CN213482385U

CN213482385U - PCB testing device and equipment

Info

Publication number: CN213482385U
Application number: CN202022132017.6U
Authority: CN
Inventors: 刘丹; 陆小珊
Original assignee: Shenzhen Wotebang Testing Equipment Co ltd
Current assignee: Shenzhen Wotebang Testing Equipment Co ltd
Priority date: 2020-09-24
Filing date: 2020-09-24
Publication date: 2021-06-18
Anticipated expiration: 2030-09-24

Abstract

The utility model discloses a PCB board testing arrangement, include: test piece, mounting and adaptor. The test piece comprises an elastic piece and a probe, wherein the elastic piece is arranged so that when the probe moves towards one direction, the elastic piece can buffer impact force caused by the movement; the fixing piece is provided with a concave storage part, and the concave storage part can accommodate the elastic piece and one end of the probe; the adapter is connected with the fixing piece and is in contact with the probe. Through set up concave portion of depositing on the mounting to and set up the elastic component in the one end department of probe, make the probe when contacting with the keysets, the one end of probe can retract concave portion of depositing with the elastic component, with the help of the elastic deformation of elastic component, has reduced the impulsive force of probe to the keysets, thereby has reached the purpose of protection keysets, has prolonged the life of keysets. The utility model also discloses a PCB board test equipment, including above-mentioned PCB board testing arrangement.

Description

PCB testing device and equipment

Technical Field

The utility model relates to a PCB board production test equipment technical field especially relates to PCB board testing arrangement and equipment.

Background

With the development of electronic technology, more and more electronic devices have been widely used.

The PCB is the basis of numerous electronic devices, and in order to ensure the normal operation of the electronic devices, a large amount of tests need to be carried out on the PCB, so that the quality of the PCB is ensured. In the related art, extensive testing may result in irreversible damage to the interposer caused by the probes when the probes are in contact with the interposer for conducting information, thereby shortening the service life of the interposer.

SUMMERY OF THE UTILITY MODEL

The utility model discloses aim at solving one of the technical problem that exists among the prior art at least. Therefore, the utility model provides a PCB board testing arrangement, effort between the two when can reducing probe and keysets and contact has effectively prolonged the life of keysets.

An embodiment of the first aspect of the utility model provides a PCB board testing arrangement, include:

the fixing piece is provided with a concave part;

the adaptor is connected with the fixing piece;

the test piece, the test piece includes elastic component and probe, the probe can with the adaptor contacts, the concave portion of depositing can hold the one end of probe with the elastic component, the elastic component sets up to, works as when the probe removes towards a direction, the elastic component can take place elastic deformation under the restraint of the bottom surface of concave portion of depositing, elastic deformation can cushion the probe with impulsive force when the adaptor contacts.

According to the utility model discloses PCB board testing arrangement has following technological effect at least: through set up concave portion of depositing on the mounting to and set up the elastic component in the one end department of probe, make the probe when contacting with the keysets, the one end of probe can retract concave portion of depositing with the elastic component, with the help of the elastic deformation of elastic component, has reduced the impulsive force of probe to the keysets, thereby has reached the purpose of protection keysets, has prolonged the life of keysets.

According to the utility model discloses a PCB board testing arrangement of some embodiments, the probe includes protruding bobble, the internal diameter of elastic component is less than the diameter of protruding bobble.

According to the utility model discloses a PCB board testing arrangement of some embodiments still includes the accepting, the accepting is used for bearing the PCB board of being surveyed, the accepting includes the portion that resets, the portion that resets makes after being used for the test PCB board testing arrangement resumes initial condition.

According to the utility model discloses a PCB board testing arrangement of some embodiments, the portion that resets is the air spring.

According to the utility model discloses a PCB board testing arrangement of some embodiments, be provided with location portion on the accepting piece, location portion is used for assisting surveyed the PCB board with PCB board testing arrangement is connected.

According to the utility model discloses a PCB board testing arrangement of some embodiments, it helps tearing the chamfer open to be provided with on location portion.

According to the utility model discloses a PCB board testing arrangement of some embodiments, it protects needle portion still to be provided with on the accepting piece, it is located to protect needle portion location portion.

According to the utility model discloses a PCB board testing arrangement of some embodiments, the figure of adaptor is one at least, every the adaptor homoenergetic can connect detachablely on the mounting.

According to the utility model discloses a PCB board testing arrangement of some embodiments still includes support piece, support piece's both ends respectively with the mounting with the accepting is connected.

The utility model discloses a second aspect embodiment provides a PCB board test equipment, including the aforesaid the utility model discloses PCB board testing arrangement of first aspect embodiment.

According to the utility model discloses PCB board test equipment has following technological effect at least: by adopting the PCB testing device, the consumption of consumables of PCB testing equipment in the practical process is effectively reduced, and the cost for testing the PCB is reduced.

Additional aspects and advantages of the invention will be set forth in part in the description which follows and, in part, will be obvious from the description, or may be learned by practice of the invention.

Drawings

The above and/or additional aspects and advantages of the present invention will become apparent and readily appreciated from the following description of the embodiments, taken in conjunction with the accompanying drawings of which:

fig. 1 is a perspective assembly view of a PCB testing apparatus according to an embodiment of the present invention;

FIG. 2 is a schematic view of a test piece according to an embodiment of the present invention;

fig. 3 is a perspective view of a fixing member in an embodiment of the present invention;

FIG. 4 is a top view of the anchor of FIG. 3;

FIG. 5 is a cross-sectional view of the fastener of FIG. 4 at A-A;

FIG. 6 is a perspective view of a receiving member in an embodiment of the present invention;

FIG. 7 is a top view of the adapter of FIG. 6;

fig. 8 is a cross-sectional view of the socket of fig. 7 at B-B.

Reference numerals: the PCB testing device 100, the testing part 110, the probe 111, the elastic part 112, the protruding ball 113, the fixing part 120, the concave part 121, the first through hole 122, the adapter 130, the bearing part 140, the reset part 141, the limiting plate 142, the carrier plate 143, the positioning part 144, the disassembly assisting chamfer 145, the needle protecting part 146, the second through hole 147 and the supporting part 150.

Detailed Description

Reference will now be made in detail to embodiments of the present invention, examples of which are illustrated in the accompanying drawings, wherein like reference numerals refer to the same or similar elements or elements having the same or similar function throughout. The embodiments described below with reference to the drawings are exemplary only for the purpose of explaining the present invention, and should not be construed as limiting the present invention.

In the description of the present invention, it should be understood that the orientation or positional relationship indicated with respect to the orientation description, such as up, down, front, rear, left, right, etc., is based on the orientation or positional relationship shown in the drawings, and is only for convenience of description and simplification of description, and does not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and thus, should not be construed as limiting the present invention.

In the description of the present invention, a plurality of means are one or more, a plurality of means are two or more, and the terms greater than, less than, exceeding, etc. are understood as not including the number, and the terms greater than, less than, within, etc. are understood as including the number. If the first and second are described for the purpose of distinguishing technical features, they are not to be understood as indicating or implying relative importance or implicitly indicating the number of technical features indicated or implicitly indicating the precedence of the technical features indicated.

A PCB board testing apparatus 100 according to an embodiment of the present invention is described below with reference to fig. 1 to 8.

According to the utility model discloses PCB board testing arrangement 100 of first aspect embodiment includes: a test piece 110, a fixture 120, and an adaptor 130.

The fixing member 120 is provided with a recess 121; the adaptor 130 is connected with the fixing member 120; the testing part 110 comprises an elastic part 112 and a probe 111, the probe 111 can contact with the adaptor 130, the concave part 121 can accommodate one end of the probe 111 and the elastic part 112, the elastic part 112 is configured such that when the probe 111 moves in one direction, the elastic part 112 can elastically deform under the constraint of the bottom surface of the concave part 121, and the elastic deformation can buffer the impact force when the probe 111 contacts with the adaptor 130.

In a specific use process, firstly, the testing element 110 passes through the fixing element 120, the elastic element 112 in the testing element 110 is located at a side of the fixing element 120 where the recess 121 is located, and at this time, one end of the probe 111 where the elastic element 112 is located has a portion extending out of the recess 121 and located outside the fixing element 120. When the adaptor 130 is connected to the fixing member 120, the top surface of the adaptor 130 contacts with one end of the probe 111 extending out of the concave portion 121, the probe 111 receives a force from the adaptor 130 and drives the elastic member 112 to start moving upwards into the concave portion 121, when the elastic member 112 is limited by the concave portion 121 and cannot move continuously, elastic deformation starts to occur, and the movement of the probe 111 is slowed, which can be understood that the impact force generated by the contact between the probe 111 and the adaptor 130 is reduced.

Specifically, as shown in fig. 1 to 5, the test piece 110 includes a plurality of probes 111 and a plurality of elastic pieces 112, the elastic pieces 112 are sleeved at one ends of the probes 111, and the elastic pieces 112 may be springs or bellows. The elastic member 112 and the probe 111 are connected in a manner that when the probe 111 moves in one direction, the elastic member 112 can buffer the impact force generated by the movement, the shape of the probe 111 can be a uniform column, at this time, the elastic member 112 is fixed at the end point of the probe 111 by welding or the like, the shape of the probe 111 can also be a column with a main body, a protruding structure is arranged at one end point, at this time, the elastic member 112 is limited on the probe 111 due to the structure at the end point of the probe 111, it can be understood that the shape of the probe 111 includes, but is not limited to, the above two cases, and the connection relationship between the elastic member 112 and the probe 111 can be changed adaptively.

Meanwhile, the fixing member 120 is provided with a first through hole 122, and the first through hole 122 is used for enabling the probe 111 to pass through the fixing member 120 and limiting the probe 111. The concave portion 121 is disposed on one side of the bottom surface of the fixing member 120, the axis of the concave portion 121 coincides with the axis of the first through hole 122, and when the probe 111 is inserted into the first through hole 122, one end of the probe 111 can extend out of the concave portion 121, that is, the one end is partially located outside the fixing member 120, so as to ensure that the probe 111 can contact with the adaptor 130. The size of the first through hole 122 is smaller than the minimum size required to pass through the elastic member 112, and the cross-sectional area of the recess 121 is larger than that of the first through hole 122, while the size of the recess 121 satisfies the size required to completely store the elastic member 112 and the end of the probe 111 provided with the elastic member 112, it can be understood that the recess 121 can restrict the elastic member 112 from continuing to move upward when the probe 111 moves upward, thereby elastically deforming the elastic member 112.

In addition, the adaptor 130 can be detachably fixed at the bottom end of the fixing member 120, and when the adaptor 120 is connected to the fixing member 120, the adaptor 130 can contact with one end of the probe 111 extending out of the fixing member 120. The adaptor 130 is actually used to communicate the PCB testing apparatus 100 and the device using the same, so that the test data of the PCB to be tested can be transmitted.

In some embodiments of the present invention, the probe 111 includes a protruding ball 113, and the inner diameter of the elastic member 112 is smaller than the diameter of the protruding ball 113.

Specifically, as shown in fig. 2, the probe 111 has a cylindrical shape, one end of the probe 111 is provided with a small protruding ball 113, and the small protruding ball 113 is fixedly connected to the end of the probe 111 by welding or the like, or is integrally formed with the probe. The diameter of the small protruding ball 113 is greater than the diameter of the cross section of the probe 111 body, and is also greater than the inner diameter of the elastic member 112 sleeved at the position of the probe 111, it can be understood that the elastic member 112 cannot be separated from the probe 111 through the small protruding ball 113, that is, when the probe 111 moves towards the direction of the end where the small protruding ball 113 is not arranged, the small protruding ball 113 can contact with the elastic member 112 and generate thrust on the elastic member 112, so that the elastic member 112 moves along with the probe 111, and when the elastic member 112 is elastically deformed, the movement of the probe 111 can be relieved due to the contact between the small protruding ball 113 and the elastic member 112. The design of the protruding ball 113 makes the structure of the test piece 110 simple, and it can be understood that the elastic piece 112 has interchangeability, and it is more convenient to replace the elastic piece 112 in later maintenance.

In some embodiments of the present invention, the PCB testing device further includes a receiving member 140, the receiving member 140 is used to connect the PCB to be tested, the receiving member 140 includes a reset portion 141, and the reset portion 141 is used to restore the initial state of the PCB testing device 100 after the test is finished.

In a specific use process, the PCB to be tested is connected to the limiting plate 142 of the receiving member 140, and a downward force is applied to the limiting plate 142, so that the limiting plate 142 moves downward until contacting the carrier plate 143, at which time the PCB to be tested contacts the end point of the probe 111 protruding out of the limiting plate 142. After the PCB under test is removed from the PCB testing apparatus 100 after the test is finished, the limiting plate 142 moves upward to the initial state by the reset portion 141, and the end of the probe 111 contacting the PCB under test is accommodated in the receiving member 140 again.

Specifically, as shown in fig. 6 to 8, the PCB testing apparatus 100 further includes a socket 140, the socket 140 is provided with a second through hole 147, an end of the probe 111 not provided with the elastic member 112 is inserted into the socket 140 through the second through hole 147, and the second through hole 147 serves to limit the position of the probe 111. The bearing element 140 includes a limiting plate 142 and a carrier plate 143, the carrier plate 143 is located at a lower side of the limiting plate 142, the reset portion 141 is respectively connected to the limiting plate 142 and the carrier plate 143, the reset portion 141 may be a piston structure, or a structure combining a spring and a shaft, and the reset portion 141 may enable the limiting plate 142 to move relative to the carrier plate 143.

When the stopper plate 142 receives a force toward the carrier plate 143, the stopper plate 142 can move toward the carrier plate 143 through the reset portion 141 until the stopper plate 142 contacts the carrier plate 143. At this time, one end of the probe 111 inserted into the socket 140 is exposed out of the limiting plate 142 and can contact with the foreign object; when the force applied to the position-limiting plate 142 disappears or becomes sufficiently small, the reset portion 141 can move the position-limiting plate 142 away from the carrier plate 143 until the position-limiting plate returns to the initial position, and at this time, one end of the probe 111 inserted into the socket 140 is contained in the socket 140 and cannot be in direct contact with a foreign object, so that the probe 111 is protected and the probe 111 is prevented from being damaged due to accidental contact with the foreign object during a non-test period. It should be understood that the power source for the reset portion 141 to move the limiting plate 142 may be from the outside, or may be from the reset portion 141 itself.

In some embodiments of the present invention, the reset portion 141 is a gas spring.

Specifically, as shown in fig. 6, the reset portion 141 is a free-type gas spring, a piston rod in the reset portion 141 is connected to the limit plate 142 in the socket 140, a main body of the reset portion 141 is fixed below the carrier plate 143 in the socket 140, the number of the reset portions 141 is at least one, and the distribution of the reset portions 141 meets the requirement that the limit plate 142 can make a linear motion by the resilience of the reset portion 141 to the limit plate 142. The air spring is simple to assemble and stable in action, the resilience force of the air spring is easy to set, and the practical value of the reset part 141 is improved.

In some embodiments of the present invention, the supporting member 140 is provided with a positioning portion 144, and the positioning portion 144 is used to assist the tested PCB to be connected to the PCB testing device 100.

Specifically, as shown in fig. 6 and 7, the positioning portion 144 is disposed on the limiting plate 142 in the socket 140, the positioning portion 144 is groove-shaped, and the second through holes 147 disposed on the socket 140 are all located in the positioning portion 144, that is, when the limiting plate 142 moves in a direction close to the carrier plate 143, one end of the probe 111 is exposed from the positioning portion 144, the PCB to be tested is in contact with the probe 111 at the positioning portion 144, and the design of the positioning portion 144 makes the PCB to be tested and the limiting plate 142 to be connected more easily and conveniently.

In some embodiments of the present invention, the positioning portion 144 is provided with an easy-to-detach chamfer 145.

Specifically, the disassembly assisting chamfer 145 is arranged at the intersection of the inner peripheral wall of the positioning portion 144 and the top surface of the limiting plate 142, the disassembly assisting chamfer 145 can be a bevel plane or a curved surface, the disassembly assisting chamfer 145 can be arranged around the inner peripheral wall of the positioning portion 144 for a circle or only arranged at one part of the inner peripheral wall of the positioning portion 144, and the disassembly assisting chamfer 145 is designed to be more convenient when a tested PCB is required to be disassembled after the test is finished.

In some embodiments of the present invention, the receiving member 140 further has a needle protection portion 146, and the needle protection portion 146 is located in the positioning portion 144.

Specifically, as shown in fig. 6 and 7, the needle guard portion 146 is disposed on the stopper plate 142 of the receiving plate, and is located in the positioning portion 144 of the stopper plate 142, and the needle guard portion 146 is groove-shaped, and the region to be measured of the PCB board to be measured can be inserted into the wire guard portion. When the limiting plate 142 moves to contact with the carrier plate 143, one end of the probe 111 is exposed from the support 140, and the depth of the wire guard portion is slightly higher than the exposed height of the probe 111, it can be understood that, at this time, the exposed portion of the probe 111 is contained in the space formed by the wire guard portion, and when the PCB to be tested is connected with the support 140, the region to be tested is inserted into the wire guard portion and contacts with the probe 111 contained in the wire guard portion. The design of the wire guard reduces the possibility that the probe 111 will be damaged by collision with a foreign object after exposure.

In some embodiments of the present invention, the number of the adaptor 130 is at least one, and each adaptor 130 can be detachably connected to the fixing member 120.

Specifically, the number of the adaptor 130 is at least one, each adaptor board can be detachably connected with the fixing member 120, the connection mode can be a buckle slot type connection, a magnetic adsorption type connection and the like, different adaptor boards can correspond to different tested PCB boards, and the design enables the same PCB board testing device 100 to be used for testing one or more types of PCB boards.

In some embodiments of the present invention, the present invention further comprises a supporting member 150, and both ends of the supporting member 150 are respectively connected to the fixing member 120 and the receiving member 140.

Specifically, as shown in fig. 1, the supporting member 150 is installed between the fixing member 120 and the receiving member 140, one end of the supporting member 150 is connected to the fixing member 120, and the other end of the supporting member 150 is connected to the receiving member 140, and the connection mode may be a detachable connection mode such as a threaded bolt connection, and may also be an undetachable connection mode such as a welding connection. The number of the supporting members 150 is at least one, and the distribution of the supporting members 150 can keep balance when the bearing member 140 is subjected to an external force, it can be understood that the length of the supporting members 150 is adaptively adjusted according to the length of the probe 111. The supporting member 150 can provide a support for the probe 111, and ensure that the probe 111 is not damaged when the socket 140 is subjected to an external force.

Furthermore, the connection mode between the supporting member 150 and the fixing member 120 and the receiving member 140 is a detachable connection mode, such that the same PCB testing apparatus 100 can use the probes 111 with different lengths by replacing the supporting member 150 with different lengths, thereby achieving different testing purposes.

According to the utility model discloses PCB board test equipment of second aspect embodiment, including the aforesaid the utility model discloses PCB board testing arrangement 100 of first aspect embodiment.

Specifically, the PCB testing apparatus employs the PCB testing device 100 in any of the above embodiments, and through the mutual cooperation between the probe 111, the elastic member 112 and the concave portion 121, the consumption of consumables of the PCB testing apparatus in an actual practical process is effectively reduced, and the cost for testing the PCB is reduced.

The embodiments of the present invention have been described in detail with reference to the accompanying drawings, but the present invention is not limited to the above embodiments, and various changes can be made without departing from the spirit of the present invention within the knowledge of those skilled in the art.

Claims

PCB board testing arrangement, its characterized in that includes:

the fixing piece is provided with a concave part;

the adaptor is connected with the fixing piece;

the test piece, the test piece includes elastic component and probe, the probe can with the adaptor contacts, the concave portion of depositing can hold the one end of probe with the elastic component, the elastic component sets up to, works as when the probe removes towards a direction, the elastic component can take place elastic deformation under the restraint of the bottom surface of concave portion of depositing, elastic deformation can cushion the probe with impulsive force when the adaptor contacts.
2. The PCB board testing device of claim 1, wherein the probe comprises a convex ball, and the inner diameter of the elastic member is smaller than the diameter of the convex ball.
3. The PCB testing device of claim 1, further comprising a receiving member, wherein the receiving member is used for receiving the PCB to be tested, the receiving member comprises a reset portion, and the reset portion is used for enabling the PCB testing device to recover to an initial state after testing is finished.
4. The PCB board testing device of claim 3, wherein the reset portion is a gas spring.
5. The PCB testing device of claim 3, wherein the supporting member is provided with a positioning portion for assisting the PCB to be tested to be connected with the PCB testing device.
6. The PCB board testing device of claim 5, wherein the positioning part is provided with an disassembly assisting chamfer.
7. The PCB testing device of claim 5, wherein the receiving member is further provided with a pin protection part, and the pin protection part is located in the positioning part.
8. The PCB board testing device of claim 1, wherein the number of the adapters is at least one, and each of the adapters is detachably connectable to the fixing member.
9. The PCB testing device of claim 3, further comprising a supporting member, wherein two ends of the supporting member are respectively connected to the fixing member and the receiving member.
PCB board testing apparatus, comprising a PCB board testing device according to any of claims 1 to 9.