CN214591321U

CN214591321U - Multi-pin-row EL (electro-luminescence) test unit for tile stacking assembly

Info

Publication number: CN214591321U
Application number: CN202120687171.1U
Authority: CN
Inventors: 钱国庆; 叶伟; 胥善红; 朱剑
Original assignee: Suzhou Tai Electronic Technology Co ltd
Current assignee: Suzhou Tai Electronic Technology Co ltd
Priority date: 2021-04-06
Filing date: 2021-04-06
Publication date: 2021-11-02
Anticipated expiration: 2031-04-06

Abstract

The utility model discloses a multi-pin-row EL test unit for a tile stacking assembly, which relates to the field of photovoltaic equipment and comprises an upper unit and a lower unit, wherein the upper unit comprises an upper frame and an upper pin row bracket, and the upper frame is connected with a single-row test row and a double-row test row in a sliding way through the upper pin row bracket; the unit includes lower frame and lower faller gill support down, the lower frame has single probe row and double probe row through faller gill support sliding connection, be provided with the probe on single probe row and the double probe row, the utility model has the advantages of: the definition of the test pattern of the test unit on the Korea 166 shingle assembly is improved through the structural design, the test stability is improved, and meanwhile, the test unit has good compatibility through the structural design.

Description

Multi-pin-row EL (electro-luminescence) test unit for tile stacking assembly

Technical Field

The utility model relates to a photovoltaic equipment field specifically is a EL test element is arranged to many needles that is used for fold tile subassembly.

Background

Photovoltaic (photo): the Solar photovoltaic power generation system is a novel power generation system which directly converts Solar radiation energy into electric energy by utilizing the photovoltaic effect of a Solar cell semiconductor material and has two modes of independent operation and grid-connected operation. Meanwhile, solar photovoltaic power generation systems are classified, and one is centralized, such as a large northwest ground photovoltaic power generation system; one is distributed (with >6MW as boundary), such as factory building roof photovoltaic power generation system of industry and commerce, resident house roof photovoltaic power generation system. Photovoltaic technology has many advantages: such as without any mechanical moving parts; except sunshine, the solar energy collector can work under the conditions of direct sunlight and oblique sunlight without any other 'fuel'; and the selection of the station site is very convenient and flexible, and the roof and the open space in the city can be applied. Since 1958, the solar photovoltaic effect was first applied in the form of solar cells in the field of energy supply for space satellites. Nowadays, as little as energy supply and roof solar panels of automatic parking meters are applied to solar power generation centers with wide areas, and the solar power generation centers are applied to the field of power generation all over the world.

Among these, the photovoltaic panel assembly is a power generation device that generates direct current upon exposure to sunlight, and is composed of thin solid photovoltaic cells made almost entirely of semiconductor material (e.g., silicon). Because there are no moving parts, it can be operated for a long time without causing any loss. Simple photovoltaic cells can provide energy for watches and calculators, and more complex photovoltaic systems can provide lighting for houses and power for the grid. The photovoltaic panel assembly can be made in different shapes and the assembly can be connected to generate more electricity. Both rooftops and building surfaces utilize photovoltaic panels, even as part of a window, skylight, or shelter, which are commonly referred to as building-attached photovoltaic systems.

At present, in order to improve compatibility, a common photovoltaic module testing device is generally low in detection stability and low in quality definition of a detected image, a specific detecting device can only detect a single module, and a high-compatibility multi-pin-row EL testing unit for a Korea 166 shingle module does not exist at present.

SUMMERY OF THE UTILITY MODEL

In order to solve the technical problems, the technical scheme provides a multi-pin-row EL test unit for a conway EL166 shingle assembly, and solves the problems that the conventional photovoltaic assembly test device proposed in the background art is not high in detection stability and low in quality definition of a detected pattern in order to improve compatibility, a specific detection device can only detect a single assembly, and a high-compatibility multi-pin-row EL test unit for the conway EL166 shingle assembly does not exist at present.

In order to achieve the above purpose, the utility model adopts the technical scheme that:

a multi-pin-row EL test unit for a tile stacking assembly comprises an upper unit and a lower unit, wherein the upper unit comprises an upper frame and an upper pin row support, and the upper frame is connected with a single-row test row and a double-row test row in a sliding mode through the upper pin row support;

the lower unit comprises a lower frame and a lower probe row support, the lower frame is connected with a single-row probe row and a double-row probe row in a sliding mode through the lower probe row support, and probes are arranged on the single-row probe row and the double-row probe row.

Preferably, two sides of the upper frame are provided with upper T-shaped sliding grooves, twelve upper needle row supports are arranged, and six upper needle row supports are respectively connected in the two upper T-shaped sliding grooves in a sliding manner.

Preferably, lower T-shaped sliding grooves are formed in two sides of the lower frame, twelve lower needle row supports are arranged, and six lower needle row supports are connected to the two lower T-shaped sliding grooves in a sliding mode respectively.

Preferably, two ends of the double-row test row are fixedly connected with the upper pin row support respectively, the number of the double-row test rows is four, the double-row test row is arranged in the middle of the upper frame, two ends of the single-row test row are fixedly connected with the upper pin row support respectively, and the number of the single-row test rows is two, and the two single-row test rows are arranged at two ends of the upper frame.

Preferably, two ends of the double-row probe row are fixedly connected with the lower probe row support respectively, the double-row probe row is four in number and four in number, the double-row probe row is arranged in the middle of the lower frame, two ends of the single-row probe row are fixedly connected with the lower probe row support respectively, and two single-row probe rows are arranged at two ends of the lower frame.

Preferably, a row of probes is uniformly distributed on the single-row probe row, a setting gap between the probes on the single-row probe row is 5mm, two rows of probes are uniformly distributed on the double-row probe row, and a setting gap between the probes on the double-row probe row is 5 mm.

Preferably, the lower end of the upper faller gill support is fixedly connected with an upper T-shaped sliding block, the upper faller gill support is connected with the upper frame in a sliding manner through the upper T-shaped sliding block, an upper circular through hole is formed in the upper faller gill support, and an electromagnetic adsorption device is arranged in the upper circular through hole.

Preferably, the lower end of the lower needle bar support is fixedly connected with a lower T-shaped sliding block, the lower needle bar support is connected with the lower frame in a sliding mode through the lower T-shaped sliding block, a lower circular through hole is formed in the lower needle bar support, and an electromagnetic adsorption device is arranged in the lower circular through hole.

Preferably, the four double-row probe banks and the four double-row test banks are arranged in a one-to-one correspondence manner, and the two single-row probe banks and the two single-row test banks are arranged in a one-to-one correspondence manner.

Preferably, the single-row test strip and the double-row test strip are made of copper bars with silver-plated surfaces.

The utility model has the advantages that: the upper probe row is in contact with the battery piece by using the probe, the copper bar is changed into a copper bar which is in direct contact with the battery piece after silver plating, the lower probe row is changed into a Koron-166 shingle pattern counter point probe row, the contact area of the battery piece is increased, the definition of an EL (electro-luminescence) test image is improved, the test stability is improved, the upper test row and the lower probe row can move in an upper frame and a lower frame through an upper probe row support and a lower probe row support, the upper test row and the lower probe row can be fixed on the upper frame and the lower frame by opening an electromagnetic adsorption device after the position is adjusted, the distance can be conveniently adjusted according to the test requirements of different products, and the compatibility is higher.

Drawings

Fig. 1 is a schematic perspective view of the present invention;

fig. 2 is a side view of the present invention;

fig. 3 is a schematic diagram of the distribution of probes in a single row of probe rows according to the present invention;

fig. 4 is a schematic diagram of the probe distribution of the double row probe row of the present invention;

fig. 5 is a schematic perspective view of a single-row test row in the present invention;

FIG. 6 is a schematic perspective view of the middle-upper needle row support of the present invention;

fig. 7 is a schematic view of the three-dimensional structure of the middle and lower needle row support of the present invention.

The reference numbers in the figures are:

1. putting the frame on; 101. an upper T-shaped chute; 2. an upper needle row bracket; 201. an upper T-shaped sliding block; 202. an upper circular through hole; 3. a single row of test rows; 4. a lower frame; 401. a lower T-shaped chute; 5. double rows of probe lines; 6. a single row of probe rows; 7. a probe; 8. a lower needle row bracket; 801. a lower T-shaped slider; 802. a lower circular through hole; 9. double rows of test rows; 10. an electromagnetic adsorption device.

Detailed Description

The following description is presented to disclose the invention so as to enable any person skilled in the art to practice the invention. The preferred embodiments in the following description are given by way of example only, and other obvious variations will occur to those skilled in the art.

Referring to fig. 1-7, a multi-pin-row EL testing unit for a tile-stacking assembly comprises an upper unit and a lower unit, wherein the upper unit comprises an upper frame 1 and an upper pin row support 2, two sides of the upper frame 1 are provided with upper T-shaped chutes 101, the lower end of the upper pin row support 2 is fixedly connected with upper T-shaped sliders 201, the upper pin row support 2 is slidably connected with the upper frame 1 through the upper T-shaped sliders 201, the upper pin row support 2 is provided with upper circular through holes 202, electromagnetic adsorption devices 10 are arranged in the upper circular through holes 202, twelve upper pin row supports 2 are provided, six upper pin row supports 2 are respectively slidably connected in the two upper T-shaped chutes 101, two ends of a double-row testing row 9 are respectively fixedly connected with the upper pin row supports 2, four double-row testing rows 9 are provided, the four double-row testing rows 9 are provided in the middle of the upper frame 1, two ends of a single-row testing row 3 are respectively fixedly connected with the upper pin row support 2, two single-row testing rows 3 are provided, two single-row test rows 3 are arranged at two ends of an upper frame 1, two ends of a double-row probe row 5 are respectively and fixedly connected with a lower probe row support 8, four double-row probe rows 5 are arranged in the middle of a lower frame 4, two ends of a single-row probe row 6 are respectively and fixedly connected with the lower probe row support 8, two single-row probe rows 6 are arranged, the two single-row probe rows 6 are arranged at two ends of the lower frame 4, the single-row test rows 3 and the double-row test rows 9 are made of copper bars with surfaces subjected to silver plating treatment, the upper probe row is contacted with a battery piece by using probes, the copper bars are directly contacted with the battery piece after the silver plating treatment, and the contact area of the battery piece is increased, so that the definition of an EL test image is improved;

the lower unit comprises a lower frame 4 and a lower probe row support 8, wherein lower T-shaped sliding grooves 401 are arranged on two sides of the lower frame 4, lower T-shaped sliding blocks 801 are fixedly connected to the lower ends of the lower probe row support 8, the lower probe row support 8 is connected with the lower frame 4 in a sliding mode through the lower T-shaped sliding blocks 801, lower circular through holes 802 are formed in the lower probe row support 8, electromagnetic adsorption devices 10 are arranged in the lower circular through holes 802, twelve lower probe row supports 8 are arranged on the lower probe row support 8, six lower probe row supports 8 are respectively connected in the two lower T-shaped sliding grooves 401 in a sliding mode, two ends of a double-row probe row 5 are respectively and fixedly connected with the lower probe row support 8, four double-row probe rows 5 are arranged in the middle of the lower frame 4, two ends of a single-row probe row 6 are respectively and fixedly connected with the lower probe row support 8, two single-row probe rows 6 are arranged on two ends of the lower frame 4, and double-row probes 7 are arranged on the single-row probe row 6 and the probe rows 5, the structure is characterized in that a row of probes 7 are uniformly distributed on a single-row probe row 6, the setting gap of the probes on the single-row probe row 6 is 5mm, two rows of probes 7 are uniformly distributed on two rows of probes 5, the setting gap of the probes on the two rows of probes 5 is 5mm, four two rows of probes 5 and four two rows of test rows 9 are arranged in a one-to-one correspondence manner, the two single-row probe rows 6 and the two single-row test rows 3 are arranged in a one-to-one correspondence manner, a lower probe row is changed into a Kolon 166-Walsh pattern point probe row, the contact area of a battery piece is further increased so as to improve the definition of an EL test image, the upper test row and the lower probe row can move in an upper frame and a lower frame through upper and lower probe row supports, after the position is adjusted, the upper test row and the lower probe row can be fixed on the upper frame 1 and the lower frame 4 by opening an electromagnetic adsorption device 10, the space can be conveniently adjusted according to the test requirements of different products, and the compatibility is higher.

To sum up, the utility model has the advantages that: the definition of the test pattern of the test unit on the Korea 166 shingle assembly is improved through the structural design, the test stability is improved, and meanwhile, the test unit has good compatibility through the structural design.

The foregoing shows and describes the general principles, essential features, and advantages of the invention. It will be understood by those skilled in the art that the present invention is not limited to the above embodiments, and that the principles of the present invention may be applied to any other embodiment without departing from the spirit and scope of the present invention. The scope of the invention is defined by the appended claims and equivalents thereof.

Claims

1. A multi-pin-row EL test unit for a tile stack assembly is characterized by comprising an upper unit and a lower unit, wherein the upper unit comprises an upper frame (1) and an upper pin row support (2), and the upper frame (1) is connected with a single-row test row (3) and a double-row test row (9) in a sliding manner through the upper pin row support (2);

the lower unit comprises a lower frame (4) and a lower probe row support (8), the lower frame (4) is connected with a single-row probe row (6) and a double-row probe row (5) through the lower probe row support (8) in a sliding mode, and probes (7) are arranged on the single-row probe row (6) and the double-row probe row (5).

2. The EL test unit for the shingle assembly according to claim 1, wherein the upper frame (1) has upper T-shaped sliding grooves (101) on both sides, twelve upper pin row supports (2) are provided, and six upper pin row supports (2) are slidably connected to two upper T-shaped sliding grooves (101), respectively.

3. The EL test unit for a shingle assembly according to claim 1, wherein lower T-shaped chutes (401) are formed on both sides of the lower frame (4), twelve lower needle row supports (8) are provided, and six lower needle row supports (8) are slidably connected to two lower T-shaped chutes (401), respectively.

4. The multi-pin-row EL test unit for a shingled assembly according to claim 1, wherein two ends of the double-row test row (9) are fixedly connected to the upper pin row holder (2), respectively, four of the double-row test rows (9) are provided, four of the double-row test rows (9) are disposed at the middle portion of the upper frame (1), two ends of the single-row test row (3) are fixedly connected to the upper pin row holder (2), respectively, two of the single-row test rows (3) are provided, and two of the single-row test rows (3) are disposed at two ends of the upper frame (1).

5. The EL test unit for multi-row shingle assembly according to claim 1, wherein two ends of the double row of probes (5) are fixedly connected to the lower row of probes support (8), respectively, the double row of probes (5) has four rows, four rows of probes (5) are arranged in the middle of the lower frame (4), two ends of the single row of probes (6) are fixedly connected to the lower row of probes support (8), two rows of probes (6) are arranged, and two rows of probes (6) are arranged at two ends of the lower frame (4).

6. The EL test unit with multiple rows of probes for the shingle assembly according to claim 1, wherein the probes (7) are uniformly distributed on the probe row (6), the setting gap between the probes (7) on the probe row (6) is 5mm, the probes (7) are uniformly distributed on the probe row (5) with two rows, and the setting gap between the probes (7) on the probe row (5) with two rows is 5 mm.

7. The multi-pin-row EL test unit for the tile stack assembly according to claim 1, wherein an upper T-shaped sliding block (201) is fixedly connected to the lower end of the upper pin row support (2), the upper pin row support (2) is slidably connected with the upper frame (1) through the upper T-shaped sliding block (201), an upper circular through hole (202) is formed in the upper pin row support (2), and an electromagnetic adsorption device (10) is arranged in the upper circular through hole (202).

8. The multi-pin-row EL test unit for the tile stack assembly according to claim 1, wherein a lower T-shaped sliding block (801) is fixedly connected to the lower end of the lower pin row support (8), the lower pin row support (8) is slidably connected with the lower frame (4) through the lower T-shaped sliding block (801), a lower circular through hole (802) is formed in the lower pin row support (8), and an electromagnetic adsorption device (10) is arranged in the lower circular through hole (802).

9. The EL test cell for a shingle assembly according to claim 1, wherein four of said double rows of probes (5) are disposed in a one-to-one correspondence with four of said double rows of test rows (9), and two of said single rows of probes (6) are disposed in a one-to-one correspondence with two of said single rows of test rows (3).

10. The multi-pin-row EL test unit for the shingle assembly according to claim 1, wherein the single row test row (3) and the double row test row (9) are made of copper bars with silver-plated surfaces.