CN211908744U - Quick replacement probe row subassembly device - Google Patents

Abstract

The utility model provides a quick replacement probe row subassembly device, including parallel arrangement's last framed bent and lower framed bent, be equipped with a plurality of probe row bodies of being listed as on every last framed bent and every lower framed bent respectively, quick replacement probe row subassembly device still includes the reference portion, the reference portion sets up on last framed bent and/or the lower framed bent, wherein the probe row body basis the position location of reference portion is installed on last framed bent and/or the lower framed bent. This kind of quick replacement probe row subassembly device, through last framed bent and the setting of lower framed bent, with the negative pole and the mutual adaptation of positive pole of photovoltaic cell piece, and the setting of a plurality of rows of probe row bodies, be used for the installation probe be convenient for realize the switching of the grid to different photovoltaic cell and aim at, through the setting of reference portion, be convenient for realize the position that the body was arranged to the location probe, thereby when the body was arranged to the probe that needs to be changed, realize reducing down time's effect, overall efficiency is high, need not to wait to the probe and pull out to insert one by one.

Description

Quick replacement probe row subassembly device

Technical Field

The utility model relates to a photovoltaic cell piece check out test set, concretely relates to quick replacement probe row subassembly device.

Background

Application number CN201720185198.4 discloses a probe testing arrangement for no main grid solar cell, including the probe row, the probe row includes probe framed bent and a plurality of telescopic probe group, and every telescopic probe group includes an at least current probe and a voltage probe, the below of a plurality of telescopic probe group is equipped with probe head or busbar. This testing arrangement adopts the cross coincidence design of Z type structure probe head and sectional type or adopts the flexible busbar of stretching out and drawing back for the test of no main grid battery becomes more convenient and accurate, has reduced the bad contact problem that conventional silk screen crimping technique brought on the one hand, also makes the compatibility of test probe group stronger simultaneously, even battery grid line quantity and interval change also can be suitable for, this kind of design can be with the good compatibility of conventional production line test sorting system, be favorable to the industrialization of new technology to promote and produce most importantly.

In the prior art, when detecting a photovoltaic cell, a probe is usually required to be electrically connected to a main gate line on a photovoltaic silicon wafer, and then the electrical detection is performed on the main gate line. After the probe is electrically connected for a long time, the probe is subjected to certain loss oxidation, so that the overall detection precision and effect are weakened, and the probe needs to be replaced in order to ensure the detection effect of the probe.

Generally, with the form of trading the probe at first, close the machine, then pull out every probe, insert every new probe of changing again, then put into the station, the whole change process is loaded down with trivial details and inefficiency, and in order to can further accelerate its change efficiency, consequently need provide one kind and be convenient for improve change efficiency, realize reducing the quick replacement probe row subassembly device of shut down change time.

SUMMERY OF THE UTILITY MODEL

The to-be-solved technical problem of the utility model is: on the conventional equipment, go up the framed bent and fix on equipment with lower framed bent, the probe is arranged the body and is adjusted the position through being located the silicon chip grid line between framed bent and the lower framed bent, after conventional equipment operation a period, need change the probe on the probe row body, at this moment, need shut down, the probe row body is fallen in dismantlement of one, change the probe on the probe row body again one by one, then, the probe row body that will change new probe is adjusted to suitable position according to the grid line of silicon chip again, install on last framed bent and the lower framed bent, start operation equipment again.

The utility model provides a technical scheme that its technical problem adopted is: a device for quickly replacing probe row components comprises an upper bent frame and a lower bent frame which are arranged in parallel, a plurality of rows of probe row bodies are respectively arranged on each upper bent frame and each lower bent frame,

the quick-change probe bank assembly device further comprises a reference part, wherein the reference part is arranged on the upper bent frame and/or the lower bent frame, and the reference part is arranged on the upper bent frame and/or the lower bent frame

The probe row body is positioned and installed on the upper bent frame and/or the lower bent frame according to the position of the reference part.

Preferably, the probe row bodies of several columns are parallel to each other and the distance between two adjacent reference parts is adjustable.

Preferably, the reference part is a scale provided on at least one side of the upper and/or lower bent.

Preferably, the device for quickly replacing the probe row components further comprises a fixing piece, and two ends of the probe row body are respectively fixed with the fixing piece;

the upper bent frame and the lower bent frame have the same structure;

a sliding groove is formed in the upper bent frame along the length direction of the scales;

the fixing piece is slidably arranged in the sliding groove; and

the fixing member can be positioned within the chute.

Preferably, the fixing piece comprises a positioning pressing block and a locking block;

the lower end face of the positioning pressing block is provided with a convex block clamped in the sliding groove, and the side wall of the positioning pressing block is provided with a clamping groove;

the locking block is inserted into the clamping groove and fixed through a stud; and

the side part of the probe row body is clamped in the clamping groove and is clamped and positioned through the locking block.

Preferably, the quick-change probe bank assembly device further comprises a plurality of marble nuts clamped in the sliding grooves;

the upper end surface of the positioning pressing block is provided with a through hole;

and the screw penetrates through the through hole to be fixedly positioned with the marble nut.

Preferably, the upper cross section of the clamping groove is in a right trapezoid shape, and the clamping groove is provided with an inclined guide wall;

the locking block is provided with a joint guide wall mutually jointed with the inclined guide arm;

the joint guide wall is mutually jointed with the inclined guide wall; wherein

The fitting guide wall can slide along the inclined guide wall.

Preferably, the locking block is integrally provided with a guide block, and a probing groove is formed in the inclined guide wall of the positioning pressing block;

the guide block is clamped in the probing groove, wherein

When the fit guide wall slides relative to the inclined guide wall, the guide block slides relative to the probing groove.

Preferably, a threaded through hole is formed in the side part of the locking block;

a blind hole is formed at the bottom of the clamping groove;

the stud is in threaded connection with the threaded through hole and the threaded blind hole in sequence.

Preferably, the probe card body comprises a frame body and a probe sleeve fixed on the frame body;

a buffer spring is arranged in the probe sleeve, and one end of the buffer spring is fixed at the bottom of the probe sleeve.

The utility model has the advantages that the quick-replacement probe row assembly device is mutually adaptive to the cathode and the anode of a photovoltaic cell through the arrangement of the upper row frame and the lower row frame, and the arrangement of a plurality of rows of probe row bodies is used for installing probes to conveniently realize the switching alignment of grids of different photovoltaic cells; compare in traditional equipment, reduced the time of changing the probe row and counterpoint adjustment, and then realized reducing down time's effect, overall efficiency is high, need not to wait to the probe body and pull out to insert one by one.

Drawings

The present invention will be further explained with reference to the drawings and examples.

Fig. 1 is an exploded view of a preferred embodiment of a quick change probe row assembly apparatus of the present invention.

Fig. 2 is a schematic structural diagram of a preferred embodiment of the upper bent of the present invention.

Fig. 3 is a schematic structural view of a preferred embodiment of the fixing member of the present invention.

Fig. 4 is a schematic structural diagram of a preferred embodiment of the positioning block of the present invention.

Fig. 5 is a schematic structural diagram of a preferred embodiment of the locking block of the present invention.

Fig. 6 is a front view of a preferred embodiment of the probe row body of the present invention.

Fig. 7 is a perspective view of a preferred embodiment of the probe row body of the present invention.

In the figure:

the device comprises an upper bent 1, scales 101, a placing opening 102 and a sliding groove 103;

a lower bent 2;

the probe row body 3, the frame body 31 and the probe sleeve 32;

the fixing part 4, the positioning pressing block 41, the convex block 411, the clamping groove 412, the inclined guide wall 413 and the blind hole 414;

the locking block 42, the attaching guide wall 421, the threaded through hole 422 and the clamping gap 43.

Detailed Description

Reference will now be made in detail to embodiments of the present invention, examples of which are illustrated in the accompanying drawings, wherein like reference numerals refer to the same or similar elements or elements having the same or similar function throughout. The embodiments described below with reference to the drawings are exemplary only for the purpose of explaining the present invention, and should not be construed as limiting the present invention. On the contrary, the embodiments of the invention include all changes, modifications and equivalents coming within the spirit and terms of the claims appended hereto.

In the description of the present invention, it is to be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "axial", "radial", "circumferential", and the like, indicate orientations and positional relationships based on the orientations and positional relationships shown in the drawings, and are used only for convenience in describing and simplifying the present invention, and do not indicate or imply that the device or element referred to must have a particular orientation, be constructed and operated in a particular orientation, and therefore, should not be construed as limiting the present invention.

Furthermore, the terms "first," "second," and the like are used for descriptive purposes only and are not to be construed as indicating or implying relative importance. In the description of the present invention, it is to be noted that, unless otherwise explicitly specified or limited, the terms "connected" and "connected" are to be interpreted broadly, and may be, for example, fixedly connected, detachably connected, or integrally connected; can be mechanically or electrically connected; may be directly connected or indirectly connected through an intermediate. The specific meaning of the above terms in the present invention can be understood in specific cases to those skilled in the art. In addition, in the description of the present invention, "a plurality" means two or more unless otherwise specified.

Among the prior art, on the conventional equipment, it fixes on equipment to go up row frame 1 and lower row frame 2, the probe is arranged the body and is adjusted the position through being located the silicon chip grid line between row frame 1 and lower row frame 2, after conventional equipment operation a period, need change the probe on the body 3 is arranged to the probe, at this moment, need shut down, the probe is arranged body 3 to dismantlement of one, change the probe on the body 3 is arranged to the probe again one by one, then, the probe that will change new probe is arranged body 3 and is adjusted to suitable position according to the grid line of silicon chip again, install on row frame 1 and lower row frame 2, the operation equipment of rebooting, the loaded down with trivial details and inefficiency of whole change process, and in order to accelerate its change efficiency further, following technical scheme has been adopted:

as shown in fig. 1, an upper bent frame 1 is arranged opposite to the positive electrode surface of the photovoltaic cell, a plurality of rows of probe row bodies 3 are arranged on the upper bent frame 1, and probes are inserted into the probe row bodies 3 and face the positive electrode surface; the lower row frame 2 is arranged opposite to the negative electrode surface of the photovoltaic cell, a plurality of rows of probe row bodies 3 are arranged on the lower row frame 2, probes are inserted into the probe row bodies 3, and the probes face the negative electrode surface;

in order to enable the installation position of each probe row body 3 on the upper bent frame 1 and the lower bent frame 2 and the working position thereof to be in seamless connection without adjusting the position of the probe row body, reference parts are arranged on the upper bent frame 1 and the lower bent frame 2, and the reference parts are mainly used for realizing position reference, so that the probe row bodies 3 on the upper bent frame 1 and the lower bent frame 2 which are not at the working position can be conveniently installed at the corresponding positions, and the probe row bodies can be replaced to the working position without replacing the positions for the second time.

In some embodiments, because the positions of the main gate lines on the surface of the photovoltaic cell slice are different, in order to adapt to the detection requirements of different photovoltaic cell slices, the following technical scheme is adopted:

the probe card bodies 3 on the upper bent frame 1 or the lower bent frame 2 are parallel to each other, and the distance between two adjacent reference parts can be adjusted, so that the requirements of different photovoltaic cells can be met.

The reference part can be a fixed positioning block, can be a red mark, can be any other part capable of being used as a reference, and only needs the part to be capable of adjusting the position, and does not hinder the overall detection.

In some embodiments, as shown in fig. 1 and 2, a specific manner is provided, which is described in detail below mainly by taking the upper bent 1 as the reference portion, wherein the scale 101 is provided on the upper bent 1, the direction of the scale 101 is consistent with the arrangement direction of the probe row bodies 3 located on the upper bent 1, a placing opening 102 is formed in the middle of the upper bent 1, and the probe row bodies 3 are placed in the placing opening 102.

In order to realize the location of probe row body 3, set up mounting 4 in the both sides of probe row body 3, arrange body 3 through mounting 4 and fix on last bent 1 with the probe, and when facing different photovoltaic cell piece, this moment, mounting 4 need adjust for last bent 1's fixed to following technical scheme has been adopted:

the upper bent 1 is provided with two sliding grooves 103, wherein the scales 101 are provided in a mirror image manner about the placing opening 102, and similarly, the two sliding grooves 103 are provided in a mirror image manner relative to the placing opening 102, and the length direction of the sliding grooves 103 is the same as the length direction of the scales 101, namely, the X-axis direction.

In some embodiments, as shown in fig. 2-5, a specific configuration for the fastener 4 is provided:

the fixing member 4 includes a positioning pressing block 41 and a locking block 42, wherein a protrusion 411 is provided on the lower end surface of the positioning pressing block 41, the width of the protrusion 411 is matched with the width of the slot opening of the upper end surface of the sliding slot 103, so that the positioning pressing block 41 is conveniently clamped in the sliding slot 103 through the protrusion 411.

A clamping groove 412 is further formed on the side wall of the positioning pressing block 41, a locking block 42 is inserted into the clamping groove 412, the locking block 42 is inserted into the clamping groove 412, so that a clamping gap 43 is formed in the locking block 42, and the probe row body 3 is clamped in the clamping gap 43.

The locking block 42 is fixed by a stud (not shown). The arrangement of the studs (not shown in the figure) is convenient for realizing the detachable effect.

In some embodiments, in order to enable the positioning pressing block 41 to be fixed well, a marble nut (not shown) is disposed in the sliding groove 103, and then the positioning pressing block 41 and the marble nut (not shown) are connected in sequence through a screw (not shown), so as to achieve a good positioning effect.

In some embodiments, the cross-section of the locking groove 412 is in the shape of a right trapezoid, and correspondingly, at the inclined surface of the right trapezoid, there is an inclined guide wall 413, and the locking block 42 also has a fitting guide wall 421. Moreover, the inclined degree of the inclined guide wall 413 is equal to that of the attaching guide wall 421, so as to ensure the subsequent good attaching guide effect, that is, in the process of pushing the locking block 42, the attaching guide wall 421 can slide along the inclined guide wall 413. The overall guiding effect is good.

The forward movement between the locking block 42 and the positioning pressing block 41 is mainly controlled by a stud (not shown in the figure), wherein a threaded through hole 422 is firstly formed in the locking block 42, then a blind hole 414 is formed in the bottom of the clamping groove 412, the diameter of the blind hole 414 is larger than that of the threaded through hole 422, when the stud (not shown in the figure) is rotated, the locking block 42 is driven to move forwards along the attaching guide wall 421, and in the moving process, the effect of gradual clamping is achieved.

As shown in fig. 6 and 7, in some embodiments, the probe row body 3 is further modified: the probe row body 3 comprises a frame body 31 and a probe sleeve 32 fixed on the frame body 31;

a buffer spring (not shown in the figure) is arranged in the probe sleeve 32, one end of the buffer spring (not shown in the figure) is fixed at the bottom of the probe sleeve 32, firstly, the probe is inserted in the probe sleeve 32, then, when the probe is pressed, the probe firstly extrudes the buffer spring (not shown in the figure), and then, the stable electrical connection with the photovoltaic cell is realized.

When the upper bent frame 1 and the lower bent frame 2 are installed on the equipment, the upper bent frame 1 and the lower bent frame 2 are parallel to each other and are not coplanar, the silicon wafer to be detected is positioned between the upper bent frame 1 and the lower bent frame 2, and the directions of probes on the upper bent frame 1 and the lower bent frame 2 are perpendicular to the surface of the silicon wafer. As shown in fig. 1, the two ends of the probe row body 3 on the upper bent frame 1 are fixed on the upper surface (deviating from one side of the silicon wafer) of the upper bent frame 1, the probe sleeve 32 points to the silicon wafer, the two ends of the probe row on the lower bent frame are fixed on the upper surface (close to one side of the silicon wafer) of the lower bent frame, and the probe 32 points to the silicon wafer, so the probe row body 3 mounted on the upper bent frame 1 and the probe row body 3 mounted on the lower bent frame 2 have different end structures, as shown in fig. 6, the probe row body 3 mounted on the lower bent frame 2 has a schematic structural diagram, as shown in fig. 7, the probe row body 3 mounted on the upper bent frame 1 has a schematic structural diagram, and further the probe row body can be stably fixed on the upper bent frame 1 and the lower bent frame 2, and the influence on the detection result of the silicon wafer is avoided.

In the description herein, references to the description of the term "one embodiment," "some embodiments," "an example," "a specific example," or "some examples," etc., mean that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the invention. In this specification, a schematic representation of the term does not necessarily refer to the same embodiment or example. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples.

In light of the foregoing, it will be apparent to those skilled in the art from this disclosure that various changes and modifications can be made without departing from the spirit and scope of the invention. The technical scope of the present invention is not limited to the content of the specification, and must be determined according to the scope of the claims.

Claims (10)

1. A device for quickly replacing probe row components comprises an upper bent frame and a lower bent frame which are arranged in parallel, wherein a plurality of rows of probe row bodies are respectively arranged on each upper bent frame and each lower bent frame,

the quick-change probe bank assembly device further comprises a reference part, wherein the reference part is arranged on the upper bent frame and/or the lower bent frame, and the reference part is arranged on the upper bent frame and/or the lower bent frame

The probe row body is positioned and installed on the upper bent frame and/or the lower bent frame according to the position of the reference part.

2. The quick-change probe bank assembly apparatus of claim 1,

the probe row bodies of a plurality of rows are parallel to each other, and the distance between two adjacent reference parts is adjustable.

3. The quick-change probe bank assembly apparatus of claim 1,

the reference part is a scale, and the scale is arranged on at least one side of the upper bent frame and/or the lower bent frame.

4. The quick change probe bank assembly apparatus of claim 3 further comprising a fixture, one of said fixtures being secured to each end of said probe bank body;

the upper bent frame and the lower bent frame have the same structure;

a sliding groove is formed in the upper bent frame along the length direction of the scales;

the fixing piece is slidably arranged in the sliding groove; and

the fixing member can be positioned within the chute.

5. The quick change probe bank assembly apparatus of claim 4,

the fixing piece comprises a positioning pressing block and a locking block;

the lower end face of the positioning pressing block is provided with a convex block clamped in the sliding groove, and the side wall of the positioning pressing block is provided with a clamping groove;

the locking block is inserted into the clamping groove and fixed through a stud; and

the side part of the probe row body is clamped in the clamping groove and is clamped and positioned through the locking block.

6. The quick change probe bank assembly apparatus of claim 5,

the quick-change probe bank assembly device also comprises a plurality of marble nuts clamped in the sliding grooves;

the upper end surface of the positioning pressing block is provided with a through hole;

and the screw penetrates through the through hole to be fixedly positioned with the marble nut.

7. The quick change probe bank assembly apparatus of claim 6,

the upper cross section of the clamping groove is in a right trapezoid shape, and the clamping groove is provided with an inclined guide wall;

the locking block is provided with a joint guide wall mutually jointed with the inclined guide arm;

the joint guide wall is mutually jointed with the inclined guide wall; wherein

The fitting guide wall can slide along the inclined guide wall.

8. The quick change probe bank assembly apparatus of claim 7,

the locking block is integrally provided with a guide block, and a probing groove is formed in the inclined guide wall of the positioning pressing block;

the guide block is clamped in the probing groove, wherein

When the fit guide wall slides relative to the inclined guide wall, the guide block slides relative to the probing groove.

9. The quick-change probe bank assembly apparatus of claim 8,

the side part of the locking block is provided with a threaded through hole;

a blind hole is formed at the bottom of the clamping groove;

the stud is in threaded connection with the threaded through hole and the blind hole in sequence.

10. The quick-change probe bank assembly apparatus of claim 1,

the probe row body comprises a frame body and a probe sleeve fixed on the frame body;

a buffer spring is arranged in the probe sleeve, and one end of the buffer spring is fixed at the bottom of the probe sleeve.

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