CN217521167U

CN217521167U - Device for testing sensitivity of probe

Info

Publication number: CN217521167U
Application number: CN202221051568.2U
Authority: CN
Inventors: 虞新剑; 殷永超; 殷建兵; 潘彦
Original assignee: Yingtan Yuntan Electronic Technology Co ltd
Current assignee: Yingtan Yuntan Electronic Technology Co ltd
Priority date: 2022-05-05
Filing date: 2022-05-05
Publication date: 2022-09-30
Anticipated expiration: 2032-05-05

Abstract

The utility model relates to a sensitivity testing device especially relates to a probe sensitivity testing device. The utility model aims at providing a once can carry out the device of the test probe sensitivity that tests to 8 probes. The technical scheme is as follows: the utility model provides a device of test probe sensitivity, is including chassis, guide pillar, lifting disk, installation piece and second clamp splice etc, and chassis top intermediate junction has 4 guide pillars that have the guide effect, and sliding connection has the lifting disk that can reciprocate between 4 guide pillars, and the lifting disk outside is connected with 8 installation pieces along the circumferencial direction, and equal sliding connection has the second clamp splice that can press from both sides tightly on the installation piece. The utility model discloses a second clamp splice on 8 installation pieces, second clamp splice can press from both sides tightly the probe, and therefore, this device once only can test 8 probes to, reduce test time, improve people's work efficiency.

Description

Device for testing sensitivity of probe

Technical Field

The utility model relates to a sensitivity testing's device especially relates to a probe sensitivity testing's device.

Background

The probe is a small single-stranded DNA or RNA fragment, is generally used for detection, and a testing device is required to test the sensitivity of the probe in the production process of the probe.

First, the probe is placed on a testing device, and then the sensitivity of the probe is tested, but the testing device can only test one probe at a time, resulting in a long testing time, thereby affecting the working efficiency of people, and therefore, a device for testing the sensitivity of the probe, which can test 8 probes at a time, is now developed.

SUMMERY OF THE UTILITY MODEL

In order to overcome the defect that the test time is long, the utility model aims to provide a device which can test the sensitivity of the test probe for 8 probes.

The technical scheme is as follows: the utility model provides a device of test probe sensitivity, which comprises a base, the guide pillar, the lifting disk, the installation piece, first clamp splice, second clamp splice and spring, chassis top intermediate junction has 4 guide pillars that have the guide effect, 4 slidingtype connections have the lifting disk that can reciprocate between the guide pillar, the lifting disk outside is connected with 8 installation pieces along the circumferencial direction, equal slidingtype connection has the second clamp splice that can carry out the clamp on one side inner wall of every installation piece, all be connected with first clamp splice on the opposite side inside of every installation piece, adjacent first clamp splice and the mutual setting of corresponding of second clamp splice, all be connected with the spring that has the reset effect between second clamp splice and the installation piece.

As a further preferable scheme, the lifting device further comprises a servo motor and a screw shaft, wherein the servo motor is connected to the middle of the top of the base plate and located between the guide posts, the screw shaft capable of rotating is connected to the upper side of an output shaft of the servo motor, and the screw shaft is in threaded connection with the lifting plate.

As further preferred scheme, still including supporting shoe, lift post, wedge pole, wedge and connecting rod, every installation piece top all is connected with the supporting shoe, and the gliding style is connected with the lift post on the supporting shoe, and lift post upper portion is connected with the wedge pole, and the second clamp splice outside all is connected with the connecting rod that can remove, and the connecting rod upside all is connected with the wedge.

As a further preferable scheme, the multifunctional vehicle further comprises a non-slip mat, and the bottom of the chassis is connected with the non-slip mat.

As a further preferable scheme, the lifting plate further comprises handles, and the front side and the rear side of the top of the lifting plate are connected with the handles.

As a further preferable scheme, the rubber mat is further included, and the number of the rubber mats on the top of the chassis along the circumferential direction is 8.

The utility model has the advantages of it is following: 1. the utility model discloses a second clamp splice on 8 installation pieces, second clamp splice can press from both sides tightly the probe, and therefore, this device once only can test 8 probes to, reduce test time, improve people's work efficiency.

2. The utility model discloses a connecting rod in the second clamp splice outside, when the probe is unqualified, the connecting rod can make the second clamp splice release the probe, does not need people to take off the probe manually to, reduce people's labour.

Drawings

Fig. 1 is a schematic perspective view of the present invention.

Fig. 2 is a schematic view of the three-dimensional structure of the mounting block, the first clamping block, the second clamping block and the spring of the present invention.

Fig. 3 is a schematic view of the three-dimensional structure of the chassis, the servo motor, the screw shaft and the lifting plate of the present invention.

Fig. 4 is a schematic view of a partial three-dimensional structure of the present invention.

Number designation in the figures: 1-chassis, 2-guide post, 3-lifting disk, 15-rubber pad, 16-non-slip pad, 17-handle, 4-mounting block, 5-first clamping block, 6-second clamping block, 7-spring, 8-servo motor, 9-screw shaft, 10-supporting block, 11-lifting post, 12-wedge rod, 13-wedge block and 14-connecting rod.

Detailed Description

The following further describes the technical solution with reference to specific embodiments, and it should be noted that: the words upper, lower, left, right, etc. used herein to indicate orientation are simply for the location of the illustrated structure in the corresponding figures. The serial numbers of the parts are themselves numbered herein, for example: first, second, etc. are used solely to distinguish one from another as to objects described herein, and do not have any sequential or technical meaning. The application states that: the connection and coupling, unless otherwise stated, include both direct and indirect connections (couplings).

Example 1

A device for testing the sensitivity of a probe is disclosed, as shown in figure 1, figure 2 and figure 3, and comprises a chassis 1, guide posts 2, a lifting disc 3, mounting blocks 4, a first clamping block 5, a second clamping block 6, a spring 7, an anti-slip pad 16, a handle 17 and a rubber pad 15, wherein 4 guide posts 2 are welded in the middle of the top of the chassis 1, the lifting disc 3 is connected between the 4 guide posts 2 in a sliding manner, the guide posts 2 can guide the lifting disc 3, the anti-slip pad 16 is connected to the bottom of the chassis 1, the stability of the device can be improved by the

anti-slip pad

16, 8 mounting blocks 4 are welded on the outer side of the lifting disc 3 along the circumferential direction, the front side and the rear side of the top of the lifting disc 3 are both connected with the handle 17, the handle 17 is convenient for people to carry the device, the inner wall of one side of each mounting block 4 is connected with the second clamping block 6 in a sliding manner, the second clamping block 6 can clamp the probe, the inner wall of the other side of each mounting block 4 is connected with the first clamping block 5, adjacent first clamp splice 5 and the mutual setting that corresponds of second clamp splice 6 all are connected with spring 7 between second clamp splice 6 and the installation piece 4, and spring 7 can make second clamp splice 6 reset, and 1 top on chassis is 8 rubber pads 15 along the circumferencial direction, and rubber pads 15 can prevent that the probe is impaired.

As shown in fig. 3, the lifting device further comprises a servo motor 8 and a screw shaft 9, the servo motor 8 is connected to the middle of the top of the chassis 1 through a bolt, the servo motor 8 is located between the guide posts 2, the screw shaft 9 is connected to the upper side of an output shaft of the servo motor 8, the screw shaft 9 is in threaded connection with the lifting disc 3, and the screw shaft 9 can enable the lifting disc 3 to move.

When people need to test the sensitivity of the probe, the device can be used for testing, firstly, the second clamping block 6 is pulled outwards, the spring 7 is compressed, then the probe is placed between the first clamping block 5 and the second clamping block 6, then, the second clamping block 6 is loosened, under the action of the spring 7, the second clamping block 6 is reset inwards to clamp the probe, then the servo motor 8 is started, the output shaft of the servo motor 8 rotates to drive the screw shaft 9 to rotate, at the moment, the lifting disc 3 moves downwards and then drives the mounting block 4, the first clamping block 5, the second clamping block 6 and the spring 7 to move downwards, so that the probe moves downwards, the sensitivity of the probe can be tested, when the lower side of the probe is contacted with the rubber pad 15, the sensitivity of the probe is qualified when the lower side of the probe moves upwards, if the lower side does not move upwards, the sensitivity of the probe is unqualified, after the probe test is finished, the servo motor 8 is started in a reverse direction, the output shaft of the servo motor 8 rotates in a reverse direction, the screw shaft 9 is driven to rotate in a reverse direction, at the moment, the lifting disc 3 moves upwards to reset, the mounting block 4 is driven, the first clamping block 5, the second clamping block 6 and the spring 7 move upwards to reset, the probe moves upwards, then, the probe is taken out, the operation is repeated, the sensitivity of the probe can be automatically tested, when the probe is tested, the second clamping block 6 clamps the probe, the probe is prevented from falling, the probe is damaged, in addition, 8 probes can be tested at one time, the test of one probe is not needed, therefore, the test speed can be accelerated, and the work efficiency of people is improved.

Example 2

On embodiment 1's basis, as shown in fig. 4, still including supporting shoe 10, lift post 11, wedge pole 12, wedge 13 and connecting rod 14, supporting shoe 10 has all been welded at 4 tops of every installation piece, sliding connection has lift post 11 on the supporting

shoe

10, 11 upper portion fixedly connected with wedge poles 12 of lift post, 6 outsides of second clamp splice all are connected with connecting rod 14, connecting rod 14 can drive 6 outside removal of second clamp splice, 14 upsides of connecting rod all are connected with wedge 13, wedge pole 12 can be with 13 outside tops of wedge.

When the sensitivity of the probe is not qualified, the probe needs to be taken down, then a new probe is put on for testing, when the lower side of the probe is contacted with the rubber pad 15, if the sensitivity of the probe is not qualified, the upper side of the probe pushes up the lifting column 11, then the wedge-shaped rod 12 moves upwards, at this time, the inclined plane of the wedge-shaped rod 12 pushes the wedge-shaped block 13 outwards, so that the wedge-shaped block 13 and the connecting rod 14 move outwards, thereby driving the second clamping block 6 to move outwards, so that the spring 7 is compressed, in this way, the second clamping block 6 will not clamp the probe, the unqualified probe will fall, after the probe falls, the lifting column 11 will move downwards due to the self gravity, then the wedge-shaped rod 12 is driven to move downwards, at the same time, under the action of the spring 7, the second clamping block 6 will move inwards to reset, and the above operations are repeated, if the sensitivity of the probe is not qualified, the second clamp splice 6 will release the probe, and unqualified probe will drop, does not need people to take off unqualified probe manually to, save time and laborsaving.

The present application is described in detail above, and the principles and embodiments of the present application are described herein by using specific examples, which are only used to help understand the method and the core idea of the present application; meanwhile, for a person skilled in the art, according to the idea of the present application, there may be variations in the specific embodiments and the application scope, and in summary, the content of the present specification should not be construed as a limitation to the present application.

Claims

1. A device for testing the sensitivity of a probe is characterized by comprising a chassis (1), a guide post (2) and a lifting disc (3), installation piece (4), first clamp splice (5), second clamp splice (6) and spring (7), chassis (1) top intermediate junction has 4 guide pillars (2) that have the guide effect, sliding connection has lifting disc (3) that can reciprocate between 4 guide pillars (2), the lifting disc (3) outside is connected with 8 installation pieces (4) along the circumferencial direction, equal sliding connection has second clamp splice (6) that can press from both sides tightly on the one side inner wall of every installation piece (4), all be connected with first clamp splice (5) on the opposite side inner wall of every installation piece (4), adjacent first clamp splice (5) and second clamp splice (6) correspond the setting each other, all be connected with spring (7) that have the effect of resetting between second clamp splice (6) and installation piece (4).

2. The device for testing the sensitivity of the probe as claimed in claim 1, further comprising a servo motor (8) and a screw shaft (9), wherein the servo motor (8) is connected to the middle of the top of the chassis (1), the servo motor (8) is located between the guide posts (2), the screw shaft (9) capable of rotating is connected to the upper side of the output shaft of the servo motor (8), and the screw shaft (9) is in threaded connection with the lifting disc (3).

3. The device for testing the sensitivity of the probe as claimed in claim 2, characterized by further comprising supporting blocks (10), lifting columns (11), wedge rods (12), wedge blocks (13) and connecting rods (14), wherein the supporting blocks (10) are connected to the tops of the mounting blocks (4), each supporting block (10) is slidably connected with one lifting column (11), the wedge rods (12) are connected to the upper portions of the lifting columns (11), the connecting rods (14) capable of moving are connected to the outer sides of the second clamping blocks (6), and the wedge blocks (13) are connected to the upper sides of the connecting rods (14).

4. A device for testing the sensitivity of a probe according to claim 3, further comprising an anti-slip pad (16), wherein the anti-slip pad (16) is connected to the bottom of the chassis (1).

5. The apparatus for testing the sensitivity of a probe as claimed in claim 4, further comprising a handle (17), wherein the handle (17) is connected to the front and rear sides of the top of the elevating plate (3).

6. The apparatus for testing the sensitivity of a probe according to claim 5, further comprising rubber pads (15), wherein the number of the rubber pads (15) on the top of the base plate (1) in the circumferential direction is 8.