CN110609260B - T/R module test circuit - Google Patents

T/R module test circuit Download PDF

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Publication number
CN110609260B
CN110609260B CN201911025746.7A CN201911025746A CN110609260B CN 110609260 B CN110609260 B CN 110609260B CN 201911025746 A CN201911025746 A CN 201911025746A CN 110609260 B CN110609260 B CN 110609260B
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circuit
channel control
module
control signal
signal
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CN110609260A (en
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龚小娟
胡国庆
王兴政
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Beijing Institute of Radio Measurement
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Beijing Institute of Radio Measurement
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01SRADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S7/00Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
    • G01S7/02Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S13/00
    • G01S7/40Means for monitoring or calibrating
    • G01S7/4004Means for monitoring or calibrating of parts of a radar system

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  • Engineering & Computer Science (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

The invention relates to the field of T/R module test, in particular to a T/R module test circuit, which comprises: the device comprises an input signal conversion circuit, a programmable logic circuit, a public channel control circuit, a receiving channel control circuit, a transmitting channel control circuit, an output interface connecting device, a clock circuit and a power circuit; the input signal conversion circuit, the clock circuit and the power circuit are all connected with the programmable logic circuit, and the programmable logic circuit is connected with the output interface connecting device through the public channel control circuit, the receiving channel control circuit and the transmitting channel control circuit. By the T/R module test circuit, the serial port output signal of the computer can be utilized to control the T/R module test circuit to output the receiving channel control signal and the transmitting channel control signal required by the normal work of the T/R module, the index data of the T/R module in the receiving and transmitting states can be tested respectively, the state switching is simple and easy, and the test efficiency is high.

Description

T/R module test circuit
Technical Field
The invention relates to the field of T/R module testing, in particular to a T/R module testing circuit.
Background
The T/R component is the most basic and most critical active component of the solid-state active phased array radar, and generally comprises a plurality of paths of T/R modules, so that the test of the T/R modules is an important step in the test flow of the T/R component, and the test result has important influence on the product quality of the T/R component. In order to ensure the normal working performance of the T/R module, the output index of the T/R module needs to be tested.
When a traditional T/R module is tested, a control signal is generally required to be externally connected to a pulse signal source and a signal switch control panel, the TR module is controlled to work by changing the signal state, but the state switching of the testing mode is complicated, and the testing efficiency is low.
Disclosure of Invention
The invention aims to solve the technical problem in the prior art and provides a T/R module test circuit.
To solve the above technical problem, an embodiment of the present invention provides a T/R module test circuit, including: the device comprises an input signal conversion circuit, a programmable logic circuit, a public channel control circuit, a receiving channel control circuit, a transmitting channel control circuit, an output interface connecting device, a clock circuit and a power circuit;
the input signal conversion circuit, the clock circuit and the power circuit are all connected with the programmable logic circuit, the programmable logic circuit is connected with the public channel control circuit, the receiving channel control circuit and the transmitting channel control circuit, and the public channel control circuit, the receiving channel control circuit and the transmitting channel control circuit are connected with the output interface connecting device.
The invention has the beneficial effects that: the T/R module test circuit can utilize the serial port output signal of the computer to control the T/R module test circuit to output a receiving channel control signal and a transmitting channel control signal required by the normal work of the T/R module, and respectively test the index data of the T/R module in the receiving and transmitting states, and the state switching is simple and easy, the power-up test is convenient and fast, and the test efficiency is high.
On the basis of the technical scheme, the invention can be further improved as follows.
Furthermore, the input signal conversion circuit is connected with a computer and is used for realizing data communication with the computer;
the programmable logic circuit is used for generating different control signals according to the serial port output signals converted by the input signal conversion circuit and respectively sending the different control signals to the public channel control circuit, the receiving channel control circuit and the transmitting channel control circuit;
the public channel control circuit is used for generating a public channel control signal according to the received control signal; the receiving channel control circuit is used for generating a receiving channel control signal according to the received control signal; the transmitting channel control circuit is used for generating a transmitting channel control signal according to the received control signal;
the output interface connecting device is connected with the TR module and used for outputting the common channel control signal, the receiving channel control signal and the transmitting channel control signal to the T/R module so as to realize the test of the TR module;
the power supply circuit is used for providing working voltage for the T/R module test circuit; the clock circuit is used for providing clock signals for the T/R module test circuit.
Further, the common channel control circuit includes a first driver, a second driver, and a third driver;
the first driver is used for carrying out signal driving and level conversion on the received control signal to obtain a control signal of the T/R module phase shifter;
the second driver is used for carrying out signal driving and level conversion on the received control signal to obtain a control signal of the T/R module attenuator;
and the third driver is used for carrying out signal driving and level conversion on the received control signal to obtain a T/R module switch control signal.
Further, the receiving channel control circuit comprises a first power supply modulation circuit and a second power supply modulation circuit;
the first power supply modulation circuit is used for carrying out signal modulation on the received control signal to obtain a control signal of the T/R module low-noise amplifier;
and the second power supply modulation circuit is used for carrying out signal modulation on the received control signal to obtain a control signal of the amplitude limiter of the T/R module.
Further, the transmission channel control circuit comprises a third power supply modulation circuit and a fourth power supply modulation circuit;
the third power supply modulation circuit is used for carrying out signal modulation on the received control signal to obtain a control signal of the T/R module driving amplifier;
and the fourth power supply modulation circuit is used for carrying out signal modulation on the received control signal to obtain a control signal of a final power amplifier of the T/R module.
And further, the system also comprises a display circuit for displaying the working state and the fault information of the tested T/R module.
Advantages of additional aspects of the invention will be set forth in part in the description which follows, and in part will be obvious from the description, or may be learned by practice of the invention.
Drawings
FIG. 1 is a block diagram of a T/R module test circuit according to an embodiment of the present invention;
fig. 2 is a block diagram of a T/R module test circuit according to another embodiment of the invention.
Detailed Description
The principles and features of this invention are described below in conjunction with the following drawings, which are set forth by way of illustration only and are not intended to limit the scope of the invention.
Fig. 1 is a block diagram of a T/R module test circuit according to an embodiment of the present invention. As shown in fig. 1, the test circuit includes: the device comprises an input signal conversion circuit, a programmable logic circuit, a public channel control circuit, a receiving channel control circuit, a transmitting channel control circuit, an output interface connecting device, a clock circuit and a power circuit; the input signal conversion circuit, the clock circuit and the power circuit are all connected with the programmable logic circuit, the programmable logic circuit is connected with the public channel control circuit, the receiving channel control circuit and the transmitting channel control circuit, and the public channel control circuit, the receiving channel control circuit and the transmitting channel control circuit are connected with the output interface connecting device.
In the above embodiment, the T/R module test circuit can control the T/R module test circuit to output the receiving channel control signal and the transmitting channel control signal required when the T/R module normally works by using the serial port output signal of the computer, and test the index data of the T/R module in the receiving and transmitting states respectively, and the state switching is simple and easy, the power-up test is convenient and fast, and the test efficiency is high.
Furthermore, the input signal conversion circuit is connected with a computer and is used for realizing data communication with the computer; the programmable logic circuit is used for generating different control signals according to the serial port output signals converted by the input signal conversion circuit and respectively sending the different control signals to the public channel control circuit, the receiving channel control circuit and the transmitting channel control circuit; the public channel control circuit is used for generating a public channel control signal according to the received control signal; the receiving channel control circuit is used for generating a receiving channel control signal according to the received control signal; the transmitting channel control circuit is used for generating a transmitting channel control signal according to the received control signal; the output interface connecting device is connected with the TR module and used for outputting the common channel control signal, the receiving channel control signal and the transmitting channel control signal to the T/R module so as to realize the test of the TR module; the power supply circuit is used for providing working voltage for the T/R module test circuit; the clock circuit is used for providing clock signals for the T/R module test circuit.
In the above embodiment, the input signal conversion circuit provides RS-232 and RS-485 serial port conversion for the interconnection of the T/R module test circuit and the computer, so as to realize data communication between the T/R module test circuit and the computer and facilitate receiving a control signal of the computer; the programmable logic circuit generates different control signals according to serial port output signals output by the computer, and the public channel control circuit, the receiving channel control circuit and the transmitting channel control circuit respectively generate corresponding public channel control signals, receiving channel control signals and transmitting channel control signals according to the respective received control signals and output the public channel control signals, the receiving channel control signals and the transmitting channel control signals to the T/R module through the output interface connecting device to realize the test of the TR module; the state switching is simple and easy, the power-up test is convenient and quick, and the test efficiency is high.
Further, the common channel control circuit includes a first driver, a second driver, and a third driver; the first driver is used for carrying out signal driving and level conversion on the received control signal to obtain a control signal of the T/R module phase shifter; the second driver is used for carrying out signal driving and level conversion on the received control signal to obtain a control signal of the T/R module attenuator; and the third driver is used for carrying out signal driving and level conversion on the received control signal to obtain a T/R module switch control signal.
In the above embodiment, the first driver, the second driver and the third driver respectively perform signal driving and level conversion on the received control signals, so as to obtain control signals of the phase shifter, the attenuator and the switch of the T/R module, respectively, and realize control of the common channel; and the state switching is simple and easy, the power-up test is convenient and quick, and the test efficiency is high.
Further, the receiving channel control circuit comprises a first power supply modulation circuit and a second power supply modulation circuit; the first power supply modulation circuit is used for carrying out signal modulation on the received control signal to obtain a control signal of the T/R module low-noise amplifier; and the second power supply modulation circuit is used for carrying out signal modulation on the received control signal to obtain a control signal of the amplitude limiter of the T/R module.
In the above embodiment, the first power supply modulation circuit and the second power supply modulation circuit respectively modulate the received control signals to obtain the control signals of the T/R module low noise amplifier and the limiter, respectively, so as to control the receiving channel; and the state switching is simple and easy, the power-up test is convenient and quick, and the test efficiency is high.
Further, the transmission channel control circuit comprises a third power supply modulation circuit and a fourth power supply modulation circuit; the third power supply modulation circuit is used for carrying out signal modulation on the received control signal to obtain a control signal of the T/R module driving amplifier; and the fourth power supply modulation circuit is used for carrying out signal modulation on the received control signal to obtain a control signal of a final power amplifier of the T/R module.
In the above embodiment, the third power supply modulation circuit and the fourth power supply modulation circuit respectively modulate the received control signals to obtain the control signals of the T/R module driving amplifier and the final power amplifier, respectively, so as to control the transmission channel; and the state switching is simple and easy, the power-up test is convenient and quick, and the test efficiency is high.
It should be noted that, the power supply modulation circuit is to convert the TTL control signal output by the programmable logic circuit into a modulation voltage signal required to control the operation of the receiving channel and the transmitting channel of the T/R module through a modulation circuit or a MOSFET driver, and generally needs to select according to a microwave device used by the receiving and transmitting channel of the T/R module.
In the embodiment of the invention, voltage conversion between circuits is realized through the input signal conversion circuit and the driver, the input signal conversion circuit converts an input 5V level signal into a 3.3V level signal, and the driver converts a 3.3V level signal output by the programmable logic chip into a 5V level signal. The embodiment of the invention can be realized by using an eight-way bus transceiver SN74LVC4245A of TI company; the output interface connection device may be implemented using a J18 series miniature rectangular electrical connector.
And further, the system also comprises a display circuit for displaying the working state and the fault information of the tested T/R module.
In the embodiment, the working state and the fault information of the tested T/R module are displayed through the display circuit, so that a tester can more intuitively and conveniently solve the test process and the fault problems found in the test process.
As shown in fig. 2, the T/R module test circuit provided in the embodiment of the present invention is provided with an input signal conversion circuit, which is connected to a serial port of a computer to control input data of the T/R module test circuit, and an output interface connection device, which is connected to a T/R module to be tested, so that the T/R module test circuit outputs different control signals by changing an input state to control the T/R module to be powered up. The input signal conversion circuit is respectively connected with the computer and the programmable logic circuit, the clock circuit is connected with the input end of the programmable logic device, the power supply circuit is connected with the power adding end of the programmable logic device, the input ends of the driver A, the driver B, the driver C, the power supply modulation A, the power supply modulation B, the power supply modulation C and the power supply modulation D are respectively connected with the output end of the programmable logic device, the output ends of the driver A, the driver B, the driver C and the power supply modulation D are respectively connected with the output interface connecting device, and the output end of the output interface connecting device is connected with the T/R module. The driver A, the driver B and the driver C respectively represent a first driver, a second driver and a third driver, and the power supply modulation A, the power supply modulation B, the power supply modulation C and the power supply modulation D respectively represent a first power supply modulation circuit, a second power supply modulation circuit, a third power supply modulation circuit and a fourth power supply modulation circuit.
The working state of the T/R module is divided into a transmitting state and a receiving state, and different state signals are respectively output by the T/R module test circuit driver and the power supply modulation by changing the content of the output signal of the computer, so that the T/R module works in the corresponding transmitting state and receiving state.
Specifically, the computer controls the driver A, the driver B, the driver C, the power supply modulation A and the power supply modulation B to output signals required by the TR module to receive the work of a channel in a receiving state by changing a control signal which is output by a serial port and controls the working state of the TR module, and the power supply modulation C and the power supply modulation D output signals which are output by the TR module and do not work in a transmitting channel; in a transmitting state, the control driver A, the control driver B, the control driver C, the power supply modulation C and the power supply modulation D output signals required by the transmitting channel of the TR module to work, and the power supply modulation A and the power supply modulation B output signals which are received by the TR module and do not work in a channel state.
The above description is only for the purpose of illustrating the preferred embodiments of the present invention and is not to be construed as limiting the invention, and any modifications, equivalents, improvements and the like that fall within the spirit and principle of the present invention are intended to be included therein.

Claims (2)

1. A T/R module test circuit, comprising: the device comprises an input signal conversion circuit, a programmable logic circuit, a public channel control circuit, a receiving channel control circuit, a transmitting channel control circuit, an output interface connecting device, a clock circuit and a power circuit;
the input signal conversion circuit, the clock circuit and the power circuit are all connected with the programmable logic circuit, the programmable logic circuit is connected with the public channel control circuit, the receiving channel control circuit and the transmitting channel control circuit, and the public channel control circuit, the receiving channel control circuit and the transmitting channel control circuit are connected with the output interface connecting device;
the input signal conversion circuit is connected with the computer and is used for realizing data communication with the computer;
the programmable logic circuit is used for generating different control signals according to the serial port output signals converted by the input signal conversion circuit and respectively sending the different control signals to the public channel control circuit, the receiving channel control circuit and the transmitting channel control circuit;
the public channel control circuit is used for generating a public channel control signal according to the received control signal; the receiving channel control circuit is used for generating a receiving channel control signal according to the received control signal; the transmitting channel control circuit is used for generating a transmitting channel control signal according to the received control signal;
the output interface connecting device is connected with the TR module and used for outputting the public channel control signal, the receiving channel control signal and the transmitting channel control signal to the T/R module so as to realize the test of the TR module;
the power supply circuit is used for providing working voltage for the T/R module test circuit; the clock circuit is used for providing a clock signal for the T/R module test circuit;
the common channel control circuit comprises a first driver, a second driver and a third driver;
the first driver is used for carrying out signal driving and level conversion on the received control signal to obtain a control signal of the T/R module phase shifter;
the second driver is used for carrying out signal driving and level conversion on the received control signal to obtain a control signal of the T/R module attenuator;
the third driver is used for carrying out signal driving and level conversion on the received control signal to obtain a T/R module switch control signal;
the receiving channel control circuit comprises a first power supply modulation circuit and a second power supply modulation circuit;
the first power supply modulation circuit is used for carrying out signal modulation on the received control signal to obtain a control signal of the T/R module low-noise amplifier;
the second power supply modulation circuit is used for carrying out signal modulation on the received control signal to obtain a control signal of a T/R module amplitude limiter;
the transmitting channel control circuit comprises a third power supply modulation circuit and a fourth power supply modulation circuit;
the third power supply modulation circuit is used for carrying out signal modulation on the received control signal to obtain a control signal of the T/R module driving amplifier;
and the fourth power supply modulation circuit is used for carrying out signal modulation on the received control signal to obtain a control signal of a final power amplifier of the T/R module.
2. The T/R module test circuit of claim 1, further comprising a display circuit for displaying the operating status and fault information of the tested T/R module.
CN201911025746.7A 2019-10-25 2019-10-25 T/R module test circuit Active CN110609260B (en)

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Publication number Priority date Publication date Assignee Title
CN111505593B (en) * 2020-04-30 2022-03-29 北京无线电测量研究所 Frequency synthesis comprehensive test system and test method

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0509694A3 (en) * 1991-04-19 1994-07-27 Hughes Aircraft Co A built-in system for antenna calibration and performance monitoring of a phased array antenna
CN108051619A (en) * 2017-12-05 2018-05-18 上海无线电设备研究所 A kind of TR components ripple control circuit fast quantification test verification system and method
CN109343014A (en) * 2018-11-23 2019-02-15 四川九洲电器集团有限责任公司 For testing the device and method of the T/R component of phased-array radar
CN110133633A (en) * 2018-02-08 2019-08-16 恩智浦有限公司 Built-in self-test and its method for radar cell receiver

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0509694A3 (en) * 1991-04-19 1994-07-27 Hughes Aircraft Co A built-in system for antenna calibration and performance monitoring of a phased array antenna
CN108051619A (en) * 2017-12-05 2018-05-18 上海无线电设备研究所 A kind of TR components ripple control circuit fast quantification test verification system and method
CN110133633A (en) * 2018-02-08 2019-08-16 恩智浦有限公司 Built-in self-test and its method for radar cell receiver
CN109343014A (en) * 2018-11-23 2019-02-15 四川九洲电器集团有限责任公司 For testing the device and method of the T/R component of phased-array radar

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