CN218885996U - IV probe row compatible with different cathode point positions of MWT battery - Google Patents

IV probe row compatible with different cathode point positions of MWT battery Download PDF

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Publication number
CN218885996U
CN218885996U CN202220413699.4U CN202220413699U CN218885996U CN 218885996 U CN218885996 U CN 218885996U CN 202220413699 U CN202220413699 U CN 202220413699U CN 218885996 U CN218885996 U CN 218885996U
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probe
panel
sliding plate
probes
probe row
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CN202220413699.4U
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Chinese (zh)
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苏生洪
职森森
徐建华
路忠林
张凤鸣
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Jiangsu Sunport Power Corp Ltd
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Jiangsu Sunport Power Corp Ltd
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Abstract

The utility model discloses a compatible IV probe row of different negative pole point positions of MWT battery relates to photovoltaic manufacturing technical field. The probe row can be conveniently and efficiently adjusted according to different sizes of silicon wafers and different positions of the cathode point, so that the probes are accurately pressed at the positions of the cathode points of the MWT battery, the testing precision is improved, the step of replacing the probes is omitted when different sizes are switched, probe consumables are reduced, and machine halt time is shortened. The IV probe row comprises an upper probe mechanism and a lower probe mechanism; the upper probe mechanism comprises an upper fixed seat and a plurality of upper probe row groups, each upper probe row group comprises an upper sliding plate and three upper probes which are sequentially connected in series, and the upper probes are connected with a-V; the lower probe mechanism comprises a lower fixing seat and a plurality of lower probe row groups, each lower probe row group comprises a lower sliding plate and three lower probes, and the three lower probes are respectively connected with + V, + I and-I. And the loss and the capacity loss caused by replacing the probe row are reduced.

Description

IV probe row compatible with different cathode point positions of MWT battery
Technical Field
The utility model relates to a photovoltaic manufacturing technology field relates to a compatible MWT battery different negative pole point position's IV probe row.
Background
With the rapid development of the photovoltaic industry, the size types of the MWT battery piece become more, and the position of the cathode point of the MWT battery piece changes along with the size of the silicon chip and the design of the position of the cathode point, so that different probe rows need to be replaced when the electrical performance is tested, and the purpose of accurate test is achieved. However, when different probe banks are replaced, time and labor are consumed, and the replaced probe banks are scrapped due to probe oxidation under the condition that the probe banks are not used for a long time, so that the production cost is increased.
Meanwhile, the increase of the price of the silicon wafer increases the production cost. In order to reduce the production cost, the whole silicon wafer can be cut into half-size silicon wafers (such as 166mm, 83mm), and the silicon wafer loss caused by the problems of edge breakage, loss and the like of the whole silicon wafer can be reduced. However, the conventional integral test probe card is not compatible with half-cell, and if the integral and half-cell are switched, the probe card suitable for the half-cell is bought again, which undoubtedly increases the production cost.
SUMMERY OF THE UTILITY MODEL
The utility model discloses to above problem, provided a compatible MWT battery different negative pole point position's IV probe row, can carry out convenience, efficient adjustment to the probe row to different silicon chip sizes, different negative pole point position designs to press the probe accurately at MWT battery negative pole point position, improve the measuring accuracy, save the change probe step when switching different sizes simultaneously, reduce the probe consumptive material, reduce board down time.
The technical scheme of the utility model is that: the IV probe row comprises an upper probe mechanism and a lower probe mechanism;
the upper probe mechanism comprises an upper fixed seat 13 and a plurality of upper probe row groups 11 detachably connected to the upper fixed seat 13, each upper probe row group 11 comprises an upper sliding plate 12 and three upper probes 14 which are fixedly connected to the upper sliding plate 12 and are sequentially connected in series, and each upper probe 14 is connected with a-V;
an upper horizontal sliding groove is further formed in the upper fixing seat 13, and the upper sliding plate 12 is connected to the upper horizontal sliding groove in a sliding manner;
the lower probe mechanism comprises a lower fixed seat 23 and a plurality of lower probe row groups 21 detachably connected to the lower fixed seat 23, each lower probe row group 21 comprises a lower sliding plate 22 and three lower probes 24 fixedly connected to the lower sliding plate 22, and the three lower probes 24 are respectively connected with + V, + I and-I;
the lower fixed seat 23 is further provided with a lower horizontal sliding groove, and the lower sliding plate 22 is slidably connected in the lower horizontal sliding groove.
The upper fixing seat 13 comprises a first upper panel and a second upper panel which are arranged in parallel and fixedly connected, and the upper horizontal sliding chute is arranged on the first upper panel and is in a step shape with a large inner part and a small outer part; the plurality of upper probe row groups 11 are arranged between the first upper panel and the second upper panel, the upper sliding plate 12 is connected to the inner side of the upper horizontal sliding chute in a sliding mode, an upper bolt 15 in threaded connection with the upper sliding plate 12 is arranged in the upper sliding plate 12 in a penetrating mode, and the upper bolt 15 abuts against the second upper panel.
The upper panel I is fixedly connected with the upper panel II through an upper screw, the upper screw penetrates through the upper panel I and is in threaded connection with the upper panel II, an upper sleeve is further sleeved in the middle of the upper screw, and the upper sleeve abuts between the upper panel I and the upper panel II.
The lower fixed seat 23 comprises a first lower panel and a second lower panel which are arranged in parallel and fixedly connected, and the lower horizontal chute is arranged on the first lower panel and is in a ladder shape with a large inner part and a small outer part; the plurality of lower probe row groups 21 are arranged between the first lower panel and the second lower panel, the lower sliding plate 22 is connected to the inner side of the lower horizontal sliding groove in a sliding mode, a lower bolt 25 in threaded connection with the lower sliding plate 22 penetrates through the lower sliding plate 22, and the lower bolt 25 abuts against the second lower panel.
The lower panel I is fixedly connected with the lower panel II through a lower screw, the lower screw penetrates through the lower panel I and is in threaded connection with the lower panel II, a lower sleeve is further sleeved in the middle of the lower screw, and the lower sleeve abuts between the lower panel I and the lower panel II.
The utility model discloses a probe group of position about a plurality of adjustable can press the probe point position perfect to negative pole point position to corresponding current data is collected to the accurate, increases the accuracy of test. Meanwhile, when the production line switches MWT battery products at the positions of the negative pole points with different intervals, the purpose of not changing the probe row can be achieved by only moving the position of the probe group left and right, and loss and capacity loss caused by changing the probe row are reduced. Meanwhile, the invention is also compatible with the test of half cells, and can realize the test switching of half cells and whole cells by increasing or reducing the probe row groups, thereby saving the switching loss of the probe row and reducing the production cost.
Drawings
FIG. 1 is a schematic diagram of the structure of a single upper probe row group,
FIG. 2 is a schematic diagram of the structure of a single lower probe array,
figure 3 is a schematic view of the structure of the upper sliding plate,
figure 4a is a schematic structural view of the upper fixing seat,
figure 4b is a top view of figure 4a,
figure 4c isbase:Sub>A cross-sectional view taken along linebase:Sub>A-base:Sub>A of figure 4base:Sub>A,
FIG. 5 is a schematic view of the assembled structure of the present invention;
in the figure, 1 is an upper probe mechanism, 11 is an upper probe row group, 12 is an upper sliding plate, 13 is an upper fixed seat, 14 is an upper probe, and 15 is an upper bolt;
2 is a lower probe mechanism, 21 is a lower probe bank group, 22 is a lower sliding plate, 23 is a lower fixed seat, 24 is a lower probe, and 25 is a lower bolt.
Detailed Description
In order to clearly explain the technical features of the present patent, the following detailed description of the present patent is provided in conjunction with the accompanying drawings.
As shown in fig. 1-5, the IV probe row includes an upper probe mechanism and a lower probe mechanism;
the upper probe mechanism comprises an upper fixed seat 13 and a plurality of upper probe row groups 11 which are detachably connected on the upper fixed seat 13, the upper probe row groups 11 comprise an upper sliding plate 12 and three upper probes 14 which are fixedly connected on the upper sliding plate 12 and are sequentially connected in series, and the upper probes 14 are connected with-V;
an upper horizontal sliding groove is further formed in the upper fixing seat 13, and the upper sliding plate 12 is connected to the upper horizontal sliding groove in a sliding manner; therefore, the plurality of upper probe row groups 11 can be subjected to spacing or position adjustment under the limiting of the upper horizontal sliding groove, so that the height change of the upper probe row groups 11 after adjustment is avoided while the positions of the upper probe row groups 11 are conveniently adjusted;
the lower probe mechanism comprises a lower fixed seat 23 and a plurality of lower probe row groups 21 detachably connected to the lower fixed seat 23, each lower probe row group 21 comprises a lower sliding plate 22 and three lower probes 24 fixedly connected to the lower sliding plate 22, and the three lower probes 24 are respectively connected with + V, + I and-I;
the lower fixed seat 23 is further provided with a lower horizontal sliding groove, and the lower sliding plate 22 is slidably connected in the lower horizontal sliding groove. Thereby make a plurality of probe row group 11 of going up can carry out interval or position control under the spacing of last horizontal spout to when the realization carries out convenient adjustment to the position of going up probe row group 11, avoid its altitude variation that appears after the adjustment.
When the device is used, each upper probe row group 11 and each lower probe row group 21 can be moved left and right to a required interval and then fixed. Therefore, when testing the MWT batteries with different cathode point intervals, the interval of the probe row group is adjustable, so that the probes are accurately pressed on the cathode points, and the purpose of improving the testing accuracy is achieved.
The upper fixing seat 13 comprises a first upper panel and a second upper panel which are arranged in parallel and fixedly connected, and the upper horizontal sliding groove is formed in the first upper panel and is in a step shape with a large inside and a small outside; the plurality of upper probe row groups 11 are arranged between the first upper panel and the second upper panel, the upper sliding plate 12 is connected to the inner side of the upper horizontal sliding chute in a sliding mode, an upper bolt 15 in threaded connection with the upper sliding plate 12 penetrates through the upper sliding plate 12, and the upper bolt 15 abuts against the second upper panel. So that the detachable connection between the upper sliding plate and the upper fixing base is achieved by tightening or loosening the upper bolt 15.
The upper panel I is fixedly connected with the upper panel II through an upper screw, the upper screw penetrates through the upper panel I and is in threaded connection with the upper panel II, an upper sleeve is further sleeved in the middle of the upper screw, and the upper sleeve abuts between the upper panel I and the upper panel II. Therefore, a plurality of upper probe row groups 11 can be conveniently placed between the first upper panel and the second upper panel, so that the upper probe mechanism can be efficiently assembled, and enough position space can be reserved for the upper probes by virtue of the upper sleeves after the upper probe mechanism is assembled.
The lower fixing seat 23 comprises a first lower panel and a second lower panel which are arranged in parallel and fixedly connected, and the lower horizontal sliding groove is formed in the first lower panel and is in a step shape with a large inside and a small outside; the plurality of lower probe row groups 21 are arranged between the first lower panel and the second lower panel, the lower sliding plate 22 is connected to the inner side of the lower horizontal sliding groove in a sliding mode, a lower bolt 25 in threaded connection with the lower sliding plate 22 penetrates through the lower sliding plate 22, and the lower bolt 25 abuts against the second lower panel. So that the lower sliding plate is detachably connected to the lower fixed base by tightening or loosening the lower bolt 25.
The lower panel I is fixedly connected with the lower panel II through a lower screw, the lower screw penetrates through the lower panel I and is in threaded connection with the lower panel II, a lower sleeve is further sleeved in the middle of the lower screw, and the lower sleeve abuts between the lower panel I and the lower panel II. Therefore, the lower probe row groups 21 can be conveniently placed between the first lower panel and the second lower panel, so that efficient assembly of the lower probe mechanism is achieved, and sufficient position space can be reserved for the lower probes by means of the lower sleeves after assembly.
Taking the number of negative electrode points 6*6 as an example:
respectively preparing 6 pairs of upper and lower probe row groups, adjusting the distance between the probe row groups according to the distance between the negative electrode points on the battery piece to ensure that the probes can be accurately pressed on the negative electrode points, screwing down the bolts on the fixed nylon plate, and fixing each probe row on the fixed nylon plate shown in figures 4a, 4b and 4 c. All the leads of the upper probe are connected in series and are connected with-V of the IV testing machine, the lower probe is connected in series in the same way according to the wiring information of each probe, and the + V, + I and I signals of the IV testing machine are respectively connected. During testing, the upper probe row and the lower probe row are overlapped by the testing mechanism, corresponding voltage and current are connected, the upper probe row and the lower probe row are led into the half cell, and a palm machine collects relevant data and calculates the electrical property of the half cell.
If need test other negative pole point interval and the battery piece of number, multiplicable corresponding probe row group, and adjust the interval of probe row group according to negative pole point interval, can realize not changing whole probe row and test.
The present invention has many specific embodiments, and the above description is only the preferred embodiment of the present invention, it should be noted that, for those skilled in the art, a plurality of improvements can be made without departing from the principle of the present invention, and these improvements should also be regarded as the protection scope of the present invention.

Claims (5)

1. An IV probe bank compatible with different cathode point positions of an MWT battery comprises an upper probe mechanism and a lower probe mechanism; it is characterized in that the preparation method is characterized in that,
the upper probe mechanism comprises an upper fixed seat (13) and a plurality of upper probe row groups (11) detachably connected to the upper fixed seat (13), each upper probe row group (11) comprises an upper sliding plate (12) and three upper probes (14) which are fixedly connected to the upper sliding plate (12) and are sequentially connected in series, and the upper probes (14) are connected with-V;
an upper horizontal sliding groove is formed in the upper fixed seat (13), and the upper sliding plate (12) is connected to the upper horizontal sliding groove in a sliding manner;
the lower probe mechanism comprises a lower fixed seat (23) and a plurality of lower probe row groups (21) detachably connected to the lower fixed seat (23), each lower probe row group (21) comprises a lower sliding plate (22) and three lower probes (24) fixedly connected to the lower sliding plate (22), and the three lower probes (24) are respectively connected with + V, + I and-I;
the lower fixing seat (23) is also provided with a lower horizontal sliding groove, and the lower sliding plate (22) is connected to the lower horizontal sliding groove in a sliding manner.
2. The IV probe bank compatible with different cathode point positions of MWT batteries according to claim 1, wherein the upper fixing seat (13) comprises a first upper panel and a second upper panel which are arranged in parallel and fixedly connected, the upper horizontal sliding groove is opened on the first upper panel and is in a step shape with a large inside and a small outside; the upper probe row groups (11) are arranged between the first upper panel and the second upper panel, the upper sliding plate (12) is connected to the inner side of the upper horizontal sliding groove in a sliding mode, an upper bolt (15) in threaded connection with the upper sliding plate is arranged in the upper sliding plate (12) in a penetrating mode, and the upper bolt (15) abuts against the second upper panel.
3. The IV probe bank compatible with different cathode point positions of MWT batteries is characterized in that the first upper panel and the second upper panel are fixedly connected through an upper screw, the upper screw penetrates through the first upper panel and is in threaded connection with the second upper panel, an upper sleeve is further sleeved in the middle of the upper screw, and the upper sleeve abuts between the first upper panel and the second upper panel.
4. The IV probe bank compatible with different cathode point positions of MWT batteries according to claim 1, wherein the lower fixing seat (23) comprises a first lower panel and a second lower panel which are arranged in parallel and fixedly connected, the lower horizontal chute is opened on the first lower panel and is in a step shape with a large inside and a small outside; the lower probe row groups (21) are arranged between the first lower panel and the second lower panel, the lower sliding plate (22) is connected to the inner side of the lower horizontal sliding groove in a sliding mode, a lower bolt (25) in threaded connection with the lower sliding plate is arranged in the lower sliding plate (22) in a penetrating mode, and the lower bolt (25) abuts against the second lower panel.
5. The IV probe bank compatible with different cathode point positions of MWT batteries according to claim 4, wherein the lower panel I and the lower panel II are fixedly connected through a lower screw, the lower screw penetrates through the lower panel I and is in threaded connection with the lower panel II, a lower sleeve is further sleeved in the middle of the lower screw, and the lower sleeve abuts between the lower panel I and the lower panel II.
CN202220413699.4U 2022-02-28 2022-02-28 IV probe row compatible with different cathode point positions of MWT battery Active CN218885996U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202220413699.4U CN218885996U (en) 2022-02-28 2022-02-28 IV probe row compatible with different cathode point positions of MWT battery

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202220413699.4U CN218885996U (en) 2022-02-28 2022-02-28 IV probe row compatible with different cathode point positions of MWT battery

Publications (1)

Publication Number Publication Date
CN218885996U true CN218885996U (en) 2023-04-18

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ID=85945791

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202220413699.4U Active CN218885996U (en) 2022-02-28 2022-02-28 IV probe row compatible with different cathode point positions of MWT battery

Country Status (1)

Country Link
CN (1) CN218885996U (en)

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