CN211509018U - Testing device - Google Patents
Testing device Download PDFInfo
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- CN211509018U CN211509018U CN202020030200.2U CN202020030200U CN211509018U CN 211509018 U CN211509018 U CN 211509018U CN 202020030200 U CN202020030200 U CN 202020030200U CN 211509018 U CN211509018 U CN 211509018U
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- transparent conductive
- conductive plate
- test
- top surface
- solar cell
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
Abstract
The utility model relates to a testing arrangement for test two-sided solar wafer's performance. The testing device includes a transparent conductive plate, a support, top and bottom side light sources, top and bottom surface probes. The transparent conductive plate is made of a transparent material, and a conductive structure is arranged on the top surface and/or the bottom surface of the transparent conductive plate and extends to the edge of the transparent conductive plate. The bottom surface probe is configured to be able to contact the conductive structure extending to the edge of the transparent conductive plate, and the top surface probe is configured to be able to contact the top surface test electrode in a case where the top surface of the transparent conductive plate is provided with the conductive structure. The utility model provides a testing arrangement can allow the test all to have the performance under the irradiant condition in the both sides of two-sided solar wafer, therefore can just accomplish in same platform testing arrangement simultaneously to the test of the performance on two surfaces of two-sided solar wafer.
Description
Technical Field
The utility model relates to an energy field especially relates to a testing arrangement.
Background
With the increasing consumption of conventional fossil energy such as global coal, oil, natural gas and the like, the ecological environment is continuously deteriorated, and particularly, the sustainable development of the human society is seriously threatened due to the increasingly severe global climate change caused by the emission of greenhouse gases. Various countries in the world make respective energy development strategies to deal with the limitation of conventional fossil energy resources and the environmental problems caused by development and utilization. Solar energy has become one of the most important renewable energy sources by virtue of the characteristics of reliability, safety, universality, long service life, environmental protection and resource sufficiency, and is expected to become a main pillar of global power supply in the future.
In a new energy revolution process, the photovoltaic industry in China has grown into a strategic emerging industry with international competitive advantages. However, the development of the photovoltaic industry still faces many problems and challenges, and the conversion efficiency and reliability are the biggest technical obstacles restricting the development of the photovoltaic industry, while the cost control and the scale-up are economically restricted.
In the production and manufacturing process of solar cells, testing is also an extremely important link. In the solar cell industry, strict standards are provided for cell tests, and a xenon lamp is usually adopted as a standard light source for testing sunlight. It is required to form a stable continuous uniform light irradiation on the light receiving surface of the cell piece in a very short time, so that the solar cell is tested to generate a photovoltage and a photocurrent under the standard light intensity. Double-sided batteries appearing in the industry also occupy a certain market proportion, and a plurality of discussions are provided for a method for testing the double-sided batteries, so that the problem of how to test the electrical properties of the front side and the back side of a battery is an urgent need to be solved. If a battery passes through two testers to test the electrical properties of the front surface and the back surface respectively, the productivity is obviously delayed and the production cost is increased.
Also, for a large-sized solar cell, it is easily bent when being tested, thereby affecting the test effect.
It is therefore desirable to provide a test device that at least partially addresses the above problems.
SUMMERY OF THE UTILITY MODEL
An object of the utility model is to provide a testing arrangement to the performance to two-sided solar wafer tests. The utility model provides a testing arrangement can allow the test all to have the performance under the irradiant condition in the both sides of two-sided solar wafer, therefore can just accomplish in same platform testing arrangement simultaneously to the test of the performance on two surfaces of two-sided solar wafer.
And, the utility model provides a testing arrangement supports the two-sided solar wafer and leans on to accomplish the test on transparent current conducting plate, because transparent current conducting plate can provide even holding power to solar wafer everywhere, therefore solar wafer is difficult to take place to buckle and lead to the test inaccurate in the testing process. Therefore, the testing device and the testing method are particularly suitable for large-size solar cells.
According to the utility model discloses an aspect provides a testing arrangement for test double-sided solar wafer's performance, double-sided solar wafer has top surface test electrode and basal surface test electrode, testing arrangement includes:
the transparent conductive plate is made of a transparent material, and a conductive structure is arranged on the top surface and/or the bottom surface of the transparent conductive plate and extends to the edge of the transparent conductive plate;
the bracket is positioned at the edge of the transparent conductive plate and fixes the transparent conductive plate;
a top side light source and a bottom side light source located on a top side and a bottom side of the transparent conductive plate, respectively; and
a top surface probe and a bottom surface probe,
wherein the bottom surface probe is configured to be contactable with the conductive structure extending to an edge of the transparent conductive plate, and the top surface probe is configured to be contactable with the top surface test electrode, with a top surface of the transparent conductive plate provided with the conductive structure; the top surface probe is configured to be able to contact the conductive structure extending to an edge of the transparent conductive plate, and the bottom surface probe is configured to be able to contact the bottom surface test electrode, in a case where the bottom surface of the transparent conductive plate is provided with the conductive structure.
In one embodiment, the conductive structure comprises a transparent conductive film overlying the transparent conductive plate.
In one embodiment, at least a portion of the conductive structure is integrated within the transparent conductive plate.
In one embodiment, the conductive structure includes a plurality of strip-shaped conductive structures, each of which is gathered at an edge of the transparent conductive plate.
In one embodiment, the strip-shaped conductive structures are configured to align with and contact corresponding test electrodes of the bifacial solar cell sheet when the bifacial solar cell sheet is properly positioned.
In one embodiment, a fixing device is further disposed on the transparent conductive plate in the case that the bottom surface of the transparent conductive plate is provided with the conductive structure, so as to fix the double-sided solar cell to the bottom side of the transparent conductive plate.
In one embodiment, the top and/or bottom surface of the transparent conductive plate is provided with a plurality of sliding blocks disposed around the center of the transparent conductive plate, the sliding blocks being capable of sliding on the transparent conductive plate to push the double-sided solar cell sheet to a predetermined position and limit it thereto.
In one embodiment, the testing device is suitable for a double-sided solar cell with the size larger than 210 mm.
The utility model provides a testing arrangement can allow the test all to have the performance under the irradiant condition in the both sides of two-sided solar wafer, therefore can just accomplish in same platform testing arrangement simultaneously to the test of the performance on two surfaces of two-sided solar wafer.
And, the utility model provides a testing arrangement supports the two-sided solar wafer and leans on to accomplish the test on transparent current conducting plate, because transparent current conducting plate can provide even holding power to solar wafer everywhere, therefore solar wafer is difficult to take place to buckle and lead to the test inaccurate in the testing process. Therefore, the testing device and the testing method are particularly suitable for large-size solar cells.
Drawings
For a better understanding of the above and other objects, features, advantages and functions of the present invention, reference should be made to the preferred embodiments illustrated in the accompanying drawings. Like reference numerals in the drawings refer to like parts. It will be appreciated by persons skilled in the art that the drawings are intended to illustrate preferred embodiments of the invention without any limiting effect on the scope of the invention, and that the various components in the drawings are not to scale.
Fig. 1 is an example of a double-sided solar cell used in a test apparatus according to the present invention;
FIG. 2 is a test set-up according to a preferred embodiment of the present invention;
FIG. 3 is a schematic top view of one example of the transparent conductive plate of FIG. 2;
fig. 4 is a schematic top view of another example of the transparent conductive plate of fig. 2.
Reference numerals:
double-sided solar cell 2
The secondary grid line 22
Topside light source 1
Bottom side light source 8
Transparent conductive film 3
Transparent conductive plate 4
Top surface probe 5
Top surface test electrode 6
Support 7
Collecting pin 91
Strip-shaped conductive structure 94
Detailed Description
Referring now to the drawings, specific embodiments of the present invention will be described in detail. What has been described herein is merely a preferred embodiment in accordance with the present invention, and those skilled in the art will appreciate that other ways of implementing the present invention on the basis of the preferred embodiment will also fall within the scope of the present invention.
The utility model provides a testing arrangement to be used for testing two-sided solar wafer, be particularly useful for testing two-sided solar wafer 2 that the size is greater than 210 mm. Fig. 1 shows an example of such a bifacial solar cell sheet 2. Fig. 1 shows the top surface of a double-sided solar cell sheet 2, and as can be seen from the figure, the double-sided solar cell sheet 2 includes a minor grid line 22 for collecting current from a base sheet and a minor grid line 22 for collecting current of the minor grid line 22, and the extending directions of the major grid line 21 and the minor grid line 22 may be substantially perpendicular. When a light source is disposed above the top surface of the bifacial solar cell sheet 2, which is a light receiving surface, the bifacial solar cell sheet 2 can generate a photovoltaic voltage and a photocurrent. Meanwhile, the structure at the bottom surface of the double-sided solar cell piece 2 is substantially the same as or similar to the structure at the top surface thereof, and when the light source is disposed at the bottom side of the double-sided solar cell piece 2, the bottom surface is a light receiving surface, and at this time, the double-sided solar cell piece 2 can also generate a photovoltaic voltage and a photocurrent. The main grid line and the auxiliary grid line of the double-sided solar cell 2 can be used as test electrodes.
Fig. 2 shows a preferred embodiment of the test device. As shown in fig. 2, the test apparatus includes a support 7, a transparent conductive plate 4, a top side light source 1 and a bottom side light source 8, and a top surface probe 5 and a bottom surface probe (which may include a probe bank, not shown). The transparent conductive plate 4 is made of a transparent material, and a conductive structure is arranged on the top surface of the transparent conductive plate 4 and extends to the edge of the transparent conductive plate 4; the bracket 7 is positioned at the edge of the transparent conductive plate 4 and fixes the transparent conductive plate 4; the top side light source 1 and the bottom side light source 8 are respectively positioned at the top side and the bottom side of the transparent conductive plate 4; the top surface probes 5 are configured to be able to contact the top surface test electrodes 6, while the bottom surface probes are configured to be able to contact conductive structures extending to the edge of the transparent conductive plate 4.
The test structure shown in fig. 2 has the bifacial solar cell sheet 2 properly placed on the transparent conductive sheet 4. It can be seen that the top surface of the bifacial solar cell sheet 2 is exposed when placed on the transparent conductive sheet 4, so that the top surface probes 5 can directly contact the top surface test electrodes 6 (including the bus bars 21 and/or the sub-bus bars 22 on the top surface). However, since the transparent conductive plate 4 covers the bottom surface of the double-sided solar cell 2, the bottom surface probe cannot directly contact the bottom surface electrode (i.e. the main grid line and/or the sub-grid line on the bottom surface) of the solar cell 2, but the bottom surface electrode can contact and realize conductive connection with the conductive structure on the top surface of the transparent conductive plate 4, and the conductive structure extends to the edge of the transparent conductive plate 4 so as to be able to contact with the bottom surface probe, so as to realize the performance test on the bottom surface.
In the present embodiment, the top side light source 1 and the bottom side light source 8 have control means independent of each other. If only the performance of the top surface of the double-sided solar cell 2 needs to be tested, only the top-side light source 1 is turned on and the top surface probe 5 is used for contacting the top surface test electrode 6 of the double-sided solar cell 2 to complete the test; if only the performance of the bottom surface of the double-sided solar cell 2 needs to be tested, only the bottom-side light source 8 is turned on and the bottom-surface probe is used for contacting the conductive structure extending to the edge of the transparent conductive plate 4 to complete the test; and if the performance of the top surface and the bottom surface of the double-sided solar cell 2 needs to be tested simultaneously, the top-side light source 1 and the bottom-side light source 8 can be turned on simultaneously, and the top surface probe 5 is used for contacting the top surface test electrode 6 of the double-sided solar cell 2, and the bottom surface probe is used for contacting the conductive structure extending to the edge of the transparent conductive plate 4 simultaneously so as to complete the test.
It can be seen that the test apparatus can perform both the performance of the top and bottom surfaces of the bifacial solar cell sheet 2 separately and simultaneously in one apparatus. The device can meet various requirements of research personnel and production and manufacturing personnel, and can save time and cost for the test process.
Preferably, various aspects of the conductive structure may have various arrangements.
For example, as shown in fig. 3, the conductive structure may include a transparent conductive film 3 overlying a top surface of a transparent conductive plate 4. In this case, the body of the transparent conductive plate 4 may be a flat plate made of, for example, glass, having no conductive property, on which an additional transparent conductive film 3 may be applied, and the transparent conductive film 3 may be of an integral film structure having an area corresponding to the area of the body of the transparent conductive plate 4, that is, each part of the edge of the transparent conductive film 3 extends to the edge of the transparent conductive plate 4. Still alternatively, at least a part of the conductive structure may be a structure integrated within the transparent conductive plate 4. That is, the transparent conductive plate 4 may have both transparent and conductive properties, and may be made of a material having transparent conductivity.
In the above case, referring to fig. 3, the conductive structure may also be provided with a collection pin 91 at its edge 92, in which case the bottom surface probe row may also directly contact the collection pin 91 to form a test loop with the bottom surface electrode of the bifacial solar cell sheet 2. Alternatively, the sink pin 91 may be replaced by a data line to transmit a signal to the outside.
Because the conductive structure is transparent, the incident light is not shielded completely, and the stability of the incident light of the back test can be ensured to the maximum extent, so that the test accuracy is ensured.
Preferably, on the basis of the above, a strip-shaped conductive structure 94 as shown in fig. 4 may be additionally provided, and the strip-shaped conductive structure 94 may be provided by welding or the like. The plurality of strip-shaped conductive structures 94 are arranged in parallel and at equal intervals. More preferably, the strip-shaped conductive structures 94 are configured to be aligned and contacted with corresponding test electrodes of the bifacial solar cell sheet 2 when the bifacial solar cell sheet 2 is properly positioned. The arrangement of the strip-shaped conductive structures 94 can further enhance the conductivity of the transparent conductive plate 4 and can be aligned with the bottom surface test electrode of the double-sided solar cell piece 2 more preferably, so as to increase the accuracy of the test. More preferably, the strip-shaped conductive structures 94 may be configured to have a narrow width to avoid blocking incident light as much as possible.
Alternatively, the stripe-shaped conductive structure 94 shown in fig. 4 may be provided without providing the entire transparent conductive film 3 and without providing the transparent conductive plate 4 itself with conductivity. The conductive strip structures 94 are gathered to the collection pins 91 and the bottom surface test probes contact the collection pins 91 to complete the test circuit with the bottom surface test electrodes.
In order to position the bifacial solar cell sheet 2 more accurately on the transparent conductive plate 4, the testing apparatus may further include a plurality of sliding blocks 93 disposed around the center of the transparent conductive plate 4, the sliding blocks 93 being schematically illustrated in fig. 3 and 4. When the bifacial solar cell sheet 2 is placed on the transparent conductive plate 4, the respective sliding blocks 93 may be pushed to push the bifacial solar cell sheet 2 to a predetermined position. In the testing process, each sliding block 93 can also play a limiting role around the double-sided solar cell 2 to avoid the influence of the position movement of the double-sided solar cell 2 on the testing.
In addition to or as an alternative to the "providing a conductive structure on the top surface of the transparent conductive plate 4", a conductive structure similar to that described above may also be provided on the bottom surface of the transparent conductive plate 4, in which case the bifacial solar cell sheet 2 may also be secured to the bottom surface of the transparent conductive plate 4 to complete the test. Preferably, in this case, a fixing device is additionally provided to provide an upward force to the double-sided solar cell sheet 2 so that it is fixed on the bottom side of the transparent conductive plate 4. The fixing means may for example be means for providing suction.
In the case where the bottom surface of the transparent conductive plate 4 is provided with a conductive structure, the top surface probe 5 is configured to be able to contact the conductive structure extending to the edge of the transparent conductive plate 4, and the bottom surface probe is configured to be able to contact the bottom surface test electrode.
The preferred embodiment of the present invention also provides a method for completing a test using the above-mentioned testing apparatus, which may include the following steps when the conductive structure is provided on the bottom surface of the transparent conductive plate:
placing the double-sided solar cell under the transparent conductive plate of the testing device and fixing the double-sided solar cell to the transparent conductive plate so that the bottom surface testing electrode of the double-sided solar cell is in contact with the conductive structure of the transparent conductive plate;
turning on and/or bottom side light sources as needed;
contacting the bottom surface probe with the bottom surface test electrode, and contacting the top surface probe with the conductive structure at the edge of the transparent conductive plate;
the reading is taken and the test is completed.
A plurality of sliding blocks disposed on a top surface of the transparent conductive plate, the method further comprising: the double-faced solar cell is placed below the transparent conductive plate, and the double-faced solar cell is slid to a preset position and limited by pushing the plurality of sliding blocks.
When the transparent conductive plate is provided with the conductive structure on the top surface thereof, the method may include the steps of:
placing the double-sided solar cell above a transparent conductive plate of a testing device and enabling a testing electrode on the bottom surface of the double-sided solar cell to be in contact with a conductive structure of the transparent conductive plate;
turning on and/or bottom side light sources as needed;
contacting the top surface probe with the top surface test electrode and contacting the bottom surface probe with the conductive structure at the edge of the transparent conductive plate;
the reading is taken and the test is completed.
Preferably, a plurality of sliding blocks are disposed on a top surface of the transparent conductive plate, the method further comprising: the double-faced solar cell is placed on the transparent conductive plate, and the double-faced solar cell is slid to a preset position and limited by pushing the plurality of sliding blocks.
The utility model provides a testing arrangement can allow the test all to have the performance under the irradiant condition in the both sides of two-sided solar wafer, therefore can just accomplish in same platform testing arrangement simultaneously to the test of the performance on two surfaces of two-sided solar wafer.
And, the utility model provides a testing arrangement supports the two-sided solar wafer and leans on to accomplish the test on transparent current conducting plate, because transparent current conducting plate can provide even holding power to solar wafer everywhere, therefore solar wafer is difficult to take place to buckle and lead to the test inaccurate in the testing process. Therefore, the testing device and the testing method are particularly suitable for large-size solar cells.
The foregoing description of various embodiments of the invention is provided to one of ordinary skill in the relevant art for the purpose of illustration. It is not intended to be exhaustive or to limit the invention to the precise form disclosed. As noted above, various alternatives and modifications of the present invention will be apparent to those skilled in the art of the above teachings. Thus, while some alternative embodiments are specifically described, other embodiments will be apparent to, or relatively easily developed by, those of ordinary skill in the art. The present invention is intended to embrace all such alternatives, modifications and variances of the present invention described herein, as well as other embodiments that fall within the spirit and scope of the present invention as described above.
Claims (8)
1. A test apparatus for testing the performance of a bifacial solar cell sheet having a top surface test electrode and a bottom surface test electrode, the test apparatus comprising:
the transparent conductive plate is made of a transparent material, and a conductive structure is arranged on the top surface and/or the bottom surface of the transparent conductive plate and extends to the edge of the transparent conductive plate;
the bracket is positioned at the edge of the transparent conductive plate and fixes the transparent conductive plate;
a top side light source and a bottom side light source located on a top side and a bottom side of the transparent conductive plate, respectively; and
a top surface probe and a bottom surface probe,
wherein the bottom surface probe is configured to be contactable with the conductive structure extending to an edge of the transparent conductive plate, and the top surface probe is configured to be contactable with the top surface test electrode, with a top surface of the transparent conductive plate provided with the conductive structure; the top surface probe is configured to be able to contact the conductive structure extending to an edge of the transparent conductive plate, and the bottom surface probe is configured to be able to contact the bottom surface test electrode, in a case where the bottom surface of the transparent conductive plate is provided with the conductive structure.
2. The testing device of claim 1, wherein the conductive structure comprises a transparent conductive film overlying the transparent conductive plate.
3. The testing device of claim 1, wherein at least a portion of the conductive structure is integrated within the transparent conductive plate.
4. A test device according to any one of claims 1 to 3, wherein the conductive structure comprises a plurality of strip-like conductive structures, each of which is gathered at an edge of the transparent conductive plate.
5. The testing device of claim 4, wherein the strip-shaped conductive structures are configured to align with and contact corresponding test electrodes of the bifacial solar cell sheet when the bifacial solar cell sheet is properly positioned.
6. The testing device of claim 1, wherein a fixing device is further disposed on the transparent conductive plate for fixing the double-sided solar cell sheet on the bottom side of the transparent conductive plate with the conductive structure disposed on the bottom surface of the transparent conductive plate.
7. The testing device of claim 1, wherein the top and/or bottom surfaces of the transparent conductive plate are provided with a plurality of sliding blocks disposed around the center of the transparent conductive plate, the sliding blocks being capable of sliding on the transparent conductive plate to push and restrain the bifacial solar cells to a predetermined position.
8. The testing device of claim 1, wherein the testing device is a testing device suitable for double-sided solar cells having a size greater than 210 mm.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202020030200.2U CN211509018U (en) | 2020-01-07 | 2020-01-07 | Testing device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202020030200.2U CN211509018U (en) | 2020-01-07 | 2020-01-07 | Testing device |
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| CN211509018U true CN211509018U (en) | 2020-09-15 |
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| CN202020030200.2U Active CN211509018U (en) | 2020-01-07 | 2020-01-07 | Testing device |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2023045390A1 (en) * | 2021-09-27 | 2023-03-30 | 泰州隆基乐叶光伏科技有限公司 | Test apparatus for solar cell sheet |
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2020
- 2020-01-07 CN CN202020030200.2U patent/CN211509018U/en active Active
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2023045390A1 (en) * | 2021-09-27 | 2023-03-30 | 泰州隆基乐叶光伏科技有限公司 | Test apparatus for solar cell sheet |
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