CN218239794U

CN218239794U - Sample platform control structure and control system, platform mechanism and microscopic imaging system

Info

Publication number: CN218239794U
Application number: CN202222118709.4U
Authority: CN
Inventors: 夏浩涵; 翟文龙
Original assignee: Shanghai Ruiyu Biotech Co Ltd
Current assignee: Shanghai Ruiyu Biotech Co Ltd
Priority date: 2022-08-11
Filing date: 2022-08-11
Publication date: 2023-01-06
Anticipated expiration: 2032-08-11

Abstract

The embodiment of the specification provides a microscopic imaging system. The microscopic imaging system includes a sample stage control structure and/or a platform mechanism for the microscopic imaging system. The sample stage control structure comprises a base, an X platform moving mechanism, a sample stage moving mechanism, a primary guide rail and a secondary guide rail. The platform mechanism for the microscopic imaging system comprises a sample table control structure, and further comprises a Y platform, a Y platform moving mechanism, a Z platform moving mechanism and an imaging device.

Description

Sample platform control structure and control system, platform mechanism and microscopic imaging system

Technical Field

The specification relates to the technical field of imaging equipment, in particular to a sample stage control structure, a control system, a platform mechanism and a microscopic imaging system.

Background

In microscopic observation applications, manual focusing or automatic focusing is generally used for imaging observation. The manual focusing is low in cost, but depends on experience, and the stability is poor; the automatic focusing depends on a complex control structure and algorithm, the space required by focusing is large, the equipment is large in size, the cost is high, the micro-operation needs the field operation of an experimenter, the time and the labor are wasted, and the experience is poor.

Therefore, it is desirable to provide a microscopic imaging system that can more simply and conveniently realize clear imaging.

SUMMERY OF THE UTILITY MODEL

One of the embodiments of the present specification provides a sample stage control structure, which includes a base, an X platform moving mechanism, a sample stage moving mechanism, a primary guide rail, and a secondary guide rail; the sample table is arranged on the X platform and is used for bearing the sample bearing device; the sample stage moving mechanism is used for driving the sample stage to move relative to the X platform through the primary guide rail; the X platform moving mechanism is used for driving the X platform to move relative to the base through the secondary guide rail; the effective stroke of the first-stage guide rail is L1, the effective stroke of the second-stage guide rail is L2, and the length of the second-stage guide rail is L3; the L1, the L2 and the L3 satisfy the condition: l3 is more than L1 and L2 is more than 2L3.

In some embodiments, the primary and secondary guideways have different accuracies; preferably, the first-stage guide rail is a linear guide rail, and the second-stage guide rail is a cross guide rail.

In some embodiments, the X stage movement mechanism and the sample stage movement mechanism have different control accuracies.

In some embodiments, the X stage moving mechanism includes an X stage driving part; the X platform drive division set up in on the base, X platform drive division with the X platform transmission is connected, the X platform with be equipped with between the base the second grade guide rail, X platform drive division is used for the drive the X platform passes through the second grade guide rail is relative the base removes.

In some embodiments, the sample stage moving mechanism comprises a sample stage drive; the sample platform driving part is arranged on the sample platform, the first-stage guide rail is arranged between the X platform and the sample platform, and the sample platform driving part is used for driving the sample platform to move through the first-stage guide rail relative to the X platform.

In some embodiments, the sample stage moving mechanism further comprises a position sensor for detecting that the sample stage reaches a set position.

One of the embodiments of the present specification provides a control system of a sample stage control structure as described above, including a controller, where the controller is configured to execute a control method of the sample stage control structure, where the control method includes: when a sample on the sample table is mounted/replaced, the sample table is controlled to move by a sample table moving mechanism; and when the sample is subjected to microscopic imaging, the X platform is controlled to move by the X platform moving mechanism.

One of the embodiments of the present specification provides a platform mechanism for a microscopic imaging system, including a sample stage control structure as described above.

In some embodiments, a Y stage and a Y stage moving mechanism are further included; the Y platform is connected with the base in a sliding mode, and the Y platform moving mechanism is used for driving the Y platform to move along a Y axis relative to the base.

In some embodiments, the X stage and the Y stage are not in the same plane.

In some embodiments, the platform structure further includes a Z platform and a Z platform moving mechanism, the Z platform and the Z platform moving mechanism are both disposed on the Y platform, the Z platform is disposed perpendicular to the Y platform, and the Z platform moving mechanism is configured to drive the Z platform to move along a Z axis.

In some embodiments, the platform mechanism further comprises an imaging device disposed on the Z-platform and the imaging device is disposed below the sample support device.

One of the embodiments of the present specification provides a microscopic imaging system, including the sample stage control structure as described above.

One of the embodiments of the present specification provides a microscopic imaging system including the stage mechanism for a microscopic imaging system as described above.

In some embodiments, the X stage moving mechanism, the Y stage moving mechanism, and the Z stage moving mechanism respectively include sensors for detecting displacements of the X stage, the Y stage, and the Z stage, respectively.

In some embodiments, the Y stage moving mechanism includes a Y stage driving part; the Y platform is provided with a sliding block, the base is provided with a sliding rail, and the Y platform driving part drives the Y platform to move along the Y axis relative to the base through the matching of the sliding block and the sliding rail.

In some embodiments, the Z stage moving mechanism comprises a Z stage drive and a first mounting block; the Z platform driving part is fixed on the first mounting block, the Z platform is arranged on the first mounting block in a sliding mode, and the Z platform driving part drives the Z platform to move relative to the first mounting block.

In some embodiments, the Z stage movement mechanism further comprises a second mounting block and a connecting plate; the second installation piece is fixed in the Y platform, first installation piece is located along the Z axle slides on the second installation piece, the connecting plate is fixed set up in first installation piece, one side of connecting plate through first elastomeric element with the second installation piece is connected, the opposite side of connecting plate is equipped with and is used for supplying the screw that imaging device's camera lens passed, first installation piece is located imaging device with between the first elastomeric element.

In some embodiments, the device further comprises a follow-up structure and a follow-up support, wherein the Z platform and the Z platform moving mechanism are arranged on the follow-up structure, the follow-up support is arranged on the Y platform, and the follow-up structure is movably connected with the follow-up support; the top end of the follow-up structure is abutted against the lower surface of the sample bearing device; the follow-up structure is used for keeping the distance between the imaging device and the lower surface of the sample bearing device.

In some embodiments, the microscopy imaging system further comprises a fixture in rolling contact with the sample support.

In some embodiments, the sample stage is provided with a guide block, and the fixing device can roll along the guide block.

In some embodiments, the guide block has an extension direction identical to a rolling direction of the fixture, and the guide block has a trapezoidal shape in a direction perpendicular to the extension direction of the guide block.

In some embodiments, the number of the guide blocks and the fixing devices is two, and the guide blocks and the fixing devices are respectively disposed on two sides of the sample carrier.

In some embodiments, the fixing device further comprises a guide shaft, the guide shaft is vertically arranged on the base or the X platform, the fixing device comprises a pressing block, and the guide shaft movably penetrates through the pressing block; the guiding axle is kept away from the one end of base is equipped with the retaining member, the cover is equipped with second elastomeric element on the guiding axle, second elastomeric element's one end with the briquetting butt, second elastomeric element's the other end with the retaining member butt.

In some embodiments, the guide shaft is a telescopic shaft capable of telescoping.

In some embodiments, the microscopic imaging system further comprises a pressure sensor for detecting a pressure of the second elastic member.

In some embodiments, a control system is also included; the control system comprises a communication device and a controller, wherein the communication device is used for receiving instructions, and the controller is used for respectively controlling the sample stage, the X platform, the Y platform and the Z platform to move according to the instructions and controlling the imaging device to image.

Drawings

The present description will be further explained by way of exemplary embodiments, which will be described in detail by way of the accompanying drawings. These embodiments are not intended to be limiting, and in these embodiments like numerals refer to like structures, wherein:

FIG. 1 is a schematic block diagram of a microscopy imaging system according to some embodiments described herein;

FIG. 2 is a schematic diagram of a portion of a microscope imaging system according to some embodiments herein;

FIG. 3 is a schematic diagram of a portion of a microscope imaging system according to some embodiments herein;

FIG. 4 is a left side view of FIG. 3 shown in accordance with some embodiments of the present description;

FIG. 5 is a schematic diagram of a portion of a microscope imaging system according to some embodiments described herein;

FIG. 6 is a schematic view of a portion of a Z stage and a Z stage movement mechanism according to some embodiments described herein;

fig. 7 is a schematic diagram of a portion of a stage control structure according to some embodiments of the present disclosure;

FIG. 8 is a schematic diagram of a portion of a stage control structure according to some embodiments of the present disclosure;

fig. 9 is a schematic diagram of a portion of a stage control structure according to some embodiments of the present disclosure;

FIG. 10 is a schematic illustration of a portion of a configuration of a microscopy imaging system according to some embodiments described herein;

FIG. 11 is a schematic view of an installation of an imaging device according to some embodiments of the present description;

fig. 12 is a schematic diagram of a configuration of a microscopy imaging system according to some embodiments of the present description.

Detailed Description

In order to more clearly illustrate the technical solutions of the embodiments of the present specification, the drawings used in the description of the embodiments will be briefly described below. It is obvious that the drawings in the following description are only examples or embodiments of the present description, and that for a person skilled in the art, the present description can also be applied to other similar scenarios on the basis of these drawings without inventive effort. Unless otherwise apparent from the context, or stated otherwise, like reference numbers in the figures refer to the same structure or operation.

As used in this specification and the appended claims, the terms "a," "an," "the," and/or "the" are not to be taken in a singular sense, but rather are to be construed to include a plural sense unless the context clearly dictates otherwise. In general, the terms "comprises" and "comprising" merely indicate that steps and elements are included which are explicitly identified, that the steps and elements do not form an exclusive list, and that a method or apparatus may include other steps or elements.

A microscopic imaging system refers to a system in which a sample is imaged by photographing through an imaging device. In some embodiments, the imaging device may include a microscope, and the position of the objective lens of the microscope is adjusted so that the image formed by the objective lens is located outside the front focal point of the eyepiece, and the objective lens magnifies the image to obtain a second magnified erect image, and when the light source is strong enough, the photoelectric element of the camera or video camera is exposed to the image. The microscopic imaging system combines a microscope with a camera shooting technology, and can observe and acquire images of microorganisms which cannot be seen by human eyes so as to store or further process the acquired images. In some embodiments, the imaging device may include a device that can be used for microscopic imaging (e.g., a microscopic camera, etc.).

FIG. 1 is a schematic block diagram of a microscopy imaging system 100 according to some embodiments described herein.

FIG. 2 is a schematic diagram of a portion of a microscope imaging system 100 according to some embodiments described herein.

FIG. 3 is a schematic diagram of a portion of a microscope imaging system 100 according to some embodiments described herein.

In some embodiments, as shown in fig. 1, 2, and 3, microscopy imaging system 100 may include sample stage 110, a fixture, an imaging device 130, a follower structure 150, and a follower support 140. In some embodiments, sample stage 110 may be used to carry sample holder 111, and the fixture may be used to apply downward pressure to sample holder 111; the following structure 150 and the following bracket 140 may be movably connected, the imaging device 130 may be disposed on the following structure 150, and the top end of the following structure 150 abuts against the lower surface of the sample holder 111; the follower structure 150 may be used to maintain the distance of the imaging device 130 from the lower surface of the sample support 111.

Sample stage 110 is a structure for fitting sample holder 111, and in some embodiments, sample holder 111 may be fixedly mounted on sample stage 110. In some embodiments, the sample stage 110 may have a variety of configurations, such as a horizontal stage.

The sample carrier 111 may refer to a material used to carry a sample (e.g., a microorganism, etc.) in a biological assay. In some embodiments, sample carrier 111 may include at least one of a sample plate, a counter plate, a multi-well plate, a petri dish, or the like.

A fixture may refer to a structure for applying downward pressure to the sample support device 111 to limit the position of the sample support device 111. In some embodiments, the fixing devices can be respectively disposed at the lateral positions of the sample holding device 111 to realize the function of applying downward pressure to the sample holding device 111 without affecting the functions of the sample holding device 111 itself and the microscope imaging system 100. In some embodiments, the number of the fixing devices may be one or more, for example, the fixing devices may be two, and two fixing devices may be respectively disposed on two opposite sides of the sample-carrying device 111, and respectively apply downward pressure to the sample-carrying device 111 from two sides of the sample-carrying device 111.

In some embodiments, the fixture may be in rolling contact with the sample support 111. In some embodiments, the securing device may include a press 120 and a press wheel.

Fig. 4 is a left side view of fig. 3 shown in accordance with some embodiments of the present description. In some embodiments, as shown in fig. 4, the cross-section of the compact 120 may be stepped, and the stepped end surface of the compact 120 may be provided with a plurality of press wheels 122. As shown in fig. 4, the opposite side of the pressing block 120 is in a stepped shape, wherein the step relatively far away from the sample stage 110 has a larger cross-sectional area than the step relatively close to the sample stage 110, and the step relatively far away from the sample stage 110 and the step relatively close to the sample stage 110 are both provided with pressing wheels. The axes of the plurality of pressing rollers 122 (dotted line a in fig. 4) may be parallel to the cross-section of the pressing block 120, and the axes of the plurality of pressing rollers 122 (dotted line a in fig. 4) may be parallel to the sample stage 110.

In some embodiments, the sample stage 110 may be provided with a guide block 121, and the fixing device may roll along the guide block 121. In some embodiments, the fixture may include a plurality of rollers 122, and guide blocks 121 may be used to guide the movement of the rollers. At least one of the plurality of press wheels 122 is movable along the guide block 121, and another at least one of the plurality of press wheels 122 is movable along the sample stage 110 and can be used to apply downward pressure to the sample carrier 111. In a specific embodiment, the number of the pressing wheels disposed on the end surface of each pressing block 120 may be 3, two of the pressing wheels are farther away from the sample stage 110 in the vertical direction relative to the other pressing wheel, the two pressing wheels relatively far away from the sample stage 110 can move along the sample carrier 111, and one pressing wheel relatively close to the sample stage 110 can move along the guide block 121.

In some embodiments, the extension direction of the guide block 121 may be the same as the rolling direction of the fixture, and the guide block 121 may have a trapezoidal shape in a direction perpendicular to the extension direction of the guide block 121. In some embodiments, the guide block 121 can have an isosceles trapezoid shape, and the inclined surface can be used to guide the movement of the pressing wheel.

In some embodiments, the number of the guide blocks 121 and the pressing blocks 120 may be two, and the guide blocks 121 and the pressing blocks 120 may be respectively disposed on two sides of the sample carrier 111. In some embodiments, the guide block 121 may cooperate with the press block 120 to effect contact and separation of the press block 120 from the sample carrier 111 to effect assembly and disassembly of the sample carrier 111.

In some embodiments, the microscopic imaging system 100 may also include a guide shaft and a base. In some embodiments, the guide shaft may be vertically disposed on the base, and the guide shaft movably penetrates the pressing block 120. In other embodiments, the guide shaft may be vertically disposed on the X stage 210. In some embodiments, a locking member 124 may be disposed at an end of the guide shaft away from the base, a second elastic member 123 may be sleeved on the guide shaft, one end of the second elastic member 123 abuts against the pressing block 120, and the other end of the second elastic member 123 may abut against the locking member 124. In some embodiments, each pressing block 120 may correspond to one or more guide shafts along which the pressing block 120 may move in a vertical direction, while the pressing block 120 is capable of applying a downward force to the sample carrier 111 based on the action of the second elastic member 123.

In some embodiments, the pressing block 120 can adapt to sample holders 111 with different thicknesses by moving up and down along the guide shaft, so that the stability of assembling the sample holders 111 is improved, and the realization of microscopic imaging is facilitated.

In some embodiments, the guide block 121 may guide the pressing roller to contact or separate from the sample holder 111 according to the position of the sample stage 110 when the sample stage moves.

For example only, during the experiment, the pressing wheel relatively far away from the sample table 110 abuts against the sample bearing device 111 so as to limit the position of the sample bearing device 111; when the experiment is finished and the sample bearing device 111 needs to be withdrawn, the pressing wheel relatively close to the sample table 110 can slide upwards along the inclined plane of the trapezoidal guide block 121, so that the pressing wheel relatively far away from the sample table 110 is gradually separated from the sample bearing device 111, and after the pressing wheel relatively far away from the sample table 110 is completely separated from the sample bearing device 111, the pressing wheel relatively close to the sample table 110 slides downwards to the sample table 110 from the inclined plane at the other end of the guide block 121. When an experiment is started and the sample bearing device 111 is assembled, the process can be opposite to the withdrawal of the sample bearing device 111, the pressing wheel relatively close to the sample table 110 can slide upwards from the inclined surface at one end of the guide block 121, so that the pressing wheel relatively far away from the sample table 110 is lifted to the upper side of the sample bearing device 111, the pressing wheel relatively close to the sample table 110 can slide downwards from the inclined surface at the other end of the guide block 121, and the pressing wheel relatively far away from the sample table 110 is gradually contacted with the sample bearing device 111 in the process, so that the acting force on the sample bearing device 111 from top to bottom is realized.

In some embodiments, by the cooperation of the guide blocks 121 and the pressing wheels relatively close to the sample stage 110, the pressing wheels relatively far from the sample stage 110 can be lifted onto the sample carrier 111 for pressing the sample carrier 111, and the pressing wheels relatively far from the sample stage 110 can be moved away from above the sample carrier 111 for withdrawing the sample carrier 111, so that the sample carrier 111 can be kept stable during the assembly or withdrawal of the sample carrier 111.

In some embodiments, the following structure can be used to apply upward force to the sample carrier 111 from the bottom up (see the following description for the following structure), and the two sides of the sample carrier 111 can be used to apply downward force from the top down through the pressing block 120; when the acting force of the sample bearing device 111 up and down reaches the balance (further, the elastic force of the second elastic component 123 of the guide shaft can be adjusted), the follow-up focusing of the sample bearing device 111 can be realized.

In some embodiments, the guide shaft may be a telescopic shaft that can be extended and retracted, and the length of the guide shaft can be changed by the extension and retraction of the telescopic shaft. In some embodiments, the extension and retraction of the telescopic shaft can adjust the elastic force of the second elastic member 123. For example, when the telescopic shaft is extended, the degree of compression of the second elastic member 123 is decreased, and the elastic force is decreased, whereas the elastic force is increased.

In some embodiments, the microscopic imaging system 100 may further include a pressure sensor for detecting a pressure of the second elastic member 123, for example, a pressure exerted by the second elastic member 123 on the pressing block or the locking member. In some embodiments, the length of the telescopic shaft can be automatically adjusted according to the detection result of the pressure sensor, for example, the pressure sensor detects that the pressure is small, and it is known from empirical data that the pressure may not enable the pressing block to abut against the sample holder 111, the telescopic shaft can be controlled to contract, so as to increase the compression degree of the second elastic component 123, thereby increasing the pressure.

In some embodiments, the sample support device 111 can be stably abutted by the telescopic shaft with adjustable pressure, so as to improve the stability of the experiment.

Fig. 5 is a schematic diagram of a portion of a structure of a microscopy imaging system 100 according to some embodiments described herein. Fig. 6 is a schematic diagram of a portion of the Z stage 230 and Z stage movement mechanism according to some embodiments of the present disclosure.

As shown in fig. 2, 3, 5, and 6, some embodiments of the present disclosure provide a stage mechanism for a microscopic imaging system 100, which may include a stage control structure, and may further include a Y stage 220, a Y stage moving mechanism, a Z stage 230, a Z stage moving mechanism, and an imaging device. The sample stage control structure may include a base, an X platform moving mechanism, a sample stage moving mechanism, a primary guide rail, and a secondary guide rail, and for further details of the sample stage control structure, reference may be made to the related descriptions of fig. 7, fig. 8, and fig. 9.

In some embodiments, the sample stage 110 may be disposed on the X stage 210, the X stage 210 may be slidably connected to the base, and the X stage moving mechanism may be configured to drive the X stage 210 to move along the X axis relative to the base; the Y stage 220 is slidably connected to the base, and the Y stage moving mechanism may be configured to drive the Y stage 220 to move along the Y axis relative to the base; both the Z stage 230 and the Z stage moving mechanism may be disposed on the Y stage 220, and the Z stage moving mechanism may be configured to drive the Z stage 230 to move along the Z axis. In some embodiments, the imaging device 130 may be disposed on the Z stage 230.

In some embodiments, the X stage moving mechanism, the Y stage moving mechanism, and the Z stage moving mechanism are respectively used to drive the X stage, the Y stage, and the Z stage, so as to facilitate the acquisition of a sample image at any position on the sample holder 111, and the distance between the imaging device 130 and the sample holder 111 can be adjusted in the Z-axis direction, so that the two can maintain an optimal relative distance to realize clear imaging.

In some embodiments, sample stage 110 may be configured to carry sample carrier 111, and imaging device 130 may be disposed below sample carrier 111. In some embodiments, the X stage moving mechanism may be configured to drive the X stage 210 to move along the X axis, so as to drive the sample carrier 111 to move along the X axis; the Y stage moving mechanism may be configured to drive the Y stage 220 to move along the Y axis, so as to drive the imaging device 130 to move along the Y axis; the Z stage moving mechanism may be configured to drive the Z stage 230 to move along the Z axis, so as to drive the imaging device 130 to move along the Z axis.

In some embodiments, the microscopy imaging system 100 may further comprise a sample stage moving mechanism, the sample stage 110 being disposed on the X stage 210; the X stage moving mechanism may be used to drive the X stage 210 to move relative to the base, and the sample stage moving mechanism may be used to drive the sample stage 110 to move relative to the X stage 210.

In some embodiments, the sample holder 111 can move along the X-axis, and the imaging device 130 can move along the Y-axis and the Z-axis, so that the imaging device 130 can observe a sample at any position on the sample holder 111, and the distance between the imaging device 130 and the lower surface (imaging surface) of the sample holder 111 can be easily adjusted to ensure clear imaging.

Some embodiments of the present description provide a sample stage control structure. In some embodiments, the relative movement of X stage 210 and sample stage 110 may be controlled by a stage control mechanism. Fig. 7 is a schematic diagram of a portion of a stage control structure according to some embodiments of the present disclosure. Fig. 8 is a schematic diagram of a portion of a stage control structure according to some embodiments of the present disclosure. Fig. 9 is a schematic diagram of a portion of a stage control structure according to some embodiments of the present disclosure.

In some embodiments, the stage control structure may be understood as the stage and associated structures that control movement of the stage. As shown in fig. 7, 8 and 9, in some embodiments, the stage control structure may include a base, an X stage 210, an X stage moving mechanism, a stage 110, a stage moving mechanism, a primary rail 113, and a secondary rail 114. In some embodiments, sample stage 110 may be disposed on X stage 210; the sample stage moving mechanism may be configured to drive the sample stage 110 to move relative to the X platform 210 through the primary guide rail 113; an X-stage moving mechanism may be used to drive the X-stage 210 to move relative to the base via the secondary rail 114.

In some embodiments, the primary guide rail 113 and the secondary guide rail 114 are arranged, so that the sample stage 110 and the X platform 210 can move along the primary guide rail 113 and the secondary guide rail 114, respectively, thereby ensuring the stability of the movement of the sample stage 110 and the X platform 210 and reducing the working space required by the equipment.

In some embodiments, the primary guide rails 113 and the secondary guide rails 114 may have different accuracies. In one embodiment, the movement of the sample stage 110 is mainly used for mounting/dismounting the sample carrier 111, etc., and the movement of the X stage 210 is used for controlling the photographing field of view during the microscopic imaging process, etc., so that the secondary guide rail 114 for driving the movement of the X stage 210 can have higher precision than the primary guide rail 113 for driving the movement of the sample stage 110. In some embodiments, the effective travel of the primary rail 113 may be L1, the effective travel of the secondary rail 114 may be L2, and the length of the secondary rail 114 may be L3; l1, L2 and L3 may satisfy the condition: l3 is more than L1 and L2 is more than 2L3. For the movement in the X-axis direction, if only one guide rail is provided, in order to meet the requirement of microscopic imaging, the guide rail needs to have higher precision, and thus the guide rail corresponds to a longer length and occupies a larger space. For example, the effective travel of the bar L4= L1+ L2, in which case the length of the bar itself would be much greater than 2L3 in order to be able to reach such an effective travel. Accordingly, some embodiments of the present disclosure provide substantial space savings over a single rail by providing a primary rail 113 and a secondary rail 114 of different precision, respectively.

For example only, if the precision requirement for the secondary rail 114 is relatively high, then the X stage 210 may be moved relative to the base using a cross rail in conjunction with a stepper drive to achieve higher precision imaging field switching.

For example only, if the requirement for the precision of the first-stage guide rail 113 is relatively low, the turbine deceleration driving part can be used to cooperate with the linear guide rail to realize the movement of the sample stage 110 relative to the X platform 210, so that the space can be saved and the equipment cost can be reduced.

In some embodiments, the primary rail 113 may be a linear rail and the secondary rail 114 may be a cross rail.

In one embodiment, the cross guide may be disposed between the X stage 210 and the base, and the X stage moving mechanism may include an X stage driving part 211, and the X stage 210 is driven to move along the cross guide relative to the base by the X stage driving part 211.

In a specific embodiment, the primary guide rail 113 may further include a gear 116 and a rack 115, the sample stage 110 may be provided with a sample stage driving portion 117, the rack 115 may be disposed on the X platform 210, a rotating shaft of the sample stage driving portion 117 may be connected to the gear 116, and the gear 116 and the rack 115 may be matched, so that the sample stage driving portion 117 may control the sample stage 110 to move along the linear guide rail relative to the X platform.

In some embodiments, different control accuracies for the movement in the X-axis direction may be set based on the requirements of the microscopy imaging system 100. In some embodiments, the X stage movement mechanism and the sample stage movement mechanism may have different control accuracies. For example, moving the sample stage 110 for mounting/replacing the sample carrier 111 may have relatively low accuracy, and moving the sample stage 110 for photographing the sample may have relatively high accuracy.

In some embodiments, the X stage moving mechanism may have a high control precision, and the setting and control of the moving path of the X stage 210 and the moving speed of the X stage 210 may be realized by the control system, so as to enable the control of the photographing field of view of the imaging device 130.

In some embodiments, the sample stage moving mechanism may have relatively low control accuracy, the control of the moving speed of the sample stage 110 may be achieved by the control system, the sample stage 110 may be moved to the outer side relative to the microscopic imaging system 100 (i.e. the projection of the sample stage 110 on the horizontal plane is not coincident with the projection of other parts of the microscopic imaging system 100 on the horizontal plane), the sample holder 111 may be installed and replaced, the sample holder 111 may be moved to the shooting position, and the like.

By way of example only, the sample stage 110 and the X-stage 210 can move along the primary guide rail 113 and the secondary guide rail 114, respectively, the sample stage 110 can be pushed out through the primary guide rail 113 to mount the sample carrier 111, the sample stage 110 is pushed back and sent to the primary shooting position after being mounted, then the position of the X-stage can be moved through the secondary guide rail 114, and the shooting view of the imaging device 130 is further adjusted to adjust the sample to the optimal shooting position. Through the arrangement of the first-stage guide rail 113 and the second-stage guide rail 114, the sample stage 110 and the X platform 210 are respectively moved, so that the space can be effectively saved compared with a single X-axis direction moving device, and in addition, the efficiency maximization can also be realized through the arrangement of different precisions.

In some embodiments, the X stage moving mechanism may include an X stage driving part 211; the X platform driving part 211 can be arranged on the base, the X platform driving part 211 can be in transmission connection with the X platform 210, the second-stage guide rail 114 can be arranged between the X platform 210 and the base, and the X platform driving part 211 can drive the X platform 210 to move relative to the base through the second-stage guide rail 114.

In one embodiment, a cross-guide (e.g., a cross-roller guide, etc.) may be disposed between the X stage 210 and the base, and the X stage driving part 211 may drive the X stage 210 to move relative to the base through the cross-guide.

In some embodiments, the stage moving mechanism may include a stage driving part 117; the sample stage driving part 117 may be disposed on the sample stage 110, a primary guide 113 may be disposed between the X stage 210 and the sample stage 110, and the sample stage driving part 117 may drive the sample stage 110 to move relative to the X stage 210 through the primary guide 113.

In an embodiment, a linear guide may be disposed between the X platform 210 and the sample stage 110, meanwhile, a rack 115 may be disposed on the X platform 210, a rotating shaft of the sample stage driving part 117 may be connected to a gear 116, the gear 116 may be matched with the rack 115, and the sample stage driving part 117 drives the sample stage 110 to move relative to the X platform 210.

In some embodiments, the sample stage moving mechanism may further include a position sensor, and the position sensor may be configured to detect that the sample stage 110 reaches a set position, so as to improve the accuracy of controlling the moving position of the sample stage 110. For example, the movement of the sample stage 110 to a position for assembling the sample carrier 111 or withdrawing/disassembling the sample carrier 111 can be detected by a position sensor to achieve the assembling and disassembling of the sample carrier 111. For another example, the position sensor can detect that the sample stage 110 moves to a preset photographing field of the imaging device 130 for the subsequent sample image acquisition. In some embodiments, the set position may be a position where the sample holder 111 is installed and ready for imaging, and the relative position between the sample stage 110 and the X-stage 210 is not changed during the imaging process. Through setting for position sensor, can avoid sample platform moving mechanism's precision error to cause the influence to formation of image.

Some embodiments of the present description also provide a control system for a sample stage control structure. In some embodiments, the control system may include a controller that may be configured to perform a method of controlling the stage control structure. The control method may include: when a sample on the sample stage 110 is mounted/replaced, the sample stage 110 can be controlled to move by the sample stage moving mechanism; in microscopic imaging of the sample, the X stage 210 may be controlled to move by the X stage moving mechanism. The sample platform control structure and a control system of the sample platform control structure can be matched into a complete control device, and the sample platform control structure can automatically complete the installation/replacement of the sample platform and the sample imaging function under the control of the control system.

In some embodiments, the precision requirement for installing/replacing the sample bearing device on the sample stage 110 is not high, as long as the installation or replacement of the sample bearing device 111 can be realized, and thus the sample stage moving mechanism may have relatively low precision to save cost. In some embodiments, microscopic imaging of the sample requires the imaging device 130 to capture a clear image of the sample at a given location, requiring greater precision, and thus the X stage movement mechanism can have greater precision to meet the needs of the experiment.

In some embodiments, the microscopy imaging system 100 may include the sample stage control structure of any of the embodiments.

In some embodiments, as shown in fig. 2, the Y stage moving mechanism may include a Y stage driving part 221; the Y stage 220 may have a slider, the base may have a slide rail, the Y stage 220 may have a lead screw nut 227 engaged with a rotation shaft of the Y stage driving part 221, and the Y stage driving part 221 drives the Y stage 220 to move along the Y axis relative to the base through the slider engaged with the slide rail.

In some embodiments, by respectively arranging the X stage 210 capable of moving along the X-axis direction and the Y stage 220 capable of moving along the Y-axis direction, the device realizes movement in the XY plane, and the working space required by the movement relative to the XY combined stage is smaller, so that the space is saved, and the device volume is small.

In some embodiments, as shown in fig. 6, the Z stage moving mechanism may include a Z stage driving part 231 and a first mounting block 223 (see fig. 11); the Z platform driving part 231 is fixed on the first mounting block 223, the Z platform 230 is arranged on the first mounting block 223 in a sliding mode, and the Z platform driving part 231 drives the Z platform 230 to move relative to the first mounting block 223. In a specific embodiment, a sliding block may be disposed on the Z platform 230, and a corresponding sliding rail may be disposed on the first mounting block 223, so as to realize the sliding arrangement of the Z platform 230 relative to the first mounting block 223.

In some embodiments, the X stage moving mechanism, the Y stage moving mechanism, and the Z stage moving mechanism may include sensors, such as a displacement sensor, an angle sensor, and the like, respectively. In some embodiments, sensors (e.g., displacement sensors) may be mounted on the X stage 210, the Y stage 220, and the Z stage 230, respectively, for detecting displacements of the X stage 210, the Y stage 220, and the Z stage 230, respectively. In a specific embodiment, the displacement sensor may detect positions of the X stage 210, the Y stage 220, and the Z stage 230 before and after movement, and feed back position information to the control system, so as to accurately know the movement positions of the X stage 210, the Y stage 220, and the Z stage 230, thereby further facilitating accurate control of the movement of the X stage 210, the Y stage 220, and the Z stage 230.

Fig. 10 is a schematic diagram of a portion of a structure of a microscopy imaging system 100 according to some embodiments described herein. The imaging device 130 may be used to expose light to form an image, and the imaging device 130 may include a camera, a video camera, and the like. In some embodiments, as shown in FIG. 10, the imaging device 130 can be used to microscopically image the sample on the sample support 111, i.e., visible light transmitted through or reflected from the sample can be passed through one or more lenses to obtain a magnified image of the microscopic sample.

FIG. 11 is a schematic view of an installation of an imaging device according to some embodiments herein. As shown in fig. 11, in some embodiments, the microscopy imaging system 100 may further include a second mounting block 222 and a connection plate 224; the second mounting block 222 is fixed to the Y platform 220, the first mounting block 223 is slidably disposed on the second mounting block 222, the connecting plate 224 is fixedly disposed on the first mounting block 223, one side of the connecting plate 224 is connected to the second mounting block 222 through a first elastic member 226, the other side of the connecting plate 224 is provided with a screw hole for passing through a lens of the imaging device 130, and the first mounting block 223 is located between the imaging device 130 and the first elastic member 226.

The follower structure 150 may be adapted to abut the lower surface of the sample carrier 111. The follower bracket 140 may be used to mount the follower structure 150.

In some embodiments, the Z stage 230 and the Z stage moving mechanism may be disposed on the follower structure 150, the follower support 140 may be disposed on the Y stage 220, and the follower structure 150 may be movably connected to the follower support 140.

In some embodiments, the top end of the follower structure 150 may abut the lower surface of the sample carrier device 111. In a particular embodiment, the top end of the follower structure 150 may be provided with a follower 225, and the follower 225 may abut the lower surface of the sample carrier device 111. In some embodiments, the imaging device 130 may be disposed on the follower structure 150, and the follower structure 150 may be used to maintain the distance between the imaging device 130 and the lower surface of the sample support device 111. In some embodiments, the following structure 150 may perform a slight up and down movement when the sample stage 110 moves to the set position, so as to ensure a distance between the imaging device 130 and the observed sample, thereby obtaining a clear and stable image.

For example only, when the imaging device 130 is located right below one of the sample holes of the sample holder 111, the Z platform driving portion 231 may control the imaging device 130 to move to an optimal observation position (the position can clearly image), and then when other holes need to be observed, the X platform driving portion 211 may drive the X platform 210 to move along the X axis, the Y platform driving portion 221 may drive the Y platform 220 to move along the Y axis, and the Z platform driving portion 231 stops working. The end of the follower 225 remote from the web 224 may always abut the sample carrier 111, and since the lower surface of the sample carrier 111 is not necessarily flat, there may be a depression or a protrusion in some position, and when the follower 225 is located in the depression or the protrusion, the first resilient member 226 will force the web 224 to move towards the sample carrier 111 or away from the sample carrier 111, and at this time, the web 224, the first mounting block 223, the Z-stage driving portion 231 and the imaging device 130 move simultaneously relative to the second mounting block 222.

In some embodiments, by providing the following structure 150, it can be ensured that the optimal relative distance between the imaging device 130 and the observed sample is always maintained, so as to ensure clear imaging and achieve following focusing.

Fig. 12 is a schematic block diagram of a microscopy imaging system 100 according to some embodiments described herein. As shown in fig. 12, in some embodiments, the microscopy imaging system 100 may further include a light source device 310, and the light source device 310 may provide a light source based on imaging needs of the imaging device 130. In some embodiments, the light source device 310 may be connected to the Y stage 220 or the Z stage 230 through a mounting arm 311 so as to move following the movement of the imaging device 130 to provide a light source required for imaging.

In some embodiments, the microscopy imaging system 100 may further include a control system. In some embodiments, a control system may include a communication device and a controller, the communication device may be to receive an instruction; the controller can be used for controlling the imaging device 130 to image according to the instruction, and the controller can be further used for respectively controlling the sample stage 110, the X stage 210, the Y stage 220 and the Z stage 230 to move according to the instruction. In some embodiments, the microscopic imaging system 100 may also be controlled according to manual control instructions of a user, for example, the user may manually control the movement of the sample stage 110, the X stage 210, the Y stage 220, the Z stage 230, and the imaging device 130 to image.

In some embodiments, the control method of the microscopy imaging system 100 may be performed by a control system of the microscopy imaging system 100. In some embodiments, the control method may include: receiving a moving instruction; based on the moving instruction, the sample stage 110, the X stage 210, the Y stage 220, and the Z stage 230 are controlled to move, and it can be understood that the control system may control any one or more of the sample stage 110, the X stage 210, the Y stage 220, and the Z stage 230 to move simultaneously or sequentially as required. In some embodiments, the control method may include: receiving an imaging instruction; based on the imaging instruction, the imaging device 130 is controlled to image. It is understood that the control system may execute the moving instruction and the imaging instruction simultaneously or sequentially according to the requirement, and specifically, the control system may control any one or more of the sample stage 110, the X stage 210, the Y stage 220, and the Z stage 230 to move simultaneously or sequentially, and control the imaging device 130 to perform one or more times of imaging simultaneously.

For example only, the user side (e.g., a mobile phone, a computer, etc.) may send the experiment operation instruction in a wired or wireless manner (e.g., a network, bluetooth, etc.), the communication device may receive the experiment operation instruction, the controller may start to perform the experiment operation based on the preset shooting view and walking parameters according to the received experiment operation instruction, and the controller may send data to the user side through the communication device after the experiment is finished.

For example only, the user end may send an instruction to start shooting by the imaging device 130 in a wired or wireless (e.g., network, bluetooth, etc.), the communication device may receive the instruction, the controller may start to perform a shooting operation based on a preset shooting view and shooting parameters according to the received instruction, and the controller may send data to the user end through the communication device after shooting is finished.

For example only, the user end may send a movement instruction of the imaging device 130 in a wired or wireless (e.g., network, bluetooth, etc.) manner, the communication device may receive the movement instruction, the controller may start to perform a movement operation according to the received movement instruction, and after the movement is completed, the controller may send a movement completion result to the user end through the communication device.

In some embodiments, the microscopic imaging system 100 can be remotely controlled to remotely operate the system without requiring an operator to perform operation on site, and is safe and efficient, and the comfort of the operator is improved.

Having thus described the basic concept, it will be apparent to those skilled in the art that the foregoing detailed disclosure is to be considered as illustrative only and not limiting, of the present invention. Various modifications, improvements and adaptations to the present description may occur to those skilled in the art, although not explicitly described herein. Such modifications, improvements and adaptations are proposed in the present specification and thus fall within the spirit and scope of the exemplary embodiments of the present specification.

Also, the description uses specific words to describe embodiments of the description. Reference throughout this specification to "one embodiment," "an embodiment," and/or "some embodiments" means that a particular feature, structure, or characteristic described in connection with at least one embodiment of the specification is included. Therefore, it is emphasized and should be appreciated that two or more references to "an embodiment" or "one embodiment" or "an alternative embodiment" in various places throughout this specification are not necessarily all referring to the same embodiment. Furthermore, some features, structures, or characteristics of one or more embodiments of the specification may be combined as appropriate.

Similarly, it should be noted that in the foregoing description of embodiments of the specification, various features are sometimes grouped together in a single embodiment, figure, or description thereof for the purpose of streamlining the disclosure aiding in the understanding of one or more of the embodiments. This method of disclosure, however, is not intended to imply that more features are required than are expressly recited in the claims. Indeed, the embodiments may be characterized as having less than all of the features of a single embodiment disclosed above.

Finally, it should be understood that the embodiments described herein are merely illustrative of the principles of the embodiments of the present disclosure. Other variations are also possible within the scope of this description. Thus, by way of example, and not limitation, alternative configurations of the embodiments of the present specification can be seen as consistent with the teachings of the present specification. Accordingly, the embodiments of the present description are not limited to only those embodiments explicitly described and depicted herein.

Claims

1. A sample table control structure is characterized by comprising a base, an X platform moving mechanism, a sample table moving mechanism, a primary guide rail and a secondary guide rail;

the sample table is arranged on the X platform and is used for bearing the sample bearing device;

the sample stage moving mechanism is used for driving the sample stage to move relative to the X platform through the primary guide rail;

the X platform moving mechanism is used for driving the X platform to move relative to the base through the secondary guide rail;

the effective stroke of the first-stage guide rail is L1, the effective stroke of the second-stage guide rail is L2, and the length of the second-stage guide rail is L3; the L1, the L2 and the L3 satisfy the condition: l3 is more than L1 and L2 is more than 2L3.

2. The sample stage control structure of claim 1, wherein the primary guide rail and the secondary guide rail have different accuracies;

and/or the X platform moving mechanism and the sample stage moving mechanism have different control accuracies;

and/or the X platform moving mechanism comprises an X platform driving part; the X platform driving part is arranged on the base and is in transmission connection with the X platform, the secondary guide rail is arranged between the X platform and the base, and the X platform driving part is used for driving the X platform to move relative to the base through the secondary guide rail;

and/or the sample stage moving mechanism comprises a sample stage driving part; the sample table driving part is arranged on the sample table, the primary guide rail is arranged between the X platform and the sample table, and the sample table driving part is used for driving the sample table to move relative to the X platform through the primary guide rail;

and/or the sample stage moving mechanism further comprises a position sensor, and the position sensor is used for detecting that the sample stage reaches a set position.

3. The sample stage control structure of claim 2, wherein the primary guide rail is a linear guide rail and the secondary guide rail is a cross guide rail.

4. A control system for a stage control structure according to any of claims 1-3, comprising a controller for performing a method of controlling the stage control structure, the method comprising:

when a sample on the sample table is mounted/replaced, the sample table is controlled to move by a sample table moving mechanism;

and when the sample is subjected to microscopic imaging, the X platform is controlled to move by the X platform moving mechanism.

5. A stage mechanism for a microscopy imaging system, comprising the sample stage control structure of any of claims 1-3.

6. The stage mechanism according to claim 5, further comprising a Y stage and a Y stage moving mechanism;

the Y platform is connected with the base in a sliding mode, and the Y platform moving mechanism is used for driving the Y platform to move along a Y axis relative to the base.

7. The stage mechanism of claim 6, wherein the X stage and the Y stage are not coplanar.

8. The stage mechanism according to claim 6, further comprising a Z stage and a Z stage moving mechanism, wherein the Z stage and the Z stage moving mechanism are both disposed on the Y stage, the Z stage is disposed perpendicular to the Y stage, and the Z stage moving mechanism is configured to drive the Z stage to move along a Z axis.

9. The stage mechanism of claim 6, further comprising an imaging device disposed on the Z stage and disposed below the sample carrier.

10. A microscopic imaging system comprising the sample stage control structure of any of claims 1-3; alternatively, a stage mechanism for a microscopy imaging system as defined in any one of claims 5-9 is comprised.

11. The microscopic imaging system of claim 10, wherein said X stage moving mechanism, said Y stage moving mechanism, and said Z stage moving mechanism each comprise a sensor for detecting displacement of said X stage, said Y stage, and said Z stage, respectively;

and/or the Y platform moving mechanism comprises a Y platform driving part; the Y platform is provided with a sliding block, the base is provided with a sliding rail, and the Y platform driving part drives the Y platform to move along a Y axis relative to the base through the matching of the sliding block and the sliding rail;

and/or the Z platform moving mechanism comprises a Z platform driving part and a first mounting block; the Z platform driving part is fixed on the first mounting block, the Z platform is arranged on the first mounting block in a sliding mode, and the Z platform driving part drives the Z platform to move relative to the first mounting block.

12. The microscopic imaging system of claim 11, wherein said Z stage movement mechanism further comprises a second mounting block and a connecting plate; the second installation piece is fixed in the Y platform, first installation piece is located along the Z axle slides on the second installation piece, the connecting plate is fixed set up in first installation piece, one side of connecting plate through first elastomeric element with the second installation piece is connected, the opposite side of connecting plate is equipped with and is used for supplying the screw that imaging device's camera lens passed, first installation piece is located imaging device with between the first elastomeric element.

13. The microscopic imaging system according to claim 10, further comprising a follow-up structure and a follow-up support, wherein the Z stage and the Z stage moving mechanism are disposed on the follow-up structure, the follow-up support is disposed on the Y stage, and the follow-up structure is movably connected with the follow-up support; the top end of the follow-up structure is abutted against the lower surface of the sample bearing device; the follow-up structure is used for keeping the distance between the imaging device and the lower surface of the sample bearing device;

and/or the microscopic imaging system further comprises a fixing device in rolling contact with the sample support device.

14. A microscopic imaging system according to claim 13, wherein said sample stage is provided with a guide block along which said fixture can roll.

15. The microscopic imaging system according to claim 14, wherein the guide block has an elongated direction that is the same as the rolling direction of the fixture, and wherein the guide block has a trapezoidal shape in a direction perpendicular to the elongated direction of the guide block.

16. The microscopy imaging system of claim 14, wherein the number of the guide block and the fixing device is two, and the guide block and the fixing device are respectively disposed on two sides of the sample holder.

17. The microscopic imaging system according to claim 13, further comprising a guide shaft, wherein the guide shaft is vertically disposed on the base or the X-platform, the fixing device comprises a pressing block, and the guide shaft movably penetrates through the pressing block; the guiding axle is kept away from the one end of base is equipped with the retaining member, the cover is equipped with second elastomeric element on the guiding axle, second elastomeric element's one end with the briquetting butt, second elastomeric element's the other end with the retaining member butt.

18. The microscopy imaging system of claim 17, wherein the guide shaft is a telescoping shaft that is capable of telescoping.

19. The microscopy imaging system of claim 17, further comprising a pressure sensor for detecting a pressure of the second resilient member.

20. The microscopy imaging system of claim 10, further comprising a control system; the control system comprises a communication device and a controller, wherein the communication device is used for receiving instructions, and the controller is used for respectively controlling the sample stage, the X platform, the Y platform and the Z platform to move according to the instructions and controlling the imaging device to image.