CN214472847U

CN214472847U - IC substrate appearance detector

Info

Publication number: CN214472847U
Application number: CN202022604449.2U
Authority: CN
Inventors: 付满仓; 沈乐
Original assignee: Suzhou Xinlisheng Electronics Co ltd
Current assignee: Suzhou Xinlisheng Electronics Co ltd
Priority date: 2020-11-12
Filing date: 2020-11-12
Publication date: 2021-10-22
Anticipated expiration: 2030-11-12

Abstract

The utility model relates to an outward appearance detects quick-witted technical field, discloses a IC substrate outward appearance detects machine, include: a first table body, wherein the appearance of the IC substrate is detected on the top of the first table body; the camera comprises a first camera and a second camera, wherein belt conveyors are fixedly arranged on the inner walls of two ends of a first table body, a bottom plate is movably arranged on the top ends of the transmission belts of the belt conveyors, the first camera is fixedly arranged on the top end of the bottom plate, and a second table body is fixedly arranged at one end of the first table body. The utility model discloses a set up first echelette and second echelette, realized fixing a position the effect of shooting to the IC substrate, it is effectual to shoot, through setting up computer case and touch display screen, staff's accessible image contrast software is with the positive and negative two-sided image rapid analysis of the IC substrate of first camera and second camera shooting, does benefit to the quality problems of quick identification IC substrate outward appearance, has avoided artifical visual detection, has improved the detection efficiency to IC substrate outward appearance.

Description

IC substrate appearance detector

Technical Field

The utility model relates to an outward appearance detects quick-witted technical field, in particular to IC substrate outward appearance detects machine.

Background

The traditional IC package uses a lead frame as a carrier for conducting circuits and supporting ICs (integrated circuit), leads are connected to two sides or the periphery of the lead frame, along with the development of IC technology, the number of the leads is increased, the wiring density is increased, the number of layers of substrates is increased, the traditional package form cannot meet the market requirement, in recent years, a novel IC package form represented by BGA (ball grid array) and CSP (chip scale package) is started, and a novel carrier IC package substrate for packaging semiconductor chips is generated;

the existing IC packaging substrate has the outstanding advantages that the electrical connection (transition) is provided between different circuits of a chip and a conventional printed circuit board (mostly a mainboard, a mother board and a back board), meanwhile, a channel for protecting, supporting and radiating is provided for the chip, the effect of meeting the standard mounting size is achieved, the multi-pin effect can be realized, the packaging product area is reduced, the electrical performance and the radiating performance are improved, the high density is realized, and the like;

the existing IC substrate is usually visually detected through manpower, time and labor are wasted, the working efficiency is not high, and the IC substrate with faults can not be rapidly separated.

SUMMERY OF THE UTILITY MODEL

The utility model aims to provide a main object of the utility model provides a IC substrate outward appearance detects machine can effectively solve current IC substrate and visualizes the detection through the manual work usually, wastes time and energy, and work efficiency is not high, the problem of the IC substrate of unable quickly separating the trouble.

In order to achieve the above purpose, the utility model adopts the following technical scheme:

an appearance inspection machine for an IC substrate, comprising: a first table body, wherein the appearance of the IC substrate is detected on the top of the first table body; first camera and second camera, the fixed belt feeder that is provided with of first table body both ends inner wall, the activity of driving belt top of belt feeder is provided with the bottom plate, first camera fixed mounting is on the top of bottom plate, first table body one end fixed mounting has the second table body, second table body top fixed mounting has the supporting body, supporting body bottom fixed mounting has the fixed plate, second camera fixed mounting is in the bottom of supporting body.

Preferably, the fixed belt feeder that is provided with of first table body both ends inner wall, fixed mounting has evenly distributed's stopper, two on the driving belt outer wall of belt feeder the interval of stopper equals with the length of bottom plate.

Preferably, the top end of the supporting body is fixedly provided with a computer case and a touch display screen, the edges of four corners of the top end of the bottom plate are fixedly provided with supporting legs, and the top ends of the supporting legs are fixedly provided with a frame body.

Preferably, a transparent glass plate is fixedly mounted on the inner wall of the frame body, the thickness of the transparent glass plate is half of that of the frame body, and the bottom end face of the transparent glass plate and the bottom end face of the frame body are located on the same plane.

Preferably, the frame top fixed mounting has the first infrared grating of symmetry, first infrared grating top fixed mounting has evenly distributed's transmitting terminal, fixed plate bottom fixed mounting has the connecting rod of symmetry, connecting rod bottom fixed mounting has the second infrared grating, second infrared grating bottom fixed mounting has evenly distributed's receiving terminal, transmitting terminal and receiving terminal looks adaptation.

Preferably, the bottom plate top is fixed and is seted up the recess of symmetry, recess bottom inner wall fixed mounting has the light, the light is in recess bottom inner wall evenly distributed, first table body other end fixed mounting has control panel.

Compared with the prior art, the utility model discloses following beneficial effect has:

1. according to the appearance detector for the IC substrate, the first infrared grating and the second infrared grating are arranged, the rapid control of the belt conveyor is realized by utilizing the grating principle, so that the bottom plate is rapidly stopped, the IC substrate can be conveniently positioned and shot, and the shooting effect is good;

2. according to the IC substrate appearance detector, due to the arrangement of the computer case and the touch display screen, workers can rapidly analyze images of the front side and the back side of the IC substrate shot by the first camera and the second camera through image comparison software, so that the quality problem of the appearance of the IC substrate can be rapidly identified, manual visual detection is avoided, and the detection efficiency of the appearance of the IC substrate is improved;

3. this IC base plate outward appearance detects machine through setting up framework and transparent glass board, does benefit to the spacing effect of treating the IC base plate that carries out the outward appearance and detect, has effectively avoided the IC base plate to drop along with the conveyer motion of belt feeder, through setting up the light, has realized the illuminating effect to the IC base plate bottom surface, has improved the shooting effect of first camera, does benefit to the work of discerning of system.

Drawings

Fig. 1 is a schematic view of the overall structure of the present invention.

Fig. 2 is a schematic front view of a second camera according to the present invention.

Fig. 3 is a schematic structural diagram of the first camera of the present invention.

In the figure: 1. a first table body; 2. a belt conveyor; 3. a second table body; 4. a carrier; 5. a computer case; 6. a touch display screen; 7. a limiting block; 8. a base plate; 9. supporting legs; 10. a frame body; 11. a first echelette; 12. a transmitting end; 13. a transparent glass plate; 14. a first camera; 15. a groove; 16. an illuminating lamp; 17. a control panel; 18. a fixing plate; 19. a second camera; 20. a connecting rod; 21. a second echelette; 22. and (4) receiving the data.

Detailed Description

In order to make the technical means, creation features, achievement purposes and functions of the present invention easy to understand, the present invention is further described below with reference to the following embodiments.

Referring to fig. 1-3, an appearance inspection machine for an IC substrate includes:

a first table 1 for performing appearance inspection of an IC substrate on the top of the first table 1;

first camera 14 and second camera 19, the fixed belt feeder 2 that is provided with in 1 both ends inner wall of the first table body, the activity of belt feeder 2's driving belt top is provided with bottom plate 8, first camera 14 fixed mounting is on the top of bottom plate 8, 1 one end fixed mounting of the first table body has the

second table body

3, 3 top fixed mounting of the second table body has supporting

body

4, 4 bottom fixed mounting of supporting body has fixed plate 18, second camera 19 fixed mounting is in the bottom of supporting body 4.

As shown in fig. 1, the belt conveyor 2 is fixedly arranged on the inner walls of the two ends of the first table body 1, the limiting blocks 7 which are uniformly distributed are fixedly arranged on the outer wall of the transmission belt of the belt conveyor 2, and the distance between the two limiting blocks 7 is equal to the length of the bottom plate 8.

By adopting the scheme, the effect of stable motion of the bottom plate 8 is realized, and basic stable motion of the IC is facilitated.

As shown in figure 1, the top end of the supporting body 4 is fixedly provided with a computer case 5 and a touch display screen 6, the edges of the four corners of the top end of the bottom plate 8 are fixedly provided with supporting legs 9, and the top ends of the supporting legs 9 are fixedly provided with a frame body 10.

By adopting the scheme, the rapid comparison and analysis of the pictures shot by the two cameras and the qualified product pictures by using the system of the computer case 5 are realized, and the basic appearance detection of the IC is rapid and convenient.

As shown in fig. 1 and 3, a transparent glass plate 13 is fixedly mounted on the inner wall of the frame 10, the thickness of the transparent glass plate 13 is half of the thickness of the frame 10, and the bottom end surface of the transparent glass plate 13 is coplanar with the bottom end surface of the frame 10.

By adopting the scheme, the limiting effect of the frame body 10 on the IC substrate is realized, and the stable movement of the IC substrate is facilitated.

As shown in fig. 1, 2 and 3, the top end of the frame 10 is fixedly provided with symmetrical first echelettes 11, the top end of the first echelettes 11 is fixedly provided with evenly distributed emitting ends 12, the bottom end of the fixing plate 18 is fixedly provided with symmetrical connecting rods 20, the bottom end of the connecting rods 20 is fixedly provided with second echelettes 21, the bottom end of the second echelettes 21 is fixedly provided with evenly distributed receiving ends 22, and the emitting ends 12 are matched with the receiving ends 22.

By adopting the scheme, the effect of rapidly positioning the bottom plate 8 by utilizing the two matched gratings is realized, rapid shooting of the top surface and the bottom surface of the IC substrate is facilitated, and the use is convenient.

As shown in fig. 1 and 3, the top end of the bottom plate 8 is fixedly provided with symmetrical grooves 15, the inner walls of the bottom ends of the grooves 15 are fixedly provided with illuminating lamps 16, the illuminating lamps 16 are uniformly distributed on the inner walls of the bottom ends of the grooves 15, and the other end of the first table body 1 is fixedly provided with a control panel 17.

By adopting the above scheme, the light supplement effect on the bottom end face of the IC substrate is realized by the arrangement of the illuminating lamp 16, and the shooting effect of the first camera 14 on the bottom end face of the IC substrate is improved.

It should be noted that, the utility model relates to an IC substrate appearance inspection machine, during the use, at first place bottom plate 8 on the top of the belt of belt feeder 2, make bottom plate 8 be located the inboard of two stopper 7, place the IC substrate of the outward appearance of waiting to detect on the top of clear glass board 13, start belt feeder 2 through control panel 17 and make the driving belt of belt feeder 2 rotate, and then drive bottom plate 8 slowly move to the right, belt feeder 2 stops moving when the transmitting terminal 12 of first infrared grating 11 and the receiving terminal 22 of second infrared grating 21 are located the coplanar, open first camera 14 and second camera 19 at this moment and shoot two faces of top surface and bottom surface of IC substrate, open one or more light 16 and illuminate the bottom end face of IC substrate when necessary, first camera 14 and second camera 19 transmit the image to touch display 6 through computer case 5, the pictures shot by the two cameras are compared with the appearance pictures of the qualified IC substrate manually by starting image comparison software on the touch display screen 6, the system of the computer case 5 can quickly draw a conclusion to be displayed on the touch display screen 6, a worker can quickly identify whether the IC substrate is qualified or not to quickly screen the IC substrate, and the belt conveyor 2 is started to transmit the qualified IC substrate to the next process.

The basic principles and the main features of the invention and the advantages of the invention have been shown and described above. It will be understood by those skilled in the art that the present invention is not limited to the above embodiments, and that the foregoing embodiments and descriptions are provided only to illustrate the principles of the present invention without departing from the spirit and scope of the present invention. The scope of the invention is defined by the appended claims and equivalents thereof.

Claims

1. An appearance inspection machine for an IC substrate, comprising:

a first table body (1) for performing appearance detection on an IC substrate on the top of the first table body (1);

first camera (14) and second camera (19), the fixed belt feeder (2) that is provided with of first table body (1) both ends inner wall, the activity of driving belt top of belt feeder (2) is provided with bottom plate (8), first camera (14) fixed mounting is on the top of bottom plate (8), first table body (1) one end fixed mounting has the second table body (3), second table body (3) top fixed mounting has supporting body (4), supporting body (4) bottom fixed mounting has fixed plate (18), second camera (19) fixed mounting is in the bottom of supporting body (4).

2. The IC substrate appearance inspection machine of claim 1, wherein: fixed mounting has evenly distributed's stopper (7), two on the driving belt outer wall of belt feeder (2) the interval of stopper (7) equals with the length of bottom plate (8).

3. The IC substrate appearance inspection machine of claim 1, wherein: supporting body (4) top fixed mounting has computer machine case (5) and touch display screen (6), bottom plate (8) top four corners edge fixed mounting has supporting leg (9), supporting leg (9) top fixed mounting has framework (10).

4. The appearance inspection machine for IC substrates according to claim 3, wherein: the inner wall of the frame body (10) is fixedly provided with a transparent glass plate (13), the thickness of the transparent glass plate (13) is one half of that of the frame body (10), and the bottom end face of the transparent glass plate (13) and the bottom end face of the frame body (10) are in the same plane.

5. The appearance inspection machine for IC substrates according to claim 3, wherein: framework (10) top fixed mounting has first infrared grating (11) of symmetry, first infrared grating (11) top fixed mounting has evenly distributed's transmitting terminal (12), fixed plate (18) bottom fixed mounting has connecting rod (20) of symmetry, connecting rod (20) bottom fixed mounting has second infrared grating (21), second infrared grating (21) bottom fixed mounting has evenly distributed's receiving terminal (22), transmitting terminal (12) and receiving terminal (22) looks adaptation.

6. The IC substrate appearance inspection machine of claim 1, wherein: bottom plate (8) top is fixed and is seted up recess (15) of symmetry, recess (15) bottom inner wall fixed mounting has light (16), light (16) in recess (15) bottom inner wall evenly distributed, first table body (1) other end fixed mounting has control panel (17).