CN217901954U - Simple integrated circuit testing device - Google Patents
Simple integrated circuit testing device Download PDFInfo
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- CN217901954U CN217901954U CN202221448811.4U CN202221448811U CN217901954U CN 217901954 U CN217901954 U CN 217901954U CN 202221448811 U CN202221448811 U CN 202221448811U CN 217901954 U CN217901954 U CN 217901954U
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Abstract
The utility model discloses a simple integrated circuit testing device, which belongs to the technical field of circuit testing and comprises a base and a tester body, wherein a testing platform is fixedly arranged at the upper end of the base, two moving grooves are formed in the upper wall of the testing platform, moving columns are connected to the inner walls of the moving grooves in a sliding manner, two transmission mechanisms which respectively drive the moving columns at two sides to move are arranged in the testing platform, and a first clamping plate is fixedly connected to one end of each moving column at two sides, which is close to each other; the first clamping plate and the second clamping plate can be used for effectively and thoroughly clamping and limiting the front, back, left and right directions of the integrated circuit board, so that the movement deviation of the integrated circuit board during testing can be avoided, and the data accuracy of the testing is also greatly improved; the distance between two adjustable first grip blocks and the second grip block adapts to the integrated circuit board of different specification sizes, can satisfy the use under the different conditions, and the result of use is showing and is promoting.
Description
Technical Field
The utility model relates to a circuit test technical field, more specifically say, relate to a simple and easy integrated circuit testing arrangement.
Background
An integrated circuit is a microelectronic device or component. The transistor, resistor, capacitor and inductor elements and wiring required in a circuit are interconnected together by a certain process, and are manufactured on a small semiconductor wafer or a plurality of small semiconductor wafers or medium substrates, and then are packaged in a package to form the micro-structure with the required circuit function. The integrated circuit board is a carrier for loading the integrated circuit, and the integrated circuit board needs to be tested before leaving a factory to verify whether the integrated circuit board is qualified or not.
At present, an integrated circuit board is generally directly placed on a test bench in testing, effective fixed limitation is not carried out on the integrated circuit board, the integrated circuit board is easy to move and deflect in testing, the testing is influenced, the testing efficiency is reduced, and errors in the accuracy of tested data can be caused; or the prior integrated circuit board with fixed specification and size is fixed, the application range is small, the use of the integrated circuit boards with different models and sizes cannot be met, and the use effect is poor.
Therefore, it is desirable to provide a simple ic testing apparatus to solve the above problems.
SUMMERY OF THE UTILITY MODEL
An object of the utility model is to provide a simple and easy integrated circuit testing arrangement is in order to solve above-mentioned technical problem.
In order to achieve the above purpose, the utility model adopts the following technical scheme:
the utility model provides a simple and easy integrated circuit testing arrangement, includes base and tester body, the upper end fixed mounting of base has test platform, two shifting chutes have been seted up to test platform's upper wall, the inner wall sliding connection of shifting chute has the removal post, test platform is inside to be equipped with two drive mechanisms that drive both sides respectively and remove the post removal, both sides the first grip block of the equal fixedly connected with of one end that the removal post is close to each other, test platform's upper end fixedly connected with riser, test platform's front end is equipped with even board, be equipped with coupling mechanism between even board and the test platform, the front end fixedly connected with switching post of even board, the equal fixedly connected with second grip block of one end that switching post and riser are close to mutually.
Further, drive mechanism is including seting up in the inside transmission chamber of test platform, the transmission chamber communicates with the shifting chute, it is connected with the pivot to rotate between the wall about the transmission chamber, the outer wall of pivot is equipped with screw thread and spiro union has the nut piece, the upper end of nut piece is fixed with the bottom of removal post.
Furthermore, coupling mechanism is including two activity grooves of seting up in test platform inside, the inner wall sliding connection in activity groove has the movable rod, fixedly connected with spring between the one end of movable rod and the inner wall in activity groove, the other end of movable rod is fixed mutually with the outer wall of even board.
Furthermore, the upper wall and the lower wall of the movable groove are both provided with limiting sliding grooves, the inner walls of the limiting sliding grooves are connected with sliding blocks in a sliding mode, and the ends, close to each other, of the sliding blocks on the two sides are fixedly connected with the outer wall of the movable rod.
Further, a sliding rod is fixedly connected between the left wall and the right wall of the transmission cavity, the sliding rod penetrates through the nut block in a sliding mode, and a rotating wheel is fixedly mounted at the outer end of the rotating shaft.
Further, the middle parts of the first clamping plate and the second clamping plate are provided with clamping grooves, and the inner walls of the clamping grooves are provided with protective soft pads.
Further, a through hole is formed in the middle of the test platform, an electric telescopic rod is fixedly mounted at the upper end of the base, a supporting plate is fixedly connected to the telescopic end of the electric telescopic rod, and the diameter of the supporting plate is smaller than that of the through hole.
Compared with the prior art, the utility model has the advantages of:
this scheme is through even board and coupling mechanism's mating reaction for the second grip block of both sides is fixed integrated circuit board's fore-and-aft direction, and can fix the integrated circuit board of different model widths through changing the distance between the second grip block of both sides, and application scope is wide.
Make the first grip block clamp of both sides to fix the left and right sides of integrated circuit board through drive mechanism, can be further spacing fixed to integrated circuit board promptly, can adjust the displacement of the first grip block of both sides according to the different length of different integrated circuit boards, the flexibility is strong.
The first clamping plate and the second clamping plate can be used for effectively and thoroughly clamping and limiting the front, back, left and right directions of the integrated circuit board, so that on one hand, the integrated circuit board can be prevented from moving and deviating during testing, the testing can be smoothly carried out, the testing efficiency is greatly improved, the data accuracy of the testing is greatly improved, and the testing effect is good; on the other hand, the distance between two adjustable first grip blocks and the second grip block adapts to the integrated circuit board of different specification sizes, has avoided at present generally can only fix the condition to the circuit board of fixed size, can satisfy the use under the different condition, and the result of use is showing and is promoting.
Drawings
Fig. 1 is a schematic perspective view of the present invention;
FIG. 2 is an enlarged schematic view of the structure at A in FIG. 1;
FIG. 3 is a schematic view of the front view of the internal structure of the testing platform of the present invention;
fig. 4 is a schematic view of the local side-view internal structure of the testing platform of the present invention;
fig. 5 is a schematic view of the top view structure of the testing platform of the present invention.
The reference numbers in the figures illustrate:
1. a base; 2. a tester body; 3. a test platform; 4. a moving groove; 5. moving the column; 6. a transmission mechanism; 601. a transmission cavity; 602. a rotating shaft; 603. a nut block; 7. a first clamping plate; 8. a connecting mechanism; 801. a movable groove; 802. a movable rod; 803. a spring; 9. connecting plates; 10. a vertical plate; 11. a transfer column; 12. a second clamping plate; 13. a restricting chute; 14. a slider; 15. a slide bar; 16. a rotating wheel; 17. a clamping groove; 18. a through hole; 19. an electric telescopic rod; 20. and (4) supporting the disc.
Detailed Description
The first embodiment is as follows:
please refer to fig. 1 and 3-5, a simple integrated circuit testing device, including base 1 and tester body 2, the upper end fixed mounting of base 1 has test platform 3, two shift chutes 4 have been seted up to test platform 3's upper wall, the inner wall sliding connection of shift chute 4 has shift column 5, test platform 3 is inside to be equipped with two drive mechanism 6 that drive both sides shift column 5 respectively and remove, the equal fixedly connected with first grip block 7 of one end that both sides shift column 5 are close to each other, test platform 3's upper end fixedly connected with riser 10, test platform 3's front end is equipped with even board 9, be equipped with coupling mechanism 8 between even board 9 and test platform 3, the front end fixedly connected with keysets 11 of even board 9, the equal fixedly connected with second grip block 12 of one end that keysets 11 and riser 10 are close to each other. When the integrated circuit board fixing device is used, firstly, the connecting plate 9 is pulled, the connecting plate 9 moves outwards under the matching action of the connecting mechanism 8, so that the distance between the second clamping plates 12 on the two sides is gradually increased, then, an integrated circuit board to be tested is placed between the two second clamping plates 12, after the connecting plate 9 is loosened, the second clamping plates 12 on the two sides can fix the front and back direction of the integrated circuit board, and integrated circuit boards with different types and widths can be fixed by changing the distance between the second clamping plates 12 on the two sides; then make the first grip block 7 centre gripping of both sides fix integrated circuit board's the left and right sides through drive mechanism 6, can be further spacing fixed to integrated circuit board promptly, can adjust the displacement of the first grip block 7 of both sides according to the different length of different integrated circuit boards, the flexibility is strong. From the above, the first clamping plate 7 and the second clamping plate 12 can be used for effectively and thoroughly clamping and limiting the front, back, left and right directions of the integrated circuit board, on one hand, the movement deviation of the integrated circuit board during testing can be avoided, the smooth running of the testing is ensured, the testing efficiency is greatly improved, the data accuracy of the testing is also greatly improved, and the testing effect is good; on the other hand, the distance between two adjustable first grip blocks 7 and the second grip block 12 adapts to the integrated circuit board of different specification sizes, has avoided generally can only fix the condition to the circuit board of fixed size at present, can satisfy the use under the different condition, and the result of use is showing and is promoting. After the fixing is finished, the integrated circuit board can be tested through the tester body 2.
The middle parts of the first clamping plate 7 and the second clamping plate 12 are provided with clamping grooves 17, and the inner walls of the clamping grooves 17 are provided with protective soft pads. The clamping groove 17 can facilitate the placement and fixation of the integrated circuit, further avoid the situation that the integrated circuit is separated from the moving, and protect the side edge of the integrated circuit board through the protective soft cushion.
Referring to fig. 3, the transmission mechanism 6 includes a transmission cavity 601 opened inside the testing platform 3, the transmission cavity 601 is communicated with the moving slot 4, a rotating shaft 602 is rotatably connected between the left wall and the right wall of the transmission cavity 601, the outer wall of the rotating shaft 602 is provided with threads and is screwed with a nut block 603, and the upper end of the nut block 603 is fixed to the bottom of the moving column 5. The rotating wheel 16 is rotated to drive the rotating shaft 602 to rotate, the rotating shaft 602 can drive the nut block 603 and the moving column 5 to move along the moving groove 4 when rotating, at the moment, the moving columns 5 on two sides move towards the direction close to each other, the moving column 5 can drive the first clamping plate 7 to move towards the direction close to the integrated circuit board, finally, the first clamping plates 7 on two sides clamp and fix the left side and the right side of the integrated circuit board, and the moving distance of the first clamping plates 7 on two sides can be adjusted according to different lengths of different integrated circuit boards.
A sliding rod 15 is fixedly connected between the left wall and the right wall of the transmission cavity 601, the sliding rod 15 penetrates through the nut block 603 in a sliding manner, and a rotating wheel 16 is fixedly mounted at the outer end of the rotating shaft 602. When the rotating shaft 602 drives the nut block 603 to move, the nut block 603 can slide along the sliding rod 15, so that the rotation of the nut block 603 can be further limited, the nut block 603 can only move left and right, the moving stability of the nut block 603 can be improved, and the moving and clamping stabilizing effects of the first clamping plate 7 can be further improved.
Referring to fig. 4, the connection mechanism 8 includes two movable grooves 801 opened inside the testing platform 3, the inner walls of the movable grooves 801 are slidably connected with movable rods 802, springs 803 are fixedly connected between one ends of the movable rods 802 and the inner walls of the movable grooves 801, and the other ends of the movable rods 802 are fixed to the outer walls of the connecting plates 9. Even board 9 of outside pulling, even board 9 can drive movable rod 802 and move outwards along activity groove 801, and can extension spring 803 simultaneously, even board 9 can drive adapter column 11 and second grip block 12 and move towards the direction of keeping away from riser 10 this moment, place integrated circuit board again between two second grip blocks 12, then loosen even board 9, the effect through spring 803 can drive movable rod 802 and move towards activity groove 801 inside this moment, movable rod 802 can drive even board 9 and second grip block 12 and move towards integrated circuit board's direction promptly, finally fix integrated circuit board's fore-and-aft direction through both sides second grip block 12.
Referring to fig. 1-2 and 5, a through hole 18 is formed in the middle of the testing platform 3, an electric telescopic rod 19 is fixedly installed at the upper end of the base 1, a telescopic end of the electric telescopic rod 19 is fixedly connected with a supporting plate 20, and the diameter of the supporting plate 20 is smaller than that of the through hole 18. Starting electric telescopic handle 19 and can driving supporting disk 20 and rise, supporting disk 20 can pass through-hole 18 and come 3 top suitable positions of test platform, can come to support integrated circuit board's bottom through supporting disk 20 this moment, can improve the protection effect to integrated circuit board.
The working principle is as follows: when the integrated circuit board fixing device is used, firstly, the connecting plate 9 is pulled outwards, the connecting plate 9 can drive the movable rod 802 to move outwards along the movable groove 801, and meanwhile, the spring 803 can be stretched, at the moment, the connecting plate 9 can drive the adapter column 11 and the second clamping plate 12 to move towards the direction far away from the vertical plate 10, namely, the distance between the second clamping plates 12 on the two sides is gradually increased, after the integrated circuit board to be tested is added to a certain position, the integrated circuit board to be tested is placed between the two second clamping plates 12, the integrated circuit board enters the clamping groove 17, then the connecting plate 9 is loosened, at the moment, the movable rod 802 can be driven to move towards the inside of the movable groove 801 under the action of the spring 803, the movable rod 802 can drive the connecting plate 9 and the second clamping plates 12 to move towards the direction of the integrated circuit board, finally, the front and back direction of the integrated circuit board can be fixed through the second clamping plates 12 on the two sides, preliminary limit fixing is carried out on the integrated circuit board, and the integrated circuit boards with different widths can be fixed by changing the distance between the second clamping plates 12 on the two sides. Then can rotate runner 16 respectively and drive pivot 602 and rotate, can drive nut block 603 and removal post 5 and remove along shifting chute 4 when pivot 602 rotates, make both sides remove the post 5 and remove towards the direction that is close to each other this moment, remove post 5 and can drive first grip block 7 and remove towards the direction that is close to integrated circuit board promptly, finally make the first grip block 7 centre gripping of both sides fix the left and right sides of integrated circuit board, can be to integrated circuit board further thorough spacing fixed.
After the fixing is finished, the integrated circuit board can be tested through the tester body 2, after the testing is finished, the rotating wheel 16 can rotate reversely, the first clamping plate 7 is driven to be away from the integrated circuit board through the matching of the transmission mechanism 6, the second clamping plate 12 can be far away from the integrated circuit board by outwards pulling the connecting plate 9, the integrated circuit board which is tested can be taken away, and the next testing can be carried out.
Claims (7)
1. The utility model provides a simple and easy integrated circuit testing arrangement, includes base and tester body, its characterized in that: the upper end fixed mounting of base has test platform, two shifting chutes have been seted up to test platform's upper wall, the inner wall sliding connection of shifting chute has the removal post, test platform is inside to be equipped with two drive mechanism that drive both sides removal post removal respectively, both sides the equal fixedly connected with first grip block of one end that the removal post is close to each other, test platform's upper end fixedly connected with riser, test platform's front end is equipped with even board, be equipped with coupling mechanism between even board and the test platform, the front end fixedly connected with switching post of even board, the equal fixedly connected with second grip block of one end that switching post and riser are close to mutually.
2. The device of claim 1, wherein: the transmission mechanism is including seting up in the inside transmission chamber of test platform, transmission chamber and removal groove communicate mutually, it is connected with the pivot to rotate between the wall about the transmission chamber, the outer wall of pivot is equipped with screw thread and spiro union has the nut piece, the upper end of nut piece is fixed mutually with the bottom of removal post.
3. The device of claim 1, wherein: the connecting mechanism comprises two movable grooves arranged inside the test platform, the inner walls of the movable grooves are connected with movable rods in a sliding mode, springs are fixedly connected between one ends of the movable rods and the inner walls of the movable grooves, and the other ends of the movable rods are fixed to the outer wall of the connecting plate.
4. A device for testing a simple integrated circuit as defined in claim 3, wherein: the upper wall and the lower wall of the movable groove are both provided with limiting sliding grooves, the inner walls of the limiting sliding grooves are connected with sliding blocks in a sliding mode, and the ends, close to the sliding blocks, of the two sides of the sliding blocks are fixedly connected with the outer wall of the movable rod.
5. The device of claim 2, wherein: fixedly connected with slide bar between the left and right wall in transmission chamber, the slide bar slides and runs through the nut piece, the outer end fixed mounting of pivot has the runner.
6. The device of claim 1, wherein: the middle part of first grip block and second grip block has all been seted up and has been pressed from both sides the groove, the inner wall that presss from both sides the groove all is provided with the protection cushion.
7. The device of claim 1, wherein: the testing platform is characterized in that a through hole is formed in the middle of the testing platform, an electric telescopic rod is fixedly mounted at the upper end of the base, a supporting plate is fixedly connected with the telescopic end of the electric telescopic rod, and the diameter of the supporting plate is smaller than that of the through hole.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202221448811.4U CN217901954U (en) | 2022-06-10 | 2022-06-10 | Simple integrated circuit testing device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202221448811.4U CN217901954U (en) | 2022-06-10 | 2022-06-10 | Simple integrated circuit testing device |
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| Publication Number | Publication Date |
|---|---|
| CN217901954U true CN217901954U (en) | 2022-11-25 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202221448811.4U Active CN217901954U (en) | 2022-06-10 | 2022-06-10 | Simple integrated circuit testing device |
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| CN (1) | CN217901954U (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116165520A (en) * | 2023-03-18 | 2023-05-26 | 深圳市俊成兴邦科技有限公司 | Integrated circuit heat dispersion testing device |
| CN116243031A (en) * | 2023-04-19 | 2023-06-09 | 江苏友润微电子有限公司 | Integrated circuit test fixture |
-
2022
- 2022-06-10 CN CN202221448811.4U patent/CN217901954U/en active Active
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116165520A (en) * | 2023-03-18 | 2023-05-26 | 深圳市俊成兴邦科技有限公司 | Integrated circuit heat dispersion testing device |
| CN116243031A (en) * | 2023-04-19 | 2023-06-09 | 江苏友润微电子有限公司 | Integrated circuit test fixture |
| CN116243031B (en) * | 2023-04-19 | 2024-05-28 | 江苏友润微电子有限公司 | Integrated circuit test fixture |
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