, 9-reflection light receiver, 10-imaging and analyzing system, 10.1-imaging module, 10.2-image collecting module, 10.3-analyzing module, 10.4-storage module, 10.5-display, 11-supporting ring, 12-groove and 13-collimator.
Detailed Description
It is to be understood that the following detailed description is exemplary and is intended to provide further explanation of the invention as claimed. Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs.
In the description of the present invention, the terms "lateral," "longitudinal," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," and the like are used in a generic and descriptive sense only and not for purposes of limitation, the terms "horizontal," "top," "bottom," "inner," "outer," and the like are used in the generic and descriptive sense only and not for purposes of limitation, the referenced devices or elements being oriented in a particular orientation for purposes of construction and operation, and thus are not to be construed as limiting the claimed invention.
In addition, the terms "mounted," "connected," "secured," and the like, as used herein, are intended to be broadly construed. For example, the connection can be fixed, detachable or integrated; the two components can be connected mechanically, directly or indirectly through an intermediate medium, or connected internally or in an interaction relationship, and the specific meaning of the terms in the present invention can be understood by those skilled in the art according to specific situations. The technical scheme of the invention is further explained by combining the drawings and the embodiments in the specification.
Referring to fig. 1 and 2, a defect analysis apparatus based on X-ray inspection images for the illustrated example is an assembly including a plurality of elements, and belongs to the field of industrial inspection equipment. The main structure of the analysis device is designed vertically so as to ensure that a workpiece to be detected can be placed in the defect analysis device for detection. Specifically, the defect analysis device includes: detect platform 1, focusing mirror 2, transmission light receiver 3, first rotating electrical machines 4, lift platform 5, elevating system 6, X ray rifle 7, switch board 8, reflection light receiver 9 and formation of image and analytic system 10, wherein:
examine test table 1, focusing mirror 2, transmission light receiver 3, first rotating electrical machines 4, lift platform 5, elevating system 6, X ray rifle 7, reflection light receiver 9 and all be located the protective housing, the protective housing is plumbous system case to reduce X ray and reveal, cause the injury to the staff.
Detect platform 1 and be box-type or box-type structure, have the inner chamber promptly, focusing mirror 2 and transmission light receiver 3 are all fixed in detecting the inner chamber of platform 1, wherein, transmission light receiver 3 is located focusing mirror 2 under, just focusing mirror 2 bonds on support ring 11, just the inboard edge of support ring 11 is concave surface form, so that with the lower surface edge laminating of focusing mirror 2 makes focusing mirror 2 installs and fixes on support ring 11 more steadily. The focusing mirror 2 and the transmission light receiver 3 are arranged in the device, so that the position relation between the detected workpiece and the focusing mirror 2 is not changed due to the movement of the detection table 1, and the detection accuracy is ensured. In another preferred embodiment, referring to fig. 3, the upper surface of the inspection table 1 further has a groove 12 to restrain the workpiece on the inspection table 1 during rotation, which helps to prevent the workpiece from falling off accidentally.
In addition, based on the above description, it should be understood that the defect analysis apparatus of the present embodiment is more suitable for the detection of disc-like, ring-like workpieces, etc., which require a large detection surface, and the defect analysis apparatus of the present embodiment can realize the overall detection of such workpieces by the rotation and the elevation of the detection table 1.
Continuously, the first rotating motor 4 is vertically fixed on the lifting platform 5 below the first rotating motor 4, that is, the motor shaft of the first rotating motor 4 is vertically upward, and the detection table 1 is horizontally fixed on the upper end surface of the motor shaft of the first rotating motor 4. The lifting platform 5 is fixed on the lifting mechanism 6, the lifting mechanism 6 is an air cylinder, or can also be a hydraulic cylinder or other mechanisms with lifting functions, so that the lifting platform 5 is driven to lift, and the problem that the whole workpiece to be detected cannot be comprehensively detected by some conventional detection devices is solved. The first rotating motor 4 is used for ensuring that the detection table 1 rotates with the workpiece to be detected, so that the X-ray gun 7 scans the surface of the workpiece within the radius of the range A, but the detection of the whole workpiece to be detected cannot be finished.
Therefore, the distance between the detected workpiece and the X-ray gun 7 is changed by the lifting platform 5 in the embodiment, the drop point of the X-ray on the upper surface of the detected workpiece is further changed, along with the reduction of the distance, the drop point is closer to the edge of the detected workpiece, otherwise, the drop point is closer to the center of the detected workpiece, so that when the detection in the same radius range is completed, the height of the lifting platform 5 is adjusted to perform the detection in another radius range (such as B, B is not equal to A), the switching between the detection and the radius range can be automatically completed by setting the parameters of the control cabinet 8, and the problem of comprehensively detecting the detected workpiece on the detection table 1 is well solved.
Further, with reference to fig. 1, the X-ray gun 7 is fixed above the detection platform 1, and the X-ray gun 7 is inclined toward the upper surface of the detection platform 1, and the specific inclination angle of the X-ray gun 7 is not particularly limited, and may be set according to actual needs, because the inclination angle of the X-ray gun 7 mainly determines the irradiation landing point of the X-ray on the upper surface of the detection platform 1, and the irradiation landing point is closer to the center of the upper surface of the detection platform 1 when the inclination angle is larger, and is closer to the edge of the upper surface of the detection platform 1 when the inclination angle is smaller. However, since the height of the inspection table 1 in this embodiment is adjustable, the irradiation landing point of the X-ray on the upper surface of the inspection table 1 can be changed, and therefore, the inclination angle of the X-ray gun 7 can be adjusted by changing the height of the inspection table 1 when it is not appropriate.
The first rotating motor 4, the lifting mechanism 6 and the X-ray gun 7 are all connected with the control cabinet 8. The reflected light receiver 9 is arranged above the detection table 1 and is positioned at the opposite side of the X-ray gun 7 so as to receive reflected light. In a preferred embodiment, the receiving surface of the reflected light receiver 9 is an arc-shaped surface, so as to receive the reflected X-rays more comprehensively and improve the detection accuracy. The defect analysis device of this embodiment has adopted transmission light receiver 3 and reflection light receiver 9 simultaneously and has received transmission light and reflection light through the work piece that is surveyed respectively to can utilize these two kinds of light to form images respectively, further synthesize the inside condition of reflection work piece through two kinds of formation of images, make the imaging resolution ratio higher, the testing result is more accurate.
The transmitted light receiver 3 and the reflected light receiver 9 are both connected to the imaging and analysis system 10 so as to convert the received light into a visual image and perform defect type analysis. Specifically, with reference to fig. 2, the imaging and analysis system 10 includes: an imaging module 10.1, an image collection module 10.2, an analysis module 10.3 and a storage module 10.4. The imaging module 10.1 is configured to image light signals collected by the transmission light receiver 3 and the reflection light receiver 9, the image collecting module 10.2 is configured to collect an image from the imaging module 10.1 and transmit the image to the analyzing module 10.3 for defect identification and classification, and the analyzing module 10.3 has a convolutional neural network model for defect classification of the image. The storage module 10.4 is used for storing the analysis result of the analysis module 10.3.
Further, the imaging and analysis system 10 includes a display 10.5 for displaying information retrieved from the storage module 10.4, such as the detected image of the workpiece under test, the type of defect, etc. The imaging and analysis system 10 of the embodiment can automatically match the received image with the corresponding defect type and level by using a high-accuracy neural network model, automatically complete classification of the defect type, then transmit the defect type to the storage module for storage, transmit the defect type to the display for display, and classify according to the defect type, thereby effectively improving the detection efficiency.
In another preferred embodiment, the detection table 1 has a wireless transmission module in its inner cavity connected to the transmitted light receiver 3, so as to transmit the transmitted light signal received by the transmitted light receiver 3 to the imaging and analysis system 10 wirelessly. Similarly, the reflected light receiver 9 is connected to a wireless transmission module, and the wireless transmission module is used for wirelessly transmitting the reflected light signal received by the reflected light receiver 9 to the imaging and analyzing system 10, so as to remove unnecessary cables, and make the structure of the defect analyzing apparatus based on the X-ray flaw detection image more compact.
As mentioned above, the lifting mechanism 6 may also be a hydraulic cylinder or other mechanism with a lifting function, so as to drive the lifting platform 5 to lift, thereby solving the problem that some existing detection devices of this kind cannot complete the overall detection of the whole detected workpiece. Referring to fig. 4, which illustrates another structure of the lifting mechanism 6, specifically, the screw mechanism 6 includes: second rotating electrical machines 6.1, fixed plate 6.2, bracing piece 6.3, screw plate 6.4, screw rod 6.5 and guide arm 6.6, wherein:
the second rotating electrical machine 6.1 is arranged vertically, i.e. the motor shaft of the second rotating electrical machine 6.1 is arranged vertically upwards. The fixed plate 6.2 is horizontally fixed on the upper end face of a motor shaft of the second rotating motor 6.1, the number of the support rods 6.3 is two, the support rods are vertically fixed on two sides of the fixed plate 6.2 respectively, the screw hole plate 6.4 is horizontally fixed on the top end of the support rod 6.3, the screw rod 6.5 is in threaded connection with a screw hole in the center of the screw hole plate 6.4, the screw rod 6.5 is located between the two support rods 6.3, and the screw rod 6.5 and the motor shaft of the second rotating motor 6.1 are coaxially arranged to prevent eccentric motion during rotation and are not beneficial to detection.
The number of the guide rods 6.6 is two, the two guide rods are respectively and vertically fixed on two sides of the second rotating motor 6.1, and the upper end of the guide rod 6.6 penetrates through the lifting platform 5 and is in sliding connection with the lifting platform. The screw hole plate 6.4 is driven by the second rotating motor 6.1 to rotate relative to the screw rod 6.5, but the screw rod 6.5 and the lifting platform 5 cannot rotate under the constraint of the guide rod 6.6 and can only slide up and down along the guide rod 6.6, so that the lifting of the lifting platform 5 is realized.
With continued reference to fig. 1, in another preferred embodiment, the defect analyzing apparatus further comprises a collimator 13 connected to the light exit of the X-ray gun 7, and the collimator 13 is inclined toward the upper surface of the inspection table 1. The collimator 13 can enhance the X-ray emitted by the X-ray gun 7, correct and collect the X-ray, generate a high-density X-ray beam, and improve the imaging resolution.
Finally, it should be understood that any modifications, equivalents, improvements, etc. made within the spirit and principle of the present invention should be included in the protection scope of the present invention. Although the embodiments of the present invention have been described with reference to the accompanying drawings, it is not intended to limit the scope of the invention, and it should be understood by those skilled in the art that various modifications and variations can be made without inventive changes in the technical solutions of the present invention.
Claims (6)
1. A defect analysis apparatus based on an X-ray inspection image, comprising: detect platform, focusing mirror, transmission light receiver, first rotating electrical machines, lift platform, elevating system, X ray rifle, switch board, reflection light receiver and formation of image and analytic system, wherein: the detection table is internally provided with an inner cavity, a focusing lens and a transmission light receiver are arranged in the inner cavity, and the transmission light receiver is positioned right below the focusing lens; the detection platform is horizontally fixed on a rotating shaft of a first rotating motor, the first rotating motor is vertically fixed on a lifting platform below the first rotating motor, and the lifting platform is fixed on a lifting mechanism; the X-ray gun is fixed above the detection platform, and the X-ray gun obliquely faces to the upper surface of the detection platform; the first rotating motor, the lifting mechanism and the X-ray gun are all connected with the control cabinet; the reflected light receiver is arranged above the detection table and is positioned on the opposite side of the X-ray gun; the transmission light receiver and the reflection light receiver are both connected with the imaging and analyzing system;
the X-ray gun further comprises a collimator which is connected to the light ray exit of the X-ray gun and obliquely faces the upper surface of the detection table;
the X-ray detection device comprises a detection table, a focusing mirror, a transmission light receiver, a first rotating motor, a lifting platform, a lifting mechanism, an X-ray gun and a reflection light receiver, and is characterized by further comprising a protective shell, wherein the detection table, the focusing mirror, the transmission light receiver, the first rotating motor, the lifting platform, the lifting mechanism, the X-ray gun and the reflection light receiver are all located in the protective shell;
the receiving surface of the reflected light receiver is an arc-shaped surface;
elevating system is screw mechanism, and it includes: the second rotating motor, the fixing plate, the supporting rod, the screw hole plate, the screw rod and the guide rod; wherein: the second rotating motor is vertically arranged, the fixing plate is horizontally fixed at the upper end of a motor shaft of the second rotating motor, the supporting rod is vertically fixed on the fixing plate, the screw hole plate is horizontally fixed at the top end of the supporting rod, the screw rod is in threaded connection with the screw hole of the screw hole plate, and the screw rod and the motor shaft of the second rotating motor are coaxially arranged; the two guide rods are vertically fixed on two sides of the second rotating motor respectively, and the upper ends of the guide rods penetrate through the lifting platform and are in sliding connection with the lifting platform.
2. The apparatus of claim 1, wherein the imaging and analyzing system comprises an imaging module, an image collecting module, an analyzing module and a storage module, wherein the imaging module is used for imaging the light signals collected by the transmitted light receiver and the reflected light receiver, the image collecting module is used for collecting the images from the imaging module and transmitting the images to the analyzing module for defect identification and classification, and the storage module is connected to the analyzing module.
3. The apparatus of claim 2, wherein the analysis module comprises a convolutional neural network model for classifying the defects of the image.
4. The apparatus of claim 2, wherein the imaging and analysis system further comprises a display for displaying the information retrieved from the storage module.
5. The apparatus of claim 1, wherein the inspection station has a wireless transmission module in its interior for transmitting information to the imaging and analysis system and for connecting to the transmitted light receiver.
6. The apparatus of claim 5, wherein the reflected light receiver is connected to a wireless transmission module for wirelessly transmitting the reflected light signal received by the reflected light receiver to the imaging and analysis system.
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN104515787A (en) * | 2013-09-27 | 2015-04-15 | 天津欣维检测技术有限公司 | High-energy X-ray non-destructive detection apparatus |
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-
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Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
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Non-Patent Citations (2)
| Title |
|---|
| X射线实时成像检测系统中定位拾取装置的设计与应用;李芳等;《无损探伤》;20191225(第06期);全文 * |
| X射线束垂直透照被检区域中心的测量方法;王为民;《无损检测》;19901215(第12期);全文 * |
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