CN215340192U - Base for batch test of integrated circuits - Google Patents
Base for batch test of integrated circuits Download PDFInfo
- Publication number
- CN215340192U CN215340192U CN202121290954.2U CN202121290954U CN215340192U CN 215340192 U CN215340192 U CN 215340192U CN 202121290954 U CN202121290954 U CN 202121290954U CN 215340192 U CN215340192 U CN 215340192U
- Authority
- CN
- China
- Prior art keywords
- test
- strip
- base
- shaped
- long
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The utility model discloses a batch test base for integrated circuits, which comprises: the long-strip-shaped base and the long-strip-shaped turnover cover movably connected to the long-strip-shaped base. A plurality of test blocks are embedded into the outer wall of the strip-shaped base along the length direction of the outer wall, and a plurality of test foot pads are arranged on the test blocks. The strip-shaped base is provided with a test circuit board electrically connected with the plurality of test foot pads, and the test circuit board is connected with an external test host. The first long edge of the long-strip-shaped flip cover is hinged to the long-strip-shaped base, and the second long edge of the long-strip-shaped flip cover can be clamped to the long-strip-shaped base. The strip-shaped flip cover is provided with a containing through hole which is in one-to-one correspondence with the plurality of test blocks, and the inner wall of the containing through hole is provided with a step groove which is in one-to-one correspondence with the plurality of test foot pads. The utility model has the beneficial effects that: a plurality of integrated circuits can be fixed at one time, batch testing is realized, and the production efficiency is greatly improved. Overall structure is simple, and the cost of manufacture is low, and is more convenient when fixed integrated circuit, has further improved production efficiency.
Description
Technical Field
The utility model relates to the technical field of integrated circuit testing, in particular to a base for batch testing of integrated circuits.
Background
When the integrated circuit is tested, the pins of the integrated circuit and the test foot pads on the test base are required to be fixed in a one-to-one correspondence manner to realize electrical conduction. The existing integrated circuit testing base can not fix a plurality of integrated circuits at the same time, so that batch testing can not be carried out, and the testing efficiency is low.
SUMMERY OF THE UTILITY MODEL
Aiming at the problems in the prior art, the utility model provides a batch test base for integrated circuits.
In order to achieve the above object, the present invention provides a batch test socket for integrated circuits, comprising: the long-strip-shaped base and the long-strip-shaped turnover cover movably connected to the long-strip-shaped base. A plurality of test blocks are embedded into the outer wall of the strip-shaped base along the length direction of the outer wall, and a plurality of test foot pads are arranged on the test blocks. The strip-shaped base is provided with a test circuit board electrically connected with the plurality of test foot pads, and the test circuit board is connected with an external test host. The first long edge of the long-strip-shaped flip cover is hinged to the long-strip-shaped base, and the second long edge of the long-strip-shaped flip cover can be clamped to the long-strip-shaped base. The strip-shaped flip cover is provided with a containing through hole which is in one-to-one correspondence with the plurality of test blocks, and the inner wall of the containing through hole is provided with a step groove which is in one-to-one correspondence with the plurality of test foot pads.
Preferably, the second long edge of the strip-shaped flip cover is hinged with a buckle cover, a buckle is arranged on the strip-shaped base, and the buckle cover can be clamped with the buckle.
Preferably, the strip-shaped base is provided with a mounting hole corresponding to the test block, and the test block is embedded in the mounting hole. An elastic clamping block is arranged at the orifice of the mounting hole, a clamping strip is arranged on the elastic clamping block, a clamping groove is arranged on the outer wall of the testing block, and the clamping strip is clamped into the clamping groove.
Preferably, the test block is provided with limit holes corresponding to the test foot pads one to one. The first end of test callus on the sole slides and sets up in spacing downthehole, and the first end of test callus on the sole passes through conductor wire and test circuit board electric connection, and the second end protrusion test piece of test callus on the sole. The cover is equipped with the spring on the test callus on the sole, and the first end of spring supports to press on the test callus on the sole, and the second end of spring supports to press on the inner wall in spacing hole.
Preferably, the inner wall of the accommodating through hole is provided with a non-slip mat.
Compared with the prior art, the utility model has the beneficial effects that: the test base can fix a plurality of integrated circuits at one time, batch test is realized, and production efficiency is greatly improved. Moreover, the test base is simple in overall structure, low in manufacturing cost and more convenient in the process of fixing the integrated circuit, and production efficiency is further improved.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to the structures shown in the drawings without creative efforts.
FIG. 1 is a schematic perspective view of an embodiment of the present invention;
FIG. 2 is a schematic structural diagram of an elastic clamping block according to an embodiment of the present invention;
FIG. 3 is a schematic diagram illustrating an internal cross-sectional structure of an elongated base according to an embodiment of the present invention;
the objects, features and advantages of the present invention will be further explained with reference to the accompanying drawings.
Detailed Description
The utility model provides a base for batch testing of integrated circuits.
Referring to fig. 1-3, fig. 1 is a schematic perspective view illustrating an embodiment of the present invention, fig. 2 is a schematic structural view illustrating an elastic clamping block according to an embodiment of the present invention, and fig. 3 is a schematic structural view illustrating an internal cross-section of a strip-shaped base according to an embodiment of the present invention.
As shown in fig. 1-3, in an embodiment of the present invention, the ic batch test socket includes: an elongated base 100 and an elongated flip cover 200 movably connected to the elongated base 100. The first long edge of the elongated flip cover 200 is hinged to the elongated base 100, the second long edge of the elongated flip cover 200 is hinged to the buckle cover 210, the buckle 110 is arranged on the elongated base 100, and the buckle cover 210 can be connected with the buckle 110 in a clamped manner, so that the elongated flip cover 200 and the elongated base 100 can be opened and closed.
A plurality of mounting holes are formed in the outer wall of the strip-shaped base 100 along the length direction thereof, and test blocks 300 are embedded in the mounting holes. An elastic fixture block 120 is arranged at the opening of the mounting hole, a fixture strip 121 is arranged on the elastic fixture block 120, a clamping groove (not shown in the figure) is arranged on the outer wall of the test block 300, and the fixture strip 121 is clamped in the clamping groove. The test block 300 is provided with a plurality of limiting holes, and the test foot pad 400 is arranged in each limiting hole. The first end of the test foot pad 400 is slidably disposed in the limiting hole. The strip-shaped base 100 is provided with a test circuit board 500, and the test circuit board 500 is connected with an external test host. The first end of the test pad 400 is electrically connected to the test circuit board 500 through a conductive wire (not shown), and the second end of the test pad 400 protrudes out of the test block 300. The testing foot pad 400 is sleeved with a spring 410, a first end of the spring 410 is pressed on the testing foot pad 400, and a second end of the spring 410 is pressed on the inner wall of the limiting hole.
By adopting the detachable embedded mounting structure for the test block 300, different test blocks 300 can be replaced according to the model of the tested integrated circuit without replacing the whole test base, so that the use is very convenient, and the test cost is greatly reduced. Through setting the test foot pad 400 to an elastic structure, the pins of the integrated circuit can be firmly supported tightly when the test foot pad 400 works, so that the stability of power connection during testing is ensured.
The strip-shaped flip cover 200 is provided with receiving through holes 220 corresponding to the plurality of test pads 300 one by one, and the inner walls of the receiving through holes 220 are provided with step grooves 221 corresponding to the plurality of test pads 400 one by one.
During testing, the integrated circuit is placed in the accommodating through hole 220, the pins of the integrated circuit are correspondingly placed in the step grooves 221, and the integrated circuit cannot fall out of the accommodating through hole 220 under the limiting action of the step grooves 221 on the pins of the integrated circuit, so that the integrated circuit can be conveniently loaded into the strip-shaped flip cover 200. After the integrated circuits are loaded in the accommodating through holes 220 of the strip-shaped flip cover 200, the strip-shaped flip cover 200 is fastened with the strip-shaped base 100, so that the integrated circuits are fixed, pins of the integrated circuits are tightly abutted against the testing foot pads 400 on the strip-shaped base 100 to be electrically conducted, and further, power-on testing can be performed. The integrated circuit is placed in the accommodating through hole 200, and the integrated circuit can be conveniently taken out after the integrated circuit is tested.
In order to prevent the integrated circuit from easily falling out of the accommodating through hole 220 during the process of fastening the elongated flip cover 200 to the elongated base 100, the inner wall of the accommodating through hole 220 is provided with a non-slip pad 222, and the non-slip pad 222 is in pressing contact with the outer wall of the integrated circuit.
Compared with the prior art, the utility model has the beneficial effects that: the test base can fix a plurality of integrated circuits at one time, batch test is realized, and production efficiency is greatly improved. Moreover, the test base is simple in overall structure, low in manufacturing cost and more convenient in the process of fixing the integrated circuit, and production efficiency is further improved.
The above description is only a preferred embodiment of the present invention, and not intended to limit the scope of the present invention, and all modifications and equivalents of the technical solutions of the present invention, which are made by using the contents of the present specification and the accompanying drawings, or directly/indirectly applied to other related technical fields, are included in the scope of the present invention.
Claims (5)
1. An integrated circuit batch test base, comprising: the device comprises a strip-shaped base and a strip-shaped turnover cover movably connected to the strip-shaped base; a plurality of test blocks are embedded in the outer wall of the strip-shaped base along the length direction of the strip-shaped base, and a plurality of test foot pads are arranged on the test blocks; the strip-shaped base is provided with a test circuit board electrically connected with the plurality of test foot pads, and the test circuit board is connected with an external test host; the first long edge of the elongated turnover cover is hinged to the elongated base, and the second long edge of the elongated turnover cover can be clamped on the elongated base; the strip-shaped flip cover is provided with a plurality of accommodating through holes in one-to-one correspondence with the test blocks, and the inner wall of each accommodating through hole is provided with a plurality of step grooves in one-to-one correspondence with the test foot pads.
2. The batch test base for integrated circuits according to claim 1, wherein the second long side of the elongated flip cover is hinged to a buckle cover, and a buckle is arranged on the elongated base and can be clamped with the buckle.
3. The batch test base of claim 1, wherein the elongated base has mounting holes corresponding to the test blocks, and the test blocks are embedded in the mounting holes; the drill way department of mounting hole is equipped with the elasticity fixture block, be equipped with the card strip on the elasticity fixture block, be equipped with the draw-in groove on the outer wall of test block, the card strip card is gone into in the draw-in groove.
4. The batch test base for integrated circuits according to claim 1, wherein the test block is provided with a plurality of limiting holes corresponding to the plurality of test pads one to one; the first end of the test foot pad is arranged in the limiting hole in a sliding mode, the first end of the test foot pad is electrically connected with the test circuit board through a conducting wire, and the second end of the test foot pad protrudes out of the test block; the testing foot pad is sleeved with a spring, the first end of the spring is pressed on the testing foot pad, and the second end of the spring is pressed on the inner wall of the limiting hole.
5. The batch test base of integrated circuits according to any of claims 1-4, wherein the inner walls of the receiving through holes are provided with anti-slip pads.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202121290954.2U CN215340192U (en) | 2021-06-09 | 2021-06-09 | Base for batch test of integrated circuits |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202121290954.2U CN215340192U (en) | 2021-06-09 | 2021-06-09 | Base for batch test of integrated circuits |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN215340192U true CN215340192U (en) | 2021-12-28 |
Family
ID=79556250
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202121290954.2U Active CN215340192U (en) | 2021-06-09 | 2021-06-09 | Base for batch test of integrated circuits |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN215340192U (en) |
-
2021
- 2021-06-09 CN CN202121290954.2U patent/CN215340192U/en active Active
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US6046597A (en) | Test socket for an IC device | |
| US10228417B2 (en) | Test fixture and test device for IC | |
| US6957967B2 (en) | Electrical connector with different pitch terminals | |
| JP2016197120A (en) | High-temperature ceramic socket configured to test packaged semiconductor device | |
| KR101469217B1 (en) | Apparatus for test of semi conductor device | |
| KR101095902B1 (en) | Socket for kelvin testing | |
| CN215340192U (en) | Base for batch test of integrated circuits | |
| WO2005013429A1 (en) | Compression mount and zero insertion force socket for ic devices | |
| KR20120132391A (en) | Test socket with a rapidly detachable electrical connection module | |
| KR200354142Y1 (en) | socket device for chip testing | |
| CN213633714U (en) | Radio frequency test probe module for flexible circuit board | |
| CN209878823U (en) | Automatic locking type BGA aging testing device | |
| KR101183167B1 (en) | Socket for kelvin testing | |
| CN208862215U (en) | A kind of split type inner conductor connector | |
| TW200716997A (en) | Electrical testing device | |
| CN220327446U (en) | Probe module | |
| CN216718644U (en) | Micro-space connector testing device | |
| CN210090507U (en) | Test fixture | |
| KR100844486B1 (en) | Test socket for semiconductor chip | |
| CN219533243U (en) | Annular component test base | |
| CN220381177U (en) | Withstand voltage testing arrangement convenient to location | |
| CN220543062U (en) | Ageing test backup pad and ageing test equipment | |
| CN219285338U (en) | Chip test system and test platform | |
| CN220356349U (en) | Clamp for batch power-on screening test of angular displacement sensors | |
| CN211402462U (en) | Universal integrated circuit test carrier plate |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CP03 | Change of name, title or address | ||
| CP03 | Change of name, title or address |
Address after: Building A, Building 201, Yingdafeng Industrial Park, No. 393 Jihua Road, Shuijing Community, Jihua Street, Longgang District, Shenzhen City, Guangdong Province, 518100 Patentee after: Shenzhen Chuangxin Online Testing Service Co.,Ltd. Address before: 518000 401, building a, yingdafeng Industrial Park, No. 393, Jihua Road, Jihua street, Longgang District, Shenzhen, Guangdong Province Patentee before: Shenzhen insell Electronic Co.,Ltd. |