CN219226226U - Battery test probe structure and device - Google Patents

Abstract

The utility model relates to the technical field of photovoltaic detection, in particular to a battery test probe structure and a device, and aims to solve the problems of poor contact and large shielding area when a main grid-free battery piece is detected by an existing probe row. The battery test probe structure provided by the utility model comprises an upper probe structure, wherein the upper probe structure comprises an upper probe row, and the upper probe row comprises a first electrode strip, a second electrode strip and a reinforcing strip; two sides of the reinforcing strip are respectively connected with the first electrode strip and the second electrode strip; the reinforcing strip is an insulator, and the first electrode strip and the second electrode strip are conductors. Through become the first electrode strip of strip and the second electrode strip with conventional columnar probe, eliminated the clearance between the probe, be equivalent to linking the probe as an organic whole, avoided the problem that partial grid line can't be detected because of the clearance of probe leads to, because the banding structural design, under the prerequisite of guaranteeing intensity, the thickness and the height of probe row can do littleer, reduced the influence of sheltering from.

Description

Battery test probe structure and device

Technical Field

The utility model relates to the technical field of photovoltaic detection, in particular to a battery test probe structure and a device.

Background

In recent years, the production of crystalline silicon solar cells rapidly develops, and the solar industry rapidly rises, which tends to increase competition in the industry, so that cost reduction and efficiency improvement become main development targets of the solar manufacturing industry. Increasing the number of main grids on the battery piece can reduce Rs (series resistance) and reduce Isc (short circuit current) loss caused by grid breakage. However, the increase in the number of main grids necessarily increases the consumption of silver paste, so that in order to reduce the cost of silver consumption, conventional continuous main grids are usually made into a plurality of thin grids (or called non-main grids). The existing probe row has the problem of poor contact when testing the multi-thin-grid-line battery piece, and the shielding area of the probe structure of the PCB or the epoxy resin is larger, so that the testing accuracy is affected.

Disclosure of Invention

The utility model aims to provide a battery test probe structure and a device, which are used for solving the problems of poor contact and large shielding area when the existing probe row detects a battery piece without a main grid.

In order to solve the technical problems, the technical scheme provided by the utility model is as follows:

the utility model provides a battery test probe structure, which comprises an upper probe structure, a lower probe structure and a battery test module, wherein the upper probe structure comprises an upper probe row, and the upper probe row comprises a first electrode strip, a second electrode strip and a reinforcing strip; two sides of the reinforcing strip are respectively connected with the first electrode strip and the second electrode strip; the reinforcing strip is an insulator, and the first electrode strip and the second electrode strip are conductors.

Further, the reinforcing bars are made of ceramic.

Further, the first electrode strip and the second electrode strip are silver-plated copper sheets.

Further, the upper probe row comprises two first electrode strips which are arranged at intervals along the length direction of the upper probe row and two second electrode strips which are arranged at intervals along the length direction of the upper probe row.

Further, the upper probe structure further comprises an upper mounting frame, and the upper mounting frame comprises a frame body and a limiting block; the frame body is provided with a clamping groove, the upper probe row and the limiting block are clamped in the clamping groove, and the limiting block is abutted to the upper probe row.

Further, the battery test probe structure further comprises a lower probe structure, wherein the lower probe structure comprises a lower probe row, and the lower probe row comprises a first electrode group and a second electrode group; the first electrode group and the second electrode group have the same structure and comprise a conductive block and two probes; one end of each of the two probes is connected with a conductive block, and the conductive block is used for being in contact with the battery piece.

Further, the first electrode group and the second electrode group are arranged in parallel, and the distance between the first electrode group and the second electrode group is smaller than the thickness of the reinforcing strip; the plurality of first electrode groups are arranged at intervals along the length direction of the first electrode strips; the plurality of second electrode groups are arranged at intervals along the length direction of the second electrode strips.

Further, the lower probe row further comprises a probe frame, the probe frame is provided with a mounting hole, and the probe is inserted into the mounting hole.

Further, the conductive bumps and probes are made of copper and the surface is silver-plated.

In another aspect of the present utility model, a battery testing device is provided, including the battery testing probe structure described above.

In summary, the technical effects achieved by the utility model are as follows:

the battery test probe structure provided by the utility model comprises an upper probe structure, wherein the upper probe structure comprises an upper probe row, and the upper probe row comprises a first electrode strip, a second electrode strip and a reinforcing strip; two sides of the reinforcing strip are respectively connected with the first electrode strip and the second electrode strip; the reinforcing strip is an insulator, and the first electrode strip and the second electrode strip are conductors.

According to the utility model, the conventional columnar probes are changed into the strip-shaped first electrode strips and second electrode strips, so that the gaps between the probes are eliminated, the probes are connected into a whole, and the problem that part of grid lines cannot be detected due to the gaps of the probes is avoided. When a part of grid lines cannot be connected by the probes, enough current and voltage cannot be accurately collected during iv test, so that the efficiency of the battery piece cannot be accurately tested, and when EL test is performed, the relevant area of the part of grid lines cannot emit light, so that judgment on the quality of the battery piece is affected, and misjudgment is easily caused.

In addition, when iv test is carried out, the point light source is required to simulate the illumination condition of the sun, so that the condition that the battery piece generates electric energy under illumination of unit intensity is detected, and the accuracy of the test can be affected by shielding of the probe row on light. When EL tests are carried out, the image acquisition is affected by the shielding of the luminescence of the battery pieces of the probe row, so that the judgment of the quality of the battery pieces is affected, and misjudgment is easily caused.

The utility model provides a battery test probe structure, which separates a first electrode strip from a second electrode strip through an insulated reinforcing strip to avoid short circuit, has a simple structure, can be directly adhered to the reinforcing strip, is equivalent to adhering three thin plates together, and has smaller thickness and height, so that the shielding problem can be reduced.

In order to secure the strength of the probe and the strength of the probe holder, the conventional probe row structure needs to give the probe a sufficiently large diameter, and accordingly, the probe holder needs to maintain a sufficient thickness for punching to facilitate the mounting of the probe. In order to avoid shielding light, the thickness of the probe frame is required to be as small as possible, so that the wall thickness of the punched hole is smaller, the probe frame is required to be kept at a sufficient height in order to ensure the strength of the punched hole of the probe frame, the conflict between the thickness and the width cannot be avoided in structural design, and the thickness of the probe frame is required to be increased if the thickness of the probe frame is small and the thickness is required to be increased if the thickness of the probe frame is reduced.

Drawings

In order to more clearly illustrate the embodiments of the present utility model or the technical solutions in the prior art, the drawings that are needed in the description of the embodiments or the prior art will be briefly described, and it is obvious that the drawings in the description below are some embodiments of the present utility model, and other drawings can be obtained according to the drawings without inventive effort for a person skilled in the art.

Fig. 1 is a front view of a battery test probe structure according to an embodiment of the present utility model;

FIG. 2 is a perspective view of a battery test probe structure according to an embodiment of the present utility model;

FIG. 3 is a perspective view of the upper probe structure;

FIG. 4 is another perspective view of a probe structure;

FIG. 5 is a schematic view of the structure of the frame;

FIG. 6 is a schematic view of the structure of the upper probe row;

FIG. 7 is an enlarged view of FIG. 6 at A;

FIG. 8 is a perspective view of the lower probe structure;

FIG. 9 is a schematic view of the structure of the lower probe row;

FIG. 10 is a schematic view of the structure of the first electrode set;

fig. 11 is a schematic structural view of the jig.

Icon: 100-upper probe structure; 200-lower probe structure; 300-adaptor; 110-upper probe row; 120-upper mounting rack; 111-a first electrode strip; 112-a second electrode strip; 113-reinforcing bars; 121-a frame body; 122-limiting blocks; 210-lower probe row; 220-a clamp; 211-a first electrode set; 212-a second electrode set; 213-probe rack; 211 a-conductive blocks; 211 b-probe; 221-upper clamping blocks; 222-lower clamping block; 223-connecting bar; a-a clamping groove; b-a limit groove; c-mounting slots.

Detailed Description

For the purpose of making the objects, technical solutions and advantages of the embodiments of the present utility model more apparent, the technical solutions of the embodiments of the present utility model will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present utility model, and it is apparent that the described embodiments are some embodiments of the present utility model, but not all embodiments of the present utility model. The components of the embodiments of the present utility model generally described and illustrated in the figures herein may be arranged and designed in a wide variety of different configurations.

Some embodiments of the present utility model are described in detail below with reference to the accompanying drawings. The following embodiments and features of the embodiments may be combined with each other without conflict.

The existing probe row has the problem of poor contact when testing the battery piece with the multi-grid line design, and the shielding area of the probe structure of the PCB or the epoxy resin is larger, so that the testing accuracy is affected.

In view of this, the present utility model provides a battery test probe structure including an upper probe structure 100, the upper probe structure 100 including an upper probe row 110, the upper probe row 110 including a first electrode bar 111, a second electrode bar 112, and a reinforcement bar 113; both sides of the reinforcement strip 113 are connected to the first electrode strip 111 and the second electrode strip 112, respectively; the reinforcement strip 113 is an insulator, and the first electrode strip 111 and the second electrode strip 112 are conductors.

The utility model eliminates the gap between the probes 211b by changing the conventional columnar probes 211b into the strip-shaped first electrode strips 111 and second electrode strips 112, which is equivalent to connecting the probes 211b into a whole, and avoids the problem that part of grid lines cannot be detected due to the gap of the probes 211 b. When a part of the grid lines cannot be connected by the probes 211b, the accurate efficiency cannot be detected when the iv test is performed, and when the EL test is performed, the relevant area of the part of the grid lines cannot emit light, the image of the area obtained by the camera is dark, the judgment on the quality of the battery piece is affected, and misjudgment is easily caused.

In addition, when iv test is carried out, the point light source is required to simulate the illumination condition of the sun, so that the condition that the battery piece generates electric energy under illumination of unit intensity is detected, and the accuracy of the test can be affected by shielding of the probe row on light. When EL tests are carried out, the shielding of the probe row to the light emission of the battery piece can influence the image acquisition, so that the judgment of the quality of the battery piece is influenced, and misjudgment is easy to cause.

The utility model provides a battery test probe structure, which separates a first electrode strip 111 and a second electrode strip 112 through an insulated reinforcing strip 113 to avoid short circuit, has a simple electrode strip structure, can be directly adhered to the reinforcing strip 113, is equivalent to adhering three thin plates together, has smaller thickness and height, and can reduce the shielding problem.

In order to secure the strength of the probe 211b and the strength of the probe holder 213, the conventional probe row structure needs to give the probe 211b a sufficiently large diameter, and accordingly, the probe holder 213 needs to maintain a sufficient thickness for punching holes to facilitate the mounting of the probe 211 b. In order to avoid shielding light, the thickness of the probe frame 213 needs to be as small as possible, so that the wall thickness of the hole is small, in order to ensure the strength of the probe frame 213 after the hole is punched, the probe frame 213 needs to be kept at a sufficient height, so that the conflict between the thickness and the width cannot be avoided in structural design, and on the premise of ensuring use, the height needs to be increased when the thickness of the probe frame 213 is small, and the thickness needs to be increased when the height is reduced.

The structure and shape of the battery test probe structure provided in this embodiment are described in detail below with reference to fig. 1 to 11.

In an alternative of the present embodiment, as shown in fig. 1 and 2, the battery test probe structure includes an upper probe structure 100, a lower probe structure 200, and an adapter 300, and a battery tab is positioned between the upper probe structure 100 and the lower probe structure 200 and is in contact with the upper probe structure 100 and the lower probe structure 200, respectively, so that iv test and EL test are conveniently performed, and the adapter 300 is connected to the upper probe structure 100 for implementing the installation of the upper probe structure 100.

In an alternative of the present embodiment, as shown in fig. 3 and 4, the upper probe structure 100 includes an upper probe row 110 and an upper mounting frame 120, and a plurality of upper probe rows 110 are arranged in parallel at intervals and mounted on an upper probe frame 213, and the upper probe frame 213 is connected to an adapter 300.

Specifically, as shown in fig. 6 and 7, the upper probe row 110 includes a first electrode bar 111, a second electrode bar 112, and a reinforcing bar 113, and the first electrode bar 111 and the second electrode bar 112 are disposed in parallel on both sides of the reinforcing bar 113 and bonded to the reinforcing bar 113. Further, the first electrode strip and the second electrode strip 112 are both rectangular copper sheets, silver is plated on the surfaces of the first electrode strip and the second electrode strip to enhance conductivity, the collection effect on current and voltage is improved, and the reinforcing strip 113 is a ceramic sheet, so that the current and voltage are collected through the first electrode strip 111 and the second electrode strip 112, the current is introduced, the strength of the upper probe row 110 is improved through the reinforcing strip 113, and bending deformation is avoided to ensure that the test result is accurate. The first electrode bar 111 and the second electrode bar 112 collect current and voltage, respectively.

In an alternative scheme of this embodiment, two first electrode strips 111 and two second electrode strips 112 are disposed at intervals along the length direction of the upper probe row 110, so that two half cells without main grid can be detected at the same time, and the test efficiency is improved.

In an alternative scheme of this embodiment, the upper mounting frame 120 includes a frame body 121 and a limiting block 122, as shown in fig. 4 and 5, the frame body 121 is in a "sun" shape structure and is provided with a clamping groove a and a limiting groove b, two ends of the upper probe row 110 are limited, and the limiting block 122 is clamped into the clamping groove a, so that the upper probe row 110 is fixed by abutting the limiting block 122. Further, in order to make the position of the upper probe row 110 accurate and keep the straight line state, the clamping groove a is a U-shaped groove, one side is a vertical edge, one side is a bevel edge, the bottom edge is a plane, and correspondingly, one side of the limiting block 122 is a bevel edge for abutting against the clamping groove a, and the other side is a vertical edge for abutting against the upper probe row 110, so that the upper probe row 110 keeps the vertical and straight line state, and the positioning of the upper probe row 110 is convenient to realize.

The gap between the two first electrode strips 111 is clamped into the limiting groove b, so that the support of the upper probe row 110 is enhanced, and the rigidity of the upper probe row is maintained.

In an alternative of the present embodiment, the lower probe structure 200 includes a lower probe row 210 and a fixture 220, as shown in fig. 8, wherein the lower probe row 210 includes a lower probe row 210 including a first electrode group 211, a second electrode group 212, and a probe holder 213, as shown in fig. 9. Specifically, the first electrode set 211 and the second electrode set 212 have the same structure, and include a conductive block 211a and two probes 211b, where the conductive block 211a and the probes 211b are both made of copper and silver-plated on the surface, as shown in fig. 10, one ends of the two probes 211b are welded to the conductive block 211a, the conductive block 211a is used for contacting with a battery piece, and the two probes 211b are respectively used for collecting current and voltage. Further, the probe 211b is provided with a mounting hole, and the probe 211b is inserted into the mounting hole to realize connection.

In this embodiment, the first electrode set 211 and the second electrode set 212 are disposed in parallel and have a pitch smaller than the thickness of the reinforcing strip 113; the plurality of first electrode groups 211 are arranged at intervals along the length direction of the first electrode strips 111, and the gaps of the plurality of first electrode groups are as small as possible so as to avoid grid leakage; the plurality of second electrode groups 212 are disposed at intervals along the length direction of the second electrode bars 112, and the gaps between the plurality of second electrode groups are as small as possible to avoid the drain grid lines.

In an alternative scheme of this embodiment, the fixture 220 includes an upper fixture block 221, a lower fixture block 222 and a connecting strip 223, as shown in fig. 11, grooves are formed on the upper fixture block 221 and the lower fixture block 222, and the grooves formed on the upper fixture block 221 and the lower fixture block 222 are combined into a mounting groove c for mounting the probe frame 213, and two ends of the probe frame 213 are clamped into the mounting groove c to achieve fixation. Two connecting strips 223 are used for two upper clamping blocks 221 and lower clamping blocks 222 to form a rectangular frame for the clamp 220.

The battery test probe structure provided in this embodiment can perform EL test and iv test on the upper and lower sides of the battery piece through the upper probe row 110 and the lower probe row 210, so that the problems of poor contact between the probe row and the battery piece and large shielding area are effectively avoided, the accuracy of the test is improved, and the quality of the battery piece is accurately judged.

Specifically, the strip-shaped sheet structure of the upper probe row 110 can be in contact with all the grid lines along the direction perpendicular to the thin grid lines, so that the problem of grid leakage caused by the gaps of the probes 211b is avoided, iv test and EL test can be ensured to be carried out on all the grid lines, and the EL image is clear and comprehensive.

In order to ensure the strength of the conventional probe, the head diameter of the conventional probe is set to be 1.5mm or 2mm, so that the probe frame is perforated by at least 1.7mm to ensure the installation of the probe, and the probe frame needs to have enough thickness to be limited by the diameter of the probe in order to ensure the strength of the probe row, the perforation diameter of the probe frame is at least 1.7mm to facilitate the arrangement of a probe sleeve to improve the service life of the probe frame, the thickness of the corresponding probe row is not less than 3mm, the insufficient supporting strength of the probe is easily caused due to the insufficient height of the probe row, and the probe is broken, so that the thickness of the conventional probe row is at least 3mm, and the height is more than 13 mm. The thickness of the upper probe row 110 provided in this embodiment may be 2mm and the height of the upper probe row may be 10mm due to the design of the strip-shaped sheet structure, so that the shielding of the light of the point light source is greatly reduced.

The lower probe row 210 connects the probes 211b through the conductive blocks 211a, reducing the gap between the probes 211b and also greatly reducing the possibility of grid leakage. In use, the lower probe row 210 supports the battery cells, and the elasticity and toughness of the probes 211b ensure the support of the battery cells and avoid damage to the battery cells during contact with the probe row. I.e., the impact when the upper probe row 110 and the lower probe row 210 contact the battery cell is buffered by the elasticity of the probes 211 b.

In addition, by using copper to process the parts such as the probe 211b, the electrode bar, the conductive block 211a and the like and plating silver on the surface, the service life of the probe 211b is prolonged, the loss caused by abrasion in the process of replacing the probe 211b when in use is reduced, the direct contact between the probe 211b and a battery piece is avoided through the conductive block 211a, the probe 211b is protected, the surface contact of the conductive block 211a is beneficial to prolonging the service life and ensuring good contact, and the conductivity is enhanced, so that the omission of a grid line is avoided, and an EL image is clear. The lifetime of the existing probe is typically three months, and the lifetime of the probe 211b provided in this embodiment can be more than twice that of the original probe.

And, the mounting mode of upper probe row 110, lower probe row 210 card go into the groove is convenient for carry out quick adjustment, is convenient for maintain, uses the upper mounting bracket 120 and the anchor clamps 220 of different specifications can change the interval between the probe row fast, has improved efficiency, has avoided the loaded down with trivial details of adjusting the probe row position one by one.

Meanwhile, the combination of the copper sheet and the ceramic sheet has toughness and rigidity, ensures the use strength of the upper probe row 110, effectively prevents the deformation and damage of the upper probe row, and ensures the accuracy of the test work.

The iv tester has the EL test function, namely, the current and the voltage of the battery piece can be collected, and the battery piece can be supplied with power to emit infrared light, so that the quality of the battery piece is judged by collecting an EL image. When the grid line is disconnected, the corresponding position does not emit light, the obtained image is dark, the defect can be judged, and if the shielding of the probe row is large, the observation of the defect is easily affected, so that erroneous judgment is caused. Similarly, if the contact between the probe row and the grid line is insufficient, the missed grid line will be determined to be bad, which is also easy to cause erroneous determination, and the battery test probe structure provided in this embodiment perfectly solves the problem, especially the detection of the side of the battery plate contacting the upper probe row 110 is more accurate.

Based on the battery test probe structure provided in the present embodiment, a battery test device is provided, including the above battery test probe structure and an iv tester.

Finally, it should be noted that: the above embodiments are only for illustrating the technical solution of the present utility model, and not for limiting the same; although the utility model has been described in detail with reference to the foregoing embodiments, it will be understood by those of ordinary skill in the art that: the technical scheme described in the foregoing embodiments can be modified or some or all of the technical features thereof can be replaced by equivalents; such modifications and substitutions do not depart from the spirit of the utility model.

Claims (10)

1. A battery test probe structure, characterized by comprising an upper probe structure (100), the upper probe structure (100) comprising an upper probe row (110), the upper probe row (110) comprising a first electrode strip (111), a second electrode strip (112) and a stiffening strip (113);

both sides of the reinforcing strip (113) are respectively connected with the first electrode strip (111) and the second electrode strip (112);

the reinforcement strip (113) is an insulator, and the first electrode strip (111) and the second electrode strip (112) are conductors.

2. The battery test probe structure according to claim 1, wherein the reinforcement bar (113) is made of ceramic.

3. The battery test probe structure of claim 1, wherein the first electrode strip (111) and the second electrode strip (112) are silver plated copper sheets.

4. The battery test probe structure according to claim 1, wherein the upper probe row (110) includes two first electrode bars (111) disposed at intervals along its length direction and two second electrode bars (112) disposed at intervals along its length direction.

5. The battery test probe structure of claim 1, wherein the upper probe structure (100) further comprises an upper mounting bracket (120), the upper mounting bracket (120) comprising a bracket body (121) and a stopper (122);

the frame body (121) is provided with a clamping groove (a), the upper probe row (110) and the limiting block (122) are clamped in the clamping groove (a), and the limiting block (122) is abutted to the upper probe row (110).

6. The battery test probe structure of claim 5, further comprising a lower probe structure (200), the lower probe structure (200) comprising a lower probe row (210), the lower probe row (210) comprising a first electrode set (211) and a second electrode set (212);

the first electrode group (211) and the second electrode group (212) have the same structure and comprise a conductive block (211 a) and two probes (211 b); one end of each probe (211 b) is connected with the corresponding conductive block (211 a), and the conductive block (211 a) is used for being in contact with the battery piece.

7. The battery test probe structure according to claim 6, wherein the first electrode group (211) and the second electrode group (212) are arranged in parallel and at a pitch smaller than the thickness of the reinforcement bar (113);

a plurality of the first electrode groups (211) are arranged at intervals along the length direction of the first electrode strip (111);

the plurality of second electrode groups (212) are arranged at intervals along the length direction of the second electrode strips (112).

8. The battery test probe structure according to claim 7, wherein the lower probe row (210) further comprises a probe frame (213), a mounting hole is formed in the probe frame (213), and the probe (211 b) is inserted into the mounting hole.

9. The battery test probe structure according to claim 6, wherein the conductive block (211 a) and the probe (211 b) are made of copper and surface-plated with silver.

10. A battery testing device comprising a battery testing probe structure according to any one of claims 1-9.

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