CN215186648U

CN215186648U - Multi-pin row test unit of laminated tile assembly

Info

Publication number: CN215186648U
Application number: CN202120637633.9U
Authority: CN
Inventors: 钱国庆; 叶伟; 胥善红; 朱剑
Original assignee: Suzhou Tai Electronic Technology Co ltd
Current assignee: Suzhou Tai Electronic Technology Co ltd
Priority date: 2021-03-30
Filing date: 2021-03-30
Publication date: 2021-12-14
Anticipated expiration: 2031-03-30

Abstract

The utility model discloses a multi-pin row test unit of a tile stacking assembly, which relates to the field of photovoltaic equipment and comprises an upper test unit and a lower test unit, wherein the upper test unit comprises an upper frame, an upper pin row bracket is connected on the upper frame in a sliding way, an upper pin row is fixedly connected on the upper pin row bracket, and an upper probe is arranged on the upper pin row; the test unit includes the lower frame down, sliding connection has lower faller gill support on the lower frame, fixedly connected with faller gill under on the faller gill support down, fixedly connected with lower probe on the faller gill down, the utility model has the advantages of: the structure is simple, and the manufacture is easy; the upper probe board and the lower probe board can move along the upper frame and the lower frame through the structure, so that the compatibility of the test unit is improved, and the test cost of the laminated cell is reduced.

Description

Multi-pin row test unit of laminated tile assembly

Technical Field

The utility model relates to a photovoltaic equipment field specifically is a many needle bars of fold tile subassembly test unit is related to.

Background

Photovoltaic (photo): the Solar photovoltaic power generation system is a novel power generation system which directly converts Solar radiation energy into electric energy by utilizing the photovoltaic effect of a Solar cell semiconductor material and has two modes of independent operation and grid-connected operation. Meanwhile, solar photovoltaic power generation systems are classified, and one is centralized, such as a large northwest ground photovoltaic power generation system; one is distributed (with >6MW as boundary), such as factory building roof photovoltaic power generation system of industry and commerce, resident house roof photovoltaic power generation system. Photovoltaic technology has many advantages: such as without any mechanical moving parts; except sunshine, the solar energy collector can work under the conditions of direct sunlight and oblique sunlight without any other 'fuel'; and the selection of the station site is very convenient and flexible, and the roof and the open space in the city can be applied. Since 1958, the solar photovoltaic effect was first applied in the form of solar cells in the field of energy supply for space satellites. The solar energy generation center with the small energy supply and the roof solar panel of the automatic parking meter and the large area has been applied all over the world in the field of power generation, wherein the average power of the shingled assembly can be increased by more than 20W, and the solar energy generation center obviously leads other novel packaging technologies.

The probe position in the device that current carry out measuring to the shingling subassembly is fixed the setting usually, and the probe position can't be adjusted when detecting, leads to detection device's compatibility not high, can't detect the shingling subassembly of different models, has improved the detection cost.

SUMMERY OF THE UTILITY MODEL

In order to solve the technical problem, the multi-pin row test unit for the tile stack assembly is provided, and the technical scheme solves the problems that the probe position in the existing device for detecting the tile stack assembly in the background art is usually fixedly arranged, the probe position cannot be adjusted when the detection is carried out, so that the compatibility of the detection device is not high, the tile stack assemblies of different models cannot be detected, and the detection cost is improved.

In order to achieve the above purpose, the utility model adopts the technical scheme that:

a multi-pin row test unit of a tile stacking assembly comprises an upper test unit and a lower test unit, wherein the upper test unit comprises an upper frame, an upper pin row support is connected to the upper frame in a sliding mode, an upper pin row is fixedly connected to the upper pin row support, and an upper probe is arranged on the upper pin row;

the lower test unit comprises a lower frame, a lower needle row support is connected to the lower frame in a sliding mode, a lower needle row is fixedly connected to the lower needle row support, and a lower probe is fixedly connected to the lower needle row.

Preferably, the upper frame is provided with an upper T-shaped sliding chute, and the lower frame is provided with a lower T-shaped sliding chute.

Preferably, the lower end of the upper faller gill support is fixedly connected with an upper T-shaped sliding block, the upper faller gill support is connected with the upper frame in a sliding manner through the upper T-shaped sliding block, an upper circular through hole is formed in the upper faller gill support, and an electromagnetic adsorption device is arranged in the upper circular through hole.

Preferably, the lower end of the lower needle bar support is fixedly connected with a lower T-shaped sliding block, the lower needle bar support is connected with the lower frame in a sliding mode through an upper T-shaped sliding block, a lower circular through hole is formed in the lower needle bar support, and an electromagnetic adsorption device is arranged in the lower circular through hole.

Preferably, the number of the upper needle rows is at least five, and two ends of the plurality of upper needle rows are fixedly connected with the upper needle plate support respectively.

Preferably, the number of the lower needle rows is at least five, and two ends of the lower needle rows are fixedly connected with the lower needle plate support respectively.

Preferably, the plurality of upper needle rows and the plurality of lower needle rows are arranged in a one-to-one correspondence manner.

The utility model has the advantages that: can be according to the distance of actual test demand adjustment probe card when carrying out the test of the shingling subassembly of different models, open electromagnetism adsorption equipment alright with last faller gill support and lower faller gill support respectively and fix on upper ledge and lower frame when the position adjustment of probe card is to test position, conveniently carry out the shingling subassembly test, when carrying out the position adjustment of probe card, only need to close electromagnetism adsorption equipment and can make the probe card remove along T shape spout, through the very big improvement test unit's of this structural design compatibility, can test the shingling subassembly of different models, the testing cost is reduced.

Drawings

Fig. 1 is a schematic perspective view of the present invention;

fig. 2 is a left side view of the present invention;

fig. 3 is a schematic perspective view of an upper and lower test unit according to the present invention;

FIG. 4 is a schematic perspective view of the lower and middle test units of the present invention;

FIG. 5 is a schematic perspective view of the middle-upper needle row support of the present invention;

fig. 6 is a schematic view of the three-dimensional structure of the middle and lower needle row support of the present invention.

The reference numbers in the figures are:

1. putting the frame on; 101. an upper T-shaped chute; 2. an upper needle row bracket; 201. an upper T-shaped sliding block; 202. an upper circular through hole; 3. arranging needles; 4. an upper probe; 5. a lower frame; 501. a lower T-shaped chute; 6. arranging needles; 7. a lower probe; 8. a lower needle row bracket; 801. a lower T-shaped slider; 802. a lower circular through hole; 9. an electromagnetic adsorption device.

Detailed Description

The following description is presented to disclose the invention so as to enable any person skilled in the art to practice the invention. The preferred embodiments in the following description are given by way of example only, and other obvious variations will occur to those skilled in the art.

Referring to fig. 1-5, the multi-pin row test unit of the tile stack assembly comprises an upper test unit and a lower test unit, wherein the upper test unit comprises an upper frame 1, an upper pin row support 2 is connected to the upper frame 1 in a sliding manner, an upper pin row 3 is fixedly connected to the upper pin row support 2, an upper probe 4 is arranged on the upper pin row 3, an upper T-shaped chute 101 is formed in the upper frame 1, an upper T-shaped slider 201 is fixedly connected to the lower end of the upper pin row support 2, the upper pin row support 2 is connected to the upper frame 1 in a sliding manner through the upper T-shaped slider 201, an upper circular through hole 202 is formed in the upper pin row support 2, an electromagnetic adsorption device 9 is arranged in the upper circular through hole 202, five upper pin rows 3 are provided, and two ends of the five upper pin rows 3 are respectively and fixedly connected to the upper pin row support 2;

the lower test unit comprises a lower frame 5, a lower pin row support 8 is connected on the lower frame 5 in a sliding manner, a lower pin row 6 is fixedly connected on the lower pin row support 8, a lower probe 7 is fixedly connected on the lower pin row 6, a lower T-shaped sliding groove 501 is formed in the lower frame 5, a lower T-shaped sliding block 801 is fixedly connected at the lower end of the lower pin row support 8, the lower pin row support 8 is connected with the lower frame 5 in a sliding manner through the lower T-shaped sliding block 801, a lower circular through hole 802 is formed in the lower pin row support 8, an electromagnetic adsorption device 9 is arranged in the lower circular through hole 802, five lower pin rows 6 are provided, two ends of the five lower pin rows 6 are respectively and fixedly connected with the lower pin row support 8, five upper pin rows 3 are arranged in one-to-one correspondence with the five lower pin rows 6, so that the upper probe 4 can be contacted and conducted with a positive electrode of a tile-stacked battery piece when the test is carried out, the lower probe 7 can be contacted and conducted with a negative electrode of the tile-stacked battery piece, when the test unit is used for testing the tile-stacked battery piece, can be according to the distance of actual test demand adjustment probe card, open electromagnetism adsorption equipment 9 when probe card's position adjustment to test position alright with last needle row support 2 and lower needle row support 8 fix respectively on last frame 1 and lower frame 5, conveniently carry out the test of stack tile subassembly, when carrying out probe card's position adjustment, only need close electromagnetism adsorption equipment 9 and can make the probe card remove along T shape spout, the use is simple, and is convenient.

To sum up the utility model has the advantages that: the upper probe board and the lower probe board can be moved along the upper frame and the lower frame through the structure, the compatibility of the testing unit is improved, the testing cost of the laminated cell is reduced, and the testing unit is simple in structure and easy to manufacture and assemble.

The foregoing shows and describes the general principles, essential features, and advantages of the invention. It will be understood by those skilled in the art that the present invention is not limited to the above embodiments, and that the principles of the present invention may be applied to any other embodiment without departing from the spirit and scope of the present invention. The scope of the invention is defined by the appended claims and equivalents thereof.

Claims

1. The multi-pin row test unit of the tile stacking assembly is characterized by comprising an upper test unit and a lower test unit, wherein the upper test unit comprises an upper frame (1), an upper pin row support (2) is connected onto the upper frame (1) in a sliding manner, an upper pin row (3) is fixedly connected onto the upper pin row support (2), and an upper probe (4) is arranged on the upper pin row (3);

the lower test unit comprises a lower frame (5), a lower needle row support (8) is connected to the lower frame (5) in a sliding mode, a lower needle row (6) is fixedly connected to the lower needle row support (8), and a lower probe (7) is arranged on the lower needle row (6).

2. The multi-pin row test unit of a tile stack assembly according to claim 1, wherein the upper frame (1) is provided with an upper T-shaped chute (101), and the lower frame (5) is provided with a lower T-shaped chute (501).

3. The multi-pin row test unit of the tile stack assembly according to claim 1, wherein an upper T-shaped slider (201) is fixedly connected to the lower end of the upper pin row support (2), the upper pin row support (2) is slidably connected with the upper frame (1) through the upper T-shaped slider (201), an upper circular through hole (202) is formed in the upper pin row support (2), and an electromagnetic adsorption device (9) is arranged in the upper circular through hole (202).

4. The multi-pin row test unit of the tile stack assembly according to claim 1, wherein a lower T-shaped sliding block (801) is fixedly connected to a lower end of the lower pin row support (8), the lower pin row support (8) is slidably connected with a lower frame (5) through the lower T-shaped sliding block (801), a lower circular through hole (802) is formed in the lower pin row support (8), and an electromagnetic adsorption device (9) is arranged in the lower circular through hole (802).

5. The multi-pin row test unit of a tile stack assembly according to claim 1, wherein there are at least five upper pin rows (3), and two ends of the upper pin rows (3) are respectively fixedly connected with the upper pin row support (2).

6. The multi-pin row test unit of a tile stack assembly according to claim 1, wherein the number of the lower pin rows (6) is at least five, and both ends of the plurality of lower pin rows (6) are respectively fixedly connected with the lower pin row bracket (8).

7. The multi-pin row test unit of a stack assembly according to claim 1, wherein a plurality of said upper pin rows (3) are arranged in a one-to-one correspondence with a plurality of said lower pin rows (6).