CN217116031U

CN217116031U - Battery test fixture

Info

Publication number: CN217116031U
Application number: CN202122762064.3U
Authority: CN
Inventors: 黄超群; 吴平; 庄辉虎; 黄辉明
Original assignee: Fujian Jp Solar Co ltd
Current assignee: Fujian Jp Solar Co ltd
Priority date: 2021-11-12
Filing date: 2021-11-12
Publication date: 2022-08-02
Anticipated expiration: 2031-11-12

Abstract

The utility model provides a battery test fixture, it arranges the probe of a plurality of rows and integrates into probe row module, and the probe row module passes through probe row module draw-in groove fixed connection with the upper and lower probe row support of test board. When the probe is replaced by the battery test fixture, only the probe row module which is prepared in advance needs to be replaced, so that the downtime for replacing the probe is shortened, and the loss of mass production capacity is reduced. The relative position of a plurality of rows of probe rows fixed on the probe row module can be freely adjusted, and the solar cell test requirements of different sizes or different main grid intervals can be better met. The number of the current probes is more than that of the voltage probes, the contact resistance of the current probes in the test is small, and the measured battery data are more accurate.

Description

Battery test fixture

Technical Field

The utility model relates to a solar cell test and test fixture field especially relate to a many main grids solar cell's test fixture.

Background

With the carbon peak and the carbon neutralization policy, clean energy such as solar energy will enter the era of high-speed flight. The silicon wafer is large-sized, and multi-main grid is one of the mainstream trends of improving the power of the solar cell at present, and the larger size of the cell and more main grid electrodes also put higher requirements on the test accuracy, the timeliness and the like of the solar cell test jig.

The traditional solar cell test fixture has the following technical problems: 1) the number of voltage probes of a probe row of a traditional solar cell test fixture is equal to the number of current probes, and the test accuracy is deviated under the condition that the contact resistance between a test probe and a cell electrode is large; in the test of a large-size battery with multiple main grids, the number of probes required is large, and the timeliness for replacing the probes is extremely poor. 2) The voltage probes and the current probes of the traditional solar cell testing jig are arranged in parallel, so that the number of the voltage probes is equal to that of the current probes, the voltage probes which are actually tested and connected in parallel are insensitive to the increase of the contact resistance, and a small number of voltage probes can be accurately measured; the series current probe requires that the contact resistance is as small as possible, the test is more accurate, and more current probes are needed. Therefore, the number of conventional voltage probes is equal to that of the current probes, and when testing a high resistance battery, the voltage probes are in interference, while the current probes are insufficient. 3) According to the traditional solar cell testing jig, a probe row is directly fixed on an upper probe row support and a lower probe row support of testing equipment, each row of probe row needs to be detached independently when a probe is replaced, and the probe row is installed again after the probe is replaced. With the gradual multi-main grid of the large-size battery, the number of the test probe rows and the number of the test probes are obviously increased, the traditional probe replacement mode consumes much production effective time, and the capacity loss is large. In addition, because the number of the main grids is large and dense, the traditional mode of replacing the probes is inconvenient in aligning the probe rows with the main grids of the battery, and the dislocation is easily caused, so that the testing accuracy is low. Therefore, the solar cell test fixture in the prior art cannot meet the test requirements of the solar cell with large size and multiple main grids.

Disclosure of Invention

In order to solve the problems, the utility model provides a battery test fixture, which is characterized in that the battery test fixture comprises an upper probe row support and a lower probe row support which are arranged in parallel, and an upper probe row module and a lower probe row module which are respectively arranged on the upper probe row support and the lower probe row support, wherein the upper probe row module and the lower probe row module respectively consist of a plurality of rows of probe rows, and the probe rows consist of a plurality of probes; go up probe row support and probe row support left and right sides down and all be provided with probe row module draw-in groove, go up probe row module and probe row module down and pass through probe row module draw-in groove is fixed respectively at last probe row support and probe row support down.

Furthermore, the left side and the right side of the upper probe row support and the lower probe row support are both provided with threaded through holes; go up probe row module and probe row module down and also all be provided with the screw hole in the position corresponding with probe row support screw through hole to the accessible matches the screw fixation on probe row support screw through hole and probe row module screw hole, realize going up probe row module and go up probe row support and probe row module down and probe row support's further fixed down.

Furthermore, the probe row also comprises probe row fixing blocks arranged on the left side and the right side in the length direction, and threaded holes are formed above the probe row fixing blocks;

furthermore, probe row sliding grooves are formed in the left side and the right side of the upper probe row module and the right side of the lower probe row module, and the probe rows and the probe row sliding grooves are fixed through threaded holes of probe row fixing blocks by using hexagon socket head cap screws; the probe row can slide and be fixed at any position on the sliding groove of the probe row by tightening and loosening screws above the fixed block of the probe row;

further, the probes forming the probe bank comprise current probes and voltage probes, and the number of the current probes is 3-5 times that of the voltage probes;

furthermore, the probes of the probe row are arranged in a way that 1 voltage probe is inserted into each probe at intervals of 3-5 current probes;

furthermore, the probe row is provided with a current conductive copper bar and a voltage conductive copper bar which are respectively connected with the current probe and the voltage probe, an insulating sleeve is arranged at the contact position of the current probe and the voltage conductive copper bar, an insulating sleeve is also arranged at the contact position of the voltage probe and the current conductive copper bar, and the insulating sleeve is used for insulating the current probe and the voltage probe.

From the above description of the structure of the present invention, compared with the prior art, the present invention has the following advantages:

the utility model provides a battery test fixture arranges the probe of a plurality of rows and integrates into probe row module, and the probe row module passes through probe row module draw-in groove fixed connection with the upper and lower probe row support of test board. When the test fixture changes the test probe, only need to change the probe row module that is equipped with in advance can, compare traditional many main bars test fixture, be showing and shorten the down time of changing the probe, reduce the volume production productivity loss. Meanwhile, the relative positions of the plurality of rows of probe rows fixed on the probe row module can be freely adjusted, so that the test requirements of solar cells with different sizes or different main grid intervals can be better met. Moreover, the number of the current probes is more than that of the voltage probes, the contact resistance of the current probes in the test is small, and the measured data is more accurate. The quantity of the voltage probes is small, the contact resistance is large, however, due to the mode of parallel test of the voltage probes, the influence of the contact resistance of the probes on the test result is small, and a small quantity of the voltage probes can also test accurate data.

Drawings

The accompanying drawings, which are incorporated in and constitute a part of this application, are included to provide a further understanding of the invention, and are incorporated in and constitute a part of this specification. In the drawings:

fig. 1 is a structural front view of a battery testing jig provided by the present invention;

fig. 2 is a top view of the battery testing jig provided by the present invention;

fig. 3 is a schematic diagram of a probe row structure of the battery test fixture provided by the present invention;

FIG. 4 is an enlarged schematic view of the structure of the battery testing fixture at position A, where the voltage probes are connected to the voltage conductive copper bars and insulated from the current conductive copper bars;

fig. 5 is an enlarged schematic view of the structure of the battery test fixture in fig. 3, in which the current probe at the position of probe row B is connected to the current conductive copper bar and insulated from the voltage conductive copper bar.

Detailed Description

In order to make the objects, technical solutions and advantages of the present invention more clearly understood, the present invention is further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the invention and are not intended to limit the invention.

As shown in fig. 1-3, the utility model provides a battery testing jig, which comprises an upper probe row support 1 and a lower probe row support 2 arranged in parallel, an upper probe row module 21-1 and a lower probe row module 21-2 respectively arranged on the upper probe row support 1 and the lower probe row support 2, wherein the upper probe row module 21-1 and the lower probe row module 21-2 respectively comprise a plurality of rows of probe rows 24, and the probe row 24 comprises a plurality of probes; the left and right sides of the upper probe row support 1 and the lower probe row support 2 are respectively provided with a probe row module clamping groove 3, and the upper probe row module 21-1 and the lower probe row module 21-2 are respectively fixed on the upper probe row support 1 and the lower probe row support 2 through the probe row module clamping grooves 3.

The left side and the right side of the upper probe row support 1 and the lower probe row support 2 are both provided with threaded through holes 22; the upper probe row module 21-1 and the lower probe row module 21-2 are also provided with threaded holes at positions corresponding to the probe row support threaded through holes 22, and can be fixed on the probe row support threaded through holes 22 and the probe row module threaded holes through matched screws, so that the upper probe row module 21-1 and the upper probe row support 1, and the lower probe row module 21-2 and the lower probe row support 2 are further fixed. The probe row 24 further comprises probe row fixing blocks 31 arranged on the left side and the right side of the length direction, and threaded holes 31-1 are formed above the probe row fixing blocks 31. The left side and the right side of the upper probe row module 21-1 and the lower probe row module 21-2 are respectively provided with a probe row sliding groove 23, and the probe row 24 and the probe row sliding groove 23 are fixed through a threaded hole 31-1 of a probe row fixing block 31 by using an inner hexagonal screw; the probe row 24 can slide and be fixed at any position on the probe row sliding groove 23 by tightening and loosening screws above the probe row fixing block 31.

The probes constituting the probe bank 24 comprise current probes 35 and voltage probes 34, and the number of the current probes 34 is 3-5 times that of the voltage probes 35; the probes of the probe bank 24 are arranged such that 1 voltage probe 35 is interspersed with 3-5 current probes 34. The probe bank 24 is provided with a current conductive copper bar 32 and a voltage conductive copper bar 33 which are respectively connected with a current probe 35 and a voltage probe 34, and as shown in fig. 4, an insulating sleeve 41 is arranged at the position where the current probe 35 is contacted with the voltage conductive copper bar 33; as shown in fig. 5, the voltage probe 34 is also provided with an insulating sleeve 42 at the position where it contacts the current conducting copper bar 32, and the

insulating sleeves

41, 42 are used for insulation between the current probe and the voltage probe.

The utility model discloses the arrangement of test fixture current probe and voltage probe, current probe quantity equals approximately 3-5 times of voltage probe quantity, compares in the one-to-one arrangement relation of traditional solar cell test fixture current probe and voltage probe, and the contact resistance of the current probe who establishes ties with the battery test return circuit effectively reduces, and the contact resistance of the voltage probe who establishes ties with the battery test return circuit has certain increase; by the difference of series-parallel connection mode to the influence of IV test accuracy, the utility model discloses test fixture, can be more accurate the solar cell IV curve of drawing, more adapt to in high contact resistance's the many main bars of jumbo size solar cell.

The utility model provides a when battery test fixture changes the probe, loosen earlier and fix interior hex bolts on the screw through-hole 22 of upper and lower

probe bank support

1, 2 takes off upper and lower probe bank module 21-1, 21-2 from probe bank module draw-in groove 3 respectively, will be equipped with in advance and changed the probe and confirm that probe bank 24 probe bank's probe bank module 21 of position passes through probe bank module draw-in groove 3 and puts back, locks the interior hex bolts of upper and lower probe bank support again to go on the fine setting of probe bank 24 position, thereby accomplish the utility model discloses the change of test fixture probe. When the size or specification of the battery changes and the position of the probe row 24 needs to be adjusted, the tightness of the screw above the fixed block of the probe row is adjusted, so that the probe row 24 slides at any position on the chute 23 of the probe row, and solar cells at different main grid intervals are matched.

The utility model provides a battery test fixture current probe and voltage probe arrangement mode and current probe quantity approximately equal to 3-5 times of voltage probe quantity, compare in the one-to-one arrangement relation of traditional solar battery test fixture current probe and voltage probe, its contact resistance with the current probe of battery test circuit series connection effectively reduces, the contact resistance of the voltage probe of connecting in parallel with battery test circuit has certain increase; by the difference of series-parallel connection mode to the influence of IV test accuracy, the utility model discloses battery test fixture, the solar cell IV curve of delineating that can be more accurate will more adapt to in the test of high contact resistance's the many owner bars of jumbo size solar cell.

To sum up, the utility model provides a battery test fixture arranges the probe of a plurality of rows and integrates into probe row module, and the probe row module passes through probe row module draw-in groove fixed connection with the upper and lower probe row support of test board. When the test fixture changes the test probe, only need to change the probe row module that is equipped with in advance can, compare traditional many main bars test fixture, be showing and shorten the down time of changing the probe, reduce the volume production productivity loss. Meanwhile, the relative positions of the plurality of rows of probe rows fixed on the probe row module can be freely adjusted, so that the test requirements of solar cells with different sizes or different main grid intervals can be better met. Moreover, the number of the current probes is more than that of the voltage probes, the contact resistance of the current probes in the test is small, and the measured data is more accurate. The quantity of the voltage probes is small, the contact resistance is large, however, due to the parallel connection test mode of the voltage probes, the influence of the contact resistance of the probes on the test result is small, and a small quantity of the voltage probes can also test accurate data.

The above description is only for the purpose of illustrating the preferred embodiments of the present invention and is not to be construed as limiting the invention, and any modifications, equivalents and improvements made within the spirit and principle of the present invention are intended to be included within the scope of the present invention.

Claims

1. A battery test fixture is characterized by comprising an upper probe row support and a lower probe row support which are arranged in parallel, and an upper probe row module and a lower probe row module which are respectively arranged on the upper probe row support and the lower probe row support, wherein the upper probe row module and the lower probe row module respectively consist of a plurality of rows of probe rows, and each probe row consists of a plurality of probes; go up probe row support and probe row support left and right sides down and all be provided with probe row module draw-in groove, go up probe row module and probe row module down and pass through probe row module draw-in groove is fixed respectively at last probe row support and probe row support down.

2. The battery testing jig of claim 1, further characterized by: the left side and the right side of the upper probe row support and the lower probe row support are both provided with threaded through holes; go up probe row module and probe row module down and also all be provided with the screw hole in the position corresponding with probe row support screw through hole to the accessible matches the screw fixation on probe row support screw through hole and probe row module screw hole, realize going up probe row module and go up probe row support and probe row module down and probe row support's further fixed down.

3. The battery testing jig of claim 1, further characterized by: the probe row also comprises probe row fixing blocks arranged on the left side and the right side of the length direction, and threaded holes are formed in the upper portions of the probe row fixing blocks.

4. The battery test fixture of claim 1 or 2, further characterized in that: probe row sliding grooves are formed in the left side and the right side of the upper probe row module and the left side and the right side of the lower probe row module, and the probe rows and the probe row sliding grooves are fixed through threaded holes of probe row fixing blocks by using hexagon socket head cap screws; the probe row can slide and be fixed at any position on the sliding groove of the probe row by the tightness of a screw above the fixed block of the probe row.

5. The battery testing jig of claim 1, further characterized by: the probe row comprises current probes and voltage probes, and the number of the current probes is 3-5 times that of the voltage probes.

6. The battery testing jig of claim 1, further characterized by: the probes of the probe row are arranged in a way that 1 voltage probe is inserted into 3-5 current probes at intervals.

7. The battery testing jig of claim 1, further characterized by: the probe bank is provided with a current conductive copper bar and a voltage conductive copper bar which are respectively connected with a current probe and a voltage probe, an insulating sleeve is arranged at the position where the current probe is contacted with the voltage conductive copper bar, an insulating sleeve is also arranged at the position where the voltage probe is contacted with the current conductive copper bar, and the insulating sleeve is used for insulating the current probe and the voltage probe.