CN219369921U

CN219369921U - Jig dial device for optimizing smoothness of probe and four-wire test PASS range

Info

Publication number: CN219369921U
Application number: CN202223234922.8U
Authority: CN
Inventors: 赵志刚; 文东升
Original assignee: Suzhou Kelinyuan Electronic Co ltd
Current assignee: Suzhou Kelinyuan Electronic Co ltd
Priority date: 2022-11-29
Filing date: 2022-11-29
Publication date: 2023-07-18
Anticipated expiration: 2032-11-29

Abstract

The utility model discloses a jig dial device for optimizing probe smoothness and four-wire test PASS range, which belongs to the technical field of PCB board electric testing and comprises a jig dial, wherein at least one pair of mounting holes are formed in the jig dial, at least one pair of mounting holes are obliquely arranged in an splayed shape, and probes are mounted on the mounting holes. The probe track of the four-wire test PASS probe has an inner splayed state, and the probe contacts the circuit board to be tested at a position which is more inner, so that the four-wire test PASS range is enlarged, and the occurrence of the condition that the probe in the prior art is stuck with a needle can be avoided.

Description

Jig dial device for optimizing smoothness of probe and four-wire test PASS range

Technical Field

The utility model relates to the technical field of PCB board electric testing, in particular to a jig dial device for optimizing probe smoothness and four-wire test PASS range.

Background

In the existing PCB manufacturing process, after the outer layer circuit is completed, it is generally required to detect whether the circuit is turned on or not and the resistance value is abnormal, and the existing test fixture mainly includes two kinds of components: a two-wire test fixture is characterized in that 1 probe is arranged on two bonding pads to be tested in the same network, the two probes are respectively connected to two ends of a power supply, an ammeter is connected in series in the circuit, and the ammeter is connected between the two probes in parallel, so that whether a circuit is conducted or not can be detected, the problem of abnormal circuit resistance caused by poor copper thickness cannot be detected, and the test precision is only 1 omega; the other is a four-wire test fixture, two probes are arranged on two to-be-tested bonding pads in the same network, one of the two probes on the same bonding pad is connected to a power supply, and the other probe is connected to a voltmeter, so that whether a circuit is conducted or not can be tested, and meanwhile, the problem of abnormal circuit resistance caused by poor copper thickness can be tested, and the precision can reach 1mΩ.

The existing probes are vertically arranged, drilling holes of the carrier plates are consistent, but the probes have a certain slope when in use, so that the problem of needle clamping occurs at a certain probability.

Disclosure of Invention

In order to overcome the defects of the prior art, the utility model aims to provide the jig dial device for optimizing the smoothness of the probe and the range of the four-wire test PASS, and the problem that the probe in the prior art is stuck can be avoided.

The utility model adopts the following technical scheme:

the utility model provides an optimize probe smoothness and four-wire test PASS within range's tool dial device, includes the tool dial, set up at least a pair of mounting hole on the tool dial, at least a pair of mounting hole is the slope of splayed form and arranges, install the probe on the mounting hole.

Further, the jig dial device further comprises a base, the base and the jig dial are arranged at intervals, and one end, away from the mounting hole, of the probe extends into the base and is electrically connected with the detection circuit in the base.

Further, the jig dial comprises a first carrier plate, a second carrier plate and a third carrier plate which are stacked, the mounting holes comprise a first drilling hole formed in the first carrier plate, a second drilling hole formed in the second carrier plate and a third drilling hole formed in the third carrier plate, and the holes of the first drilling hole, the second drilling hole and the third drilling hole are sequentially staggered.

Further, when the probe is 0.05mm, the values of the apertures of the first drilling hole, the second drilling hole and the third drilling hole are in the range of 0.057-0.063mm.

Further, when the probe is 0.05mm, the hole distances between the first drilling hole and the second drilling hole and the hole distances between the third drilling hole and the hole distances between the first drilling hole and the second drilling hole are 0.065-0.075mm.

Further, a first groove is formed in the bottom surface of the first carrier plate, and the first groove and the first drilling hole are coaxially arranged.

Further, a second groove is formed in the top surface of the second carrier plate, and the second groove and the second drilling hole are coaxially arranged.

Further, a third groove is formed in the bottom surface of the third carrier plate, and the third groove and the third drilling hole are coaxially arranged.

Compared with the prior art, the utility model has the beneficial effects that:

the probe track of the four-wire test PASS probe has an inner splayed state, and the probe contacts the circuit board to be tested at a position which is more inner, so that the four-wire test PASS range is enlarged, and the occurrence of the condition that the probe in the prior art is stuck with a needle can be avoided.

Drawings

FIG. 1 is a schematic diagram of a jig dial device for optimizing probe smoothness and four-wire test PASS range according to the present utility model;

fig. 2 is a partial enlarged view at a in fig. 1.

In the figure: 1. a first carrier plate; 101. a first borehole; 102. a first groove; 2. a second carrier plate; 201. a second borehole; 202. a second groove; 3. a third carrier plate; 301. a third borehole; 302. a third groove; 4. a circuit board to be tested; 5. a probe; 6. and (5) a base.

Detailed Description

The present utility model will be further described with reference to the accompanying drawings and detailed description, wherein it is to be understood that, on the premise of no conflict, the following embodiments or technical features may be arbitrarily combined to form new embodiments.

In the description of the present application, it should be understood that the terms "top," "bottom," "inner," "lower," and the like indicate an orientation or a positional relationship based on that shown in the drawings, and are merely for convenience of description and simplicity of description, and do not indicate or imply that the apparatus or elements in question must have a specific orientation, be configured and operated in a specific orientation, and thus should not be construed as limiting the present application.

The terms "first," "second," and "third" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defining "a first", "a second", or a third "may explicitly or implicitly include one or more such feature.

In the description of the present application, it should be noted that, unless explicitly specified and limited otherwise, the terms "mounted," "connected," and "connected" are to be construed broadly, and may be either fixedly connected, detachably connected, or integrally connected, for example; can be mechanically or electrically connected; can be directly connected or indirectly connected through an intermediate medium, and can be communication between two elements. The specific meaning of the terms in this application will be understood by those of ordinary skill in the art in a specific context.

The jig dial device for optimizing the smoothness of the probe and the range of the four-wire test PASS as shown in the figures 1-2 comprises a jig dial, wherein at least one pair of mounting holes are formed in the jig dial, the at least one pair of mounting holes are obliquely arranged in an splayed shape, and the probe 5 is arranged on each mounting hole; the track of the probe 5 is in an internal splayed state, and the position of the probe 5 contacting the circuit board 4 to be tested is more inward, so that the range of four-wire test PASS is enlarged, and the occurrence of the condition that the probe 5 is stuck in the prior art can be avoided.

As the preferred embodiment, the jig dial comprises a first carrier plate 1, a second carrier plate 2 and a third carrier plate 3 which are stacked, the mounting holes comprise a first drilling hole 101 formed in the first carrier plate 1, a second drilling hole 201 formed in the second carrier plate 2 and a third drilling hole 301 formed in the third carrier plate 3, the holes of the first drilling hole 101, the second drilling hole 201 and the third drilling hole 301 are sequentially staggered, when in processing, three carrier plates are respectively perforated, vertical drilling holes can be conveniently processed, and the holes of the three carrier plates are sequentially staggered, so that the probes 5 can be placed in a splayed shape, and the occurrence of the condition that the probes 5 in the prior art are blocked can be avoided.

Based on the structure, when the probe 5 is 0.05mm, the range of values of the apertures of the first drilling hole 101, the second drilling hole 201 and the third drilling hole 301 is 0.057-0.063mm, the range of values of the apertures of the first drilling hole 101, the second drilling hole 201 and the third drilling hole 301 is 0.065-0.075mm, the slope of the probe 5 is attached to the drill aperture of the dial of the four-wire test jig after structural optimization, the condition of occasionally clamping the probe can be avoided, and the aperture expansion of the second drilling hole 201 of the second carrier plate 2 improves the fault tolerance of drilling machining deviation.

On the basis of the structure, the bottom surface of the first carrier plate 1 is provided with a first groove 102, and the first groove 102 and the first drilling hole 101 are coaxially arranged; a second groove 202 is formed in the top surface of the second carrier plate 2, and the second groove 202 and the second drilling hole 201 are coaxially arranged; the third recess 302 has been seted up to the bottom surface of third carrier plate 3, and third recess 302 and the coaxial heart setting of third drilling 301 set up the recess respectively through the position of corresponding drilling on the carrier plate, can make things convenient for the accurate location punching of the drilling that corresponds respectively, can also avoid taking place the condition of probe 5 card needle.

On the basis of the structure, the jig dial device further comprises a base 6, the base 6 and the jig dial are arranged at intervals, corresponding drilling holes and grooves are also formed in the base 6, one end of the probe 5, which is far away from the mounting hole, extends into the drilling holes and grooves of the base 6, and is electrically connected with the detection circuit in the base 6, so that four-wire testing is achieved.

According to the jig dial device for optimizing the smoothness of the probe 5 and the range of the four-wire test PASS, the hole pitch and the hole position of the prior four-wire test jig dial are completely consistent, the problem that the probe is clamped occasionally due to the deviation of the hole position and the hole diameter of the three carrier plates exists, the slope of the probe 5 is attached to the hole pitch of the drill hole of the four-wire test jig dial after structural optimization, the condition of occasionally clamping the probe can be avoided, and the hole diameter of the second drill hole 201 of the second carrier plate 2 is enlarged to improve the fault tolerance of the drilling machining deviation.

The tracks of the probes 5 in the three carrier plates after the drill hole pitch of the four-wire test fixture dial is optimized show an internal splayed state, and the positions of the probes 5 contacting the circuit board 4 to be tested are more inward, so that the range of the four-wire test PASS is enlarged, and the needle printing condition of the probes 5 is optimized.

The above embodiments are only preferred embodiments of the present utility model, and the scope of the present utility model is not limited thereto, but any insubstantial changes and substitutions made by those skilled in the art on the basis of the present utility model are intended to be within the scope of the present utility model as claimed.

Claims

1. Optimize probe smoothness and four-wire test PASS within range's tool dial device, its characterized in that: the jig comprises a jig dial, at least one pair of mounting holes are formed in the jig dial, at least one pair of mounting holes are obliquely arranged in a splayed shape, and probes are mounted on the mounting holes.

2. The jig dial device for optimizing probe smoothness and four-wire test PASS range of claim 1, wherein: the jig dial device further comprises a base, the base and the jig dial are arranged at intervals, and one end, away from the mounting hole, of the probe extends into the base and is electrically connected with a detection circuit in the base.

3. The jig dial device for optimizing probe smoothness and four-wire test PASS range of claim 1, wherein: the jig dial comprises a first carrier plate, a second carrier plate and a third carrier plate which are stacked;

the mounting holes comprise a first drilling hole formed in the first carrier plate, a second drilling hole formed in the second carrier plate and a third drilling hole formed in the third carrier plate, and the holes of the first drilling hole, the second drilling hole and the third drilling hole are arranged in a staggered mode.

4. The jig dial device for optimizing probe smoothness and four-wire test PASS range of claim 3, wherein: when the probe is 0.05mm, the values of the apertures of the first drilling hole, the second drilling hole and the third drilling hole are in the range of 0.057-0.063mm.

5. The jig dial device for optimizing probe smoothness and four-wire test PASS range of claim 3 or 4, wherein: when the probe is 0.05mm, the hole distances between the first drilling hole and the second drilling hole and the hole distances between the second drilling hole and the third drilling hole are in the range of 0.065-0.075mm.

6. The jig dial device for optimizing probe smoothness and four-wire test PASS range of claim 3, wherein: the bottom surface of first carrier plate has seted up first recess, first recess with first drilling concentric setting.

7. The jig dial device for optimizing probe smoothness and four-wire test PASS range of claim 3, wherein: the top surface of the second carrier plate is provided with a second groove, and the second groove and the second drilling hole are coaxially arranged.

8. The jig dial device for optimizing probe smoothness and four-wire test PASS range of claim 3, wherein: and a third groove is formed in the bottom surface of the third carrier plate, and the third groove and the third drilling hole are coaxially arranged.