CN218159632U

CN218159632U - Multifunctional low-power consumption solid state disk test cabinet

Info

Publication number: CN218159632U
Application number: CN202222131051.0U
Authority: CN
Inventors: 占志敏; 柴新辉
Original assignee: Shenzhen Wison Technology Co ltd
Current assignee: Shenzhen Wison Technology Co ltd
Priority date: 2022-08-12
Filing date: 2022-08-12
Publication date: 2022-12-27
Anticipated expiration: 2032-08-12

Abstract

The utility model discloses a multi-functional low-power consumption solid state hard drives test cabinet belongs to hard disk testing arrangement technical field for test SSD's performance in batches. The utility model discloses a server, RISER card, RAID card, SATA line, SATA circuit board and outer power, the RISER card is installed on the PCIE interface of server, and the RAID card is installed on the PCIE expansion groove of RISER card, and the SATA circuit board passes through SATA line and RAID card electric connection, and outer power is connected with the SATA circuit board and provides the direct current, and the SATA circuit board is equipped with a plurality of SATA interfaces that are used for installing SSD. The utility model discloses a test cabinet can hold many servers, and 40 SSDs can be tested simultaneously to single platform server, and the performance of full play server still supports a tractor serves several purposes, realizes test technical index such as BIT, RDT, H2 of solid state hard drive, has shortened the production time of change equipment and test environment greatly, greatly saves manpower, material resources, place and power consumption etc..

Description

Multifunctional low-power consumption solid state disk test cabinet

Technical Field

The utility model belongs to the technical field of the hard disk testing arrangement, especially, relate to a multi-functional low-power consumption solid state hard drives test cabinet.

Background

A Solid State Disk (SSD), also called Solid State Drive, is a hard Disk made of a Solid State electronic memory chip array, and is inserted into a computer or a server before a manufacturer leaves a factory to provide a stable DC5V voltage for reading and writing tests of the SSD. The SSD solid state disk is tested through the high-temperature environment and the stable voltage, and products with hidden dangers and instability are screened out, so that the performance and parameters of products leaving a factory can meet the industrial use requirements.

The existing aging test method for the BIT (aging test software for random read-write data) of the solid state disk is that a single computer host simultaneously tests 8 solid state disks, about 15 operators are needed according to the calculation of 300 interfaces of the computer host 2400 in a production factory, the power consumption of the single computer host is 150 watts and 300=45000 watts, the occupied area of a site is about 200 square meters, and the defects are as follows: the required area is large, more manpower is required, the power consumption is large, and the production efficiency is low. Moreover, the existing BIT aging test method for the solid state disk can only test BIT, and another production device needs to be replaced for testing RDT (a verification reliable data transmission protocol, rapid diagnosis, random test technology software program) and H2 (a complete data read-write detection software), so that the production period is long. The chinese invention patent 2021116218887 discloses a solid state disk aging amount testing device, which can improve the aging amount and aging accuracy of a single solid state disk without changing the model of the existing switching power supply by adding a 5V power supply module on the basis of the conventional scheme of the prior art, i.e. improve the productivity and reduce the cost. But the throughput that the test device can improve is limited.

Therefore, a multifunctional low-power consumption solid state disk testing cabinet is provided to solve the problems of low capacity, high power consumption, few functions and the like of the existing hard disk testing device.

SUMMERY OF THE UTILITY MODEL

An object of the utility model is to provide a multi-functional low-power consumption solid state hard drives test cabinet aims at solving the scheduling problem that current hard drives testing arrangement productivity is low, the consumption is big, the function is few. For realizing the purpose, the utility model discloses a technical scheme be:

the utility model provides a multi-functional low-power consumption solid state hard drives test cabinet, includes server, RISER card, RAID card, SATA line, SATA circuit board and outer power, the RISER card is installed on the PCIE interface of server, the RAID card is installed on the PCIE expansion groove of RISER card, the SATA circuit board passes through SATA line and RAID card electrical connection, and outer power is connected with the SATA circuit board and provide the direct current, the SATA circuit board is equipped with a plurality of SATA interfaces that are used for installing SSD.

More preferably, the server passes through the slide rail and installs on the test cabinet, and the universal wheel is installed to the bottom of test cabinet and is conveniently removed, and the glass door is all installed to the front and back of test cabinet and is conveniently observed, and the display screen that shows server running state is installed at the top of test cabinet. The SATA circuit board is installed on one side of the test cabinet, so that observation is facilitated, and SSD replacement is facilitated.

Further describing the above scheme, the SATA line is an SFF-8087 to 4SATA line, one end of the SFF-8087 to 4SATA line is installed on an SFF-8087 interface on the RAID card, and the other end is installed on 4SATA ports on the SATA circuit board.

Further describing the above scheme, the external power source converts 220V ac power into 12V dc power and supplies the dc power to the SATA circuit board, and the SATA circuit board is provided with a circuit board switch.

Preferably, the external power source is mounted on the surface of the server top cover, and the SATA circuit board is mounted on the surface of the server top cover through the support.

Furthermore, the server is a Delr 720, the CPU model is Xeon E5-2609, and the number of the servers is two, and BIT, H2 and RDT programs are installed in the server.

Compared with the prior art, the utility model discloses a there is following beneficial effect:

1. each server mainboard develops 5 PCIe interfaces through two Ricer cards, RAID cards are installed on the 5 PCIe interfaces, and each RAID card is distributed with 8 SATA interfaces, so that 40 solid state disks can be tested at the same time, and the performance of a single server is fully exerted;

2. the test cabinet can contain a plurality of servers, the occupied area is small, centralized management is convenient, more than 5 test cabinets can be managed by one operator, and manpower, material resources and fields are greatly saved;

3. the solid state disk testing system supports multiple purposes, can realize the technical indexes of testing such as BIT, RDT, H2 and the like of the solid state disk by using different testing software and methods, does not need to use other equipment for testing in order to test other technical indexes, and greatly shortens the production time of replacing equipment and testing the environment.

Drawings

Fig. 1 is an overall schematic diagram provided in an embodiment of the present invention;

fig. 2 is a schematic diagram of a server and an expansion card according to an embodiment of the present invention;

fig. 3 is an exploded schematic view of a server and an expansion card according to an embodiment of the present invention;

fig. 4 is an exploded schematic view of an expansion card according to an embodiment of the present invention;

fig. 5 is a schematic view of a SATA circuit board according to an embodiment of the present invention;

fig. 6 is a schematic diagram of a circuit connection according to an embodiment of the present invention.

Wherein, in the figures, the respective reference numerals:

1. a test cabinet; 11. a universal wheel; 12. a glass door; 13. a display screen; 2. a server; 21. a server upper cover; 22. a PCIE interface; 3. a RISER card; 31. a PCIE expansion slot; 4. a RAID card; 41. SFF-8087 interface; 42. SFF-8087 vs 4SATA lines; 5. an SSD; 51. a SATA circuit board; 52. a circuit board switch; 53. a pillar; 54. an SATA interface; 6. and an external power supply.

Industry professional software terminology interpretation:

burn-in test is aging test software for random read-write data;

h2, complete data read-write detection software;

RDT (reserve duty tracing) is a software program for verifying reliable data transmission protocol, quickly diagnosing and randomly testing technology;

SSD (Solid State Drives) Solid State disk

A Riser card: refers to a function expansion card or a switch card inserted on a PCIe interface

RAID card: (redundant array of independent disks) redundant array of independent disks, also called PCIe-to-SATA array card.

PCIe interface: PCI-Express (peripheral component interconnect Express) is a high-speed serial computer expansion bus standard, PCIe belongs to high-speed serial point-to-point double-channel high-bandwidth transmission, connected devices distribute independent channel bandwidth and do not share bus bandwidth, and functions of active power management, error report, end-to-end reliability transmission, hot plug, quality of service (QOS) and the like are mainly supported.

Detailed Description

In order to facilitate understanding of the present invention, the present invention will be described more fully hereinafter with reference to the accompanying drawings. The preferred embodiments of the present invention are shown in the drawings. The invention may, however, be embodied in many different forms and should not be construed as limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete.

The technical solution of the present patent will be described in further detail with reference to the following embodiments.

As shown in fig. 1-6, the embodiment of the present invention provides a multifunctional low power consumption solid state hard disk test cabinet, including server 2, RISER card 3, RAID card 4, SATA line, SATA circuit board 51 and outer power supply 6, RISER card 3 is installed on PCIE interface 22 of server 2, RAID card 4 is installed on PCIE expansion slot 31 of RISER card 3, SATA circuit board 51 passes through SATA line and RAID card 4 electric connection, and outer power supply 6 is connected with SATA circuit board 51 and provides the direct current, SATA circuit board 51 is equipped with a plurality of SATA interfaces 54 that are used for installing SSD5.

As shown in figure 1, the server 2 is installed on the test cabinet 1 through a slide rail, universal wheels 11 are installed at the bottom of the test cabinet 1 to facilitate movement, glass doors 12 are installed on the front and back of the test cabinet 1 to facilitate observation, and a display screen 13 for monitoring and displaying the running state of the server 2 is installed at the top of the test cabinet 1. The SATA circuit board 51 is installed on one side of the test cabinet 1, so that observation is facilitated, and the SSD5 is replaced conveniently. The SATA line is SFF-8087 to 4SATA line 42, one end of SFF-8087 to 4SATA line 42 is installed on 8087 interface on RAID card 4, and the other end is installed on 4SATA ports on SATA circuit board 51.

As shown in fig. 2 and 3, the external power supply 6 converts 220V ac power into 12V dc power and supplies the SATA circuit board 51, and the external power supply 6 is of the type FSA011. The SATA circuit board 51 is provided with a circuit board switch 52, the SATA circuit board 51 is divided into three blocks, each block is provided with 14 SATA interfaces 54, and the total number of the SATA interfaces 54 is 42, wherein two interfaces are standby interfaces.

In the embodiment of the present invention, the model of the server 2 is dell R720, the CPU model is xeon e5-2609 and has two, and the server 2 internally has BIT, H2, and RDT programs. The conventional BIT aging test method for the solid state disk is to test 8 solid state disks simultaneously by a single computer host, and can only test BIT. The utility model discloses a performance with server 2 extremely reaches, installs two RISER cards 3 additional on the service area mainboard, then expands two RISER cards 3 to 5 RAID cards 4 again, 8 SSD5 of every RAID card 4 tests, as shown in figure 4, 5, 6, still installed the model for FSA011 external power supply 6 additional for testing SSD5, trun into the 220V alternating current 12V direct current and supply SSD5. Improve the server 2 that originally can only test 8 solid state hard drives simultaneously to 40 to install many service areas in same test cabinet 1, greatly reduce area, and use manpower and materials sparingly.

The prior BIT aging test method for the solid state disk is characterized in that a single computer host simultaneously tests 8 solid state disks, if 300 computer hosts in a production factory are calculated by 2400 interfaces, about 15 operators are needed, the power consumption of the single computer host is 150 watts multiplied by 300=45000 watts, and the occupied area of a site is about 200 square meters; and the utility model discloses the simultaneous testing only needs 60 platforms of server, 6 platforms of 1 mountable of every test cabinet, totally 10 test cabinets 1, takes up an area of about 50 square meters, through the test the utility model discloses a single platform server 2 adds the external power 6 consumption and is 267 watts, and 2400 SSD5 of simultaneous testing totally 267 x 60=16020 watts. To sum up, the utility model discloses effectively reduce power consumption and place, but the performance of unit server 2 is fully exerted.

It will be understood that when an element is referred to as being "secured to" another element, it can be directly on the other element or intervening elements may also be present. When an element is referred to as being "connected" to another element, it can be directly connected to the other element or intervening elements may also be present. In contrast, when an element is referred to as being "directly on" another element, there are no intervening elements present. As used herein, the terms "vertical," "horizontal," "left," "right," and the like are for purposes of illustration only and are not intended to represent the only embodiment, and as used herein, the terms "upper," "lower," "left," "right," "front," "rear," and the like are positional relationships with reference to the drawings.

Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs. The terminology used herein in the description of the invention is for the purpose of describing particular embodiments only and is not intended to be limiting of the invention. As used herein, the term "and/or" includes any and all combinations of one or more of the associated listed items.

The above embodiments are only used for illustrating the present invention, and not for limiting the present invention, and those skilled in the relevant technical field can make various changes and modifications without departing from the spirit and scope of the present invention, so that all equivalent technical solutions also belong to the scope of the present invention, and the protection scope of the present invention should be defined by the claims.

Claims

1. The utility model provides a multi-functional low-power consumption solid state hard drives test cabinet, includes server (2), RISER card (3), RAID card (4), SATA line, SATA circuit board (51) and external power supply (6), its characterized in that: RISER card (3) are installed on PCIE interface (22) of server (2), RAID card (4) are installed on the PCIE expansion slot (31) of RISER card (3), SATA circuit board (51) pass through SATA line and RAID card (4) electric connection, and outer power supply (6) are connected and provide the direct current with SATA circuit board (51), SATA circuit board (51) are equipped with a plurality of SATA interfaces (54) that are used for installing SSD (5).

2. The multifunctional low-power-consumption solid state disk test cabinet according to claim 1, characterized in that: the server (2) is installed on the test cabinet (1) through the slide rail, universal wheel (11) are installed to the bottom of test cabinet (1), and glass door (12) are all installed to the front and back of test cabinet (1), and display screen (13) that show server (2) running state are installed at the top of test cabinet (1), and one side at test cabinet (1) is installed in SATA circuit board (51).

3. The multifunctional low-power consumption solid state disk test cabinet of claim 1, characterized in that: the SATA line is an SFF-8087-to-4 SATA line (42), one end of the SFF-8087-to-4 SATA line (42) is installed on an SFF-8087 interface (41) on the RAID card (4), and the other end of the SFF-8087-to-4 SATA line is installed on 4SATA ports on the SATA circuit board (51).

4. The multifunctional low-power-consumption solid state disk test cabinet according to claim 1, characterized in that: the external power supply (6) converts 220V alternating current into 12V direct current and supplies the direct current to the SATA circuit board (51), and a circuit board switch (52) is arranged on the SATA circuit board (51).

5. The multifunctional low-power-consumption solid state disk test cabinet according to claim 1, characterized in that: the external power supply (6) is arranged on the surface of the server upper cover (21), and the SATA circuit board (51) is arranged on the surface of the server upper cover (21) through a support post (53).

6. The multifunctional low-power consumption solid state disk test cabinet of any one of claims 1 to 5, characterized in that: and the server (2) is provided with BIT, H2 and RDT programs.