CN116047271A - Automatic test system and automatic test method - Google Patents
Automatic test system and automatic test method Download PDFInfo
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- CN116047271A CN116047271A CN202310103616.0A CN202310103616A CN116047271A CN 116047271 A CN116047271 A CN 116047271A CN 202310103616 A CN202310103616 A CN 202310103616A CN 116047271 A CN116047271 A CN 116047271A
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- 238000012360 testing method Methods 0.000 title claims abstract description 123
- 238000010998 test method Methods 0.000 title claims abstract description 11
- 238000005259 measurement Methods 0.000 claims description 16
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- 102100036285 25-hydroxyvitamin D-1 alpha hydroxylase, mitochondrial Human genes 0.000 claims description 4
- 101000875403 Homo sapiens 25-hydroxyvitamin D-1 alpha hydroxylase, mitochondrial Proteins 0.000 claims description 4
- 230000003068 static effect Effects 0.000 claims description 4
- 238000000034 method Methods 0.000 description 6
- 238000011161 development Methods 0.000 description 4
- 230000009286 beneficial effect Effects 0.000 description 3
- 238000002955 isolation Methods 0.000 description 3
- 238000004891 communication Methods 0.000 description 2
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- 238000010586 diagram Methods 0.000 description 2
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
- G01R31/2834—Automated test systems [ATE]; using microprocessors or computers
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P90/00—Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
- Y02P90/02—Total factory control, e.g. smart factories, flexible manufacturing systems [FMS] or integrated manufacturing systems [IMS]
Abstract
The invention discloses an automatic test system and an automatic test method, which belong to the technical field of hardware test, and are applied to digital isolator test, wherein the automatic test system comprises: an apparatus main body, a measuring apparatus, and a computer; the device main body comprises a programmable relay array, a main circuit board, a digital isolator, an isolator sub-circuit board, a microcontroller and a microcontroller sub-circuit board, wherein the digital isolator is arranged on the isolator sub-circuit board, and the microcontroller is arranged on the microcontroller sub-circuit board; the measuring device, the isolator subcircuit board and the microcontroller subcircuit board are all electrically connected with the main circuit board, the measuring device is electrically connected with the input pins of the programmable relay array, the isolator subcircuit board is electrically connected with the output pins of the programmable relay array, and the microcontroller subcircuit board is electrically connected with the control pins of the programmable relay array; the measuring device and the microcontroller are both electrically connected to the computer.
Description
Technical Field
The invention belongs to the technical field of hardware testing, and particularly relates to an automatic testing system and an automatic testing method.
Background
Traditional laboratory digital isolator testing often relies on manual operation, and testing efficiency is low. The existing automatic test technology can only realize program control of single measurement equipment and single connection mode, and needs to reconnect the test equipment and reconfigure a control program after replacing a new test item, so that the full-automatic test requirements of various test items and various connection modes in the development process can not be met.
Disclosure of Invention
In order to solve the technical problems, the invention provides an automatic test system and an automatic test method.
First aspect
The invention provides an automatic test system, which is applied to digital isolator testing, and comprises: an apparatus main body, a measuring apparatus, and a computer;
the device main body comprises a programmable relay array, a main circuit board, a digital isolator, an isolator sub-circuit board, a microcontroller and a microcontroller sub-circuit board, wherein the digital isolator is arranged on the isolator sub-circuit board, and the microcontroller is arranged on the microcontroller sub-circuit board;
the measuring equipment, the isolator subcircuit board and the microcontroller subcircuit board are all electrically connected with the main circuit board, the measuring equipment is electrically connected with the input pins of the programmable relay array, the isolator subcircuit board is electrically connected with the output pins of the programmable relay array, and the microcontroller subcircuit board is electrically connected with the control pins of the programmable relay array;
the measuring device and the microcontroller are both electrically connected with the computer;
the computer is used for controlling the programmable relay array through the microcontroller, and testing the digital isolator through the programmable relay array and the measuring equipment.
Optionally, the measuring device comprises: the device comprises a heat flow meter, a programmable power supply, a programmable waveform generator, an oscilloscope, a digital multimeter and a programmable electronic load;
the heat flow meter, the programmable power supply, the programmable waveform generator, the oscilloscope, the digital multimeter and the programmable electronic load are all electrically connected with the main circuit board.
Optionally, the heat flow meter comprises a heat flow meter cover, an accommodating space is formed inside the heat flow meter cover, and the isolator sub-circuit board are arranged in the accommodating space.
Optionally, the programmable relay array includes an X-axis pin and a Y-axis pin, one of the X-axis pin and the Y-axis pin of the programmable relay array is electrically connected with the measurement device, and the other is electrically connected with the isolator sub-circuit board.
Second aspect
The invention provides an automatic test method, which is applied to the automatic test system of the first aspect, and comprises the following steps:
acquiring equipment information of the measuring equipment, wherein the equipment information comprises equipment names, equipment addresses and initializing information;
under the condition that whether the initialization information is needed to be initialized, calling a corresponding device driver according to the device name and the device address, and initializing the measuring device;
acquiring information of a digital isolator to be tested;
acquiring environment temperature configuration information, wherein the environment temperature configuration information comprises I test temperatures;
acquiring configuration information of items to be tested, wherein the configuration information of the items to be tested comprises J items to be tested;
and under the condition that the digital isolator is at the first test temperature, respectively testing J items to be tested, adjusting the heat flow instrument to enable the digital isolator to be at the second test temperature, and repeatedly testing the J items to be tested until the J items to be tested at the I test temperature are measured.
Optionally, the information of the digital isolator to be tested includes a material number, a forward and reverse channel number, whether the enable pin EN1 exists, whether the enable pin EN2 exists, an output default value, a forward channel to be tested and a reverse channel to be tested.
Optionally, the plurality of items to be tested include: maximum transmission rate, minimum transmission pulse width, input/output propagation delay, rise time/fall time of output signals, logic high/logic low voltage threshold of an input channel, voltage/equivalent impedance of the output channel under different loads, static/dynamic power consumption and power supply voltage undervoltage protection threshold.
Optionally, I test temperatures are configured by the heat flow meter.
Optionally, testing the item to be tested specifically includes:
configuring measurement equipment, wherein the measurement equipment comprises a general relay and an oscilloscope;
configuring the programmable relay array, and circularly traversing the test channel;
adjusting the primary side voltage VDD1 of the digital isolator to be tested, and circularly traversing each voltage value of the VDD 1;
adjusting the secondary side voltage VDD2 of the digital isolator to be tested, and circularly traversing each voltage value of the VDD 2;
and testing the digital isolator to be tested, and obtaining and recording the measurement result of the digital isolator to be tested.
Compared with the prior art, the invention has at least the beneficial effects that:
in the invention, the automatic test system can freely configure a plurality of measuring devices, the test channels of the digital isolator and various test items, and automatically complete the various test items of the digital isolator. The program control of a plurality of measuring devices and a plurality of connection modes can be realized by avoiding relying on manual operation, so that the full-automatic test requirements of a plurality of test projects and a plurality of connection modes in the development process are met, and the test efficiency is greatly improved.
Drawings
The above features, technical features, advantages and implementation of the present invention will be further described in the following description of preferred embodiments with reference to the accompanying drawings in a clear and easily understood manner.
FIG. 1 is a schematic diagram of an automated test system according to the present invention;
FIG. 2 is a schematic flow chart of an automated test method provided by the present invention;
fig. 3 is a flow chart of a method for testing items to be tested according to the present invention.
Detailed Description
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the following description will explain the specific embodiments of the present invention with reference to the accompanying drawings. It is evident that the drawings in the following description are only examples of the invention, from which other drawings and other embodiments can be obtained by a person skilled in the art without inventive effort.
For simplicity of the drawing, only the parts relevant to the invention are schematically shown in each drawing, and they do not represent the actual structure thereof as a product. Additionally, in order to simplify the drawing for ease of understanding, components having the same structure or function in some of the drawings are shown schematically with only one of them, or only one of them is labeled. Herein, "a" means not only "only this one" but also "more than one" case.
It should be further understood that the term "and/or" as used in the present specification and the appended claims refers to any and all possible combinations of one or more of the associated listed items, and includes such combinations.
In this context, it should be noted that the terms "mounted," "connected," and "connected" are to be construed broadly, and may be, for example, fixedly connected, detachably connected, or integrally connected, unless explicitly stated or limited otherwise; can be mechanically or electrically connected; can be directly connected or indirectly connected through an intermediate medium, and can be communication between two elements. The specific meaning of the above terms in the present invention will be understood in specific cases by those of ordinary skill in the art.
In addition, in the description of the present invention, the terms "first," "second," and the like are used merely to distinguish between descriptions and are not to be construed as indicating or implying relative importance.
Example 1
In one embodiment, referring to fig. 1 of the specification, the present invention provides a schematic structural diagram of an automated test system.
The automatic testing system provided by the invention is applied to digital isolator testing.
The digital isolator is a device for realizing digital signal transmission in an electric isolation state, and is widely applied to various electronic system equipment such as industrial control, electric power energy, communication networks, instruments and meters, consumer electronics and the like. The power supply circuit is divided into a primary side and a secondary side, wherein the two sides are mutually isolated, and each side is provided with corresponding power supply voltage and reference ground. The digital isolator is a series of products, the number of channels is selectable, the enabling function is selectable, and the channel direction is selectable. The digital isolation test items include, for example, maximum transmission rate, minimum transmission pulse width, input/output propagation delay, rise time/fall time of output signals, logic high/logic low voltage threshold of an input channel, voltage/equivalent impedance of the output channel under different loads, static/dynamic power consumption, undervoltage protection threshold of a supply voltage, and the like. In laboratory testing, test equipment is required to include digital multimeters, incubators, oscilloscopes, waveform generators, programmable power supplies, programmable loads, and the like.
The automated test system comprises: an apparatus main body 1, a measuring apparatus 2, and a computer 3;
the device body 1 includes a programmable relay array 101, a main circuit board 102, a digital isolator 103, an isolator sub-circuit board 104, a microcontroller (MicrocontrollerUnit, MCU) 105, and a microcontroller sub-circuit board 106;
the digital isolator 103 is disposed on an isolator subcircuit board 104, and the microcontroller 105 is disposed on a microcontroller subcircuit board 106;
the measuring equipment 2, the isolator subcircuit board 104 and the microcontroller subcircuit board 106 are all electrically connected with the main circuit board 102, the measuring equipment 2 is electrically connected with input pins of the programmable relay array 101, the isolator subcircuit board 104 is electrically connected with output pins of the programmable relay array 101, and the microcontroller subcircuit board 106 is electrically connected with control pins of the programmable relay array 101;
the measuring device 2 and the microcontroller 105 are electrically connected with the computer 3; the computer 3 can control the measuring device 2 as well as the microcontroller 105.
The computer 3 is used for controlling the programmable relay array 101 through the microcontroller 105, and testing the digital isolator 103 through the programmable relay array 101 and the measuring device 2.
It should be noted that, the automatic test system provided by the present invention can automatically test any type of digital isolator 103. And the test temperature, the power supply voltage of the chip, the signal frequency, the isolation channel, the test item can be configured arbitrarily, and the coverage rate of the test item is more than 80%.
Wherein the measuring device 2 comprises: a heat flow meter 201, a programmable power supply 202, a programmable waveform generator 203, an oscilloscope 204, a digital multimeter 205, and a programmable electronic load 206;
the heat flow meter 201, the programmable power supply 202, the programmable waveform generator 203, the oscilloscope 204, the digital multimeter 205, and the programmable electronic load 206 are all electrically connected to the main circuit board 102.
The heat flow meter 201 includes a heat flow meter cover, and an accommodating space is formed inside the heat flow meter cover, and the isolator sub-circuit board 104 are disposed in the accommodating space. The heat flow meter may be used to control the test temperature and may allow the automated test system to be at a variety of different test temperatures, such as-40 ℃, 25 ℃, 125 ℃, and the like.
In one possible implementation, the programmable relay array 101 includes an X-axis pin and a Y-axis pin, one of the X-axis pin and the Y-axis pin of the programmable relay array 101 is electrically connected to the measurement device 2, and the other is electrically connected to the isolator sub-circuit board 104. The switching on and off between the various test devices 2 and the digital isolator 103 can be achieved by a programmable relay array 101.
Compared with the prior art, the invention has at least the beneficial effects that:
in the invention, the automatic test system can freely configure a plurality of measuring devices, the test channels of the digital isolator and various test items, and automatically complete the various test items of the digital isolator. The program control of a plurality of measuring devices and a plurality of connection modes can be realized by avoiding relying on manual operation, so that the full-automatic test requirements of a plurality of test projects and a plurality of connection modes in the development process are met, and the test efficiency is greatly improved.
Example two
In one embodiment, referring to fig. 2 of the specification, the present invention provides a flow chart of an automated testing method.
The invention provides an automatic test method, which is applied to an automatic test system as in the first embodiment, and comprises the following steps:
s101: device information of the measurement device is acquired, the device information including a device name, a device address, and whether or not to initialize information.
S102: and under the condition that whether the initialization information is needed to be initialized, calling a corresponding device driver according to the device name and the device address, and initializing the measuring device.
S103: and acquiring information of the digital isolator to be tested.
The information of the digital isolator to be tested comprises a material number, the number of forward and reverse channels, whether an enable pin EN1 exists, whether an enable pin EN2 exists, an output default value, a forward channel to be tested and a reverse channel to be tested.
S104: and acquiring environment temperature configuration information, wherein the environment temperature configuration information comprises I test temperatures.
In one possible embodiment, the I test temperatures are configured by a thermal flow meter.
S105: obtaining configuration information of items to be tested, wherein the configuration information of the items to be tested comprises J items to be tested.
Wherein the J items to be tested include: maximum transmission rate, minimum transmission pulse width, input/output propagation delay, rise time/fall time of output signals, logic high/logic low voltage threshold of an input channel, voltage/equivalent impedance of the output channel under different loads, static/dynamic power consumption and power supply voltage undervoltage protection threshold.
S106: under the condition that the digital isolator is at the first test temperature, J items to be tested are tested respectively, and the heat flow instrument is regulated to enable the digital isolator to be at the second test temperature, the J items to be tested are tested repeatedly until the J items to be tested at the I test temperature are measured.
In the automatic testing method provided by the invention, the automatic testing of various parameters of the digital isolator at different testing temperatures can be completed, and the testing efficiency is greatly improved.
Referring to fig. 3 of the specification, a flow chart of a method for testing a project to be tested is provided in the invention.
S201: configuring measurement equipment, wherein the measurement equipment comprises a general relay and an oscilloscope;
s202: configuring the programmable relay array, and circularly traversing the test channel;
s203: adjusting the primary side voltage VDD1 of the digital isolator to be tested, and circularly traversing each voltage value of the VDD 1;
s204: adjusting the secondary side voltage VDD2 of the digital isolator to be tested, and circularly traversing each voltage value of the VDD 2;
s205: and testing the digital isolator to be tested, and obtaining and recording the measurement result of the digital isolator to be tested.
In one possible implementation, the propagation delay test is included in the plurality of items under test. The transmission delay includes a falling edge delay and a rising edge delay.
Specifically, taking propagation delay test as an example, the measurement flow includes:
the isolator transmission delay test starts;
a "test result Excel" was created.
Configuring general relays 1, 2, 3, 4
An oscilloscope is configured;
configuring the programmable relay array, and circularly traversing the test channel;
adjusting the VDD1, and circularly traversing each voltage value of the VDD 1; for example vdd1=3.3v, 5v.
Adjusting the VDD2, and circularly traversing each voltage value of the VDD 2; for example vdd1=3.3v, 5v.
Configuring a programmable waveform generator, and circularly traversing each frequency value of the input signal frequency; for example fsw=10 khz,1mhz.
Measuring transmission delay, falling edge delay TPHL and rising edge delay TPLH by an oscilloscope;
and (5) storing a test waveform, and recording a test result to Excel.
And ending the transmission delay test of the isolator.
The man-machine interaction layer is responsible for collecting user input parameters in an Excel mode, including test equipment information, test temperature options, chip information, test item configuration and the like. On the other hand, the test result is output in an Excel or picture mode. The test application layer is the physical implementation of a specific test item. The driving layer provides an interface for the computer to operate the test equipment and the MCU.
Compared with the prior art, the invention has at least the beneficial effects that:
in the invention, the automatic test system can freely configure a plurality of measuring devices, the test channels of the digital isolator and various test items, and automatically complete the various test items of the digital isolator. The program control of a plurality of measuring devices and a plurality of connection modes can be realized by avoiding relying on manual operation, so that the full-automatic test requirements of a plurality of test projects and a plurality of connection modes in the development process are met, and the test efficiency is greatly improved.
It should be noted that the above embodiments can be freely combined as needed. The foregoing is merely a preferred embodiment of the present invention and it should be noted that modifications and adaptations to those skilled in the art may be made without departing from the principles of the present invention, which are intended to be comprehended within the scope of the present invention.
Claims (9)
1. An automated test system for use in digital isolator testing, the automated test system comprising: an apparatus main body, a measuring apparatus, and a computer;
the device main body comprises a programmable relay array, a main circuit board, a digital isolator, an isolator sub-circuit board, a microcontroller and a microcontroller sub-circuit board, wherein the digital isolator is arranged on the isolator sub-circuit board, and the microcontroller is arranged on the microcontroller sub-circuit board;
the measuring equipment, the isolator subcircuit board and the microcontroller subcircuit board are all electrically connected with the main circuit board, the measuring equipment is electrically connected with the input pins of the programmable relay array, the isolator subcircuit board is electrically connected with the output pins of the programmable relay array, and the microcontroller subcircuit board is electrically connected with the control pins of the programmable relay array;
the measuring device and the microcontroller are both electrically connected with the computer;
the computer is used for controlling the programmable relay array through the microcontroller, and testing the digital isolator through the programmable relay array and the measuring equipment.
2. The automated test system of claim 1, wherein the measurement device comprises: the device comprises a heat flow meter, a programmable power supply, a programmable waveform generator, an oscilloscope, a digital multimeter and a programmable electronic load;
the heat flow meter, the programmable power supply, the programmable waveform generator, the oscilloscope, the digital multimeter and the programmable electronic load are all electrically connected with the main circuit board.
3. The automated test system of claim 1, wherein the heat flow meter comprises a heat flow meter housing, an interior of the heat flow meter housing forming a receiving space, the isolator and the isolator subcircuit board being disposed in the receiving space.
4. The automated test system of claim 1, wherein the programmable relay array comprises an X-axis pin and a Y-axis pin, one of the X-axis pin and the Y-axis pin of the programmable relay array being electrically connected to the measurement device and the other being electrically connected to the isolator subcircuit board.
5. An automated test method for use in an automated test system according to claims 1 to 4, the automated test method comprising:
acquiring equipment information of the measuring equipment, wherein the equipment information comprises equipment names, equipment addresses and initializing information;
under the condition that whether the initialization information is needed to be initialized, calling a corresponding device driver according to the device name and the device address, and initializing the measuring device;
acquiring information of a digital isolator to be tested;
acquiring environment temperature configuration information, wherein the environment temperature configuration information comprises I test temperatures;
acquiring configuration information of items to be tested, wherein the configuration information of the items to be tested comprises J items to be tested;
and under the condition that the digital isolator is at the first test temperature, respectively testing J items to be tested, adjusting a heat flow instrument to enable the digital isolator to be at the second test temperature, and repeatedly testing the J items to be tested until the J items to be tested at the I test temperature are measured.
6. The automated test method of claim 5, wherein the information of the digital isolator to be tested comprises a material number, a forward and reverse channel number, whether there is an enable pin EN1, whether there is an enable pin EN2, an output default value, a forward channel to be tested, and a reverse channel to be tested.
7. The automated testing method of claim 5, wherein the plurality of items under test comprise: maximum transmission rate, minimum transmission pulse width, input/output propagation delay, rise time/fall time of output signals, logic high/logic low voltage threshold of an input channel, voltage/equivalent impedance of the output channel under different loads, static/dynamic power consumption and power supply voltage undervoltage protection threshold.
8. The automated test method of claim 5, wherein I test temperatures are configured by the thermal flow meter.
9. The automated testing method of claim 5, wherein testing the item under test specifically comprises:
configuring measurement equipment, wherein the measurement equipment comprises a general relay and an oscilloscope;
configuring the programmable relay array, and circularly traversing the test channel;
adjusting the primary side voltage VDD1 of the digital isolator to be tested, and circularly traversing each voltage value of the VDD 1;
adjusting the secondary side voltage VDD2 of the digital isolator to be tested, and circularly traversing each voltage value of the VDD 2;
and testing the digital isolator to be tested, and obtaining and recording the measurement result of the digital isolator to be tested.
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| CN2023100625878 | 2023-01-16 | ||
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Cited By (1)
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