CN219676153U

CN219676153U - USB flash disk aging tester of 3.0/3.1 protocol USB interface

Info

Publication number: CN219676153U
Application number: CN202320278428.7U
Authority: CN
Inventors: 柴新辉; 占志敏
Original assignee: Shenzhen Wison Technology Co ltd
Current assignee: Shenzhen Wison Technology Co ltd
Priority date: 2023-02-22
Filing date: 2023-02-22
Publication date: 2023-09-12
Anticipated expiration: 2033-02-22

Abstract

The utility model discloses a USB flash disk aging tester with a 3.0/3.1 protocol USB interface, and belongs to the technical field of USB flash disk aging testing equipment. The utility model comprises a host, a PCIE expansion card, an NVME expansion card and a HUB HUB. The PCI E expansion card is installed on a PCIE slot of the host, the NVME expansion card is installed on the PCIE slot of the PCIE expansion card, the HUB HUB is electrically connected with the sockets on the NVME expansion card, and a plurality of USB sockets are arranged on the HUB HUB. And the USB flash disk is inserted into the USB socket during testing. According to the utility model, the PCIE slot of the host is expanded, then the NVME expansion card is adopted for expansion, and finally the HUB HUB with the transmission speed of 10Gbps is adopted for expanding the USB interfaces to 64, so that the read-write speed of a single USB interface is 100MB/s; meanwhile, the HUB HUB adopts two installation schemes to meet the requirements of small batch and mass production, so that the space of the USB flash disk aging tester is effectively reduced, the production efficiency of a USB flash disk factory is improved, the equipment investment cost is saved, and the energy, the land and the labor cost are saved.

Description

USB flash disk aging tester of 3.0/3.1 protocol USB interface

Technical Field

The utility model belongs to the technical field of USB flash disk aging test equipment, and particularly relates to a USB flash disk aging test machine with a 3.0/3.1 protocol USB interface.

Background

The existing USB flash disk aging test method for the 3.0/3.1 protocol interface is a single computer host, 16 USB flash disks are tested simultaneously through a HUB with the transmission speed of 5Gbps, the speed is relatively slow, the reading speed and the writing speed of the single USB interface are about 35MB per second, the test time is about 2 hours for testing a USB flash disk with the capacity of 128G, the test time is relatively long, only a plurality of computer devices can be increased for increasing the productivity, and waste including sites, manpower and energy consumption is caused. As shown in fig. 1, the general test device for a usb disk is disclosed in chinese patent 2012204486848, which mainly aims to solve the problems of easy virus infection, increased production cost, low test efficiency and unsuitable mass production in the usb disk test, but adopts too many keys and key input circuits, so that the intelligentization is low. Therefore, a USB flash disk aging tester with a 3.0/3.1 protocol USB interface is provided, and the problems are solved.

Disclosure of Invention

The utility model aims to provide a USB flash disk aging tester with a 3.0/3.1 protocol USB interface, and aims to solve the problems that an existing USB flash disk aging tester in the background art is large in area, labor-saving, energy-saving, low in efficiency and low in intelligence. In order to achieve the purpose, the utility model adopts the following technical scheme: a USB flash disk aging tester with 3.0/3.1 protocol USB interface comprises a host, a PCIE expansion card, an NVME expansion card and a HUB HUB. The PCI E expansion card is installed on a PCIE slot of the host, the NVME expansion card is installed on the PCIE slot of the PCIE expansion card, the HUB HUB is electrically connected with the sockets on the NVME expansion card, and a plurality of USB sockets are arranged on the HUB HUB. And the USB flash disk is inserted into the USB socket during testing.

More preferably, the HUB is mounted on the surface of the host, if the host has only a single PCIE slot, the PCIE expansion card expands the PCIE slot first, the multiple NVME expansion cards are mounted on the PCIE expansion card, the PCIE expansion card is connected with the HUB, 32 USB discs can be inserted at the same time, the reading speed and the writing speed of the single USB socket reach about 100MB per second, and the single host can rapidly detect the USB discs in a batch. And HUB concentrator installs on the host computer surface, and small occupation of land is few, convenient operation is fit for miniaturized test USB flash disk.

More preferably, the host computer is installed on the test cabinet through the slide rail, and the universal wheel is installed to the bottom of test cabinet, and glass door is all installed at the front and back of test cabinet, and the display screen that shows host computer running state is installed at the top of test cabinet. The test cabinet can be provided with a plurality of hosts, and a single host can process 64U disks, so that a large-scale test can be performed, and the test cabinet is suitable for a large-scale factory.

Further describing above-mentioned scheme, HUB concentrator installs in the place ahead of test cabinet, with glass door parallel installation, makes things convenient for the tester to load and unload the USB flash disk, improves production efficiency.

Furthermore, the PCIE expansion card is PCIE3.0x16 to 4 ports, the NVME expansion card is SFF-8643, and the calculation force of the host is fully exerted.

Further describing the scheme, the H2 testing software is installed in the host, and the testing software has the testing functions of 32 ports and 64 ports. The test software firstly writes data into the USB flash disk, then reads the data out, and checks whether the written and read data are correct or not so as to judge whether the read and written USB flash disk has bad blocks or not.

Compared with the prior art, the utility model can fully exert the calculation power of the host, expands PCIE slots of the host, expands by adopting NVME expansion cards, and finally expands the USB sockets to 64 by adopting a HUB HUB with the transmission speed of 10Gbps, wherein the read-write speed of a single USB socket reaches 100MB/s; meanwhile, the HUB HUB adopts two installation schemes to meet the requirements of small batch and mass production, so that the space of the USB flash disk aging tester is effectively reduced, the production efficiency of a USB flash disk factory is improved, the equipment investment cost is saved, and the energy, the land and the labor cost are saved.

Drawings

FIG. 1 is a schematic diagram of the present utility model of China patent 2021213901548;

FIG. 2 is a schematic diagram of an embodiment of the present utility model;

FIG. 3 is a schematic illustration of an installation provided by an embodiment of the present utility model;

FIG. 4 is an exploded view of an embodiment of the present utility model;

FIG. 5 is a schematic illustration of the use of an embodiment of the present utility model;

fig. 6 is a schematic diagram of an embodiment of the present utility model.

Wherein, each reference sign in the figure:

1. a test cabinet; 11. a universal wheel; 12. a glass door; 13. a display screen; 2. a host; 21. a HUB; 211. a USB socket; 22. PCIE slots; 221. PCIE expansion card; 23. NVME expansion card.

Industry term interpretation:

USB flash disk: is a short name of USB (USBflashdisk) disk, and harmonic is also called as "USB disk".

HUB: the hub is a multiport repeater.

H2: h2testw is a detection tool from Germany, which tests the actual writing speed of the U disk by writing data, reads out the data, and checks whether the written data are correct or not so as to judge whether the read and written U disk has bad blocks or not. NVME expansion card: refers to a function expansion card or a transit card inserted on a PCIE interface.

PCIE slot: PCI-Express (peripheralcomponentinterconnectexpress) is a high-speed serial computer expansion bus standard, PCIE belongs to high-speed serial point-to-point dual-channel high-bandwidth transmission, and connected devices allocate exclusive channel bandwidth and do not share bus bandwidth, and mainly support functions of active power management, error reporting, end-to-end reliability transmission, hot plug, quality of service (QOS) and the like.

Detailed Description

In order that the utility model may be readily understood, a more complete description of the utility model will be rendered by reference to the appended drawings. The drawings illustrate preferred embodiments of the utility model. This utility model may, however, be embodied in many different forms and should not be construed as limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete.

The technical scheme of the patent is further described in detail below with reference to the specific embodiments.

As shown in fig. 2-6, the utility model provides a 3.0/3.1 protocol USB interface USB flash disk aging tester, which includes a host 2, a PCIE expansion card 221, an NVME expansion card 23, and a HUB 21. As shown in fig. 3 and 4, the PCIE expansion card 221 is a PCIE 3.0x16-to-4 port, the NVME expansion card 23 is an SFF-8643, the PCIE expansion card 221 is installed on a PCIE slot 22 of the host 2, the NVME expansion card 23 is installed on the PCIE slot 22 of the PCIE expansion card 221, the HUB 21 is electrically connected with a socket on the NVME expansion card 23, and a plurality of USB sockets 211 are provided on the HUB 21. The USB flash disk is inserted into the USB socket 211 during testing.

As shown in fig. 2, the HUB 21 is mounted on the surface of the host 2, if the host 2 has only a single PCIE slot 22, the PCIE expansion card 221 expands the PCIE slot 22 first, a plurality of NVME expansion cards 23 are mounted on the PCIE expansion card 221, the PCIE expansion card 221 is connected to the HUB 21, and 32 USB discs can be inserted at the same time, so that the read speed and the write speed of the single USB socket 211 reach about 100MB per second, and a single host 2 can quickly detect the USB discs in a batch. And HUB concentrator 21 installs at host computer 2 surface, and small occupation of land is few, convenient operation is fit for miniaturized test USB flash disk.

As shown in fig. 5, the host computer 2 is mounted on the test cabinet 1 through a slide rail, universal wheels 11 are mounted at the bottom of the test cabinet 1, glass doors 12 are mounted at the front and rear sides of the test cabinet 1, and a display screen 13 for displaying the running state of the host computer 2 is mounted at the top of the test cabinet 1. The test cabinet 1 can be provided with a plurality of mainframes 2, 64U disks can be processed by a single mainframe 2, in the embodiment, the test cabinet 1 can be provided with 6 mainframes 2, namely, the total U disk installation quantity is 384U disks, and the test cabinet can be used for carrying out mass test and is suitable for large-scale factories. The HUB concentrator 21 is installed in the place ahead of test cabinet 1, with glass door 12 parallel arrangement, makes things convenient for the tester to load and unload the USB flash disk, improves production efficiency.

The host 2 is internally provided with H2test software which has the test functions of 32 ports and 64 ports. The test software firstly writes data into the USB flash disk, then reads the data out, and checks whether the written and read data are correct or not so as to judge whether the read and written USB flash disk has bad blocks or not.

In the embodiment of the utility model, the model of the host 2 is the delr 720, the model of the CPU is the xene 5-2609, and two types of the host 2 are provided, and the host 2 is internally provided with the H2test software. The existing USB flash disk aging test method for the 3.0/3.1 protocol interface is that a single computer host 2 tests 16 USB flash disks simultaneously through a HUB with a transmission speed of 5Gbps, the speed is relatively slow, the reading speed and the writing speed of the single USB interface are about 35MB per second, the test time is about 2 hours for testing a USB flash disk with 128G capacity, the test time is relatively long, and only a plurality of computer devices can be increased for increasing the productivity, so that waste including sites, manpower and energy consumption is caused. Referring to fig. 6, two pcie 3.0x16-4-port SFF-8643NVME expansion cards 23 are adopted in the utility model, the HUB 21 connected with the transmission speed of 10Gbps tests 64 USB discs simultaneously, the read speed and the write speed of a single USB interface reach about 100MB per second, in addition, for the purpose that the aging test function is easier to operate, test software of 32 ports and 64 ports is developed on the basis of the original 16-port H2test software, thereby effectively improving the production efficiency of a USB disc factory and saving the input cost of equipment.

It will be understood that when an element is referred to as being "fixed to" another element, it can be directly on the other element or intervening elements may also be present. When an element is referred to as being "connected" to another element, it can be directly connected to the other element or intervening elements may also be present. In contrast, when an element is referred to as being "directly on" another element, there are no intervening elements present. The terms "vertical," "horizontal," "left," "right," and the like are used herein for illustrative purposes only and are not meant to be the only embodiments, and the terms "upper," "lower," "left," "right," "front," "back," and the like are used herein with reference to the positional relationship of the drawings.

Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this utility model belongs. The terminology used herein in the description of the utility model is for the purpose of describing particular embodiments only and is not intended to be limiting of the utility model. The term "and/or" as used herein includes any and all combinations of one or more of the associated listed items.

The above embodiments are only for illustrating the present utility model, not for limiting the present utility model, and various changes and modifications may be made by one of ordinary skill in the relevant art without departing from the spirit and scope of the present utility model, and therefore, all equivalent technical solutions are also within the scope of the present utility model, and the scope of the present utility model is defined by the claims.

Claims

1. The USB flash disk aging tester of 3.0/3.1 protocol USB interface, including host computer (2), PCIE expansion card (221), NVME expansion card (23), HUB concentrator (21), its characterized in that: the PCIE expansion card (221) is installed on a PCIE slot (22) of the host (2), the NVME expansion card (23) is installed on the PCIE slot (22) of the PCIE expansion card (221), the HUB HUB (21) is electrically connected with a socket on the NVME expansion card (23), and a plurality of USB sockets (211) are arranged on the HUB HUB (21).

2. The USB flash drive aging tester of 3.0/3.1 protocol USB interface of claim 1, wherein: the HUB concentrator (21) is arranged on the surface of the host (2).

3. The USB flash drive aging tester of 3.0/3.1 protocol USB interface of claim 1, wherein: the main machine (2) is arranged on the test cabinet (1) through a sliding rail, universal wheels (11) are arranged at the bottom of the test cabinet (1), glass doors (12) are arranged at the front and rear surfaces of the test cabinet (1), and a display screen (13) for displaying the running state of the main machine (2) is arranged at the top of the test cabinet (1).

4. A USB flash drive aging tester according to claim 3, wherein: the HUB concentrator (21) is arranged in front of the test cabinet (1) and is arranged in parallel with the glass door (12).

5. The USB flash drive aging tester of 3.0/3.1 protocol USB interface of claim 1, wherein: the PCIE expansion card (221) is PCIE 3.0x16-to-4-port, and the NVME expansion card (23) is SFF-8643.

6. The USB flash drive aging tester according to any one of claims 1-5, wherein: and H2test software is installed in the host (2).