CN215542843U - Chip testing and sorting equipment - Google Patents
Chip testing and sorting equipment Download PDFInfo
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- CN215542843U CN215542843U CN202122306669.1U CN202122306669U CN215542843U CN 215542843 U CN215542843 U CN 215542843U CN 202122306669 U CN202122306669 U CN 202122306669U CN 215542843 U CN215542843 U CN 215542843U
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Abstract
The utility model belongs to the technical field of semiconductor testing, and discloses a chip testing and sorting device which comprises a workbench, a detection plate and a detection machine, the detection plate is positioned above the workbench, the detection machine is positioned above the detection plate, a first outer side conveyor belt is arranged in the detection plate, one side of the first outer conveyor belt is provided with a second outer conveyor belt, the middle of the second outer conveyor belt is provided with a first extraction conveyor belt, the utility model is provided with the first outer conveyor belt, a feeding plate and a sliding filler block, the crystal grain to be detected is placed in the sliding filler block, and is sent into the detecting plate by the feeding plate, and then the sliding filler block is driven to move by the first outer side conveying belt, and unqualified sliding filler blocks are taken out by the second extraction conveyor belt, the use of the detection machine can be greatly reduced by the test mode, and each crystal grain can be detected.
Description
Technical Field
The utility model belongs to the technical field of semiconductor testing, and particularly relates to chip testing and sorting equipment.
Background
The manufacturing process of semiconductor device can be roughly divided into wafer manufacturing, wafer testing, packaging and final testing, wherein the wafer manufacturing is to manufacture electronic circuit devices on a silicon wafer, after the manufacturing is completed, the wafer is changed into individual crystal grains, then the wafer testing step is to perform electrical testing on the crystal grains, unqualified crystal grains are eliminated, and meanwhile, in order to ensure the accuracy of the wafer testing, the wafer needs to be subjected to sampling inspection.
In the prior art, a plurality of detectors are used in the test of the test equipment, and a plurality of crystal grains are detected, so that the equipment cannot lead out unqualified crystal grains at the first time, and a worker can easily touch the detected crystal grains during sampling.
SUMMERY OF THE UTILITY MODEL
The utility model aims to provide chip testing and sorting equipment to solve the problems that existing testing equipment cannot timely extract unqualified products and is inconvenient for workers to sample.
In order to achieve the purpose, the utility model provides the following technical scheme: the utility model provides a chip testing and sorting equipment, includes workstation, pick-up plate and detection machine, the pick-up plate is located the top of workstation, the detection machine is located the top of pick-up plate, the internally mounted of pick-up plate has first outside conveyer belt, one side of first outside conveyer belt is provided with second outside conveyer belt, the centre of second outside conveyer belt is provided with first extraction conveyer belt.
Preferably, one side of the second outer side conveyor belt, which is back to the first outer side conveyor belt, is provided with a second extraction conveyor belt, one side of the second extraction conveyor belt, which is back to the second outer side conveyor belt, is provided with a first inner side conveyor belt, one side of the first inner side conveyor belt is provided with a second inner side conveyor belt, one end of the second inner side conveyor belt is provided with a sampling conveyor belt, and one end of the sampling conveyor belt, which is back to the second inner side conveyor belt, is provided with a sampling groove.
Preferably, one side of the detection plate is provided with an extension plate, and the extension plate and the detection plate are both internally provided with a detection machine mounting seat.
Preferably, the number of the detection machine mounting seats in the detection plate is two, and the two detection machine mounting seats are located between the sampling conveyor belt and the first outer side conveyor belt.
Preferably, the detection plate is internally provided with a feeding plate in a sliding manner, a moving groove is formed in the feeding plate, and the inner wall of the moving groove is connected with a sliding packing block in a sliding manner.
Preferably, the sliding filler block is positioned above the first outer conveyor belt, and the width of the moving groove is larger than that of the first outer conveyor belt.
Compared with the prior art, the utility model has the following beneficial effects:
(1) the utility model is provided with the first outer side conveyor belt, the feeding plate and the sliding packing block, the crystal grains to be detected are placed in the sliding packing block and are fed into the detection plate by the feeding plate, the sliding packing block is driven to move by the first outer side conveyor belt, and the unqualified sliding packing block is taken out by the second extraction conveyor belt.
(2) The sampling conveyor belt and the sampling groove are arranged, the sliding filler blocks in the second inner side conveyor belt are extracted through the sampling conveyor belt, and the sliding filler blocks are moved into the sampling groove, so that the sampling is not needed to be performed manually by workers, the workers are prevented from touching the crystal grains which are being detected during the sampling, and the sampling by the workers is facilitated.
Drawings
FIG. 1 is a schematic structural view of the present invention;
FIG. 2 is a top view of the sensing plate of the present invention;
FIG. 3 is a top view of the feed plate of the present invention;
in the figure: 1. a work table; 2. detecting a plate; 3. a detector; 4. an extension plate; 5. a detector mounting base; 6. a first outer conveyor belt; 7. a first extraction conveyor; 8. a second extraction conveyor; 9. a first inner conveyor belt; 10. a second inner conveyor belt; 11. a feeding plate; 12. a moving groove; 13. sliding the packing block; 14. a sampling conveyor belt; 15. sampling grooves; 16. a second outer conveyor belt.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
Referring to fig. 1-3, the present invention provides the following technical solutions: the utility model provides a chip test sorting facilities, which comprises a workbench 1, pick-up plate 2 and detection machine 3, pick-up plate 2 is located the top of workstation 1, detection machine 3 is located the top of pick-up plate 2, the internally mounted of pick-up plate 2 has first outside conveyer belt 6, first outside conveyer belt 6 can effectual drive slip filler block 13 remove, thereby quick test the crystalline grain, one side of first outside conveyer belt 6 is provided with second outside conveyer belt 16, the centre of second outside conveyer belt 16 is provided with first extraction conveyer belt 7, can take out unqualified crystalline grain the very first time, and concentrated processing.
Further, a second extraction conveyor belt 8 is arranged on one side, opposite to the first outer conveyor belt 6, of the second outer conveyor belt 16, a first inner conveyor belt 9 is arranged on one side, opposite to the second outer conveyor belt 16, of the second extraction conveyor belt 8, a second inner conveyor belt 10 is arranged on one side of the first inner conveyor belt 9, a sampling conveyor belt 14 is arranged at one end of the second inner conveyor belt 10, the sampling conveyor belt 14 can effectively extract the sliding filler blocks 13 conveyed to the second inner conveyor belt 10, a sampling groove 15 is arranged at one end, opposite to the second inner conveyor belt 10, of the sampling conveyor belt 14, and the sliding filler blocks 13 obtained through sampling can be effectively collected.
Furthermore, one side of the detection plate 2 is provided with an extension plate 4, and the extension plate 4 and the detection plate 2 are both internally provided with a detection machine mounting seat 5, so that the detection machine 3 can be ensured to effectively detect the crystal grains.
Specifically, the two detection machine mounting seats 5 inside the detection plate 2 are arranged, and the two detection machine mounting seats 5 are located between the sampling conveyor belt 14 and the first outer side conveyor belt 6, so that the detection machine 3 can be ensured to detect the extracted sample.
It is worth mentioning that the feeding plate 11 is slidably mounted inside the detection plate 2, the moving groove 12 is formed inside the feeding plate 11, and the sliding filler block 13 is slidably connected to the inner wall of the moving groove 12, so that the sliding filler block 13 can be effectively driven by the first outer conveyor belt 6 to move in the moving groove 12.
Further, the sliding filler block 13 is located above the first outer side conveyor belt 6, and the width of the moving groove 12 is larger than that of the first outer side conveyor belt 6, so that the sliding filler block 13 can conveniently move smoothly in the moving groove 12.
The working principle and the using process of the utility model are as follows: when the utility model is used, a crystal grain to be detected is placed on the sliding filler block 13, the feeding plate 11 is installed in the detecting plate 2 in a sliding mode, the sliding filler block 13 is driven to move by the outer side conveying belt 6, the sliding filler block 13 passes through the detecting machine 3 on the detecting machine installing seat 5, after detection is completed, the sliding filler block 13 with unqualified crystal grains is moved into the second outer side conveying belt 16 by the first extraction conveying belt 7, part of the sliding filler block 13 is moved to the position above the first inner side conveying belt 9 or the second inner side conveying belt 10 by the second extraction conveying belt 8, then the sliding filler block 13 above the second inner side conveying belt 10 is sampled by the sampling conveying belt 14, and the sliding filler block 13 is conveyed into the sampling groove 15 so that a worker can detect the crystal grain.
Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that changes, modifications, substitutions and alterations can be made in these embodiments without departing from the principles and spirit of the utility model, the scope of which is defined in the appended claims and their equivalents.
Claims (6)
1. The utility model provides a chip testing sorting facilities, includes workstation (1), pick-up plate (2) and detection machine (3), pick-up plate (2) are located the top of workstation (1), detection machine (3) are located the top of pick-up plate (2), its characterized in that: the detection plate is characterized in that a first outer side conveyor belt (6) is installed inside the detection plate (2), a second outer side conveyor belt (16) is arranged on one side of the first outer side conveyor belt (6), and a first extraction conveyor belt (7) is arranged in the middle of the second outer side conveyor belt (16).
2. The chip testing and sorting apparatus of claim 1, wherein: one side that second outside conveyer belt (16) is carried on the back in the first outside conveyer belt (6) is provided with second extraction conveyer belt (8), one side that second extraction conveyer belt (8) is carried on the back in the second outside conveyer belt (16) is provided with first inboard conveyer belt (9), one side of first inboard conveyer belt (9) is provided with second inboard conveyer belt (10), the one end of second inboard conveyer belt (10) is provided with sampling conveyer belt (14), sampling conveyer belt (14) are carried on the back in the one end of second inboard conveyer belt (10) and are provided with sampling groove (15).
3. The chip testing and sorting apparatus of claim 1, wherein: an extension plate (4) is installed on one side of the detection plate (2), and detection machine installation seats (5) are arranged inside the extension plate (4) and the detection plate (2).
4. The chip testing and sorting apparatus of claim 3, wherein: the detection device is characterized in that two detection device mounting seats (5) in the detection plate (2) are arranged, and the two detection device mounting seats (5) are located between the sampling conveyor belt (14) and the first outer side conveyor belt (6).
5. The chip testing and sorting apparatus of claim 1, wherein: the feeding plate (11) is installed inside the detection plate (2) in a sliding mode, a moving groove (12) is formed in the feeding plate (11), and a sliding filling block (13) is connected to the inner wall of the moving groove (12) in a sliding mode.
6. The chip testing and sorting device of claim 5, wherein: the sliding filler block (13) is positioned above the first outer side conveyor belt (6), and the width of the moving groove (12) is larger than that of the first outer side conveyor belt (6).
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN202122306669.1U CN215542843U (en) | 2021-09-23 | 2021-09-23 | Chip testing and sorting equipment |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN202122306669.1U CN215542843U (en) | 2021-09-23 | 2021-09-23 | Chip testing and sorting equipment |
Publications (1)
Publication Number | Publication Date |
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CN215542843U true CN215542843U (en) | 2022-01-18 |
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Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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CN202122306669.1U Active CN215542843U (en) | 2021-09-23 | 2021-09-23 | Chip testing and sorting equipment |
Country Status (1)
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CN (1) | CN215542843U (en) |
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2021
- 2021-09-23 CN CN202122306669.1U patent/CN215542843U/en active Active
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