CN213875928U

CN213875928U - High-precision test fixture

Info

Publication number: CN213875928U
Application number: CN202022847546.4U
Authority: CN
Inventors: 卢世雄
Original assignee: Shenzhen Bindebao Electronic Technology Co ltd
Current assignee: Shenzhen Bindebao Electronic Technology Co ltd
Priority date: 2020-12-01
Filing date: 2020-12-01
Publication date: 2021-08-03
Anticipated expiration: 2030-12-01

Abstract

The utility model discloses a high accuracy test fixture, including fixing base and ox horn seat, be equipped with many ox horn needles on the ox horn seat, be equipped with at least two sets of spring needles on the fixing base, every group spring needle includes probe, spring and test wire, spring one end and probe fixed connection, and the other end is connected with the test wire, and the same product test point of every group probe contact, the same ox horn needle of every group test wire connection. The utility model discloses a connect the electric conductive property of same product test point of two sets of spring pins test of same ox horn needle, on the one hand, set up the contact rate that two sets of spring pins can increase spring pin and test point, guarantee that the test of test point does not omit. On the other hand, if one spring pin fails, the test of the test point is not affected, and the spring pin of the test fixture can improve the test accuracy of the product test point.

Description

High-precision test fixture

Technical Field

The utility model relates to a test fixture technical field among the test equipment especially relates to a high accuracy test fixture.

Background

The purpose of arranging the test points on the circuit board is to test whether the components on the circuit board meet the specification and the welding performance, and the test points are used without directly contacting the parts and the welding pins thereof, so that the parts are protected from being damaged, and the reliability of the test is indirectly and greatly improved.

However, as the design of the circuit board is smaller and smaller, the layout of the test points is denser, when the circuit board is placed on the test fixture, each test point is tested corresponding to one spring pin, and the test point is easily misaligned with the spring pin to cause deviation in the test process, so that the test misjudgment is caused, more test time is consumed, and the production efficiency of the circuit board is lower.

The above disadvantages need to be improved.

Disclosure of Invention

In order to overcome the not enough of current technique, the utility model provides a high accuracy test fixture.

The utility model discloses technical scheme as follows:

the utility model provides a high accuracy test fixture, includes fixing base and ox horn seat, be equipped with many ox horn needles on the ox horn seat, its be equipped with at least two sets of spring needles on the fixing base, every group spring needle includes probe, spring and test wire, spring one end with probe fixed connection, the other end with the test wire is connected, every group the same product test point of probe contact, every group the test wire is connected same the ox horn needle.

According to the above scheme the utility model discloses, its characterized in that, be equipped with two sets of pogo pins on the fixing base.

According to the above scheme the utility model discloses, a serial communication port, the pogo pin includes probe, elastic profile and test wire, elastic profile includes spring portion and locates first connecting portion and the second connecting portion at spring portion both ends, first connecting portion fixed connection the probe, second connecting portion fixed connection the test wire.

According to above scheme the utility model discloses, a serial communication port, the pogo pin includes probe, spring and test wire, the top of spring is equipped with the through-hole that forms through the close circle winding of spring, the probe is fixed in the through-hole, the bottom of spring is connected with the test wire.

According to the above scheme the utility model discloses, a serial communication port, the fixing base includes the fixed plate of a plurality of parallels, is located the bottom the fixed plate pass through the connecting plate with the ox horn seat is connected, the ox horn seat is pegged graft with test equipment and is switched on.

According to the above scheme the utility model discloses, a serial communication port, the fixed plate is including syringe needle fixed plate, needle tubing fixed plate, spring fixed plate and the backup pad that from top to bottom arranges in proper order, the spring of spring needle and the bottom of probe are fixed on the spring fixed plate, the top of probe is passed the needle tubing fixed plate with behind the syringe needle fixed plate with the contact of product test point.

According to above-mentioned scheme the utility model discloses, its characterized in that, it is adjacent two-layer connect through a plurality of support columns between the fixed plate.

According to above-mentioned scheme the utility model discloses, its characterized in that is located a plurality of layers on the same axis the confession has been seted up respectively on the fixed plate the through-hole that the spring needle passed.

According to the above scheme the utility model discloses, its beneficial effect lies in, the utility model discloses a connect the electric conductive property of same product test point of two sets of spring pins of same ox horn needle, on the one hand, set up the contact rate that two sets of spring pins can increase spring pin and test point, guarantee that the test of test point does not omit. On the other hand, if one spring pin fails, the test of the test point is not affected, and the spring pin of the test fixture can improve the test accuracy of the product test point.

Drawings

In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings required for the embodiments or the prior art descriptions will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art to obtain other drawings without creative efforts.

Fig. 1 is a schematic structural view of the present invention;

fig. 2 is a schematic cross-sectional structure diagram of the present invention;

FIG. 3 is a schematic structural view of a first pogo pin of the present invention;

fig. 4 is a schematic structural view of a second pogo pin of the present invention.

In the figures, the various reference numbers:

11. product test point, 31, first spring needle, 32, second spring needle, 311, probe, 312, spring, 313, test line, 41, syringe needle dead plate, 42, needle tube dead plate, 43, spring dead plate, 44, backup pad, 51, connecting plate, 61, support column, 71, ox horn seat, 711, ox horn needle.

Detailed Description

The invention is further described with reference to the following figures and embodiments:

it will be understood that when an element is referred to as being "fixed" or "connected" to another element, it can be directly or indirectly connected to the other element. The terms "upper", "lower", "inner", "outer", and the like indicate orientations or positions based on the orientations or positions shown in the drawings, and are only for convenience of description and not to be construed as limiting the technical solution. The terms "first", "second", etc. are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features.

As shown in fig. 1 to 2, a high-precision testing fixture includes a fixing base and a horn base 71. The ox horn seat 71 is provided with a plurality of ox horn needles 711, the fixing seat is provided with two groups of spring needles, the probe of each group of spring needles contacts the same product test point 11, and the test line of each group of spring needles is connected with the same ox horn needle 711.

As shown in fig. 2, in the present embodiment, the two groups of pogo pins are a first pogo pin 31 and a second pogo pin 32, respectively, each of the first pogo pin 31 and the second pogo pin 32 includes a probe 311, a spring 312, and a test wire 313, one end of the spring 312 is fixedly connected to the probe 311, the other end of the spring 312 is connected to the test wire 313, and the test wire 313 is electrically connected to the horn pin 711 of the horn base 71.

The utility model discloses a test fixture can cooperate with polytype spring needle and carry out electric parameter capability test to the product test point, including but not limited to following two kinds of spring needles.

As shown in fig. 3, the pogo pin includes a probe 311, an elastic section and a test line 313, the elastic section includes a spring portion 312, and a first connection portion and a second connection portion disposed at two ends of the spring portion, the first connection portion is fixedly connected to the probe 311, and the second connection portion is fixedly connected to the test line 312.

As shown in fig. 4, the pogo pin includes a probe 311, a spring 312 and a test wire 313, a through hole formed by winding a spring close loop is formed at the top of the spring, the probe 311 is fixed in the through hole, and the test wire 313 is connected to the bottom of the spring 312.

As shown in fig. 1 to 2, in the present embodiment, the fixing base includes four layers of parallel fixing plates, namely, a needle fixing plate 41, a needle fixing plate 42, a spring fixing plate 43 and a supporting plate 44, two adjacent layers of fixing plates are connected by a plurality of supporting columns 61, and the number of the supporting columns 61 connected between the fixing plates is four.

The needle fixing plate 41 is used for fixing the needle of the probe 311, positioning the needle of the probe 311, and preventing the needle of the probe 311 from shifting. The needle fixing plate 42 is used for fixing the tube body of the probe 311, and plays a role in further strengthening. The needle fixing plate 41 and the needle fixing plate 42 are used for fixing the position of the probe 311, and the thicknesses of the needle fixing plate 41 and the needle fixing plate 42 can be designed to be relatively thinner, so that the cost of the section bar is saved. In the present embodiment, the needle mount 41 and the needle mount 42 have the same thickness.

The spring 312 is a part of the testing link and is required to be matched with the bottom of the probe 311, so that the thickness of the spring fixing plate 43 is designed to be relatively thicker to provide enough space to accommodate the spring 312 and the bottom of the probe 311. One side of the supporting plate 44 is connected with the ox horn seat 71 through the connecting plate 51, and the ox horn seat 71 is connected with the test equipment in a plugging way. The supporting plate 44 is required to support the whole test fixture, so the supporting thickness is designed to be relatively thicker. In the present embodiment, the spring fixing plate 43 and the support plate 44 have the same thickness.

Furthermore, through holes for the spring pins to pass through are respectively formed in the needle head fixing plate 41, the needle tube fixing plate 42 and the spring fixing plate 43 which are located on the same axis, the number of the through holes in each layer of fixing plate is two, the through holes are respectively used for the first spring pin 31 and the second spring pin 32 to pass through, the head of the probe 311 extends out of the surface of the needle head fixing plate 41, and the bottom of the probe 311 and the spring 312 are embedded in the spring fixing plate 43.

The utility model discloses a connect the electric conductive property of same product test point of two sets of spring pins test of same ox horn needle, on the one hand, set up the contact rate that two sets of spring pins can increase spring pin and test point, guarantee that the test of test point does not omit. On the other hand, if one spring pin fails, the test of the test point is not affected, and the spring pin of the test fixture can improve the test accuracy of the product test point.

It will be understood that modifications and variations can be made by persons skilled in the art in light of the above teachings and all such modifications and variations are considered to be within the scope of the invention as defined by the following claims.

The above exemplary description of the present invention is made in conjunction with the accompanying drawings, and it is obvious that the present invention is not limited by the above manner, and various improvements made by the method concept and technical solution of the present invention or by directly applying the concept and technical solution of the present invention to other occasions without improvement are all within the protection scope of the present invention.

Claims

1. The utility model provides a high accuracy test fixture, includes fixing base and ox horn seat, be equipped with many ox horn needles on the ox horn seat, its characterized in that, be equipped with at least two sets of spring needles on the fixing base, every group the spring needle includes probe, spring and test wire, spring one end with probe fixed connection, the other end with the test wire is connected, every group the same product test point of probe contact, every group the test wire is connected same the ox horn needle.

2. The fixture according to claim 1, wherein two sets of pogo pins are disposed on the fixing base.

3. The high-precision testing jig according to claim 1, wherein the pogo pin comprises a probe, an elastic profile and a testing line, the elastic profile comprises a spring portion, and a first connecting portion and a second connecting portion which are arranged at two ends of the spring portion, the first connecting portion is fixedly connected with the probe, and the second connecting portion is fixedly connected with the testing line.

4. The high-precision test fixture according to claim 1, wherein the spring needle comprises a probe, a spring and a test wire, the top of the spring is provided with a through hole formed by winding a spring close ring, the probe is fixed in the through hole, and the bottom of the spring is connected with the test wire.