CN215120733U - Novel multi-pin-row EL test unit for tile stacking assembly - Google Patents

Abstract

The utility model discloses a novel many fallers EL test element for imbrication subassembly relates to the photovoltaic equipment field, including test assembly and lower base, test assembly includes fixed column and sliding connection piece, the spud pile surface has single probe row and double probe row through sliding connection piece sliding connection, be provided with the probe on single probe row and the double probe row, the lower base includes the lower carriage, lower carriage both ends fixedly connected with side backup pad, lower carriage middle part fixedly connected with middle part backup pad, the utility model has the advantages of: make test unit to encircle sandan 158.75 shingle assembly test pattern definition improvement through special pin header design, increased test stability, make test unit have good compatibility simultaneously through structural design.

Description

Novel multi-pin-row EL test unit for tile stacking assembly

Technical Field

The utility model relates to a photovoltaic equipment field specifically is a relate to a novel many fallers EL test element for shingle assembly.

Background

Photovoltaic (photo): the Solar photovoltaic power generation system is a novel power generation system which directly converts Solar radiation energy into electric energy by utilizing the photovoltaic effect of a Solar cell semiconductor material and has two modes of independent operation and grid-connected operation. Meanwhile, solar photovoltaic power generation systems are classified, and one is centralized, such as a large northwest ground photovoltaic power generation system; one is distributed (with >6MW as boundary), such as factory building roof photovoltaic power generation system of industry and commerce, resident house roof photovoltaic power generation system. Photovoltaic technology has many advantages: such as without any mechanical moving parts; except sunshine, the solar energy collector can work under the conditions of direct sunlight and oblique sunlight without any other 'fuel'; and the selection of the station site is very convenient and flexible, and the roof and the open space in the city can be applied. Since 1958, the solar photovoltaic effect was first applied in the form of solar cells in the field of energy supply for space satellites. Nowadays, as little as energy supply and roof solar panels of automatic parking meters are applied to solar power generation centers with wide areas, and the solar power generation centers are applied to the field of power generation all over the world.

Among these, the photovoltaic panel assembly is a power generation device that generates direct current upon exposure to sunlight, and is composed of thin solid photovoltaic cells made almost entirely of semiconductor material (e.g., silicon). Because there are no moving parts, it can be operated for a long time without causing any loss. Simple photovoltaic cells can provide energy for watches and calculators, and more complex photovoltaic systems can provide lighting for houses and power for the grid. The photovoltaic panel assembly can be made in different shapes and the assembly can be connected to generate more electricity. Both rooftops and building surfaces utilize photovoltaic panels, even as part of a window, skylight, or shelter, which are commonly referred to as building-attached photovoltaic systems.

At present, a common photovoltaic module testing device is not high in detection stability generally for improving compatibility, the quality definition of a detected image is low, a specific detecting device can only detect a single module, and at present, no high-compatibility multi-pin-row EL testing unit for Sancheng 158.75 Peidel photovoltaic modules exists.

SUMMERY OF THE UTILITY MODEL

In order to solve the technical problem, the technical scheme solves the problems that the existing common photovoltaic module testing device provided in the background technology is not high in stability of common detection for improving compatibility, the quality definition of a detected graph is low, a specific detection device can only detect a single module, and the existing high-compatibility multi-pin-row EL testing unit for the Sanchen 158.75 Peider photovoltaic module does not exist.

In order to achieve the above purpose, the utility model adopts the technical scheme that:

a novel multi-probe-row EL test unit for a tile-stacking assembly comprises a test assembly and a lower base, wherein the test assembly comprises a fixed column and a sliding connection block, the surface of the fixed column is connected with a single-row probe row and a double-row probe row in a sliding manner through the sliding connection block, and probes are arranged on the single-row probe row and the double-row probe row;

the lower base comprises a lower support, side support plates are fixedly connected to two ends of the lower support, and a middle support plate is fixedly connected to the middle of the lower support.

Preferably, the number of the fixed columns is two, the number of the sliding connection blocks is eight, and four sliding connection blocks are respectively connected to the two fixed columns in a sliding mode.

Preferably, two ends of the double-row probe row are respectively and fixedly connected with the sliding connection block, and the number of the double-row probe row is two, and the two double-row probe rows are arranged in the middle of the fixing column.

Preferably, two ends of the single-row probe row are respectively and fixedly connected with the sliding connection block, and two single-row probe rows are arranged at two ends of the fixed column.

Preferably, the top of the sliding connection block is provided with a positioning threaded hole, the middle of the side surface of the sliding connection block is provided with a sliding through hole, and the bottom of the side surface of the sliding connection block is provided with a connecting through hole.

Preferably, a row of probes are uniformly distributed on the single-row probe row, and the setting gap of the probes on the single-row probe row is 3.1 mm.

Preferably, the probes distributed on the double-row probe row are two rows, two probes on the double-row probe row are in one group, and the gap between every two probes on the double-row probe row is 3.1 mm.

Preferably, the front end of the fixing column is fixedly connected with an installation block, and the installation block is provided with an installation threaded hole.

The utility model has the advantages that: through special faller gill design, will originally go up faller gill and encrypt faller gill and change into cheng 158.75 shin graphics in a shingle counter point faller gill, thereby increase the battery piece area of contact and improve EL test image definition, improve test graphics definition, increase test stability, go up faller gill both ends simultaneously and pass through sliding connection piece and fixed column sliding connection, interval around can the movable adjustment, positioning screw hole on the accessible sliding connection piece fixes last faller gill on the fixed column after the position adjustment is accomplished, the lower base is a copper whole and need not the adjustment, the test demand adjustment interval according to different products is conveniently realized, compatibility is higher.

Drawings

Fig. 1 is a schematic perspective view of the present invention;

fig. 2 is a schematic diagram of the probe distribution of the double row probe row in the present invention;

FIG. 3 is a schematic diagram of the distribution of probes in a single row of probe rows according to the present invention;

fig. 4 is a schematic perspective view of the middle and lower support frames of the present invention;

fig. 5 is a schematic perspective view of the sliding connection block of the present invention.

The reference numbers in the figures are:

1. fixing a column; 101. mounting blocks; 102. installing a threaded hole; 2. a sliding connection block; 201. positioning the threaded hole; 202. a slide through hole; 203. a connecting through hole; 3. a single row of probe rows; 4. double rows of probe lines; 5. a probe; 6. a lower bracket; 7. side support plates; 8. and a middle support plate.

Detailed Description

The following description is presented to disclose the invention so as to enable any person skilled in the art to practice the invention. The preferred embodiments in the following description are given by way of example only, and other obvious variations will occur to those skilled in the art.

Referring to fig. 1-5, a novel multi-row EL test unit for a tile stack assembly comprises a test assembly and a lower base, the test assembly comprises a fixed column 1 and a sliding connection block 2, the surface of the fixed column 1 is connected with a single row of probe rows 3 and a double row of probe rows 4 in a sliding manner through the sliding connection block 2, the front end of the fixed column 1 is fixedly connected with a mounting block 101, the mounting block 101 is provided with a mounting threaded hole 102, the fixed column 1 mounts the test assembly on a test device through the mounting block 101, the top of the sliding connection block 2 is provided with a positioning threaded hole 201, the middle part of the side surface of the sliding connection block 2 is provided with a sliding through hole 202, the bottom of the side surface of the sliding connection block 2 is provided with a connecting through hole 203, the single row of probe rows 3 and the double row of probe rows 4 are provided with probes 5, the single row of probe rows 3 are uniformly distributed with one row of probes 5, a gap between the probes 5 on the single row of probe rows 3 is 3, the gap is 3.1mm, two rows of probes 5 are distributed on the double-row probe row 4, two probes 5 on the double-row probe row 4 form a group, the gap between every two groups of probes 5 on the double-row probe row 4 is 3.1mm, through a special pin header design, an original upper pin header encryption pin header is changed into a ring Cheng 158.75 shingled pattern pin header, the contact area of a battery piece is increased, the definition of an EL test image is improved, the definition of the test image is improved, and the test stability is improved, two fixed pins 1 are provided, eight sliding connection blocks 2 are provided, four sliding connection blocks 2 are respectively connected on the two fixed pins 1 in a sliding manner, two double rows of probe pins 4 are provided, the two double rows of probe pins 4 are respectively and fixedly connected with the two sliding connection blocks 2 arranged in the middle of the fixed pins 1, two single rows of probe pins 3 are provided, and the two single rows of probe pins 3 are respectively and fixedly connected with the two sliding connection blocks 2 arranged at the two ends of the fixed pins 1;

lower base includes lower carriage 6, 6 both ends fixedly connected with side backup pads 7 of lower carriage, 6 middle part fixedly connected with middle part backup pad 8 of lower carriage, go up needle bar both ends and pass through sliding connection piece 2 and fixed column 1 sliding connection, interval around can the activity adjustment, location screw hole 201 on accessible sliding connection piece 2 fixes last needle bar on fixed column 1 after the position adjustment is accomplished, lower base is that a copper is whole to need not the adjustment, the test demand adjustment interval according to different products is convenient, compatibility is higher.

To sum up the utility model has the advantages that: make test unit to encircle sandan 158.75 shingle assembly test pattern definition improvement through special pin header design, increased test stability, make test unit have good compatibility simultaneously through structural design.

The foregoing shows and describes the general principles, essential features, and advantages of the invention. It will be understood by those skilled in the art that the present invention is not limited to the above embodiments, and that the principles of the present invention may be applied to any other embodiment without departing from the spirit and scope of the present invention. The scope of the invention is defined by the appended claims and equivalents thereof.

Claims (8)

1. A novel multi-row-of-needles EL test unit for a tile stack assembly is characterized by comprising a test assembly and a lower base, wherein the test assembly comprises a fixed column (1) and a sliding connection block (2), the surface of the fixed column (1) is connected with a single-row probe row (3) and a double-row probe row (4) in a sliding mode through the sliding connection block (2), and probes (5) are arranged on the single-row probe row (3) and the double-row probe row (4);

the lower base comprises a lower support (6), two ends of the lower support (6) are fixedly connected with side support plates (7), and the middle of the lower support (6) is fixedly connected with a middle support plate (8).

2. The novel multi-pin-row EL test unit for a tile stack assembly according to claim 1, wherein there are two fixed pins (1), eight sliding connection blocks (2), and four sliding connection blocks (2) are slidably connected to the two fixed pins (1).

3. The novel multi-row EL test unit for the shingle assembly according to claim 1, wherein two of the double rows of probes (4) are fixedly connected to the sliding connection block (2) at two ends, and two of the double rows of probes (4) are arranged in the middle of the fixed column (1).

4. The novel multi-pin-row EL test unit for a shingle assembly according to claim 1, wherein two single-pin-row probe rows (3) are fixedly connected to the sliding connection block (2) at both ends, and two single-pin-row probe rows (3) are disposed at both ends of the fixed column (1).

5. The novel multi-pin-row EL test unit for the tile stack assembly according to claim 1, wherein a positioning threaded hole (201) is formed in the top of the sliding connection block (2), a sliding through hole (202) is formed in the middle of the side surface of the sliding connection block (2), the sliding connection block is slidably connected with the fixed column (1) through the sliding through hole (202), and a connecting through hole (203) is formed in the bottom of the side surface of the sliding connection block (2).

6. The new multi-row EL test unit for a shingle assembly according to claim 1, wherein the probes (5) uniformly distributed on the single row of probe rows (3) are arranged in a row, and the set gap between the probes (5) on the single row of probe rows (3) is 3.1 mm.

7. The novel EL test unit with multiple rows of probes for the shingle assembly according to claim 1, wherein the probes (5) distributed on the double row of probes (4) are arranged in two rows, two probes (5) on the double row of probes (4) are in one group, and the setting gap between the probes (5) on each group on the double row of probes (4) is 3.1 mm.

8. The novel multi-pin-row EL test unit for the tile stack assembly according to claim 1, wherein a mounting block (101) is fixedly connected to the front end of the fixing column (1), and a mounting threaded hole (102) is formed in the mounting block (101).

Images