CN215986182U - Test head mounting structure and testing arrangement with effect and buffering effect are floated to self-adaptation - Google Patents
Test head mounting structure and testing arrangement with effect and buffering effect are floated to self-adaptation Download PDFInfo
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- CN215986182U CN215986182U CN202122210883.7U CN202122210883U CN215986182U CN 215986182 U CN215986182 U CN 215986182U CN 202122210883 U CN202122210883 U CN 202122210883U CN 215986182 U CN215986182 U CN 215986182U
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Abstract
The application discloses test head mounting structure and testing arrangement with effect and buffering effect are floated to self-adaptation. The self-adaptive floating effect and buffering effect test head mounting structure provided by the embodiment of the first aspect at least has the following beneficial effects: at least one of the mounting seat and the floating block is provided with a mounting hole and is connected with the connecting piece through the mounting hole, a gap is formed between the connecting piece and the mounting hole, and when the test head mounting structure tests an electronic product interface, the floating block and/or the mounting seat can move relative to the connecting piece through the gap, so that the mounting seat plays a floating effect, and the service life of the test head mounting structure is prolonged. In addition, the floating block is connected with the fixing seat through the buffering component, when the test head mounting structure tests the interface of an electronic product, the buffering component can play a certain buffering role on the floating block, and the service life of the test head mounting structure is further prolonged.
Description
Technical Field
The application relates to the technical field of electronic product interface test equipment, in particular to a test head mounting structure and a test device with self-adaptive floating effect and buffering effect.
Background
Before most of electric appliances are sold, the electric appliances need to be subjected to spot inspection, and an electronic product interface is tested through a testing device. In the related art, the testing device generally includes a plurality of testing head mounting structures for mounting the testing heads, each testing head mounting structure includes a mounting seat for mounting the testing head and a fixing seat for fixing the mounting seat, when an electronic product interface is tested, the testing head corresponding to a testing product is mounted on the mounting seat, because the mounting seat and the fixing seat are rigidly connected, when the testing head is inserted into the electronic product interface, the testing head mounting structure is easy to damage, and the service life of the testing head mounting structure is short.
Disclosure of Invention
The present application is directed to solving at least one of the problems in the prior art. Therefore, the application provides a self-adaptive floating effect and buffering effect test head mounting structure, which can have a floating effect and a buffering effect when an electronic product interface is tested.
The application also provides a test device of the test head mounting structure with the self-adaptive floating effect and the buffering effect.
According to the first aspect embodiment of this application, the test head mounting structure with adaptive floating effect and buffering effect includes:
the mounting seat is used for fixing the test head;
the floating block is connected with the mounting seat through a connecting piece, at least one of the floating block and the mounting seat is provided with a mounting hole, the end part of the connecting piece is arranged in the mounting hole in a penetrating way, and a gap is formed between the connecting piece and the inner wall of the mounting hole, so that the floating block and/or the mounting seat can move relative to the connecting piece through the gap;
and a buffer component is arranged between the fixed seat and the floating block.
According to the test head mounting structure with the self-adaptive floating effect and the buffering effect, the test head mounting structure at least has the following beneficial effects: at least one of the mounting seat and the floating block is provided with a mounting hole and is connected with the connecting piece through the mounting hole, a gap is formed between the connecting piece and the mounting hole, and when the test head mounting structure tests an electronic product interface, the floating block and/or the mounting seat can move relative to the connecting piece through the gap, so that the mounting seat plays a floating effect, and the service life of the test head mounting structure is prolonged. In addition, the floating block is connected with the fixing seat through the buffering component, when the test head mounting structure tests the interface of an electronic product, the buffering component can play a certain buffering role on the floating block, and the service life of the test head mounting structure is further prolonged.
According to some embodiments of the application, the mounting hole is opened in the slider, one end of the connecting piece passes through the mounting hole with slider swing joint, the other end with mount pad fixed connection.
According to some embodiments of the application, the one end of connecting piece is equipped with fixed head, fixed head is located in the mounting hole, be formed with throat structure in the mounting hole, fixed head's size is greater than the bore of throat structure.
According to some embodiments of the application, the test head mounting structure further comprises a first elastic piece, one end of the first elastic piece is connected with the floating block, the other end of the first elastic piece is connected with the connecting piece or the mounting seat, and the connecting piece can slide in the mounting hole along the axial direction of the mounting hole.
According to some embodiments of the application, the both ends of connecting piece respectively with the slider with mount pad rotatable coupling, first elastic component cover is located on the connecting piece, just the both ends of first elastic component connect respectively in the slider with the fixing base.
According to some embodiments of the present application, the buffer assembly includes a second elastic member, and two ends of the second elastic member respectively abut against the slider and the fixing seat.
According to some embodiments of the present application, the buffer assembly further includes a guide pillar and a guide sleeve, one of the slider and the fixing seat is fixedly connected to the guide sleeve, the other of the slider and the fixing seat is fixedly connected to one end of the guide pillar, the other end of the guide pillar penetrates through the guide sleeve, and the second elastic member is sleeved on the guide pillar.
According to some embodiments of the present application, a mounting platform is formed on the mounting base, the mounting platform for mounting a test head.
According to some embodiments of the present application, the mount pad has been seted up along the direction of height an installation groove, the installation groove is used for installing the test head.
The test device according to the embodiment of the second aspect of the application comprises the test head mounting structure with the self-adaptive floating effect and the buffering effect.
The test device according to the embodiment of the second aspect of the present application has at least the following advantages: including above-mentioned test head mounting structure who has self-adaptation floating effect and buffering effect's whole beneficial effect.
Additional aspects and advantages of the present application will be set forth in part in the description which follows and, in part, will be obvious from the description, or may be learned by practice of the present application.
Drawings
The present application is further described with reference to the following figures and examples, in which:
FIG. 1 is a cross-sectional view of a test head mounting structure with adaptive floating effect and cushioning effect according to an embodiment of a first aspect of the present application;
FIG. 2 is an enlarged view taken at A in FIG. 1;
FIG. 3 is a perspective view of a test head mounting structure with adaptive floating effect and buffering effect according to an embodiment of the first aspect of the present application;
fig. 4 is a perspective view of another structure of a test head mounting structure with adaptive floating effect and buffering effect according to an embodiment of the first aspect of the present application.
Reference numerals:
the mounting seat 100, the mounting platform 110 and the mounting groove 120;
a slider 200, a spacer 201, a throat structure 210, a mounting hole 220;
a fixed base 300;
a connecting piece 400, a connecting piece 410, a fixed head 411 and a first elastic piece 420;
the buffer assembly 500, the guide column 510, the guide sleeve 520 and the second elastic piece 530;
the head 600 is tested.
Detailed Description
Reference will now be made in detail to embodiments of the present application, examples of which are illustrated in the accompanying drawings, wherein like or similar reference numerals refer to the same or similar elements or elements having the same or similar function throughout. The embodiments described below with reference to the drawings are exemplary only for the purpose of explaining the present application and are not to be construed as limiting the present application.
In the description of the present application, it is to be understood that the positional descriptions, such as the directions of up, down, front, rear, left, right, etc., referred to herein are based on the directions or positional relationships shown in the drawings, and are only for convenience of description and simplification of description, and do not indicate or imply that the referred device or element must have a specific direction, be constructed and operated in a specific direction, and thus, should not be construed as limiting the present application.
In the description of the present application, the meaning of a plurality is one or more, the meaning of a plurality is two or more, and the above, below, exceeding, etc. are understood as excluding the present number, and the above, below, within, etc. are understood as including the present number. If the first and second are described for the purpose of distinguishing technical features, they are not to be understood as indicating or implying relative importance or implicitly indicating the number of technical features indicated or implicitly indicating the precedence of the technical features indicated.
In the description of the present application, unless otherwise expressly limited, terms such as set, mounted, connected and the like should be construed broadly, and those skilled in the art can reasonably determine the specific meaning of the terms in the present application by combining the detailed contents of the technical solutions.
In the description of the present application, reference to the description of the terms "one embodiment," "some embodiments," "an illustrative embodiment," "an example," "a specific example," or "some examples," etc., means that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the present application. In this specification, the schematic representations of the terms used above do not necessarily refer to the same embodiment or example. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples.
The test head mounting structure with the self-adaptive floating effect and the buffering effect according to the embodiment of the first aspect of the application comprises a mounting seat 100, a floating block 200, a fixed seat 300, a connecting piece 410 and a buffering assembly 500.
Mount 100 is used to secure test head 600;
the floating block 200 is connected with the mounting seat 100 through a connecting piece 410, at least one of the floating block 200 and the mounting seat 100 is provided with a mounting hole 220, the end part of the connecting piece 410 is arranged in the mounting hole 220 in a penetrating way, and a gap 201 is formed between the connecting piece 410 and the inner wall of the mounting hole 220, so that the floating block 200 and/or the mounting seat 100 can move relative to the connecting piece 410 through the gap 201;
a buffer assembly 500 is arranged between the fixed seat 300, the fixed seat 300 and the slider 200.
The test head mounting structure with the adaptive floating effect and the buffering effect of the embodiment of the first aspect of the present application is hereinafter referred to simply as a test head mounting structure.
As shown in fig. 1 to 2, when the test head mounting structure is in an initial state, that is, when the test head mounting structure does not detect an electronic product interface, a certain gap is formed between the mounting seat 100 and the slider 200 and between the slider 200 and the fixing seat 300.
When the test head mounting structure needs to detect the electronic product interface, the test head mounting structure is horizontally placed, that is, the mounting seat 100, the slider 200 and the fixing seat 300 are sequentially connected along the horizontal direction, and the test head 600 corresponding to the electronic product interface is mounted on the mounting seat 100. The appliance is then moved horizontally to insert test head 600 into the electronics interface.
At least one of the mounting seat 100 and the slider 200 is provided with a mounting hole 220, and is fixedly connected with the connecting piece 410 through the mounting hole 220, and a gap 201 is formed between the connecting piece 410 and the mounting hole 220, when the test head mounting structure tests an electronic product interface, because the slider 200 and/or the mounting seat 100 can move relative to the connecting piece 410 through the gap 201, the mounting seat 100 has a floating effect, and the service life of the test head mounting structure is prolonged.
Specifically, mounting hole 220 has been seted up in slider 200 and mount pad 100 at least, and form interval 201 between the side of mounting hole 220 and connecting piece 410, when mount pad 100 atress, interval 201 can make mount pad 100 swing in certain direction, make mount pad 100 form the floating effect, thereby when test head 600 pegs graft mutually with the electronic product interface, certain buffering effect has, protect this test head mounting structure, improve this test head mounting structure's life, simultaneously, also can protect test head 600 and electronic product interface.
According to some embodiments of the present application, the mounting seat 100 and the slider 200 are both provided with the mounting hole 220, the connecting element 410 can swing in the mounting hole 220 in the slider 200, so as to drive the mounting seat 100 to swing, and in addition, the mounting seat 100 can also swing relative to the connecting element 410, and it can be understood that the swing angle of the mounting seat 100 in this embodiment is larger.
According to some embodiments of the application, only the mounting seat 100 is provided with the mounting hole 220, and the slider 200 is fixedly connected with the connecting piece 410, that is, the mounting seat 100 can swing relative to the connecting piece 410 through the gap 201 between the mounting seat 100 and the mounting hole 220, so that a floating effect is achieved, and as the part of the connecting piece 410 is fixedly connected with the slider 200, the mounting seat 100 in the embodiment swings more stably, and the test head mounting structure is more stable.
According to some embodiments of the present application, only the slider 200 is provided with the mounting hole 220, and the mounting base 100 and the connecting member 410 are fixedly connected, that is, the connecting member 410 can swing in the mounting hole 220 to drive the mounting base 100 to swing, it can be understood that the mounting base 100 in this embodiment swings more stably, and since the connecting member 410 has a certain length, the swing angle of the mounting base 100 in this embodiment is relatively large.
In addition, the fixing base 300 is connected with the slider 200 through the buffering assembly 500, and it can be understood that the test head mounting structure tests an electronic product interface, and when the electronic product interface is plugged with the test head 600, the mounting base 100 generates a horizontal force on the fixing base 300 through the connecting piece 410, the slider 200 and the buffering assembly 500, wherein the buffering assembly 500 can buffer one of the forces, so as to further protect the test head mounting structure and further improve the service life of the test head mounting structure.
According to some embodiments of the present application, the slider 200 is provided with a mounting hole 220, and one end of the connecting member 410 is movably connected to the slider 200 through the mounting hole 220, and the other end is fixedly connected to the mounting base 100.
As shown in fig. 2, the slider 200 is provided with a mounting hole 220, and the connecting member 410 can swing within the gap 201 to drive the mounting base 100 to swing, it can be understood that the mounting base 100 in this embodiment swings more stably, and because the connecting member 410 has a certain length, the swing angle of the mounting base 100 is also larger.
According to some embodiments of the present application, one end of the connecting member 410 is provided with a fixing head 411, the fixing head 411 is located in the mounting hole 220, a reducing structure 210 is formed in the mounting hole 220, and the size of the fixing head 411 is larger than the caliber of the reducing structure 210.
As shown in fig. 2, a fixing head 411 is formed at one end of the connecting element 410, the size of the fixing head 411 is larger relative to the other positions of the connecting element 410, one end of the mounting hole 220 is opened, the connecting element 410 enables the fixing head 411 to be located in the mounting hole 220 through the opening, a reducing structure 210 is formed in the mounting hole 220, the caliber of the reducing structure 210 is smaller than the size of the fixing head 411, the fixing head 411 cannot leave the mounting hole 220, and one end of the connecting element 410 is fixed in the mounting hole 220 of the slider 200. In addition, a space 201 is formed between the slider 200 and the connecting member 410 at a position corresponding to the throat structure 210.
According to some embodiments of the present application, the test head mounting structure further includes a first elastic member 420, one end of the first elastic member 420 is connected to the slider 200, and the other end is connected to the connecting member 410 or the mounting base 100, and the connecting member 410 can slide in the mounting hole 220 along the axial direction of the mounting hole 220.
When testing the electronic product interface, the mounting base 100 pushes the connecting element 410 to slide in the mounting hole 220, and in addition, one end of the first elastic element 420 is connected to the slider 200, and the other end is connected to the connecting element 410 or the mounting base 100.
It is understood that if the other end of the first elastic member 420 is connected to the mounting base 100. The connecting member 410 slides in the mounting hole 220, so that the mounting base 100 and the slider 200 are gradually close to each other, due to the elastic force of the first elastic member 420, the first elastic member 420 can generate a thrust force for driving the mounting base 100 and the slider 200 to be away from each other, so that a buffering effect is achieved, and the first elastic member 420 can achieve an effect of resetting the mounting base 100.
It can be understood that, if the other end of the first elastic member 420 is connected to the connection member 410, specifically, the first elastic member 420 is disposed in the mounting hole 220, one end is connected to the inner wall of the mounting hole 220, and the other end is connected to the connection member 410. The connecting piece 410 slides in the mounting hole 220, and because the elastic action of the first elastic piece 420, the resistance that prevents the connecting piece 410 from continuing to slide in the mounting hole 220 can be generated, so that a buffering effect is achieved, and the first elastic piece 420 can achieve the effect of enabling the connecting piece 410 to reset, so that the mounting base 100 is driven to reset.
According to some embodiments of the present disclosure, the test head mounting structure further includes a first elastic member 420, two ends of the connecting member 410 are rotatably connected to the slider 200 and the mounting base 100, respectively, the first elastic member 420 is sleeved on the connecting member 410, and two ends of the first elastic member 420 are connected to the slider 200 and the fixing base 300, respectively.
As shown in fig. 1 to 2, one end of the connecting member 410 is connected to the mounting base 100 through a screw thread, and the other end is located in the mounting hole 220, so that the mounting base 100 can rotate along the axis of the connecting member 410 by a certain angle, the angle at which the mounting base 100 can buffer is increased, and the buffering effect of the mounting base 100 is improved.
It can be understood that, when the detection structure tests the interface of the electronic product, if the mounting base 100 receives the force of the circumferential direction of the connecting member 410, the mounting base 100 can rotate by a certain angle, the first elastic member 420 can buffer the mounting base 100, and in addition, because the two ends of the first elastic member 420 are connected to the floating block 200 and the fixing base 300, the first elastic member 420 can reset the mounting base 100 through its own torsion.
For example, the first elastic member 420 is a spring.
According to some embodiments of the present application, the connecting element 410 is a limit screw, and the screw head of the limit screw is the fixing head 411, and one end of the limit screw having the screw head is connected to the slider 200. The end of the limiting head with threads is in threaded connection with the mounting base 100, and it can be understood that the limiting head is not locked when in threaded connection with the mounting base 100, so that the mounting base 100 can have a certain steering angle.
According to some embodiments of the present application, the buffering assembly 500 includes a second elastic member 530, and two ends of the second elastic member 530 respectively abut against the slider 200 and the fixing base 300.
As shown in fig. 1, the slider 200 is connected to the anchor 300 by the second elastic member 530, and when the slider 200 moves toward the anchor 300, the second elastic member 530 cushions the slider 200.
For example, the second elastic member 530 is a spring.
According to some embodiments of the present disclosure, the buffer assembly 500 further includes a guide pillar 510 and a guide sleeve 520, one of the slider 200 and the fixing base 300 is fixedly connected to the guide sleeve 520, the other is fixedly connected to one end of the guide pillar 510, the other end of the guide pillar 510 is disposed through the guide sleeve 520, and the second elastic element 530 is disposed on the guide pillar 510 in a sleeved manner.
As shown in fig. 1, the guide sleeve 520 is embedded in one of the slider 200 and the fixing base 300, one end of the guide post 510 is fixed to the other end, and the other end is inserted into the guide sleeve 520. It will be appreciated that the guide sleeve 520, in cooperation with the guide post 510, makes the coupling of the slider 200 to the anchor 300 more stable, and makes the slider 200 more stable when moving in a horizontal direction.
According to some embodiments of the present application, the mounting base 100 is formed with a mounting platform 110, and the mounting platform 110 is used for mounting the test head 600.
As shown in fig. 3, the upper end of the mounting seat 100 is formed with a mounting platform 110.
According to some embodiments of the present application, the mounting seat 100 is opened with a mounting groove 120 along the height direction, and the mounting groove 120 is used for mounting the test head 600.
Some of the electronic product interfaces will be arranged in the vertical direction, so that the test head 600 also needs to be installed on the installation base 100 in the vertical direction, as shown in fig. 4, and the installation groove 120 can better fix the test head 600.
It can be understood that, since the test head 600 has a certain length, the corresponding mounting grooves 120 on the slider 200 and the fixing base 300 are also formed with grooves corresponding to the mounting grooves 120, so that the test head 600 can be conveniently mounted on the test head mounting structure, and the test head 600 is further stably fixed.
The test device according to the embodiment of the second aspect of the application comprises the test head mounting structure with the self-adaptive floating effect and the buffering effect.
The test device according to the embodiment of the second aspect of the present application has at least the following advantages: including above-mentioned test head mounting structure who has self-adaptation floating effect and buffering effect's whole beneficial effect.
The embodiments of the present application have been described in detail with reference to the drawings, but the present application is not limited to the embodiments, and various changes can be made within the knowledge of those skilled in the art without departing from the gist of the present application. Furthermore, the embodiments and features of the embodiments of the present application may be combined with each other without conflict.
Claims (10)
1. Test head mounting structure with effect and buffering effect are floated to self-adaptation, its characterized in that includes:
the mounting seat is used for fixing the test head;
the floating block is connected with the mounting seat through a connecting piece, at least one of the floating block and the mounting seat is provided with a mounting hole, the connecting piece is arranged in the mounting hole in a penetrating manner, and a gap is formed between the connecting piece and the inner wall of the mounting hole, so that the floating block and/or the mounting seat can move relative to the connecting piece through the gap;
and a buffer component is arranged between the fixed seat and the floating block.
2. The mounting structure of a test head with adaptive floating effect and buffering effect as claimed in claim 1, wherein said mounting hole is opened in said slider, one end of said connecting member is movably connected to said slider through said mounting hole, and the other end is fixedly connected to said mounting seat.
3. The mounting structure of a test head with adaptive floating effect and buffering effect as claimed in claim 2, wherein a fixing head is provided at one end of the connecting member, the fixing head is located in the mounting hole, a throat structure is formed in the mounting hole, and the size of the fixing head is larger than the caliber of the throat structure.
4. The structure of claim 2, further comprising a first elastic member, wherein one end of the first elastic member is connected to the slider, and the other end of the first elastic member is connected to the connecting member or the mounting base, and the connecting member can slide in the mounting hole along the axial direction of the mounting hole.
5. The mounting structure of claim 4, wherein two ends of the connecting member are rotatably connected to the slider and the mounting seat, respectively, the first elastic member is sleeved on the connecting member, and two ends of the first elastic member are connected to the slider and the fixing seat, respectively.
6. The mounting structure of claim 1, wherein the buffer assembly comprises a second elastic member, and two ends of the second elastic member respectively abut against the slider and the fixing base.
7. The mounting structure of testing head with adaptive floating effect and buffering effect as claimed in claim 6, wherein said buffering assembly further comprises a guide pillar and a guide sleeve, one of said floating block and said fixing base is fixedly connected to said guide sleeve, the other of said floating block and said fixing base is fixedly connected to one end of said guide pillar, the other end of said guide pillar is inserted into said guide sleeve, and said second elastic member is sleeved on said guide pillar.
8. The mounting structure of a test head with adaptive floating effect and buffering effect as claimed in claim 1, wherein said mounting base is formed with a mounting platform for mounting the test head.
9. The mounting structure of a test head with adaptive floating effect and buffering effect as claimed in claim 1, wherein the mounting seat has a mounting groove along the height direction, and the mounting groove is used for mounting the test head.
10. A test apparatus comprising the test head mounting structure having the adaptive floating effect and the buffering effect according to any one of claims 1 to 9.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202122210883.7U CN215986182U (en) | 2021-09-13 | 2021-09-13 | Test head mounting structure and testing arrangement with effect and buffering effect are floated to self-adaptation |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202122210883.7U CN215986182U (en) | 2021-09-13 | 2021-09-13 | Test head mounting structure and testing arrangement with effect and buffering effect are floated to self-adaptation |
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| CN215986182U true CN215986182U (en) | 2022-03-08 |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114779051A (en) * | 2022-04-29 | 2022-07-22 | 深圳格芯集成电路装备有限公司 | Chip pressure equipment |
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2021
- 2021-09-13 CN CN202122210883.7U patent/CN215986182U/en active Active
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114779051A (en) * | 2022-04-29 | 2022-07-22 | 深圳格芯集成电路装备有限公司 | Chip pressure equipment |
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