CN214471675U - Laser instrument low temperature testing arrangement - Google Patents
Laser instrument low temperature testing arrangement Download PDFInfo
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- CN214471675U CN214471675U CN202120727898.8U CN202120727898U CN214471675U CN 214471675 U CN214471675 U CN 214471675U CN 202120727898 U CN202120727898 U CN 202120727898U CN 214471675 U CN214471675 U CN 214471675U
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Abstract
The utility model provides a laser instrument low temperature testing arrangement, include: the laser device comprises a cavity, a laser device and a laser device, wherein the laser device is suitable for being placed in the cavity; the supporting cylinder is communicated with the cavity and provided with a first port and a second port which are opposite, and the first port is fixed with the side wall of the cavity; the light absorption component covers the second port and is fixedly connected with the edge of the second port; the light emitted by the laser during the burn-in test is adapted to be directed through the first port to the light absorbing component. The reliability of the laser low-temperature testing device is improved.
Description
Technical Field
The utility model relates to a laser instrument technical field, concretely relates to laser instrument low temperature testing arrangement.
Background
The performance parameter test of the laser is an important basis for judging the quality of the laser, and the test temperature of the laser is reduced, so that the physical limitation of the laser is broken, and the key performance indexes such as output power, electro-optic conversion efficiency and the like are improved. Researchers in the field of semiconductor lasers generally adopt inert gases such as liquid nitrogen or liquid helium as a primary cold source, a PID circuit controls the temperature, and the temperature of a laser to be tested is controlled at a required test temperature, so that low-temperature test of the laser is realized.
Common tests for lasers include low temperature burn-in tests. The low-temperature aging test takes a long time, and the light emitted by the laser generates more heat energy when continuously irradiating the planar lens on the side wall of the cavity, so that the planar lens on the side wall of the cavity is burnt, and the reliability of the low-temperature test device of the laser is poor.
SUMMERY OF THE UTILITY MODEL
Therefore, the to-be-solved technical problem of the utility model lies in overcoming the relatively poor problem of laser instrument low temperature test device reliability among the prior art to a laser instrument low temperature test device is provided.
The utility model provides a laser instrument low temperature testing arrangement, include: the laser device comprises a cavity, a laser device and a laser device, wherein the laser device is suitable for being placed in the cavity; the supporting cylinder is communicated with the cavity and provided with a first port and a second port which are opposite, and the first port is fixed with the side wall of the cavity; the light absorption component covers the second port and is fixedly connected with the edge of the second port; the light emitted by the laser during the burn-in test is adapted to be directed through the first port to the light absorbing component.
Optionally, the light absorbing assembly includes a light absorbing disc and a cooling element, the light absorbing disc covers the second port and is fixed to an edge of the second port, and the cooling element is disposed on a surface of the light absorbing disc, which faces away from the cavity.
Optionally, a plurality of grooves are formed in the surface of one side, facing the cavity, of the light absorption plate.
Optionally, the longitudinal cross-sectional shape of the groove comprises a triangle.
Optionally, the light absorbing plate comprises an aluminum light absorbing plate.
Optionally, the cooling member is a cooling pipe, and the cooling pipe is suitable for introducing cooling liquid.
Optionally, the cavity is a glove box, and a glove for operating and replacing the laser to be tested is arranged on the side of the cavity.
Optionally, the method further includes: the transfer bin is arranged on the side part of the cavity and is used for transmitting the laser into the cavity; a first valve disposed between the transfer chamber and the cavity; a second valve disposed on the transfer chamber for isolating the transfer chamber from the atmosphere; the air extraction device is connected with the transfer bin; the inflating device is connected with the transfer bin; and the vacuum detection device is positioned in the transfer bin.
Optionally, the method further includes: a refrigeration clamp positioned within the cavity, the refrigeration clamp adapted to secure the laser; the refrigerant flow channel is arranged in the refrigeration clamp and provided with a liquid inlet and a liquid outlet; the refrigerating device is used for providing a refrigerant for the refrigerating clamp, one end of the refrigerating device is communicated with the liquid inlet through a first pipeline, and the other end of the refrigerating device is communicated with the liquid outlet through a second pipeline.
Optionally, an opening is further formed in the side wall of the cavity, and a planar coated lens is embedded in the opening.
The technical scheme of the utility model following beneficial effect has:
1. the utility model discloses technical scheme provides a laser instrument low temperature test device, include: the laser device comprises a cavity, a laser device and a laser device, wherein the laser device is suitable for being placed in the cavity; the supporting cylinder is communicated with the cavity and provided with a first port and a second port which are opposite, and the first port is fixed with the side wall of the cavity; the light absorption component covers the second port and is fixedly connected with the edge of the second port; since the light emitted by the laser during the aging test is suitable for being emitted to the light absorption component through the first port, the light absorption component absorbs the laser and converts the laser into heat to be emitted. The supporting cylinder is positioned between the light absorption assembly and the cavity, so that even if the aging test time of the laser is long, the laser can be prevented from irradiating the side wall of the cavity to burn parts of the side wall of the cavity, and the reliability of the low-temperature test device of the laser is improved.
2. Further, the light absorbing component comprises a light absorbing disc and a cooling piece. The cooling piece takes away heat generated by laser absorbed by the light absorption disc, and heat is prevented from being accumulated on the light absorption disc.
3. Furthermore, a plurality of grooves are formed in the surface of one side, facing the cavity, of the light absorption disc. The laser light is confined in the grooves where it is absorbed by the light-absorbing plate through multiple reflections.
4. Further, when the laser irradiates the light absorption disc, the laser is refracted to different directions by the grooves with the triangular longitudinal section shapes, so that the light absorption disc can better absorb heat.
4. Further, the light absorbing plate comprises an aluminum light absorbing plate. The aluminum light absorption plate has the characteristics of low cost and good heat conduction.
5. Further, the cavity is a glove box. Can change through gloves when changing the laser instrument that awaits measuring, need not to open the cavity and lead to condensation phenomenon and the evacuation problem repeatedly, improve the efficiency of laser instrument test.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the embodiments or the technical solutions in the prior art will be briefly described below, and it is obvious that the drawings in the following description are some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to these drawings without creative efforts.
Fig. 1 is a schematic structural diagram of a low-temperature testing apparatus for a laser according to an embodiment of the present invention;
fig. 2 is a schematic structural diagram of a light absorbing assembly according to an embodiment of the present invention.
Detailed Description
The technical solution of the present invention will be described clearly and completely with reference to the accompanying drawings, and obviously, the described embodiments are some, but not all embodiments of the present invention. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.
In the description of the present invention, it should be noted that the terms "center", "upper", "lower", "left", "right", "vertical", "horizontal", "inner", "outer", and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, and are only for convenience of description and simplification of description, but do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and thus, should not be construed as limiting the present invention. Furthermore, the terms "first," "second," and "third" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance.
In the description of the present invention, it is to be noted that, unless otherwise explicitly specified or limited, the terms "mounted," "connected," and "connected" are to be construed broadly, and may be, for example, fixedly connected, detachably connected, or integrally connected; can be mechanically or electrically connected; the two elements may be directly connected or indirectly connected through an intermediate medium, or may be communicated with each other inside the two elements, or may be wirelessly connected or wired connected. The specific meaning of the above terms in the present invention can be understood in specific cases to those skilled in the art.
Furthermore, the technical features mentioned in the different embodiments of the invention described below can be combined with each other as long as they do not conflict with each other.
The present embodiment provides a low temperature testing apparatus for a laser, please refer to fig. 1 and fig. 2 in combination, which includes: the laser device comprises a cavity 1, wherein a laser device is suitable to be placed in the cavity 1; a support cylinder 2 communicated with the cavity 1, wherein the support cylinder 2 is provided with a first port 201 and a second port 202 which are opposite, and the first port 201 is fixed with the side wall of the cavity 1; a light absorbing member 3 covering the second port 202 and fixedly connected to an edge of the second port 202; the light emitted by the laser during the burn-in test is adapted to be directed to the light absorbing element 3 through the first port 201.
In this embodiment, the cavity 1 is a glove box, and a glove for operating and replacing the laser to be tested is disposed on a side of the cavity 1.
Can change through gloves when changing the laser instrument that awaits measuring, avoid opening cavity 1 and lead to condensation phenomenon and the evacuation problem repeatedly, improve the efficiency of laser instrument test.
The support cylinder 2 comprises a stainless steel support cylinder.
The distance between the first port 201 and the second port 202 of the support cylinder 2 is 250 mm to 350 mm, for example, 250 mm, 280 mm, 300 mm, 330 mm or 350 mm. If the distance between the first port 201 and the second port 202 is too long, the laser low-temperature testing device occupies a large space and wastes materials for manufacturing the support cylinder 2; if the distance between the first port 201 and the second port 202 is too short, heat on the light absorbing member 3 is easily transferred to the chamber 1.
The light emitted by the laser in the aging test process is suitable for being emitted to the light absorption component 3 through the first port, and the light absorption component 3 absorbs the laser and converts the laser into heat to be emitted. And the supporting cylinder 2 is positioned between the light absorption component 3 and the cavity 1, so that even if the aging test time of the laser is long, the laser can be prevented from irradiating the side wall of the cavity to burn parts on the side wall of the cavity 1, and the reliability of the low-temperature test device of the laser is improved.
The first port 201 is connected with the side wall of the cavity 1 in a sealing way. The second port 202 is sealingly connected to the light absorbing element 3.
Referring to fig. 2, fig. 2 is a schematic structural diagram of a light absorbing element according to an embodiment of the present invention, and it should be noted that, in order to better illustrate the light absorbing element 3, fig. 2 is a schematic sectional diagram of the light absorbing element 3, and actually, the light absorbing element 3 itself is a complete structure. The light absorbing component 3 comprises a light absorbing disc 302 and a cooling piece 301, the light absorbing disc 302 covers the second port 202 and is fixed with the edge of the second port 202, and the cooling piece 301 is arranged on the surface of one side, back to the cavity 1, of the light absorbing disc 302.
The blotting cup 302 comprises an aluminum blotting cup.
The aluminum light absorption plate has the characteristics of low cost and good heat conduction.
With continued reference to fig. 2, a plurality of grooves 303 are formed on a side surface of the optical absorption disc 302 facing the cavity 1. The laser light is confined in the groove 303 and is absorbed by the light absorbing plate 302 via multiple reflections in the groove 303.
With continued reference to fig. 2, the grooves 303 are distributed in a ring shape on the surface of the light-absorbing plate 302 facing the cavity 1. The plurality of annular grooves 303 have the same center.
The longitudinal sectional shape of the groove 303 includes a triangle.
When the laser light is emitted to the optical pickup disc 302, the laser light is refracted in different directions by the grooves 303 with the triangular longitudinal cross-sectional shapes, so that the optical pickup disc 302 can better absorb heat.
With continued reference to fig. 2, the cooling element 301 is a cooling tube, and the cooling tube is suitable for introducing a cooling fluid therein. Preferably, the cooling pipe is shaped as a bent pipe having a plurality of bent portions, so that the effective length of the cooling pipe is increased and the cooling capacity is improved.
The cooling member 301 has a liquid inlet and a liquid outlet, and the cooling liquid enters the liquid inlet from the liquid supply device, flows through the cooling member 301, and flows out from the liquid outlet to take away heat on the light absorbing component 3.
With continued reference to fig. 1, the apparatus for low-temperature testing of a laser further includes: the transfer bin 4 is arranged on the side of the cavity 1, and the transfer bin 4 is used for transmitting the laser into the cavity 1.
The low temperature testing device of the laser further comprises: a first valve (not shown) disposed between the transfer chamber 4 and the chamber 1.
With continued reference to fig. 1, the apparatus for low-temperature testing of a laser further includes: a second valve 7, said second valve 7 being disposed on said transfer chamber 4 for isolating said transfer chamber 4 from the atmosphere.
With continued reference to fig. 1, the apparatus for low-temperature testing of a laser further includes: and the air extractor 5 is connected with the transfer bin 4.
The air extracting device 5 comprises a vacuum pump, and the air extracting device 5 is connected with the transfer bin 4 through a vacuum tube.
The low temperature testing device of the laser further comprises: and an inflating device (not shown in the figure) connected with the transfer bin 4.
The low temperature testing device of the laser further comprises: and a vacuum detection device (not shown in the figure) is positioned in the transfer chamber, and preferably, the vacuum detection device is positioned in a vacuum port at the joint of the vacuum tube and the transfer chamber 4.
The low temperature testing device of the laser further comprises: a refrigerated clamp (not shown) located inside the cavity 1, said refrigerated clamp being suitable for fixing the laser.
The low temperature testing device of the laser further comprises: and the refrigerant flow channel is arranged in the refrigeration clamp and is provided with a liquid inlet and a liquid outlet.
The low temperature testing device of the laser further comprises: the refrigerating device is used for providing a refrigerant for the refrigerating clamp, one end of the refrigerating device is communicated with the liquid inlet through a first pipeline, the other end of the refrigerating device is communicated with the liquid outlet through a second pipeline, the refrigerant enters the liquid inlet from the refrigerating device through the first pipeline, flows through the refrigerating clamp, flows through the inside of the laser on the refrigerating clamp, then flows out of the liquid outlet and enters the refrigerating device through the second pipeline, and the circulation is performed so as to take away heat generated by the laser.
With reference to fig. 1, an opening is further formed in the sidewall of the cavity 1, and a planar coated lens 6 is embedded in the opening.
The planar coated lens 6 comprises quartz glass coated with an antireflection film.
In the laser testing process, when the laser to be tested needs to be replaced, the refrigerant only needs to be stopped to be introduced into the refrigeration clamp, after the refrigerant in the refrigeration clamp is discharged, the tested laser is taken out through the gloves and placed on a tray (not shown in the figure) in the cavity 1, the laser to be tested placed on the tray is moved to the refrigeration clamp, the laser to be tested is fixed, and the refrigeration clamp is introduced with the refrigerant to refrigerate the laser to be tested to reach the testing temperature.
When needing to pass through transmission storehouse 4 from the outside transmission laser instrument that awaits measuring to cavity 1, close first valve after, open second valve 7, put into transmission storehouse 4 to the laser instrument that awaits measuring, close second valve 7, close after second valve 7, carry out the evacuation in to transmission storehouse 4 through air exhaust device 5, then open first valve, transmit the laser instrument that awaits measuring to cavity 1 in, close first valve again.
When the measured laser needs to be transmitted to the outside from the cavity 1 through the transmission bin 4, the first valve is opened, the measured laser is placed in the transmission bin 4, the first valve is closed, after the first valve is closed, the gas is filled and discharged into the transmission bin 4, then the second valve 7 is opened, and the measured laser is transmitted to the outside from the transmission bin 4.
It should be understood that the above examples are only for clarity of illustration and are not intended to limit the embodiments. Other variations and modifications will be apparent to persons skilled in the art in light of the above description. And are neither required nor exhaustive of all embodiments. And obvious variations or modifications therefrom are within the scope of the invention.
Claims (10)
1. A low temperature testing device for a laser, comprising:
the laser device comprises a cavity, a laser device and a laser device, wherein the laser device is suitable for being placed in the cavity;
the supporting cylinder is communicated with the cavity and provided with a first port and a second port which are opposite, and the first port is fixed with the side wall of the cavity;
the light absorption component covers the second port and is fixedly connected with the edge of the second port;
the light emitted by the laser during the burn-in test is adapted to be directed through the first port to the light absorbing component.
2. The low-temperature laser testing device according to claim 1, wherein the light absorbing assembly comprises a light absorbing disc and a cooling element, the light absorbing disc covers the second port and is fixed with an edge of the second port, and the cooling element is disposed on a surface of the light absorbing disc facing away from the cavity.
3. The low-temperature laser testing device according to claim 2, wherein a plurality of grooves are formed on a surface of the optical absorption disc facing the cavity.
4. The laser cryogenic test apparatus of claim 3 wherein a longitudinal cross-sectional shape of the groove comprises a triangle.
5. The laser cryogenic test apparatus of claim 2, wherein the optical getter disc comprises an aluminum optical getter disc.
6. The low-temperature laser testing device according to claim 2, wherein the cooling member is a cooling pipe adapted to be filled with a cooling liquid.
7. The low-temperature laser testing device according to claim 1, wherein the cavity is a glove box, and a glove box is arranged at the side part of the cavity and used for operating and replacing the laser to be tested.
8. The laser cryogenic test device of claim 1, further comprising:
the transfer bin is arranged on the side part of the cavity and is used for transmitting the laser into the cavity;
a first valve disposed between the transfer chamber and the cavity;
a second valve disposed on the transfer chamber for isolating the transfer chamber from the atmosphere;
the air extraction device is connected with the transfer bin;
the inflating device is connected with the transfer bin;
and the vacuum detection device is positioned in the transfer bin.
9. The laser cryogenic test device of claim 1, further comprising: a refrigeration clamp positioned within the cavity, the refrigeration clamp adapted to secure the laser;
the refrigerant flow channel is arranged in the refrigeration clamp and provided with a liquid inlet and a liquid outlet;
the refrigerating device is used for providing a refrigerant for the refrigerating clamp, one end of the refrigerating device is communicated with the liquid inlet through a first pipeline, and the other end of the refrigerating device is communicated with the liquid outlet through a second pipeline.
10. The low-temperature laser testing device as claimed in claim 1, wherein an opening is further formed in a side wall of the cavity, and a planar coated lens is embedded in the opening.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202120727898.8U CN214471675U (en) | 2021-04-09 | 2021-04-09 | Laser instrument low temperature testing arrangement |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202120727898.8U CN214471675U (en) | 2021-04-09 | 2021-04-09 | Laser instrument low temperature testing arrangement |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN214471675U true CN214471675U (en) | 2021-10-22 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202120727898.8U Active CN214471675U (en) | 2021-04-09 | 2021-04-09 | Laser instrument low temperature testing arrangement |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN214471675U (en) |
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2021
- 2021-04-09 CN CN202120727898.8U patent/CN214471675U/en active Active
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