CN217141308U - Automatic testing and sorting machine for electronic elements - Google Patents

Abstract

The utility model relates to an automatic testing separator for electronic components, which has the function of testing the electronic components at low temperature, and comprises a feeding area and a testing area, wherein the separator also comprises a feeding sealing cavity and a testing sealing cavity, the feeding area is positioned in the feeding sealing cavity, the testing area is positioned in the testing sealing cavity, the testing sealing cavity is filled with dry gas, and the feeding sealing cavity and the testing sealing cavity can be communicated to receive the electronic components, the automatic testing separator for electronic components of the utility model is provided with sealing in the testing area, the feeding area is also provided with sealing to enlarge the sealing range, reduce and slow down the escape of the dry gas in the testing sealing cavity, ensure the drying environment of the testing area, promote the frost and dew prevention effect, the feeding area and the testing area are respectively sealed, the testing area is a first-level sealing area, the feeding area is a second-level sealing area, so as to form double sealing, and the setting of a second-level sealing structure, the dry gas is mainly concentrated in the first-level sealing area, the space is small, and the concentration of the dry gas in the testing area can be guaranteed.

Description

Automatic testing and sorting machine for electronic elements

Technical Field

The utility model relates to a chip test equipment technical field, concretely relates to electronic component automatic test sorter.

Background

Nowadays, science and technology are continuously developed and innovated, applications and requirements of integrated circuits (electronic components for short) are more and more, and since the electronic components need to be subjected to multiple precise manufacturing processes in the production process, before the electronic components are sold, a series of electrical property tests must be performed to ensure the product quality of the electronic components.

The current sorting machine commonly used for testing electronic elements is a translation sorting machine, the translation sorting machine is divided into a normal-temperature testing sorting machine and a high-temperature testing sorting machine, the normal-temperature testing sorting machine mainly provides two testing environments of normal temperature and high temperature for the electronic elements, and the sorting machine has the advantages of low design difficulty, low failure rate, various feeding and receiving modes, low sealing performance and incomplete testing due to no low-temperature interference; the three-temperature testing sorting machine mainly provides testing environments of various temperature nodes of low temperature, normal temperature and high temperature for electronic elements, is comprehensive in testing, and can meet the testing specification of the high-precision and high-function electronic elements, so that the product quality of the electronic elements during shipment is ensured. However, when the three-temperature testing separator is in a low-temperature testing environment, water vapor in the air can be condensed when reaching a certain content, so that the phenomenon of frost condensation and dewing is caused, and the testing effect is influenced.

SUMMERY OF THE UTILITY MODEL

An object of the utility model is to disclose an electronic component automatic test sorter to at least partly solve above-mentioned problem.

In order to solve the technical problem, the utility model adopts the following technical scheme:

the utility model provides an electronic component automatic test sorter, has electronic component low temperature test function, the sorter includes material loading district and test zone, the sorter still includes the sealed chamber of material loading and tests sealed chamber, the material loading district is located the sealed intracavity of material loading, the test zone is located the sealed intracavity of test, the sealed intracavity of test is filled with dry gas, can communicate between the sealed chamber of material loading and the test sealed chamber, in order to accept electronic component.

The beneficial effect of this scheme of adoption:

based on three temperature test sorter of prior art only sets up sealed chamber in the test section, lead to the problem of the large amount of loss of dry gas, in this scheme, except that set up sealedly in the test section, the loading area also sets up sealedly, and increase sealed scope reduces and slows down the loss of test sealed intracavity dry gas, guarantees the dry environment in test section, promotes frost prevention dewfall effect.

In this scheme, the material loading district is sealed respectively with the test zone, and the test zone is the one-level seal zone, and the material loading district is the second grade seal zone to form double seal, compare in the whole seal zone that sets the material loading district and test zone to a cavity, the setting of second grade seal structure, the dry gas is mainly concentrated in the one-level seal zone, and its space is less, more can guarantee the concentration of dry gas in the test zone.

Simultaneously, the dry gas that looses in the test sealed chamber can flow into the material loading sealed chamber, makes test area and material loading district all be in dry environment, carries out the drying to electronic component at the material loading district promptly, avoids electronic component to bring steam into the test area when getting into the test area from the material loading district, further promotes frost prevention dewfall effect.

Preferably, the feeding area is provided with a turntable feeding machine, the turntable feeding machine comprises a turntable feeding end and a turntable discharging end, the testing area receives the electronic elements discharged from the turntable discharging end, the turntable feeding machine can automatically and sequentially take the electronic elements and uniformly discharge the electronic elements, so that the electronic elements can sequentially enter the testing area to be tested, the electronic element detection can be automatically and sequentially performed, and the turntable feeding machine can be more easily arranged in the feeding sealing cavity and normally run due to the rotating feeding mode. The process of material plate loading and plate arrangement is saved, and the purposes of reducing cost and improving efficiency are achieved.

Preferably, the feeding sealed cavity comprises a first feeding sealed cavity for accommodating the turntable feeder and a second feeding sealed cavity for accommodating the discharge rail, a material taking opening is formed in the side wall and/or the top wall of the second feeding sealed cavity, and the electronic element is taken out through the material taking opening and then placed into the test area.

Transport electronic component to getting the material mouth from carousel blowing end through the blowing track to through getting the intercommunication between material mouth realization material loading seal chamber and the test seal chamber, make electronic component can follow the material loading district and get into the test district and test, realize accurately getting the material.

Preferably, a discharging rail is arranged at the discharging end of the turntable, a discharging shuttle is arranged on the discharging rail, the discharging shuttle reciprocates to convey the electronic element discharged by the turntable feeding machine to the position corresponding to the material taking port, the electronic element is conveyed by the discharging shuttle, the electronic element is prevented from sliding or being damaged in the conveying process, and the safety and the stability of the electronic element during conveying are improved.

Preferably, the material taking port is provided with an automatic door, the material taking port is opened and closed through the automatic door, the automatic door is opened when the material is taken, the automatic door is closed after the material is taken, the separation and respective sealing effect of the feeding area and the testing area are ensured, the loss of the dry gas from the testing sealing cavity to the feeding sealing cavity is reduced, and the concentration of the dry gas in the testing sealing cavity is ensured.

Preferably, the sorting machine further comprises a power mechanism for controlling the automatic door to open and close, the power mechanism comprises an air cylinder or an electric screw rod or an electric belt pulley, the automatic door is opened and closed through the power mechanism, the control precision is guaranteed, the automatic door is accurately matched with an electronic element to be taken, and the separation sealing effect is improved.

Preferably, the front wall of the first feeding sealed cavity and the top wall of the second feeding sealed cavity form a step part, an observation sealing door is arranged on the front wall of the first feeding sealed cavity to observe or maintain a feeding area, and when a turntable feeding machine or a material shuttle breaks down or the material is folded and tilted by the whole machine, the failure is conveniently found manually and timely, and the follow-up maintenance, rectification and modification are guaranteed.

Preferably, the feeding area further comprises a vibration feeding disc, a direct vibration track is arranged between the vibration feeding disc and the rotary disc feeding end, the vibration feeding disc automatically sorts electronic element bulk materials, the automatic feeding disc feeding machine is used for automatically feeding the bulk materials, the rotary disc feeding machine sequentially takes the bulk materials, tedious manual sorting is replaced, the automation degree is high, misoperation and manual pollution are reduced, the feeding efficiency and the matching precision are improved, unqualified electronic elements can be sorted out simultaneously, and the feeding quality is guaranteed. And the vibration feeding plate and the turntable feeding machine are matched in a feeding mode, so that the preposed work is simplified, and the vibration feeding plate can be completely arranged in the feeding sealing cavity, thereby realizing the sealing of the feeding area and ensuring the drying of the environment of the feeding area.

As the preferred, be equipped with the material loading emergency exit of adding the electronic component bulk cargo on the sealed chamber wall of material loading, the material loading emergency exit is opened during the material loading, and the material loading emergency exit is closed after the material loading is accomplished, reduces the loss of dry gas to realize getting of material loading district and sealed.

Preferably, the test area is provided with a preheating disc and a test mechanism, the preheating disc preheats the electronic elements in the received feeding area, the preheated electronic elements are conveyed to the test mechanism for testing, and the electronic elements are preheated according to the temperature required by the test before entering the test mechanism, so that the time for heating and cooling in the test mechanism is saved, and the test efficiency is improved.

Preferably, the sorting machine further comprises a discharging area, the electronic elements are conveyed to the discharging area after being tested in the testing area, the discharging area comprises a manual discharging area and/or an automatic discharging area, multiple material receiving modes are provided, follow-up selection is facilitated, and different requirements of customers are met.

Preferably, the feeding area and the testing area are covered with sealing covers to form a sealing space, the sealing space is divided into a feeding sealing cavity and a testing sealing cavity through partition plates, the feeding sealing cavity and the testing sealing cavity are formed by matching of the sealing covers and the partition plates, the structure is simplified, and the processing difficulty is reduced.

These features and advantages of the present invention will be disclosed in more detail in the following detailed description and the accompanying drawings.

Drawings

The utility model is further described with the following drawings:

fig. 1 is a top view of the electronic component three-temperature testing sorter of the present invention.

Fig. 2 is a top view of the feeding area of the electronic component three-temperature testing sorter of the present invention.

Fig. 3 is a top view of the discharge rail seal assembly of the present invention.

Fig. 4 is the utility model discloses the material loading area has got rid of the part after the spatial structure sketch map.

Fig. 5 is a left side view of the feeding area of the utility model.

Fig. 6 is the utility model discloses material loading sealed chamber and test sealed chamber overall arrangement sketch map.

Reference numerals:

100. a feeding area; 110. vibrating the feed tray; 120. a direct vibration track; 130. a turntable feeding machine; 131. a turntable feed end; 132. a turntable discharging end;

140. a discharge rail;

150. a discharging shuttle;

160. a vision detector;

200. a test zone; 210. a first manipulator; 220. a pre-temperature plate; 230. a testing mechanism; 240. feeding a material track; 250. a feeding shuttle;

300. a discharge zone; 310. a manual discharge area; 311. a manual material tray; 320. an automatic discharge area; 321. a conveying device; 322. an automatic tray; 324. a fifth manipulator; 330. a discharge rail; 340. a discharging shuttle;

400. testing the sealed cavity; 410. testing the front wall of the sealed cavity; 411. a second automatic door; 420. testing the back wall of the sealed cavity; 421. a third automatic door;

500. a feeding sealing cavity; 510. a first feeding sealing cavity; 511. the front wall of the first machine feeding sealing cavity; 5111. observing the sealing door; 512. a feeding safety door; 520. a second feeding sealing cavity; 521. the top wall of the second feeding sealing cavity; 5211. a material taking port; 522. a first automatic door; 523. a cylinder; 524. a limiting block; 525. the side wall of the second feeding sealing cavity;

600. a substrate.

Detailed Description

The technical solutions of the embodiments of the present invention are explained and explained below with reference to the drawings of the embodiments of the present invention, but the embodiments described below are only preferred embodiments of the present invention, and not all embodiments. Based on the embodiments in the embodiment, other embodiments obtained by those skilled in the art without any creative work belong to the protection scope of the present invention.

In the description of the present invention, it is to be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "clockwise", "counterclockwise" and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, and are only for convenience of description and to simplify the description, but do not indicate or imply that the device or element referred to must have a particular orientation, be constructed and operated in a particular orientation, and therefore should not be construed as limiting the present invention.

Furthermore, the terms "first", "second" and "first" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of the present invention, unless otherwise specified, "a plurality" means two or more unless explicitly defined otherwise.

In the present invention, unless otherwise expressly specified or limited, the terms "mounted," "connected," and "fixed" are to be construed broadly and may, for example, be fixedly connected, detachably connected, or integrally connected; can be mechanically or electrically connected; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The specific meaning of the above terms in the present invention can be understood according to specific situations by those skilled in the art.

In the present disclosure, unless expressly stated or limited otherwise, the first feature "on" or "under" the second feature may comprise direct contact between the first and second features, or may comprise contact between the first and second features not directly. Also, the first feature being "on," "above" and "over" the second feature includes the first feature being directly on and obliquely above the second feature, or merely indicating that the first feature is at a higher level than the second feature. "beneath," "under" and "beneath" a first feature includes the first feature being directly beneath and obliquely beneath the second feature, or simply indicating that the first feature is at a lesser elevation than the second feature.

The automatic testing and sorting machine for electronic components of the present invention is further described in detail with reference to the accompanying drawings and the following detailed description:

following with the three temperature test sorters of electronic component who has high temperature, normal atmospheric temperature and low temperature test function simultaneously as the example right the utility model discloses explain, but technical personnel in the field can understand, the utility model discloses also can be applicable to on the electronic component low temperature test sorter that only has low temperature test function, also can be applicable to and have low temperature test and normal atmospheric temperature test function simultaneously, perhaps have two temperature test sorters of low temperature test and high temperature test function simultaneously.

Referring to fig. 1, electronic component three-temperature test sorter is including the charge-up zone 100, test section 200 and the ejection of compact district 300 that set gradually, still includes test seal chamber 400, and test section 200 is arranged in test seal chamber 400, and is filled with dry gas in test seal chamber 400 to realize test section 200 sealed and dry, play the function of avoiding the frost and fogging.

However, the volume of the three-temperature test separator is large, the test sealing cavity 400 is generally formed by a glass cover and a metal sheet, the sealing effect of the metal sheet is poor, a large amount of dry air can escape to the outside, and external water vapor can enter the sealing cavity, so that the frost condensation phenomenon is not obviously improved.

Referring to fig. 1, according to the utility model discloses an embodiment, the utility model provides an electronic component three temperature test sorter still includes material loading seal chamber 500, and material loading district 100 is located material loading seal chamber 500, can communicate between material loading seal chamber 500 and the test seal chamber 400 to accept electronic component.

In this scheme, except that setting up at test section 200 is sealed, material loading district 100 also sets up sealedly, and material loading district 100 seals respectively with test section 200, test section 200 is the one-level sealing zone, material loading district 100 is the second grade sealing zone, in order to form dual sealed, compare in only setting up the sealing zone at test section 200, the setting of second grade seal structure, the seal range of three temperature test sorter has been increased, reduce and slow down the loss of dry gas in test seal chamber 400, guarantee the dry environment of test section 200, the prevention frost dewfall effect has been promoted.

Meanwhile, dry gas escaping from the test sealed cavity 400 flows into the feeding sealed cavity 500, so that the test area 200 and the feeding area 100 are both in a dry environment, namely the feeding area 100 dries the sealed cavity, water vapor is prevented from being brought into the test area 200 when the electronic element enters the test area 200 from the feeding area 100, and the effect of preventing frost condensation and dew condensation is further improved.

As shown in fig. 1 and 2, the feeding area 100 is provided with a vibration feeding tray 110, a straight vibration rail 120, a turntable feeder 130 and a discharging rail 140, the turntable feeder 130 includes a turntable feeding end 131 and a turntable discharging end 132, the turntable feeding end 131 receives electronic components discharged from the vibration feeding tray 110, and the testing area 200 receives electronic components discharged from the turntable discharging end 132.

The straight vibration rail 120 is arranged between the vibration feeding tray 110 and the rotary table feeding end 131, the discharging rail 140 is arranged at the rotary table discharging end 132, the discharging rail 140 is provided with a discharging shuttle 150, and the discharging shuttle 150 can reciprocate on the discharging rail 140.

The vibration feeding tray 110 automatically sorts the added electronic element bulk materials, and the electronic elements move to the position, close to the turntable feeding machine 130, of the tail end of the straight vibration rail 120 through vibration, so that tedious manual sorting is replaced, the automation degree is high, misoperation and manual pollution are reduced, and the feeding efficiency and the matching precision are improved; the turntable feeder 130 sequentially takes the electronic components at the tail end of the alignment vibration rail 120 through the turntable feeding end 131, and uniformly discharges the electronic components to the discharge shuttle 150 on the discharge rail 140 through the turntable discharging end 132 after rotating a certain angle, so that the electronic components are conveyed in the feeding area 100 and can enter the test area 200 sequentially, the electronic component detection can be automatically and orderly carried out, the electronic components are conveyed through the discharge shuttle 150, the electronic components are prevented from slipping or being damaged in the conveying process, and the safety and the stability of the electronic components during conveying are improved.

In order to further improve the detection function of the three-temperature test sorting machine, a visual detector 160 is arranged between the rotary disc feeding end 131 and the rotary disc discharging end 132 so as to perform visual detection on the electronic elements in the rotating process of the electronic elements along with the rotary disc feeding machine 130, unqualified electronic elements are sorted out, the electronic elements passing the subsequent electrical property detection can be directly used as qualified products for sale, the integration level of the three-temperature test sorting machine is improved, additional visual detection equipment is not needed, the post-operation is saved, and the hardware cost is further reduced.

The feeding mode of the vibration feeding plate 110 matched with the rotary plate simplifies the preposing work, and the vibration feeding plate is completely arranged in the feeding sealing cavity 500, so that the sealing of the feeding area 100 can be realized, and the drying of the environment of the feeding area 100 is ensured.

The feeding area 100 and the testing area 200 are located in different sealed cavities, the electronic component cannot be directly conveyed to the testing area 200, in this embodiment, the first manipulator 210 is arranged in the testing area 200, a material taking opening 5211 is formed between the feeding sealed cavity 500 and the testing sealed cavity 400, the feeding sealed cavity 500 and the testing sealed cavity 400 are communicated through the material taking opening 5211, and the first manipulator 210 carries the electronic component from the feeding sealed cavity 500 to the testing sealed cavity 400 through the material taking opening 5211.

Specifically, as shown in fig. 4, the feeding sealed cavity 500 includes a first feeding sealed cavity 510 for accommodating the turntable loader 130 and a second feeding sealed cavity 520 for accommodating the discharge rail 140.

In order to add the bulk electronic component, a loading safety door 512 for adding the bulk electronic component is disposed on the wall of the loading sealing chamber 500, and specifically, as shown in fig. 4 and 5, the loading safety door 512 is disposed on the side wall of the first loading sealing chamber 510 close to the vibration feeding tray 110. During feeding, the feeding safety door 512 is opened, and after the feeding is completed, the feeding safety door 512 is closed, so that the loss of dry gas is reduced, and the feeding and sealing of the feeding area 100 are realized.

As shown in fig. 1 to 4, a material taking opening 5211 is disposed on the top wall 521 of the second loading sealing chamber, and the electronic component is taken out through the material taking opening 5211 and then placed in the testing area 200.

Of course, in other embodiments, the material taking port may be disposed on the side wall 525 of the second feeding sealing chamber.

The feeding shuttle 150 moves to a position corresponding to the material taking opening 5211 along the feeding track 140 after receiving the electronic component from the turntable feeding end 132, so as to facilitate accurate material taking of the first robot 210.

In order to realize getting the material and reducing the function that the dry gas circulates simultaneously, it is equipped with the power unit that first automatically-controlled door 522 and control first automatically-controlled door 522 opened and shut to get material mouthful 5211 department, cylinder 523 is preferred to power unit, it opens and shuts to drive first automatically-controlled door 522 through the push rod is flexible in the cylinder 523, and control push rod motion accuracy, so that when getting the material first automatically-controlled door 522 opens, with electronic component get take accurate cooperation, first automatically-controlled door 522 closes after getting the material and accomplishing, guarantee the separation of material loading district 100 and test section 200 and sealed effect separately, reduce the loss of dry gas to material loading seal chamber 500 by test seal chamber 400, guarantee the concentration of the dry gas in the test seal chamber 400.

In order to limit the opening range of the first automatic door 522, the front end of the cylinder 523 is further provided with a limit block 524 for limiting the extension stroke of the cylinder 523, the opening range of the first automatic door 522 is controlled by limiting the extension stroke of the cylinder 523, and under the condition that the electronic element is ensured to be taken out smoothly, the opening and closing time cannot be prolonged due to too large opening, and the working efficiency and the sealing effect are influenced.

Of course, in other embodiments, the power mechanism may also be an electric screw rod or an electric belt pulley.

In order to improve the work efficiency of conveying electronic components, it is preferable that two turntable discharging ends 132 are arranged on the turntable feeding machine 130, the discharging rails 140 and the discharging shuttles 150 are respectively arranged at the two turntable discharging ends 132, so that two discharging channels are formed in the feeding area 100, the two discharging channels are both located in the second feeding sealed cavity 520, two material taking ports 5211 are arranged on the top wall 521 of the second feeding sealed cavity, a first automatic door 522, an air cylinder 523 and a limiting block 524 are arranged at the position of each material taking port 5211, the two discharging shuttles 150 operate alternately, the two material taking ports 5211 are opened alternately, and the first manipulator 210 takes materials from the two material taking ports 5211 alternately, so as to achieve the purpose of efficient production.

Specifically, in order to simplify the structure and reduce the processing difficulty, in this embodiment, the sealing cover is covered with the feeding area 100 and the testing area 200 to form a sealing space, the sealing space is divided into a feeding sealing chamber 500 and a testing sealing chamber 400 by a partition plate, in order to facilitate processing, the strength is ensured, and the cost is reduced, metal sheets are arranged around the sealing cover, the top wall is transparent glass, so as to observe the conditions of the feeding area and the testing area, a window can be arranged on the metal sheets around, the transparent glass is arranged at the window, so as to observe from multiple directions, the partition plate is preferably a metal sheet partition plate, the partition plate comprises a first partition plate extending from top to bottom, a notch is cut at the position of the first partition plate located on the discharging rail 140, so that the discharging shuttle 150 penetrates through the notch, the partition plate further comprises a second partition plate extending from the upper edge of the notch to the direction of the testing sealing chamber 400, a third partition plate extending from the side edge of the notch to the direction of the testing sealing chamber 400, and a second partition plate and a third partition plate The fourth baffle at the front end, the second baffle, the third baffle, the fourth baffle and the base plate 600 below form a discharging rail seal assembly for sealing a discharging rail, and enclose into the second feeding seal cavity 520, the first baffle forms a first machine feeding seal cavity front wall 511, the second baffle forms a second feeding seal cavity top wall 521, the third baffle forms a second feeding seal cavity side wall 525, the first machine feeding seal cavity front wall 511 and the second feeding seal cavity top wall 521 form a step part, preferably, a material taking port 5211 is arranged on the second feeding seal cavity top wall 521, and meanwhile, the first automatic door 522, the air cylinder 523 and the limiting block 524 are also arranged on the second feeding seal cavity top wall 521.

In order to observe or maintain the feeding area 100, an observation sealing door 5111 is arranged on the front wall 511 of the feeding sealing cavity of the first machine, so that when the turntable feeding machine 130 or the discharging shuttle 150 breaks down or the whole machine is stacked and tilted, the fault can be conveniently found manually in time, and the subsequent maintenance, rectification and modification are guaranteed.

As shown in fig. 1, the testing area 200 is provided with a pre-warming disk 220 and a testing mechanism 230, the pre-warming disk 220 pre-warms the electronic components of the received feeding area 100, the pre-warmed electronic components are conveyed to the testing mechanism 230 for testing, and the electronic components are pre-warmed according to the temperature required by the testing before entering the testing mechanism 230, so that the time for warming and cooling in the testing mechanism 230 is saved, and the testing efficiency is improved.

Specifically, a feeding track 240 is arranged between the pre-temperature plate 220 and the testing mechanism 230, a feeding shuttle 250 is arranged on the feeding track 240, and the feeding shuttle 250 reciprocates on the feeding track 240.

The first robot 210 takes out the electronic component in the discharging shuttle 150 from the material taking port 5211, places the electronic component in the preheating tray 220 for preheating, and takes out the preheated electronic component by the first robot 210 and places the electronic component in the material feeding shuttle 250.

Of course, in other embodiments, a second robot may be further disposed between the pre-temperature tray 220 and the testing mechanism 230, and the pre-heated electronic component is taken out by the second robot and placed into the feeding shuttle 250.

A third manipulator is arranged at the testing mechanism 230.

The feeding shuttle 250 conveys the electronic components to the position of the testing mechanism 230, and the third manipulator takes out the electronic components in the feeding shuttle 250 and then puts the electronic components into the testing mechanism 230 for electrical performance testing.

Preferably, two feeding rails 240 are provided, two feeding shuttles 250 are respectively provided on the two feeding rails 240, and the two feeding shuttles 250 alternately work to form two conveying channels to cooperate with the two discharging channels in the feeding area 100, so as to improve the feeding efficiency.

Preferably, two third manipulators are provided, and are respectively used for picking and placing the electronic components in the two feeding shuttles 250, and the two third manipulators work alternately, so that the testing efficiency is improved, and the interference is reduced.

The three-temperature testing sorting machine in the embodiment provides refrigeration through the refrigerant machine during low-temperature testing, provides heating through the heating rod during high-temperature testing, and the three-temperature testing mechanism 230 for the electronic element is the prior art, and is not repeated in this embodiment.

As shown in fig. 1, the sorting machine further includes a discharging area 300, the electronic components are transported to the discharging area 300 after being tested in the testing area 200, and the discharging area 300 includes a manual discharging area 310 and an automatic discharging area 320, so as to provide multiple receiving modes, facilitate subsequent selection, and meet different requirements of customers.

Of course, in other embodiments, the outfeed section 300 may only include the manual outfeed section 310.

Of course, in other embodiments, outfeed zone 300 may include only automatic outfeed zone 320.

A discharging rail 330 is arranged on one side of the testing mechanism 230 away from the pre-heating plate 220, a discharging shuttle 340 is arranged on the discharging rail 330, the discharging shuttle 340 reciprocates on the discharging rail 330, and the tested electronic component is taken out by the third manipulator, placed into the discharging shuttle 340 and conveyed to the discharging area 300 through the discharging shuttle 340.

Preferably, two discharging rails 330 are provided, two discharging shuttles 340 are respectively provided on the two discharging rails 330 to form two discharging channels, and the two discharging shuttles 340 work alternately to cooperate with the two third manipulators.

To meet the different usage requirements of the customers, the drop-out area 300 includes a manual drop-out area 310 and an automatic drop-out area 320. The manual discharging area 310 is provided with a manual tray 311, the automatic discharging area 320 is provided with a conveying device 321 and an automatic tray 322, and the conveying device 321 is preferably a conveying belt. A fourth robot and a fifth robot 324 are provided in the outfeed area 300.

After the discharging shuttle 340 is conveyed to the discharging area 300, the fourth manipulator puts the electronic components which are not tested in the discharging shuttle 340 into the material box according to the test result, and carries the electronic components which are tested to be qualified in the discharging shuttle 340 to the manual discharging area 310 or the automatic discharging area 320 and puts the electronic components into the corresponding material tray. Specifically, in the manual discharging area 310, the fourth manipulator puts the ICs in the manual tray 311 in order, and takes out the ICs manually after the manual tray is full; in the automatic discharging area 320, the fifth robot 324 carries the empty tray of the automatic tray 322 to the automatic discharging area 320 in advance, then the fourth robot takes out the electronic components from the discharging shuttle 340 and puts the electronic components into the automatic tray 322, and after the electronic components are full, the automatic tray 322 is conveyed out by the conveying belt.

Preferably, two or more conveying belts in the automatic discharging area 320 are selected, so that the receiving efficiency is improved, and meanwhile, electronic components with different testing grades are conveyed for subsequent testing. The conveying device 321 receives the material from the automatic material receiving tray 322 and receives the material from the automatic material receiving tray 322.

Of course, one or more manual trays 311 of the manual ejection area 310 may be provided as needed to place electronic components of different test grades.

Referring to fig. 1 and 6, it can be seen that the discharging area 300 is also partially located in the testing sealed cavity 400 to enlarge the coverage area of the testing sealed cavity 400, increase the filling range of the drying gas, further ensure that the testing area is constantly kept in a dry environment, and improve the capability of preventing frost and dew formation, and in order to make the internal layout more clear, the upper walls of the testing sealed cavity 400 and the feeding sealed cavity 500 in fig. 6 are removed.

Specifically, the manual discharging area 310 of the discharging area 300 is located in the testing sealed cavity 400, a second automatic door 411 is arranged at a position, close to the manual discharging area 310, of the front wall 410 of the testing sealed cavity, after the manual tray 311 is full, the second automatic door 411 is opened, a worker takes out the manual tray 311, and after the conveying is finished, the second automatic door 411 is closed, so that the escape of dry air is reduced. The part of automatic discharging area 320 is located test seal chamber 400, concretely, conveyor 321 anterior segment is located test seal chamber 400, the back end of conveyor 321 is located test seal chamber 400, test seal chamber back wall 420 is located conveyor 321's position and sets up the material receiving port, automatic charging tray 322 penetrates out from the material receiving port, the material receiving port is equipped with third automatic door 421, automatic charging tray 322 fills up the back, when needing automatic material receiving, third automatic door 421 is opened, material receiving automatic charging tray 322 carries electronic component to material receiving position department, after the transport finishes, third automatic door 421 close, with the loss that reduces dry gas.

The utility model discloses well electronic component three temperature test sorter's working process as follows:

an operator pours electronic components into the vibration feeding tray 110 from the feeding safety door 512, the electronic components are fed by the vibration feeding tray 110, enter the turntable feeding machine 130 through the straight vibration rail 120, visual detection is carried out in the rotation process of the turntable feeding machine 130, the electronic components which are detected to be unqualified are taken out and put into a defective material box, the electronic components which are detected to be qualified are conveyed to the discharging shuttle 150, the discharging shuttle 150 conveys the electronic components to the position of the material taking port 5211 along the discharging rail 140, at the moment, the first automatic door 522 is opened under the action of the air cylinder 523, the electronic components in the discharging shuttle 150 are taken out by the first mechanical arm 210, the first automatic door 522 is closed under the action of the air cylinder 523, and the discharging shuttle 150 returns to the turntable discharging end 132 to continuously take the materials; the first manipulator 210 puts the electronic components into the pre-temperature tray 220 for pre-temperature, then puts the pre-heated electronic components into the feeding shuttle 250, the feeding shuttle 250 transports the electronic components to the position of the testing mechanism 230 along the feeding track 240, the third manipulator takes the electronic components in the feeding shuttle 250 and then puts the electronic components into the testing mechanism 230 for testing, after the testing is completed, the third manipulator takes the electronic components out and puts the electronic components into the discharging shuttle 340, the discharging shuttle 340 transports the electronic components to the discharging area 300 along the discharging track 330, the fourth manipulator puts the electronic components which are not tested into the magazine, and transports the electronic components which are tested to be qualified into the electronic components, the electronic components with higher testing grade are transported to the manual discharging area 310 for receiving, and the electronic components with higher testing grade are transported to the automatic discharging area 320 for receiving so as to be automatically fed when retesting.

The above description is only for the embodiments of the present invention, but the scope of the present invention is not limited thereto, and those skilled in the art should understand that the present invention includes but is not limited to the description in the above embodiments and the accompanying drawings. Any modification which does not depart from the functional and structural principles of the invention is intended to be included within the scope of the claims.

Claims (12)

1. The utility model provides an electronic component automatic test sorter, has electronic component low temperature test function, the sorter includes material loading district and test zone, a serial communication port, the sorter still includes material loading sealed chamber and test sealed chamber, the material loading district is located the material loading sealed intracavity, the test zone is located the test sealed intracavity, the test sealed intracavity is filled with dry gas, can communicate between material loading sealed chamber and the test sealed chamber, in order to accept electronic component.

2. The automatic test handler of claim 1, wherein the loading area is provided with a carousel loader comprising a carousel loading end and a carousel discharge end, the test area receiving electronic components discharged from the carousel discharge end.

3. The automatic testing and sorting machine for electronic components according to claim 2, wherein a discharging rail is disposed at the discharging end of the rotary table, the feeding seal cavities include a first feeding seal cavity for accommodating the rotary table feeder and a second feeding seal cavity for accommodating the discharging rail, a material taking opening is disposed on a side wall and/or a top wall of the second feeding seal cavity, and the electronic components are taken out through the material taking opening and then placed into the testing area.

4. The automatic testing and sorting machine for electronic components as claimed in claim 3, wherein the feeding track is provided with a feeding shuttle, and the feeding shuttle reciprocates to transport the electronic components fed from the turntable feeder to a position corresponding to the feeding port.

5. The automatic test handler of claim 3, wherein the material pick-up port is provided with an automatic door, and the material pick-up port is opened and closed by the automatic door.

6. The automatic testing and sorting machine for electronic components according to claim 5, further comprising a power mechanism for controlling the opening and closing of the automatic door, wherein the power mechanism comprises a cylinder or a power screw or a power pulley.

7. The automatic testing and sorting machine for electronic components according to claim 3, wherein the front wall of the first feeding sealing chamber and the top wall of the second feeding sealing chamber form a step portion, and an observation sealing door is provided on the front wall of the first feeding sealing chamber for observing or maintaining the feeding area.

8. The automatic test handler of claim 2, wherein the feeding area further comprises a vibration feeding tray, and a straight vibration rail is disposed between the vibration feeding tray and the feeding end of the turntable.

9. The automatic testing and sorting machine for electronic components according to any one of claims 1 to 8, wherein a loading safety door for loading bulk materials of electronic components is provided on the wall of the loading sealing chamber.

10. The automatic testing and sorting machine for electronic components according to any one of claims 1 to 8, wherein the testing area is provided with a pre-warming tray and a testing mechanism, the pre-warming tray pre-warms the electronic components received from the feeding area, and the pre-warmed electronic components are transported to the testing mechanism for testing.

11. The automatic test handler of any one of claims 1 to 8, further comprising an outfeed section to which electronic components are transported after testing in the test section, the outfeed section comprising a manual outfeed section and/or an automatic outfeed section.

12. The automatic test handler of any one of claims 1 to 8, wherein the feeding area and the testing area are covered with a sealing cover to form a sealing space, and the sealing space is divided into the feeding sealing chamber and the testing sealing chamber by a partition plate.

Images