CN216670078U

CN216670078U - Probe testing device

Info

Publication number: CN216670078U
Application number: CN202122765028.2U
Authority: CN
Inventors: 周公庆; 马列; 刘宗刚; 马志强; 袁桃生; 谈仕祥; 侯锟; 苟小康
Original assignee: Tongwei Solar Meishan Co Ltd
Current assignee: Tongwei Solar Meishan Co Ltd
Priority date: 2021-11-12
Filing date: 2021-11-12
Publication date: 2022-06-03
Anticipated expiration: 2031-11-12

Abstract

The utility model discloses a probe testing device, and belongs to the technical field of probe testing. The probe testing device comprises m transverse probe rows and n longitudinal probe rows, wherein the m transverse probe rows and the n longitudinal probe rows are mutually crossed and connected, m is larger than or equal to 1, n is larger than or equal to 1, the m transverse probe rows are mutually arranged in parallel, and the n longitudinal probe rows are mutually arranged in parallel. Each transverse probe row comprises a transverse insulating strip, a plurality of test probes are arranged on two sides of the transverse insulating strip respectively, each longitudinal probe row comprises a longitudinal insulating strip, and the longitudinal insulating strips are in cross connection with the transverse insulating strips. The utility model overcomes the problem that the test of the probe device in the prior art is easy to have errors, and provides the probe test device which can avoid the problem of test errors caused by the offset of a probe row, can greatly improve the test precision, and has stronger practicability and wide application.

Description

Probe testing device

Technical Field

The utility model belongs to the technical field of probe testing, and particularly relates to a probe testing device.

Background

The IV test process is a process for testing the electrical property of the battery under the standard temperature condition (25 ℃), the standard light intensity AM1.5 and the standard spectrum (xenon lamp spectrum), and is used for distinguishing and evaluating the electrical property of the battery piece. In the testing process, the probe is pressed on the conductive electrode of the cell to lead out the current of the cell, so that the performance of the cell can be tested. However, in the case of the P-type PERC cell, the positive electrode and the negative electrode are respectively distributed on the front surface and the back surface, so that a probe row must be used to form a good contact with the surface of the cell, otherwise the accuracy of the test is seriously affected.

For the probe apparatus of the tester, some solutions have also been proposed in the prior art, such as the utility model and creation names: the scheme discloses a novel special probe bank for a solar cell defect detector (application date: 2013, 5, 8 and application number: 201320244818.9), which comprises a conventional probe bank, a tinned welding strip and a tinned welding strip fastening device; wherein: the sample platform is connected with the control probe row pressing cylinder, the conventional probe row is arranged on the sample platform, and the tin-plated welding strip is connected with the conventional probe row in a fastening mode through a tin-plated welding strip fastening device.

According to the scheme, the probe devices of the existing testing machine are designed into the probe rows parallel to the main grid lines, when the probe devices are used for testing the electrical performance of the battery piece, the probes are pressed downwards to enable the probe heads to be in contact with the electrode surface of the battery piece, so that charges on the surface of the battery can be led out, a loop is formed, and the performance of the battery piece is tested. However, if the probe row is slightly shifted during the test, the probe cannot be completely contacted with the electrode of the battery, so that the current of the whole area cannot be tested, thereby affecting the test result. On the other hand, as the size of the existing battery is larger and larger, the battery is designed into a partitioned block, and welding is performed after laser cutting, so that a plurality of areas of electrodes and grid lines of a designed sheet are not connected, and if a probe in one area does not correspond to the grid line accurately, the whole current collection of the area is influenced.

SUMMERY OF THE UTILITY MODEL

1. Problems to be solved

The utility model overcomes the problem that the test of the probe device in the prior art is easy to have errors, and provides the probe test device which can avoid the problem of test errors caused by the offset of a probe row, can greatly improve the test precision, and has stronger practicability and wide application.

2. Technical scheme

In order to solve the problems, the technical scheme adopted by the utility model is as follows:

the utility model relates to a probe testing device, which comprises m transverse probe rows and n longitudinal probe rows, wherein the m transverse probe rows and the n longitudinal probe rows are mutually crossed and connected, the m transverse probe rows are mutually parallel, the n longitudinal probe rows are mutually parallel, m is more than or equal to 1, and n is more than or equal to 1; the transverse probe row and the longitudinal probe row are used for leading out electric charges on the surface of the battery piece.

Furthermore, each transverse probe row comprises a transverse insulating strip, a plurality of test probes are respectively arranged on two sides of the transverse insulating strip, and the test probes arranged on each side of the transverse insulating strip are connected with each other through a conductive strip.

Further, each longitudinal probe row includes a longitudinal insulating strip cross-connected to a transverse insulating strip.

Furthermore, a plurality of test probes are respectively arranged on two sides of the longitudinal insulating strip, and the test probes arranged on each side of the longitudinal insulating strip are mutually connected through the conductive strips.

Furthermore, the transverse probe rows are vertically connected with the longitudinal probe rows, and the longitudinal insulating strips are vertically connected with the transverse insulating strips.

Furthermore, each test probe comprises a probe rod and a probe head, and the probe rod is connected with the probe head through a telescopic rod; further, the telescopic rod is arranged at the bottom of the probe rod.

Further, several probe tips are connected to each other by conductive silver strips.

3. Advantageous effects

Compared with the prior art, the utility model has the beneficial effects that:

according to the probe testing device, the transverse probe row and the longitudinal probe row which are connected in a cross mode are arranged, so that the problem that the probe row is shifted due to overlong testing time in the prior art can be solved; in addition, even if the transverse probe row or the longitudinal probe row deviates, the probe testing device can still avoid the problem of testing errors caused by the deviation of the probe row, and can further improve the testing precision of the battery piece. The probe testing device has simple structure, can be applied to an IV testing machine and an EL testing machine, and has stronger practicability and application universality.

Drawings

FIG. 1 is a schematic structural diagram of a probe testing apparatus according to the present invention;

FIG. 2 is a schematic structural diagram of a test probe according to the present invention.

Description of reference numerals: 100. a transverse probe bank; 110. a lateral insulating strip; 200. a longitudinal probe bank; 210. a longitudinal insulating strip;

300. testing the probe; 310. a probe shaft; 320. a telescopic rod; 330. a probe head; 340. a conductive silver strip; 400. a conductive strip.

Detailed Description

In order to make the objects, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are some embodiments of the present invention, but not all embodiments; moreover, the embodiments are not relatively independent, and can be combined with each other according to needs, so that a better effect is achieved. Thus, the following detailed description of the embodiments of the present invention, as presented in the figures, is not intended to limit the scope of the utility model, as claimed, but is merely representative of selected embodiments of the utility model. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.

For a further understanding of the utility model, reference should be made to the following detailed description taken in conjunction with the accompanying drawings and examples.

Example 1

Referring to fig. 1, the probe testing device of the present invention includes m transverse probe banks 100 and n longitudinal probe banks 200, where m is greater than or equal to 1, n is greater than or equal to 1, and both the transverse probe banks 100 and the longitudinal probe banks 200 are used for guiding out charges on the surface of a battery piece, so as to test the battery piece. Furthermore, the m transverse probe banks 100 and the n longitudinal probe banks 200 are in cross connection with each other, so that the problem of test errors caused by the deviation of the transverse probe banks 100 or the longitudinal probe banks 200 can be avoided, and the accuracy of the probe test device in testing the battery piece can be ensured. Further, when m is greater than or equal to 2 and n is greater than or equal to 2, the m transverse probe lines 100 are arranged in parallel with each other, and the n longitudinal probe lines 200 are arranged in parallel with each other; it should be noted that, by providing a plurality of transverse probe banks 100 and longitudinal probe banks 200, connection of battery pieces designed by segments or blocks can be achieved, so that accuracy of battery piece testing can be ensured. It should be noted that the transverse probe lines 100 and the longitudinal probe lines 200 of the present invention are connected to each other, so that the entire test abnormality caused by a single probe abnormality can be avoided.

Further, the horizontal probe lines 100 and the vertical probe lines 200 are explained in detail below:

each transverse probe row 100 in the probe test device of the present invention includes a transverse insulating strip 110, and a plurality of test probes 300 are respectively disposed on two sides of the transverse insulating strip 110. It should be noted that the test probes 300 on one side of the transverse insulating strip 110 are staggered with the test probes 300 adjacent to the other side, so that the light-shielding area of the transverse probe bank 100 can be effectively reduced, and the influence of the transverse probe bank 100 on the total incident light amount during the test of the battery cell is reduced. Further, the plurality of test probes 300 disposed at each side of the transverse insulating strip 110 are connected to each other through the conductive strip 400, thereby achieving electrical connection between the test probes 300. In addition, the distance between the plurality of test probes 300 disposed on each side of the transverse insulating strip 110 is equal, that is, the plurality of test probes 300 on each side are disposed at equal intervals.

The longitudinal probe banks 200 of the present invention are cross-connected to the transverse probe banks 100, and specifically, each longitudinal probe bank 200 includes a longitudinal insulating strip 210, and the longitudinal insulating strip 210 is cross-connected to the transverse insulating strip 110. It is worth noting that in this example, the longitudinal insulating strips 210 are perpendicularly connected to the lateral insulating strips 110, so that the lateral probe banks 100 are perpendicularly connected to the longitudinal probe banks 200. Furthermore, the two sides of the longitudinal insulating strip 210 are respectively provided with the plurality of test probes 300, the test probes 300 on one side of the longitudinal insulating strip 210 are staggered with the test probes 300 adjacent to the other side, and the influence of the longitudinal probe row 200 on the total incident light quantity during the test of the battery piece can be effectively reduced. In addition, the plurality of test probes 300 on each side of the longitudinal insulating strip 210 are disposed at equal intervals and connected to each other by the conductive strips 400. It should be noted that the transverse probe row 100 and the longitudinal probe row 200 of the present invention are in a straight row structure or a non-straight row structure, in this example, the transverse probe row 100 and the longitudinal probe row 200 are in a non-straight row structure, specifically, the transverse probe row 100 and the longitudinal probe row 200 are in a curved shape in this example, the conductive strips 400 of the transverse probe row 100 and the longitudinal probe row 200 are arranged in a curved shape, that is, the test probes 300 are arranged at the connection positions of two convex conductive strips 400, so that the light shielding can be reduced, and the accuracy of the battery piece test can be improved.

It should be noted that, as shown in fig. 2, each of the test probes 300 of the present invention includes a probe shaft 310 and a probe head 330, the probe shaft 310 is connected to the probe head 330 through a telescopic shaft 320, the telescopic shaft 320 is disposed at the bottom of the probe shaft 310, and the telescopic shaft 320 can raise or lower the position of the probe head 330, so that the probe head 330 contacts the battery piece. It is worth to be noted that, the plurality of probe heads 330 of the utility model are connected with each other through the conductive silver strips 340, so that the contact area between the transverse probe row 100 or the longitudinal probe row 200 and the cell electrodes can be increased, and the contact resistance in the test process can be effectively reduced, thereby ensuring that the resistance difference is stable during each test, and further ensuring the stability of the test result; further to avoid the problem of inaccurate results due to poor contact of some of the test probes 300.

In addition, when the probe test device of the present invention tests the battery piece, two probe test devices may be provided, specifically, one of the probe test devices is disposed above the battery piece, and the other probe test device is correspondingly disposed below the battery piece, that is, the probe head 330 disposed above the battery piece and the probe head 330 disposed below the battery piece contact the battery piece together, so as to further implement the test of the battery piece.

According to the probe testing device, the problem of probe row displacement caused by overlong testing time in the prior art can be solved by arranging the transverse probe row 100 and the longitudinal probe row 200 which are connected in a cross manner; in addition, even if the horizontal probe bank 100 or the longitudinal probe bank 200 has an offset, the probe testing device of the utility model can still avoid the problem of testing errors caused by the offset of the probe banks, and can further improve the testing precision of the battery piece. The probe testing device can be applied to not only an IV testing machine but also an EL testing machine, and has strong practicability and wide application.

The utility model has been described in detail hereinabove with reference to specific exemplary embodiments thereof. It will, however, be understood that various modifications and changes may be made without departing from the scope of the utility model as defined in the appended claims. The detailed description and drawings are to be regarded in an illustrative rather than a restrictive sense, and any such modifications and variations, if any, are intended to fall within the scope of the utility model as described herein. Furthermore, the background is intended to be illustrative of the state of the art as developed and the meaning of the present technology and is not intended to limit the scope of the utility model or the application and field of application of the utility model.

Claims

1. A probe test device is characterized in that: the device comprises m transverse probe banks (100) and n longitudinal probe banks (200), wherein the m transverse probe banks (100) are mutually crossed and connected with the n longitudinal probe banks (200), the m transverse probe banks (100) are mutually arranged in parallel, the n longitudinal probe banks (200) are mutually arranged in parallel, m is more than or equal to 1, and n is more than or equal to 1; the transverse probe row (100) and the longitudinal probe row (200) are used for leading out electric charges on the surface of the battery piece.

2. A probe testing apparatus according to claim 1, wherein: each transverse probe row (100) comprises a transverse insulating strip (110), and a plurality of test probes (300) are respectively arranged on two sides of the transverse insulating strip (110).

3. A probe testing apparatus according to claim 2, wherein: the plurality of test probes (300) arranged on each side of the transverse insulating strip (110) are connected with each other through conductive strips (400).

4. A probe testing apparatus according to claim 2, wherein: each longitudinal probe bank (200) comprises longitudinal insulating strips (210), and the longitudinal insulating strips (210) are in cross connection with the transverse insulating strips (110).

5. The probe test apparatus according to claim 4, wherein: the two sides of the longitudinal insulating strip (210) are respectively provided with a plurality of test probes (300), and the test probes (300) arranged on each side of the longitudinal insulating strip (210) are mutually connected through conductive strips (400).

6. The probe test apparatus according to claim 4, wherein: the transverse probe row (100) is vertically connected with the longitudinal probe row (200).

7. The probe test apparatus according to claim 6, wherein: the longitudinal insulating strips (210) are vertically connected with the transverse insulating strips (110).

8. The probe test apparatus according to any one of claims 2 to 7, wherein: each test probe (300) comprises a probe shaft (310) and a probe head (330), wherein the probe shaft (310) is connected with the probe head (330) through a telescopic rod (320).

9. A probe testing apparatus according to claim 8, wherein: several probe tips (330) are interconnected by conductive silver strips (340).

10. A probe testing apparatus according to claim 8, wherein: the telescopic rod (320) is arranged at the bottom of the probe rod (310).

11. The probe test apparatus according to any one of claims 2 to 7, wherein: the transverse probe row (100) and the longitudinal probe row (200) are both curved in shape.