CN213210263U - Oscilloscope probe switching device - Google Patents
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- CN213210263U CN213210263U CN202022242660.4U CN202022242660U CN213210263U CN 213210263 U CN213210263 U CN 213210263U CN 202022242660 U CN202022242660 U CN 202022242660U CN 213210263 U CN213210263 U CN 213210263U
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Abstract
The application discloses oscilloscope probe auto-change over device, oscilloscope probe auto-change over device includes signal generation module and probe switch module, signal generation module is used for producing control command, probe switch module is used for receiving control command to control the relation of connection between its first port and a plurality of second port, because the test channel of oscilloscope is connected to first port, and a plurality of second port then connect the different test points of equipment to be tested respectively, realized promptly under the circumstances of not getting up and down again that the switch function between the test channel of the oscilloscope that realizes first port connection and the different test points of equipment to be tested, realized promptly under the circumstances of not getting up and down again that the purpose of changing the equipment to be tested test point that oscilloscope probe connects has also expanded the limited test channel of oscilloscope.
Description
Technical Field
The application relates to the technical field of instruments and meters, in particular to an oscilloscope probe switching device.
Background
An Oscilloscope (Oscilloscope) is an electronic measuring instrument with wide application, can convert an electric signal invisible to the naked eye into a visible image, and is convenient for people to research the change process of various electric phenomena.
Generally, the number of channels of oscilloscopes used in various laboratories is limited, and generally, the oscilloscopes are four channels, when more than four parameter waveforms need to be measured in a certain experiment, the four-channel oscilloscopes appear to be somewhat complicated, and if the experiment is interrupted in the experiment process, the probe position is changed after power is turned off, and data is collected once again, inconvenience is caused (for example, the device to be measured may be inconvenient to power on and off, or the probe position may need to be changed by detaching the module again and then building up the module again).
Therefore, how to expand the limited scope channels without powering up or down again becomes one of the research directions for those skilled in the art.
SUMMERY OF THE UTILITY MODEL
In order to solve the technical problem, the application provides an oscilloscope probe switching device to realize the purpose of replacing the test point of the equipment to be tested connected with the oscilloscope probe under the condition of not powering on and powering off again.
In order to achieve the technical purpose, the embodiment of the application provides the following technical scheme:
an oscilloscope probe switching apparatus comprising: the device comprises a signal generating module and a probe switching module; wherein the content of the first and second substances,
the probe switching module comprises a receiving end, a first port and a plurality of second ports, wherein the first port is used for connecting a test channel of the oscilloscope, the second port is used for connecting a test port of the device to be tested, the receiving end is used for receiving a control instruction, and the probe switching module is used for controlling the conduction of the second port corresponding to the control instruction and the first port when receiving the control instruction;
and the signal generation module is used for generating the control instruction.
Optionally, the probe switching module includes two of the second ports.
Optionally, the control instruction includes a first instruction and a second instruction, and the first instruction and the second instruction respectively correspond to the two second ports one to one.
Optionally, the probe switching module includes: a radio frequency coaxial switch;
the radio frequency coaxial switch comprises a first input end, a second input end, a first port and two second ports;
the first input end is used for receiving the first instruction, and the second input end is used for receiving the second instruction;
the two second ports are respectively used for connecting the two test ports of the device to be tested.
Optionally, the radio frequency coaxial switch module further includes: a ground terminal;
the ground terminal is used for ground potential.
Optionally, the signal generating module includes: a first signal generating branch and a second signal generating branch;
the input end of the first signal generating branch circuit is electrically connected with the input end of the second signal generating branch circuit and used for receiving an input signal; the input signals comprise first type signals and second type signals;
the first signal generating branch is used for generating the first instruction when the input signal is a first type signal;
the second signal generating branch is used for generating the second instruction when the input signal is a second type signal.
Optionally, the first signal generating branch comprises: the first capacitor, the first resistor and the first switch tube; wherein the content of the first and second substances,
one end of the first capacitor is used as an input end of the first signal generation branch circuit, and the other end of the first capacitor is electrically connected with one end of the first resistor and the control end of the first switching tube;
the other end of the first resistor and the first end of the first switching tube are used for receiving a working power supply;
the second end of the first switch tube is used as the output end of the first signal generation branch;
the first type of signal is a high level signal.
Optionally, the second signal generating branch comprises: the inverter, the second capacitor, the second resistor and the second switching tube; wherein the content of the first and second substances,
the input end of the phase inverter is used as the input end of the second signal generation branch circuit, and the output end of the phase inverter is electrically connected with one end of the second capacitor; the other end of the second capacitor is electrically connected with one end of the second resistor and the control end of the second switch tube;
the other end of the second resistor is electrically connected with the first end of the second switching tube and used for receiving a working power supply;
the second end of the second switch tube is used as the output end of the second signal generation branch;
the second type of signal is a low level signal.
Optionally, the first switch tube and the second switch tube are both P-type MOS tubes.
From the technical scheme, the embodiment of the application provides an oscilloscope probe switching device, the oscilloscope probe switching device comprises a signal generation module and a probe switching module, wherein the signal generation module is used for generating a control instruction, the probe switching module is used for receiving the control instruction and controlling the connection relation between the first port and the plurality of second ports, because the first port is connected with the test channel of the oscilloscope, and the plurality of second ports are respectively connected with different test points of the device to be tested, namely, the switching function between the test channel of the oscilloscope connected with the first port and different test points of the equipment to be tested is realized under the condition of not powering on and powering off again, the purpose of replacing the test point of the device to be tested connected with the oscilloscope probe under the condition of not powering on and powering off again is achieved, and the limited test channel of the oscilloscope is expanded.
Drawings
In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings needed to be used in the description of the embodiments or the prior art will be briefly introduced below, it is obvious that the drawings in the following description are only embodiments of the present application, and for those skilled in the art, other drawings can be obtained according to the provided drawings without creative efforts.
FIG. 1 is a schematic diagram of a test connection relationship of an oscilloscope in the prior art;
FIG. 2 is a schematic diagram of a connection relationship for implementing a multi-test point test in the prior art;
FIG. 3 is a schematic diagram of another connection relationship for implementing multi-test point testing in the prior art;
fig. 4 is a schematic structural diagram of an oscilloscope probe switching apparatus according to an embodiment of the present application;
fig. 5 is a schematic structural diagram of an oscilloscope probe switching device according to another embodiment of the present application;
fig. 6 is a schematic diagram of a radio frequency coaxial switch according to an embodiment of the present application;
fig. 7 is a schematic structural diagram of a signal generation module according to an embodiment of the present application;
fig. 8 is a flowchart illustrating an oscilloscope probe switching method according to an embodiment of the present application.
Detailed Description
As described in the background art, as shown in fig. 1, the number of test channels of an oscilloscope is often quite limited, and when the number of test points of a device to be tested is large (for example, includes 8 test points, respectively, test points 1 to 8) and exceeds the number of test channels of the oscilloscope, if it is necessary to avoid the operation of changing a probe by powering on and powering off again, a plurality of oscilloscopes (such as two oscilloscopes (oscilloscope 1 and oscilloscope 2) shown in fig. 2) are often required or an oscilloscope with a large number of test channels (such as a multi-channel oscilloscope shown in fig. 3) is adopted, as shown in fig. 2 and fig. 3 respectively, the test modes shown in fig. 2 and fig. 3 greatly increase the test cost, most laboratories do not have a plurality of oscilloscopes or multi-channel oscilloscopes, and it is difficult to meet.
In view of this, an embodiment of the present application provides an oscilloscope probe switching apparatus, including: the device comprises a signal generating module and a probe switching module; wherein the content of the first and second substances,
the probe switching module comprises a receiving end, a first port and a plurality of second ports, wherein the first port is used for connecting a test channel of the oscilloscope, the second port is used for connecting a test port of the device to be tested, the receiving end is used for receiving a control instruction, and the probe switching module is used for controlling the conduction of the second port corresponding to the control instruction and the first port when receiving the control instruction;
and the signal generation module is used for generating the control instruction.
The oscilloscope probe switching device comprises a signal generation module and a probe switching module, wherein the signal generation module is used for generating a control instruction, the probe switching module is used for receiving the control instruction and controlling the connection relation between a first port and a plurality of second ports of the probe switching module, the first port is connected with a test channel of the oscilloscope, and the plurality of second ports are respectively connected with different test points of the equipment to be tested, so that the switching function between the test channel of the oscilloscope connected with the first port and the different test points of the equipment to be tested is realized under the condition of no power-on and power-off again, the purpose of replacing the test points of the equipment to be tested connected with the oscilloscope probe is realized under the condition of no power-on and power-off again, and the limited test channel of the oscilloscope is also expanded.
The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are only a part of the embodiments of the present application, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
The embodiment of the present application provides an oscilloscope probe switching device, as shown in fig. 4, including: the signal generating module 10 and the probe switching module 20; wherein the content of the first and second substances,
the probe switching module 20 includes a receiving end, a first port 21 and a plurality of second ports 22, where the first port 21 is used to connect to a test channel 31 of the oscilloscope 30, the second port 22 is used to connect to a test port of a device to be tested, the receiving end is used to receive a control instruction, and the probe switching module 20 is used to control the second port 22 corresponding to the control instruction to be conducted with the first port 21 when receiving the control instruction;
the signal generating module 10 is configured to generate the control instruction.
In this embodiment, after the signal generating module 10 generates the control instruction according to the user requirement, the control instruction is received by the probe switching module 20, and the probe switching module 20 controls the conduction of the second port 22 corresponding to the control instruction and the first port 21 according to the control instruction, so as to achieve the purpose of switching between different second ports 22 and the test channel 31 of the oscilloscope 30, and achieve the purpose of switching the test channel 31 of the oscilloscope 30 without powering on or powering off again.
The correspondence relationship between the control command and the second port 22 may be that the plurality of second ports 22 are numbered, so that the plurality of second ports 22 have respective corresponding serial numbers, for example, the serial numbers of the plurality of second ports 22 are respectively 1, 2, 3, etc., when the control command is generated, the control command may include corresponding serial number information (e.g., 1, 2, 3, etc.), and at this time, the control command including serial number information 1 corresponds to the second port 22 with serial number 1.
In addition, the number of the receiving ends may be multiple, the control instruction is distinguished according to a transmission manner to different receiving ends, for example, the receiving ends include a first receiving end, a second receiving end, and a third receiving end, when the control instruction is transmitted to the probe switching module 20 through the first receiving end, one of the second ports 22 is correspondingly controlled to be in communication with the first port 21, when the control instruction is transmitted to the probe switching module 20 through the second receiving end, the other of the second ports 22 is correspondingly controlled to be in communication with the first port 21, and when the control instruction is transmitted to the probe switching module 20 through the third receiving end, the remaining one of the second ports 22 is correspondingly controlled to be in communication with the first port 21.
In fig. 4, the number of the second ports 22 is illustrated as 3, and in other embodiments of the present application, the number of the second ports 22 may also be 2, 4, 5, and the like, which is not limited in the present application.
However, it should be noted that, since the number of the test channels 31 of the oscilloscope 30 connected to the first port 21 is one, the number of the second ports 22 communicated with the first port 21 at the same time is only one.
In summary, in the present embodiment, the probe switching apparatus of the oscilloscope 30 comprises a signal generating module 10 and a probe switching module 20, the signal generating module 10 is used for generating a control command, the probe switching module 20 is used for receiving the control command and controlling the connection relationship between the first port 21 and the plurality of second ports 22, since the first port 21 is connected to the test channel 31 of the oscilloscope 30, and the plurality of second ports 22 are respectively connected to different test points of the device under test, namely, the switching function between the test channel 31 of the oscilloscope 30 connected with the first port 21 and different test points of the device to be tested is realized under the condition of not powering on and powering off again, the purpose of replacing the test point of the device to be tested connected with the probe of the oscilloscope 30 is realized under the condition of not powering on and powering off again, and the limited test channel 31 of the oscilloscope 30 is also expanded.
On the basis of the above embodiments, in an embodiment of the present application, referring to fig. 5, the probe switching module 20 includes two second ports 22.
That is, in the present embodiment, the second port 22 is described as an example of two ports.
Correspondingly, the control instruction includes a first instruction and a second instruction, and the first instruction and the second instruction respectively correspond to the two second ports 22 one to one.
When the probe switching module 20 includes two of the second ports 22, referring to fig. 6, the probe switching module 20 may include: a radio frequency coaxial switch;
the radio frequency coaxial switch comprises a first input VO1, a second input VO2, a first port 21 and two second ports 22;
the first input VO1 is used for receiving the first instruction, and the second input VO2 is used for receiving the second instruction;
the two second ports 22 are respectively used for connecting two test ports of the device under test.
The radio frequency coaxial switch has good isolation, insertion loss and standing wave performance and high power tolerance, and can control the communication between the two first ports 21 and the second port 22 by only one high-level signal. Still referring to fig. 5, when the first input VO1 receives a high level pulse signal, the second port 22 labeled P1 is connected to the first port 21, and the second port 22 labeled P1 is connected to the test channel 31 of the oscilloscope 30, and this state is maintained, only when the second input VO2 receives a high level pulse signal, the second port 22 labeled P2 is connected to the first port 21, and the second port 22 labeled P2 is connected to the test channel 31 of the oscilloscope 30.
Still referring to fig. 6, the rf coaxial switch module further comprises: a ground terminal GND;
the ground GND is used for ground potential.
The grounding end GND is used for providing ground potential for the radio frequency coaxial switch module and can be connected with a shell of the radio frequency coaxial switch to realize integral protection.
On the basis of the above-mentioned embodiment, in another embodiment of the present application, as shown in fig. 7, the signal generating module 10 includes: a first signal generating branch 11 and a second signal generating branch 12;
the input end of the first signal generating branch 11 is electrically connected with the input end of the second signal generating branch 12, and is used for receiving an input signal; the input signals comprise first type signals and second type signals;
the first signal generating branch 11 is configured to generate the first instruction when the input signal is a first type signal;
the second signal generating branch 12 is configured to generate the second instruction when the input signal is a second type signal.
Alternatively, still referring to fig. 7, the first signal generating branch 11 includes: the first capacitor C1, the first resistor R1 and the first switch tube Q1; wherein the content of the first and second substances,
one end of the first capacitor C1 is used as the input end of the first signal generating branch 11, and the other end of the first capacitor C1 is electrically connected to one end of the first resistor R1 and the control end of the first switch Q1;
the other end of the first resistor R1 and the first end of the first switch tube Q1 are used for receiving working power supply;
a second end of the first switching tube Q1 is used as an output end of the first signal generating branch 11;
the first type of signal is a high level signal.
Optionally, the first switching tube Q1 is a P-type MOS tube.
Alternatively, still referring to fig. 7, the second signal generating branch 12 includes: the inverter F1, the second capacitor C2, the second resistor R2 and the second switch tube Q2; wherein the content of the first and second substances,
the input end of the inverter F1 is used as the input end of the second signal generating branch 12, and the output end of the inverter F1 is electrically connected with one end of the second capacitor C2; the other end of the second capacitor C2 is electrically connected to one end of the second resistor R2 and the control end of the second switch tube Q2;
the other end of the second resistor R2 is electrically connected with the first end of the second switch tube Q2 and is used for receiving working power supply;
a second end of the second switching tube Q2 is used as an output end of the second signal generating branch 12;
the second type of signal is a low level signal.
Optionally, the second switching tube Q2 is a P-type MOS tube.
In fig. 7, VCC denotes the operating power supply, and Sctr denotes the input signal.
That is, in the signal generating module shown in fig. 7, when the first type signal is input to the signal generating module as the input signal, the first capacitor C1 is charged, the polarity of the right end (in the direction toward fig. 7) of the first capacitor C1 is negative, the first switch tube Q1 is turned on, the first signal generating branch 11 outputs a high level, when the first capacitor C1 is full, the branch in which the first capacitor C1 is located is equivalent to an open circuit, the first resistor R1 connected to the control electrode of the first switch tube Q1 is connected to the working power supply as a pull-up resistor, the control electrode of the first switch tube Q1 is at a high level, the first switch tube Q1 is turned off, and the first signal generating branch 11 outputs a high level pulse as the first command.
For the second signal generating branch 12, the high-level first-type signal passes through an inverter F1, the left end of the second capacitor C2 is at a low level, and the right end is connected to a second resistor R2 as a pull-up resistor to the working power supply, i.e., at this time, the control electrode of the second switch tube Q2 is at a high level, the second switch tube Q2 is turned off, the second signal generating branch 12 outputs a low level, and when the second capacitor C2 is fully charged, the control electrode of the second switch tube Q2 is still at a high level, so the output of the second signal generating branch 12 is always at a low level.
When the second type of signal is input to the signal generating module as the input signal, the second type of signal passes through an inverter F1, the second capacitor C2 is charged, the polarity of the right end of the second capacitor C2 is negative, the second switch tube Q2 is turned on at this time, the second signal generating branch 12 outputs a high level, after the second capacitor C2 is fully charged, the branch where the second capacitor C2 is located is equivalent to an open circuit, the second resistor R2 connected to the control electrode of the second switch tube Q2 is connected to the working power supply as a pull-up resistor, the control electrode of the second switch tube Q2 is at a high level at this time, the second switch tube Q2 is turned off, and at this time, the second signal generating branch 12 outputs a high level pulse as the second command.
For the first signal generating branch 11, the left end of the first capacitor C1 is at a low level, and the right end is connected to a first resistor R1 as a pull-up resistor to the working power supply, that is, the control electrode of the first switch transistor Q1 is at a high level, the first switch transistor Q1 is turned off, the first signal generating branch 11 outputs a low level, and when the first capacitor C1 is fully charged, the control electrode of the first switch transistor Q1 is still at a high level, so the output of the first signal generating branch 11 is always at a low level.
The following describes an oscilloscope probe switching method provided by the embodiment of the present application, and the oscilloscope probe switching method described below may be referred to in correspondence with the oscilloscope probe switching apparatus described above.
Correspondingly, an embodiment of the present application further provides an oscilloscope probe switching method, as shown in fig. 8, which is implemented based on the oscilloscope probe switching apparatus according to any one of the embodiments, and the oscilloscope probe switching method includes:
s101: connecting a first port of a probe switching module with a test channel of an oscilloscope, and respectively connecting a plurality of second ports of the probe switching device with a plurality of test ports of equipment to be tested;
s102: and generating a control instruction by using the signal generation module so that the probe switching module controls the conduction of the second port corresponding to the control instruction and the first port.
In summary, the embodiment of the present application provides an oscilloscope probe switching device, which includes a signal generating module and a probe switching module, the signal generating module is used for generating a control instruction, the probe switching module is used for receiving the control instruction and controlling the connection relation between the first port and the plurality of second ports, because the first port is connected with the test channel of the oscilloscope, and the plurality of second ports are respectively connected with different test points of the device to be tested, namely, the switching function between the test channel of the oscilloscope connected with the first port and different test points of the equipment to be tested is realized under the condition of not powering on and powering off again, the purpose of replacing the test point of the device to be tested connected with the oscilloscope probe under the condition of not powering on and powering off again is achieved, and the limited test channel of the oscilloscope is expanded.
Features described in the embodiments in the present specification may be replaced with or combined with each other, each embodiment is described with a focus on differences from other embodiments, and the same and similar portions among the embodiments may be referred to each other.
The previous description of the disclosed embodiments is provided to enable any person skilled in the art to make or use the present application. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the generic principles defined herein may be applied to other embodiments without departing from the spirit or scope of the application. Thus, the present application is not intended to be limited to the embodiments shown herein but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.
Claims (9)
1. An oscilloscope probe switching apparatus, comprising: the device comprises a signal generating module and a probe switching module; wherein the content of the first and second substances,
the probe switching module comprises a receiving end, a first port and a plurality of second ports, wherein the first port is used for connecting a test channel of the oscilloscope, the second port is used for connecting a test port of the device to be tested, the receiving end is used for receiving a control instruction, and the probe switching module is used for controlling the conduction of the second port corresponding to the control instruction and the first port when receiving the control instruction;
and the signal generation module is used for generating the control instruction.
2. The oscilloscope probe switching apparatus according to claim 1, wherein the probe switching module comprises two of said second ports.
3. The oscilloscope probe switching apparatus according to claim 2, wherein the control instruction comprises a first instruction and a second instruction, and the first instruction and the second instruction correspond to the two second ports one-to-one, respectively.
4. The oscilloscope probe switching apparatus according to claim 3, wherein the probe switching module comprises: a radio frequency coaxial switch;
the radio frequency coaxial switch comprises a first input end, a second input end, a first port and two second ports;
the first input end is used for receiving the first instruction, and the second input end is used for receiving the second instruction;
the two second ports are respectively used for connecting the two test ports of the device to be tested.
5. The oscilloscope probe switching apparatus according to claim 4, wherein the radio frequency coaxial switch module further comprises: a ground terminal;
the ground terminal is used for ground potential.
6. The oscilloscope probe switching apparatus according to claim 3, wherein the signal generating module comprises: a first signal generating branch and a second signal generating branch;
the input end of the first signal generating branch circuit is electrically connected with the input end of the second signal generating branch circuit and used for receiving an input signal; the input signals comprise first type signals and second type signals;
the first signal generating branch is used for generating the first instruction when the input signal is a first type signal;
the second signal generating branch is used for generating the second instruction when the input signal is a second type signal.
7. The oscilloscope probe switching apparatus according to claim 6, wherein the first signal generating branch comprises: the first capacitor, the first resistor and the first switch tube; wherein the content of the first and second substances,
one end of the first capacitor is used as an input end of the first signal generation branch circuit, and the other end of the first capacitor is electrically connected with one end of the first resistor and the control end of the first switching tube;
the other end of the first resistor and the first end of the first switching tube are used for receiving a working power supply;
the second end of the first switch tube is used as the output end of the first signal generation branch;
the first type of signal is a high level signal.
8. The oscilloscope probe switching apparatus according to claim 7, wherein the second signal generating branch comprises: the inverter, the second capacitor, the second resistor and the second switching tube; wherein the content of the first and second substances,
the input end of the phase inverter is used as the input end of the second signal generation branch circuit, and the output end of the phase inverter is electrically connected with one end of the second capacitor; the other end of the second capacitor is electrically connected with one end of the second resistor and the control end of the second switch tube;
the other end of the second resistor is electrically connected with the first end of the second switching tube and used for receiving a working power supply;
the second end of the second switch tube is used as the output end of the second signal generation branch;
the second type of signal is a low level signal.
9. The oscilloscope probe switching device according to claim 8, wherein the first switching tube and the second switching tube are both P-type MOS tubes.
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| CN202022242660.4U CN213210263U (en) | 2020-10-10 | 2020-10-10 | Oscilloscope probe switching device |
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| CN202022242660.4U CN213210263U (en) | 2020-10-10 | 2020-10-10 | Oscilloscope probe switching device |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114076901A (en) * | 2021-11-15 | 2022-02-22 | 四川九洲电器集团有限责任公司 | Automatic testing system and method for power module output ripple |
| WO2023115627A1 (en) * | 2021-12-24 | 2023-06-29 | 上海御渡半导体科技有限公司 | Detection apparatus and method for ate test channel |
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2020
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114076901A (en) * | 2021-11-15 | 2022-02-22 | 四川九洲电器集团有限责任公司 | Automatic testing system and method for power module output ripple |
| CN114076901B (en) * | 2021-11-15 | 2022-10-21 | 四川九洲电器集团有限责任公司 | Automatic testing system and method for output ripples of power supply module |
| WO2023115627A1 (en) * | 2021-12-24 | 2023-06-29 | 上海御渡半导体科技有限公司 | Detection apparatus and method for ate test channel |
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