CN214335096U - Aging test box - Google Patents
Aging test box Download PDFInfo
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- CN214335096U CN214335096U CN202120167960.2U CN202120167960U CN214335096U CN 214335096 U CN214335096 U CN 214335096U CN 202120167960 U CN202120167960 U CN 202120167960U CN 214335096 U CN214335096 U CN 214335096U
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Abstract
The utility model discloses an aging test box, which comprises a box body, wherein the upper surface is provided with a plurality of stations for placing LNB modules; the ageing power supply module, the ageing power supply module includes: the power supply circuits are arranged in the box body; and the plurality of power supply connectors are connected in parallel through the power supply circuit and arranged on the upper surface of the box body, and each power supply connector is correspondingly arranged on each test station. The utility model discloses an aging testing box, it has higher space utilization, ageing efficiency and ageing ability.
Description
Technical Field
The utility model belongs to the technical field of aging testing equipment, more specifically say, it relates to an aging testing box.
Background
At present, adopt ageing equipment to carry out aging testing to the LNB module usually, ageing equipment's power supply unit places under the outside normal atmospheric temperature environment in ageing room usually, owing to need test a plurality of LNB modules simultaneously, consequently, power supply unit's external making its occupation space great, whole space utilization is lower.
SUMMERY OF THE UTILITY MODEL
The embodiment of the utility model provides an aim at: there is provided an aging test box capable of solving the above-mentioned technical problems existing in the prior art.
The above technical purpose of the present invention can be achieved by the following technical solutions: a burn-in test kit comprising:
the upper surface of the box body is provided with a plurality of test stations for placing the LNB module;
the ageing power supply module, the ageing power supply module includes:
the power supply circuits are arranged in the box body; and
and the plurality of power supply connectors are connected in parallel through the power supply circuits and arranged on the upper surface of the box body, and each power supply connector is correspondingly arranged on each test station.
Preferably, the box body upper surface is equipped with a plurality of parting beads that set gradually, adjacent two form two at least between the parting bead test station.
Preferably, the power supply circuit includes:
the positive conductive bar is used for connecting the positive electrode of the power supply; and
and the negative conductive strips are connected with the positive conductive strips in series and are used for connecting the negative electrode of the power supply, and the power supply connectors are connected between the positive conductive strips and the negative conductive strips in parallel.
Preferably, the positive conductive strip and the negative conductive strip are arranged in parallel.
Preferably, the aging power supply module further comprises a plurality of power supply switches arranged on the upper surface of the box body, and each power supply switch is connected in series between each power supply connector and the positive conductive strip, or each power supply switch is connected in series between each power supply connector and the negative conductive strip, so as to control the power supply of each power supply connector to be switched on and off.
Preferably, the aging power supply module further comprises a current voltmeter, and the current voltmeter is electrically connected to the power supply circuit and is used for measuring the total current and the total voltage of the power supply circuit in real time.
Preferably, the current voltmeter is provided with a total current display and a total voltage display which are used for displaying the power supply circuit in real time, and the display surface is arranged on the side surface of the box body.
Preferably, a plurality of the test stations are arranged in a multi-row matrix.
Preferably, the distance between two adjacent test stations in the same column is defined as d, and d is more than or equal to 1.5cm and less than or equal to 2 cm.
Preferably, a plurality of power supply connector holes are formed in the upper surface of the box body, and each power supply connector extends out of the upper surface of the box body through each power supply connector hole.
To sum up, the utility model discloses following beneficial effect has:
the utility model provides an aging testing box, including the box body with establish at the ageing power supply module of box body, ageing power supply module connects and establishes the power supply circuit in the box body inside including establishing a plurality of power supplies at the box body upper surface, make full use of the space of box body to improve space utilization. Furthermore, a plurality of power supply connectors are connected in parallel through the power supply circuit, so that the arrangement of the power supply connectors is more compact, the integration degree is higher, and the occupied space is small. Meanwhile, at least two power supply circuits are arranged, so that the space utilization rate is further improved. The aging test box effectively and fully fills the space of the box body, so that more devices to be tested can be tested at the same time, the occupied space is small, and the aging test box has high space utilization rate, aging efficiency and aging capacity.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings needed to be used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to the structures shown in the drawings without creative efforts.
FIG. 1 is a schematic structural diagram of the aging testing box of the present invention;
FIG. 2 is an enlarged partial schematic view of portion A of FIG. 1;
FIG. 3 is a schematic view of the internal structure of the aging testing box of the present invention;
fig. 4 is the internal wiring schematic diagram of the aging testing box of the present invention.
In the figure: 100. an aging test box; 10. a box body; 11. a parting strip; 12. a wire passing hole; 13. a power supply connector hole; 20. a power supply circuit; 21. a positive conductive strip; 22. a negative conductive bar; 30. a power supply connector; 40. a power supply switch; 50. a current voltmeter; 200. and an LNB module.
Detailed Description
The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative efforts belong to the protection scope of the present invention.
It should be noted that all the directional indicators (such as upper, lower, left, right, front and rear … …) in the embodiment of the present invention are only used to explain the relative position relationship between the components, the motion situation, etc. in a specific posture (as shown in the drawings), and if the specific posture is changed, the directional indicator is changed accordingly.
In addition, the descriptions related to "first", "second", etc. in the present invention are for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicit ly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one such feature. In addition, the technical solutions in the embodiments may be combined with each other, but it must be based on the realization of those skilled in the art, and when the technical solutions are contradictory or cannot be realized, the combination of the technical solutions should not be considered to exist, and is not within the protection scope of the present invention.
Referring to fig. 1 to 4, the present invention provides an aging testing box 100 with high space utilization, aging efficiency and aging capability.
Hereinafter, the structure of the burn-in test cartridge 100 is described in detail, and the burn-in test cartridge 100 includes:
a box body 10, the upper surface of which is provided with a plurality of test stations for placing the LNB module 200;
the ageing power supply module, the ageing power supply module includes:
at least two power supply circuits 20 connected in parallel, wherein the power supply circuits 20 are arranged in the box body 10; and
and the plurality of power supply connectors 30 are connected in parallel through the power supply circuit 20 and are arranged on the upper surface of the box body 10, and each power supply connector 30 is correspondingly arranged on each test station.
Specifically, the box body 10 is substantially rectangular, and may be a wooden box body 10, of course, the shape thereof may also be flexibly set according to actual requirements, or may be made of other materials with better structural strength.
The upper surface of the box body 10 is provided with a plurality of test stations for placing the LNB modules 200, the LNB modules 200 are specifically low noise down converters, and the function of the LNB modules 200 is to amplify and down convert satellite signals transmitted by a feed source to change Ku or C band signals into L bands, and transmit the L bands to a satellite receiver through a coaxial cable, that is, the aging test box 100 is mainly used for performing aging test on a plurality of low noise down converters (satellite power amplifiers).
The aging power supply module is configured to supply power to the plurality of LNB modules 200, specifically, in this embodiment, two power supply circuits 20 are provided, but in other embodiments, three, four, or more power supply circuits may be flexibly provided.
The power supply circuit 20 is used for being connected with a power supply through an electric wire, and the side surface of the box body 10 is provided with a wire passing hole 12 so that the electric wire connected with the external power supply through the power supply circuit 20 can pass through. The power supply circuit 20 is installed inside the case 10 to be placed by using the inner space of the case 10, thereby improving the space utilization of the case 10.
In this embodiment, two power supply circuits 20 are provided and connected in parallel to increase the number of power supply connectors 30, so as to improve the aging efficiency and aging capability of the aging power supply module.
In this embodiment, the power supply connector is N connectors, and in other embodiments, other types of power supply connectors may be provided according to actual requirements.
The plurality of power supply connectors 30 are connected in parallel through the power supply circuit 20 to individually supply power to the plurality of LNB modules 200, and because the plurality of power supply connectors 30 are connected in parallel, the voltage supplied by each power supply connector 30 is relatively consistent, so as to ensure that each LNB module 200 can perform aging test in a relatively consistent circuit environment. Meanwhile, the plurality of power supply connectors 30 are connected in parallel, so that the overall structure of the power supply circuit 20 is compact, the arrangement of the plurality of power supply connectors 30 is compact, the integration degree is high, the occupied space is small, and the space utilization rate of the box body 10 is improved to a large extent.
The utility model provides an aging testing box 100, including box body 10 with establish at the ageing power supply module of box body 10, ageing power supply module is including establishing a plurality of power supply connector 30 of box body 10 upper surface and establishing at the inside power supply circuit 20 of box body 10, make full use of the space of box body 10 to improve space utilization. Further, the plurality of power supply connectors 30 are connected in parallel through the power supply circuit 20, so that the arrangement of the plurality of power supply connectors 30 is more compact, the integration degree is higher, and the occupied space is small. Meanwhile, at least two power supply circuits 20 are provided to further improve the space utilization. The aging test box 100 effectively makes the box body 10 fully available, so that more devices to be tested can be tested at the same time, and the aging test box occupies less space and has higher space utilization rate, aging efficiency and aging capability.
Hereinafter, a specific arrangement of the power supply circuit 20 of the burn-in power supply module is described in detail.
The power supply circuit 20 includes:
a positive conductive strip 21 for connecting the positive electrode of the power supply; and
and a negative electrode conductive strip 22 connected in series with the positive electrode conductive strip 21 and used for connecting a negative electrode of the power supply, wherein the power supply connectors 30 are connected in parallel between the positive electrode conductive strip 21 and the negative electrode conductive strip 22.
Specifically, the positive conductive bar 21 is a strip-shaped metal part having a certain conductivity for conducting electricity, and similarly, the negative conductive bar 22 is a strip-shaped metal part having a certain conductivity for conducting electricity.
The positive conductive strip 21 and the negative conductive strip 22 are connected in series and are respectively connected with the positive pole and the negative pole of a power supply, so that the power supply and the power supply form a power supply loop, the power supply can be an external power supply, the line holes 12 are formed in the side face of the box body 10, so that the conducting wires of the positive conductive strip 21 and the negative conductive strip 22 pass through the line holes 12 and are connected with a main power wire of the external power supply, the main power wire can be connected with a corresponding plug according to the socket type of the burn-in room, and the burn-in test can be carried out only by inserting the plug into the socket of the burn-in room during testing.
The power supply circuit 20 is provided with the positive conductive strip 21 and the negative conductive strip 22, so that the overall structure of the power supply circuit 20 is simple, and meanwhile, the plurality of power supply connectors 30 can be connected in parallel at positions between the positive conductive strip and the negative conductive strip, so that the space between the two is fully utilized, and the space utilization rate is effectively improved.
Referring to fig. 4, the plurality of power supply connectors 30 are connected in parallel between the positive conductive strip 21 and the negative conductive strip 22, specifically, the positive electrode of each power supply connector 30 is electrically connected to the positive conductive strip 21, the negative electrode of each power supply connector 30 is electrically connected to the negative conductive strip 22, and the connection structure is as shown in fig. 4, and the plurality of power supply connectors 30 are connected in parallel between the positive conductive strip 21 and the negative conductive strip 22, so that the circuit structure is compact, the arrangement of the power supply connectors 30 can be more compact, and the overall integration degree is higher.
In order to ensure that the space of the box 10 is fully utilized by the positive conductive strip 21 and the negative conductive strip 22, the positive conductive strip 21 is disposed on the upper sidewall of the box 10, the negative conductive strip 22 is disposed on the lower sidewall of the box 10, or the negative conductive strip 22 is disposed on the upper sidewall of the box 10, and the positive conductive strip 21 is disposed on the lower sidewall of the box 10.
In this embodiment, the positive conductive strip 21 and the negative conductive strip 22 are respectively disposed on two opposite side walls of the box 10, so as to fully utilize the internal space of the box 10, and occupy less internal space of the box 10 than the positive conductive strip 21 and the negative conductive strip 22 are disposed in the internal space of the box 10, and meanwhile, the installation stability of the two is also ensured by installing the positive conductive strip 21 and the negative conductive strip 22 on the side wall of the box 10.
The positive conductive strip 21 and the negative conductive strip 22 may be mounted on the side wall of the box 10 by means of screw fixation, snap connection, adhesive fixation, etc., without limitation.
Specifically, the positive conductive strip 21 and the negative conductive strip 22 are disposed in parallel to each other, so as to further improve the integration and compactness of the two, and at the same time, to facilitate the connection of the power supply connector 30 at a position therebetween.
In order to facilitate individual control of the single LNB module 200, the aging power supply module further includes a plurality of power supply switches 40 disposed on the upper surface of the box 10, wherein each of the power supply switches 40 is connected in series between each of the power supply connectors 30 and the positive conductive bar 21, or each of the power supply switches 40 is connected in series between each of the power supply connectors 30 and the negative conductive bar 22, so as to control the power supply of each of the power supply connectors 30.
Specifically, through establishing ties together single power supply switch 40 and single power supply connector 30, through opening and close of power supply switch 40 to the power break-make of control power supply connector 30, regulate and control the power break-make of single LNB module 200 in order to realize, can stop alone or begin certain LNB module 200 function according to actual aging testing demand, so that it can adopt the ageing mode of multiple difference, has better practicality.
Wherein, in this embodiment, power switch 40 adopts three fender ship type switches, and it has certain high temperature resistance, and simultaneously, power switch 40 establishes ties with power supply connector 30, and for the power supply connector of more convenient change damage, this three fender ship type switch can be accomplished with 4.8mm plug spring terminal with power supply connector 30's wiring, if change pull out can.
In order to intuitively determine whether the LNB module 200 is in a working state, the aging power supply module further includes a current voltmeter 50, and the current voltmeter 50 is electrically connected to the power supply circuit 20 and is configured to measure the total current and the total voltage of the power supply circuit 20 in real time.
Specifically, the current voltmeter 50 is connected in series to the total branch of the plurality of power supply circuits 20 in parallel, so as to measure the total current and the total voltage of the power supply circuits 20 in real time.
When the LNB module 200 is accessed, the current indication and the voltage indication of the current voltmeter 50 are recorded in real time by opening one power supply switch 40 (every time one LNB module 200 is accessed) to judge whether each LNB module 200 is in the working state.
Similarly, in the aging test process, if the indication of the current-voltage meter 50 is abnormal, that is, a certain LNB module 200 is abnormally operated, the LNB module 200 with the abnormality is visually determined by sequentially turning on and off the single power switch 40, recording the current indication and the voltage indication of the current-voltage meter 50 in real time, and changing the indication of the current-voltage meter 50.
The judging method can be according to the formula: i is1≈I2N, wherein I1Representative ammeter reading ≈ I2Representing the current index of a single LNB module, N being the number of LNB modules, when I1≈I2When N is established, the aging test has no abnormality, when I is1≈I2And when N is not satisfied, abnormality occurs in the aging test.
In order to facilitate the observation of the indication of the current voltmeter 50, the current voltmeter 50 has a display surface for displaying the total current indication, the total voltage indication of the power supply circuit 20 and the normal state of the LNB module 200 in real time, and the display surface is disposed on the side surface of the box body 10.
In order to enable a plurality of LNB modules 200 to be compactly arranged on the upper surface of the box body 10, a plurality of sequentially arranged division bars 11 are arranged on the upper surface of the box body 10, and at least two test stations are formed between every two adjacent division bars 11.
Specifically, two adjacent division bars 11 and the upper surface of the box body 10 form a placing groove, the placing groove forms at least two test stations for placing at least two LNB modules 200, in this embodiment, the placing groove forms two test stations for placing two LNB modules 200, and of course, in other embodiments, the number of test stations may be flexibly set according to actual situations.
Furthermore, a plurality of test stations are arranged in a multi-row matrix form.
Specifically, strip mode of setting based on anodal busbar 21 and negative pole busbar 22 to make each power supply connector 30 parallelly connected between anodal busbar 21 and negative pole busbar 22 be the form setting of being listed as, and simultaneously, anodal busbar 21 and negative pole busbar 22 are equipped with the multiunit, so that each power supply connector 30 is the multiseriate matrix correspondingly and arranges the upper surface at box body 10, because each power supply connector 30 corresponds each test station setting, and is a plurality of test station is multiseriate matrix and arranges, so that a plurality of LNB modules 200 are the multiseriate matrix correspondingly and arrange the upper surface at box body 10, overall structure's integration degree is higher, and the structure is more compact.
A plurality of power supply connector 30 holes 13 are formed in the upper surface of the box body 10, and each power supply connector 30 extends out of the upper surface of the box body 10 through each power supply connector 30 hole 13.
In order to further ensure the integration degree of the whole structure, the distance between two adjacent test stations in the same column is defined as d, and d is more than or equal to 1.5cm and less than or equal to 2 cm.
If d is less than 1.5cm, the closer the two test stations adjacent to the same column are, the closer the two LNB modules 200 adjacent to the same column are, the smaller the space between the two LNB modules 200 is, and the inconvenience of placing and taking out the LNB modules 200 is brought about.
If d is greater than 2cm, the farther two adjacent test stations in the same column are, the farther two adjacent LNB modules 200 in the same column are, the more space is left between the two LNB modules 200, and the integration degree of the whole structure is lower.
It is above only the utility model discloses a preferred embodiment, the utility model discloses a scope of protection does not only confine above-mentioned embodiment, the all belongs to the utility model discloses a technical scheme under the thinking all belongs to the utility model discloses a scope of protection. It should be noted that, for those skilled in the art, various modifications and decorations can be made without departing from the principle of the present invention, and these modifications and decorations should also be regarded as the protection scope of the present invention.
Claims (10)
1. A burn-in test kit, comprising:
the upper surface of the box body is provided with a plurality of test stations for placing the LNB module;
the ageing power supply module, the ageing power supply module includes:
the power supply circuits are arranged in the box body; and
and the plurality of power supply connectors are connected in parallel through the power supply circuits and arranged on the upper surface of the box body, and each power supply connector is correspondingly arranged on each test station.
2. The burn-in test kit of claim 1, wherein the kit body has a plurality of spaced bars disposed in sequence on the top surface thereof, and at least two of the test stations are formed between two adjacent spaced bars.
3. The burn-in test kit of claim 1, wherein the power supply circuit comprises:
the positive conductive bar is used for connecting the positive electrode of the power supply; and
and the negative conductive strips are connected with the positive conductive strips in series and are used for connecting the negative electrode of the power supply, and the power supply connectors are connected between the positive conductive strips and the negative conductive strips in parallel.
4. The burn-in test kit of claim 3, wherein the positive conductive strip and the negative conductive strip are disposed parallel to each other.
5. The burn-in test kit of claim 3, wherein the burn-in power module further comprises a plurality of power switches disposed on the top surface of the housing, each of the power switches being connected in series between each of the power contacts and the positive conductive strip or between each of the power contacts and the negative conductive strip for controlling the power on/off of each of the power contacts.
6. The burn-in test kit of claim 1, wherein the burn-in power supply module further comprises a current voltmeter electrically connected to the power supply circuit for measuring the total current and the total voltage of the power supply circuit in real time.
7. The burn-in test kit of claim 6, wherein the current voltmeter has a display surface for displaying the total current indication and the total voltage indication of the power supply circuit in real time, the display surface being provided on a side surface of the kit body.
8. The burn-in test kit of claim 1, wherein a plurality of said test stations are arranged in a matrix of rows and columns.
9. The burn-in test kit of claim 8, wherein if the spacing between two adjacent test stations in the same column is defined as d, then d is 1.5cm ≦ 2 cm.
10. The weathering test cassette of claim 1, wherein the top surface of the cassette body defines a plurality of power supply connector apertures through which the power supply connectors extend from the top surface of the cassette body.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202120167960.2U CN214335096U (en) | 2021-01-21 | 2021-01-21 | Aging test box |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202120167960.2U CN214335096U (en) | 2021-01-21 | 2021-01-21 | Aging test box |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN214335096U true CN214335096U (en) | 2021-10-01 |
Family
ID=77905943
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202120167960.2U Active CN214335096U (en) | 2021-01-21 | 2021-01-21 | Aging test box |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN214335096U (en) |
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2021
- 2021-01-21 CN CN202120167960.2U patent/CN214335096U/en active Active
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