CN213689688U

CN213689688U - Welding-free thin film capacitor test clamp and device capable of testing in batches

Info

Publication number: CN213689688U
Application number: CN202022383857.XU
Authority: CN
Inventors: 王亚民; 谢平; 李嘉雄
Original assignee: Aihuaxin Power Capacitor Suzhou Co ltd
Current assignee: Aihuaxin Power Capacitor Suzhou Co ltd
Priority date: 2020-10-23
Filing date: 2020-10-23
Publication date: 2021-07-13
Anticipated expiration: 2030-10-23

Abstract

The utility model relates to a welding-free film capacitance test fixture and a device which can be used for batch test, the film capacitance test fixture comprises a fixture body, the fixture body is provided with a first side surface and a second side surface, the clamp comprises a third side face and a fourth side face, the first side face and the second side face are perpendicular to each other, the first side face is just arranged on the third side face, the second side face is just arranged on the fourth side face, the clamp body is provided with a plurality of through holes distributed at intervals, pin feet of the thin film capacitors penetrate through the through holes, the through holes are arranged between the first side face and the third side face in a penetrating mode, the clamp body is further provided with a plurality of threaded holes distributed at intervals, the threaded holes are communicated with the through holes, the tops of the threaded holes are located on the second side face, the threaded holes extend along the direction perpendicular to the axes of the through holes, the bottoms of the threaded holes are located in the clamp body, screws are assembled in the threaded.

Description

Welding-free thin film capacitor test clamp and device capable of testing in batches

Technical Field

The utility model relates to a film capacitor technology field especially relates to a but exempt from welding film capacitor test fixture and device of batch test.

Background

The metallized polypropylene film capacitor is made up by using polypropylene film as medium and coating metal layer on its surface by adopting vacuum evaporation mode, and the metal layer is made up by using zinc and aluminium as general metal layer, and making the metallized film pass through the processes of winding, spraying gold, welding, encasing, pouring adhesive and solidifying so as to obtain the invented product. The high-frequency-characteristic-value-based high-voltage-characteristic integrated circuit has the advantages of small size, good frequency characteristic, wide working temperature range, long service life, high reliability, environmental protection and the like, and is suitable for the development trend requirements of miniaturization, high current, high temperature, high reliability and high environmental. Due to the quality requirements of the product, the reliability of the prepared film capacitor needs to be tested.

The general box-packed metallized film capacitor adopts a 4pin or 2pin design, when reliability test is carried out, such as high-temperature load or high-temperature high-humidity test, the test quantity of each specification is generally as high as 10-50 pcs, and the reliability test process needs to be carried out on each capacitor in a staged mode at multiple time points. At present, a method for testing reliability generally includes that a lead is welded to connect a plurality of plastic shell capacitors in parallel, as shown in fig. 1 or 2. And then at the time points of the stages, such as 168h, 336h, 500h, 750h and 1000h, respectively melting off the soldering tin by using a soldering iron, electrically measuring each capacitor, and then soldering a lead to connect a plurality of plastic shell capacitors in parallel. The mode has long welding time and low efficiency, and the soldering flux in the soldering wire can generate smoke in the welding process, possibly has harmful effect on people and needs to treat the smoke.

SUMMERY OF THE UTILITY MODEL

In order to solve the technical problem, the utility model aims at providing an exempt from to weld film capacitance test anchor clamps and device that can test in batches, the utility model discloses the installation is convenient with the dismantlement, uses the utility model discloses when testing film capacitance performance, need not weld film capacitance pin foot, can realize quick batch performance test, and anchor clamps and device can repeat repetitious usage.

The utility model discloses a but exempt from welding film capacitance test anchor clamps of batch test, including the anchor clamps body, the anchor clamps body has first side, the second side, third side and fourth side, first side and second side mutually perpendicular, first side is just to the third side setting, the second side is just to the fourth side setting, the anchor clamps body is equipped with a plurality of interval distribution's through-hole, the through-hole supplies the pin foot of film electric capacity to pass, the through-hole link up and sets up between first side and third side, the anchor clamps body still is equipped with a plurality of interval distribution's screw hole, the screw hole communicates with the through-hole each other, the top of screw hole is located the second side, the bottom that the screw hole extends and the screw hole along the direction of the axis of perpendicular to through-hole is located anchor clamps originally internally, be equipped with the screw in the screw hole, the screw is used for supporting.

Further, the clamp body is in a long strip plate shape.

Further, the cross section of the through hole is square.

Further, the clamp body is a conductor.

Further, the anchor clamps body is tin-plated brass anchor clamps. The tin-plated copper material can meet the harsh test conditions of high temperature, high humidity and the like.

Furthermore, the thin film capacitors are box-packaged capacitors, and the distance between the through holes is the same as the distance between pin pins of the thin film capacitors in the box-packaged capacitors.

Further, the first side and the second side are parallel to each other, and the third side and the fourth side are parallel to each other.

Further, the through hole extends in a direction perpendicular to the plane of the first side surface.

Further, the screw is an M2.5 socket head cap screw.

The utility model aims at providing a but exempt from to weld film capacitor test fixture device of batch test, including at least two sets of above-mentioned film capacitor test fixture, film capacitor test fixture is parallel to each other and just respectively to the both sides of same film capacitor between two liang.

Borrow by above-mentioned scheme, the utility model discloses at least, have following advantage:

the utility model discloses a set up through-hole and screw hole, can realize film capacitor's connection fast, the installation is convenient with the dismantlement, can guarantee through screw mounting means that the contact is inseparable between anchor clamps body and the pin foot, need not rely on the parallelly connected a plurality of film capacitor of welding, has avoided causing the material extravagant and pollution among the welding method of traditional soldering tin.

If test sample quantity is more, can also utilize the utility model discloses a film capacitor test fixture device passes through the matrix form to a plurality of film capacitor test fixtures and uses carrying out the series-parallel connection, realizes film capacitor's capability test in batches.

The above description is only an overview of the technical solution of the present invention, and in order to make the technical means of the present invention clearer and can be implemented according to the content of the description, the following detailed description is made with reference to the preferred embodiments of the present invention and accompanying drawings.

Drawings

FIG. 1 is a schematic structural diagram of a conventional 2pin molded case capacitor before testing;

FIG. 2 is a schematic structural diagram of a conventional 4pin molded case capacitor before testing;

FIG. 3 is a cross-sectional view of a first side of a thin film capacitance test fixture;

FIG. 4 is an enlarged schematic view of circle A in FIG. 3;

FIG. 5 is a schematic diagram of the structure of the second side of the film capacitor test fixture;

FIG. 6 is an assembly view of a solderless, batch testable fixture apparatus for thin film capacitance testing in use;

FIG. 7 is a partial view of the assembly of a solderless, batch testable fixture apparatus for thin film capacitance testing in use;

description of reference numerals:

1-2pin plastic shell capacitor; 2-welding points of a lead and a pin of a capacitor; 3-soldered test leads; 4-4pin plastic shell capacitor; 5-a first side; 6-through holes; 7-a threaded hole; 8-a second side; 9-thin film capacitance test fixture; 10-a screw; 11-pin capacitance to be tested; 12-pin foot.

Detailed Description

The following detailed description of the embodiments of the present invention is provided with reference to the accompanying drawings and examples. The following examples are intended to illustrate the invention, but are not intended to limit the scope of the invention.

Example 1

Referring to fig. 3-5, the present invention provides a welding-free batch testable thin film capacitor test fixture 9 for testing box-packaged capacitors. The film capacitor test fixture 9 comprises a fixture body which is in a long strip plate shape. The anchor clamps body is tin-plated brass anchor clamps. The tin-plated copper material can meet the harsh test conditions of high temperature, high humidity and the like.

The clamp body is provided with a first side surface 5, a second side surface 8, a third side surface and a fourth side surface, wherein the first side surface 5 and the second side surface 8 are vertical to each other, the first side surface 5 is over against the third side surface and is parallel to each other, and the second side surface 8 is over against the fourth side surface and is parallel to each other.

The clamp body is provided with a plurality of through holes 6 distributed at intervals, pin pins 12 of the thin film capacitor pass through the through holes 6, and the cross section of each through hole 6 is square. The through hole 6 is arranged between the first side surface 5 and the third side surface and extends along a direction perpendicular to the plane of the first side surface 5. The distance between the through holes 6 is the same as the distance between the pin pins 12 of the thin film capacitors in the box capacitor.

The anchor clamps body still is equipped with a plurality of interval distribution's screw hole 7, and screw hole 7 communicates with through-hole 6 each other, and the top of screw hole 7 is located second side 8, and screw hole 7 extends and the bottom of screw hole 7 is located the anchor clamps body along the direction of the axis of perpendicular to through-hole 6, is equipped with screw 10 in the screw hole 7, and screw 10 is used for supporting tight film capacitor's pin foot 12. The size of the threaded hole 7 is M2.5, and the screw 10 is an M2.5 inner hexagonal stainless steel screw. The film capacitor test clamp 9 is matched with an M2.5 inner hexagonal stainless steel screw for use, and can be quickly disassembled and assembled through an electric torque wrench.

Preferably, the width a of the first side surface 5 is 5-10 mm, the width b of the second side surface 8 is 4-6 mm, and the length of the clamp body is 200-500 mm. According to the size of the box-packed capacitor body, the hole pitch1(5 mm-60 mm) of the film capacitor test fixture can be determined, the pitch of the threaded holes 7 and the pitch of the through holes 6 are set by taking the confirmed hole pitch1 as the pitch, namely, the pitch of the threaded holes 7 and the pitch of the through holes 6 are the same as the hole pitch 1. The depth d1 of the threaded hole 7 is 6-7 mm. The through hole 6 is preferably a square hole, the side length c1 of the through hole is 2-2.5 mm, the distance d2 from the through hole 6 to the edge of the first side face 5 is 5-6 mm, and the through hole 6 and the threaded hole 7 have an overlapping area of 1-1.5 mm in depth d1 along the direction of the through hole 6 and the edge of the first side face 5.

Example 2

Referring to fig. 6-7, the utility model discloses a but exempt from welding film capacitor test fixture device of batch test, including the film capacitor test fixture 9 in two sets of embodiment 1, film capacitor test fixture 9 is parallel to each other and just to the both sides of same film capacitor respectively between two liang. After the thin film capacitor test fixture device is assembled, two pin pins 12 of each thin film capacitor respectively penetrate through the through holes 6 in the thin film capacitor test fixture 9, and the screws 10 tightly abut against the parts, located in the through holes 6, of the pin pins 12.

The utility model discloses a film capacitor test fixture device has the installation and dismantles conveniently, can guarantee through 10 mounting means of screw that the contact is inseparable between tool and the pin foot 12, and tinned copper material can make it can satisfy harsh test conditions such as high temperature and high humidity. Avoids material waste and pollution in the traditional soldering method of soldering tin. If the number of the test samples is large, the test samples can be used in series and parallel in a matrix form. And the clamp and the device can be repeatedly used.

The film capacitor test fixture device can be used for electrically connecting a box capacitor (length is 32 multiplied by height is 33 multiplied by width is 18) with 10pcs pins and 2 pins before high temperature and high humidity test, and a test fixture with pitch1 of 25mm is selected according to the size of the capacitor width of 18mm, and the length of the test fixture is 300 mm.

Referring to fig. 6-7, use the utility model discloses the time, aim at the through-hole 6 on the experimental anchor clamps 9 of film electric capacity to await measuring pin foot electric capacity 11 on pin foot 12 to pass pin foot 12 through-hole 6, then arrange screw 10 in screw hole 7, utilize electronic torque wrench to tighten screw 10, make screw 10 support pin foot 12, with this realization await measuring pin foot electric capacity 11 parallelly connected.

The above is only a preferred embodiment of the present invention, and is not intended to limit the present invention, it should be noted that, for those skilled in the art, a plurality of modifications and variations can be made without departing from the technical principle of the present invention, and these modifications and variations should also be regarded as the protection scope of the present invention.

Claims

1. The utility model provides a but welding batch test's film capacitance test anchor clamps which characterized in that: comprises a clamp body, the clamp body is provided with a first side surface, a second side surface, a third side surface and a fourth side surface, the first side surface and the second side surface are vertical to each other, the first side surface is arranged opposite to the third side surface, the second side surface is arranged opposite to the fourth side surface, the clamp body is provided with a plurality of through holes which are distributed at intervals, the through hole is used for the pin of the film capacitor to pass through, the through hole is arranged between the first side surface and the third side surface in a penetrating way, the clamp body is also provided with a plurality of threaded holes which are distributed at intervals, the threaded holes are communicated with the through holes, the top of the threaded hole is positioned on the second side surface, the threaded hole extends along the direction vertical to the axis of the through hole, the bottom of the threaded hole is positioned in the clamp body, and a screw is assembled in the threaded hole and used for tightly abutting against a pin of the thin film capacitor in the through hole.

2. The welding-free batch testable thin film capacitance test fixture of claim 1, wherein: the clamp body is in a long strip plate shape.

3. The welding-free batch testable thin film capacitance test fixture of claim 1, wherein: the cross section of the through hole is square.

4. The welding-free batch testable thin film capacitance test fixture of claim 1, wherein: the clamp body is a conductor.

5. The welding-free batch testable thin film capacitance test fixture of claim 1, wherein: the clamp body is a tin-plated brass clamp.

6. The welding-free batch testable thin film capacitance test fixture of claim 1, wherein: the thin film capacitor is a box-packed capacitor, and the distance between the through holes is the same as the distance between pin pins of the thin film capacitors in the box-packed capacitor.

7. The welding-free batch testable thin film capacitance test fixture of claim 1, wherein: the first side and the second side are parallel to each other, and the third side and the fourth side are parallel to each other.

8. The welding-free batch testable thin film capacitance test fixture of claim 1, wherein: the through hole extends along a direction perpendicular to the plane of the first side face.

9. The welding-free batch testable thin film capacitance test fixture of claim 1, wherein: the screw is an M2.5 hexagon socket head cap screw.

10. The utility model provides a but welding batch test's experimental fixture device of film capacitance which characterized in that: the thin film capacitor test fixture comprises at least two groups of thin film capacitor test fixtures as claimed in any one of claims 1 to 9, wherein every two groups of thin film capacitor test fixtures are parallel to each other and respectively face two sides of the same thin film capacitor.