CN217426107U

CN217426107U - Multipurpose test fixture and intelligent terminal

Info

Publication number: CN217426107U
Application number: CN202221041374.4U
Authority: CN
Inventors: 吕德稳; 李岩
Original assignee: Suzhou Inspur Intelligent Technology Co Ltd
Current assignee: Suzhou Inspur Intelligent Technology Co Ltd
Priority date: 2022-04-29
Filing date: 2022-04-29
Publication date: 2022-09-13
Anticipated expiration: 2032-04-29

Abstract

The utility model provides a multipurpose test fixture and an intelligent terminal, wherein the test fixture comprises an interface module, a switching module and an interface to be switched; the interface module is inserted on the mainboard of the central processing unit; the golden finger of the interface module is connected with the first port of the switching module; and the second port of the switching module is linked with the interface to be switched. The multipurpose test fixture package also comprises a symmetrical processor; the interface to be switched is also connected to the symmetric processor through corresponding receiving lines and transmitting lines. The symmetry processor is also connected to an oscilloscope. Based on a multipurpose test fixture, the utility model also provides an intelligent terminal. The utility model discloses to switch three kinds of signals of PCIE, SATA, USB of interface module through switching module according to test signal's different needs, reach the purpose that can measure multiple signal on a tool board, and then promoted the efficiency of interface test, reduced the test cost.

Description

Multipurpose test fixture and intelligent terminal

Technical Field

The utility model belongs to the technical field of the test fixture design, a special design multipurpose test fixture and an intelligent terminal.

Background

The m.2 interface is also called NGFF, which is called Next Generation Form Factor in english, and is a new interface specification for replacing MSATA by Intel. Because of the faster speed and smaller size, most computers now use such hard disks. In addition, the m.2 interface is a new host interface scheme, and can be compatible with various communication protocols, such as sata, PCIe, USB, HSIC, UART, SMBus, and the like. Before a computer uses an M.2 interface to transmit data between a CPU and a hard disk, the M.2 interface needs to be subjected to signal testing, and the aim is to detect whether the M.2 interface meets the specification. If not, the communication protocol needs to be changed to meet the user's needs. With the application of most computers based on m.2 interfaces, the problem of detecting m.2 interfaces is more and more challenging, and a test fixture needs to be designed for the m.2 interface to meet the test requirements. The conventional test fixture can only detect one communication protocol of the m.2 interface. In the actual signal test, signals under different communication protocols of M.2 often need to be tested, use traditional test fixture to need to make equipment outage change tool reach the signal under the different communication protocols of test, like SATA, PCIE and USB, test above-mentioned three kinds of signals need carry out many times break-make electricity and a plurality of M.2 interface test fixture, and whole test procedure is loaded down with trivial details and takes time.

As shown in fig. 1, which is a connection diagram of an m.2 test fixture in the prior art, the m.2 test fixture connects RX and TX signals of PCIE on an m.2 interface to an SMP through a PCIE protocol by inserting an m.2gold finger (m.2gold finger) on the m.2 interface (m.2 interface), and then applies the RX and TX signals to the oscilloscope through an SMP connection line to test the RX and TX signals of the m.2 interface PCIE. In the prior art, if PCIE, SATA and USB signals of the m.2 interface are to be tested, different test jigs need to be replaced to implement the testing, specifically, three jig boards need to be powered off, and replacement of jig boards under different protocols is implemented in sequence, which is time-consuming and labor-consuming, and increases the testing period and testing cost.

Disclosure of Invention

In order to solve the technical problem, the utility model provides a multipurpose test fixture and an intelligent terminal can test the effect of signal under the multiple communication protocol under same test fixture.

In order to achieve the above purpose, the utility model adopts the following technical scheme:

a multipurpose test fixture comprises an interface module, a switching module and an interface to be switched;

the interface module is inserted on a mainboard of the central processing unit;

the golden finger of the interface module is connected with the first port of the switching module; and the second port of the switching module is linked with the interface to be switched.

Further, the multipurpose test fixture package also comprises a symmetrical processor; the interface to be switched is also connected to the symmetrical processor through a corresponding receiving line and a corresponding sending line.

Further, the symmetry processor is also connected to an oscilloscope.

Further, the interface module comprises an m.2 interface, an MXM interface, an OCP interface, and a WLAN interface.

Further, the switching module includes a dial Switch and a PCIE Switch chip.

Further, the interface to be switched includes PCIE, USB, and SATA.

Furthermore, the type of the dial switch is DSIC08 THGET.

The utility model also provides an intelligent terminal, including a multipurpose test fixture.

The effect provided in the summary of the invention is only the effect of the embodiment, not all the effects of the invention, and one of the above technical solutions has the following advantages or beneficial effects:

Drawings

FIG. 1 is a schematic diagram illustrating the connection of an M.2 testing fixture in the prior art;

fig. 2 is a schematic view illustrating a structural connection of a multipurpose test fixture according to embodiment 1 of the present invention;

fig. 3 is a schematic view of a multipurpose test fixture according to embodiment 1 of the present invention connected to an oscilloscope.

Detailed Description

In order to clearly explain the technical features of the present invention, the present invention will be explained in detail by the following embodiments and the accompanying drawings. The following disclosure provides many different embodiments, or examples, for implementing different features of the invention. In order to simplify the disclosure of the present invention, the components and arrangements of specific examples are described below. Furthermore, the present invention may repeat reference numerals and/or letters in the various examples. This repetition is for the purpose of simplicity and clarity and does not in itself dictate a relationship between the various embodiments and/or configurations discussed. It should be noted that the components illustrated in the figures are not necessarily drawn to scale. Descriptions of well-known components and processing techniques and processes are omitted so as to not unnecessarily limit the invention.

Example 1

The embodiment 1 of the utility model provides a multipurpose test fixture, if need test different signals in order to solve among the prior art, need change the tool board under the different agreements and realize in proper order, waste time and energy, increased test cycle and test cost.

The test fixture comprises an interface module, a switching module and an interface to be switched; the interface module is inserted on the mainboard of the central processing unit; the golden finger of the interface module is connected with the first port of the switching module; and the second port of the switching module is linked with the interface to be switched. The multipurpose test fixture package also comprises a symmetrical processor; the interface to be switched is also connected to the symmetric processor through corresponding receiving lines and transmitting lines.

Fig. 2 is a schematic view illustrating a structure connection of a multipurpose test fixture according to embodiment 1 of the present invention. The utility model discloses a M.2 interface explains in detail.

A CPU: a Central Processing Unit; central processing unit

And M.2: next Generation Form Factor; solid state disk connector

PCIE: peripheral Component Interconnect Express; peripheral device interconnect interface

USB: the Universal Serial BUS; a universal serial bus;

SATA: serial ATA (ATA: Advanced Technology Attachment); a complex programmable logic device;

the method comprises the steps of firstly connecting an M.2 interface (M.2Interface) with a CPU, transmitting different signals by an M.2gold finger (M.2Goldfinger) inserted into the M.2 interface (M.2Interface) through an M.2 multipurpose test fixture, switching three signals of PCIE, SATA and USB through a Dial switch (Dial switch) according to different requirements of the test signals, then connecting RX and TX signals of the PCIE, SATA and USB on the M.2 interface to the SMP, and then applying the signals to an oscilloscope through an SMP connecting line to achieve the purpose of testing different signals of the M.2 interface PCIE, SATA and USB.

The method specifically comprises the following steps: the M.2 interface (M.2Interface) is connected with the CPU.

The M.2 multipurpose test fixture is connected with the CPU through an M.2 golden finger (M.2Goldfinger) inserted on an M.2 interface (M.2Interface).

According to different requirements of test signals, PCIE, SATA and USB signals are switched through a Dial switch (Dial switch), if SATA signals on AN M.2 interface need to be tested, the Dial switch is only required to be switched to a SATA signal mode, and then RX (PERP0_ SATA _ BN, PERP0_ SATA _ BP) and TX (PERP0_ SATA _ AN and PERP0_ SATA _ AP) signals on AN M.2 golden finger are led to the SMP.

And connecting the RX and TX signals of PCIE, SATA and USB on the M.2 interface to the SMP.

The purpose of testing different signals of the M.2 interface PCIE, the SATA and the USB is achieved by applying the SMP connecting line to the oscilloscope.

Fig. 3 is a schematic diagram of the connection between a multipurpose test fixture and an oscilloscope according to embodiment 1 of the present invention.

The interface to be switched is also connected to the symmetrical processor through a corresponding receiving line and a corresponding sending line;

the utility model discloses well dial switch's model is DSIC08THGET, the utility model discloses the scope of protection is not restricted to the model listed in embodiment 1, and other models that can realize are also within protection range.

The switching module of the present invention may also optionally use other devices, such as: PCIE Switch.

The utility model discloses select the M.2 interface to explain, except M.2 interface tool, this technical scheme still can be used in test tool boards such as MXM, OCP, WLAN.

The embodiment 1 of the utility model provides a multipurpose test fixture according to test signal's different needs, switches interface module's PCIE, SATA, three kinds of signals of USB through switching module, reaches the purpose that can measure multiple signal on a tool board, and then has promoted the efficiency of interface test, has reduced the test cost.

Example 2

Based on the utility model discloses a multipurpose test fixture that embodiment 1 provided, the utility model discloses embodiment 2 has still provided an intelligent terminal, and this intelligent terminal includes a multipurpose test fixture, adopts this multipurpose test fixture to carry out different signal tests.

Specifically, the method comprises the following steps: the M.2 interface (M.2Interface) is connected with the CPU.

The M.2 test fixture is connected with the CPU (FT-2000) through an M.2 golden finger (M.2Goldfinger) inserted on an M.2 interface (M.2 interface-Connector Keying Profile).

According to different requirements of test signals, PCIE, SATA and USB signals are switched through a dial switch (DSIC08THGET), if SATA signals on AN M.2 interface need to be tested, the dial switch is only required to be switched to a SATA signal mode, and then RX (PERP0_ SATA _ BN, PERP0_ SATA _ BP) and TX (PERP0_ SATA _ AN and PERP0_ SATA _ AP) signals on AN M.2 golden finger are led to the SMP.

The embodiment 2 of the utility model provides an intelligent terminal, according to test signal's different needs, through three kinds of signals of PCIE, SATA, the USB that switch the interface module of switching module, reach the purpose that can measure multiple signal on a tool board, and then promoted the efficiency of interface test, reduced test cost.

It is noted that, herein, relational terms such as first and second, and the like may be used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Furthermore, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include elements inherent in the list. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other identical elements in a process, method, article, or apparatus that comprises the element. In addition, parts of the above technical solutions provided in the embodiments of the present application, which are consistent with the implementation principles of corresponding technical solutions in the prior art, are not described in detail so as to avoid redundant description.

Although the embodiments of the present invention have been described with reference to the accompanying drawings, the scope of the present invention is not limited thereto. Various modifications and alterations will occur to those skilled in the art based on the foregoing description. And are neither required nor exhaustive of all embodiments. On the basis of the technical scheme of the utility model, various modifications or deformations that technical personnel in the field need not pay out creative work and can make still are within the protection scope of the utility model.

Claims

1. A multipurpose test fixture is characterized by comprising an interface module, a switching module and an interface to be switched;

the interface module is inserted on a mainboard of the central processing unit;

2. The multipurpose test fixture of claim 1, wherein the multipurpose test fixture package further comprises a symmetry handler; the interface to be switched is also connected to the symmetrical processor through a corresponding receiving line and a corresponding sending line.

3. The multipurpose test fixture of claim 2, wherein the symmetry handler is further connected to an oscilloscope.

4. The multipurpose test fixture of claim 1 wherein the interface module includes an m.2 interface, an MXM interface, an OCP interface, and a WLAN interface.

5. The multipurpose test fixture of claim 1, wherein the switching module comprises a dial Switch and a PCIE Switch chip.

6. The multipurpose test fixture of claim 1, wherein the interfaces to be switched include PCIE, USB and SATA.

7. The multipurpose test fixture of claim 5, wherein the dial switch is DSIC08 THGET.

8. An intelligent terminal, characterized in that, comprising a multipurpose test fixture according to any one of claims 1 to 7.